optical properties and interaction of radiation with matter s.nannarone tasc infm-cnr &...
TRANSCRIPT
Optical propertiesand
Interaction of radiation with matterS.Nannarone
TASC INFM-CNR & University of Modena
Outline
•Elements of Classical description of E.M. field propagation in absorbing/ polarizable media Dielectric function
•Quantum mechanics microscopic treatment of absorption and emission and connection with dielectric function
Physics related to a wide class of Photon-in Photon-out experiments including Absorption, Reflectivity, Diffuse scattering, Luminescence and Fluorescence or radiation-matter interaction
[some experimental arrangements and results, mainly in connection with the BEAR beamline at Elettra
http://new.tasc.infm.it/research/bear/]
Systems
•bulk materials the whole space is occupied by matter
•Surfaces matter occupies a semi-space, properties of the vacuum matter interface on top of a semi-infinite bulk
•Interfaces transition region between two different semi-infinite materials
•Electronic properties full and empty states, valence and core states, localized and delocalized
states
•Local atomic geometry /Morphology electronic states – atomic geometry different faces of the same
coin
Information [see mainly following lectures]
Energy range Visible, Vacuum Ultraviolet, Soft X-rays)
Synchrotron and laboratory sources/LAB
This can be done by Laboratory sources
They cover in principle the whole energy range nowadays covered by synchrotrons (J.A.R.Samson Techniques of vacuum ultraviolet spectroscopy)
•Incandescent sources
•Gas discharge
•X-ray e- bombardment line emission
•Bremsstrahlung continuous emission sources
•Higher harmonic source
Conceptually Shining light on a system, detecting the products and measuring effects of this interaction
Synchrotron and laboratory sources / Synchrotron
Some well known features
•Collimation
•Intrinsic linear and circular polarization
•Time structure (typically 01-1 ns length, 1 MHz-05GHz repetition rate)
•Continuous spectrum, high energy access to core levels
• Reliable calculability of absolute intensity
•Emission in clean vacuum, no gas or sputtered materials
•High brilliance unprecedented energy resolution
• High brilliance small spot Spectromicroscopy“The one important complication of synchrotron source is, however, that
while laboratory sources are small appendices to the monochromators, in a synchrotron radiation set-up the measuring devices becomes a small appendices to the light source. It is therefore recommendable to make use of synchrotron radiation only when its advantages are really needed.”
C.Kunz, In Optical properties of solids New developments, Ed.B.O.Seraphin, North Holland, 1976
Radiation-Matter Interaction Polarization and current induction in E.M. field
Matter polarizes in presence of an electric field Result is the establishment in the medium of an electric field function of both external and polarization charges
Matter polarizes in presence of a magnetic field Result is the establishment in the medium of a magnetic field function of both external and polarization currents
•Mechanisms and peculiarities of polarization and currents induction in presence of an E.M. field
•Scheme to calculate the E.M. field established and propagating in the material
•Basis to understand how this knowledge can be exploited to get information on the microscopic properties of matter
The presence of fields induce currents
Basic expressions - Charge polarization
and induced currents
pol P
polJ Pt
magJ c M
cond transport scalar potential optical em wave transport opticalJ E E J J
ii
pP
V
i
i
mM
V
Polarization vectors
Charge and Magnetic/current polarization – closer look
ii
pP
V
i
i
mM
V
-Ze-
+Ze
ip e
E
0P
B
m
magJ
Induced currents
cond transport scalar potential optical em wave transport opticalJ E E J J
+_
e-
( )
transport transport
transport
J qNv E
V
VZe+
( )E
( )B
( ) ( )optical E
Motion of charge under the effect of the electric field of the E.M. field but in an environment where it is present an E.M. field
2
2transport
Ne
m
Expansion of polarisation
Linear and isotropic media
eP E
mM B
4 4 eE P ED E E
4 4 (1 4 )m mH B M B B B
1
1 4 m
1 4 e
Dielectric function Permeability function
iji ij j kj i
jj
P E E higher order termE s Physical meaning Elastic limit the potential is not deformed by the field
Linear versus non linear optics
Formally linear optics implies neglecting terms corresponding to powers of the electric field
Physically it means E.M. forces negligible with respect to electron-nuclei coulomb attraction
9 810 / 10 /E V cm breakdown fields V cm
Nuclear atomic potential is deformed not harmonic (out of the elastic limit) response distortion higher harmonic generation
' ' ' ' ' '( , ) ( , , , ) ( , ) ( , ) ( , )t
All space
D r t dr dt r r t t E r t r t E r t
In very general way
4 extD
-1Responce function
External stimulus
Dielectric function and response
Note is defined as a real quantity
Summary material properties within linear approximation
1
1 4 m
1 4 e
And
transportoptical
Conduction in an e.m. field Conduction under a scalar potential – Usual ohmic conduction
. .E MEJ
staticJ E
4 extE
1E H
c t
0H
14 4optical extH E E J
c t
Corresponding equations for vacuum case
4 extE
0B
B Et
1 4extB E J
c t c
Maxwell equations in matter for the linear case
Wave equation - Vacuum
22
2 2
1E E
c t
22
2q
c
q
c
Vacuum supports the propagation of plane E.M. waves with dispersion / wave vector energy dependence
Wave equation - Matter
Matter supports the propagation of E.M. waves with this dispersion
Formally q is a complex wavevector
22
2 2 2
4 opticalE E Ec t c t
2 2
2 22 2
4( )q i n
c c
Wave vector eigenvalue/dispersion depends on the properties of matter
through (all real quantities)
0 exp ( )qE E i r t
Complex refraction index
0 ˆ ˆexp exp ( )E E s r i ns r tc c
k
Absorption Phase velocity
2
1 2
2 21
2
/
2 / 4 /
i n
n k
nk
Real and imaginary parts not
independent
cv
n
22
22 2
2
4( )q i
c cn
Absorption coefficient
dI Idr 2 4kc
k
2I E( )
0( , ) ( ) dI d I e Lambert’s law
Complex dielectric constant – Complex wave vector2
22
4( )q i
c
0 ˆ ˆ( , ) exp ( ) exp ( )E r t E q r i q r tnc c
k
n n ik 21 2 /i n
2 21 /n k
2 2 / 4 /nk
2 2 4k kI E dI Idr c
Supported/propagating E.M. modes depend on the properties of matter through
The study of modes of the e.m. field supported/propagating in a medium and the related spectroscopical information is the essence of the optical properties of matter
1st part Classical scheme / macroscopic picture
2nd part Quantum mechanics / microscopic picture
Relation between (r,t), (r,t) (r,t) or (q,) (q, ) (r ) and the properties of matter
Spatial dispersion
2ˆq q
extension on which the average is made
a 2
ˆ 0q q
( , ) ( 0, ) (0, )q q
2ˆ 0q q
Note 0 wavevector does not mean lost of dependence on direction anisotropic materials excited close to origin
Unknowns and equations
(real quantities) are the unknowns related with the material properties
(r,t) is close to unity at optical frequencies magnetic effects are small
magJ c M
(not to be confused with magneto-optic effects: i.e. optics in presence of an external magnetic field)
Generally a single spectrum – f.i. absorption – is available from experiment
(An ellipsometric measurement provides real and imaginary parts at the same time.
It is based on the use of polarizers not easily available in an extended energy range)
Real and imaginary parts are related through Kramers – Kronig relations
Sum rules
Kramers – Kronig dispersion relations
' ''2
1 ' 2 20
( )21
( )P d
'1 '
2 ' 2 20
( ) 12( )
( )P d
Under very general hypothesis including causality and linearity
Models for the dielectric constant / Lorentz oscillator
2202 Loc
d dm r m r m r eE
dt dt
Induced dipole
Mechanical dumped oscillator forced by a local e.m. field
Neglecting the magnetic term /Localev B c
2
2 20
1( )
( )Loc
Loc
e Ep E
m i
2
2 20
1( )
( )Loce E
m i
Out of phase – complex/dissipation – polarizability (Lorentzian line shape)
( )LocalE e-
Complex dielectric function
1 2( )( ) 1 4 ( ) ( )i
2
2 2
4 11
( )o
Ne
m i
4 4 eE P ED E E
P N E
From
2 22
1 2 2 2 2 2
( )41
( )o
o
Ne
m
2
2 2 2 2 2 2
4
( )o
Ne
m
Lorentz oscillator Dielectric function
Lorentz oscillator Refraction index
Lorentz oscillator Absorption Reflectivity Loss function
EEL spectroscopy
Physics
Difference between transverse and longitudinal excitation
Optical spectroscopy
Non linear Lorentz oscillator
0
22 2
22 Loc
d d er r r E
dt dtr
m
0 0
2 2 22 2 2
1( )
2 2 22n
n n nn
e
m i i
20
1
(
( ) 2
) ni
n
tn
n
Er
m
ee
i
1 2 ....r r r
21 1 2 2r E r E
22
1 1 0 122
d d er r r E
dt dt m
22 2
2 2 0 22 12d d
r r rdt dt
r
• induced dipole at frequency and 2
• the system is excited by a frequency but oscillates also at frequency 2
• re-emitting both and 2
Anarmonic potential
Lorentz oscillator in a magnetic field 1/2
2202
( ) (0,0, )Loc Ext Ext
d d drm r m r m r e E B B B
dt dt dt
2 20
2 20
2 20
( )
( )
0
x
y
m im m eE eB i
m im m eE eB i
m z im z m
x x x
x
z
y
y y y
2 220
22 2 20
2
4
x y
x
L
L
i E i EeP n
m i
2 220
22 2 20
2
4y
L
Ly xi E i EeP n
m i
2L
eB
m
x and y motions are coupled
Larmor frequency
;x yP Nex P Ney Solving for x and y
0 ( 1)P E �
0 1
0
1
1
xx xy xz
yx yy yz
zx
x x
z zz
y
zy
y
P E
P E
P
( 1)x xx x xy y xz zP E E E
2 220
22 2 20 0
( 1) ( 1)4
x
L
yx y
ien
m i
2
22 2 20 0
2
4x
L
Ly
ien
m i
2
22 2 20 0
2
4
Lyxxy
L
ien
m i
1zz
Lorentz oscillator in a magnetic field 2/2
( )ij B�
Lorentz oscillator in a magnetic field 1/3
0 ( 1)P E
(0,0, )
0
0 ;
0 0
xx
yy
zz
xy
xy B B
�
2 220
22 2 2 20 0
2
22 2 2 20 0
2
22 2 2 20 0
1 14
2
4
2
4
yy
L
L
y
L
x xy
L
L
xx
xy
ine
m i
ine
m i
ine
m i
The dielectric function is a tensor
[ Physically lost of symmetry for time reversal ]
Propagation in a magnetised medium 1/2
22
0 2
22
0 0 1,
2
,322 2
( )
ij j ij j ij j
iD
E E Dt
Ett
E
Wave equation
2 20 0i j j i ij j
j j
k k E k E E Eigenvalue equation
2 2 2 2 2 2 2 2
2 2 2 2 2 2 2 2
2 2 2 2 2 2 2 2
/ / /
/ / / 0
/ / /
x xx y x xy z x xz
y x yx y yy y z yz
z x zx z y zy z zz
n n k k n k k k n k k k
n k k k n n k k n k k k
n k k k n k k k n n k k
0
kn
kwith
Note ≠ 0 in anisotropic media
Propagation in a magnetised medium 2/2
2
2
0
0
0 0
xx xy
yx yy yz
zz
n
n
Considering the medium with B||z
2xx zyn i
Magneto-optics effects
Dichroism N+ Right circular polarized wave
N- Left circular polarized wave
Magneto-optic effects e.g. Faraday and Kerr effects/geometries
Linear polarized Elliptically polarized
Rotation according to n+-n-
M M
Longitudinal geometry
Two waves propagating with two different velocities and different absorption
Dielectric tensor
are in general tensorial quantities
4 4 eE P ED EE � �
4x x xx xy xz x
y y yx yy yz y
z z zx zy zz z
D E P
D E P
D E P
( , ), ( , ), ( , ), ( , ), ( , )e mq q q q q ����������
Dielectric tensor
4xx xy xz xx xy xz xx xy xz
yx yy yz yx yy yz yx yy yz
zx zy zz zx zy zz zx zy zz
xx yy zz 0 0
0 0
0 0
xx xy xz
yx yy yz
zx zy zz
0
0 0
xx xy
xy yy yz
zz
Scalar medium
Magnetized medium
Longitudinal and transverse dielectric constant 1/2
Any vector field F can be decomposed into two vector fields one of which is irrotational and the other divergenceless
0
0
L
L
T
T
F
F F
F
F F
If a field is expanded in plane waves FT is perpendicular to the direction of propagation.
0
0
D D k
B E
B
k
E
D
Longitudinal and transverse dielectric constant 2/2
( , ) (1 )4L L L
iJ q E
22
2 2
1 4(1 ) (1 ) ( , ) ( , )T T Tq E q i J q
c c
22
2
1(1 ) ( )T Lq
c
( , ) (1 ) ( , )4T T T
iJ q E q
The description in terms of longitudinal and transverse dielectric function is equivalent to the description in terms of the usual (longitudinal) dielectric function and magnetic permeability. They are both/all real quantities together with conductivity. They combine together to forming the complex dielectric constant defined here.
Optics EELS/e- scattering
Transverse and longitudinal modes 1/3
Modes can be transverse or longitudinal in the same meaning of transverse and longitudinal E.M. field searching for transverse waves is equivalent to searching for transverse modes
Propagating waves and excitation modes of matter are two different
manifestation of the same physical situation
Plasmon is a charge oscillation at a frequency defined by the normal modes oscillation produces a field only a field of this kind is able to excite this mode
+_
q
q( )E
Transverse and longitudinal modes 2/3
ˆ ˆ( , ) 0 ( , ) 0s D q s E q
ij�
NE k
c
Searching for modes eigenvectors of
Transverse modes Polaritons
Longitudinal modes
ˆ 0E Es E
( , ) ( , ) ( , ) 0i ij jD k k E k �
( , ) 0ij k
the quantum particles are coupled modes of radiation field and of the elementary excitations of the system: Plasmons, longitudinal opical phonons, longitudinal excitons,….
The quantum particles are coupled modes of radiation field and of the elementary excitations of the system, called Polaritons including transverse (opical) phonons, excitons,….
Transverse and longitudinal modes 3/3
( , ) 0E k
0D
4
DP
10 ( , ) ( , )i ij ijE k D k
1 1( , ) 0( , )ij
ij
kk
Polarization waves
Sum rules for the dielectric constant
' ' ' 2
0
1Im ( )
2 pd
' ' 2
0
Re 1 2 (0)d
Examples of sum rules
Of use in experimental spectra interpretation
Quantum theory of the optical constants
Macroscopic optical response Microscopic structure
Transition probability
Ground state HRADIATION + HMATTER perturbed by radiation-matter interaction
Two approaches
• fully quantum mechanics
• semi classical
Three processes
• Absorption
• Stimulated emission
• Spontaneous emission
O ° O
O ° O ° ° O
Microscopic description of the absorption and emission process
R M IH H H H
2 2 21( )
2R k k kk
H P Q
,
1( )
2k kk
E n .... ....k
n
mi,ei mj,ej
21
( ) ( )2
iM i j i i j i spin
i j i j ii
eH p A r e r H
m c
�
Term neglected for non relativistic particles
System
Radiation
Matter
•Interaction Hamiltonian HI
•Effect of the interaction on the states of the unperturbed HR + HI
Hamiltonian of a charged particle in E.M. field
1H A E A
c t
1F e E v H
c
2 2 21
2R x x y y z z
e e eH p A p A p A e
m c c c
xp ix
22
22
212
2R
e eH i i e
m c c
eAA
cA
2 2
22 2 2 2
22
1 12 2
2 2
2
R
e eH i i
m c m c
e
m m
e
A
A
p
cA A
c
0A
Particle radiation interaction
22
22
22 ( )
2
2 ( ) ( )2
2 ( )
ii R i i j i spin
i i j i
i i j i spini
i j ii i
i
R i
R
e r H
eH i A r e
eA
c
m
ei A
rc
c
Hm
r
Matter Hamiltonian + perturbation Hamiltonian
H E Problem to be solved
Eigenstate and eigenvector of the matter radiation system in interaction
Important notes
M R n n nH H E
• it is assumed here – formally - that the problem in absence of interactions has been solved.
• In practice this can be done with more or less severe approximations.
• The calculation of the electronic properties of the ground state is a special and important topic of the physics of matter
( , ... ...n n i i k nr s n
( , )n i ir s
Many particles state
Generally obtained by approximate methods
The solution is found by a perturbative method
Transition between states of ground state due to the perturbation term
The effect of perturbation HI on the eigenstates of H0
Obtained by time dependent perturbation theory
..... .... ( , )n k n i inn r s
' '
'( )
0
( ) ( )
( )
n
n t nn
mm I n
m
t
t c t
dc ti H
dt
Matrix elements 1/3
(0) 1 (0)n m nc The evolution of the state m is obtained calculating the matrix element
( ) (0) (0) (0)m n m I nt c H
... .... ( , )n k n i in r s
System states under perturbation due to
Changes of photon occupation and matter (f.i. electronic) state
0 exp ( )kA A i k r i t
Matrix elements 2/3
It is found that for photon mode k, only
' 1k kn n
contribute linear terms to matrix elements
Probability of transition of the system from state
'n n
+1 photon emission -1 photon absorption
Matrix element 3/3
'
' ' '
'
'
' ' '
'
2
22
2
2
22
2
1sin
8 ( ) 2( ) ( , )
1sin
8 ( 1) 2( ) ( ) ( )
(
,
)kn n
kn nk
nn n
knn n n n
kn
n n
kn n
n
tn
c t M k E E Emis
tn
c t M k E E Absorption
si nV
V
o
' ' exp( )(ii nn n n
i i
eM ik r i
m
Transition probabilities
' '
2 24 ( 1)( , ) ( )k
nn n nk
nM k E E Emission
V
' '
2 24 ( )( , ) ( )k
nn n nk
nM k E E Absorption
V
Spontaneous emissionStimulated emission
Spontaneous emission present only in quantum mechanics treatment
Integrating in time from 0 to infinity for the transition probabilities
per unit time
Dielectric function and microscopic properties
2
0
1( )
T
P J E dt ET
2
4
4( ) 1 4 ( ) i
( )f n probability of finding the state in a state n, at thermodynamic equilibrium ( ) ( ')f n f n for 'n nE E
' ' exp( )inn n i ia ni
i
eM ik r p
m
2
8knE
V
Dissipated
power
' '
'
22
24( ) ( ) '
4( )
8 knnn n
k
nn
nV
nM E E f n f
VVn
Microscopic expression of the dielectric function
'
22
' '2
4 1Im ( ) ( ) ( ) ( ')n n n n k
nn
M E E f n f nV
Physical meaning Sum of all the absorbing channels at that photon energy
Note dissipation originates from non radiative de-excitation channels
Intuitive meaning of the expression for absorption coefficient
'
22
' '2
4 1Im ( ) ( ) ( ) ( ')n n n n k
nn
M E E f n f nV
' ' 'Im ( ) ( ) ( ) ( ) ( ) ( ')n n n kn nnN E N E M E E f n f n
'( )n
N E
En
En’
( )nN E
N(E) density of states(Number of states/eV)
Joint Density Of States N(E) N(E’)
Dipole approximation
' '
22 8 ( )
( , ) exp( )k ii i nn n n
ik i
n eM k ik r p
V m
exp 1ik r
' '
' '
( ) iin n n n
i i
i in n n ni
eM p
m
i e r
Matrix elements of position operator
Semi classical approach
0 exp ( ) 2 ( )R ki
R iA A i k r ie
i A rtc
Note that the same result can be obtained by considering the transition probability between quantized states of the matter system under the effect of classical external perturbation of the E.M. field with given by the same expression of
This semi classical approach gives identical results for absorption and stimulated emission probabilities, but does not account for spontaneous emission
Selection rules for Hydrogen atom
' in nii
e r ˆ ( ,sin sin ,sin cos cos )
' ' '
' ' '
' ' '
' ' ' co
si
ˆ s
n sin
in o
ˆ
ˆ s
c s
nlmn l m
nlmn l m
nlmn l m
nlmn l m
er
ie er
je er
ke er
( ) (cos )m imnlm lR r P e
Generic light polarization
nlm
' ' 'n l m
Selection rules/2
' ' '
' ' ' c sˆ o
nlmn l m
nlmn l m
er
k er
' '
' '
' '
' '
2 ( )
2 ( )
cos sin sin ( ) ( )
cos ( ) ( ) ( )
m m i m mn ln l
m m i m mn ln l
drd d r R R P P e
drr R R d P P d e
' ' 1m m l l
For radiation polarized along z
Expressions valid in any central field
nlm
''' 1n l l m
[linear polarized light ]
Hydrogen - Selection rules Circular polarization
sin ( ) sin ( )r x iy or r x iy
2
E
2
ie i
1 1l m
Calculation of matrix elements - Optical properties of matter
' '
' '
( ) iin n n n
i i
i in n n ni
eM p
m
i e r
The basic step in calculation involves
many particles wavefunctions
Born - Oppenheimer approximation
( , ) ( , ) ( )n n nr R r R R
Nuclear motions separated from electronic motions
'
*
,( ) ( , )( ) ( , )mm k mk
eM dr k r i k r
m r
One electron description
One electron WF Solution of motion in an average potential generated by all other electrons
Dielectric function in one electron approximation
' '
'
'
' ' '
2
32 ,
2 2
, ,
4 2Im ( ) ( ) ( ( ) ( )
2
( ( )) ( ( ))
( ) ( ( ) ( ) ( )
mm k mk mm m BZ
F m F m
mm k mk m m k mkBZ
dk M E k E k
f E k f E k
M dk E k E k M JDOS
'*
,( ) ( , )( ) ( , )mm k mk
eM dr k r i k r
m r
Crystal states E(k) K reduced vector within the Brillouin zone
Case of crystals
Joint Density of States - JDOS
Phenomenology of absorption
•Interband transitions
-direct/indirect
-Intraband absorption
-Phonon contribution
•Core/localized (e.g. molecular) level absorption
Local field effects - Local (Lorentz) field corrections
03L
PE E
Decay and relaxation of excited states
' '
'
22
, ,
4 ( 1)1( , ) ( )k
m kn n nn kR k
nM k E E
V
Probability of relaxation/decay of excited state as integral on all the spontaneous emission channels of field and matter states
As a consequence the dependence of Im () has to be modified
1 1 1( )
e phR e e
•Lorentzian broadening
function substituted for by Lorentzian curve
(e.g. see Lorentz oscillator)
Lorentzian broadening
'
2 20
( )
1
( )
m knE E
i
Exploitation of emission / radiative decay
Total/Partial yield measurement of absorption through electron (Secondary, Auger,..) and photon (fluorescence, luminescence,…) yields
De-excitation spectroscopies
•Fluorescence
•Luminescence XEOL
•Auger electron and photon induced – Selection rules and surface sensitivity
233 *
1
( ) ( ( ) ) ( , ) ( ) ( ( ))c n c n c F nn
I dk E k E dr k r er r f E k
matrix element ~ constant I Density of states and 3
Boundaries reflectivity
From material filling the whole space to material with boundaries and matter-vacuum interfaces
Reflectivity - Measure of the reflected intensity as a function of incident intensity
Fresnels relations based on boundary conditions of fields link
reflected intensity with dielectric function
Reflectivity from a semi-infinite homogeneous material
Surface plane Normal to surface
Modellisation of surfaces and interfaces
Multiple boundaries
S and p reflectivity
Diffuse scattering 1/2
2 2 2 (( , ) , ) 0(, )n rE r k E r
Scalar theory of scattering (single Cartesian component)
2 2( , ) ( , ) ( , ) ln( , ) 0( , )E r rE r k r E r
2 21( , ) ( , ) 1
4F r k n r
2 2( , ) ( , ) , )(4 ) ( ,U r k U r U rF r
Defining: Scattering potential
Incident field
scattering medium
Scattered wave
Inhomogeneous filling of spaceTerm neglected if dimensions
Small and/or rough objects
Diffuse scattering 2/2
0ˆˆ
1( )
0ˆˆ( , )ˆ( ) si r
ik rks
fe
U rs er
ss
0' '( )' 3 ' ' 3 'ˆ ˆ
1 0ˆ ˆ( , ) ( ) ( )s rsik i rqf s s F r e d r F r e d r
The scattering amplitude is the Fourier transform of the scattering potential
Inverting F(r) n(r)
Born approximation
s
0s
0ˆks ksq
q
Conclusions
Classical scheme Introduction of the dielectric function
Microscopic (quantum mechanics) treatment of emission and absorption
Relation between macroscopic dielectric function (measured quantity) and microscopic properties
http://www.gfms.unimore.it/
Calculation of ij elements
Source Source: 3.3 m of arc, 3.1 m x 3.3 m vertical x horizontal
two fields – vertical and horizontal – out of phase of ±/2 according to the sign of take off angle (J.Schwinger PR 75(1949)1912)
2 22 23 3
0
0
3 3( ) ( ) [( ) (1 )]
4 42z i
c c
eE i A
cr
1 2' 2 23 3
0
0
3 3( ) ( ) [( ) (1 )]
4 42y i
c c
eE A
cr
Electric fields
-2 -1.5 -1 -0.5 0 0.5 1 1.5 20
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5x 1012
320eV r = 1 m
0.1% BW
(mrad)
Eoy
N/C
//320eV
r = 1 m 0.1% BW
-2 -1.5 -1 -0.5 0 0.5 1 1.5 2-3
-2
-1
0
1
2
3 T
Eoz
N/C
x 1012
(mrad)
≈ 103 photons/bunch - bunch duration ≈ 20 ps
-250
-200
-150
-100
-50
0
I(A
*e-1
2)
45 40 35 30 25 20 15 Z c
E = 100 eV Exit slits 900um * 30 um
-0.4
Electric field at E= 100 eV +0.4
-0.4 +1 -1 Horizontal
Vert
ical
Selector fully open: Zc= 45 mm, Zg = 1 mm
S1=-0.9 S2=0.011 S3=-0.068
Ey=0.95 Ez=0.04 =-1.4
-250
-200
-150
-100
-50
0
I , A
*e-1
2
403020
Zc, mm
100 eVZg = 41
Zc = 34
-1
+0.4
+1
0
Electric field at E = 100eV Erepresentation
Horizontal
Ve
rtic
al
-0.4
Ellipticity, =0.04
Polarization selector position: Zc = 34 mm, Zg = 41 mm
(aperture 4 mm) S1=-0.97 S2=0.011 S3=0.082
Ey=0.98 Ez=0.04 =-1.44
-250
-200
-150
-100
-50
0
I , A
*e-1
2
403020
Zc, mm
100 eVZg = 31
Zc = 31
-1 +1 -0.4
+0.4 Electric field at E = 100 eV
Horizontal
Ve
rtic
al
Ellipticity, =0.33
Polarization selector position: Zc = 31 mm, Zg = 31 mm
(aperture 14 mm) S1=-0.77 S2=0.08 S3=-0.57
Ey=0.93 Ez=0.31 =1.43
Polarimetry 100 eV ellipse
Transport and conditioning optics
BPM
P1
MONO
EXIT SLITS
GAS CELL
Helicity selector
P2
Intensity monitor
Light spot
Energy range 3- 1600 eVEnergy resolution E/E ≈ 3000 (peak 5000) at vertical slit (typically 30 μm) x 400 μm (variable) Variable
divergence (maximum, variable) 20 m vert x hor
ellipticity variable horizontal/vertical (typically in the range 1.5 – 3.5, Stokes parameters (normalized to the beam intensity) S1 0.5 - 0.6, S2 0 - 0.1, S3 0.75 -0.85 )
helicity variable (typical value for rate of circular polarization P or S3 0.75 – 0.95)
Source 4 m HxV
Mirrors in sagittal focusing reduction of slope errors effects in the dispersion plane
plane-grating-plane mirror monochromator based on the Naletto-Tondello configuration
Examples and experimental arrangements at BEAR (Bending magnet for Absorption Emission and Reflectivity)
Bulk materials
Surfaces
Interfaces
Absorption
Reflectivity
Fluorescence
Luminescence – XEOL
Diffuse scattering
Experimental arrangements
BEAR (Bending magnet for Emission Absorption Reflectivity) beamline at Elettra
Experimental/scattering chamber
(Positive -Differentially pumped joints)
Goniometers
Sample manipulator
6 degree of freedom
VIS Luminescence
monochromator
Detection
e- analyser / photodiodes
(2 solid angle)
M,A 0.001°A 0.01°S 0.05°C 0.1°
Rotation around beam axis any position of E in the sample frame
Optical constants of rare hearths
1 0 - 2 1 0 - 1 1 0 0 1 0 1 1 0 2 1 0 3 1 0 4 1 0 5 1 0 6
p h o t o n e n e r g y ( e V )
1 0 - 1 3
1 0 - 1 2
1 0 - 1 1
1 0 - 1 0
1 0 - 9
1 0 - 8
1 0 - 7
1 0 - 6
1 0 - 5
1 0 - 4
1 0 - 3
1 0 - 2
1 0 - 1
1 0 0
1 0 1
1 0 2
k
K
L 1 , 2 , 3
M 4 , 5
N 4 , 5
O 2 , 3
D r u d e E n d r i z
L a r r u q u e r t
C u r r e n t
H e n k e
C h a n t l e r
E x t r a p o l a t i o n
See f.i. Mónica Fernández-Perea, Juan I. Larruquert, José A. Aznárez1, José A. Méndez Luca Poletto, Denis Garoli, A. Marco Malvezzi, Angelo Giglia, Stefano Nannarone, JOSA to be published
Interfaces & surface physics in periodic structures(multilayer optics)
(Optical technology Band pass mirrors)
At Bragg Z dependent standing e.m. field establishes both inside the structure and at the vacuum-surface interface modulated in amplitude and position
ML : Artificial periodic stack of materials
Z
ultra-thin deposited films
buried interface spectroscopy•Devices of use in spectroscopy
BRAGG
See also poster P III 26
Standing waves & excitation
Physics of mirror/Reflection
Spectroscopy of interfaces
Scanning through
Bragg peak
In energy or angle
Local modulation of excitation
Photoemission, Auger, fluorescence, luminescence etc..
Si Mo
Si
Cr/Sc Cr-Oxide interface (As received )
Qualitative analysis-Opposite behavior of Cr and Sc-Different chemical states of the buried Sc-Two signals from oxygen: one bound to Cr at the surface, the second coming from the interface- Carbon segregation at the interface
Cr2
O3
(6 Å)
Cr
(15 Å)
Sc
(25 Å)
X 60
573 eV
Ru (Clean) -Si buried interface
silicide
Inte
nsity (
arb
. units)
620600580560Kinetic energy (eV)
740736732728
h = 838 eV
Ru 3d
Mo 3d
Si 2p
Peak
are
a (
arb
. units
)
7.57.06.56.05.55.0Grazing angle (°)
1st component
2nd
componentRu 3d
Inte
nsity
(ar
b. u
nits
)
290288286284282280278Binding energy (eV)
Ru 3d
1st
component
2nd
component background
Ru
(15 Å)
Si
(41.2 Å)
Mo
(39.6 Å)
Angular scan through the Bragg peak
at 838 eV
X 40
Model – Ru-Si interface• Interface morphology
• Calculation of e.m. field inside Ml
•Photoemission was calculated, (Ek= h - EB)
Minimum position and lineshape depend critically on the morphology profile
Ru
Ru-Si
Mo-Si ML & i.f. roughness
Wavelength [nm]
Mo/Si61.2 %
58.4 %
Motivation role of ion kinetic energy and flux during ML growth
Ions EK: 5 eV (1st nm), 74 eV > 1nm Controlled activation of surface mobility
Ion assistance
ML (P 8 nm, 0.44) Performance- R (10°)
Performance & diffuse scattering
Performance differences are to be related to interface quality
Diffuse scattering around the specular beam was measured
KS= Ki + qZ + q//
diffuse scattering - MLs
f.i. Stearns jAP 84,1003
RqiRHq
q
z
edeq
qSz
z
//
2222 )(
2
1
2// eR1
)(
In plane Fourier transform on q// of potential
Single interface – Autocorrelation function
MLs : S(q) two terms
I.f.roughnes produces diffuse scattering around the specular beam
I.f.roughnes can/can not be coherently correleted through the ML
Description on a statistical base, ….fractal properties
R
eRHyyxxH
12)()','( 2
KS= Ki + qZ + q//
• incoherent scattering by single interfaces
• correlated/coherent scattering among i.f. (interlayer replica of roughness)
See f.i. Stearns JAP, 84, 1003, 1998
Diffuse scatteringDetector
qdetector 0.003 nm-1
At 0.48 nm (13.1 eV)
Incident beam
Divergence
qdiv 0.0005 nm-1/m
At 0.48 nm (13.1 eV)
- scan
Rocking scan
Mo/Si
Mo-Si ML diffuse scattering
Ion assistance
In plane correlation function - absence of interface correlation
hRRC 22 /exp)(
ξ , correlation length h, fractal dimension/jaggedness
Correlation function
ξ=400 Å
ξ=200 Å
ξ= 300 Å
ξ=120 Å
See also poster Borgatti et al. P III 17
Pentacene on Ag(111)
Premise about C22H14/substrates•He scattering on pentacene deposited by hyperthermal beams 1ML planar
•Morphology and electronic properties ( delocalization of the electrons) transport properties highly anisotropic;
•on Metals: nearly planar orientation a condition hindering the formation of an ordered overlayer;
on semiconductors/oxides: SiO2 standing GeS lying.
Chemisorption morphology - tilt angle & electronic structure
( Concentrating on 1 Mono layer )
See also poster Pedio et al. P II 33
C3 symmetry
Oblique cell Periodicity (6 x 3) ,
1 monolayer
Surface Cell( By He scattering )
Danışman et al. Phys. Rev. B 72, 085404 (2005)
XAS
298296294292290288286284
Photon Energy (eV)
31 5
6
4
2
0.3 ML
0.5 ML
1 ML
2 ML
3 ML
Multilayer
C K-edge
gas phase13 56
4
2
10°
27°
25°
resonances
LUMO
LUMO+1
Redistribution of the oscillator strength in the C1s – LUMO excitation region (1-3 of gas phase)
(At magic angle 54.7°)
Tilt angle
Gas phase XAS
(Alagia et al.JChemPhys 122(05)124305)
VB photoemissionLDA calculations C22H14/Al(100)
Simeoni et al. S.Science 562,43 (2004)
Redistribution of states upon chemisorption
HOMO-LUMO gap increasing-4 -3 -2 -1 0 1
Kinetic Energy (eV)
Photoemission
0.3 ML
0.5 ML
1 ML
2 ML
3 ML
3b2g
2au
3b3g
clean
h=30 eV
3b2g
2au
3b3g
EV
0
6.6 eV
7.4
8.3
EF
abs
orpt
ion
coe
ffic
ient
a. u
.
310305300295290285280Photon Energy (eV)
Nex_185_int Nex_186_6_int Nex_187_6_int Nex_188_6_int Nex_189_int
C=0°
C=90°
1 Ml C22H14/Ag(111)
resonances
resonances
xM
yM
zM
bea
m
XAS 1 ML - precession scan
ε= EV/EH = 0.29
Dichroism/Bond directionality & Tilt angle of the molecule
i= 10°
XAS – 1 ML - deconvolution
0.5
0.4
0.3
0.2
0.1
0.0
abso
rpti
on
co
effi
cien
t a.
u.
294292290288286284
Photon Energy (eV)
C=54.7°
data fit
i
iCi
Step
1 Ml C22H14/Ag(111)
A
BE
ACA BCB
CCC
C
D
F
2 2 2
22 2 2
2 2 2 2 2
2 2 2
cos sin 2 cos sin cos sin sin cos cos cos
cos sin 2 cos sin cos sin sin
2 cos sin 1 cos cos sin
sin sin cos cos cos sin sin
H
C C C C M M
C C C C
C C C C
M M
E p p E
Precession scan - FormulaeFit function for Single domain
Fit parameter: θ (polar angle of dinamic dipole )
0.5
0.4
0.3
0.2
0.1
0.0
abso
rpti
on
co
effi
cien
t a.
u.
294292290288286284Photon Energy (eV)
C=54.7°
data fit i
iCi
Step
1 Ml C22H14/Ag(111)
A
BE
ACA BCB
CCC
C
D
F
P
Tilt angle - Fit Coverage Tilt angle precession scan
Tilt anglePolar scan
0.3 25° +/- 5°
0.6 27° +/- 5° 28° +/- 4°
1.0 10° +/- 4° 8° +/- 4°