optimizing sip test cost with a platform approachselected based on different company testing...
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ni.com
Optimizing SiP Test Cost with a Platform Approach
SiP Conferences China 2018
Pearl He
APAC Semi BDM Manager – National Instruments
ni.com
NI equips engineers and scientists with systems that
accelerate productivity, innovation, and discovery.
Mission Statement
7,500+
EMPLOYEES
50+ COUNTRIES
$1.23BILLION
IN 2016
OVER 18%
INVESTMENT IN R&D
35,000+
CUSTOMERS WORLDWIDE
Long-Term Track Record of Growth
Re
ve
nu
e in
mill
ions U
SD
$0
$200
$400
$600
$800
$1,000
$1,200
$1,400
'87 '88 '89 '90 '91 '92 '93 '94 '95 '96 '97 '98 '99 '00 '01 '02 '03 '04 '05 '06 '07 '08 '09 '10 '11 '12 '13 '14 '15 '16
The World of Converged Devices
More capability defined in software
Functions change rapidly
Increasingly complex to design and test
Unique Attributes of Smart Devices - Common Test Needs
More functionality
Ensure high reliability
Lowest cost
Fast time to market
CONVERGENCE LOWER PRICE RAPID CHANGE
Markets for System-in-Package
RF and wireless devices
Integrated Passive Devices
Solid-state drives (SSDs)
Automotive applications
IoT for wearable and machine to machine (M2M) products
Power modules
Source: https://www.amkor.com/go/SiP
System-in-Package Implications on Test
Diverse markets and applications
Demand for plug-and-play
Demand for lower total cost
High volumes and rapid ramp
cycles
Economics of traditional test solutions disrupted!
SiP testing lacks of standard test coverage metrics,
choice of tests to be applied at SiP has been
selected based on different company testing
strategy.
No Industrial Standard
1. Complexity of functions leads to complexity of
test
2. Test mode may not be supported, system level
of test is required.
Challenges with SiP Production Testing
Long Test Time Comparing to Traditional SOC
SiP load boards resemble that of a reference design
of the end-application device
Higher Complexity Load Boards
Communicating with an SiP usually use device
specific protocols – which is usually an IP developed
by the SiP maker but may not be readily available to
the test vendor.
High-level communication (Protocol Support)
Different SiP Test Scenarios
Traditional ATE Custom System Custom System
Parametric etc. traditional ATE System Level Test Required
Considering different scenarios needs to balance cost and time!
LBDUT DUT
Build a system on loadboard
System Level Test Required
DUT is a system
DUT
Different Solutions to Architect SiP Testing
Stability and Reliability
User Friendly
In House Design Solution
• Not reliable for production
environment
• High cost
• Need time to build and design
Handler Centric Solution
• Using system level test handler software
with traditional instruments
Traditional ATE
• Traditional ATE HW+SW Solution
• Hard to scale for customization
Open Architecture Platform
• Easy to extension and customization
• NI STS for production environment
Vendor Strategies for Test and Measurement
C L O S E D
• “Vendor knows best”
• Fixed-functionality
• Closed ecosystem
• Customer pays
P L A T F O R M
• “Customer knows best”
• Customizable solution
• Open, vibrant ecosystem
• Customer designs
NI SERVICES AND SUPPORT
NI MODULAR HARDWARE
ONE-PLATFORM APPROACH
Support 700+ Field Engineers
700+ Support Engineers
50+ Worldwide Offices
Open Connectivity10,000+ Instrument and Device Drivers
1,000+ Sensor and Motor Drivers
Add-Ons400+ Software Add-Ons
5M+ Tools Network Downloads
Community300,000+ Online Members
450+ User Groups
9,000+ Code Examples
Partners1,000+ Alliance Partners
Industry-Leading Technology Partners
Academia8,000+ Classrooms Worldwide
TH
IRD
-PA
RT
Y S
OF
TW
AR
ET
HIR
D-P
AR
TY
HA
RD
WA
RE
NI PRODUCTIVE
DEVELOPMENT SOFTWARE
NI E
CO
SY
ST
EM
NI
EC
OS
YS
TE
M
PXI System Overview
PXI Backplane
• Data Transfer
• Timing
• Synchronization
• Triggering
PXI Chassis
• Power
• Cooling
• System Monitoring
• Enclosure
PXI I/O Modules
• 600+ Products
• RF, DC, DIO…
Multicore
Embedded
Controller
Broad Modular Instrumentation Portfolio
Multifunction I/O
FPGA / Reconfigurable I/O
Digital I/O
Analog Input / Output
Vision and Motion
Counter / Timer / Clock
DAQ and Control
Oscilloscopes
High-Speed Digital I/O
DMM & SMU
Signal Generators
Switching
RF Analyzers & Generators
Instrumentation
GPIB, USB, LAN
RS232 / RS485
CAN, LIN, DeviceNet
SCSI, Ethernet
VXI - VME
Boundary Scan / JTAG
Interfaces
NI Semiconductor Test Software▪ Suite of software for test development, execution, and debug
▪ TestStand + TestStand Semiconductor Module
▪ Sequence Editor/Operator Interface
▪ Binning, Handler Integration, Pin/Channel Map, STDF, Multisite
▪ Built-in steps for common measurements (e.g. continuity, Vcc, etc)
▪ Open interface to integrate 3rd party instruments with multi-site support
▪ Digital Pattern Editor
▪ Code module development with NI LabVIEW/LabVIEW FPGA or C#/.NET
▪ STS Calibration and Diagnostics Software
Common Platform that Scales
NI STS T1NI PXI NI STS T4NI STS T2
PXI Chassis and Controller
PXI Instrumentation and Measurement Software
LabVIEW or C# (Code Module Development) and TestStand (Test Management)
STS Standardized Docking and Cabling Interface
ni.com
• The NI STS T4 is used for FEM Production Test
• Dual sites on Turret Handler
• STS Benefits:
• Roadmap support to 5G
• Short Test Time
• Lower tester capital cost
ni.com
• The NI STS T1 is used for SiP(WiFi +BT) Test
• Quad site tester that communicates to a custom-designed handler
• STS Benefits:
• Vendor-supported ATE platform
• Test time: 17s vs 65s rack & stack solution
• Lower tester capital cost
• Zero footprint
ni.com
• Traditional testers do not have parallel capacitance/inductance instruments at low cost
• Traditional boxes missing factory integration features
• Production-ready Operator Interface
• Handler Control
• Binning
• Standard Datalogging (STDF)
• System calibration and diagnostics
STS T2▪ Manipulator Support
▪ Electrical interface
▪ Docking interface
Case Study : IPD Production Test
STS T2
Integrated Passive Devices
Summary
The diversity of SiP markets and applications require test solutions that can scale to meet targeted needs.
Traditional approaches for IC package and module test over-serve some requirements while not meeting others.
A platform approach to SiP test allows customers to use the elements they need while avoiding the elements (and costs) they don’t.
When these elements are available on the same platform or within the ecosystem they can be effectively leveraged to reduce overall cost of test.
P L A T F O R M
• “Customer knows best”
• Customizable solution
• Open, vibrant ecosystem
• Customer designs