plasma diagnosticsliterature on diagnostics (general): ! h r griem, plasma spectroscopy (mcgraw-hill...
TRANSCRIPT
Richard Engeln
This set of slides consists of a collec/on of short presenta/ons on different topics, all related to plasma diagnos/cs. During my presenta/on I will use the first ‘introductory’ presenta/on as a guideline. I will discuss some diagnos/cs in more detail, and make a selec/on of the applica/ons of diagnos/cs, depending on the audience.
Plasma Diagnostics - how to study molecule formation in plasma ? -
“ your working gas mixture ≠ input gas mixture” (at high dissociation degree)
quote from Prof. J. Winter during his lecture during
the 2005 Summer School on Low Temperature Plasma Physics: Basics and Applications
Introduction
Molecule Formation in Plasma
Plasma source
O2 plasma expansion
substrate
O2 plasma impinging on a substrate
taken from: A. Lebéhot et al. in ‘Atomic and Molecular Beams’, ed. R. Campargue
Introduction
N2 plasma with O2 injected in the background
O(3P)atm + NOads → NO2{2B1} → NO2{2A1} + hν
Molecule Formation in Plasma Introduction
H2r,v detection via QMS detection of H-
H2 + e --> H- + H
over-population
Molecule Formation in Plasma Introduction
Dark (dense) clouds
! 10-30 K / 104-108 part./cm3
! Universal molecule factory
Diffuse (translucent) clouds ! 40-100 K / 100 part./cm3
! Unknown absorption features
Molecule Formation in Plasma
(from: H. Linnartz, CRD meeting (2004))
Introduction
" What particles are arriving at the surface ?
" In which state are the particles arriving ?
" New molecules are generated: - electronically and/or ro-vibrationally excited ? - substrate material and temperature dependence ?
" Is there flux dependence on the generation
process ?
Questions when studying molecule formation in plasma ? (when in contact with a surface)
Shuttle glow
Excited NO2
Introduction
" What particles are arriving at the surface ?
" In which state are the particles arriving ?
" New molecules are generated: - electronically and/or ro-vibrationally excited ? - substrate material and temperature dependence ?
" Is there flux dependence on the generation
process ?
Questions when studying molecule formation in plasma ? (when in contact with a surface)
Shuttle glow
Excited NO2
Introduction
What is needed to answer these questions ?
" (VUV) Laser Induced Fluorescence
- relative densities, + spatial resolution
" Fourier Transform IR/UV absorption
- line of sight, + absolute densities, + large λ-range (overview spectrum )
" (Cavity Ring Down) absorption
- line of sight, + (very) high sensitivity
" (spontaneous) Raman spectroscopy
- ‘low’ sensitivity, + every molecule Raman active, + spatial resolution
Gas-phase optical diagnostics for the detection of stable molecules and atomic/molecular radicals
Introduction
Plasma Diagnostics (optical)
Optical diagnostic Parameters Examples
Doppler LIF w, T, n Ar-metastable
Two-photon LIF w, T, n H atom
VUV LIF n(v,J), T H2r,v
IR absorption n(v,J), T NO, N2O, NO2
Cavity Ring Down absorption n(v,J), T NH, NH2, NH3
Literature
On diagnostics (general):
! H R Griem, Plasma Spectroscopy (McGraw-Hill Book Company, New York, 1964)
! W Demtröder, Laser Spectroscopy,Basic Concepts and Instrumentation edited by F P Schäfer
(Springer-Verlag, Berlin, Heidelberg, New York, 1981)
! K Muraoka, K Uchino, M D Bowden, Plasma Physics and Controlled Fusion 40, 1221 (1998)
! J-P E Taran, CARS spectroscopy in Applied Laser Spectroscopy, edited by W Demtröder and M
Inguscio (Plenum, New York, 1990)
! G Berden, R Peeters, G Meijer, Int. Rev. Phys. Chem. 19, 565 (2000)
! G. Berden and R. Engeln, Cavity Ring-Down Spectroscopy, Techniques and Applications,
Blackwell Publishing Ltd, United Kingdown (2009)
Laser Induced Fluorescence spectroscopy
Laser Induced Fluorescence (LIF)
Ø number of laser photons na absorbed in unit volume and time:
Ø number of fluorescence photons Nf (λik) originating from V:
Ø signal Sf:
n I na li L l=σ
N n V q I n VAA Rf a f li L l
ik
i= = ⋅
+σ
S N T q Gf f ph ph= ⋅ ⋅ ⋅ ⋅Ω / ( )4π λ
lf nS ∝
V laser
IL
l
i
k
j
σli.IL
Ail
Aik
R
Ø sensitive
Ø extra info from time behaviour
Ø experimentally straightforward
Ø possibility of 2D-imaging
Ø not quantitative
Ø depending on gas composition
(quenching)
LIF on ground-state atoms: ü ground-state atoms have large energy spacings e.g. H: E(n=2) - E(n=1) = 10.2 eV ü species selectivity requires high energetic photons (H: λ <121.6 nm)
experimentally demanding techniques for VUV-generation
Laser Induced Fluorescence (LIF)
Advantages Disadvantages
How to detect the hydrogen atom
with LIF ?
How to detect the hydrogen atom
in the groundstate with LIF ?
Ø no demanding VUV-generation
Ø non-resonant fluorescence detection
possible
Ø self-absorption can be avoided
Ø low 2-photon cross sections require
high laser intensities
Ø 2-photon cross sections often not
known
l
i
k
j
Ail
Aik
R
σli(2).IL2
n=1
3
2
4
486
486
486
656
656
195
193
2 x
205
nm
2 x
243
nm
122
H excitation schemes
2 x
243
nm
2 photon LIF
Advantages Disadvantages
Quantities deduced from LIF
Ø integrated intensity: n
Ø Doppler width: T
Ø Doppler shift ν - ν0: v
MkT
cD ⋅=
Δ 2ln81νν
97490 97492 97494 97496 97498 97500 975020
100
200
300
400
500
Area ~ n
νlif
δν ~ T
νth
Δν ~ v
Fluo
resc
ence
sig
nal (
a.u.
)
Frequency (cm-1)
Laser Induced Fluorescence (LIF)
Applications: Ø deposition of a-C:N Ø plasma etching (photo-resist)
Applications: Ø fast deposition of a-Si:H Ø H-source Ø surface passivation
1s
3s,d
2p Hα
205 nm
205 nm 656 nm
3p
3s
207 nm
207 nm 745 nm
2p
monitoring H monitoring N
2 photon LIF on atoms
(VUV) LIF on H2 molecules
Excitation from H2(X, v=0) to H2(B)
Photons with energy ≅ 11 eV (λ ≅ 110 nm, Vacuum UV)
Fluorescence of H2 in B-state
λ in the Vacuum UV
Absorp'on spectroscopy
absorption
Absorption spectroscopy
Lambert-Beer : Absorption:
If is small:
]exp[)()(0
lIIνκνν −=
ννσκ ),( Jvn=
lνκ l
II
νκ=
Δ
0
Light Source
)(0νI
)(νIl
Sample
IR laser absorption
spectroscopy
IR absorption
IR laser absorption
spectroscopy
IR absorption
1306.0 1306.2 1306.40.7
0.8
0.9
1.0
Tran
smis
sion
Wavenumber [cm-1]
1306.0 1306.2 1306.40.7
0.8
0.9
1.0
CH4
N2O H2O
Trace gas detection
Fourier Transform absorption spectroscopy
189500 190000 190500 191000
-0.015
-0.010
-0.005
0.000
0.005
0.010
0.015
0.020
inte
nsity
(a.u
.)
mirror position (cm-1)
interferogram
FTIR absorption
vessel
arc
window
interferometer
detectors
sample compartiment
glowbar
13120 13125 13130 13135 13140 13145 13150 13155 13160 13165 13170
0.030
0.032
0.034
0.036
vesselfinalabsorption / graph 3
inte
nsity
(a.
u.)
frequency (cm-1)
background sample
O2 FTIR measurement in a vessel
FTIR absorption
vessel
arc
window
interferometer
detectors
sample compartiment
glowbar
O2 FTIR measurement in a vessel
13120 13130 13140 13150 13160 13170-0.005
0.000
0.005
0.010
0.015
0.020
0.025
0.030
13120 13130 13140 13150 13160 13170-0.005
0.000
0.005
0.010
0.015
0.020
0.025
0.030
abso
rptio
n
frequency (cm-1)
FTIR absorption
ü Multiplex advantage
ü Very large wavelength range
FT IR absorption IR laser absorption
ü Very high wavelength resolution
ü High sensitivity
ü Low wavelength resolution
ü Sensitivity
ü Very small wavelength range
absorption
+
-
Homo-nuclear diatomic species not detectable in IR
Sensitivity
(pulsed lasers)
è
Example: è Alternative schemes:
Fourier Transform spectroscopy (multiplex, but low sensitivity) Cavity Ring Down spectroscopy (high sensitivity)
310−≥lνκ
3
0
10−≥Δ
II
m 1.0=l218 m 10−=σ
-316 m 10),( ≥Jvn
-318
,m 10),(∑ ≥=
Jvtot
JvnN
absorption
ü absorption per unit of pathlength (cavity loss):
ü non-intrusive and remote ü high sensitivity due to effective multipassing ü absorption per unit of ü direct absorption –> line of sight measurement
Sensitive direct absorption technique (A. O’Keefe and D.A.G. Deacon, Rev. Sci. Instrum. 59 (1988) 2544)
dLnRc /)1(/1 σ+−=τ
CRD absorption
Basic scheme of the pulsed CRD spectrometer
1τ =c1-R nσL+d d
Cavity loss
=τc
d(1-R+nσL)
Ring-down time
CRD absorption
Performing a pulsed CRD experiment
Ring-down transient CRD spectrum
frequency (cm-1)
Rin
g-do
wn
time
(ns)
Inte
nsity
(a.
u.)
13100 13101 13102 0
1000
500
1500
time (ns) 0 1000 2000 3000 4000
CRD absorption
Performing a pulsed CRD experiment
CRD absorption spectrum
frequency (cm-1)
Cav
ity lo
ss
(10-
5 1/
cm)
13100 13101 13102 0
4
2
5
3
1
1τ =c1-R nσL+d d
If cavity length is 45 cm, determine R. 1. R = 99 % 2. R = 99.9 % 3. R = 99.99 % 4. Not enough information
Cavity loss (1/cm)
1τ =c1-R nσL+d d
baseline
absorption spectrum
CRD absorption
+ optical technique
+ independent of intensity
+ direct absorption measurement:
-- but: line-of-sight
+ high sensitivity due to effective multipassing
+ pulsed light sources: spectral range into the UV
+ experimentally straightforward (tunable laser, highly reflecting
mirrors, PMT, ‘fast’ and ‘deep’ digitizer)
high potential for diagnostics in plasmas
CRD absorption
ETP setup
Plasma created at high pressure (~400 mbar) in cascaded arc
plasma source
Expansion into low-pressure chamber (0.2 mbar)
+ injection of e.g. SiH4
Plasma in interaction with surface, leading to e.g. deposition or
etching
cascadedarc plasma source
expanding plasma
substrate holder
PMTfilter
R
laser pulse(tunabledye-laser)
protection flow (Ar)
R
precursorinjection
oscilloscope
Ar
CRD for the detection of SiH during a:Si-H deposition
CRD absorption during deposition
CRD spectrum of SiH measured during a:Si-H deposition
CRD absorption during deposition
nσL/d
CRD spectrum of SiH measured during a:Si-H deposition
(1-R)/d
CRD absorption during deposition
412,5 413,0 413,5 414,0 414,5
0
50
100
150
Experimental
Simulated (LIFBase)
R2(14.5)
Q1(14.5)
Q1(11.5)
Q2
Q1
Tvibr = 3000KTrot(v=0) = 1800K
Abs
orpt
ion
(x10
-6)
Wavelength (nm)
SiH detection: A 2 Δ à X 2Π, 405 – 430 nm
line width
temperature
absorption
cross-section
density
+
CRD absorption on SiH
TALIF spectroscopy on
H atoms
gas
stationaryshock wave
supersonic flowM > 1
subsonic flowM < 1
Mach diskM = 1
Cascaded arcPlasma expansion
cathode (×3)anode
(nozzle)cathodes (3)
gas inlet
Ar/H2 plasma expansion
Cascaded arc
anode (nozzle)
1 10 1001020
1021
1022
20 Pa 100 Pa
H2 d
ensi
ty (m
-3)
axial position (mm)
Rayleigh scattering on H/H2 plasma expansion
1/z2
Ø produce 205 nm via THG of a Nd:YAG
pumped dye laser
Ø from spectral scans data on: n,T,v,f(v)
1s2S
3s2S
2p2P
205.14 nm
Hα 656.5 nm
3d2D3p2P
2s2S
0
10.2
12.1
13.6ion
ener
gy (e
V)
121.56 nmLyman α
slitmaskflitergates PMT
205 nm205 nm
cascaded arc3.5 slm HI=40A, V=150V
2
TALIF detection of H atoms
1 10 1001019
1020
1021 100 Pa 20 Pa
Den
sity
(m-3)
z (mm)
H atom density along the jet axis (TALIF)
1 10 100
1019
1020
1021
nozzle length 6 mm 14 mm
H d
ensi
ty (m
-3)
axial position (mm)
Effect of nozzle-length on H density
-6 -4 -2 0 2 4 6
0
1
2
3
4
5
nozzle
arc
long
nozzle
arc
shortshort nozzlelong nozzle (x5)
H fl
ux d
ensi
ty (1
025 m
-2s-1
)
radial position (mm)
Effect of nozzle-length on H flux
-15 -10 -5 0 5 10 15
0.0
0.2
0.4
0.6
0.8
1.0
nozzle
arc
8
nozzle
arc
8large diam. nozzleshort nozzle
H fl
ux d
ensi
ty (1
025 m
-2s-1
)
radial position (mm)
Effect of nozzle-width on H flux
2H Hrv2
HH
H22H Hrv
2
J
nozzle
Conclusions
1. Large influence of nozzle geometry on
H flux
2. Loss of H atoms due to surface
association (volume association far
too slow)
H flux: ΦH > 1021 s-1
Dissociation degree = 0.4
P. Vankan et al., Appl. Phys. Lett. 86 (2004) 101501
S. Mazouffre et al., Phys Rev. E 64 (2001) 066405
loss of H atoms = production of
H2rv at the surface
Doppler-‐LIF spectroscopy on
Ar atoms
+
+
SiH3 reflection ~85% SiH3 reaction ~15%:5-fold bonded Si SiH3 surface diffusion:strong bond formation with danling bond
dangling bond creation byEley-Rideal H-abstractiondangling bond creation by ion
dangling bond surface diffusion
Plasma chemistry
Plasma creation
Material processing
Expanding Thermal Plasma (ETP)
Ar plasma expansion
Doppler LIF
Ar density as function of distance from the exit of the source
1 10 1001020
1021
1022
Ar
den
sity
(m-3)
Axial position (mm)
42 Pa 100 Pa
Rayleigh scattering
Doppler LIF experimental setup
Doppler LIF
BSBS
chopper
Lock inamplifier
diode laser
Argonlamp
FabryPerot
diodes
PMT
filter
reference
trigger
z-axis
1 2 3 4 5 6 7 8 9 10 11
0.0
0.5
1.0
Argon lamp
Fabry Perot
LIF signal
inten
sity (
a.u.
)
piezo voltage (a.u.)
Doppler LIF
Typical result of a Doppler LIF measurement
-1 0 1 2 3 4 5 60.00.51.01.5 z=174 mm
velocity (km/s)
inte
nsi
ty (
a.u
.)
0.00.51.0 z=100 mm
0.0
0.5z=59 mm
Doppler LIF Ar velocity distribution functions
10-3 10-2 10-1
100
1000
velo
city
(m/s
)
z (m)10-3 10-2 10-1
1000
z (m)T
(K)
calculated with:
20 Pa
Ar atom velocity Ar atom temperature
γ = 1.4 (theoretically: 5/3 for mono-atomic gas) zref = 0.0025 m T0 = 6000 K
Doppler LIF
IR absorp*on spectroscopy on
N2/O2 plasma
N2/O2 plasma setup (IR diode laser absorption spectroscopy)
pumps
ArN2
Ar, N2
H2, O2
p = 20 Pa
window
retroreflector
gas inlet
diode laser
PMT
IRMA system
QMS
pump
I = 55 A
window window
window
N2 plasma with O2 injected in the background
Introduction
O(3P)atm + NOads → NO2{2B1} → NO2{2A1} + hν
Molecule Formation in Plasma
NO formation in an Ar-N2-O2 plasma
0 10 20 30 40 50 60 70 80 90 1000
1
2
3
4
5
6
0.0
1.0
2.0
3.0
100 90 80 70 60 50 40 30 20 10 0
20 Pa
NO
den
sity
(1019
m-3)
Percentage of O2 (%)
105 Pa
NO
den
sity
(1020
m-3)
Percentage of N2 (%)
N + NO → N2 + O N + NOads → N2O
0 10 20 30 40 50 60 70 80 90 100
0
1
2
3
4
5
6
N2O
den
sity
(1018
m-3)
Percentage of O2 (%)
20 pa 105 Pa
100 90 80 70 60 50 40 30 20 10 0
Percentage of N2 (%)
N2O formation in an Ar-N2-O2 plasma
N2O only formed at low O2 flow
150 200 2500.0
0.5
1.0
1.5 O2 off after 3 min
N2 off after 3 min
NO
den
sity
(1019
m-3)
Time (s)
Time behavior of NO formation in Ar-N2-O2 plasma
τres≅1s no O2 flow ⇓
no NO formation
no N2 flow ⇓
NO formation >> τres
N on/in the surface (no O storage)
0 50 100 150 200 250 300 3500
1
2
3 O2 off after 1 min
O2 off after 5 min
N2O
mol
e fra
ctio
n (1
0-4)
Time [s]
Time behavior of N2O formation in an N2-O2 plasma
no O2 flow ⇓
N2O formation >> τres
τres≅1s
NO on/in the surface (depends upon O2 conditioning)
Conclusions
1. Input gas mixture, N2 and O2, changes into a
mixture of N2, O2 and NO, N2O and NO2.
2. Time-resolved measurements show that
surfaces become saturated with N atoms and
NO radicals.
3. In Ar-NO plasmas, up to 90% conversion of NO
into N2 and O2
Absorp'on spectroscopy IR absorp'on spectroscopy on N2/O2 plasma
VUV-‐LIF spectroscopy on
H 2r,v molecules in plasma
Why study hydrogen plasma expansions? (produced from a cascaded arc)
/ Plasma & Materials Processing PAGE 1 9/7/12
1. Use of H2 gas in processing plasma application - etching and cleaning - passivation during deposition
2. Astrophysical interest
- ‘hot’ H2, formed at grains through surface association, and acts as precursor in astro-chemistry
3. Fundamental study of H2/HD/D2 Lyman transitions
- extension of database 4. The cascaded arc might be used as H- ion source, because
of high fluxes of H2r,v at low Te (around 1 eV)
Plasma source and expansion
/ Plasma & Materials Processing PAGE 2 9/7/12
I = 40 – 60 A
P = 5 – 10 kW
Φarc = 3 slm
I = 40 – 60 A
P = 5 – 10 kW
parc = 0.2x105 Pa
pbg = 100 Pa
Plasma expansion
/ Plasma & Materials Processing PAGE 3 9/7/12
T = 2000 K T = 1000 K T = 6000 K
T = 400 K
/ Plasma & Materials Processing PAGE 4
PLEXIS setup
PLEXIS setup
/ Plasma & Materials Processing PAGE 5 9/7/12
Laser table Nd:YAG
(450 mJ/shot @ 355 nm) dye laser
(50 mJ/shot @ 460 nm) ( 8 mJ/shot @ 230 nm)
Vacuum chamber cylindrical (2m x 0.3m) 9 Pa / 3000 sccm H2
• Movable plasma source and substrate
• Axial magnetic field Bmax = 0.2 T
Ar/H2 plasma expansion
PAGE 6 9/7/12
Ø Produce 205 nm via THG of a Nd:YAG pumped dye laser
Ø From spectral scans data on: n,T,v,f(v)
1s2S
3s2S
2p2P
205.14 nm
Hα 656.5 nm
3d2D3p2P
2s2S
0
10.2
12.1
13.6ion
ener
gy (e
V)
121.56 nmLyman α
slitmaskflitergates PMT
205 nm205 nm
cascaded arc3.5 slm HI=40A, V=150V
2
Two photon Absorption LIF (TALIF) on atomic hydrogen
PAGE 7 9/7/12
slit mask filter
gated PMT
1 10 1001019
1020
1021
20 P a 100 P a
Den
sity (m
-‐3)
A x ia l pos ition (mm)
Mazouffre et al. Phys. Rev. E 64, 016411 (2001)
H atom density in H2 plasma expansion (TALIF)
PAGE 8 9/7/12
VUV-LIF detection of H2r,v
H2 energy scheme
Ø X à B transition in H2 (~11 eV) Ø Detection of fluorescence in the
VUV range Ø Excitation with 120 – 165 nm
photons, produced via SARS
AS
8A
S9 A
S7
AS
7
AS
6
AS
5 AS
4 AS
3
AS
2 AS
1
120 140 160 180 200 220
10-4
10-3
10-2
10-1
100
101 depleted pump
Ener
gy (m
J)
wavelength (nm)
Excitation and detection
PAGE 9 9/7/12
SARS technique
/ Plasma & Materials Processing PAGE 10 9/7/12
Four-wave mixing process
M. Spaan, A. Goehlich, V. Schultz-von der Gathen, H. F. Döbele, Applied Optics 33 (1994) 3865 T. Mosbach, H. M. Katsch, H. F. Döbele, Rev. Sci. Instrum. 85 (2000) 3420 P. Vankan, S.B.S. Heil, S. Mazouffre, R. Engeln and D.C. Schram, H. F. Döbele, Rev. Sci. Instrum. 75 (2004) 996
VUV-LIF detection of H2r,v
H2 energy scheme
Ø X à B transition in H2 (~11 eV) Ø Detection of fluorescence in the
VUV range Ø Excitation with 120 – 165 nm
photons, produced via SARS
AS
8A
S9 A
S7
AS
7
AS
6
AS
5 AS
4 AS
3
AS
2 AS
1
120 140 160 180 200 220
10-4
10-3
10-2
10-1
100
101 depleted pump
Ener
gy (m
J)
wavelength (nm)
Excitation and detection
PAGE 11 9/7/12
H2 energy scheme VUV-LIF detection scheme
VUV-LIF detection of H2r,v
PAGE 12 9/7/12
VUV-LIF setup
PMT
PMT
H2
LN2
VUV mono
L W
BS
MM
plasma
W
S
WM
M
Nd:YAGTHG
Dye (C440)
BBO
M
M
220 nm
to pump
to pump
440 nm
PMT
NO cell
PAGE 13 9/7/12
PMT
PMT
H2
LN2
VUV mono
L W
BS
MM
plasma
W
S
WM
M
Nd:YAGTHG
Dye (C440)
BBO
M
M
220 nm
to pump
to pump
440 nm
PMT
NO cell
VUV-LIF setup
Measured H2 Lyman spectrum
/ Plasma & Materials Processing PAGE 15 9/7/12
43650 43700 43750 43800 43850 43900
0
2
4
6
8
10
Fluo
resc
ence
(a.u
.)
SH frequency (cm-1)
81295 81045 AS9 frequency (cm-1)
77140 76890 AS8 frequency (cm-1)
VUV-LIF setup
/ Plasma & Materials Processing PAGE 16 9/7/12
PMT
PMT
H2
LN2
VUV mono
L W
BS
MM
plasma
W
S
WM
M
Nd:YAGTHG
Dye (C440)
BBO
M
M
220 nm
to pump
to pump
440 nm
PMT
NO cell
PMT
PMT
H2
LN2
VUV mono
L W
BS
MM
plasma
W
S
WM
M
Nd:YAGTHG
Dye (C440)
BBO
M
M
220 nm
to pump
to pump
440 nm
PMT
NO cell
44000 44020 44040 44060 44080 44100 44120 44140 44160 44180 44200
44200 44220 44240 44260 44280 44300 44320 44340 44360 44380
TALIF spectrum of NOP = 2 mbar
Fluo
resc
ence
(a.u
.)
Wavenumber (cm-1)
Flu
ores
cenc
e (a
.u.)
/ Plasma & Materials Processing PAGE 17 9/7/12
VUV-LIF setup
/ Plasma & Materials Processing PAGE 18 9/7/12
PMT
PMT
H2
LN2
VUV mono
L W
BS
MM
plasma
W
S
WM
M
Nd:YAGTHG
Dye (C440)
BBO
M
M
220 nm
to pump
to pump
440 nm
PMT
NO cell
44000 44020 44040 44060 44080 44100 44120 44140 44160 44180 44200
44200 44220 44240 44260 44280 44300 44320 44340 44360 44380
TALIF spectrum of NOP = 2 mbar
Flu
ore
scence
(a.u
.)Wavenumber (cm-1)
Flu
ore
scence
(a.u
.)
73182 73184 73186 73188 73190
22048 22049 22050 22051 22052 22053
H2(v= 4,J= 7)
via VUV-‐LIF
AS7 frequency (cm-1)
NO via TALIF
dye laser frequency (cm-1)
VUV-LIF spectroscopy
44040 44060 44080 44100
H2(rv)
FP
frequency (cm-1)
NO
Inte
nsity
v=3,
J=12
v=4,
J=7
v=4,
J=2
v=2,
J=9
v=3,
J=5
/ Plasma & Materials Processing PAGE 19 9/7/12
state-selective
spatially resolved
non-intrusive
dynamic range > 4 orders
detection limit ~ 1013 m-3
P. Vankan et al., Rev. Sci. Instrum. 75 (2004) 996
Measured H2 Lyman spectrum
Measured H2 Lyman spectrum
Advantages multiplexing: ü spectrum more dense ü efficient measurement
/ Plasma & Materials Processing PAGE 20 9/7/12
81595 81415 AS9 frequency
44020 44060 44100 44140 44180
0.0
0.5
1.0
1.5
2.0
(6,7
)
(3,6
)
(3,1
4)
(3,9
)
(2,1
7)
(4,7
)
(4,1
1) /
(9,1
)(3
,5)
(3,8
)(2
,10)
H 2(v,J
)=(3
,7)
fluor
esen
ce (a
.u.)
SH frequency (cm-1)
77440 77260 AS8 frequency
Measured H2/HD/D2 Lyman spectra
/ Plasma & Materials Processing PAGE 21 9/7/12
100 Pa 1500 sccm H2 / 1500 sccm D2 45 A, z = 8 mm
O. Gabriel et al. Chemical Physics Letters 451 (2008) 204
Measured and calculated Lyman spectra
/ Plasma & Materials Processing PAGE 22 9/7/12
Spectroscopic data for D2 H. Abgrall et al. J. Phys. B: At., Mol. Opt. Phys. 32 (1999) 3813
Spectroscopic data for HD H. Abgrall, E. Roueff, Astron. Astrophys. 445 (2006) 361
Spectroscopic data for H2 H. Abgrall et al. Astron. Astrophys. Suppl. Ser. 101 (1993) 273
All H2 Lyman transitions HD Lyman transitions J < 11 D2 Lyman transitions J < 12
Measured and calculated H2/HD/D2 Lyman spectrum
Measured and calculated Lyman spectra
/ Plasma & Materials Processing PAGE 23 9/7/12
New calculated Lyman transitions including higher rotational states (J > 10), incollaboration with Abgrall and Roueff
O. Gabriel et al. J. Mol. Spectrosc 253 (2009) 64
Measured and calculated H2/HD/D2 Lyman spectrum
Non-Boltzmann distribution for H2
/ Plasma & Materials Processing PAGE 24 9/7/12
700 K for low J 3800 K for high J
“Hockey stick”
Non-Boltzmann distributions in H2/D2 jet
/ Plasma & Materials Processing PAGE 25 9/7/12
Low J: T = 300 K High J: T = 3000 K
Low J: T = 700 K High J: T = 3800 K
Low J: T = 500 K High J: T = 3400 K
O. Gabriel et al, J. Chem. Phys. 132 (2010) 104305
/ Plasma & Materials Processing PAGE 26 9/7/12
Results on H- production through DA process
Production rate of H- ions by dissociative attachment
Te = 5000 K
ne = 1017 m-3
J. Horáček et al, Phys. Rev. A, 70 (2004) 052712
O. Gabriel et al, J. Chem. Phys. 132 (2010) 104305
Absorp'on spectroscopy
CRD spectroscopy on
N2/H2 plasma
+
+
SiH3 reflection ~85% SiH3 reaction ~15%:5-fold bonded Si SiH3 surface diffusion:strong bond formation with danling bond
dangling bond creation byEley-Rideal H-abstractiondangling bond creation by ion
dangling bond surface diffusion
NH3 production in N2/H2 plasma
+
+
SiH3 reflection ~85% SiH3 reaction ~15%:5-fold bonded Si SiH3 surface diffusion:strong bond formation with danling bond
dangling bond creation byEley-Rideal H-abstractiondangling bond creation by ion
dangling bond surface diffusion Plasma chemistry leading to e.g. NHx
N2/H2 plasma creation
NH3 formation ?
NH3 production in N2/H2 plasma
Ø absorption per unit of pathlength (cavity loss):
Ø non-intrusive Ø high sensitivity due to effective multipassing Ø direct absorption –> line of sight measurement
(O’Keefe and Deacon, Rev. Sci. Instrum. 59 (1988) 2544)
Det.
R
d
L 5 ns
lightpulse
R
n, σ
time
inte
nsity
τ
withabsorption
emptycavity
1/e
dLnRc /)1(/1 σ+−=τ
Cavity Ring Down: principals and features
Rev. Sci. Instrum. 69, 3763 (1998)
Cavity Enhanced Absorption detection scheme
CEA measurement recorded in a vessel in which N2/H2-plasma expands
6568.3 6568.4 6568.5 6568.6 6568.70.00
0.02
0.04
0.06
0.08
0.10
inte
nsity
(a.u
.)
frequency (cm-1)
Scanning frequency: 30 Hz Frequency range: 15 GHz Averages: 1000 Measurement time: 30 s The absorption coefficient κ(ν) from intensity by:
NH3 production in N2/H2 plasma
1( ) νν
κ ν⎛ ⎞ ⎛ ⎞= − ×⎜ ⎟ ⎜ ⎟
⎝ ⎠⎝ ⎠0S ( ) 1-RS( ) d
6568.4 6568.5 6568.6 6568.70
1
2
3
4
abso
rptio
n (in
10-5
cm
-1)
frequency (cm-1)
NH3 production in N2/H2 plasma
Part of the absorption spectrum of NH3 as measured in an expanding N2/H2 plasma
σ ≈ 10-22 m2
N ≈ 1019 m-3
Ttr = 600 K
Line width
0.0 0.1 0.2 0.3 0.4 0.50.0
0.5
1.0
1.5
2.0
2.5
3.0
(φH2
+ φN2
)
Pbg= 100 Pa
NH
3 den
sity
(1019
m-3)
φH2
Total N+ flow is consumed
Saturation behavior explained by rate determining steps: N+ + H2 -> NH+ + H NH+ + e -> N + H
NH3 production in N2/H2 plasma
Ammonia density produced in expanding N2 plasma in which H2 is injected in the background
NH3 production in N2/H2 plasma
Ammonia density as function of background pressure at constant gas flow (N2-arc/H2-background)
0 50 100 150 2000.0
1.0
2.0
3.0
4.0
NH
3 den
sity
(1019
m-3)
Pressure (Pa)
Linear with pressure (dNH3/dt constant)
Wall production (?)
3 particle reaction stable intermediate
NH3 production in N2/H2 plasma
NH3 production in two different vessels
0.0 0.2 0.4 0.6 0.8 1.00
2
4
6
8
10
12
14
0.0
0.5
1.0
1.5
2.0
2.5
% N
H3
φH2
/φtotal
% N
H3
Ø Total gas flow of 2 slm through cascaded arc
Ø At maximum 12 % of the background gas is NH3
larger surface-to-volume ratio
Appl. Phys. Lett. 2002, 81, 418
Conclusions
Input gas mixture, N2/H2, changes into
N2/H2/NH3 mixture
(12 % of the background gas is NH3).
NH3 is formed at surfaces.