product specification page 1/15 title doc no. dspc … · eia 364 series: electrical connector test...

JESS-LINK PRODUCTS CO., LTD

PRODUCT SPECIFICATION PAGE 1/15

TITLE

PCI-e OCuLink Connector

DOC No. DSPC-001534

REVISION：

08

AUTHORIZED BY：

James

DATE：

12/14/2017

CLASSIFICATION：

UNRESTRICTED

OCuLink x4 Cable end

OCuLink x4 Receptacle Connector



TITLE


DOC No. DSPC-001534

REVISION：

08

AUTHORIZED BY：

James

DATE：

12/14/2017

CLASSIFICATION：

UNRESTRICTED

1.0 SCOPE

This Product Specification covers the performance requirements of the Pitch 0.5mm PCI-e OCuLink

Pluggable Connectors

2.0 PRODUCT DESCRIPTION

2.1 PRODUCT NAME AND SERIES NUMBER(S)

● PCI-e OCuLink x4 Receptacle R/A SMT with SMT shell Attached

JPC DWG No.: SD_P933G042-D

● PCI-e OCuLink x4 Receptacle R/A SMT with DIP shell Attached

JPC DWG No.: SD_P933F042-D

● PCI-e OCuLink x4 Receptacle VT SMT with SMT shell Attached


● PCI-e OCuLink x4 Receptacle VT SMT with DIP shell Attached


● PCI-e OCuLink x4 Receptacle VT SMT with HR-I DIP shell Attached

JPC DWG No.: SD_P931C042-D

● PCI-e OCuLink x4 Receptacle VT SMT with HR-II DIP shell Attached

JPC DWG No.: SD_P931D042-D

● PCI-e OCuLink x4 Receptacle VT SMT with HR-III DIP shell Attached

JPC DWG No.: SD_P931E042-D

● PCI-e OCuLink x8 Receptacle R/A SMT with SMT shell Attached


● PCI-e OCuLink x8 Receptacle R/A SMT with DIP shell Attached


● PCI-e OCuLink x8 Receptacle VT SMT with SMT shell Attached


● PCI-e OCuLink x8 Receptacle VT SMT with DIP shell Attached


● PCI-e OCuLink x8 Receptacle VT SMT with HR-II DIP shell Attached

JPC DWG No.: SD_P931D080-D



TITLE


DOC No. DSPC-001534

REVISION：

08

AUTHORIZED BY：

James

DATE：

12/14/2017

CLASSIFICATION：

UNRESTRICTED

● PCI-e OCuLink x4 cable Straight type and Active Latch

JPC DWG No.: Refer to Cable drawing

● PCI-e OCuLink x4 cable Right Angel type and Active Latch


● PCI-e OCuLink x4 cable Left Side type and Active Latch


● PCI-e OCuLink x4 cable Straight type and Passive Latch


● PCI-e OCuLink x8 cable Straight type and Active Latch


● PCI-e OCuLink x8 cable Right Angel type and Active Latch


2.2 DIMENSIONS,MATERIS,PLATINGS AND MARKING

See Customer Drawing for information on dimensions, material, plating and marking



TITLE


DOC No. DSPC-001534

REVISION：

08

AUTHORIZED BY：

James

DATE：

12/14/2017

CLASSIFICATION：

UNRESTRICTED

3.0 APPLICABLE DOCUMENTS AND SPECIFICATIONS

PCIe OCuLink Specification

EIA 364 Series: Electrical Connector Test Procedures Including Environmental Classifications with

Test Procedures

EIA 364-1000 Environmental Test Methodology for Assessing the Performance of

Connectors and Sockets Used in Business Office Applications

4.0 QUALIFICATION

Laboratory condition and sample selection are in accordance with EIA 364

5.0 RATINGS

ITEM SPEC

Voltage 30 Volts AC(RMS)/DC Max

Continuous Current 0.5 Amps

Temperature Operating: -25°C to +60°C

Non-Operating: - 40°C to +85°C

Durability 0.76 um Au-250 Cycles (Internal Application)



TITLE


DOC No. DSPC-001534

REVISION：

08

AUTHORIZED BY：

James

DATE：

12/14/2017

CLASSIFICATION：

UNRESTRICTED

6.0 PERFORMANCE

6.1 TEST GROUP 1- TEMPERATURE LIFE (*Presents :For 10 Years Life Spam Test)

ITEM TEST TEST PROCEDURE CONDITION REQUIRMENT

1

Low Level

Contact

Resistance

EIA 364-23; apply a maximum

voltage of 20mVDC and a

current of 100 mA.

Mated Base Line

2 Durability

(precondition)

EIA-364-09; perform plug &

unplug cycles: 50

No evidence of

physical damage

3 Temperature

Life

EIA-364-17 Method A, Test

Condition 3, 72 hours at 105° ±

2°C

*10 Years Temperature life Test

432 hours at 115°±2°C

Mated None

4

Low Level

Contact

Resistance



current of 100 mA. Mated <20 mΩ Δ max

5 Reseating Manually unplug & plug the

connector, 3 cycles

No evidence of

physical damage

6

Low Level

Contact

Resistance



current of 100 mA.

Mated <20 mΩ Δ max

Note:

1. Sample size = 251 test points minimum.(e.g. 4x receptacle connector 42 ckt approx.≧6pcs)



TITLE


DOC No. DSPC-001534

REVISION：

08

AUTHORIZED BY：

James

DATE：

12/14/2017

CLASSIFICATION：

UNRESTRICTED

6.2 TEST GROUP 2 -CYCLIC TEMPERATURE & HUMIDITY


1

Low Level

Contact

Resistance



current of 100 mA.

Mated Base Line

2 Durability

(precondition)


unplug cycles: 50

No evidence of

physical damage

3 Thermal

Shock

EIA 364-32, Method A, test

condition I(10 cycles) Mated None

4

Low Level

Contact

Resistance



current of 100 mA.


5

Cyclic

Temperature

& Humidity

EIA-364-31 Cycle connectors

between 25º ± 3ºC at 80% RH

and 65 º± 3 ºC at 50% RH 24

cycles. Ramp times should be

0.5 hour and dwell should be

1.0 hour.

Mated None

6

Low Level

Contact

Resistance



current of 100 mA.



connector, 3 cycles

No evidence of

physical damage

8

Low Level

Contact

Resistance



current of 100 mA.




TITLE


DOC No. DSPC-001534

REVISION：

08

AUTHORIZED BY：

James

DATE：

12/14/2017

CLASSIFICATION：

UNRESTRICTED

6.3 TEST GROUP 3-MECHANICAL SHOCK & VIBRATION


1

Low Level

Contact

Resistance



current of 100 mA.

Mated Base Line

2 Durability

(precondition)


unplug cycles: 50

No evidence of

physical damage

3

Temperature

Life

(precondition

EIA-364-17, Method A, Test

Condition 3

240 hours at 90°±2°C

(60°C for 5 years)

Mated None

4

Low Level

Contact

Resistance



current of 100 mA.

Mated Mated <20 mΩ Δ max

5 Vibration

EIA-364-28 test condition VII

test condition letter D 15

minutes in each of 3 mutually

perpendicular directions. Both

mating halves rigidly fixed to

not contribute to relative motion

of one contact against another.

Mated

<30 mΩ Δ max

(Change from initial

baseline contact

resistance)

Discontinuity < 1 μsec

No evidence of

physical damage

6

Low Level

Contact

Resistance



current of 100 mA.




TITLE


DOC No. DSPC-001534

REVISION：

08

AUTHORIZED BY：

James

DATE：

12/14/2017

CLASSIFICATION：

UNRESTRICTED

6.4TEST GROUP 4 - MIXED FLOWING GAS (*Presents :For 10 Years Life Spam Test)


1

Low Level

Contact

Resistance


voltage of 20mVDC and a current of

100 mA.

Mated Base Line

2 Durability

(precondition)


unplug cycles: 50

No evidence of

physical damage

3

Temperature

Life

(precondition)

EIA-364-17, Method A, Test

Condition 3

120 hours at 105°±2°C

Mated

None

(Conditioning

Exposure)

4

Low Level

Contact

Resistance



100 mA.


See note 3

5 Mixed Flowing

Gas (*10 Years)

EIA-364-65; Class IIA,

First Un-Mated 224 Hours; After

Mated 112 Hours Total 336 Hours 14

days

Un-Mated/Mated

None

(Conditioning

Exposure)

6

Low Level

Contact

Resistance



100 mA.


7 Thermal

Disturbance

Cycle connectors 10 times between

15º ± 3ºC and 85 º± 3 ºC. Ramps

should be a minimum of 2°C per

minute and dwell times should insure

that the contacts reach the

temperature extremes for a minimum

of 5 minutes.

Mated

None

(Conditioning

Exposure)

8

Low Level

Contact

Resistance



100 mA.


See note 3



TITLE


DOC No. DSPC-001534

REVISION：

08

AUTHORIZED BY：

James

DATE：

12/14/2017

CLASSIFICATION：

UNRESTRICTED


connector, 3 cycles

No vidence of

physical damage

10

Low Level

Contact

Resistance



100 mA.


Note:

1. Expose receptacles unmated for 9.34 days (224 hours) of the test duration. Mate the

receptacle to the same plug used during preconditioning temperature life. Expose mated plug

and receptacle for the remainder of the test duration 4.66 days (112 hours).

2. Characterize porosity & plating thickness before test sequence.

3. Intermediate test values must meet 10 mΩ max delta at 99% and 1% of samples shall not

exceed 15 mΩ delta.

6.5TEST GROUP 5 – Withstanding Voltage


1

Dielectric

Withstanding

Voltage

EIA-364-20; 500VDC minimum

applied between adjacent

contacts for 1 minute

Mated No breakdown or

flashover

2

Contact

Resistance

(Low Level)



current of 100 mA.

Mated Base Line

3 Durability EIA-364-09; (cycles: 50) No evidence of

physical damage

4

Contact

Resistance

(Low Level)



current of 100 mA.


5

Dielectric

Withstanding

Voltage

EIA-364-20; 300VDC minimum

applied between adjacent

contacts for 1 minute Mated

No breakdown or

flashover



TITLE


DOC No. DSPC-001534

REVISION：

08

AUTHORIZED BY：

James

DATE：

12/14/2017

CLASSIFICATION：

UNRESTRICTED

6.6T GROUP 6 - SOLDERABILITY


1 General

Examination connector tested Unmated

No evidence of

physical damage

2 Solder ability

EIA-364-52 Category 1,no

stream RMA class 1 flux

Immerse in molten solder at

245 ºC at a rate of 25.4mm per

second. Solder Duration:5±0.5

seconds.

Unmated

Solderable area shall

have a minimum of

95% solder

Coverage: when

testing 30 random

loose contacts.

3

SMT

Process

Compatibility

See Section 9.0 for JPC

Connector Only Test Profile Unmated

Dimensional:

Conformance to

Sales Drawing

Requirements

Visual No Damage

Note:

1. Solderability:4 from each terminal style for each part number.

6.7 TEST GROUP 7 –Durability


1

Dielectric

Withstanding

Voltage

EIA-364-20; apply a voltage of

500 VDC minimum for 1 minute

between adjacent terminals

and between adjacent

terminals and ground

Mated

No disruptive

discharge

No leakage current in

excess of 5mA

2

Low Level

Contact

Resistance



current of 100 mA.

Mated Base Line

3 Durability


unplug cycles: 250 (Internal

Application)

0.76 um Au-10,000 Cycles

(External Application)

No evidence of

physical damage



TITLE


DOC No. DSPC-001534

REVISION：

08

AUTHORIZED BY：

James

DATE：

12/14/2017

CLASSIFICATION：

UNRESTRICTED

4

Low Level

Contact

Resistance



current of 100 mA. Mated <20 mΩ Δ max

5

Dielectric

Withstanding

Voltage

EIA-364-20; apply a voltage of

500 VDC for 1 minute between

adjacent terminals and

between adjacent terminals

and ground.

Mated

No disruptive

discharge

No leakage current in

excess of 5mA

Note:

1. Separate sets of test specimens will be used to access dielectric withstanding voltage and the

change in low level contact resistance.

2. Dielectric withstanding voltage testing will use different contacts than those used for low level

contact resistance testing.

7.0 PERFORMANCE (MECHANICAL)

7.1 TEST GROUP 8


1

Temperature

Rise

(via current

cycling)

Measure the temperature rise

at the rated current after 96

hours.

(45 minutes ON and 15

minutes OFF).

Fixture as required.

Mated Temperature Rise:

+30°C maximum



TITLE


DOC No. DSPC-001534

REVISION：

08

AUTHORIZED BY：

James

DATE：

12/14/2017

CLASSIFICATION：

UNRESTRICTED

7.2 TEST GROUP 9


1

Connector

Mate Forces

(42 circuit / 80

circuit)

Mate connector at a rate of 25

mm per min. Mated 40 N MAX

2

Connector

Un-mate

Forces

(42 circuit / 80

circuit)

Un-mate connector at a rate of

25 mm per min.

Un-mate 25 N MAX

7.3 TEST GROUP 10


1 Normal Force Apply a perpendicular force. Mated

0.29 N, (30 grams)

MINIMUM normal

force

7.4 TEST GROUP 11


1 X Axis Load

(Side)

Mate plug to connector and

apply load on plug 22.5mm

away from Rec. until open

circuit.

Mated 0.4 NM min

2

Y Axis Load

(Toward

Latch)


apply load on plug22.5mm

away from Rec. until open

circuit.

Mated 0.4 NM min

3

Plug Pullout

Force

(Axial)


apply a right angle pullout force

on the wire at a rate of 25 mm

per min.

Mated

30 N minimum

Force to overcome

latch



TITLE


DOC No. DSPC-001534

REVISION：

08

AUTHORIZED BY：

James

DATE：

12/14/2017

CLASSIFICATION：

UNRESTRICTED

7.5 TEST GROUP 12


1

Low Level

Contact

Resistance



current of 100 mA.

Mated Base Line

2 Wire Flex

EIA 364-21 test condition II

with Tension = 26 N. Flex

cables 180° for 20 cycles.

Mated No physical damage

3

Low Level

Contact

Resistance



current of 100 mA.


7.6 TEST GROUP 13


1

Cable Pullout

Force

(Axial Load)

Apply an axial load to cable to

Keep 10 sec Un-Mated 40N Minimum

8.0 PACKING

Refer to Customer Drawing for packing information



TITLE


DOC No. DSPC-001534

REVISION：

08

AUTHORIZED BY：

James

DATE：

12/14/2017

CLASSIFICATION：

UNRESTRICTED

9.0 OTHER INFOMATION

DESCRIPTION REQUIREMENT

Average Ramp Rate 3°C/sec Max

Preheat Temperature 150°C Min to 200°C Max

Preheat Time 60 to 180 sec

Ramp to Peak 3°C/sec Max

Time over Liquidus(217℃) 60 to 150 sec

Peak Temperature 260+0/-5°C

Time within 5℃ of Peak 20 to 40 sec

Ramp-Cool Down 6°C/sec Max

Time 25℃ to Peak 8 min Max



TITLE


DOC No. DSPC-001534

REVISION：

08

AUTHORIZED BY：

James

DATE：

12/14/2017

CLASSIFICATION：

UNRESTRICTED

10.0 MODIFICATION HISTORY

Rev. Comments Date Originator Approval

01 Preliminary Draft 03/15/2016 Brown James

02 Modify Preliminary Draft 11/15/2016 Brown James

03

Modify Specification for 10 Year Life spam

Inquiry

Add IMFG And Temperature Life 115℃ 432

Hours And Durability 10,000 C/T Test

12/12/2016 Aaron James

04 Compliant with SFF-8611 & 8612 &

PCI-SIG & Competitor Spec. 12/28/2016 Aaron James

05 Add 6.3 Test Group 3 Mechanical Shock &

Vibration 02/14/2017 Aaron James

06 Change specimen q’ty based on

EIA364-1000 & typo 04/12/2017 Jason James

07 Specify Oculink 8X products together 11/28/2017 Jason James

08 Modify the working temperature 12/14/2017 Jason James

product specification page 1/15 title doc no. dspc … · eia 364 series: electrical connector test...

Documents