radiation-induced pair defects in 6h-sic studied by optically detected magnetic resonance

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Materials Science Forum Vols. 353-356 (2001) pp 505-508 © (2001) Trans Tech Publications, Switzerland doi:10.4028/www.scientific.net/MSF.353-356.505 All rights reserved. No part of contents of this paper may be reproduced or transmitted in any form or by any means without the written permission of TTP, www.ttp.net. (ID: 152.14.136.96, NCSU North Carolina State University, Raleigh, United States of America-05/09/13,16:50:38)

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Page 1: Radiation-Induced Pair Defects in 6H-SiC Studied by Optically Detected Magnetic Resonance

Materials Science Forum Vols. 353-356 (2001) pp 505-508© (2001) Trans Tech Publications, Switzerlanddoi:10.4028/www.scientific.net/MSF.353-356.505

All rights reserved. No part of contents of this paper may be reproduced or transmitted in any form or by any means without the written permission of TTP,www.ttp.net. (ID: 152.14.136.96, NCSU North Carolina State University, Raleigh, United States of America-05/09/13,16:50:38)

Page 2: Radiation-Induced Pair Defects in 6H-SiC Studied by Optically Detected Magnetic Resonance

506 Silicon Carbide and Related Materials 2000

Page 3: Radiation-Induced Pair Defects in 6H-SiC Studied by Optically Detected Magnetic Resonance

Materials Science Forum Vols. 353-356 507

Page 4: Radiation-Induced Pair Defects in 6H-SiC Studied by Optically Detected Magnetic Resonance

508 Silicon Carbide and Related Materials 2000

Page 5: Radiation-Induced Pair Defects in 6H-SiC Studied by Optically Detected Magnetic Resonance

Silicon Carbide and Related Materials 2000 10.4028/www.scientific.net/MSF.353-356 Radiation-Induced Pair Defects in 6H-SiC Studied by Optically Detected Magnetic Resonance 10.4028/www.scientific.net/MSF.353-356.505