Sampa testing

13.08.14Arild Velure

FPGA testboard design

SoC-Kit Board

HPS MemoryCommand and

Control Module

Clock Manager

Uart to bus

MUX

Data manager

SAMPA• Communication / Interface

– UART to bus• Gives direct access to internal bus from uart• Switching between Linux terminal and bus is done online with a

switch

– HSMC• Link to SAMPA carrier board • Data is transported to memory through a DMA

– Ethernet• Kernel module in Linux takes data from memory and transmits it to

DAQ

HSMC

• Software/ DAQ

Functional testing Onboard SAMPA emulator in C

Labview reused from ALTRO test (backup plan)

DAQ and data analysis Root program for DAQ

Date program (for MPW2)

Status of design• FPGA design

– Design 85% done• Kernel module and some parts of the data manager is not finished• All other modules tested and working

– Ethernet interface tested to 670Mbits/s• Further optimizations might be possible

• DAQ/Root– Can receive, store and display data from Ethernet– Can communicate with Sampa/testboard through UART– Working on configuration interface and multi-channel support

• Functional test program– SAMPA emulator

• Need to update ALTRO++ code (ALTRO emulator) for latest changes

– Labview• Filter models need to be updated from ALTRO implementation• Testboard interface needs to be implemented

– Is already modular so should not be too difficult

Plans (I)

• Functional verification DSP– By tapping the signal path at various stages of the

DSP filters, the filters can be verified against a high-level model in the testprogram

– By supplying the Sampa with a test signal from the testboard a bitwise comparison of the input data vs output data can be run continuously

Plans (II)• GEM prototype testing

– Prototype in development– Provided by WignerRCP Group of Hungary– Signal to noise test : Verify with GEM detector at which effective GEM the

signal to noise value for MIPs would be 20:1 for the small pads (IROC) and >=30:1 for the medium and large pads (OROC).

Plans (III)

• GEM prototype testing– Noise tests on GEM detector with and without

input protection (resistors and diodes) – Input protection testing• Equip all pads of a 10x10cm2 detector with readout,

inject a radioactive gas into the detector, increase the HV to have regular sparks, and hopefully see that no SAMPAs break. Then we remove input protection and probably see that sometimes channels break. • Planned for MPW2

Plans (IIII)

• Irradiation tests– Single Event Effects

• High Energy Hadrons (HEH) may lead to – Single Event Upset (SEU) – Single Event Latch-up (SELs)

• Estimated Flux (HEH) ~3.4kHz/cm^2• Tested with shift register and possibly pedestal memory• Testing at external high energy facility

– Total Ionizing Dose• Inner most partitions ~ 2 kRad• Tested through monitoring of power consumption and operation• Can be tested at local facilities (Oslo/Brazil)