sampling procedures and tables for inspection by …

N O T MEASUREMENT

MVF

MIL-ST O -1D5E

10 M AY 1989

SUPERSEDIN G

MIL-STD-1D5D

29 APRIL 1963

MILITARY’ STANDARD

SAMPLING PROCEDURES AND TABLESFOR INSPECTION BY AITRIBUTES

I

A MSC N / A AREA Q CIC

~~. A p prov e d for public rele ese; dlstrlbutlon is unlimite d.

Downloaded from http://www.everyspec.com

MIL-STO-1O5E

DEP~ OF DEFENSEWashington,EC 20301

SN-lPL13KPRKEDUWS AND TABLESFOR INSPECTIONBY ~

1. ‘hismilitarystaxiardis approvedfor use by all Ceprwmts and Agenciesof * ~t of Mf==e.

2. Ikneficial~ts (recmmmdations,additions,deletims) and anyprtinent data whiti may be of use in inprovingthis documnt shouldbeaddressedto:

CcmmnderUs. Army Armment Researdn,Develop-rentandEnginerinq Center

ATIN: SKAR-BAC-S/BldcJ. 6PicatinnyArsenal,NJ 07806-5000

by using&“ self-addressedStandardization~t -r ovww.ntProposal(ODForm 1426)am=ring at the md of thisdommnt or letter.

ii


MII-S’ID-105E

‘ItLisp.blitationprovidez.sampliqproceduresand referene tablesfor use inplanningand conductinginspectionby attributes.‘Thesamplingconceptis basedon the prokbilistic reaxrente of eventshhena seriesof lots or Mxhes areprtducedin a stableenvimrmmt.

‘Mispublicationshouldix usedto guidethe user in the rk?velqzwntof an~ion strategythatprmides a cost effectiveq+math to attwamfidmm in prcchxtanpliance with con-~actualtechn.iralrquimmnts. Tneuser is wrned of the asmmxl risksrelativeco * rhozensanplesizeadMK-

Mili@ ~ifications should~t ~t~ r .”equmrents for use of wficssIIQlingplans,nor shouldtheyprovideAQL’sor Ll?D’sas a requimmnt.

Sal@ing plans for continuous,ratherthan lot ~ion, are containedinMllAIV-1235, “’Singleand Mlci-Level ContinuousSanplingPmcedxes and Tablesfor I .nscectionby Attrihxes”.

iii


MIL-STC-105E

Paragraph1.

1.11.2

2.

2.1

3.

3.13.23.33.43.53.63.73.83.93.103.113.123.133.143.153.163.173.183.193.203.213.223.23

4.

4.14.24.34.4

——..

SCOPE...............................................

-se ....................................-.”.”-”A@ication .......................................

REmwKED lxKuMmrs.................................

Non applicable....................................

DEFIMTICMS................... ......................

_t*leCmlity-1 (ML)[email protected](~) ....................AverageGutgoingQualityLimit (=L) .............Classificationof Defects.........................CriticalDefect...................................CriticalDefective...........:....................Cefect............................................Defective..........................................DefectsPer Hul@redun.its.........................Inspection........................................Inspectionby Attributes..........................I_ctor Bat* ......................................I.mor EatchSize.................................MajorDefect......................................MajorDefective...................................MinorDefect......................................MinorEefective...................................PercentDefective..................................P-ss Average...................................Sanpl e............................................Sa@e SizeCede Letter...........................san@ing Plan.....................................Unit of Prcdmt...................................

GmJ=m~s --------------------------------

WrittenProcedures................................Noncunformnm ....................................Formtirm and Identificationof lots or Batches...ML ...............................................

4.4.1 AQL Use...........................................4.4.2 Limitation........................................4.4.3 Chasing ins.................. ...................

11

1

1

1

222222 .,2333333333344.4444

4

4455555

iv


mL?S’m-lo5s

C@m2?l’s - C Q ntinu e d.

Pa.ragra@4.54.5.14.5.24.5.34.64.74.7.14.7.24.7.34.7.44.84.94.9.14.9.24.9.34.9.44.104.10.14.10.1.14.10.1.24.10.1.34.10.1.44.10.24.114.124.12.14.12.2

sa71Qlhg.........................................RepresentativeSanding..........................Tim20f S.a@@ .................................~&irrP&tiple Saupling......................

.............................SwitchiqP~ .............................Mxm.lcoTightened............. .................Ti@tened to Norml ..............................Noz-mlto Famed ................................Reducedtot+xm.l................ ................DkxmtinuationofInspection. ...................San@ing Plans...................................~ion==l.. ................... ............Clxk?l.ettera.....................................Maining sanplin Golan.........................TYF=of*l%l Plens..........................Determinationofkxeptabi.lity....................PercentDefectiveInspection.....................SingleSa@ingP lab........... ..................CoubleSamplingPlan.............................tiltipleSa@ingP lab.......... .................Sp2CialProce&re forRdweclIrsection. ....... .D!2fectsPer [email protected] Protectkn... ...................

...........................................-t%-=-i=ic ~ ..................AverageSa@e SizeCurvea.:.....................

5. TABLES...............................................

TableI.II-A.

II-B.

11<.

III-A.

III-B.

III-C.

San@e SizeCede I.etters.........................Shgle SenpMng Plansfor Nonm.1~ion Mster table)....................:.

SingleSaWMng Plansfor Tight&InspectionMaster table)......................

SingleSanpM.ngPlansfor ReducedIrqection (M3stertable)......................

CoubleSamplingPlansfor Normal~ion 043stertable)......................

CuubleSanplingPlansfor Tightened~ion (Mastertable)......................

CoubleSa@ing Plansfor ReducedI~ion (Masterteble)......................

v

q

5

:56666667177788888

t!9,9999

11

13

14

15

16

17

18

19


CcNIENrs - Cclnthuled.

TableIV-A.

IV-B.

Iv-c.

V-A.

V-B.

\T-A.

VI-B.

VII-A.

VII-B.

VIII.Ix.

MTL-S’IC-105E

M.dtipleSapling Plans for Nornksl~im (~ert~le) ................... ...

MiltipleSamplingPlans for TightenedInspection(Msstertable)......................

[email protected]@ingPlans for Reduced~im (Msstertable)......................

AveragzDutgoingQualityLimitFacLorsforNormal~ion (Stiglesampling)............

Average@tgoing @ality LimitFactorsforTightenedIn-ion (SingleSan@ng) .........

Limittig(Xality (inPercentDefective)forwhicha Pa = 10% (forNormal ~ion,Singlesanplti g).............................

LimitingQuality (inCefectsper HundredUnits)forwhich the Pa = 10% (forNormal~im, StigleSa@ing) ...................

limiting@it y (inPercentDefective)forwhichthe Pa = 5% (forNormsl I.nsp?ction,Singlesanplin g).............................

Ltitk.g CMality (inDefectsper Hundred’Wits) forwhiti the Pa = 5% (forNormsl~ction, Si.ngle*ling) ....................

LimitNun&rsfor P&ducaiInspection.............AverageSa@e Size Cumes for DoubleandtWltipleSampling...............................

Sa@ing Plans and ~rating CharacteristicCurves (andData) for:

X-A. Sa@e SizeCc& I.etterA........................X-B. San@e SizeCode b?tterB........................x-c. SanpleSizeCa5e LetterC...:....................X-D. San’pleSizeCcxieLetterD........................X-E. Sa@e SizeCede LetterE........................X-F. San@e SizeCede LetterF........................x-G. Sa@e SizeCo& LetterG........................X-H. San@e SizeCode I.etterH........................X-J. San@e SizeCock LetterJ........................X-K. SanpleSizeCcrZeI.etterK........................X-L. San@e SizeCo& LetterL........................x-M. Sa@e SizeCcck LetterM........................X-N. San@e SizeCode Lectern........................x-P. SanpleSizeCode LetterP........................x-Q. San@e S$zeCmie IetterQ........................X-R. San@e SizeCock LetterR........................

20

22

24

26

27

28

29

30

3132

33

34363840424446485052545658606264

/

/’

vi


MR-.5TD-1OSE

)

x-s.

PanCJraph6.

6.16.26.3

CmnENrs - amnued.

~

Sa@e Size Cc@e Letters........................ 66

twnzs............................................ 61

IntendedUse................................... 67,SubjectTezm (keywozd)Listing................_fmp=viousIs sue.,................ ... :

aNmlDIrK tamRIAL .............................. 68

vii


W*1OSE

,,

sJueLIK P~ AND TAEESFCR lNSP~ICM BY ATmmlm2S,

1. -DE

1.1 Purpose. ~s publicationestablisheslot or batchsanplingplans adprcesiuresfor inspectionby attributes.‘mis @limtion shallnot be “interpretedco ~ or am flictwith any contractualm@xwmtS. me Wrds‘Bae”’, “~”, “~tile”, etct refer~y to ~ ~tr~o~s use oftheqling plarscontainedin thisstandard~donotitrplym agre9mntbythe @vernmm to Saept anyprcduct.GOVS17X~ Shallk as

Eeterndnationof acceptabilityby the&scri&d in amtrectual doam-ems. me San@ing plans

describsdin this standsd are S@iable to A(2L’sof .01~rcent or higherandare thereforenot suitablefora@i~tions wherequalitylemls in the &fectivepartsp millioprangecanbe realized.

1.2 lwl:~$. San@ing plans&signat.e3in this publi=tion are eppli~le,ML not lmt , to impection of Ule follcwing:

a. Fml itens.

c. *rations or services.

d. Materialsin pmmss.

e. Su@ies in storage.

f. Maintenanceqerstions.

9. Dataor remrds.

h. Adniniszrativeprocecbres.

lWse pla ns are inte ndsd primsrilyto M used for a continuingseriesof 10CSor bat-. l?h2plans my alsobe used for the inspectionof isolatedlotsorbacchss,but, in this lattercase,the user is cautionedto consultthe qx3rStingcharacteristiccumes to finda plan wh.itiwill yieldthe &sired protection(Sse4.11).

2.

2.1

3.

PEm@Km IxnMNcs ‘Not ~licable.

DEFINITI@JS

1


mL-s’Imlo5E

3.1 AcceptableCualityLevel (ML). m a continuousseriesof lots isconsidered,the AQL is the qualitylevelwhich,for the purpses of sanplinginspection,is the ltit of a satisfactoryprocessaverage (See3.19).

Nc7rE:A sanplingplan and an AQL are tisen in accordaro?with the riskassunsd.Use of a valueof AQL for a ~ain defector groupof defectsindicatesthatthes~ling Pl~ till a- the -t ~joritY of @ lots or bat- P*- *processaveragelevelof percat &fective (ordefectspar hundredunits)in theselotsor batchesbe no greaterthanthe designatedvalue of AQL. Tnus,the AQL isa desiqaatedvalueof p2rcentdsfective(ordefects~ hurdredunits)for whichlotswill be acceptedITOStof the tfi by the sapling prcedure beingused. Theaanplingplansprovidedhereinare so arrangedthat the prdability of acceptanceat the designatedAQL valuedeps!ndsupon the sanplesize,~ing 9enerallYhi~erfor larges.snplesthan for smallones,for a givenAQL. The AQL done does notidentifythe chancesof accqZing or rejectingindividuallots or batchesM nuredirectlyrelatesto what mightte exp+ctedfran a seriesof lots or batches,providedthe stepsindicatedin thispublicationare taken. It is necessarYtoreferto the ~ating &aracteristiccurveof the plan to deterndnethe relativerisks.

3.2 AverageGutgoingGuality (AD2). For a particularprocessaverage,the 7@ isthe averagequalityof o~tgoingprcductincludingall acceptedlots or batches,plus all reject+ lots or bat&es aftertinerejected’lots or batcheshavekeeneffectively100 ~rcent irqxcted and all defective replacedby non-rkfectives.

3.3 Average cXIt90ingC?JdityLimit (ACQL). TheJKX)Lis the n-axhrnAD2 foragivena~ptance Sa@ing plan.Factorsfor -t ing AD2L VS1= ~ 9iven inTableV-A for each of the singlesapling plans for normalinspectionand inTableV-B for earh of the singlesanplingplans for tightenedinqection.

3.4 Classificationof Defects. A classificationof defectsis the emnerationOfPssible defecLsof the unit of prcductclassifiedaccordingto theirseriousness.

3.5 Criti& Eefect. A criticaldefectis a defectthat jud-t and experienceindicatewouldresultin hazardousor unsafeconditionsfor indivitialsusing,maintaining,or ciqendingupon the product,or a defectthat judgmt ard~rien= indimte is likelyto prevent~rformsne of the tacticalfunctionof amajorend itemsuch as a ship,aircraft,tank,missile,or spacevehicle.

3.6 CriticalDefective. A critid defectiveis a unit of productwhichcontainsone or mre criticsldefectsand nay also concainIMjor and/or&ordefects.

3.7 ,~fe. A defectis any nonconformanceof the unit of productwithef~d requirements.

2


MIL-mlosE

3.8 Cefectiw. A defectiveis a unit of procbctwhid containsone or nuredefects.

3.9 Defectspr Hundr@5Units. Ibe nurberof defectsper hundredunitsof anygivenquantityof unitsof productis one hundrd tires .ttienu-&erof tkfectsanltainedtherein (oneor nuredefems bsing~ssible in any unit of product)dividedby the totalnunbsrof tics of product,i.e.:

Defectsper . Nun&r of defects x 100lmldredunits Nun&r of unitsimpe@sd

3.10 -ion. Inspectionis the protessof mssuring, testing,or ~se ~in9 the tit of prtckm with the requirsfmts.

,

3.11 ~on by Attributes. ~ion by atcri.butesis “~on Whersbyeitherthe uruc of prcduct1s classifiedsinplyas defectiveor non-defective,orthe rnm&r of defectsin theunit of prcductis wunted, with respct to a givz2n~~t or set or rqi~ts.

3.12 LOK or Batd. The termlot or batch shallnean “inspectionlot”or“’-Lion batch-,i.e.,a collectionof unitsof productfromwhicha sapieis to be drawn and irspsctedad ray differfrana collectionof unitsdesignatd.. —..—. ... . . .. ..as a La or oacm ror ouer pupses (e.g., prooucuon, snqnent, etc.).

3.13 E or Bst~ Size. The lot or batch size is the nunberof unitsof prcductin a lot or batch.

3.14 Msjor Defect. A mjor defectis a &fect, otherthan critical,thatislikelyto resultin failure,or to A= mterially the usabilityof the unitof prcductfor its intendedprpose.

3.15 N!ajorCefective. A mjor defectiveis a unit of prtductwhichcontainsoneor mre msjor *fects, and ray also containminordefectsbut containsno criticaldefect.

3.16 minor Defect. A minordefectis a defectthat is not likelyto reducemateriallythe usabilityof the unit of praiuctfor its intendedpupose, or is a-= frm establiah05stmhrds - littlebearingon the effectiveuse orqeration of the unit.

3.17 Minor Defective. A minordefectiveis a unitof productwhi& containsoneor nxxe minor defectsbut mains no critid or m jordefect.

3


MIL-STD-105E

3.18 PercentDefective: The percent&fective of any given quantityof unitsof productis one hundredtk the nun-herof defectiveunitsof prcductcontainedthereindividsdby the totalrnnnkerof unitsof product,i.e.:

PercentDefective = Nwber of defective x 100Nun&r of unitsinspected

3.19 Pnxess Average. The p-ss averageis the averageprcent defectiveoraveragenu&er of defectsper hundredunits (whitieveris .s@icable) of produ~subnittedby the sqplier for originalinspection.Original~ion is thefirstinspectionof a particularquantityof prcductas distinguishedfrcanthe-tiion of PrOdUCttiti has keen resuhn.ittedafterprior rejection.

3.20 Sanple. A .sa@e consistsof one or !mreunitsof prduct drawn fra a lotor batti,the units of the sanplebeing selectedat rancbnwithoutregardto theirquality. The ntnrberof unitsof productin the sa@e is the sa.nplesize.

3.21 SanPle Size Cede Letter. The sanplesizecode letteris a deviceusedalongwith the AQL for locating’a sanplingplanon a table of san’plingplans.

3.22 SanplingPlan. A sanplingplan indicatesthe nunberof unitsof prcductfraneach lot or battiwhi& are to be inspscted(sanplesize or seriesofsa@e sizes)and the criteriafor*tennining the acceptabilityof the lot orbatti (arreptanmand rejectionn-rs) .

3.23 Unit of Product. The unitof productis the thing inspsctedin ordertodetermineits classificationas defedive or non-defectiveor to countthe nunberof defects. It nBy be a stiglearticle,a pair,a set, a length,an ~, anopsratia, a volm, a ccsrponentof an end product,or the end prcductitself.The unit of prcductIMY or nBy not k the sam as the unit of pur&ase, aqply,production,or shipt.

4.1 WrittenProcedures. Writtenproceduresare o~ily develo@ and mdeavailablefor the ~t representative’sreview,upon request. Wnen thewrittenp~ indicateuse of this stadard, they Shall DYl@y with the~S of this standardand referenceappropriateparts as necY2s.SaZy.

4.2 Nonconfonnanm. The extentof noncnnfonranceof productshallbe exprersedeitherin termsof percentdefective‘orin termsof defectsper hundredunits.

4


FKL+TW105S

4.3 Forrnatianad Ick!ntifirationof &s or Batches. The prcductshallbasssn’bledinto icknt.ifiablelots,sublets,batches,oriniuti othermrun2rasmay b? prescribed. Each lotor Mtch shall,as far as is practicable,consistof units of productof a singlet~, grack,class,size,and crqosition,manufactureduncisressentiallyt.& saneainditians,and at essentiallyt& sauetim . Tis310tsor bstchesshallbei&ntified bytheamtractor andshall be keptintactin i@quate and suitablestoragespace.

4.4 AQL.—

4.4.1.AQL use. ‘Me AQL,tqsther with the Sa@e SizeCo& b?tter,is LEA for~ - -1* Plm provi&d hareixl.

4.4.2 Limitation. The sele&n or use of an AQL shallnot iK@y that thecontractorhas t& rightto sqply any &fective.unit of produa.

Ziis%%%%%iy, or for indivicha.1&fects. An AQL for a groupof &f_DifferentAQ1.sray be chosenforgruupsof &fects

my Ix chosenin ackiitionto AQIa for individualdefects,or s@roups, withinthat gfoup. AQL valussof 10.0or lessway be eqxassed titherin prcentdefectiveor in defectspsr llundrqdt5; thoseover lo.o shallbeeqress@kdefectsper hundredunitsonly.

4.5 San@inq.

4.’5.1@xesentative C3tratified)SallQlinq. When ~ropriate, the nunterofunits in the sanpleshallEe selectedin ~rtim to the sizeof subletsorSu&bStCkS, or partsof the lot or hat*, identifiedby m rationalcriterion.When reprasentatives.a@irq ia used,the units frm eati -lot, s&-batdl orpart of the lot or batd shall& sel~”.edat randan.

4.5.2 Tine of SamJ inq1 A .sanplemy be drati afterall the unitsculprisiirqtk lot or batchhave &en assmlsd, or aanpleunitsmay be drawnduringassenblyof the lot or batch,in whiticasethe sizeof the 10C or battiwill be determined&fore any ample unitsaredrawn.If tl-e.5an@eunitsare drawnduring~lyof the lot or htti, and if ths rejectionnun&r is reachedbeforethe lot *Cnl@eta that pxtian of the lot alreadyclxlpletedshallbe rejected. m causeof the defectiveprcductal be determinedand wrrective actiontaken,afterwhich anewlotorbatch~h begun.

4.5.3 Lhubleor FldtipleSaq3Ml-qUssd, Sa

hhendoubleor multiplesanplingis to bech sarpleshallbe selecttioverthe entirelot or batch.

5


MIL-S’ID-1O5E

4.6 Inspection P~. Normal~ion willke used at the startof~ion. Normal,tightenedor reducedimpction shallcontinueunchangedforeach classof defectsor defective on succf2ssivelotsor batchesexceptwheretheswitdd.ngpmcedums givenbelowrequire&ange. The tit-9 P~ s~lbe a@ied to each classof defectsor defective independently.

4.7 switdimq Procedures.

4.7.1 Normalto Tightened. When normalinspction is in effect,tightened~ion shallbe institutedwhen 2 out of 2, 3, 4, or 5 consecutivelots orbat&es have been rejettedon originalinspction (i.e., ignoringresutxnittedlotsor batchesfor this procdure)-

4.7.2 Tigirtemdto Normal. When tightenedin-ion is .tieffeet,normal~ion shallEe institutedwhen5 consecutivelots or batcheshave beenconsideredaceptable on origti inqection.

4.7.3 Nod to Reduced. t?nennormalinspectionis in effect,reducedinspectionshallke institutedprovidedthat all of the followingconditionsare satisfied:

a. T’FISpreceding10 lotsor bazches“(ormore, as indicated by the notetoTableVIII) have been on norrnslinspectionand all have been acepted on origha.1~ion; and

The totalnumberof *f ectives(ordefects)in * samles frm thepm&” 10 lots or batde.s (orsutio- nmber as - used for conditim “a”amve) is qua.1to or.less thanthe appliwble n-r gi- in Table~11. Ifdoubleor mltiple san@ing is in use, all sanplesinspectedshouldte ticluded,not “first”sanplesonly; and

c. Productionis at a stezdyrate;and

d.’ Reducedinspectionis consickreddesirable.

4.7.4 RducA to Nor&l. men reducedinspectionis in effect,norml inspectionshallbe institutedif any of the followingoccuron originalinspction:

a. A lot or batch is rejected;or

b. A lot or batch is cmsidered acceptableunder the proceduresOf4.10:1.4,or

c. Productionkecmes irregularor delayed;or

d. Other conditionswarranttit normalin~~~ion shallbe instituted.

6


~-S’ID-105E

4.8 Discontinuationof Inspection. If the cumnul.atimrnnrberof lotsmta~~ in a sequenceof mnsecutivelots on originaltightened~ionreachesfive,the acqxanoe pmcedums~ion w e p~sions of this

of this sllamlardshallbe dismntilnled.stmdard shallnot be resumeduntil

correctiveactionhas teentaken. TigthenedinspecU“onshall thenteusdasif4.7.1had keen invciked.

4.9 ~.mg Plans. .

4.9.1 Inspectionlevel: me “inspectionlevel&termines the relationshipketu=enthe lot or t.atchsize and the ssnplesize. mehsp2ction levelto be usedfor

. -Y Particuk Ze@mnent tillbe as prescribedby the mmractor’s writtenprceddres. l?ireeirqection levels:I, II, and III,are given in TableI forgenemiluse (s&4.1). Normally,InspectionEvel II is used. However,Inspectionml I my & usedwhen lessdiscriminationis needsd,or I.@_dIIImy * used for greauerdiscrimination.Four additionalsfeciallevels:S-1, S-2, S-3, and S-4,aregiven in the dam tableand my ~ used khrerelativelysm.11sanplesizesare ~sary and largesanplingrisks~ or rustbe tolerated.

~

NYIE: In the selectionof inspectionlevelsS-1,co S-4,~ rust be ex-~ised toavoidAQ1.sincnnsist4ntwith+ase impection levels.of the special “

In”othsrwords,thepurpsa~ion levelsis to keep sanplessmll wtiennem.ssary.For

~=, tb5 CO& letterSun&r S-1 go no furtherthanD, equivalentto a Si.@esampleof size 8, but it is of no use to -Se S-1 if tha AQL is 0.10peromr forwfi~ the mininnmsampleis 125.

4.9.2 ~ ~ters. Ssnplesizesare &signatej by-tzxb?letters. TableI shallbe used to findthe applicablecode letterfor the ~icu.lar lot or batdlsizead the prescrikeslirqection level.

4.9.3 Cbta.Wq SanplingPlan. ‘lk AQLandthe cods lettershallbe usedtoobtainthe sartplingplan .&m TablesII, 111, or IV. Wnenno smpling planiSam.ilablefor a givencombinationof AQL and co& letter,the tablesciinxZtheuser to a differentletter. Tne San@esize tokusd is givenbythenewadeletter,not by the originalletter. If thisp~ leadsto differentsanplesizesfor differentclassesof defems, the cede letteraimespmdq to *_ ~le size-ie my ke used for all CI.SSSCSof ckfeci.s.k analternativeto a singlesanplingplanwith an a~ nurr&rofo, theplanwiti m ~ nm&r of 1 with its cor~ ly largersanplesizefor a-igqated AQL (whereavailable),may be used.


MIL-S’ID-1OSE

4.9.4 Typ2Sof SalIplingPlans. Threet~s of sanpltigplans: Single,Eooble,and mltiple, are given in TablesII, III,and IV, respectively.When severaltypesof plansam2 availablefora givenAQL and code letter,any one my ke used.A decisionas to type of plan,eithersingle,double,or nultiple,when amilablefor a givenAQL and ccxieletter,willusyallyhe based upon the cmparison bet-the administrativediffim.ltyandthe averagesanplesizesof the availableplans.Tne averageaanplesize of mltiple plans is less than for double (exceptiri.thecase correqmndingto singleacce@nce nmber 1) and both of theseare alwayslessthm a singlesanplesize (seeTableIX). Usuallythe ~Stiatimdifficultyfor singlesanplingandthe met per unit of the .san@eare lessthanfordoubleor multiple.

4.10 Determinationof ~ ability.

4.10.1 PercentDefectiveInspection.To determineacceptabilityof a lot orbatchunderperrsmtdef=hive inspection,the a@icable sanplingplan ehallbeused in accordancewith 4.1O.1.1,4.10.1.2,4.10.1.3,and 4.10.1.4.

4.10.1.1 SingleSaq3ltig Plan. Thenunbarof sampleunits inspectedshallbeequalto the ~le size givenby theplan. If the numberof defective foundinthe sanpleis equalto or lessthanthe acceptancenumber,the lot or bst@ Shallbe considereda-ptable. If thenunkerof defective is equalto or greatertithe rejectionnunbr, the lot or battishallbe rejected.

4.10.1.2 DoubleSap q1’ Plan. A n-r of sanpleunits equalto the firstsanplesize givenby the plan shallk ~ed. If the numberof defectivefoundin the firsteanpleis equalto or lessthan the firstaccqtanm number,the lot or bat~ shallbe mnsideredacceptable. If the nuntxrof defectivefoundin the first.san@eis equalto or greaterthan the firstrejectionrmbertthe lot or batti shallbe rejected.If the nmber of defective foundh the~irstsmple is ketweenthe firstaccqtane and rejectionnumbers;a secondsmple of the same size shallbe insp3cted.The nurberof defective foundinthe firstand secondsanplesshallM acnnmlated. If the cumlative nmber of.defective is equalto or lessthanthe secondaqane number,the lot or batdshall* mnsidered acceptable. If the emulative nunterof defective is Wto or greaterthan the ae.mndrej-ion nunber,the lot or batch shall&rejetted.

4.10.1.3 ~tiple Sanple Plan. Undermltiple sapling, the proedure shallmsimilarto that specifiedin 4.10.1.2,exceptthat the nmber of suassivesanplesrequiredto reach a ckcisionmy be as many as seven.

4.10.1.4 ~al Procedurefor-cd Irqectim. Under tied insp52tion,theSwim P~ ~Y terminatewithouteitheracceptanceor rejectioncriteriahatig teen mt. In these circmstantes,the lot or batch will k considereda~able, but normal impsctionwill k reinstatedstartingwith the nx lot orbatch (See4.7.4.b).

8


MIL+3IW1OSE

4.10.2 Oefectsp HundredUnitsInspection. To determinet+? a “ ityof alotorbatch un&r*fectspsr hundredunits inspection,the promdum~~fidforpermnt defective inSpettiM aiwve shall& used,exceptthat the word“defects”shallk substitutesfor “Ck!fectives”.

4.11 Limiting wity Protection.IIY2~hg plansW ~a~ P~-s publimtion = &signed for use wherethe unitsof productare

~XG in a continuingseriesof lotsor batchesover a periodof tim2.‘Mouemr,if the lot or batcA is of an isolatedrbstum,it is cksirableto limitthese.kcdon of sanplingplansto those,associatedwith a dsal~t~ _ ~~1 ~tprcmt& not less than a specifiedlimitingqualityprotection. SsnplingplansforthisPUZFOSScm * seksed by -sing a Limiting~ity (UD - a ~’sriskto te associatedwithit. TablesVI antiVII give valuesof LQ for thethe Cxmnnly used comumr’s risksof 10 percentand 5 ~t respectively.If adifferentvalueof comunT#s risk is rquired, tk O.C. curvesardtkirti-latedvaluesmy be use5. Tmmncept ofmmlyalsobe usem inspacify+lgtheAOL and I~im” Levelsfora seriesof lotsor bat-s, thus fixingndsumnn.sanplesizewherethereis Sam reasonfor avoiding(~fi mm ~ a 9i=mnsmer’s risk)ITCIrethana limitingproportionof &fecti- (orc@f~s) in -Ysinglelot or batti.

4.12 Curves.

4.12.1 @crating maramsristic cumes. ‘me oparating~eristic ~ fornorml irqection, shownin TableX, mte the percentageoflots or batdeswhichmay be enp2rtedto be arceptedunderthe variousSS@ing plansfor a givenproa?ssquality. T& mrves ahcnmare for singleSa@ing; cumes for dmble andmlciple ssa@ing are retchedas closelyas practicable.The O.C. ~ -forAOLs greaterthan 10.0am based on the Poissondistributionad are a#i-cablefor defectsper hundredunits inspe&cion;those for AQLs of 10.0or lessand~le SiZeSof 80 or 1=s are based on the binonialdistrilmtim ad areqlirable for permnt defectiveinspection;those for~ of 10.0 or less @sa m ple sizes largerthan 80 are based the Poissondistributionand are S@icableeitherfor defectsp3r hurdredunits ~ion, or for parent defective-on (* poissm -him being an adequateapproximationto thebinmual distributionunderthesemnd.itiona). Tabulatedvalues,~ to4-4 VS-hIasor pmbabiliciesof ~anm (pa,in percent)are givenforeatiOfthealrvee shown,m in addition,for tighten@ inspection,h for~f~p2r lnmiredunits forAQIsof 10.0or less and San@e sizesof 80 or 1-.

4.12.2 Awsraqe~le SizeCumes. AverageSan@e Size C@FSS for=le andmultipleaa!plingare in TableIX. Theseshow the averagesamplesizesuhirhmybe ~ed to ocmr underthe variousaanplingplans for given levelsof prcKJ2SSquality. lhe curvesassureno curtailrmntof insertion arslare ~roximte tothe extentthat they are baseclupon tttePoissondistribution,and that the Sa@esizesfor doubleand mltiple aanplingare assuredto be O.631nand O.25n~itiY, tie n is the equim.km qle size.

9,


MIL-STD-105E

=ICN 5

TABI&SANDmInlES

11


“fABLE

1’—.$amph

Jizecode/eflers

(see4.9.1ad

4.9.2)

!ipecid

i.qwcdon

level,

Gencr81

Inspection

hwda

lxx

cubm

baim

,s.

Is-

2s-

3S-

4I

II11

1

2la

0A

AA

AA

Au

9to

15A

AA

AA

Bc

16to

sA

Au

D0

.C0

26.to

soA

Do

cc

1)E

51to

93B

D“c

cc

EF

91

to

1s0

DB

co.

DF

G

1s1

to28

0B

cD

EE

GII

281

10S30

Bc

.0E

FII

J

sol

101200

cc

EF

GJ

K

iml

to3203

cD

EG

NK

L3?0)

toImoo

cIJ

FG

JL

1!

lmol

tomooo

c0

FN

KN“

N

3s00

110

IW303

IIE

G1

LN

P

Isoo

ol10

Woooo

DE

GJ

NP

o

S003

01m

dover

Dt

IIK.

Nu

n


191*1~ -I AA” I - I1:1, i~-lvv -1. - I

NORMAL14


15

.

SINGLETIGHTENED


I

TABLE

II-C—

Single

sampling

plans/orreduced

inspection

(Mater

table)

(see

4.’3.3

ad4.9.4)

— 5,. d,

.- ..! 4 B c — [) E F — c H J — M L u — N P 0 — n

— 0.01s

— A,R,

—

6 .

s..+!.

dw

—2 1 1

~ - & t 0 — 1 I 1 — 1 5 11 — 10

— z— ~ 1 1 1 — 2 3 s — 1 ,

3 5 a—1> m II

;02,

Ill 1,1

2,3

165

981

71010

1013

II

50 w 18 — m 11s

m

01 v —m —

I,

1

0-h

ii.,..W11”4pi.”WI..

m..

1!-d.

J“q.,!.

-?.CK+S!+“b.kh

.:2.,tilw

w-..,

hp.<8!”..

0:

,C,vvti=,

~*,,

u.,n“,...+1..

ph.b..

.“..

k !,.

-u.,-,

1-

.--1..

.—

........“.—

t-

11,k

=..,8.%.

...+..

b..k..,.<6,

b.*b

..kh.

..-b..h.

wk..“Ad,

.,9,

,A.1.,,M

.$.,,,,.

-dl..pa.”

P..4,tal,4,


83 ; . . . -.”.”.-.. _==a T

2 ltldl:: 1::1::1::1: il::l::l::l~l

-1,1-1. lf=l’+lO - i--l--1- -1- -1 -,1-= l,slk-””-—l

DOUBLENORMAL17


TABLE

III-B—

Double

sumpfing

plans/ortightened

inspection

(Mater

lulde)(see

4.9.

3an

d4-

9.41

.+?

[“.

,,,,

~d.

,,.+,1.,..

,..,,,.

..4.

.,,,,

,1,.

, ,,F“.,

?i

*-I

,,

,.!,

,.,

.,,

-“.,

,,

,8+;,.,

s;

“!...

,,9

,,,,.,

0

..,..4

m,:

v,,,.,

,, 1,:

,;I :,”’;

.-J

*s.,

.x!

40

,,n“

,,/

*4

12:

1rl

“8

s...d

:1:

,1,.,,

‘..“4

:,:

,,r,,,,

,H,,,

...

12s

mw

v,,.,

mm

%.

m.x4

\K,.,

,,;

,,,&...

,,5

*m

1,v,,.s

mYm

.4

W,

cm

,,$-

0ml

Ku%.d

ml,

nm.

,,l’,,.

!,..-w

,.ww...1

Ima

Z5m

t’,!,!

w“m

“+.

.Aaw

ton

— ,,,,,

— ,.,

— ., —

— ,,.-,

— ,.,,

— II,“ _ /“1 I : s 12

,.,.”...

!)..,.,,..,.,.,,,,,!....,

..”.

.,,m

,

— ,,,,,

—,,

— 1 r- — 1 7 !12 I* 1, ,, 1’

T4.●1

,,

,.,,,.

,,.,,

u

i

@ , 7- ]

-J T , — o 1 -7 , 7- 6 T 11 T ,5 — 1: —

e-

1!..n?.!..+,.,

,1..hi..

,“”.

II..+

.,,.-#.

-,W...l.1..,.

1..,,

,,,,,A.,m

,.”,.,

,“.W

A..

I,!

,.

—0

I

o-

,!.,n,,,,.q,k,

,,,..I-..

,.”.

,,-

.,,...

=,..*-

“,=

$,.,.4”

.,d

m

-U,.C.”W...%

.4.,,,.q.,,v

,8”k.

.h.-m

,..,,,

.“,+”!.,..+..+

1.1..,.!-.

...tl.hl.l


lm#_Sm-lo5E1

!1 tl~l. Ibldl::l::’1

. . 1 1 1 1 ! 1 I 1 1 1 , 1 , 1

19

DOUBLEREDUCED


,,, ,,,9

w“~.1.

NORMAL20


.- :-+4

z,.

.,:

.4L! c

:2,!

,a,

,:.“

,

.-.

:

,.,.

.*

..d

.

,-b

:.,a.

su.,.

..-4

“

.*..

...4

. .::

.,* ...

:..-

..

,.. .::

,*8 * -s

::,-

,.,

.4 ---

::

r,..

.W%.-8

.- .W

s,=

,lb,.9!

.-.9J

.-.,

.W

,.I-.

01...4

,,;,b

.1,,

,

,-1,,$

,tim

...

,,,.-.,

,,,h

,,.

.E

.w

t -..1

ma

,*.

*,*..

.*-.

.

TABLE

[V-A

—Muhible

samblin~

idam

/ornormal

in$Peclio~~

(~la

Jl~

table)

(SCw

l.9.3

and

4.9.

4)

..1

.

. ICI

— ,,m

— 1 {., [,M*M!

1,“lb n v n .1 Iiu,, * , ,.1 t n.1

,.10 n?.

●,O

1,8

,,, 2.,

,2,

,..*

.,*,8,11

,11*Y

,>1,3

,11s9

,,4s6

4;,.!.4

*I.,

,,..

,.,-

.-,

..

...+

.

-U-”..+.a#-.

b.-.

...+.

.1--1

.-.”..4.

--.-

$“-.-@

-,-lo-o-

-Lb.

!....+.”

t!..-

-b.1.o.-.

*.-,

-.....”!1

.,,

,.!.

-..

-

...”..-

.&.--e

..!.

..+

”IA

.1.

.l.”

..d

+,

-..6

”.@

-1..

,*.

...4

4..

.,-

----

-d.

1.!

4...

,,“

— ,19

—

,,


,7

t! I l""'""'""l-"-"--"l-------l-------l= :2====leeeRaeel

11,,111

$@. 1-

/

MULTIPLETIGHTENED

22


M3A3ID-105E

MULTIPLETIGHTENED

23


m

MULTIPLE“REDUCED

24

#,”mn#ln

c)@., .l. *


1

1

( 1

:::2::: ~..-.==C= ..===~fj

,-- . ..-.== ~--------

-.-s=:: -..-.=2C: ..:==~~

.- ”----- .“. .=::----- s= ( 1

-.” . . . ..~ ---s:=: ---=2== --ce= aa.. -”--- ------- .- ..==:-----3s.- ”---- -.. --. ..s -.-~:g: .- .=:==. ..-””- -------- -------- .--. --=:

------- -------- -.. ---.= ---=-r.----.. 6---” .- e - ” ” - .e -””-- .- ””,,.-.

. . . . . . . -------- -------- -----. *

...e.-- .. e---” .e e.”-. .0 -..”..

. . . . . . . . . . . . . ..- . . . . . . . . . . . . . ..-

..eeoe - . ------ .. 0- - - - .. --..”-

- ::::::: ::::::: :::::::

. . . . . . . “..---..-

- ~ ------- .--*---

.“.. ”.”.

~ ~ -------

MULTIPLEREDUCED

25


MLL-STD-ICISE

1 I I I I I

j{ -mu Owk ur - Xaa! Zn. o aI

26


MIA3IW105E

I I 1

-. . -.i s : . . : : : :--” I I

I I .

14° I ---1-’” 1=44 Usg ilg I. I I I I I 1 +t] I --VI”-- Ie=-ltia=l=-ol ‘- I

.

AOQLTIGHTENED


TABLE

VI-A

—Limiting

Quality(in@rcentdejectiue)

/orwhich

Pa=

Zz10

Percent

~~(jorNormal

Inspection,Single

sampling)

.>M

(see

4.11)

!s

— 0.01

— 0,29

—

— 0,02

— ).46

.20

—

— 0.04

— 0.73

— 0.31

. D.27

—

— 0.06

— I.2

1.49

1.43

.33

—

—

0,1(

— 1,8

0.78

0,67

D,53

— ).46

—

Acceptable

Qu.lity

Level

-n R =!code

Sample

<1=,,,,

.i.~

-m

0.010

A2

D3

c5

D8

E13

F20

G32

II

50

J80

K125

L21m

w315

x500

1’

m1)

I250

0.18

II

2000

— 0.15

— 2.0

— 1.2

— 1.1

3.84

).74

— ),59

—

— 0.2

— 4,5

2.0

1.7

— I.3

1.2

0.94

— 2.77

—

0,40

0.65

1.0

].:

25

16

11

6.9

12

7.6

10

4.8

6.5

0.2

3.1

4.3

5.4

7.4

2,7

3.3

4.6

5.9

2.1

2,9

3.7

4.9

1.9

2,4

3,1

4,0

1.5

1.9

2,5

3.5

1.2

1.6

2.3

1.0

1.4

—

6.:

—

68 41 36 30

—

27 22 19—

16 14

—

r

10

—

58

—54

44

42

— 34

29

24

— 23

—

l....

..


TAL?LE

VI-B—

Limitiog

Qmdity

(inde/ec:$

perhudred

units)

/orwhich

Pa=

10Percen:

(Ior

Nom,al

inspection,Single

farupling)

(=X

4.11)

CA~+

1,,,”

al,,

0.01

A2

II3

c5

00

E13

F20

c32

II50

J20

KIn

Lmil

u315

!i503

1,203

u1250

0.18

IIm

,02

,A6

m

m 7 ,, ,3 ,1

,W 2 49 43 — 23

1: ,9 ,2 I b 1! s!

m 6 ,0 .7 — ,3 ,2 ,94

— ,11

—

04 1.2

1,1

2,7

2,I

I,9 I,5 1,2

— 1.0

D,6

12 — 4.,

— 4,:

3.:

2) 2., I.! 1,1

— 1.(

—

4mpI

AJ.

wI;I,

Led

— 1.0’

— 18 1,0

6,1

— 54 4,6

3,1

— 3,1

2,5

2,3

— J

I.5

2,5

4,0

6,5 Im

71

46

2?49

m11

m21

33

1211

2i‘2?

II13

N24

8,4

12Is

19

7,4

9,4

1216

5.9

7.1

1014

4.9

6,4

9,0

6,0

S,6

3.s

10 78 67 51 46 31 31 25 n

— 15 — 120

’10

— 84 71 59 — 68 40 35 — —

— 25 E la 13(

— 12( 91 71 h! St

6 i 1 ? 1, 1( 1(

la i 3% 311

2s 22(

,60

~ m lol

— w m

w ii 61( w la tic

u i 94 v 61

Et ii 30 I@ —

m z Ikax

—

1 1- 0 In m

vi


TABLE

VII-A—Limiiing

Quality(in

percentdefecii.e)

forwhich

Pa=.

sPercetat

gs(fo

rNormal

Inspection,Single

s~mpling)

$;(see

4.11)

. 0

cede

S.mple

lett

erqize

A2

B3

c5

D8

E13

F20

G32

H50

J80

K125

L200

M315

N500

P800

v1250

R2000

— 0.01(

— — ).24

— —

— 0.01

— .38

—

— 0.0

2

— ,60 ,24

—

— 0.0

4(

— ).% — ).38

— 1.32

—

— 0.06

— .5 .59

.50

— .39

—

Acceptable

Quality

Level

— 0.1

0

— !.4 .% .79

.62

— .53

—

0.1

5

— 3.7

— 1.s

1.3

).97

).84

).66

— 0.25

— 5.8

2.4

2.0

— 1.6

1.3

[.1

— 1.05

—

— 0.4(

— &9

1.8

1.2

2.5

— 2.1

1.6

1.4

— .1 —

0.651.0

21

14

9.1

5.8

7.7

5.0

,6.2

3.9

5.3

3.3

4.2

2.6

3.4

2.1

2.7

1.0

2.4

1.5

—

I.5

— 31 14 12 9,4

—

8.4

6.6

5.4

— 4.4

3.8

—

— 2,5

— 45 — 22 — 18 15 13 — 11 8.5

7.0

— 6.1

—

—

4.0

63 32 28 23 2G 16 14 11 9.6

. —

6.5

7B 41 41 34 30 2s 20 18 15

—

10

—

66— 60 50 46 — 37 32 26 — 24 —


TABLE

VII-B—Limiting

Quality(in

da/cc/sPerhundred

unifs)/orwhich

Pa=

.5Percent

(/or

Nor

n,til

Insp

ect

ion,

Sin

gle

smtt

plin

g)-

(SC

!?4.

11)

Gdo

so.+

1,11,1

,!tl

A2

B3

cs

o8

E13

Fm

G32

nw

Im

~Ii

In

L200

u31s

Nm

P6m

QI=

t,m

ml-

s~

g -n n

,01 ,24

01!

,J6

—

m ‘.C4

,.2(

— 26 — ,s 39 SO — .39

—

,11

,4 v ,. ,7 ,6 s

).1!

1,0

.2 .3 .91

.64

,63

—

).2 5.0

1.4

Lo 1.6

1.3

1.1

— SE —

Accqltabh

IJdil,

IA*,I

— 0.41

— 9.1

3.0

1.2

2.s

— !.1 1.6

1.4

— 1.1

—

).6 Is i.9 i.O !,9 1.3

— L6 !.1 1.0

1.5

1.1

22 9: 7.!

h s: 4,:

3.4

2.1

Z4 —

15

2.s

4.0

63 MO

Im

a

24

E9

3142

2432

29

U20

2423

1316

2126

9.1

1316

21

6A11

Itla

&68.s

II15

5,4

7.0

9.6

6.4

61

3.8

10

$5 ?3 m E2

41 36 27 — 24

— 6s — WI

%0

10 — 2J0

170

,s0

— —

— m — m w 340

— 270

220

—

1s m w 64(

— m IIc

— ‘5 05 n 61(

— w 44

1

7worn

tmm

ml

140

010

110

rlo 1

Im — Ku

Im —

i w E


I

I

I al... ... ... .-- I’--- I== I

I :1 . . . ‘... ... . . . “.. -1--1

-A=-

lIMITNUMBERS 32

. . . . . . . . . . ..--m


MXIAID-105E

. :+

33AVERAGE

SAMPLE SIZE


3=-

TABLE

X-A

—Tables

jot-samp!esize

code

letter:

A

CNAR

TA

-CP

ERAT

INC

CNAR

ACTI

RIST

ICCU

RV[S

FOR

SING

LESA

MPL

iNC

PLAN

SW

*t,,101

1.07s

,,,,(,,,,”

m,,,

ICn”e.

1.,&&.le

-d..ltipl,

S..plinK.-

..trhed

...l..d,

..prwtiir.blp)

,K,:,-rr.n

1,.,

om . . :“ ., . 10 ,.. ... !!! .

ul’hl.l

I)111:S11!,11WF.11LIITSb

hI-I-.1

d.ki;v.

f,.W.’,<

10:i.

d?frm

V,h..,rw,l..it.

k.W;.

>10)

,..,

I,F..-...,.

“,4,”.,,!.

0..!,!,!...!.!La;.,1..-1

,..P-,..,

TABL

[X-

A-1

-,TA

BULA

TIO

VALU

[SFO

RW

ERAT

ING

CNAR

ACTI

RIST

ICCU

RWS

FOR

SING

LESA

MPL

ING

PLAN

S

au”

I“

w,

I0.!431

1.4,

I21

nI

41.2

I09

1I

16I

175

I23!

I305

I174

I5

17

I6

29

I8

59

I9

77

I;;

I;.;.

1,

,,

,2.%

17,0

I409

a.]

111

I199

I2.s

I202

I18I

I462

wI

715

I995

I1121

cm

”I

511

15

.2,

12

L6

15

51

10

7.,

I1M

12

11

12

12

1M

I14

12

1S

15

1W

]8

12

t10

71

ilZ

dl

.--

..

,7s0

1).1

184

WI

ML

121

?1I

?9U

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EX-

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TED

VALU

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NGCH

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TERI

STIC

CURV

ESFO

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GPI

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Aec.p.bk

Ch.lity

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i.ovlim)

p.0,010

IO,MO

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0,25

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40x

I0,62

Ix

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0

F.(i”

rrc,.t

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pmhddwnll.

W.o

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0,0119

0,0249

0.0+29

0.10

0,232

0,281

0342

0.489

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I.01

95,0

0,20410

0.0204

o.aW

0,10s

0,2W

0,318

0.316

0494

0.61S

o.7&2

0.99s

1.19

w,0

0,2W

410.M2S

0s822

0.140

O,al

o.3n

0,43

s0.

262

0.692

0s24

I,w1.30

1s,0

0,0224

0.076V

0,1?4

0.m3

0.23s

0.176

0.241

0,6W

0.634

0.979

1.27

1.49

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0,124

0.214

0.294

0,(54

0.614

0,694

0,022

1.01

1.17

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1,13

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0.111

0,215

0.314

0.409

0.s%

0.77S

0,864

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1,22

1.39

1.14

2.02

10.0

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0.111

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1.42

1.61

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0,290

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0,641

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1.56

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0,221

0,672

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X.R

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0,127

0,211

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0.342

0.411

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0,612

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0,124

0.181

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0,004

0,540

0,651

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0.334

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1,24

1.41

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0.315

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0.S26

0,627

0.172

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1.21

1.51

1.0

0.132

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65


TABL.E

X-S—Tables

/orsamplesize

code

letter:S

Ac=

Accept.mcemnber

Re=

RejectionIIwnber

a=

Accept-

MCpitted

mIM*●9+*

dm.

TTPO

ofm

+ir#

p!u

Shgla

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Multiple

I

cmu-

3130

‘znCa

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w 16UI

2400

3KI0

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m

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bnl

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m

12

02

12

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02

03

13

13

23

0.025


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Mlvsm-loss

6. 6

6.1 Inten&d Use. [email protected] p~ end tables for insperzionbyattrti~tended to ke used in the aquj.sicim of Eefensennteria.1.

6.2 subjectTerm (I@?yWord)Listi.nq.

Aceptable CuaMty Level (A(Z)

merage ~goirq Qdality(~)

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Dsfective

Lat or Batch

ProcessAversge

S.an@e

SalrplilqPlan

unit of Prcduct

6.3 changes fran P-ous Issue.this revisionto icientify&mqesthe extm.siveneasof the rhanges.

Vertkal lines O= asterisks ars not ussd in

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