second-order polarization techniques for the characterization of thin films

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Second-order polarization techniques for the characterization of thin films Martti Kauranen Institute of Physics Tampere University of Technology Finland

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Second-order polarization techniques for the characterization of thin films. Martti Kauranen Institute of Physics Tampere University of Technology Finland. Where is Tampere?. TAMPERE. Second-order nonlinear optics. Second-harmonic response Spatial symmetry symmetry group of material - PowerPoint PPT Presentation

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Page 1: Second-order polarization techniques for the characterization of thin films

Second-order polarization techniques for the characterization of thin films

Martti KauranenInstitute of Physics

Tampere University of TechnologyFinland

Page 2: Second-order polarization techniques for the characterization of thin films

COST MP0604, Ancona, October 26, 2007 2

Where is Tampere?

TAMPERE

Page 3: Second-order polarization techniques for the characterization of thin films

COST MP0604, Ancona, October 26, 2007 3

Second-order nonlinear optics

• Second-harmonic response

• Spatial symmetry– symmetry group of material

• Centrosymmetry– second-order processes electric-

dipole-forbidden– probes of surfaces and thin films

( ) ( ) i tE t E e (2)

,(2 ) ( ) ( )i j kijk

j kP E E

)2()2()2( 0 lmnijkijk C

surfacenormal

surfacenormal

mirrorplane

z

2

2

thin film

substrate

Page 4: Second-order polarization techniques for the characterization of thin films

COST MP0604, Ancona, October 26, 2007 4

Multipole interactions

• Hamiltonian

• Second-order

• Magnetic and quadrupole tensors– symmetry properties are different from those of the electric-

dipole tensor

EQBmE :H

EEχM :2mee

EEχBEχEEχP eeQeemeee ::2

EEχQ :2Qee

2

e

e

e

2

e

e

m

(m)

2

m

e

e(e)

eee eem mee

weak

axial

4th rankaxial

4th rank

electric-dipole-forbidden effects can occur

Page 5: Second-order polarization techniques for the characterization of thin films

COST MP0604, Ancona, October 26, 2007 5

Chirality and optical activity

• Chiral molecules– two mirror-image forms (enantiomers)– noncentrosymmetric– biological material– pharmacological molecules

• Optical activity– optical effects due to chirality– optical rotation– circular dichroism– interference between electric

and magnetic contributions– reverse sign between

the enantiomers

helicalpath

ee

kE

chiralmedium

Page 6: Second-order polarization techniques for the characterization of thin films

COST MP0604, Ancona, October 26, 2007 6

Chirality and nonlinear optics

• Second-order materials– low molecular symmetry

– electric-dipole response in isotropic materials– magnetic response in centrosymmetric materials

• New probes of chirality– optical activity in the nonlinear response– sensitivity to surfaces and thin films– small amount of material– electric-dipole-allowed probes– relative magnitude ~1

high macroscopic symmetry

(a) (b)

s s

sp

pp

2

2

<<

waveplate

thin film

substrate

Page 7: Second-order polarization techniques for the characterization of thin films

COST MP0604, Ancona, October 26, 2007 7

Interesting quantities

• Susceptibility tensor– symmetry group– structural features– strength of nonlinear

response

• Molecular ordering– degree of orientation

cossin221)2(

ZZZzxx

3)2( cosZZZzzz

ijk for C2 C2 symmetry featureszzzzxxzyy

xxz=xzxyyz=yzyxyz=xzyyxz=yzxzxy=zyx

-----

chiralitychirality

chirality and anisotropy

Page 8: Second-order polarization techniques for the characterization of thin films

COST MP0604, Ancona, October 26, 2007 8

Thin-film characterization

• Fundamental field

• Second-harmonic field

• In-plane isotropy

ps AA psE ˆˆ)(

spsp AhAgAfAE 22)2(

1 1 ...ff a 1 1 ...gg a 1 1 ...hh a

achiral

chiralpf sh

sf sg no EDpg

ph

s s

sp

pp

2

2

<<

waveplate

thin film

substrate

Page 9: Second-order polarization techniques for the characterization of thin films

COST MP0604, Ancona, October 26, 2007 9

Chiral film with in-plane isotropy

• Polyisocyanide

N N NCO

OCH2

CH3

CHN *Cn

NO2

OCOCH2CH2 CH3

COCH2CH2 CH3

O

N N NCO

OCH2

CH3

CHN *Cn

NO2

OCOCH2CH2 CH3

COCH2CH2 CH3

O

rotation angle-180 -90 0 90 180

SH in

tens

ity

0.0

0.5

1.0

rotation angle-180 -90 0 90 180

SH in

tens

ity

0.0

0.5

1.0

rotation angle of quarter waveplate (degrees)

SH in

tens

ity

Page 10: Second-order polarization techniques for the characterization of thin films

COST MP0604, Ancona, October 26, 2007 10

Magnetic contributions?

• Polyisocyanide– evidence through complete tensor analysis

• Polythiophene – direct evidence

SCH3

O

( )n SCH3

O

( )n

0)(~ meezxx

eemxxzsg

rotation angle of WP (degrees)

SH in

tens

ity

rotation angle-180 -90 0 90 180

SH in

tens

ity0.0

0.5

1.0 0g0g

Page 11: Second-order polarization techniques for the characterization of thin films

COST MP0604, Ancona, October 26, 2007 11

Anisotropic achiral film

• 2-docosylamine-5-nitropyridine (DCANP)

O2NC22H45

N NH

substrate

dipping

O2NC22H45

N NH

substrate

dipping

rotation angle-180 -90 0 90 180

SH in

tens

ity

0.0

0.5

1.0

rotation angle-180 -90 0 90 180

SH in

tens

ity

0.0

0.5

1.0

SH in

tens

ity

rotation angle of quarter waveplate (degrees)

Page 12: Second-order polarization techniques for the characterization of thin films

COST MP0604, Ancona, October 26, 2007 12

Chiral and anisotropic film

• Thiohelicene– chiral

• Langmuir-Blodgett film– columnar aggregates– in-plane anisotropy

• Symmetry group– in-plane anisotropy– chiral– eight susceptibility components– arbitrary in-plane axes

OC12H25OC12H25

OC12H25

O

O

SC12H25O

O

O

Ssurfacenormal

z x

y

zy x

x'

y'2C

OC12H25OC12H25

OC12H25

O

O

SC12H25O

O

O

S

Page 13: Second-order polarization techniques for the characterization of thin films

COST MP0604, Ancona, October 26, 2007 13

QWP

2

X

z

Y

x

s

p

s

p

Measurements

• Independent measurements– vary azimuth – detect s- and p-polarized

signals

• Recovery of susceptibility tensor– regression based data analysis– comparison of theoretical models– statistical indicators

f, g, h for each signal222)2( spsp AhAgAfAI

1 1 ...ff a

1 1 ...gg a

1 1 ...hh a

Page 14: Second-order polarization techniques for the characterization of thin films

COST MP0604, Ancona, October 26, 2007 14

Experimental results

tensor components residuals

symmetry groupis actually 2D

Page 15: Second-order polarization techniques for the characterization of thin films

COST MP0604, Ancona, October 26, 2007 15

Absolute probes of chirality?

• Normal incidence required– no difference between s and p

• Circular polarizations required– insensitivity to anisotropy

• Problem– even tight focusing does not

produce strong longitudinal polarization components

XY

XY

E

Epoor coupling with surface nonlinearity

Page 16: Second-order polarization techniques for the characterization of thin films

COST MP0604, Ancona, October 26, 2007 16

Radial and azimuthal polarization

• Cylindrical symmetry– insensitive to anisotropy

• Focusing– longitudinal components in focus– coupling to surface nonlinearity

• Beams with handedness– sensitive to chirality?

• Combine different types of beams– radial and circular polarization

XY

E

E

E

E

EB

XY

E

E

E

E

EB

XY

E

E

E

E

EB

Page 17: Second-order polarization techniques for the characterization of thin films

COST MP0604, Ancona, October 26, 2007 17

NLO microscopy of nanodots*

• Cylindrical gold nanodots**– SHG forbidden for ideal samples

at normal incidence– THG allowed

SHG THG

bright particles depend on polarization *Jeff Squier, CSM

**Tapio Niemi, ORC, TUT