slide development of a laser driver chip test set‑up for slhc experiments

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S. Meroli (a,b) , A. Cazzorla (a,b) , B. Checcucci (a) , G. Mazza (c) , A. Moschitta (a,b) , L. Servoli (a) (a) Istituto Nazionale di Fisica Nucleare Sezione di Perugia Italy (b) Università degli Studi di Perugia - Italy (c) Istituto Nazionale di Fisica Nucleare Sezione di Torino Italy

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Page 1: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

S. Meroli(a,b), A. Cazzorla(a,b), B. Checcucci(a), G. Mazza(c), A. Moschitta(a,b), L. Servoli(a)

(a) Istituto Nazionale di Fisica NucleareSezione di Perugia – Italy

(b) Università degli Studi di Perugia - Italy

(c) Istituto Nazionale di Fisica NucleareSezione di Torino – Italy

Page 2: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

OUTLINE

• Optical Links for LHC Upgrade

• Test Setup description

• Test Results

• Conclusions

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Page 3: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

Optical Link at LHC

• Optical links heavily used in LHC experiments:– Minimize power dissipation and material budget

– Allow high data-rates

- Immune to electrical interference

• example: CMS tracker readout:- used 50000 optical fibres

- 40 MS/s transfer rate

- total length of the link approximately 100m

- bit error rates less than 10-12

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Page 4: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

Optical Link Upgrade for LHC

• Future LHC upgrade: luminosity increased by an order of magnitude. Higher radiation doses. More data to be transmitted

• Further requirements: low power dissipation, reduced mass.

• Possible solution: increase the bandwidth of each individual link.

- Run at multi‐Gbps speeds;- Have better radiation tolerance;- Operate at low temperatures (~ -10°) and in strong magnetic field (4T);

- Be easy to install and operate.

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Page 5: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

GBT Project

• The GBT project aims to design a fast and radiation tolerant optical transceiver for HEP experiments.

• The GBT project is a collaboration between:

Cern, CPPM Marseille, SMU Dallas and several INFN units (Perugia, Torino, Bologna, Bari).

• The GBT will provide a bi-directional connection between the front-end electronics and the DAQ/TTC/SC systems:

- working at 4.8 Gbit/s

- radiation tolerant (total dose and SEU effects)

Development of a full custom ASIC is needed

(fabricated in a commercial CMOS 130 nm technology).

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Page 6: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

GBT Architecture

The GBT includes:- GBTIA Transimpedance optical receiver

- GBTx Data and Timing Transceiver

- GBT-SCA Slow control ASIC

- GBLD Laser driver (DUT)• Possibility to drive both edge

emitting lasers and VCSELs

• Differential and single ended driving

• Independently programmable rising and falling edge pre/deemphasis

• I2C digital control with SEU protection

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Page 7: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

GBLD Diagram Block

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• I2C Interface

• Internal Registers

• Input Stage

• PreDriver

• Output Stages

Page 8: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

GBLD Specification

Electrical Specification Proposal for

5 Gbps Operation

# Specifications Min Max Unit Note

1 Rise Time 60 Ps 20%-80%

2 Fall Time 60 Ps 20%-80%

3 Total

Jitter

50 Ps @BER=

1E-12

4 Deterministic

Jitter

30 Ps

5 Modulation

current

2 24 mA

6 Bias current 2 43 mA

7 Pre/De-emphasis

current

0 12 mA

8 Power

consumption

460 mW

Eye Diagram: overlap of the waveform in a single UI.

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Page 9: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

GBLD Testboard

• Critical for the Testboard is the design of:

- Footprint:• transition between the chip pad and the PCB• insufficient thermal sink.• soldering problems due to high density package.

- Separated Power Distribution System for critical areas

- Bias network capable to work in a 4T magnetic environment

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Schematic Testboard

Assembled Testboard

Page 10: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

GBLD Testboard

• To ensure signal integrity at 5 Gb/s, an accurate simulation work for the microstrip design has been carried out.

Tool to study the electric field propagation and the coupling between the microstrip lines

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Tool to determine the size, the length and the geometry of the microstrip line

ElectricField

Page 11: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

GBLD Testboard

This analysis allowed us to reach the main goal:microstrip lines impedance closes to 50Ω (± 5%) avoiding mismatch and reflections

Microstrip impedance measurement, made out with a TDR module

(~51Ω)

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• To ensure signal integrity at 5 Gb/s, an accurate simulation work, for the microstrip design, has been carried out.

Page 12: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

Laser Driver Test Setup

• PC to control in real-time:

- GBLD setting (through I2C line)- Signal Data-Rate generated from PPG- Signal Measurements from SDA Scope

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Page 13: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

Test results: Eye Diagrams

• @2.5 Gb/s: - eye open - jitter quite low

Eye [email protected] Gb/s

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• @5 Gb/s: - rise/fall times not sufficiently fast - significant jitter present

Eye Diagram@5 Gb/s

Page 14: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

Test results: Rise Time

Rise Time@5 Gb/s

• Rise time significantly higher than 120 ps

• Rise time far from specification (60 ps) and critical for 5 Gb/s operation

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Rise [email protected] Gb/s

Page 15: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

Test results: Fall Time

Fall [email protected] Gb/s Fall Time@5 Gb/s

• Fall time significantly higher than 100 ps

• Far from specification (60 ps)

PreDriver fails to switch the current quickly (bandwidth limitation)Increasing the preDrvBias Current: GBLD performance improvement

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Page 16: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

Test results: Output Jitter

Rj@5 Gb/s Dj@5 Gb/s

Tj@5 Gb/s

5 Gb/s jitter results very similar at 2.5 Gb/s jitter results

• Rj remains into the specifications • Dj is the dominant part

• The dominant Dj component is the Inter-Symbolic Interference (ISI) related to the bandwidth limitation.

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Page 17: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

Test results: SNR

• SNR@5 Gb/s worsens than [email protected] Gb/s

• SNR improves increasing the preDrvBias current

High rise/fall time and Deterministic Jitter make impossible the operation @5Gb/s

SNR@5 Gb/s

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[email protected] Gb/s

Page 18: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

Test results: Pre-Emphasis Current

Rise

Time

Fall

Time

Positive

overshoot

Negative

overshoot

82 ps 78.5 ps 20.9 % 23.3 %

Rise

Time

Fall

Time

Positive

overshoot

Negative

overshoot

137.9 ps 135.6 ps 5.1 % 2 %

Pre-emphasis is an addictional current provided during the rise and fall time. Need to improve the rise and fall time.

Waveform without pre-emphasis@5 Gb/s

Waveform with max pre-emphasis@5 Gb/s

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Page 19: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

With maximum pre-emphasis the rise/fall time decreases significantly (close to the proposal specifications). Eye Diagrams wider

Pre Emphasis MAX

Pre Emphasis MINRise Time

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Test results: Pre-Emphasis Current

Page 20: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

Conclusion

• A full automatic test setup has been realized

• A 5 Gb/s laser driver in CMOS 0.13 μm technology hasbeen designed and tested.

• Prototype is functional but bandwidth is a bit below specs

• Possible reasons: GBLD parasitic capacitance and layout symmetry need optimization.

• A new version of GBLD chip and a new testboard have been realized (May 2010) and will be put under test soon.

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Page 23: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

Input Range

Output pk-pk Voltage vs Input Voltage

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Page 24: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

Test results: Eye Height

• Eye Height @5 Gb/s closer than Eye Height @2.5 Gb/s

Eye Height @5 Gb/s

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Eye Height @2.5 Gb/s

Page 25: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

Tests with pre-emphasis current

Ipeak is the additional current that adds to/subtracts from Imod

during the period Tpeak over which the Pre-Emphasis/De-Emphasis takes place.

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Page 26: Slide Development Of A Laser Driver Chip Test Set‑Up For Slhc Experiments

Tests with VCSEL

Eye Diagram obtained with a VCSEL

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