solar telematics system reliability and safety analysis craig lechlitner brian kelley clayton...
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SOLAR TELEMATICS SYSTEM
Reliability and Safety Analysis
Craig Lechlitner
Brian KelleyClayton Dickemann
Dan Ehrman
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Block Diagram
C A N
UA
RT
1
UA
RT
2
S P I
U A R T3D a t a R d y
G P I O
A / D C o n v .
Comm. Controller
P I C 3 2 M X7 9 5 F 5 1 2 H
3 . 3 V
Gra
phic
s
Tou
ch/V
ol S
PI
S P I
U A R T
F la s h S P I
Par
alle
l Por
t
Bac
klig
ht E
NB
ackl
ight
PW
M
Tou
ch C
S
Spe
aker
PW
MV
olum
e C
S
D a t a R d y
Graphics Controller
P I C 2 4 F J 2 5 6 D A 2 1 0
16 R
GB
/CLK
4-W
ire T
ouch
Scr
een
B a c k lig h t
7 in . L C D To u c h s c re e n
2 0 0 m A
4-W
ire T
ouch
SP
I
CS
TouchCntrl.
TS C 2 0 0 0
UA
RT
US
B
M C P 2 2 0 0
UA
RT
US
B
U 4
M C P 2 2 0 0
UA
RT
RS
232
M A X3 2 3 2
Par
alle
l
2MB 10ns SRAM
I S 6 1 W V 1 0 2 4 1 6 B L L
V in
C TX/ C R X
CA
NH
/CA
NL
CANTrnscv.
M A X3 0 5 1
1234
M in iU S B1234
M in iU S B
123456789
D B 9
12
To C A R
2 0 0 m A
Graphics/AudioController
A u d io P W M A u d io
Vol
ume
SP
IS
PI
CS
Low-Pass FilterAmplifierVolume Control
M C P 6 0 2 / M C P 4 2 4 1 / L M 4 9 5 0
SP
I
2 GB Flash Memory
S D C a rd
3
1234
E x t . B u t t o n I n p u t s (8 )
8
4
40 2
4
41
3
2
22
2
2E
xtIs
o
Opt
o-Is
olat
or
2
2
U A R T
GPS
L S 2 0 0 3 1
2
L S 1
S P E A K E R8
1 2 -1 6 V3 . 3 V
2 0 0 m A (9 . 9 V )
200m
A E
N20
0mA
DIM
P o we r S u p p lie s
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PSSCs
1. An ability to track vehicle location using GPS.
2. An ability to receive and send CAN messages from and to other systems in the car.
3. An ability to display graphics on the LCD display.
4. An ability to respond to user input from a touchscreen.
5. An ability to store and load data to and from non-volatile memory.
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Components Chosen for Analysis• Graphics Controller (PIC24FJ256DA210)• Communications Microcontroller (PIC32MX795F512H)• SRAM (IS61WV102416BLL)• 3.3v Switch Mode Regulator (LM3407)
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PIC24 graphics microcontroller• High complexity (100 pin, 16 bit)• Controls LCD, touch input, audio, SRAM, SD card. Interfaces with
PIC32
λp = 3.76 failures per 106 hours
MTTF = 266,000 hours = 30.4 years
Parameter Description Value Comments
C1 Die complexity 0.28 16 bit microprocessor
πT Temperature coefficient 0.60 70 C Die Temperature (estimate)
C2 Pin count 0.052 100 pin, Nonhermetic SMT
πE Environmental constant 4.0 Ground Mobile
πQ Learning factor 1.0 In production for >2 years
πL Quality factor 10.0 Commercial Product
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PIC32 communications microcontroller
• High complexity (64 pin, 32 bit)• Communicates with other systems on CAN bus, GPS, sends
telemetry data.
λp = 4.64 failures per 106 hours
MTTF = 216,000 hours = 25 years
Parameter Description Value Comments
C1 Die complexity 0.56 32 bit microprocessor
πT Temperature coefficient 0.60 70 C Die Temperature (estimate)
C2 Pin count 0.032 64 pin, Nonhermetic SMT
πE Environmental constant 4.0 Ground Mobile
πQ Learning factor 1.0 In production for >2 years
πL Quality factor 10.0 Commercial Product
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SRAM• 16 MBit• Holds frame buffers for LCD.• Interfaces with PIC24.
• λp = 15.84 failures per 106 hours• MTTF = 63,000 hours = 7.2 years
Parameter Description Value Comments
C1 Die complexity 2.48 16MBit,Estimate (table only goes to 1MBit)
πT Temperature coefficient 0.60 70 C Die Temperature (estimate)
C2 Pin count 0.024 48 pin, Nonhermetic SMT
πE Environmental constant 4.0 Ground Mobile
λ cyc Cycling induced Failure Rate
0.0 NOT Flotex or Textured-Poly EEPROM
πQ Learning factor 1.0 In production for >2 years
πL Quality factor 10.0 Commercial Product
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LM2673 Switch mode regulator• Possible high temperature• Powers everything except backlight and audio amplifier• 12-15v unregulated input• 3.3v, 3Amax regulated output
• λp = 0.376 failures per 106 hours• MTTF = 2,660,000 hours = 304 years
Parameter Description Value Comments
C1 Die complexity .04 Estimate 101 to 1000 MOS transistors (Linear model
πT Temperature coefficient 0.60 70 C Die Temperature (estimate)
C2 Pin count 0.0034 8 pin, Nonhermetic SMT
πE Environmental constant 4.0 Ground Mobile
πQ Learning factor 1.0 In production for >2 years
πL Quality factor 10.0 Commercial Product
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Definition of Criticality levels• High - Possibility of injury to user• Medium - Renders device useless, major repairs needed• Low – Majority of device still works, easily repairable
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FMCEA chartFailure mode Possible causes Effect Detection method Criticality
Power supply becomes unregulated (Vout > 3.3v)
Failure of U5 Possible damage to most ICs, excessive heat build up, smoke and fire
Observation (smell of burning electronics), probe 3.3v line
High
3.3v Power supply becomes shorted
Failure of U5, D5, C19, etc
Only backlight works, possible heat build up, smoke and fire
Observation (visual, smell of burning electronics), probe 3.3v line
High
Device fails to power up Blown fuse due to temporary short circuit
or reverse polarity on VIN
Nothing works Observation (visual) Low
Pin on either PIC24 or PIC32 becomes constant 1 or 0
Software, poor soldering, failure of peripheral.
Specific function stops working
Observation Low - Medium
Failure to communicate with other systems on CAN bus.
Failure of U10 (PIC32), or U13 (MAX 3051), software in this or another system.
Cannot control headlights, wiper, vehicle direction. Cannot display battery or solar array stats, etc.
Self check Low, can still display vehicle speed/position, vehicle will still drive.
Data in SRAM becomes corrupted/unreadable
Failure of U3 (SRAM), U1 (PIC24)
Erratic data sent to LCD Observation (visual), use logic analyzer
Low - Medium
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Questions?