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1 Statistics and Pharmaceutical Quality Karthik Iyer (CQE, CSSBB) Senior Policy Advisor CDER/OC/OMPQ January 24 th , 2014 IFPAC * This presentation reflects the views of the author and should not be construed to represent FDA’s views or policies.

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Page 1: Statistics and Pharmaceutical Quality - · PDF fileStatistics and Pharmaceutical Quality Karthik Iyer (CQE, CSSBB) Senior ... • The analysis was performed using ASTM E2334-09. Keeping

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Statistics and Pharmaceutical Quality

Karthik Iyer (CQE, CSSBB)

Senior Policy AdvisorCDER/OC/OMPQJanuary 24th, 2014

IFPAC* This presentation reflects the views of the author and should not be construed to represent FDA’s views or policies.

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Agenda

• Enforcement Action Examples• CGMP References• ASTM Standards• Acceptance Criteria

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Examples: Recent Warning Letters, Recalls, and

483 Citations• WL: Incorrect application of sampling

plans• WL: Equipment changes and process

capability• Recall: application of ASTM E2709• 483 Notice of Observations

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1. Warning Letter – Sampling Plans

• Firm using sampling plans incorrectly– Pooled X vials, used only 1 reportable value, but used

n=X in sampling plan.

– ….based your lot or batch acceptance/rejection criteria on a single reportable value averaged from a pooled sample.

…For ….., you are collecting 3 pooled samples (each pool

= 10 vials). This equates to a lot disposition action on 3 reportable values with corresponding AQL of X% and LQ of X% respectively. This is not equivalent to an X or X plan as claimed in your SOP.

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1. Warning Letter – Sampling Plans

– Response to 483 indicated firm did not know how to use and interpret sampling plans correctly.

– Firm did not understand concepts of Acceptable Quality Level (AQL) and Limiting Quality (LQ) and Operating Characteristic Curve (OC) of a specific sampling plan.

181614121086420

1.0

0.8

0.6

0.4

0.2

0.0

Lot Percent Defective

Prob

abili

ty o

f A

ccep

tanc

e

Operating Characteristic (OC) CurveSample Size = 30, Acceptance Number = 0

35302520151050

1.0

0.9

0.8

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0.3

Lot Percent Defective

Prob

abili

ty o

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ccep

tanc

e

Operating Characteristic (OC) CurveSample Size = 3, Acceptance Number = 0

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2. Warning Letter – Equipment Comparability and Process Capability

• Four (4) tablet products, various strengths – Initial process qualification used a single-sided tablet

press. During routine production, however, these products were also being manufactured using a double-sided tablet press.

– Compression using the double sided press was not qualified.

– Firm’s response to the FDA 483 attempted to show statistical equivalence between the single and double sides presses.

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2. Warning Letter – Equipment Comparability and Process Capability

• The firm’s written response referenced the Cpk values for processes using a double-sided tablet press and the single-sided tablet press.

• FDA evaluation of the FDA 483 response– The Cpk value alone was not an appropriate metric to demonstrate

statistical equivalence. Cpk analysis requires a normal underlying distribution and a demonstrated state of statistical process control. The firm did not address these issues in their response.

– Statistical equivalence between the two presses could have been shown by using either parametric or non-parametric (based on distribution analysis) approaches and comparing means and variances. Neither of these approaches was employed. Firm did not use the proper analysis to support its conclusion that no significant differences existed between the two compression processes.

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2. Warning Letter – Equipment Comparability and Process Capability

• Issues –– Data did not support proper statistical

conclusions.– Firm did not understand underlying

assumptions required to conduct Process Capability calculations.

– Firm did not conduct proper statistical analysis to demonstrate equivalence between two operations.

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Application of ASTM E2709 (Referenced in PV Guidance) - Standard Practice for Demonstrating Capability to Comply with an Acceptance Procedure.

Tablets, Q value: 70%

Background: Firm having recall issues due to dissolution failures on stability. Dissolution data analyzed using ASTM 2709. Sample data below shown for 2 lots (each row = different lot).

Take-home: If evaluated correctly, these lots would have been flagged as high risk for failure.

Unit 1

Unit 2

Unit 3

Unit 4

Unit 5

Unit 6

Unit 7

Unit 8

Unit 9

Unit 10

Unit 11

Unit 12 Mean SD RSD

USP -PASS

or FAIL

ASTM E2709 Probability @ 95% confidence

96% 72% 82% 74%102

% 70% 97% 63% 71% 78% 74% 60% 78% 14% 17% Pass 0.14%

77% 73% 90% 95% 92% 59% 73% 94% 60% 72% 62% 85% 78% 13% 17% Pass 0.14%

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483 Notice of Observations• SPC program deficiencies• Assessed SPC SOP for established

products• Firm improperly deriving control limits

– By using long term standard deviation– By limiting the standard deviation at a set Ppk

• Approach differs from established consensus standards and may not signal out of statistical control 10

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483 Notice of Observations

• Sampling plan deficiencies– “…SOP XX is inadequate because there is no

documented scientific rationale for determining if the acceptance and rejection levels are appropriate for lot release…”

– Firm failed to understand/characterize final quality statement from application of plans

– CGMP requires credentialed personnel

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CGMP References

• 211.110(a) & (b)• 211.165(d)• 211.180(e)• Preamble for 21 CFR 210, 211

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Key elements in these requirements

• Control procedures • Monitor the output • Performance • Variability in the characteristics of in-process

material and the drug product• ….derived from previous acceptable process

average and process variability estimates(where possible)

• ….determined by...suitable statistical procedures (where appropriate)

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Statistics• Can sample units at any stage of process and analyze for:

– Weight.– Content Uniformity.– Dissolution.– Other critical quality attributes and or parameters of interest.

• Can make decisions at any stage of process with respect to:– Ability for a lot to pass USP UDU and or Dissolution tests in the future.

(ASTM E2709)– Confidence in sampling. (ASTM E2334 & ASTM E122)– Capability and Performance analysis. (ASTM E2281)– Statistical Process Control Charts. (Monitor Variation, ASTM E2587)

• Following tools illustrate making inferences about untested units on a particular attribute, variable and or parameter with respect to sample size and an associated confidence.

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Voluntary Consensus Standards:US Government Agencies

• OMB Circular A119– Federal Participation in the Development and Use of

Voluntary Consensus Standards and in Conformity Assessment Activities (Rev. Feb 10, 1998)

– directs agencies to use voluntary consensus standards in lieu of government-unique standards except where inconsistent with law or otherwise impractical

– intended to reduce to a minimum the reliance by agencies on government-unique standards.

http://www.whitehouse.gov/omb/circulars/a119/a119.html

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Sample Size Effect on RSD Limit @ 95% Confidence / 95% Probability

0.00

1.00

2.00

3.00

4.00

5.00

6.00

7.00

85.1 87.5 90 92.5 95 97.5 100 102.5 105 107.5 110 112.5 114.9

Sample Mean

RSD

n=10

n=20

n=30n=100

n=500

n=1000

Sample Size Effect on RSD Limit @ 99% Confidence / 95% Probability

0.00

1.00

2.00

3.00

4.00

5.00

6.00

7.00

85.1 87.5 90 92.5 95 97.5 100 102.5 105 107.5 110 112.5 114.9

Sample Mean

RSD

n=10

n=20

n=30

n=100

n=500

n=1000

ASTM E2709Standard Practice for Demonstrating Capability to Comply with an Acceptance Procedure

One tool to analyzeUniformity of DosageUnits

Demonstrating Statistical

Confidence

Measurement by Variables

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ASTM E2709 ExplanationStandard Practice for Demonstrating Capability

to Comply with an Acceptance Procedure

• Slide shows the relationship between sample size and tolerance for variability. As sample size increases, so does the tolerance for variability.

• The analysis was performed using ASTM E2709-10. The RSD limits on the y-axis represent the maximum variability a lot can possess to ensure with 95 or 99% confidence that there is at least a 95 or 99% probability a lot will comply withthe USP Uniformity of Dosage Units test based upon a given sample size, confidence level, and sample mean. – For example: If you sampled 30 units and had a sample

mean of 95%, then the maximum RSD value for those 30 units would be ~3.0% to be 95% confident that there is at least a 95% probability a future sample from the lot would pass the USP UDU test.

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Demonstrating ConfidenceMeasurement by Attributes

Confidence vs Sample Size

0

10

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30

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50

60

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90

100

6 10 12 24 30 100 150 300 500 1000

Sample Size

Conf

iden

ce Pd=1%Pd=0.5%Pd=0.065%

ASTM E2334Setting an Upper Confidence Bound For a Fraction or Number of Non-Conforming items, or a Rate of Occurrence for Non-conformities, Using Attribute Data, When There is a Zero Response in the Sample

Sample Size vs Percentage of Non Conformities

0

5

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10 20 30 50 500 1000

Sample Size

Perc

enta

ge N

on C

onfo

rmin

g

99%Confidence

95%Confidence

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ASTM E2334 ExplanationSetting an Upper Confidence Bound For a Fraction or

Number of Non-Conforming items, or a Rate of Occurrencefor Non-conformities, Using Attribute Data, When There is a

Zero Response in the Sample

• Slide shows the relationship between Confidence and Sample Size. As sample size increases, so does confidence demonstrated.

• The analysis was performed using ASTM E2334-09. Keeping the maximum percent defective constant (1, 0.5, and 0.065%) a line was generated to show how sample size effects the confidence demonstrated in having no more than the maximum percent defective. A zero response was assumed (that is zero defects in the sample) and a binomial distribution was used.– For example: If you desire a percent defective of no more than

0.5% and sample 30 units, then you are only ~15% confident that your lot has no more than 0.5% defects.

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ASTM E2334 Explanation Setting an Upper Confidence Bound For a Fraction or

Number of Non-Conforming items, or a Rate of Occurrencefor Non-conformities, Using Attribute Data, When There is a

Zero Response in the Sample

• Slide shows the relationship between the upper confidence bound on percent defects and sample size. As sample size increases the upper confidence bound on percent defects decreases.

• The analysis was performed using ASTM E2334-09. Keeping the confidence level constant (95 and 99%) a line was generated to show how sample size effects the upper confidence bound percent defects. A zero response was assumed (that is zero defects in the sample) and a binomial distribution was used.– For example: If you want to be 99% confident that there is no

more than 1% defective units in your lot, then you must sample ~460 units with a zero response.

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ASTM E2281Standard Practice for

Process and Measurement Capability Indices

Confidence in Manufacturing Capability

0.00

0.50

1.00

1.50

2.00

2.50

3.00

3.50

6 10 12 20 24 30 50 100 250 500 1000

Sample Size

Man

ufac

turin

g Ca

pabi

lity

95% Confidence99% Confidence

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ASTM E2281 ExplanationStandard Practice for

Process and Measurement Capability Indices

• Slide shows the relationship between a reported Process Capability Index (Cpk (3.14)) and sample size. As sample size increases, so does the reported Cpk.

• When reporting a Cpk, a lower 95 or 99% confidence bound should always be the value reported. As this value accounts for the sample size in which the Cpk was estimated.– For example: If you sampled 30 units and estimated

a Cpk of 3.14, then the value reported should be ~2.5 (that is I am 99% confident that the Cpk for my process is at least 2.5). The analysis was done using ASTM E2281-08.

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Ppk vs. Cpk

• Cpk – Data normally distributed– State of Statistical control– Sigma estimated using Control chart methods– Short-term

• Ppk– Data Normally Distributed– Sigma estimated using standard formula – Long-term

• Both indices can be applied to non-normal data through transformation, distribution fit or non parametric approaches

• Note: There may be cases where the calculation and application/interpretation of Cpk and Ppk are different

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• SPC (Statistical Process Control) Charts are a collection of very effective statistical-graphical tools which can be used to:

– Understand and diagnose your data. – Track performance to identify problems, or shifts in

performance (good or bad).– Control or adjust the process to maintain desired

performance.• Can be applied for data based on Incoming, In-

process, or Lot release samples.• Can be applied for both variable and attribute

data.

ASTM E2587Standard Practice for Use of Control Charts in Statistical Process Control

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9181716151413121111

103

102

101

100

Sam ple

Sam

ple

Mea

n __X=101.868

UCL=103.048

LCL=100.689

9181716151413121111

4.5

3.0

1.5

0.0

Sam ple

Sam

ple

Ran

ge

_R=2.046

UCL=4.326

LCL=0

1

665

1

555

5

52

2

Voice of the Process Is the process in a state of control?

ASTM E2587 Standard Practice for Use of Control Charts in Statistical Process ControlVariable X-bar-R chart

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ASTM E2587Standard Practice for Use of Control Charts in Statistical Process Control

• Chart is used to detect special causes of variation during manufacturing.

• Control is determined against standard 8 rules established by Dr. Walter Shewhart.

• Preceding chart is called X-bar-Range with Subgroup size of 5 tablets (each point is an average of 5 individual results).

• Control limits reveal true variability of the process.

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ASTM E2587 Standard Practice for Use of Control Charts in Statistical Process ControlAttribute nP chart

28252219161310741

12

10

8

6

4

2

0

Sample

Sam

ple

Coun

t

__NP=4.9

UCL=11.38

LCL=0

Pass/Fail test for incoming tablet bottles (nP chart)The tablet bottle is either pass or fail (Binary response)

S ample 100 bottles per incom ing lot

Here we assume the failure rate is 5 bottles/100 bottlesNeed to know historical defect rate from supplier

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SPC Checklist• Points to Consider with SPC

– Is the data normally distributed?• Possible use of a run chart for limited or non-normal data• Note: There may be SPC chart applications for non-normal data

– What is the rational subgroup size?– What does the SOP say with respect to

• How to Establish Control Limits?• How often are Control Limits Revised?• Which SPC rules to use?• What to do if a rule is violated?• Magnitude of change that is important?• Is a shift in mean or variance important or both?• What is the Average Run Length (ARL or false positives)?

– If data is non-normal, it will increase SPC rule violations which may not necessarily be an indication of an out of control process.

• How are the samples taken and do they follow a linear time sequence?• Are the samples independent?

• Relevant CGMP that can be used for SPC– 211.110, 211.160, 211.165

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Establishing Acceptance Criteria

• What are the appropriate quality levels?– Acceptable / Unacceptable

• What is the distribution of my data?– Normal / Unknown / Not normal / etc.

• What is the risk of the product and/or attribute?– Are there controls in place to mitigate the

risk?

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Example of Acceptance Criteria for Normally Distributed Data

– Attribute: Content Uniformity– Limit: 95-105 %– Data: Continuous / Normal– Assurance Metric:

• 95% confident / NMT 2.5% of population is below 95%

• 95% confident / NMT 2.5% of population is above 105%

– Test: Two One Sided Tolerance Interval

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105.0102.5100.097.595.0

2.5

2.0

1.5

1.0

0.5

0.0

Sample Mean

Max

SD

TOSTI 10TOSTI 30TOSTI 60

Variable

Acceptance Limit Curve (n=10, 30, 60)

Acceptance Limit Curve

Based on the above acceptance limit curves, the user will select the appropriate sample size based on (previous) acceptable process average and variability estimates.Interpretation of curve:

Sample Size: 30Sample Mean: 97.5Acceptance: The SD on the 30 units must be less than or equal to 0.963.

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Example of Acceptance Criteria for Unknown or Non-Normal Data

– Attribute: Content Uniformity– Limit: 95-105 %– Assurance Metric:

• 95% confident / NMT 5% of population is out of spec

– Test: Single Stage Attribute Sampling Plan

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Operating Characteristic Curve

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Lot Percent Defective

Prob

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5

0.05

Operating Characteristic (OC) CurveSample Size = 180, Acceptance Number = 4

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Evaluation of Acceptance Criteria

• Controls for off-target means• Controls for a proportion of the lot to be between

the LSL and USL at a given confidence level – Potential defects are evenly distributed (i.e. equal

potential defects below LSL and above USL)• Establishes a quality level based on risk of

product and attribute

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Acknowledgements

• Alex Viehmann – CDER/OPS• Grace McNally – CDER/OC