sunset e20c manual

SunSet E20/c

SunSet

E20/cUser’s Manual

SS266Version 2.00

MAN-11100-E101 Rev. D

Sunrise Telecom ... a step ahead

302 Enzo Drive San Jose, CA 95138

Tel: 1-408-363-8000 Fax: 1-408-363-8313

SunSet E20/c

Copyright 2003

Sunrise Telecom, Incorportated

This device uses software either developed by Sunrise or licensedby Sunrise from third parties. The software is confidential andproprietary. The software is protected by copyright and containstrade secrets of Sunrise or Sunrise’s licensors. The purchaser ofthis device agrees that it has received a license solely to use thesoftware as embedded in the device, and the purchaser is prohib-ited from copying, reverse engineering, decompiling, or disassem-bling the software.

WARNING

Using the supplied equipment in a manner not specifiedby Sunrise Telecom may impair the protection providedby the equipment.

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SunSet E20/c

Chapter 1 In itial Setu p .........................................................71.1 Important Safety Information ............................................71.2 Unpacking the Test Set .....................................................91.3 Software Card Installation ............................................... 101.4 Replacing the Battery Pack ............................................ 111.5 Notes on Using This Manual ........................................... 12

Chapter 2 Test Set Description ........................................... 132.1 Keys ................................................................................ 142.1.1 Primary Functions ....................................................... 142.1.2 Shift Functions ............................................................ 172.2 LEDs .............................................................................. 182.2.1 Common LEDs ............................................................ 182.2.2 Line 1 and 2 LEDs ....................................................... 192.2.3 Datacom (Orange Labeled) LEDs ................................ 202.3 Connector Panels............................................................ 212.3.1 Left Side Panel ............................................................ 212.3.2 Right Side Panel .......................................................... 222.3.3 Top Panel ..................................................................... 222.3.3.1 Using the Battery and AC Charger ............................ 232.3.3.2 Using the Serial Port ................................................. 24

Chapter 3 Menus ................................................................. 273.1 Introduction ..................................................................... 273.2 Test Configuration ........................................................... 343.2.1 E1SINGL Mode............................................................ 353.2.2 E1DUAL Mode ............................................................. 403.2.3 E1-MUX Mode ............................................................. 473.2.4 MUXTEST Mode ......................................................... 513.3 Test Pattern ..................................................................... 563.3.1 Standard Patterns ........................................................ 563.3.2 User Test Patterns ....................................................... 573.4 Measurement Results ..................................................... 603.4.1 E1 Results and General Definitions ............................. 633.4.1.1 Line 1 and Line 2 Summary Screens ......................... 663.4.1.2 Frequency Screen ...................................................... 663.4.1.3 LINE 1 and Line 2 G.821 Screens ............................. 683.4.1.4 Line 1 and Line 2 ALM/SIG Screens ......................... 683.4.1.5 Line 1 and Line 2 M.2100/550 Screens ...................... 693.4.1.6 LINE 1 and Line 2 G.826 Screens ............................. 703.4.2 E1-MUX Mode Measurement Results .......................... 713.4.3 MUXTEST Mode Results ............................................ 723.4.4 DATACOM Mode Measurement Results ....................... 72

SunSet E20/c User’s ManualTable of Contents

SunSet E20/c

3.5 Other Measurements ...................................................... 733.5.1 View Received Data..................................................... 743.5.2 View FAS Words .......................................................... 763.5.3 View MFAS Words ....................................................... 783.5.4 Pulse Mask Analysis ................................................... 793.5.4.1 Start New Analysis ................................................... 803.5.4.2 View Last Pulse Shape ............................................. 813.5.5 C-Bit Analysis .............................................................. 823.5.6 Histogram Analysis ..................................................... 843.5.6.1 Current Histogram ....................................................... 853.5.6.2 Saved Histogram ...................................................... 883.5.7 Propagation Delay ....................................................... 893.5.8 Channel Loopback ....................................................... 903.6 VF Channel Access ........................................................ 913.6.1 VF & Noise Measurements .......................................... 923.6.2 View Line CAS ............................................................. 963.6.3 Call Analysis ................................................................ 973.6.3.1 Digit Analysis .......................................................... 1013.6.4 Call Emulator ............................................................. 1033.6.4.1 Standard Emulations .............................................. 1033.6.4.2 Place a Call ............................................................ 1053.6.4.3 Receive a Call ........................................................ 1073.6.4.4 User Emulation ....................................................... 1093.6.5 Supervision Setup ..................................................... 1133.6.6 Dial Parameters ......................................................... 1153.6.7 Signal Meanings ........................................................ 1173.6.8 View/Print Trace Results ............................................ 1223.7 Other Features .............................................................. 1253.7.1 Error Injection ............................................................ 1263.7.2 Alarm Generation ....................................................... 1283.7.3 View Results Records ................................................ 1303.7.4 Send Frame Words .................................................... 1323.8 System Parameters ...................................................... 1353.8.1 Version/Option ........................................................... 1353.8.2 System Profiles ......................................................... 1363.8.3 MEAS Configuration .................................................. 1383.8.4 General Configuration ................................................ 1423.8.5 Erase NV Ram........................................................... 1443.8.6 Self Test .................................................................... 1443.8.7 Factory Defaults ........................................................ 1443.9 Language Selection ...................................................... 145

SunSet E20/c

Chapter 4 Applications ..................................................... 1474.1 Connecting the Cords ................................................... 1474.2 Basic Applications ........................................................ 1494.2.1 Accept a New Circuit ................................................. 1494.2.2 Monitor an In-Service Circuit ..................................... 1514.2.3 Checking for Frequency Synchronization ................... 1534.2.4 Measure Signal Level ................................................ 1554.2.5 V.54 Channel Loopback Test ...................................... 1574.2.6 Running a Timed Test ................................................ 1584.2.6.1 Manual Start ........................................................... 1584.2.6.2 Auto Start ............................................................... 1584.2.7 Observe Network Codes or Channel Data .................. 1594.2.8 Monitor a Voice Frequency Channel ........................... 1614.2.9 Simple Talk/Listen ..................................................... 1624.2.10 Send a Tone ............................................................. 1634.2.11 Nx64 kbit/s Testing .................................................. 1644.3 Advanced Applications ................................................. 1664.3.1 In-Service Dual Drop & Insert THRU Testing .............. 1664.3.2 Testing a Terminal Multiplex ....................................... 1694.3.3 Emulating a Terminal Multiplex .................................. 1714.3.4 Emulating an Add/Drop Multiplexer ............................ 173

Chapter 5 Datacom ........................................................... 1775.1 Technology Overview-Introduction ................................. 1775.1.1 Communication Components ..................................... 1775.1.2 Transmission Basics .................................................. 1785.1.3 Data Networks ........................................................... 1795.1.4 Call Control Procedure ............................................... 1805.1.5 Physical Layer Protocol ............................................. 1825.2 Datacom Menus ........................................................... 1835.2.1 Datacom Mode Test Configuration ............................. 1835.2.1.1 Test Configuration ................................................... 1835.2.2 Datacom Interface ..................................................... 1885.2.2.1 Live Tracer .............................................................. 1895.2.3 View/Print Buffer ........................................................ 1925.2.4 Datacom Measurement Results ................................. 1945.2.5 Other Measurements ................................................. 1965.2.5.1 View Received Data ................................................ 1975.2.5.2 Propagation Delay .................................................. 1985.2.6 Protocols ................................................................... 1985.3 Datacom Interface Pin-outs .......................................... 1995.4 Applications .................................................................. 2075.4.1 Point-to-Point Datacom Testing .................................. 2075.4.2 2M Multiplex Datacom Port Testing ........................... 2095.4.3 Datacom Monitoring................................................... 2105.4.4 Fault Location with Remote & Local Loopbacks ........ 211

SunSet E20/c

Chapter 6 Reference .......................................................... 2136.1 Standard Test Patterns ................................................. 2136.2 E1 Technology Overview............................................... 2146.2.1 Technical Standards................................................... 2146.2.2 Basic Definitions ....................................................... 2146.2.3 Converting a Voice Signal .......................................... 2156.2.4 2.048 Mbit/s Data Rate .............................................. 2166.2.5 Line Coding ................................................................ 2166.2.6 Signal Levels ............................................................. 2186.2.7 2.048 Mbit/s Framing ................................................. 2196.2.8 MFR2/DTMF/DP Technology ..................................... 2256.3 Abbreviations ................................................................ 2276.4 Troubleshooting ............................................................. 2326.5 Calibration .................................................................... 2346.6 Customer Service ......................................................... 2376.7 Express Limited Warranty ............................................. 2386.8 Certificate of Origin ...................................................... 2406.9 Declaration of Conformity ............................................. 240

Index .................................................................................... 241

Ch. 1 Initial Setup 7

Chapter 1 Initial Setup

Welcome to the SunSet E20/E20c. This manual will take youthrough setting up and using your test set, helping you make fulluse of its extensive and flexible testing capabilities.

1.1 Important Safety InformationPlease read and follow these safety recommendations, to avoidinjury and to prevent damage to the unit. If the equipment is usedin a manner not specified by the manufacturer, the protection pro-vided by the equipment may be impaired.

Removable Software Cartridges : Insert and remove software car-tridges ONLY with the power switched OFF. Otherwise, softwarecartridges may become damaged.

Power : Use only the SS138D AC adaptor for charging and ACpowered operation. The SS138D adaptor is rated at 100VAC-240VAC, 50/60 Hz, 1.6A.MAX. The E20/E20c is rated at 15 VDC,2.0A.

Fuses : The test set is equipped with an internal resettable fuse,which is rated to trip at 3.7 amps. Do not attempt to replace thisfuse. Return the unit to Sunrise Telecom Incorporated, or its au-thorized service centers, for repair.

Battery : Use of the Sunrise Telecom replacement NiMH battery,SS140, is recommended. Please dispose of batteries safely.

Operating Environment : This instrument is intended for opera-tion in partly weather protected and temperature controlled loca-tions, as per IEC 721-3-7, Class 7K2. DO NOT operate this unit inrain, or in a direct water splash environment.

Operating temperature: 0 to 50° C

Storage temperature: -20 to 70° C

Humidity: 5% to 90% noncondensing

When bringing the test set from an extreme cold to warm environ-ment, allow the test set to warm for at least 4 hours prior to use.Condensation may interfere with the operation of the test set andmay result in damage if power is applied.

8 SunSet E20/c

General Precautions and Notes• No operator serviceable parts are inside this instrument. Refer

to qualified personnel.• Do not operate the unit with the cover removed.• Always use the provided power cord. To avoid electric shock,

the power cord protective grounding must be connected toground. The unit is grounded through its provided power cord.

• Provide good ventilation.• Do not position the unit in a way that makes it difficult to

disconnect it from other equipment or from the power supply.• Overvoltage protection: category II.• Pollution degree II, per IEC 664.

Input Connectors Warning

The BNC, 1.6/5.6, and banana connectors are intended for con-nection to E1 circuits only. Maximum input voltage is 12 VDC.The datacom connector is intended fora connection to V.35, X.21,RS-449, RS-232, and G.703 circuits only. Maximum input voltageis ±15 VDC.


1.2 Unpacking the Test SetUse the following procedure for unpacking your new test set:

1. Remove the packing list from the shipping container.2. Remove the test set and accessories from the shipping container.3. Inspect all parts and immediately report any damage to both the

carrier and to Sunrise Telecom Incorporated.4. Verify that all parts specified on the packing list were received.5. Complete the Warranty Registration Card and return it immedi-

ately to Sunrise Telecom Incorporated or your national distributor.

Note : Sunrise Telecom Incorporated must receive your warranty reg-istration card in order to provide you with updated software releases.

6. Ensure the software cartridge is fully seated in its slot (refer toFigure 1).

7. Plug the AC Battery Charger, SS138D, into the test set, theninto an appropriate AC wall outlet: 120 VAC - 240 VAC.

8. Charge the test set for at least one hour before its first use. Or,leave the battery charger plugged in while operating the test set.

9. Switch the set on and verify that it passes the SELF TEST. Ifthe SunSet does not turn on immediately, it may need to chargefor up to 5 minutes before it can run.

10.For safe storage, put the SunSet and accessories into thecarrying case.

10 SunSet E20/c

1.3 Software Card InstallationThe test set’s software can be upgraded via the PCMCIA card.The software card is inserted into the inner card slot of the testset. Refer to Figure 1.

Caution! Do not remove or insert the software card while the testset is on; the card may be damaged.

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Figure 1 Cartridge Installation

Notes: • Each software cartridge is mated to a single SunSet. If your

SunSet does not start properly, verify that the serial numberprinted on the software cartridge matches the serial number onthe back of your SunSet.

• When ordering software upgrades, be sure to specify the serialnumber of the SunSet into which the new cartridge will beinstalled.

• Please note your SunSet features a second slot, which mayhold an optional SRAM memory card.

• After inserting a new software card, perform an NV RAMERASE. This procedure should performed after inserting a newsoftware card. Refer to Chapter 3, Section 3.8.5 for theprocedure.


1.4 Replacing the Battery Pack1. Push down on the battery cover on the back panel, in the

direction indicated by the arrow in Figure 2.

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Figure 2 Replacing the Battery Pack

2. Pull the SS140 NiMH battery pack off its Velcro backing, andout of the test set.

3. Unclip the battery pack, as indicated in Figure 2.4. Clip in your new battery pack, replace it against the hook and

loop inside the unit, and slide the battery cover back on,hooking the cover clips into the provided slots.

Note : Please Recycle Battery

12 SunSet E20/c

1.5 Notes on Using This ManualCertain conventions are used throughout this manual. The > sym-bol means ‘select with the cursor, then press the ENTER key’. Anexample would be: From the main menu, select OTHER MEA-SUREMENTS > VIEW RECEIVED DATA (in order to see the dataon all timeslots).

Names in all capital letters, as OTHER MEASUREMENTS above,match the titles of screens, items on the screens, or a key.

Keys and functions are sometimes referred to by the partial wordpresent on the key/screen itself. For example: Press the ESCkey (Escape), and Select timeslots AUTO (Automatically).

This manual applies to both the SSE20 and the SSE20c. There-fore, some of the screens presented in the manual represent thoseof the black and white, and some those of the color unit.

Some configuration screens, such as MEAS CONFIGURATIONand ISDN TEST CONFIGURATION, have more parameters thanwill fit on one screen. In these cases, you will see a small ‘more’indicator at the bottom of the screen, accompanied by up anddown arrows. This indicates that you need only use the up ordown cursor keys to scroll to the next page of configurations. SeeFigure 3.

Chapter and section numbers are shown in italics: Chapter 2,Section 2.1.

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Figure 3 Configuration Screen with More Indicator

Ch. 2 Test Set Description 13

Chapter 2 Test Set Description

This chapter describes the physical features of the test set: thekeys, LEDs, and connector panels. Refer to Figure 4 for the frontview of the test set.

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7 8

9

A B C D

E * 1 2 3

F # 4 5 6

F1 F2 F3 F4

PRINT GRAPH ERR INJ

LEDMEAS

SHIFT ESC ENTER

POWER

1

2

SIGNAL

CODE ERR

PCM-31

ERROR

SIGNAL

PCM-30

CRC DET

PCM-31

PAT SYNC

BIT ERROR

POWER

BATTERY

AIS

ALARM

USER1

USER2

RTS

CTSRxDTE

RxDCE

ERROR

PCM-30

CRC DET

AIS

ALARM

CODE ERR

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Figure 4 SunSet E20 Front View

14 SunSet E20/c

2.1 KeysMost SunSet keys perform two distinct operations. The white la-bel on the key indicates what function will be performed if the keyis pressed by itself. The orange label above the key shows whatfunction will be performed if the SHIFT key is pressed first. ASHIFT indicator will be displayed in the upper left-hand corner ofthe screen.

The SHIFT key should not be pressed simultaneously with an-other key. Instead, the SHIFT key should be pressed and thenreleased. At this point, the SHIFT indicator will appear in the LCDscreen header. Any other key can now be pressed and released,and the SunSet will perform the function indicated by the orangelabel.

If the keys are not operating as expected, check the SHIFT indi-cator. If the SHIFT indicator indicates the wrong shift status, pressthe SHIFT key again.

2.1.1 Primary Functions

F-keys (F1, F2, F3, F4) : These keys are used to select choicesF1 through F4 at the bottom of the LCD display.

When you configure a setup screen, a number of options are typi-cally available for each setup item. The available choices appearon the bottom of the screen. The desired option may be invoked bypressing the corresponding F-key directly below. In Figure 5, theFRAMING is set to PCM-30 by pressing the F1 key.

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Figure 5 F-keys


Notes:• In most instances, when the desired F-key is pressed, the

cursor will advance to the next line of the display automatically.To change the settings of a previous line, press the up arrowkey, then reselect the option using the appropriate F-key.

• The options appearing at the bottom of the screen are associ-ated with a particular setup parameter within that screen. Asyou change the position of the cursor within a setup screen, theF-key options available will also change.

• If more than four F-key options are available, a ‘MORE’indicator will appear in the F4 position. Pressing the F4 key willshow the other available options.

PRINT: The PRINT key is used to print any alphanumeric andgraphical information appearing on the screen.

: This key is used to switch the backlight on and off. Keepingthe backlight off will allow the test set to run longer.

• The test set’s backlight has a programmable timer for auto-matic shut-off. This timer can be set from 1 to 99 minutes orcontinuous operation. This feature is configured in SYSTEMPARAMETERS > GENERAL CONFIG > BACK LIGHT.

GRAPH: The GRAPH key displays a graphic of the current circuitconfiguration and status. The graphic may be invoked during ba-sic menu setups and basic operations, such as: TEST CONFIGU-RATION, SEND TEST PATTERN, and VF CHANNEL ACCESS.Press the GRAPH key upon completing a TEST CONFIGURA-TION setup to ensure that you have selected the proper settings.The graphics will update based on your TEST CONFIGURATIONsettings.

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Figure 6 Graphic Screen

16 SunSet E20/c

Here is a description of some of the elements common to a graphicdisplay. Refer to Figure 6.

R: This is where the test set performs its received measurementresults.

T: This is where the test set transmits a test pattern.

• Arrows denote the direction the signal is travelling.

Boxed words, or abbreviations, provide additional information:

Tx: The transmit port of the noted line (1 or 2).

Rx: The receive port of the noted line.

FRAMING reports the framing type, and if CRC checking ispresent.

CODING reports the transmitted coding type.

PAT reports the test pattern.

TEST RATE reports the full or fractional test rate.

BRDG, TERM, or MON (monitor) is noted by each line.

Returning to the keypad description:

ERR INJ: This key is used to inject errors into the test set’s transmit-ted signal. Errors are injected according to the current settings in theOTHER FEATURES or Alarms/Errors icon > ERROR INJECTIONmenu. If the error injection mode is set to rate, an error inject indica-tor will appear on the top of the screen when you press this button.

AUTO: The AUTO key has two functions:

1. Allows auto-synch on the received line code, frame, and pattern.It may not be always possible to determine the line code of acircuit. For instance, an all 1s signal will mask the presence ofHDB3 coding. The test set reports HDB3 coding if it actually seesthe code; otherwise, it reports AMI coding.

2. Restarts measurements.

: This key turns the speaker volume higher or lower via UP andDOWN F-keys. Press EXIT (F3), ESC, or ENTER when finished.

MEAS: Press to access MEASUREMENT RESULTS.

LED: The LED key is used to turn off any flashing LEDs. TheLEDs flash to indicate any error or alarm condition which occurredpreviously, but which is no longer present.

: The CONTRAST key adjusts the contrast of the LCD screen.Press the key repeatedly until the contrast is as you wish.

- - - (Cursor Up/Down/Left/Right Arrow): The arrow keysare used to move the cursor in the indicated direction.


ESC: The escape key moves you back toward the main menu. Toreturn to the main menu, press ESC repeatedly until you arrive at it.

ENTER: The ENTER key performs three functions:

1. When a menu item is highlighted and the ENTER key ispressed, the test set will display the screen for the highlightedmenu item.

2. If setups are complete in a data entry screen, pressing ENTERwill often return you to the previous menu.

3. In a few cases, pressing the ENTER key is required after theuser finishes entering data in a given screen. In these cases,the test set will execute the inputs only after the ENTER keyhas been pressed. In most of the high usage functions, it is notnecessary to press ENTER to invoke the operation. If theoperation you are trying to perform will not begin, try pressingthe ENTER key. When the ENTER key is used to invoke theoperation, you may need to press ESC to return to the previousmenu.

SHIFT: Refer to Section 2.1.2 for details.

POWER: The power key turns the test set ON/OFF. It is the redkey located in the lower left-hand corner of the test set’s keypad.

2.1.2 Shift Functions

The SHIFT key is pressed to provide access to the functionsspecified by orange labels. The SHIFT key should always bepressed first, then released before the desired orange-label key isselected. SHIFT status is displayed in the upper left-hand cornerof the screen.

A, B, C, D, E*, F# : These keys are used to enter DTMF tones, aswell as hexadecimal numbers. They can also be used to providelabels for user-defined information.

0, 1, 2, 3, 4, 5, 6, 7, 8, 9: These keys are used to enter user testpatterns and telephone numbers. They can also be used to pro-vide labels for user-defined information.

18 SunSet E20/c

2.2 LEDsThe bicolor LEDs provide a visual indication for the condition of thereceived signal. The LEDs provide enough diagnostic informationat a glance that additional testing may not be required by someusers. An LED will be lit green continuously when the particularcondition for that LED is detected. For example, a continuous greenlight for PCM-30 indicates that the test set has detected PCM-30framing. A continuous red light denotes an alarm condition for theitem. For example, the ERROR LED lights red if an error (code, bit,CRC, framing) has been observed.

Blinking lights provide historical information for the circuit condi-tion. This is helpful if you happened to be away from the test setwhen the error or alarm condition occurred. Pressing the LED keystops the blinking.

2.2.1 Common LEDs

PAT SYNC• Green: If the test set has synchronized on the test pattern in

the received signal. The received pattern must match thetransmitted pattern. The pattern may be observed in MEA-SUREMENT RESULTS and on the graphic screen. When thetest set is in BER mode, the test set will automatically attemptto synchronize on the pattern that is being sent.

• Red: If synchronization is lost, it lights red.

BIT ERROR• Red: Lights red if a bit error has been detected.

POWER• Green: Lights green when the test set is switched on and has

an adequate power source.

BATTERY• Green: Lights green when the battery is being charged.• Red: Lights red when the test set’s power supply voltage has

dropped to a low level. A 15 minute countdown (900 seconds)is displayed after the BATTERY LED lights, indicating when thetest set will automatically shut down.

Note: Connecting the AC Battery Charger will allow you to use thetest set indefinitely. However, if you plan to use the test set for anextended period of time, it is best to plug the AC Battery Chargerin first. If the charger is plugged in while a measurement is inprocess and while the battery is not fully charged, the test setmay automatically reset itself. In this case, the current measure-ment results would be lost.


2.2.2 Line 1 and 2 LEDs

These LEDs provide the same functions for both Line 1 and Line2 displays:

SIGNAL• Green: A green LED indicates that the test set is receiving valid

2.048 Mbit/s signals.• Red: A red LED indicates no signal.

PCM-31, PCM-30• Green: A green LED indicates that the type of framing chosen

in the test configuration has been detected on the receivedsignal. PCM-31 indicates that the basic FAS (Frame AlignmentSignal) has been detected. PCM-30 indicates that the MF 16(Multiframe) pattern has been detected, as well as the basicFAS pattern.

• Red: A red LED indicates that the selected framing has notbeen detected.

• None: If the received signal is unframed, neither LED will be lit.If the test set is configured for a particular type of framing in thetest configuration, it will continuously search for that type offraming. The appropriate LED will light whenever the framing isfound.

AIS• Red: Lights red if the test set detects an Alarm Indication Signal

(unframed all ones) on its receive jack.

CODE ERR• Red: Lights red if a coding violation is detected on the received

signal. A code error is a bipolar violation that is not part of a validHDB3 substitution.

CRC DET• Green: When CRC is enabled in the test configuration, the CRC

DET LED lights green if CRC-4 check sequences are detectedby the test set.

• Red: If CRC is enabled, but no CRC is detected, the LED lightsred.

• None: When CRC is disabled, it is not lit.

ERROR• Red: Lights red if frame or E-bit errors have been observed.

This LED will also light if CRC-4 errors are detected when CRCerror checking has been enabled, and frame errors are detectedwhen the signal is a framed signal. CRC-4 and framing are bothconfigured in the test configuration.

20 SunSet E20/c

ALARM• Red: Lights red if the test set detects FAS ALM, MFAS ALM,

or AIS T/S-16 alarm.

2.2.3 Datacom (Orange Labeled) LEDs

Datacom LEDs, which are dual function with Line 2 LEDs:

RxDCE• Green: Lights green when the test set is receiving data on the

DCE port.

RxDTE• Green: Lights green when the test set is receiving data on the

DTE port.

RTS• Green: Lights green when the Ready To Send control lead is on.

CTS• Green: Lights green when the Clear To Send control lead is on.

USER1 & USER 2• Green: These LEDs light when the control lead, defined as User

1 or User 2 in the test configuration, is on.


2.3 Connector PanelsThe test set has three connector panels. One the left, one on theright, and one the top. The following sections describe their use.

2.3.1 Left Side Panel

Right Side Connector Panel

L1-TX75 120 L1-RX75 120

Left Side Connector Panel

DATACOM

HEADPHONE

75 L2-TXL2-RX75 120

Figure 7 Connector Panels

The left side connector panel, shown in Figure 7, has the follow-ing ports:

DATACOM : This is provided for DATACOM testing. This port uses aSCSI (36-pin connector) interface to connect with other industrystandard interfaces such as RS-232/ V.24, V.35, RS530, X.21,RS449, and 64 kbit/s G.703 codirectional. The interface cables anddatacom option can be purchased as an option.

HEADPHONE: Plug a headphone into this port. In general, whenthe headphone is used, the speaker will no longer sound.

• When both is specified, Line 1 will be outputted to the left sideand Line 2 will be outputted to the right side.

• Stereo to Mono headphone converter should be used for VF,ISDN, QSIG, V5.X applications using Line 1 only.

Application Output Remarks VF Channel Access

Both Line 1=Left only or Line 2=Right only, dependent on SPEAKER setting

ISDN Analysis* Both QSIG Analysis* Both V5.X Monitor Both GSM Monitor Both * Call emulation is Line 1 only, use stereo to mono converter.

Table 1 Headphone Conversion

22 SunSet E20/c

Line 2 RX : The RX BNC and banana connectors are where the2.048 Mbit/s line signal is received by the test set. Optionally, 1.6/5.6mm ports are available. Line 2 ports are used for DUAL mode.

Line 2 TX : The TX BNC connector is where the 2.048 Mbit/s linesignal is transmitted from the test set. Optionally, 1.6/5.6mm portsare available.

2.3.2 Right Side Panel

The right side connector panel is shown in Figure 7. It has thefollowing line 1 ports:

Line 1 TX: These connectors are where the 2.048 Mbit/s line sig-nal is transmitted from the test set, with 75Ω unbalanced and120Ω balanced, simultaneously. Line 1 ports are always used inSINGLE mode.

Line1 RX: These connectors are where the 2.048 Mbit/s line sig-nal is received by the test set, in either the 75Ω unbalanced or120Ω balanced port.

2.3.3 Top Panel

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Figure 8 SunSet E20 Top Panel

The top of the test set, shown in Figure 8, has these connectors:

SERIAL PORT : The serial port is used for sending information toan optional thermal printer or for operating the remote control op-tion. This port uses an RS-232C DTE configuration with hardwareflow control when the 8-pin DIN to 25-pin D-Sub conversion cableis connected (see Section 2.3.3.2 in this chapter).

15 VDC: The test set charger, SS138D, is plugged in here. Thetest set may be operated with a discharged battery, provided thecharger is connected. The battery will charge while the test set isbeing operated (see Section 2.3.3.1 in this chapter).


2.3.3.1 Using the Battery and AC Charger

Caution! Do not use any charger other than the one providedby Sunrise Telecom with the SunSet E20/c. Doing so will causedamage to the test set and void the warranty.

The test set is powered by an internal 9-cell NiMH battery pack,which is field replaceable. The battery is designed to provide amplepower for portable testing applications. The battery is charged bya custom-designed charger for optimum performance. The chargeris powerful enough to run the test set continuously while keepingthe battery charged.

The charger contains a fast-charge feature which recharges thebattery. This fast-charging action causes no damage to the bat-tery. The SS138D charger operates at:

• 120 VAC-240 VAC, 50/60 Hz

The charger recognizes when the battery is fully charged. At thispoint, the charger switches from fast-charge to a trickle-charge.Trickle-charging completes the charging cycle for maximum bat-tery output. Trickle-charging does not damage the battery overlong periods of time. However, to get maximum life from the bat-tery, disconnect the charger when it is fully charged. Here aresome tips for obtaining the best performance out of the battery:

• Use the backlight only if it is need.• Extreme temperatures affect battery life.• Use the Cigarette Lighter Battery Charger (SS104C) when

transporting the test set. This will help maintain a full batterycharge when AC power is not available. This charger operatesat a trickle charge, and will not fully charge the battery pack inany reasonable length of time.

• If you are going to perform extended testing and you are notsure if the battery will last, plug the charger in at the beginningof the test so the test set will run indefinitely. If you wait untilthe battery is low during a test to plug the charger in, the testset’s processor may reset and drop the current test as thecharger is plugged in.

• Recharge the battery between uses, even if the time availablefor a recharge is short. The AC Battery Charger’s two-stagedesign charges the battery to approximately 80% of its fullcapacity in just a few hours. The test set will fully charged inapproximately four hours.

• Let the battery pack charge overnight, to ensure it is fullycharged when you begin testing.

24 SunSet E20/c

2.3.3.2 Using the Serial Port

The test set is equipped with a standard serial port, for both print-ing and remote control operations.

Serial Port SettingsThe Serial Port is configurable for: baud rate, parity, stop bit, bits/character and carriage return/line feed.

• These settings are configured from within SYSTEM PARAM-ETERS (or the System icon) > GENERAL CONFIG.

• In general, the SunSet’s serial port settings will need to matchthe settings of your printer.

Configuring the SunSet’s serial port is described in detail in theprocedures which follow.

Configuring for PrintingThe test set may be ordered with an optional High Capacity Ther-mal Printer (SS118B or 118C). This printer operates by an 8-bitserial RS-232C method, and uses thermal paper (i.e. it has no inkcartridge or ribbon which needs to be replaced). Many other serialprinters are available to the user; however, not all of these printerswill operate correctly with the SunSet.

You are free to use this information to attempt to set up the testset with another printer. However, Sunrise Telecom does not war-rant the operation of the test set with any printer other than theone supplied by Sunrise Telecom.

If you wish to connect to a mode or other brand of printer, youmay find the SS122B Null Modem Adaptor useful.

To begin printing, follow this procedure:

1. Connect the Sunrise Telecom DIN-8 to RS232C Printer Cable(SS115B) to the SunSet. Figure 9 shows the cable pin assign-ments of the DB9 Printer Cable.

2. If you are using a Sunrise Telecom printer, skip this step.• Otherwise, you may need to connect the Sunrise Telecom Null

Modem Adapter (SS122B) to the free end of the Printer Cable.

3. Confirm that the test set's serial port settings match those ofyour printer.

• The switches to configure your printer's serial port and printcharacteristics are usually located on the back or bottom of theprinter.

• If you are using the Sunrise Telecom thermal printer, refer toTable 2 for the correct switch settings.


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Figure 9 SS115B Printer Cable Pin Assignments

Position Dip Switch Setting

Parameters Parameter Setting

Dip Switch 1 1 OFF Input Serial 2 ON Printing Speed High 3 ON Auto Loading On 4 OFF Auto Line Feed Off 5 ON Setting Command Enable 6 OFF Printing Density 100% 7 ON Printing Density 100% 8 ON Printing Density 100%

Dip Switch 2 1 ON Printing Columns 40 2 ON User Font Back-Up ON 3 ON Character Select Normal 4 ON Zero Normal

5 ON International Character Set

English

6 ON International Character Set

English

7 OFF International Character Set

English

8 OFF International Character Set

English

Dip Switch 3 1 ON Data Length 8 BITS 2 ON Parity Setting NO 3 ON Parity Condition Odd 4 ON Busy Control H/W Busy 5 OFF Baud Rate Select 9600 Bps 6 ON Baud Rate Select 9600 Bps 7 ON Baud Rate Select 9600 Bps 8 ON Baud Rate Select 9600 Bps

Table 2 SS118B/C/D Printer Switch Settings

26 SunSet E20/c

• The test set’s factory default serial port settings are:BAUD RATE: 9600PARITY: NONESTOP BIT: 1-BITBITS/CHAR: 8-BIT

• If you need to reconfigure the test set's serial port settings tomatch the settings of your printer, use the following procedure:A. From the main menu, select SYSTEM PARAMETERS >

GENERAL CONFIG and select BAUD RATE. Three selec-tions are available: 1200 (F1), 2400 (F2), and 9600 (F3).

• This setting must match the setting on your printer; other-wise random characters will appear on your printout.

B. Select PARITY. Three options are available: NONE (F1),EVEN (F2), and ODD (F3). This setting must match theconfiguration of your printer.

C. Select STOP BIT. Two options are available: 1-BIT (F1) and2-BIT (F2). This setting must match the configuration ofyour printer. Normally this is configured as 1-BIT.

D. Select BITS/CHAR. Two options are available: 7-BIT (F1)and 8-BIT (F2). This setting must match the configurationof your printer. Normally this is configured as 8-BIT.

E. Select CR/LF, choose the setting opposite of the printersetting.

4. Set up the printing instructions in SYSTEM PARAMETERS >MEAS CONFIGURATION (see Chapter 3, Section 3.8.3).

5. Confirm that the DIP switch settings (or other switch settings)on your printer correspond to those of the test set’s serial port.If you have changed the DIP switch settings, switch the printeroff and then on before continuing.

6. Ensure that the printer is on and on-line.7. Ensure that the test set is not displaying its GRAPHIC screen.

This screen is non-printable.8. Press PRN SCRN (print screen) on the test set’s keypad.9. The current screen should now print.• If it doesn't, check the connections, configuration, and switch

settings.

Note : See Section 1.3 for the software card installation procedure.

Ch. 3 Menus 27

Chapter 3 Menus

3.1 IntroductionThe SunSet E20 operates by a menu-driven format. Before youcan select a menu item, highlight the desired item using the arrowkeys. After highlighting the item, you may execute the selectionby pressing the ENTER key. In a few specific cases, the simpleaction of highlighting an item will execute the selection. The SENDTEST PATTERN menu works in this way.

The following menu tree shows the location of each menu item.Some menu items are offered only with certain software options.

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28 SunSet E20/c

PROTOCOLSFRAME RELAYSS#7 ANALYSISISDN ANALYSISGSM ANALYSISV5.1/V5.2

The sections within this chapter provide a detailed explanation foreach menu item. However, the menu items for datacom and pro-tocols are contained in their own chapters later in this manual, orin their own manuals.

The color version of the SunSet E20 (E20c) presents an icon-based main menu. See Figure 11 for the menu. Note that thepossible screen messages, such as the ‘Shift’ and ‘Inject’ indica-tors, are shown in different colors. The time of day has moved tothe left side of the screen. F-keys are located at the base of thescreen as usual. Figure 11 is a sample color screen.

Screen 1

Screen 2

Figure 11 Color Main Menu

Ch. 3 Menus 29

Use the keypad arrow keys to select the icon/menu you want toaccess. Use the PAGE-UP/PAGE-DN (F1) key to access bothmenu screens. Setup is highlighted in the sample figure. Here is alist of what is available under each icon:

Setup• TEST CONFIGURATION• TEST PATTERN• SEND FRAME WORDS• X.50 ANALYSIS• V.110 ANALYSIS• CHANNEL LOOPBACK

Results• MEASUREMENT RESULTS• VIEW RESULTS RECORDS• VIEW RECEIVED DATA• VIEW FAS WORDS• VIEW MFAS WORDS• HISTOGRAM ANALYSIS• PULSE MASK ANALYSIS• C-BIT ANALYSIS• PROPAGATION DELAY• CHANNEL LOOPBACK• DATACOM INTERFACE (In DATACOM mode)

Alarms Errors• ERROR INJECTION• ALARM GENERATION

System• VERSION/OPTION• SYSTEM PROFILES• MEAS CONFIGURATION• GENERAL CONFIG• ERASE NV RAM• SELF TEST• FACTORY DEFAULTS• LANGUAGE SELECTION

30 SunSet E20/c

VF• VF & NOISE MEASUREMENTS• VIEW LINE CAS• CALL ANALYSIS• SUPERVISION SETUP• DIAL PARAMETERS• SIGNAL MEANINGS

Frame RelayRefer to Frame Relay User’s Manual SS266-1.

SS#7Refer to SS#7 User’s Manual SS266-4.

ISDNRefer to ISDN User’s Manual SS266-3.

GSMRefer to GSM User’s Manual SS266-2.

X.25Refer to X.25 User’s Manual SS866-11.

See the corresponding chapters in the User’s Manual, or the indi-vidual manuals for the protocols such as V.110 and V5.1/V5.2, foreach selection.

Ch. 3 Menus 31

ARRANGE (F2)Press this key to access the ARRANGE ICON screen, where youmay rearrange the order of the icons on the main menu screens.This might be convenient if you frequently do a particular test lo-cated on the second screen (such as GSM testing); you can movethe corresponding icon to the first screen for easy access.

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Figure 12 Arrange Icons

• Use the ICON-UP (F1) and ICON-DN (F2) keys to rearrange theorder in which the icons are shown.

• Note that icon 1 corresponds to the upper left corner icon of thefirst screen, then across to icon 4, then down left to icon 5, andacross again, then finally icons 9 and 10 show on the secondmenu screen.

• Press DEFAULT (F3) to return the icons to their standardplacement.

• Press PROFILE (F4) to save the new arrangement under alabel. You will enter the ICONS PROFILES screen.

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Figure 13 Icons Profiles Screen

32 SunSet E20/c

Storing an Icon Profile1. On a main menu screen, press the F3 key (PROFILES) to enter

the ICONS PROFILES screen.2. With the cursor on CURRENT (Line 0), press STORE (F1). This

will save the current icon order as you have arranged it. Thecursor appears at the LABEL position on the ICON PROFILESlabel screen, as in Figure 14.

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Figure 14 Icon Profiles Label Screen

3. Press TOGGLE (F3). The letter A will be highlighted in thecharacter grid.

4. Use the arrow keys to move the cursor indicator to the desiredcharacter.A. Press SELECT (F4). The character appears next to the

label.B. Repeat until you have the label as desired.

5. Press TOGGLE (F3) to move out of the character grid and backto the LABEL item.

6. Press ENTER to store the pattern and to return to the mainmenu screen.

Ch. 3 Menus 33

Invoking an Icon Profile1. On a main menu screen, press PROFILE (F3).2. In the ICON PROFILES screen which appears, select the

profile you want to invoke.A. Press LOAD (F3). Note that the F-keys change when you

move the cursor off of CURRENT (Line 0).B. Press ENTER. You will return to the main menu, now

organized as per the profile you loaded.

Deleting an Icon Profile1. On a main menu screen, press PROFILE (F3).2. In the ICON PROFILES screen which appears, select the

profile you want to invoke.A. Press DELETE (F1). Note that the F-keys change when you

move the cursor off of CURRENT (Line 0). If you want todelete all of the stored profiles, press DEL-ALL (F2).

B. Press ENTER. You will return to the main menu.• You may also access the ICONS PROFILES screen from

the main menu, where it is the F3 key.

PROFILES (F3)Save the icon order you have created under a label. See Storingan Icon Profile.

34 SunSet E20/c

3.2 Test ConfigurationBefore connecting the test set to the circuit, besure to properly configure the test configuration.To access the TEST CONFIGURATION screen,press the ESC key until you have reached themain menu. Select TEST CONFIGURATION andpress ENTER (Setup icon-color test set).

F-keys show the options for each setup parameter in this screen.As each F-key is pressed, the test set immediately alters itsconfiguration to reflect these new settings.

Refer to Figure 15 for the E1SINGL TEST CONFIGURATION menu.

Note the following:

1. To avoid configuration mistakes, use the GRAPH key tographically confirm any changes to your setup.

2. Press the AUTO key in E1 or E1-MUX modes to automaticallydetect incoming framing and CRC-4 patterns.

+ $ !-$1 +. '

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Figure 15 Test Configuration Menu

The first selection in the TEST CONFIGURATION Menu is TESTMODE. Several choices are available: E1SINGL, E1DUAL, E1-MUX, MUXTEST, and DATACOM. The TEST CONFIGURATIONmenu differs for each mode.

Ch. 3 Menus 35

3.2.1 E1SINGL Mode

• Use for voice frequency, VF, and 2.048 Mbit/s BERT (Bit ErrorRate Test) applications.

• The Line 1 ports are used for the E1SINGL mode.

Figure 16 shows the graphic associated with the settings in Fig-ure 15. MEAS at the top of the screen indicates measurementsare being taken.

Configure the following items in the E1 SINGL Mode. Press thecorresponding F-key to select the desired setting.

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Figure 16 E1 SINGL Mode Graphic

Tx SOURCEOptions: LOOP (F1), TESTPAT (F2)

• LOOP: Use for full duplex drop and insert testing on an in-service line. In this case the signal received on the Rx jack willbe transmitted out the Tx jack for Line 1.

• TESTPAT: Use for out-of-service bit error rate testing. In thiscase, a test pattern will be transmitted on the selected Transmitjack. During Nx64 or VF CHANNEL ACCESS testing, an idlecode will be inserted on the unused channels.

FRAMINGOptions: PCM-30 (F1), PCM-31 (F2), UNFRAME (F3)

Choose the framing appropriate for the circuit under test.

• PCM-30: This means the set will synchronize on both FrameAlignment Signal (FAS) and MultiFrame Alignment Signal(MFAS).

• PCM-31: This means the set will synchronize only on FrameAlignment Signal (FAS).

36 SunSet E20/c

Notes:• If you are unsure of the proper framing, push the AUTO key.

Use the combination which synchronizes properly and/or al-lows error free measurement results.

• If the framing and CRC-4 state of the received signal do not exactlymatch the framing and CRC-4 settings, the test set will displayLoss of Frame condition and may display loss of CRC DET.

• HDB3 is the default line code. The line code can be configuredfor AMI or HDB3 in: MAIN MENU > SYSTEM PARAMETERS> MEAS CONFIGURATION.

CRC-4Options: YES (F1), NO (F2)

• Choosing YES allows the test set to measure CRC-4 errors onthe incoming signal and also to transmit the CRC-4 bits on theoutgoing signal. CRC-4 works with PCM-31 and PCM-30framing only.

• If UNFRAME has been selected for framing, the test set willforce the CRC-4 configuration to NO.

TEST RATEOptions: 2.048 (F1), Nx64K (F2)

• 2.048M: This configures the test set for full rate testing. If youare not certain about which one to choose, press the F1 key forfull rate testing at 2.048 Mbit/s.

• Nx64: This configures the test set for fractional testing. Uponpressing Nx64, you will immediately enter the SELECTTIMESLOT, screen. Select each timeslot to test, these can beselected automatically, or manually. A sample screen is shownin Figure 17.

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Figure 17 Select a Timeslot

Ch. 3 Menus 37

To Manually Select the Timeslots:1. Use the keypad arrow keys to choose the timeslot and then

press SELECT (F2).2. Repeat until you have selected all the necessary timeslots.

Selected timeslots remain highlighted, as shown in Figure 17.3. Press UN-SEL (F3) to deselect a timeslot.• Press CLR-ALL (F4) to clear all selections and to start over.

To Automatically Select the Timeslots:1. Press AUTO (F1)• If you are receiving a signal which is already formatted in the

N (or M) x64 kbit/s fractional E1 format, the quickest methodfor selecting timeslots is to press the AUTO (F1) key.

2. Press ENTER to set your choices, and return to the MAINMENU.

• In AUTO, the test set will automatically configure the timeslotsby looking for active data. It will configure the transmit side tobe the same as the active timeslots on the receive side. Thetest set determines which timeslots are active by first determin-ing which timeslots are idle. Any timeslot that is not idle isassumed to be active. The test set determines that a timeslotis idle when it finds the line's idle code (specified in theSYSTEM PARAMETERS > MEAS CONFIGURATION > IDLECHNL CODE).

Note: In PCM-31 framing, timeslots 1-31 correspond to channels1-31. In PCM-30 framing, timeslots 1-15 correspond to channels1-15, and timeslots 17-31 correspond to channels 16-30. In PCM-30, timeslot 16 is used for the multiframe alignment signal. Frac-tional E1 is not offered with unframed signals, because framing isrequired to determine the location of timeslots.

The timeslots specified for transmit and receive need not be thesame. The number of selected timeslots can differ from the Txside to the Rx side. The test set will assume that all incomingdata is received byte by byte in ascending channel order.

L1-Rx PORTOptions: TERM (F1), BRIDGE (F2), MONITOR (F3)

Configures the Line 1 2.048 Mbit/s receiver.

These settings let the test set electrically decode a 2.048 Mbit/ssignal under a wide range resistive of cable losses. They also de-termine which electrical load will be placed on the circuit by the testset. These settings have no effect on the transmitters. On a 2.048Mbit/s circuit, there must always be exactly one receiver that ap-plies the low impedance (75/120Ω) termination. There should neverbe two or more receivers applying a low impedance termination.

38 SunSet E20/c

Caution! If you are uncertain, choose bridge. this will protect the2.048 mbit/s signal.

• TERM mode terminates the received signal with a 75 or 120Ωimpedance termination. The tested signal has been transmittedover real cable at a level between approximately +6 and -43 dB.Use TERM when you will disrupt the circuit for testing.

• In BRIDGE mode, the test set applies high-impedance isola-tion resistors to the circuit under test. This isolation circuit willprotect the signal from any possible disruption. The testedsignal has been transmitted over regular cable at a level ofapproximately +6 and -43 dB.

• MONITOR mode should be used when a measurement is madeat a protected monitoring point, at a level between -15 and -30dB. The signal is provided from the protected MONITOR jackof a network equipment.

In MONITOR mode, if a 0 dB signal is received, the CODE ERRLED will light red. This often happens when the set is plugged intoan OUT jack. In this case, choose TERM instead. If you are un-certain if a jack is bridged or protected, try BRIDGE first.

TX CLOCKOptions: L1-RX (F1), INTERN (F2), L2-RX (F3), OFFSET (more,F1), TTL-L2 (more, F2)

The TX CLOCK is used to time the transmit signal.

• L1-Rx: Choose L1-Rx, and the test set uses the timing from thesignal received on Line 1 as the clock source.

• INTERN: INTERN uses the internal timing of the test set. Thistiming is not synchronized to the network. You should useinternal timing in loopback testing where synchronization is notrequired.

• L2-Rx: In this mode, timing is received from the signal receivedon Line 2.

• OFFSET: The test set uses a digital synthesizer to shift thetransmit frequency in 1, 10, 100, or 1000 Hz steps. Shift up to± 50,000 hz (25K ppm) and the screen shown in Figure 18 isdisplayed.

Ch. 3 Menus 39

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Figure 18 DDS Shift

1. Set the DDS SHIFT between 0 and 50,000 Hz by using the INC(F1) and DEC (F2) keys.

2. Set the SCALE of the shift by using the INC (F1) and DEC (F2)keys. Choose among 1, 10, 100, and 1000. For example, a shiftof 3 Hz with a SCALE of 10 would shift the frequency 13 Hz.

• TTL-L2: In this mode the set uses a G.703 sinusoidal clockplugged into Line 2 RX as its timing source.

40 SunSet E20/c

3.2.2 E1DUAL Mode

E1DUAL mode allows use of both LINE 1 and LINE 2 ports. Usethis mode to perform applications such as full duplex drop andinsert and bidirectional monitoring. See Figure 19 for a sampleconfiguration screen, and Figure 20 for a sample graphic screen.

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Figure 19 E1DUAL Mode

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Figure 20 E1Dual Graphic

Configure the following items:

Tx/INSERTOptions: L1-TX (F1), L2-TX (F2)

Select the 2.048 Mbit/s test line onto which to insert the test signal.

• This determines where the 2.048 Mbit/s test pattern, Nx64 kbit/s test pattern, Nx64 kbit/s multiplexed signal, or voice fre-quency channel will be inserted. For example, if Tx/INSERT isL2-Tx and you are talking on the test set, then your voice willbe inserted on line 2.

• Select either L1-Tx (F1 selects Line 1) or L2-Tx (F2 selects Line 2).

Ch. 3 Menus 41

Rx/DROPOptions: L1-RX (F1), L2-RX (F2)

Select the received test signal from either L1-Rx or L2-Rx.

• This selection configures bit error rate, 2.048 Mbit/s line fre-quency, E-bit error measurements, M.2100/550 measurements,voice channel frequency, voice channel level, voice channel RxABCD, view received data, view FAS words, view MFAS words,etc. For example, if you are doing a bit error rate test on the receivedsignal from line 1, then you should choose Rx/DROP as L1-Rx.

Tx SOURCEOptions: LOOP (F1), TESTPAT (F2)

• LOOP is used for full duplex drop and insert testing on an in-service line. In this case the signal received on the Rx jack willbe transmitted out the Tx jack for Line 1 and Line 2. You will beinserting a signal on one or more channels on the line you chosein Tx/INSERT. The channels and corresponding ABCD bits onthat line that are not being used will be passed through the testset unchanged from Rx to Tx.

• TESTPAT is used for out-of-service bit error rate testing. In thiscase, a test pattern will be transmitted on the selected Tx/INSERT jack. During Nx64 or VF CHANNEL ACCESS testing,an idle code will be inserted on the unused channels. On the linethat is not selected, the channels and ABCD bits are passedthrough the test set unchanged from Rx to Tx.

FRAMINGOptions: PCM-30 (F1), PCM-31 (F2), UNFRAME (F3)

Choose the framing that is appropriate for the circuit under test.

• PCM-30 means the set will synchronize on both Frame Align-ment Signal (FAS) and MultiFrame Alignment Signal (MFAS).

• PCM-31 means that the set will synchronize only on FrameAlignment Signal (FAS).

Notes:• If framing and CRC-4 state of the received signal do not exactly

match the framing and CRC-4 settings, the test set will displayLoss of Frame condition and may display loss of CRC DET.

• HDB3 is the default line code. The line code can be configuredfor AMI or HDB3 in: MAIN MENU > SYSTEM PARAMETERS> MEAS CONFIGURATION.

• If you are unsure of the proper framing, push AUTO. Use thecombination which synchronizes properly and/or allows errorfree measurement results.

42 SunSet E20/c


• Choosing YES allows the test set to measure CRC-4 errors onthe incoming signal and to transmit the CRC-4 bits on theoutgoing signal. CRC-4 works with PCM-31 and PCM-30framing only.

• If UNFRAME has been selected for framing, the test set willforce the CRC-4 configuration to NO.

TEST RATEOptions: 2.048 (F1), Nx64K (F2)

• 2.048M configures the test set for full rate testing. If you areunsure which one to choose, select 2.048 Mbit/s.

• Nx64K configures the test set set for fractional testing. Uponselection, the SELECT TIMESLOT screen is displayed. In thisscreen, choose each timeslot for testing (see Figure 17).

To Manually Select the Timeslots:1. Use the keypad arrow keys to choose the timeslot and then

press SELECT (F2).2. Repeat until you have selected all the necessary timeslots.

Selected timeslots remain highlighted, as shown in Figure 17.3. Press UN-SEL (F3) to deselect a timeslot.• Press CLR-ALL (F4) to clear all selections and to start over.

To Automatically Select the Timeslots:1. Press AUTO (F1)• If you are receiving a signal which is already formatted in the

N (or M) x64 kbit/s fractional E1 format, the quickest methodfor selecting timeslots is to press the AUTO (F1) key.

2. Press ENTER to set your choices and return to the MAIN MENU.• In AUTO, the test set will automatically configure the timeslots

by looking for active data. It will configure the transmit side to bethe same as the active timeslots on the receive side. The testset determines which timeslots are active by first determiningwhich timeslots are idle. Any timeslot that is not idle is assumedto be active. The test set determines that a timeslot is idle whenit finds the line's idle code (specified in the SYSTEM PARAM-ETERS > MEAS CONFIGURATION > IDLE CHNL CODE).

Note: In PCM-31 framing, timeslots 1-31 correspond to channels1-31. In PCM-30 framing, timeslots 1-15 correspond to channels1-15, and timeslots 17-31 correspond to channels 16-30. In PCM-30, timeslot 16 is used for the multiframe alignment signal. Frac-tional E1 is not offered with unframed signals, because framing isrequired to determine the location of timeslots.

Ch. 3 Menus 43

The timeslots specified for transmit and receive need not be thesame. The number of selected timeslots can differ from the Txside to the Rx side. The test set will assume that all incomingdata is received byte by byte in ascending channel order.

L1-Rx Port and L2-Rx PortOptions: TERM (F1), BRIDGE (F2), MONITOR (F3)

Configures the two 2.048 Mbit/s receivers.

• These settings let the test set electrically decode a 2.048 Mbit/s signal under a wide range resistive or cable losses. Thesesettings also determine which electrical load will be placed onthe circuit by the test set. These settings have no effect on thetransmitters. On a 2.048 Mbit/s circuit, there must always beexactly one receiver that applies the low impedance (75/120Ω)termination. There should never be two or more receiversapplying a low impedance termination.

• See the L1-Rx port description for E1SINGL mode for adescription of each of these choices.

TX CLOCKOptions: RECEIVE (F1), INTERN (F2), SHIFT (F3)

The TX CLOCK is used to time the transmit signal.

• RECEIVE: Choose RECEIVE, and the test set uses the timingfrom the signal received on the line set as RX/DROP above asthe clock source for both TX lines.

The next three figures portray three different timing scenariospossible when RECEIVE is selected. Figure 21 represents slavetiming. Here, TX CLK=L1-Rx, but the signal received on L1-Rxis timed off of the L1-Tx source. Thus, there is no true clocksource. In this case, the transmit signal may die.

44 SunSet E20/c

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Figure 22 depicts loop or slave timing. Tx/INST and TX CLK areset for the same line. Loop timing is necessary when transmittingtoward an exchange or other network element that requires syn-chronous signals. This network element must be configured to bea master timing source in relation to your signal, lest you haveslave to slave timing.

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Ch. 3 Menus 45

Figure 23 depicts external timing. External timing uses an exter-nal clock source to time the Tx/INSERT signal. The external clocksource should be configured for the opposite line from the Rx/DROP selection. In this case, Rx/DROP and Tx/INSERT are setfor Line 2. Therefore, TX CLK is set for Line 1 (L1-Rx).

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Note: In Figures 21-23, TxSOURCE has always been set forTESTPAT. The TX CLK setting is ignored if TX SOURCE is set forLOOP. In LOOP, both Lines 1 and 2 pass timing from Rx to Tx.

• INTERN: This setting uses the internal timing of the test set.This timing is not synchronized to the network. You should useinternal timing in loopback testing where synchronization is notrequired.

If you set TX/INSERT as L1-Tx, and choose INTERN, the L1-Tx signal will use the internal timing of the test set. In DUALmode, the L2-Tx signal will use the timing recovered from L2-Rx.

• SHIFT: The test set uses a digital synthesizer to shift thetransmit frequency in 1, 10, 100, or 1000 Hz steps. Shift up to± 50,000 hz (25K ppm) and the screen shown in Figure 24 isdisplayed.

46 SunSet E20/c

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Figure 24 DDS Shift

1. Set the DDS SHIFT between 0 and 50,000 Hz by using the INC(F1) and DEC (F2) keys.

2. Set the SCALE of the shift by using the INC (F1) and DEC (F2)keys. Choose among 1, 10, 100, and 1000. For example, a shiftof 3 Hz with a SCALE of 10 would shift the frequency 13 Hz.

Ch. 3 Menus 47

3.2.3 E1-MUX Mode

E1-MUX provides multiplexing capabilities between the differentrate signals. Use this mode to make the test set emulate a termi-nal multiplex, or an add/drop multiplex. This mode allows you tosend a test pattern in either direction. The E1-MUX configurationscreen is shown in Figure 25.

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E1If necessary, you may refer to the more detailed descriptions ofeach E1 configuration selection in Section 3.2.1.


Determines where the Nx64 kbit/s multiplexed signal will be in-serted. For example, if Tx/INSERT is L2-Tx, and you are insert-ing a received V.35 signal onto the line, then it will be inserted online 2.


Select the 2.048 Mbit/s signal to be used for dropping an Nx64kbit/s signal to the multiport.

• If you want to drop out a 64 kbit/s signal to V.35 from line 1, thenchoose Rx/DROP as L1-Rx.

• This selection configures 2.048 Mbit/s line frequency, E-biterror measurements, View received data, View FAS words,View MFAS words, etc.

48 SunSet E20/c

FRAMINGOptions: PCM-30 (F1), PCM-31 (F2)

• PCM-30 means the test set will synchronize on both FrameAlignment Signal (FAS) and MultiFrame Alignment Signal(MFAS)

• PCM-31 means the test set will synchronize only on FrameAlignment Signal.

Notes :

• HDB3 is the default line code. The line code is configured in thefollowing menu: MAIN MENU > SYSTEM PARAMETERS >MEAS CONFIGURATION.

• If the framing and CRC-4 state of the received signal do not exactlymatch the framing and CRC-4 settings, the test set will displayLoss of Frame condition and may display loss of CRC DET.

• Choose the framing that is appropriate for the circuit under test.• If you are unsure of the proper framing, push the AUTO key.• Use the combination which synchronizes properly and/or al-

lows error free measurement results.


CRC-4 YES allows the test set to measure CRC-4 errors on the in-coming signal and to transmit the CRC-4 bits on the outgoing signal.

• If you are unsure of the proper framing, push the AUTO key


L1-Rx Port and L2-Rx Port configure the two 2.048 Mbit/s receiv-ers. These settings let the test set electrically decode a 2.048Mbit/s signal under a wide range of resistive or cable losses. Theydetermine which electrical load will be placed on the circuit by thetest set. A 2.048 Mbit/s line requires exactly one low impedancetermination. These settings have no effect on the transmitters.

Caution! If you are uncertain, choose bridge. This will protect the2.048 Mbit/s circuit under test.

• TERM: This mode terminates the received signal with a 75 Wor 120Ω impedance termination. The tested signal has beentransmitted over real cable at a level between approximately +6and -43 dB. Usually, you should use TERM when you willdisrupt the circuit for testing.

• BRIDGE: The test set applies high-impedance isolation resis-tors to the circuit under test. This isolation circuit will protect thesignal from any possible disruption. The tested signal has been

Ch. 3 Menus 49

transmitted over regular cable at a level of approximately +6and -43 dB.

• MONITOR: Use when a measurement is made at a protectedmonitoring point, at a level between -15 and -30 dB. The signalis provided from the protected MONITOR jack of a networkequipment. In MONITOR mode, if a 0 dB signal is received, theCODE LED will light red. This often happens when the set isplugged into an OUT jack. In this case, choose TERM instead.If you uncertain if a jack is bridged or protected, try BRIDGEfirst.

TX CLOCKOptions: None, this is set at L1-Rx.

DATACOMThe datacom settings configure the multiport.

TYPEOptions: V.35 (F1), RS449 (F2), X.21 (F3), G.703 (more, F1),RS232S (more, F2)

TYPE determines the electrical interface at the datacom port.

TxSRCOptions: PATT (F1), E1DRP (F2)

Tx Source sets the transmit source for the datacom port.

• PATT: Sends a test pattern out the datacom port.• E1DRP: Sends the dropped NX64 kbit/s signal out the datacom

port.

MUXMUX settings define where the BERT will be performed.

B-LEDOptions: E1DRP (F1), DTCM (F2)

Determines the side Bit Error Rate Test measurements are per-formed on and the side the PAT SYNC LED will apply to.

• E1DRP: This means the E1 side will be bit error tested, and thePAT SYNC LED will refer to the E1 synchronization.

• DTCM: This is the datacom type selected above: RS232,G.703, etc. Choosing DTCM means the signal coming from thelow speed side will be tested, and the PAT SYNC LED will referto the low speed (datacom) side.

50 SunSet E20/c

E1 INSOptions: LOOP (F1), DTCM (F2), PATT (F3)

Determine which signal will be inserted into the 2.048 Mbit/s line.It may be changed only if TxSRC is set to E1DRP.

• LOOP: This means all 30 or 31 channels will be looped throughfrom 2.048 Mbit/s receive to 2.048 Mbit/s transmit. Nothing willbe inserted.

• DTCM: This means the low speed Nx64 kbit/s signal will beinserted on the 2.048 Mbit/s transmit.

• PATT: This means that the TEST PATTERN will be insertedon the 2.048 Mbit/s transmit signal.

E1T/SOptions: Nx64K

Select which Nx64 kbit/s channels to insert or drop the signal on.

• Nx64K: Press to enter the SELECT TIMESLOT screen. Referto E1 T/S in Section 3.2.1 for further details on selectingtimeslots.

Ch. 3 Menus 51

3.2.4 MUXTEST Mode

MUXTEST provides testing through a multiplex from either thelow speed datacom side to the high speed 2.048 Mbit/s side orfrom the high speed 2.048 Mbit/s side to the low speed datacomside. Figure 26 shows the MUXTEST configuration screen.

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E1 SIDERefer to Section 3.2.1 for a more detailed description of each E1configuration selection.

52 SunSet E20/c


Determines where the Nx64 kbit/s multiplexed signal will be in-serted. For example, if TX/INSERT is L2-Tx and you are insertinga received V.35 signal onto the line, then it will be inserted on line 2.


Select the 2.048 Mbit/s signal to be used for dropping a Nx64kbit/s signal to the datacom port.

• If you want to drop out a 64 kbit/s signal to V.35 from Line 1,then choose L1-Rx as Rx/DROP.

• This selection configures 2.048 Mbit/s line frequency, E-biterror measurements, View Received Data, View FAS Words,View MFAS Words, etc.

FRAMINGOptions: PCM-30 (F1), PCM-31 (F2)

Choose the framing that is appropriate for the circuit under test.

• PCM-30 means the test set will synchronize on both FrameAlignment Signal (FAS) and MultiFrame Alignment Signal(MFAS).

• PCM-31 means the test set will synchronize only on FrameAlignment Signal. It will disregard MultiFrame Alignment Signal.

Notes :

• If the framing and CRC-4 state of the received signal do notexactly match the settings, the test set will display a LOSS OFFRAME condition, and may display loss of CRC DET.

• If you are unsure of the proper framing, push AUTO. Use thecombination which synchronizes properly and/or allows errorfree measurement results.

• HDB3 is the default line code. The line code can be configuredfor AMI or HDB3 in the following menu: MAIN MENU > OTHERFEATURES > MEAS CONFIGURATION.


• CRC-4 YES to measure CRC-4 errors on the incoming signaland to transmit the CRC-4 bits on the outgoing signal.

• CRC-4 works with PCM-31 and PCM-30 framing only. IfUNFRAME has been selected for framing, the test set will forcethe CRC-4 configuration to NO.

Ch. 3 Menus 53


L1-Rx Port and L2-Rx Port configure the two 2.048 Mbit/s receivers.

• These settings let the test set electrically decode a 2.048 Mbit/ssignal under a wide range of resistive or cable losses. Thesesettings also determine which electrical load will be placed on thecircuit by the test set. These settings have no effect on thetransmitters.

Caution! If you are uncertain, choose bridge. this will protect the2.048 Mbit/s signal.

TX CLOCKOptions: L1-RX (F1), INTERN (F2), L2-RX (F3)

The TX CLOCK is used to time the Tx/INSERT signal.

• INTERN configures the test set for master timing. Here, thetest set supplies the timing source, but the source is notsynchronized to the network. Figure 28 depicts internal timing.

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54 SunSet E20/c

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• To configure the test set for slave timing, where the MUXsupplies the timing source, set the TX CLOCK for the same lineas Tx/INST. Refer to Figure 29.

• If Tx/INST is L1-Tx, then TX CLOCK should be L1-Rx. Con-versely, if Tx/INST is L2-Tx, then TX CLOCK should be L2-RX.

DATACOM SIDETYPEOptions: V.35 (F1), RS449 (F2), X.21 (F3), G.703 (more, F1), RS232(more, F2)

Determines the electrical interface at the multiport.

BERT SIDEE1T/SOptions: Nx64 (F1)

Select which Nx64 kbit/s channels to insert or drop the signal on.Pressing F1 on this slot will display the SELECT TIMESLOTscreen. Use it to select transmit/receive timeslots.

1. Select to the desired timeslot and press SELECT (F2). Thistimeslot will remain highlighted. Continue selecting timeslotsas needed.

2. You may deselect the timeslot highlighted by the cursor bypressing UN-SEL (F3). Pressing CLR-ALL (F4) will clear all ofthe selections and allow you to start the process over. Figure17 provides the SELECT TIMESLOT screen for E1 mode.

Ch. 3 Menus 55

B-LEDOptions: E1DRP (F1), DTCM (F2)

Determines the side Bit Error Rate Test measurements are per-formed on and the side the PAT SYNC LED will apply to.

• E1DRP: This means the E1 side will be bit error tested, and thePAT SYNC LED will refer to the received E1 signal.

• DTCM: This is the datacom type selected above: RS232,G.703, etc. Choosing DTCM means the signal coming from thelow speed datacom side will be tested, and the PAT SYNC LEDwill refer to the datacom side.

Figure 30 displays the configuration associated with the previousgraphic. The B-LED is set to DTCM (RS232, the DATACOM TYPEselected). Both the E1 and DATACOM ports will transmit the testpattern and perform a BERT when receiving the test pattern onthe other side of the multiplex. In other words, the test set willperform a mux and a demux test simultaneously. Simply switchthe B-LED selection in order to view results for each side.

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56 SunSet E20/c

3.3 Test PatternFrom the main menu (or via the Setup icon), se-lect TEST PATTERN. The screen displays a listof the patterns available for transmitting/receiv-ing. It also reports the received pattern. Figure 31shows the TEST PATTERN screen.

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3.3.1 Standard Patterns

To send one of the standard patterns:

1. Use the arrow keys to highlight the desired pattern.• As each pattern is highlighted, the test set begins transmitting

that pattern.

2. Press INVERT (F2) to send the pattern with an inverted polarity(1s and 0s reversed). Press NORMAL (F2) to send the patternwith a normal polarity.

3. At the MEASURE MODE line in SYSTEM PARAMETERS(System icon-color test set) > MEAS CONFIGURATION, youhave the option of selecting BER (F1) to have the test set lookfor a BERT pattern, or LIVE (F2), where the test set does notlook for a pattern, and tests live traffic. If LIVE is selected, thePAT SYNC LED will turn off. See the Reference chapter forpattern definitions.

Ch. 3 Menus 57

3.3.2 User Test Patterns

In addition to the standard patterns, you may program and send auser pattern. To access, press USER (F1) in the TEST PATTERNscreen (Figure 31). The USER TEST PATTERN screen appearslisting any stored patterns (Figure 32). In this screen you cancreate, edit, view, send, or delete a pattern.

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Sending a User Test Pattern1. In the TEST PATTERN screen, press USER (F1).2. The test set will present a list of stored USER patterns.Use the

Up/Down arrow keys to select the desired pattern.3. Press ENTER to send the selected pattern.

Viewing a User Test Pattern1. From the USER TEST PATTERN screen, move the cursor to

the desired pattern and press VIEW (F1).2. You will see your selected pattern on the screen (in binary).3. When finished, press ESC to return to the USER TEST

PATTERN screen.

Creating User-Defined Patterns1. In the SEND TEST PATTERN screen, press USER (F1) to

enter the USER TEST PATTERN screen.2. Cursor down to a blank position on the user pattern list.3. Press CREATE (F1). The cursor appears at the LABEL

position on the USER TEST PATTERN screen.4. Press TOGGLE (F3). The letter A will be highlighted in the

character grid as shown in Figure 33.5. Use the arrow keys to move the cursor to the desired character.

58 SunSet E20/c

6. Press SELECT (F4) and the letter appears next to the label.Repeat until you have the label as desired.

7. Press TOGGLE (F3) to move out of the character grid and backto the LABEL item.

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Figure 33 User Test Pattern Screen

8. Press the down arrow key to move to the pattern entry (No.)area.

9. Press the SHIFT key.• You may enter up to 24 bits to make the desired pattern.• Use the INSERT (F1) and DELETE (F2) keys if you need to

make corrections to the pattern.

11.Press the SHIFT key when finished. Verify that the ‘SHIFT’indicator is no longer displayed.

12.Press the ENTER key to store the pattern and to return to theUSER TEST PATTERN screen. The new pattern lable will nowbe displayed in the menu.

13.Move the cursor to the pattern lable and press ENTER totransmit the pattern.

Editing a User Test Pattern LabelUse this procedure to edit the label of a test pattern.

1. From the TEST PATTERN screen, press USER (F1) to moveinto the USER TEST PATTERN screen.

2. Select the code lable that you want to edit and press EDIT (F2).3. When the cursor is on the LABEL code line, press TOGGLE

(F3). A letter within the character grid will be highlighted.A. To replace a particular letter; select it and press INSERT

(F1). Select the desired replacement character and pressTYPOVR (F1).

Ch. 3 Menus 59

B. Press DELETE (F2) to remove a letter.C. If you need to add characters to the label, press TOGGLE

(F3) to return to the character grid. Select the desiredcharacter and press SELECT (F4). Repeat until the LABELis complete.

4. Press TOGGLE (F3) to move out of the character grid and backto the LABEL line and press ENTER.

Correcting a Mistake in the Pattern While Entering the PatternUse the following procedure to correct any mistakes made whileentering the pattern. This procedure assumes you are startingfrom step 7 of the Creating User-Defined Patterns procedure.

1. While entering the 1s and 0s, you notice an incorrect digit.Press the SHIFT key to remove the ‘SHIFT’ indicator.

2. Select the incorrect digit and press the SHIFT key to displaythe ‘SHIFT’ indicator.

3. Enter the correct digit.4. Press the SHIFT key to remove the ‘SHIFT’ indicator.5. Move the cursor to the end of the line.6. Press the SHIFT key again to display the ‘SHIFT’ indicator.7. Enter in the rest of the digits.8. Press ENTER to store the pattern.• You can edit the code's label using the same procedure.

Deleting a User Test PatternFollow this procedure to delete a user test pattern you no longerneed:

1. From the TEST PATTERN screen, press USER (F1) to enterthe USER TEST PATTERN screen.

2. Select the test you want to delete and press DELETE (F3). Thepattern is deleted and you are finished. Press ESC to return tothe main menu.

60 SunSet E20/c

3.4 Measurement ResultsTo observe measurement results:

1. Select MEASUREMENT RESULTS from themain menu (Results icon-color test set) andpress START (F3).

2. Page-Down through the screens.3. Press ESC when finished.

The test set continuously performs measurements on receivedsignal(s). While a measurement is being made, the ‘MEAS’ statusindicator is displayed at the top of the screen. When the measure-ment is stopped, the indicator will disappear.

Measurement results are stored when your press STOP (F3) andwhen PRINT RESULT is set to LAST in SYSTEM PARAMETERS> MEAS CONFIGURATION, or when a TIMED measurement fin-ishes. Events are also stored when PRINT EVENT is ENABLED,and in MEAS CONFIGURATION.

You do not need to access MEASUREMENT RESULTS for re-sults to be compiled. Measurements are automatically restartedevery time the configuration is significantly changed. The resultsscreens allow you to view the accumulated measurements andrestart the measurement process.

The actual measurement results screens and the values displayeddepend upon the TEST MODE selected in the TEST CONFIGU-RATION screen. There are, however, some common features inall of the results screens (see Figure 34).

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Ch. 3 Menus 61

Measurements often have a count number displayed on the lefthand side and the corresponding rate or percentage displayed onthe right hand side of the same line. For example, in Figure 34,CODE appears on the left and RATE on the right.

A key concept for the results screens is availability. A circuit isavailable for use only when the bit error rate is low enough thatthe signal can get through and be understood.

A circuit is said to be unavailable at the beginning of 10 consecu-tive severely errored seconds. Errors, errored seconds, and se-verely errored seconds are not accumulated when the circuit isunavailable. Therefore, if you start continuously injecting errors tothe test set at a 2x10-3 error rate, you will see increasing bit er-rors, errored seconds, and severely errored seconds for the first 9seconds. At the tenth second, all the counts will decrease backto the values they had before the error injection was started, andthe unavailable counter will increase by 10.

Once a circuit is unavailable, it becomes available only after 10consecutive seconds without severe errors. To continue the previousexample, if you turn the severe error injection off, and then insert 1or 2 errors during the next 5 seconds, you will observe that the un-available second counter continues to increase for the first 9 sec-onds while the error counter does not change. Then at the tenthsecond, the unavailable second counter suddenly decreases by 10and the error counter increases by the 1 or 2 errors that you inserted.

The following F-keys are shared by all screens:

PAGE-UP (F1), PAGE-DN (F2) : These keys allows you to view allavailable results pages.

STOP/START (F3): Press STOP to halt the test. Pressing STARTrestarts the measurement process from within this menu.

HOLDSCR/CONTINU (more, F1) : Hold Screen freezes all of themeasurement displays so they may be easily observed. The mea-surement count is still proceeding, but the counts are updatedonly in memory. You may now read the previous counts clearly.When you have finished viewing the screen, press CONTINU toview updated measurement results.

LOCK/UNLOCK (more, F2): Press LOCK to disable the keypad.The measurement process continues as usual, but keypad strokeshave no effect on the test set. This is useful if you are running along-term test and do not wish to have the test disturbed. PressUNLOCK to enable the test set’s keypad. Using this feature will notdisturb any measurement results.

62 SunSet E20/c

In addition to the actual measurement data, the following informa-tion is displayed in the upper portion of the results screens:

CURRENT TIME: The time of day is displayed in the upper right-hand corner of the screen.

ET: Elapsed Time is the time that has passed since the test wasstarted or restarted.

RT: Remaining Time is the time that remains until the end of test-ing. The factory default condition is that the test runs continu-ously until the user stops it. CONTINU is displayed in the RT fieldto denote a continuous test. However, in the SYSTEM PARAM-ETERS > MEAS CONFIGURATION menu, you may specify thelength of test time. In this case, the remaining time will countdown to zero during the measurement.

FRM: The transmitted framing is displayed here.

TxCK : The transmit clock source is displayed here.

PATT: The transmitted test pattern is displayed here.

RATE: The exact test rate is displayed here.

Ch. 3 Menus 63

3.4.1 E1 Results and General Definitions

E1 Mode measurement result screens contain several pages ofdata. Which screens are displayed depend on which mode youare in, SINGL or DUAL. Screen 1, which appears when you firstenter MEASUREMENT RESULT, is the STATUS screen. It dis-plays the status of each line in use. In large font, a status mes-sage is displayed for both lines 1 and 2. These messages (forexample: NO ERRORS, FRM LOSS, SIG LOSS, ERROR DET)represent the condition of the line during testing. Remember topress START (F3) to begin taking measurements.

Measurement Result DefinitionsThe following measurements are displayed in the results screens.The definitions are listed in alphabetical order.

Note : Each measurement is proprietary to its screen; e.g. ‘error’refers to E-Bit errors in the E-BIT screen, and to all Summaryerrors in the SUMMARY screen, etcetera.

AISS: Alarm Indication Signal Seconds is a count of the numberof seconds in which AIS was detected.

AS: This is the count of Available Seconds since the start of thetest. AS equals the length of the total test time minus any Un-available Seconds.

%AS: This is the percentage of Available Seconds since the startof the test.

BIT: This is a count of bit errors that have occurred since the startof the test. Bit errors are not counted during unavailable time.

BER: Bit Error Rate is the total number of bit errors divided by thetotal number of bits during available time since the start of the test.

CLK SLIP : This is the number of Clock Slips that have occurredsince the start of the test.

CODE: This is a count of the number of line Code Errors (BipolarViolations that violate the coding rules) that have occurred sincethe start of the test. In HDB3 coding, a Code Error is a bipolarviolation that is not part of a valid HDB3 substitution.

(CODE) RATE: This is the average Bipolar Violation error rate sincethe start of the test.

CRC: This is a count of the number of CRC-4 block errors thathave occurred since the start of the test. This measurement isreported as N/A when the test set is not synchronized on a re-ceived CRC-4 check sequence.

64 SunSet E20/c

(CRC) RATE: This is the average CRC-4 block error rate since thestart of the test. This measurement is reported as N/A when the testset is not synchronized on a received FAS or MFAS signal.

DGRM: This is the count of degraded minutes since the start ofthe test. A DGRM occurs when there is a 10-6 bit error rate during60 available, non-severely bit errored seconds.

%DGRM: This is the percentage of summary Degraded Minutessince the start of the test.

EBIT: This count shows the number of E-bit errors since the startof the test.

EBER: This is the average E-bit error rate since the start of the test.

EFS: This is a count of number of Error Free Seconds since thestart of the test.

%EFS: This is the percentage of summary Error Free Secondssince the start of the test. A summary Error Free Second is asecond in which the signal is properly synchronized and no errorsor defects occur.

ES: This is a count of the number of Errored Seconds that haveoccurred since the start of the test. An ES is any second with atleast one BPV, bit error, FBE, errored block, or CRC-4 error. AnES is not counted during an Unavailable Second.

%ES: This is the percentage of errored seconds that have oc-curred since the start of the test.

FALM : Frame Alarm seconds is a count of seconds that have hadfar end frame alarm (FAS Remote Alarm Indication, RAI) sincethe start of the test.

FE: This is a count of the number of Frame bit Errors that haveoccurred since the start of the test. This measurement is reportedas N/A when the test set has not synchronized on a known fram-ing pattern within the received signal.

Hz/PPM: The Hertz/Part Per Million count records any variancefrom 2.048 Mbit/s in the received frequency.

LOFS: Loss Of Frame Seconds is a count of seconds since thestart of the test that have experienced a loss of frame.

LOSS: Loss Of Signal Seconds is a count of the number of sec-onds during which the signal has been lost during the test.

+LVL : Positive Level is the level of positive pulses being receivedby the test set. Measurements are displayed in decibels variancefrom G.703 specified level (dB).

-LVL : Negative Level is the level of negative pulses being re-ceived by the test set. Measurements are displayed in decibelsvariance from G.703 specified level (dB).

Ch. 3 Menus 65

Lpp : Level Peak-to-Peak is the peak-to-peak level of negativeand positive pulses being received by the test set. Measurementsare displayed in decibels variance from DSX level (dB).

MAX Hz: This is the maximum frequency measured since thestart of the test.

MIN Hz: This is the minimum frequency measured since the startof the test.

MFAL : Multiframe Alarm seconds is a count of seconds that havehad far end multiframe alarm (MFAS Remote Alarm Indication,RAI) since the start of the test.

MFE: This is a count of the number of Multiframe bit Errors thathave occurred since the start of the test. This measurement isreported as N/A when there is no framing pattern within the re-ceived signal.

RxCLK : This is the received clocking frequency.

± RxLVL : This is the positive or negative level of pulses beingreceived by the test set.

RCV Hz: This is the current frequency measured during the lastsecond.

SES: This is the count of Severely Errored Seconds since thestart of the test. A severely errored second has an error rate of>10-3. SES is not counted during unavailable time.

%SES: This is the percentage of seconds since the start of thetest that are Severely Errored Seconds.

SLIP: This is the count of Bit Slips. SLIP occurs when the synchro-nized pattern either loses a bit or has an extra bit stuffed into it.

UAS: This is the count of Unavailable Seconds that have occurredsince the start of the test. Unavailable time begins at the onset of10 consecutive severely errored seconds. The displayed value ofUAS updates after the tenth consecutive severely errored secondoccurs. Unavailable time also begins at a LOS or LOF.

%UAS: This is the percentage of unavailable seconds since thestart of the test.

+WANDR: This is the total positive phase difference between themeasured frequency and the reference frequency since the startof the test. The +WANDR value increases whenever the mea-sured frequency is larger than the reference frequency.

-WANDR: This is the total negative phase difference between themeasured frequency and the reference frequency since the startof the test. The -WANDR increases whenever the measured fre-quency is less than the reference frequency.

66 SunSet E20/c

The following is a description of the available results screens.

3.4.1.1 Line 1 and Line 2 Summary Screens

Screens 2 and 3 contain the summary results for Lines 1 and 2,respectively, if both lines are in use. Figure 35 displays the SUM-MARY screen for Line 1.

SUMMARY screens present the most significant measurementresults. These screens contain data related to the specific typesof impairments, like code errors, CRC-4 block errors, framing,and multi-framing bit errors.

,$0$!

!$0 & +9 $ !-$1

+!$1#:&-

-/ -/ -/ -/ -/ -// +-; +-;

<6

Figure 35 Line 1 Summary Screen (E1 Mode)

3.4.1.2 Frequency Screen

The next screen is FREQUENCY, which shows relevant frequencyinformation.

• The bar graph indicates how fast the signal is slipping in relationto the reference clock. In the TEST CONFIGURATION screen,RxDROP determines which line the measurements are takenon. The other (not selected) line is the reference clock. Forexample, if RxDROP is L1-Rx, L1 will be measured, and thereference clock will be derived from the L2-Rx signal.

• It is important to know the source of the reference clock, tomeaningfully interpret your graph results.

• Note that the bar graph slips most rapidly at the center positionand then gradually slows down as the length of the barincreases.

• A count of the number of clock slips is kept at the end of the bar.• At 256 clock slips the graph resets itself.• One clock slip occurs when the measured frequency deviates

from the reference frequency by one unit interval. A unit interval

Ch. 3 Menus 67

is equal to 488 nano seconds, for E1 lines.• The bar graph is only valid when both L1-Rx and L2-Rx have

valid signals. If L2-Rx has no signal it will show a NO LINE 2REF SIGNAL, and no graph will be shown.

• Figures 36 and 37 show the Line Frequency screen used for E1Mode.

0$

"! + " !-$1

8

&:!$0###'&:!$0###&:!$0###

"/% % "

///////

" <<<<<

Figure 36 Line Frequency Screen (E1 Mode)

!"$"$# &+ $ !-$1

8

!

&:!$1'&:!$1&:!$1!

&/% &% &

Figure 37 Line Frequency/No Ref Signal

Note: When no reference clock signal is present, the test set willdefault to its internal clock, for the measurement of MAX, MIN,and current RCV bit rates of the selected signal. Refer to theMeasurement Result Definitions section as needed.

68 SunSet E20/c

3.4.1.3 LINE 1 and Line 2 G.821 Screens

These screens present the measurement parameters specified inITU G.821. Note that these screens will only appear if the G.821item in the SYSTEM PARAMETERS > MEAS CONFIG screen isset to ON. The same applies specifically to the DGRM measure-ment. Figure 38 provides a sample screen. Refer to the Measure-ment Result Definitions section as needed.

0!",$# + , !-$1

-1!"$"$ = -

- =-=-===-

Figure 38 G.821 Logical Screen

3.4.1.4 Line 1 and Line 2 ALM/SIG Screens

This screen presents alarm and measurement parameters relat-ing to the E1 signal. Refer to the Measurement Result Definitionssection as needed.

0!"$

/-,#;-,#;55$-0;

&

!!, + $ !-$1

Figure 39 ALM/SIG Screen (E1 Mode)

Ch. 3 Menus 69

3.4.1.5 Line 1 and Line 2 M.2100/550 Screens

This screen provides pass/fail measurements in accordance withITU M.2100/550 specifications. This specification is used wherea 2.048 Mbit/s circuit passes through international boundaries. Itallocates a certain allowable error rate to each nation that carriesthe circuit. You need only to enter the appropriate percentage thatis to be allowed for the line under test. The test set makes theM.2100/550 calculations and reports whether the line passed orfailed. Refer to Figure 40. The definitions following pertain particu-larly to this screen.

$!##0 + " !-$1

-!&""

&==!0&!#--!#&--&---&"--

Figure 40 Line 1- M.2100/550 screen (E1 Mode)

PERIOD: Identifies the date and time interval of each of the re-ported pass or fail results. The period interval used in Figure 40 is2 minutes. You may change this interval in the SYSTEM PARAM-ETERS > MEAS CONFIGURATION, page 2. Valid entries mayrange from 00 to 99 minutes.

P/F: This shows whether the test result passed or failed duringthe test period.

%ES: This is the percentage of M.2100 Errored Seconds sincethe start of the test. An errored second is any second with aCode, Bit, Frame, Multiframe or CRC error.

%SES: This is the percentage of Severely Errored Seconds sincethe start of the test. An M.2100 Severely Errored Second is anysecond with >10-3 bit error rate, 10-3 code error, excessive frame,multiframe or CRC bit errors, loss of frame, loss of pattern, syn-chronization, or loss of signal.

70 SunSet E20/c

3.4.1.6 LINE 1 and Line 2 G.826 Screens

The next screen shows the G.826 results. Refer to Figure 41.

#"$

$!" & + $ !-$1

23 -1!,

$$$

=-=-$=-$=-=-=##-#

<6

Figure 41 Line 1- G.826 Screen (E1 Mode)

Note: You must turn on G.826 measurements in SYSTEM PA-RAMETERS > MEAS CONFIGURATION. This ITU standard, speci-fies required performance characteristics of 2.048 Mbit/s lines.The parameter definitions given in G.826 are block-based. Thismakes in-service measurement convenient.

The following definitions are specific to this screen:

BBE : A Background Block Error is an errored block not occurringas part of a SES (Severely Errored Second).

%BBE : The percentage of errored blocks since the start of thetest, excluding all blocks during SES and unavailable time.

EB: An Errored Block is a block containing one or more bit errors.

%EB: This is the percentage of errored blocks since the start ofthe test.

SES: A Severely Errored Second is a one second period whichcontains greater or equal to 30% errored blocks.

%SES: This is the percentage of Severely Errored Seconds sincethe start of the test.

Ch. 3 Menus 71

3.4.2 E1-MUX Mode Measurement Results

The E1-MUX mode MEASUREMENT RESULT screen, show theLine 1 and Line 2 Summary Results. See the Measurement Re-sult Definitions section as needed. Three additional datacomscreens are shown in this mode. See Chapter 5, Datacom, for theresults definitions. Figure 42 shows the Datacom SUMMARYscreen, Figure 43 shows the DATACOM BIT results, and Figure44 shows the BLOCK ERROR screen.

!0

-" +:$19 +:$1 ! "

+ +

"!$,

Figure 42 Datacom Summary Results (E1-MUX Mode)

,$"!

$"" +:$19 +:$1"

!- ,=- =-!#" =!#" = =-

Figure 43 Datacom Bit Error Results

72 SunSet E20/c

!0 ! " +:$1

) ,1,11 - "

"!$, <6

Figure 44 Datacom Block Error Measurement

3.4.3 MUXTEST Mode Results

Measurement results for MUXTEST mode are the same as thoseof E1-MUX Mode. Refer to Section 4.1, E1 Mode, for descriptionsof all the screens, except for the Datacom results. The Datacomscreens are found in Section 4.2 and in Chapter 5.

3.4.4 DATACOM Mode Measurement Results

The DATACOM results screens contain three pages of data. Fig-ures 42 to 44 show sample screens. See Chapter 5 for furtherinformation.

Ch. 3 Menus 73

3.5 Other MeasurementsThe OTHER MEASUREMENTS menu screen is shown in Figure45. Most of these items are found under the Results icon for thecolor test set, in a slightly different order. V.110 and ChannelLoopback are found under the Setup icon.

!"!"

% %% %% '-" -

Figure 45 Other Measurements Menu Screen

Most of these menu choices are described here in Section 5.Note that Datacom is described in Chapter 5. X.50 and V.110ANALYSIS have their own manuals.

74 SunSet E20/c

3.5.1 View Received Data

Refer to Figure 46, for a typical screen display.This display refers to the Rx/DROP setting in theTEST CONFIGURATION screen. In DATACOMmode, the data displayed will be for the receivedsignal in the TEST CONFIGURATION screen.

%

& ' (* 1 (>*! $$ (?* (@*$ ," (*" !! A(*, (*0 (*

!!$0

Figure 46 View Received Data

To view this screen, use the following procedure:

1. In the main menu, select OTHER MEASUREMENTS (Resultsicon-color test set) > VIEW RECEIVED DATA and view the livepresentation of the data.

• Press PAUSE (F3) to trap the current data on the E1 line.• Press PRINT (F4) to send the data to the serial port for printing.• Press PAGE-UP (F1) or PAGE-DN (F2) to view more data.

Note the PAGE number in the upper left-hand portion of thescreen. 64 pages of data are available; which is equal to 16frames or one multiframe.

2. When finished, press ESC to return to the main menu.

Ch. 3 Menus 75

The following display definitions are used in this screen:

PAGE: Indicates which of the available 64 pages of data is cur-rently being displayed.

T/S: Specifies the TimeSlot being viewed.

BINARY : This column shows the binary data actually being re-ceived on the line. Each line represents the 8-bit timeslot.

HEX: This column shows the hexadecimal representation of the 8bits being transmitted in each timeslot.

ASCII: This column displays the ASCII representation of the 8-bitbinary framing word which has been received.

• The character displayed to the left of the parentheses repre-sents the 8-bit framing words translated in their present order.

• The character displayed within the parentheses represents the8 bits translated in reverse order.

76 SunSet E20/c

3.5.2 View FAS Words

View FAS Words is accessed via the OTHERMEASUREMENTS menu (Results icon-color testset). View FAS Words allows viewing of the livepresentation of E1 framing binary words. Timeslots0 of frames 0 through 15 are displayed in thisscreen (see Figure 47). The presented data refers to the Rx/DROPselection in the TEST CONFIGURATION screen. See Chapter 5-Reference for further information.

Notes :

• Valid framing is required to select this screen.• This feature is not available for the DATACOM TEST MODE.• Press PAUSE (F1) to freeze the presentation of data; press

RESUME (F1) to return to a live FAS word display.• PRINT (F2) will become available when this screen is paused;

press PRINT to send the screen to the serial port for printing.

%

!$",01 !$",01B2<66666!$",01#!$"

10", <6

Figure 47 FAS Frame Words

The even frames, 0-14, contain the FAS, Frame Alignment Sig-nal, in bits 2-8. As shown in Figure 47, FAS is represented by0011011.

The odd frames do not contain the frame alignment signal. The toprow of these frames in Figure 47 shows the allocation of bits 1-8 inthese frames. The figure represents an undisturbed condition.

When the framing is set for PCM-30 Multiframe, there is a slightvariation in the odd framing bits, those not containing the framealignment signal. Bit 1 is used to transmit the 6-Bit CRC-4multiframe alignment signal and 2 CRC-4 error indication bits. The

Ch. 3 Menus 77

CRC-4 multiframe alignment signal has the form 001011. Figure48 shows the FAS frame words seen when the framing is set forPCM-30.

0""

%

!$",01 !$",01B2C<66666!$",01#!$"

Figure 48 FAS Words

In Figure 48, the first bits of frames 1-11 (odd) send the pattern001011, the CRC-4 multiframe alignment signal.

78 SunSet E20/c

3.5.3 View MFAS Words

In View MFAS Words, you may view the live pre-sentation of Timeslot 16, Frames 0-15. You needto select PCM-30 framing in the TEST CONFIGU-RATION screen to select this screen (Figure 49).The data comes from the Rx/DROP selection inthe TEST CONFIGURATION screen. This feature is not availablefor the DATACOM TEST MODE. To enter View MFAS Words:

1. From the MAIN MENU, select OTHER MEASUREMENTS(Results icon-color test set) > VIEW MFAS WORDS.

• Press PAUSE (F1) to freeze the presentation of data; pressRESUME (F1) to return to a live MFAS word display.

• PRINT (F2) will become available when this screen is paused;press PRINT to send the screen to the serial port for printing.

!

% ) !$",01 !$",01+D++<4B;!$",01#!$"

Figure 49 MFAS Frame Words

In the Multiframe, timeslot 16 is used for either common channelor channel associated signalling, as required. Please note that inFigure 49, the template for the even frames (0000xyxx) appliesonly to Frame 0. All other frames follow the template shown abovethe odd frames (ABCDabcd). As seen in Figure 49, in frame 0,MFAS is 0000. The rest of the frames contain signalling channelsdesignated a, b, c, and d. Frame 1 contains channels 1 and 16,frame 2 contains channels 2 and 17, and so forth until frame 15,which contains channels 15 and 30.

Ch. 3 Menus 79

3.5.4 Pulse Mask Analysis

The Pulse Mask Analysis option enables you tomeasure the quality of an E1 waveform. The mea-sured results compare favorably with pulse shapemeasurements obtained from testing with a digi-tal oscilloscope.

• The Pulse Mask Analysis is performed for any received testpattern or live signal, and line interface mode.

• The signal shape is displayed on the test set’s screen.• The ITU G.703 pulse mask can be superimposed for fast

inspection.• The test set will store the present pulse shape for later viewing.• Note that if you start analysis while measurements are running,

the test set will stop the measurements. When Pulse MaskAnalysis is complete, the test set will restart the measurements.

The PULSE SHAPE ANALYSIS menu is shown in Figure 50.

10, <6

%%

Figure 50 Pulse Shape Analysis Menu

In the PULSE SHAPE ANALYSIS menu you can:

• Start a new analysis.• View the last analysis made by the test set.

80 SunSet E20/c

3.5.4.1 Start New Analysis

Select PULSE SHAPE ANALYSIS > START NEW ANALYSIS tostart a new analysis. Figure 51 provides a sample screen.

"$,""

%2;.E!$36 26 2 "036<CC2 036

FE. -= 3;E.-= F C

-$;"36&;2F

Figure 51 Pulse Shape Analysis

In three to five seconds, the captured pulse shape will be dis-played. A PASS/FAIL message will appear at the top of the screen,when a G.703 mask has been imposed on the received pulse. Ifthe pulse meets the G.703 criteria, it passes. Otherwise, it fails.In this screen, there are three F-keys:

G.703 (F1): Displays the ITU G.703 mask with the captured sig-nal. This F-key then becomes NO-MASK (F1); press to removethe G.703 mask.

RESTART (F2): Starts a new pulse shape capture and analysis.

PRINT (F3): Press PRINT to send the screen to the serial port forprinting.

Definitions for this screen are:

Width :Pulse Width, in ns

Rise Time : in ns

Fall Time : in ns

Ovr Shoot : Over Shoot, percentage

Und Shoot : Undershoot, percentage

Level : Signal level, in dB

Ch. 3 Menus 81

3.5.4.2 View Last Pulse Shape

View the last pulse shape captured by the test set. You may viewthis pulse shape at any time, even after the test set has beenturned off for an extended period of time. Follow this procedure:

1. In the main menu, select OTHER MEASUREMENTS (Resultsicon-color test set) > PULSE MASK ANALYSIS >VIEW LASTPULSE SHAPE.

• The last pulse shape will be displayed on the screen, along withthe G.703 and PRINT F-keys.

• See Section 3.5.4.1 for the results definitions.

82 SunSet E20/c

3.5.5 C-Bit Analysis

The C-Bit Analysis option allows the user to sendand receive C-Bit frames. To enter C-Bit Analysis:

1. From the main menu, select OTHER MEA-SUREMENTS (Results icon-color test set) >C-BIT ANALYSIS.

• C-bits can be received on both Line 1 and Line 2, but they canbe transmitted on only one line. This will be the line set for Tx/INSERT in the TEST CONFIGURATION screen.

!11 <6

42.

+& +&

! +&

!$",01#!$"

!

'

Figure 52 C-bit Analysis

Note: The test set will transmit an IDLE pattern upon entering theC-bit Analysis screen.

The following programmable fields are available in this screen:

L1-Tx T/SOptions: 1-15, 17-31

Select the transmit timeslot on which to send C-bits.

• Press NEXT (F1) or PREVIUS (F2) as necessary.• To send C-bits on Line 2 (and thus, this item changes to L2-Tx

T/S), set Tx/INSERT to L2-Tx in the TEST CONFIGURATIONscreen.

• As PCM-30 framing is required for this C-bit analysis, you maynot select timeslot 16.

Ch. 3 Menus 83

TRANSMITOptions; USER (F1), IDLE (F2)

This setting determines bit 2.

• IDLE sends logic 1 as bit 2. When 1 is placed in this spot, C-bit framing will be ignored.

• USER activates the C-bit framing and sets the programmablebits. To program the bits use the following procedure:

1. Select SEND bits.2. At each bit, press SHIFT and enter either 0 or 1 with the

numeric keypad. The cursor automatically moves one spot tothe right once a bit is entered. When the cursor highlights aspecific bit, information about this C-bit is displayed.

L1-RxOptions: 1-15, 17-31

Select the Line receive timeslot on which to receive C-bits.

• Press NEXT (F1), or PREVIUS (F2) as needed.• Because PCM-30, MFAS, framing is required, you may not

select timeslot 16.

This screen also shows the received C-bits for both Lines 1 & 2.If C-bits are not found on a line, a C-BIT NOT FOUND messagewill be displayed for that line.

Definitions of C-bits 2-15 are shown in Table 3.

B it # A ss ig n m en t

2 E S C A P E 0 -C -F ram e A ctive 1 -C -F ram e Ig no re d

3 2M b Lo op s 0 -S ub scrib e r 1 -N e tw ork

4 Lo op 2 o r Lo op 3 0 -S ub scrib e r 1 -N e tw ork

5 Lo op 2 In s tru c tion 0 -A c tive 1 -N on-a ctive

6 Lo op 3 In s tru c tion 0 -A c tive 1 -N on-a ctive

7 H D B 3 C o m m and 0 -A c tive 1 -N on-a ctive

8 Lo op A ckn ow ledg e 0 -A ckn ow ledg e 1 -N o A ckno w ledge m en t

9 N o t D e fine d

10 L oca l F a u lt 0 -A c tive 1 -N on-a ctive

11 R e m ote /L ine F au lt 0 -A c tive 1 -N on-a ctive

12 C F ra m e L oss 0 -A c tive 1 -N on-a ctive

13 -15 S p are

Table 3 C-bit Definitions

84 SunSet E20/c

3.5.6 Histogram Analysis

Histogram analysis automaticity starts when E1or Datacom measurement starts. You can view/print either the current file, or a previously savedone (if you have an additional memory card).

Figure 53 shows the HISTOGRAM ANALYSISmenu, which appears upon entering this item.

Note: Interrupting a timed measurement to view results will causea new histogram analysis to start when you return to measuring.

"1!#

Figure 53 Histogram Analysis Menu

Ch. 3 Menus 85

3.5.6.1 Current Histogram

From the main menu, select OTHER MEASUREMENT (Resultsicon-color test set) > HISTOGRAM ANALYSIS > CURRENT HIS-TOGRAM.

• The Current Histogram start and stop date and time will bedisplayed, as depicted in Figure 54.

• The CURRENT date and time correspond to the last time youentered MEASUREMENT RESULTS.

• Select VIEW (F1) to view the current histogram. Figure 55shows a sample histogram screen.

• Pressing STORE (F2) will erase any previously stored data.You must have a SRAM card to store data.

• Your CURRENT histogram data is also stored, but it will beerased the next time you enter MEASUREMENT RESULTS.

• If you do not want to save the current file and erase the onealready saved, press ESC instead of ENTER at the warningmessage screen.

#!1,

##1,1#!,

##1,#!#!

%

Figure 54 Current Histogram Menu

86 SunSet E20/c

!$!$

999

1!1!$

&!7

" <6

Figure 55 View Current Histogram

The following F-keys are available for the histogram analysis:

TYPE (F1): Press to select from the following measurement types.

• If the test set is configured for E1SINGL/E1DUAL, E1-MUX orMUXTEST, the following error types are available:- EBIT, CRC, FAS, MFAS, CODE: See the Measurement

Result Definitions section.- LOS: Loss of Signal- LOF: Loss of Frame- AIS: Alarm Indication Signal- FASRAI: FAS Remote Alarm Indication- MFASRAI: MFAS Remote Alarm Indication- BERT_LOPS: Loss of Pattern Synchronization- BERT_BIT: Bit errors

• If the test set is configured for DATACOM mode, the followingerror types are available:- BERT_LOPS: Loss of Pattern Synchronization- BERT_BIT: Bit errors

• For all error types:- The history of each error type is displayed individually.- The error type is specified in the upper portion of the screen.- Pressing TYPE automatically changes the type options

displayed.

In Figure 55, BIT error was selected as the error type.

Ch. 3 Menus 87

LINE 1/2 (F2): Selects the parameters of either E1 Line 1, E1Line 2, or Datacom; depending on the setup.

• When the test set is configured for DATACOM, MUXTEST, orE1MUX test mode, the datacom's parameters will automati-cally be selected and you will not be given the LINE 1/2 option.

ZOOM (F3): Changes the resolution to the next lower time periodat the cursor location. Highlight the error before pressing ZOOM.

• Select a minute, hour, or day interval as your time period

JUMP (more, F1): Moves the display cursor by 10 steps in thedisplay period.

• Use the left or right arrow keys on the keypad to move thecursor one period at a time

PRINT (more, F2): Press to send the results to the serial port.

Notes :• The HISTOGRAM ANALYSIS screen will display either the

current or saved results.• Each time MEASUREMENTS RESULT is selected, the test

set will replace the file in the CURRENT HISTOGRAM data.• For each file, the HISTOGRAM ANALYSIS feature will store

the most recent 24 hours of data with a display resolution(PERIOD) of 1 minute.

• For each file, the HISTOGRAM ANALYSIS screen will storeboth the present 60 hours and the previous 60 days ofhistogram data with a resolution (PERIOD) of one hour.

88 SunSet E20/c

3.5.6.2 Saved Histogram

Select SAVED HISTOGRAM to view, print, or give a label to asaved Histogram Analysis. If you attempt to enter SAVED HIS-TOGRAM without an extra memory card, you will see a warningmessage. See Section 3.5.6.1 for an explanation of the data. SeeFigure 56 for a SAVED HISTOGRAM screen:

!0"

2C 2: ! F<2C!- &-##1!$1

##1!!$1!-##1!###

%

Figure 56 Saved Histogram Screen

F-keys available on this screen are:

VIEW (F1): Press to enter the selected record.

PAGE-UP/PAGE-DN (F2): Press to scroll through the availablescreens of saved histograms.

DELETE (more, F1): Press to delete the highlighted histogram.

LOCK/UNLOCK (more, F2): Press LOCK to lock the record, sothat it may not be deleted or otherwise changed. Press UNLOCKto unlock the record.

LABEL (more, F3): Press to enter a screen where you can givethe histogram a name.

1. Press TOGGLE (F3) to access the characters, then select thecharacters by pressing SELECT (F4).

• Use INSERT (F1) and DELETE (F2) when you need to add orremove a character.

2. Press TOGGLE (F3) when you are done.3. Press ENTER, and you will return to the SAVED HISTOGRAM

screen, where the new label will be on the record, under theLABEL heading.

CLR-ALL (more, F1): Press to delete all unlocked histograms.

Ch. 3 Menus 89

3.5.7 Propagation Delay

• View the propagation delay of a looped backsignal (Figure 57).

• You may enter this screen in a full-rate or Nx64mode.

• The test set measures the number of unit inter-vals it takes for the signal to return. A unit interval is the amountof time it takes to transmit one bit (488 nS for an E1 signal). Thisnumber is translated into an exact number of microseconds ofround trip delay.

$$! <6

$,

!!G

<3<CD626B5C . ;

Figure 57 Propagation Delay

• Press CALIB (F2) if you have more than one piece of loopedequipment on the line, and want to re-calibrate the measure-ment to see the propagation delay between two devices, notincluding the test set. Observe the OFFSET to see the delaybetween only the two pieces of equipment (taking the test setto Equipment 1 measurement out of the delay measurement).Continue as necessary to press CALIB to take measurementsfurther down the line.

• Press RESTART (F1) to stop and restart a propagation delaytest.

• The display will be for the Rx/DROP selection in the TESTCONFIGURATION screen.

90 SunSet E20/c

3.5.8 Channel Loopback

With the test set’s E1 V.54 channel loopback fea-ture, you can get detailed information for the main-tenance or troubleshooting of V.54 datacom cir-cuits. The V.54 channel loopback can locate thefaults in the circuit by setting up a loop in the farend modem, which allows for local or remote measurements. Thetest set can activate or deactivate the near end device by send-ing the activation and deactivation code. V.54 channel loopbackuses the T1 E1.2/94-003 standard.

" $

663

)336

6)

Figure 58 V.54 Application

The CHANNEL LOOPBACK feature is accessed via OTHERMEASUREMENTS (Setup icon-color test set).

!1

-"$

Figure 59 V.54 Channel Loopback Screen

Use LOOP-UP (F1) or LOOP-DN (F2) to send codes as needed.

Ch. 3 Menus 91

3.6 VF Channel AccessThe VF CHANNEL ACCESS menu performs avariety of talk/listen functions.

Note : Do not attempt to enter VF CHANNEL AC-CESS if the PCM-31 LED or the PCM-30 LED isnot green. Green LEDs indicate that the framingfound on the received signal matches the framing selected in theTEST CONFIGURATION screen. It is impossible to talk, listen,or perform other channelized functions in the absence of framesynchronization, since channels can be identified only within aframed signal.

Refer to Figure 60 for the VF CHANNEL ACCESS menu.

H % %&

1!!",

Figure 60 VF Channel Access Menu

Note: During VF CHANNEL ACCESS, when the test configurationTxSOURCE is set to TESTPAT, idle channel code and signalling(A/B/C/D bits) will be inserted into the unselected channels. Theidle channel code and signal can be programmed in the MAINMENU > SYSTEM PARAMETERS (System icon-color test set)> MEAS CONFIGURATION > IDLE CHNL CODE and IDLE CHNLA/B/C/D menu items.

92 SunSet E20/c

3.6.1 VF & Noise Measurements

The VF & NOISE MEASUREMENTS screen lets you choose:

• which channel to test for both transmitting and receiving• whether to talk, send a tone, or place quiet termination on the

transmit signal• the transmitted frequency and level• which signalling bits to send• to listen on both or either line

It also tells you:

• the received signalling bits• the received 8-bit data• the received frequency and level• noise measurements on the received frequency

Note that there are some differences in setting up for E1SINGL orE1DUAL mode.

H

+& &! /!

+(;*

!

+ + +&!& + 8!

+ 8I1I/ +(;*II/!0&!0 +I +I&(;*I,-(;*I-,(;*I#-"(;*I,1-#

'

Figure 61 VF Measurements

Figure 61 is an example of an E1Dual setup. Tx-1 is set for timeslot01. Tx is Line 1, since Tx/INSERT was set for Line 1 in TESTCONFIGURATION. To insert on Line 2 (and consequently see Tx-2 on this screen), select Tx/INSERT: L2-TX in TEST CONFIGU-RATION. Tx of the other line will be in loop mode.

Rx-1/2 shows the selected receive timeslot for each line. TheMEASUREMENT RESULTS come from the IN/DROP selectionfurther down this menu.

Ch. 3 Menus 93

Tx-T/S (E1SINGL) or Tx-1 (E1DUAL)Options: 1-31

Choose the transmit timeslot.• Press NEXT (F1) or PREVIUS (F2) as needed.• Tx-1 normally should be the same as the Rx-1, but you do have

the option to set them for different channels.• Upon selecting a timeslot, approximately three seconds pass

before actually inserting on the timeslot.

Rx-1 (E1SINGL) or Rx-1/2 T/S (E1DUAL)Options: 1-31

Choose the receive timeslot for E1 Line 1 (E1SINGL mode) or E1Lines 1 and 2 (E1DUAL mode).

• Use NEXT (F1) or PREVIUS (F2) as needed• To receive on Line 2, select L2-Rx for the DROP item.

TxABCDOptions: IDLE (F1), SEIZE (F2), manually set

Change the signalling bits transmitted with the associated trans-mit channel. These bits will be transmitted only if the test set isusing MFAS (PCM-30) framing.

• Pressing IDLE (F1) or SEIZE (F2) will place that signal onto theA/B/C/D position. Program the IDLE or SEIZE signal in the VFCHANNEL ACCESS/SUPERVISION SETUP.

To change these bits manually:1. Press SHIFT and use the 1 and 0 keys to enter the signalling bits.2. Press ENTER to send the ABCD bits.

IN/DROP (E1DUAL)Options: L1 (F1), L2 (F2)

Determine on which line to Insert and Drop the signal.• Insert determines the line onto which you insert the test signal.• Drop determines which line will report Measurement Results.

TxModeOptions: THRU (F1), TALK (F2), QUIET (F3), TONE (F4)• Press THRU to pass all of the received channels out on the

transmit signal.• Press TALK to talk on the selected transmit channel; the test

set will transmit speech from the microphone.• Press QUIET to place a quiet termination on the transmit signal.• Press TONE to insert a tone on the selected transmit channel.

If you select TONE, use the next two settings to set the tonefrequency and level.

94 SunSet E20/c

TxFREQOptions: 50 Hz-3950 Hz

If TONE is selected for TxMode, choose the tone frequency bypressing the SHIFT key and entering the value from the keypad.

TxLVLOptions: -60 to 3 dBm

If TONE is selected for TxMode, choose the transmit tone levelby pressing the SHIFT key and entering the value from the key-pad. You may select any value from -60 to +3 dBm. Press MINUS(F1) to achieve negative values.

Speaker (E1DUAL)Options: L1 (F1), L2 (F2), L1+L2 (F3)

Select the line you want to hear on the speaker.

• Press L1 to listen on Line 1.• Press L2 to listen on Line 2.• Press L1+L2 to listen on both lines.

Measurement ResultsThe last five items pertain to received data. As the equals signindicates, they are for viewing only, and may be neither edited norchanged.

RxFREQView the received frequency of the selected channel in hz.

Rx(dBm)View the received level in dBm.

RxABCDView the received Channel Associated Signalling System (CAS) bits.

Note: These bits are meaningful only if the PCM-30 LED is green.Ignore these bits if this LED is not green.

S/N (dB)Observe the Signal to Noise measurement, in decibels. This mea-surement is updated every second.

3K (dBm)Observe the Noise 3-K Flat measurement, in dBm. This measure-ment is updated every second.

Ch. 3 Menus 95

OFFSETObserve the coder Offset.

PEAKObserve the coder peak from +127 to -127, using A-law.

RxDATAView the live 8-bit channel data as it is received from the selected line.

PSOP (dBm)Observe the Noise Psophometric measurement in dBm. Thismeasurement is updated every second.

1010 (dBm)Observe the Noise 1010 Hz measurement, in dBm. This mea-surement is updated every second.

96 SunSet E20/c

3.6.2 View Line CAS

• View the signalling bits for all of the 30 channels for either Line1 (E1SINGL) or Lines 1 and 2 (E1DUAL).

• You must select PCM-30 framing in the TEST CONFIGURA-TION screen.

• The PCM-30 LED must be green in order for the signalling bitsto be displayed.

• Timeslots 1-5 are shown on the first line, 6-10 are shown in thesecond line, etc. See Figure 62 for a sample screen.

&,0!!!0&,0!!!!0

0""

Figure 62 View Line 1 & 2 CAS

Press STATUS (F1) to see a decode of each ABCD state. Infor-mation will be displayed when a match of state for forward/back-ward conditions are met, as specified in the SUPERVISIONSETUP screen. Here are the definitions:

IDLE= IDLESEIZ= SEIZEACKW= SEIZE ACKNOWLEDGMENTANSW= ANSWERCLRB= CLEAR BACKCLFR= CLEAR FORWARDBLCK= BLOCK????= UNKNOWN; no state or no match detected

• Note that some states will change too quickly for the test setto display and detect. Therefore, only constant states which aredetected when the screen is refreshed will be displayed.

• Press ABCD (F1) to display the ABCD information.

Ch. 3 Menus 97

3.6.3 Call Analysis

,

5 66 .6.<.

+& +!&'-"

'

Figure 63 Call Analysis

In Call Analysis, the test set monitors the digits and states sentbetween two pieces of equipment. To use this feature the test setmust be configured for E1DUAL mode, using PCM-30 or PCM-31framing.

Notes:• Supervision setup must be precisely setup for Call Analysis to

work properly.• The test set must see a Seize and a Seize Acknowledgment

before it will capture digits.• New memory storage cards will be reformatted upon entering

this feature.• Refer to Section 6.2.8 for more information on this technology.

Configure the following:

TYPEOptions: MFR1SS5 (F1), MFR2 (F2), DTMF (F3), PULSE (F4)

Select the type of signal you will be analyzing.

• Use MFR1SS5 to analyze SS5 signalling.• Use MFR2 to analyze MFR2 and MFR2 compelled signalling.• Use DTMF to analyze DTMF signalling.• Use PULSE to analyze Pulse signalling.

98 SunSet E20/c

Rx-1 T/SOptions: 1-31, or AUTO (F3)-MFR2, DTMF or PULSE only

Select the Line 1 timeslot to receive the signal on.

• Use NEXT (F1) and PREVIUS (F2) to select the timeslot.• If AUTO is selected, the test set scans all channels for the

TRIGGER event (line 4). You will also be presented with twoadditional choices; TRIGGER and SUPERVISION/ABCD.

Rx-2 T/SOptions: 1-31, or AUTO (F3)-MFR2, DTMF or PULSE only

Select the Line 2 timeslot to receive the signal on.

• Use NEXT (F1) and PREVIUS (F2) to select the timeslot.• If you select AUTO, the test set will scan for the Line 2 receive

timeslot. You will also be presented with two additional choices;TRIGGER and SUPERVISION/ABCD.

TRIGGER (available if RX T/S set to AUTO)Options: CAS (F1), STATE (F2)

• Select CAS (F1) to have the test set start capturing after itdetects specific CAS bits.1. An ABCD line will appear in place of SUPERVISION. Use

the SHIFT and number keys to enter the bits you want thetest set to match.

2. When the test set sees the set ABCD bits, it will report themon the CALL ANALYSIS screen.

• Select STATE (F2) to have the test set begin capturinginformation after it sees the selected state.

5 66 .6.<.

+& +!&

!1$

%

Figure 64 Call Analysis, with Trigger

Ch. 3 Menus 99

SUPERVISION (STATE only)Options: IDLE (F1), SEIZE (F2), ACKW (F3), ANSW (more, (F2),CLR-BK (more, (F2), CLR-FW (more, (F2), BLOCK (more, F1)

Determine what signal trigger state must be met for the unit tostart capturing.

• IDLE looks for an idle signal.• SEIZE looks for a seizure.• ACKW looks for a backward seize acknowledgment.• ANSW looks for an answer signal.• CLR-BK looks for a Clear-Back signal.• CLR-FW looks for a Clear-Forward signal.• BLOCK looks for a Block signal.

When you have determined the settings, press ENTER. Observethe real-time analysis.

The following F-keys are available:

STOP/RESTART (F1): Press to stop the analysis, press again torestart.

ABSOLUT (F2): Shows timestamps in Absolute mode; the abso-lute time since start.

RELATIV (F3): Shows timestamps in Relative mode; the time rela-tive to the last change.

Figure 65 shows a DTMF analysis screen.

!0

+ +!2 &6<4 C-!0;C -,, 2: -$!, 2: B9$-" 2J2.-!! 2J2.!-!,2J2.,-!" 2J2."-!$ 2J2.$-!2J2.-!! 2J2.!

Figure 65 DTMF Call Analysis Sample

100 SunSet E20/c

Figure 66 shows a MFR2 CALL ANALYSIS screen.

!0

+ +! !2 &6!!<4 C-!;C -", 2: $-!, 2: B9$-$" 2J2.-!! 2J2.!-!, 2J2.,-!" 2J2."-!$ 2J2.$-!2J2.-!! 2J2.!

Figure 66 MFR2 Call Analysis Screen

The following F-keys are available on a stopped screen:

PAGE-UP (F1): Page up one page.

PAGE-DN (F2): Page down one page.

ANALYZE (F3): Analyzes the digits; see DIGIT ANALYSIS.

RESTART (more, F1): Restarts CALL ANALYSIS.

ABSOLUT (more, F2): Shows timestamps in Absolute mode; theabsolute time since start.

RELATIV (more, (F2): Shows timestamps in Relative mode; thetime relative to the last change. Toggle between the ABSOLUTand RELATIV modes to see the timestamp for each.

Notes:• When SS5 is selected (MFR1SS5), the SS5 tones will be

detected. The Label decode will be supplied automatically.• When MFR2 is selected, MFR2 tones will be detected, and the

choices will appear. Line 1 Rx is in the Forward direction, andLine 2 Rx is in the backward direction.

• To differentiate between CAS line signalling and PULSE digitsin the PULSE CALL ANALYSIS, PULSE will be displayedbefore a detected pulse digit sequence of IDLE/SEIZE.

Ch. 3 Menus 101

3.6.3.1 Digit Analysis

To access the Digit Analysis function, press STOP (F1) in theCALL ANALYSIS screen, then press ANALYZE (F3). The digitanalysis screen is presented, as in Figures 67 and 68.

• Digit Analysis will record the last 32 digits for analysis whenCALL ANALYSIS is stopped.

• If a TRIGGER is set (in CALL ANALYSIS), then up to 32 digitsfrom the stopping point back to the trigger points will be storedand analyzed.

!0

23 ))"6&:,#0&0 !6;0-&$-1%!-

)!!6&:,##&,, !6;,-0&"-%-,

)6&:00&$1! #,6;0-&$-#%!- !

Figure 67 DTMF Digit Analysis Screen

The following items are displayed in this screen:

H/L Hz: The high and low frequencies of the digit, in hz.

dBm : The dBm level of each tone.

INTD: Interdigit period–the time between digits.

PERD: Period–the dial period.

TWIST: Twist–the difference in power between the two frequencies.

102 SunSet E20/c

!0

23 )- = 1!"1!,1!"1"1!"1"$11!"0""1!"1"!,1#"0"

!

Figure 68 Pulse Digit Analysis

The Pulse Digit Analysis screen (Figure 68) definitions also in-clude:

PPS: Pulses per second

PPRD: Pulse Period

This screen also has additional F-keys:

LINE-1/2 (F3): Press to toggle between the lines.

RETURN (F4): Press to return to the CALL ANALYSIS screen.

Ch. 3 Menus 103

3.6.4 Call Emulator

This menu allows placing and receiving calls. Select one of the10 predefined sequences, or input a user defined sequence.

Notes:• To run the user call emulator, press START in the USER CALL

EMULATOR menu. If you escape from the menu to the CALLEMULATOR menu, then press the START key, you will berunning the Q.441 spec instead of the one you defined.

• When you edit your own sequence, no default Q.441 timervalue will be provided for PERD (periodic timer). You need toenter a value according to the Q.441 spec or any other desiredvalue to make the sequence work.

3.6.4.1 Standard Emulations

In this screen select a standard emulation to use.

$,!

-8-$$ ! !-8-$$ !-8-$)" $-8-$)""- ,-0- ! 1- !#- -

%

Figure 69 Call Emulator List


USER (F1): Press to enter the USER CALL EMULATOR screenwhere you may create, edit, or use a User emulation sequence.See the next section.

VIEW (F2): Press to enter a screen which shows a sample se-quence of the selected emulation. Figure 70 shows sample DTMFsequence screen. Note that for DTMF RECEIVE, you will emu-late the RECEIVE side only.

START (F4): Press to start the highlighted emulation. Refer toFigure 70.

104 SunSet E20/c

!,$$

I&I&I&KLI&IKI,KIK

Figure 70 DTMF Receive Sequence

Ch. 3 Menus 105

3.6.4.2 Place a Call

For CALL emulation, you will enter a screen where you setup andplace a call. Here is a sample screen:

$,!

8-$$ !

! $1,1

M

I&II!II$I"

Figure 71 Call Emulation/MFCR2 Call Screen

Use this procedure to setup the call:

1. CHANNEL: Choose the timeslot to place the call on. Selectfrom 1-15, 17-31; use the NEXT (F1) and PREVIUS (F2) keysto select the channel.

2. CALL NUMBER: Use the SHIFT and number keys to enter thedigits for the number you want to call. The A-F keys, corre-sponding to the digits, are also available.

For some emulation sequences the following items will also beavailable to configure:

3. CALLING NUMBER: This is the number you are dialing from.Use the SHIFT and number keys to enter the digits.

4. CALLING PARTY’S CATEGORY: The Calling Party Categorydeals with the category of the calling party as defined by Q.441(or user defined by the Signal Meanings) Forward Group II, i.e.the user can be a subscriber without priority II-1, subscriber withpriority II-2, etc.

• Use the SHIFT and number keys to enter the digits.

5. Press the CALL (F4) key when you are ready to place the call.You will enter the appropriate CALL screen. Here is a samplefigure:

106 SunSet E20/c

$,!

+) +)

2 &6 3; BF<4 C-,";C -# 2: -1,! 2: -#0"",-$,1,-""",-,,1,-0!#"",-1,1

Figure 72 Call Emulation/Sample Call

Here is the information on this screen:

Time/s : Time Stamp; the time the digits were sent and received.

Send : The CAS or Register signalling sent

Recv : The CAS or Register signalling received.

Label : The meaning of the sent or received CAS or Register sig-nalling, as defined by Supervision Setup or Signal Meanings.

The F-keys are available:

STOP/RESTART (F1): Stops and restarts the CALL or RECEIVE.

ABSOLUT (F2) : Displays Time stamp in absolute mode.

RELATIVE (F3) : Displays Time stamp relative to previous event.

HANG-UP (F4): Releases the call in progress.

Keypad FunctionalityWhen a MFCR2 or MFR2 call has been established, enable key-pad DTMF dialing by pressing the SHIFT key. DTMF tones willthen be sent when you press the 0-9 digits. This is especiallyuseful for verifying credit card functionality, or audio responsesystems.

Ch. 3 Menus 107

3.6.4.3 Receive a Call

For RECEIVE emulation, a screen where you set up to receive acall is displayed. Here is a sample screen:

$,!

8-$$ !

-'0 8 8

Figure 73 Receive Setup

Configure the following:

CHANNEL• Use the NEXT (F1) and PREVIUS (F2) keys to select from 1-

15, 17-31 for the receive channel.

No. DIGITS EXPECTED• Use the SHIFT and number keys to enter the number of digits

you expect the test set to see and capture. The range is from1-20 digits.

Some receive emulations will include the following items toconfigure:

REQUEST CALLER IDOptions; NO (F1), YES (F2)

• Select NO to not request the CALLER ID be sent to the test set.• Select YES to request the CALLER ID be sent to the test set.

When received, the CALLER ID will show up in the messages.Used between central offices for tracking and billing purposes.

108 SunSet E20/c

REQUEST CATEGORYOptions; NO (F1), YES (F2)

• Select NO to not request the REQUEST CATEGORY (such as2, Subscriber with Priority, or 6, Data Transmission) be sent tothe test set.

• Select YES to request the REQUEST CATEGORY be sent tothe test set. When received, the Category will show up in thereceive messages.

Press RECEIVE (F4) when you are ready to receive a call. Thetest set will display the RECEIVE screens, where you can seethe call trace. Here is a sample screen:

$,!

8-$$ ! +) +)

2 &6 3; BF<4 C-,$NNNN0-"#0;C 0-0$0 2: 0-0" 2: B

Figure 74 Receive Screen Sample

The information presented and F-keys available are the same asthat for the CALL screen in Section 3.6.4.2.

Ch. 3 Menus 109

3.6.4.4 User Emulation

Select this screen to create, edit, or use a user emulation se-quence. Follow this procedure:

1. In the CALL EMULATION screen, press USER (F1) and theUSER CALL EMULATOR screen is displayed. This screenfeatures a list of any stored user emulations and allowscreating a new sequence.

$$!

-!-!-$-"-,-0-1-#--

Figure 75 User Call Emulator Screen

The User Call Emulator Screen has the following F-keys:

EDIT (F1): Press to edit your sequence.

DELETE (F2): Press to delete the highlighted sequence.

RENAME (F3): Press to bring up the CALL EMULATOR PRO-FILES screen, where you may rename the selected sequence.Use the Label procedure further in this section.

START (F4): Press to start the selected emulator sequence.

2. Press EDIT (F1) and the Edit Emulator screen is displayed.The cursor will be on the first line; LABEL.

3. Press EDIT (F1) again to display the CALL EMULATORPROFILES screen, where you give your call sequence a label(name).

110 SunSet E20/c

01

78 %'&

Figure 76 Call Emulator Profiles

Follow this procedure to give the sequence a label:

A. Press TOGGLE (F3) to display the character screen.B. Use the keypad arrow keys to move the flashing cursor to

the desired character and press SELECT (F4).C. Continue steps A and B until you have completed the label.

When finished, press TOGGLE (F3) to escape from thecharacter screen.

• You may also use the SHIFT key and the alphanumericdigits available on the keypad for entering the label.

D. If you make a mistake while entering the letters, highlightthe character with your cursor, then press DELETE (F2).

F. When the label is complete, press ENTER to return to theEDIT EMULATOR screen (Figure 77).

"!1

- KL!KL !KL

Figure 77 Edit Emulator

Ch. 3 Menus 111

4. Use the keypad arrow keys to select CHANNEL.• Press NEXT (F1) and PREVIUS (F2) to select the timeslot to

use (both Rx and Tx) during emulation, in the 1-15, 17-31 range.

SEND SideThe Send side refers to the Line or Register signalling which willbe sent by the test set on whichever line has been selected asTx/INSERT in TEST CONFIGURATION. Three items are avail-able for sending:

TYPEOptions: NONE (F1), CAS (F2), DTMF (F3), MF-F (more, F1),MF-B (more, F2), DP (more, F3)

Determines the type of signalling used.

• NONE: No signalling• CAS: Channel Associated Signalling• DTMF: Dual Tone Multi-Frequency• MF-F: Multi-frequency-forward• MF-B: Multi-frequency-backward• DP: Dial Pulse

CODEOptions: any keypad alphanumeric digits; four digits maximumfor CAS. 20 digits maximum for all other types.

These are the actual bits to be transmitted by the test set.

• Press the SHIFT key and enter the desired signalling bits

PERDOptions: up to 999 ms

PERD determines the elapsed time before proceeding to the nextstep in the emulation.

RECEIVE SideThe receive side refers to the Line or Register signalling which yourequire to be received by the test set, before progressing to thenext step. Three items are available for the receive side. Note thatTYPE and CODE work in the same manner as in the send side.

TOUTOptions: NONE (F1), up to 999 ms

TOUT refers to Time Out. This determines the length of time whichthe test set will wait for its received digits/CAS before abortingthe signalling sequence.

112 SunSet E20/c

To select a time limit:

A. Press SHIFT and enter the desired number digits up to 999(ms). Press SHIFT when done.

B. Press ENTER to exit the editor screen and save thesettings.

5. To begin an emulation sequence, select the sequence youwant to use in the USER CALL EMULATOR Screen and pressSTART (F4). The screen shown in Figure 78 is displayed.

6. Observe the time digits are sent or received, and their label.

,10

+) +)2 &6 3; BF<4 C-,-,, BF9-,#$-0# BF9$-0#""0-0#,"-0#,"-0,,,-0#,!

Figure 78 Start User Emulation

The Start User Emulation screen contains the following F-keys:

STOP/RESTART (F1): Stops and restarts the CALL or RECEIVE.

ABSOLUT/RELATIV (F2): Presents time stamps in absolute orrelative mode (view at Time/s line).

Ch. 3 Menus 113

3.6.5 Supervision Setup

In this screen define the IDLE, SEIZE, ACKNOWLEDGMENT,CLEAR BACKWARD and CLEAR FORWARD VF Supervision bitsmanually, or use the ITU Q.422 standard. These definitions areused in the CALL ANALYSIS screen.

#"!

8-$!!

(*(* & % % %! & 5 66 .6<F 8-$!! !

Figure 79 Supervision Setup Screen

NameOptions: Q.422 (F1), USER1 (F2), USER2 (F3), USER3 (F4)

Select standard ITU Q.422 or User-defined signalling.

• Select Q.422, and the test set will use the ITU Q.422 standardsignal definitions. You may view them on the screen.

• Press ENTER to invoke the settings.• Select a USER option, and enter the supervision bits manually.1. Use the SHIFT and number keys to make each entry.2. Use the keypad arrow keys to move between line items.3. When the entries are complete, press ENTER. The settings will

be saved as well as invoked.

The supervision definitions:

DIR: Direction; Forward or Backward

ABCD (F) : Forward ABCD signalling bits

ABCD (B) : Backward ABCD signalling bits

IDLE F/B : Idle Forward or Backward bits:• In the idle state the outgoing end (forward) sends af=1, bf=0.

The incoming end (backward) replies with af=1, bf=0, if idle.• These four supervision bits will be placed on the CAS bits for

the timeslot being transmitted when IDLE (F1) is selected in theCALL ANALYSIS screen.

114 SunSet E20/c

SEIZE F: Forward seizure signal transmitted at the beginning of acall to initiate circuit operation.

SEIZE ACK B : Backward acknowledgment of a seizure signal.

ANSWER B : The answered state must be established on the pre-ceding link immediately after it is recognized.

CLEAR BACK B : Clear Back is an idle condition from the calledsubscriber’s line telling the incoming switch to release the call.

CLEAR FORW1F/CLEAR FORW2F : Clear Forward sends acleared condition from the calling subscriber’s line, or it is therelease from the calling switching equipment. Note that there aretwo conditions.

BLOCK F/B : Block an idle circuit from outgoing and incomingcalls.

Ch. 3 Menus 115

3.6.6 Dial Parameters

Use the DIAL PARAMETERS screen to setup the parametersused for VF dialing. Refer to Figure 80.

""#"#

"6 !6 "6";(556*= ,

Figure 80 Dial Parameters

DIAL PERIODOptions: 1 ms to 999 ms

Specify the dial period in milliseconds used for DTMF and MFdialing. The default value is 100 ms.

• Press SHIFT and enter the desired value from the keypad.

SILENT PERIODOptions: 1 ms to 999 ms

Specify the silent period in milliseconds used for MFR2, DTMFand MF dialing. The default value is 100 ms.


INTERDIGIT PRDOptions: 1 ms to 999 ms

Select the interdigit period for pulse dialing.


TONE LEVEL dbmOptions: -20 to -5 dbm

Select the tone level.

• Press MINUS (F1) to attain a negative value, then use theSHIFT and numeric keys to enter the value.

116 SunSet E20/c

B-BITOptions: YES (F1), NO (F2)

B-Bit dialing applies to pulse calls. When B-bit dialing is enabledand a call is placed, the B supervision bit of the selected timeslottoggles between 0 and 1.

• Before calling, change the transmit CAS bits to the seizurecondition. When dialing, the test set will pulse the B-bitaccording to the timing selected in %BREAK and INTERDIGITperiod. When the dialing is complete, the test set remains in theseizure condition.

PULSE (10pps)Dial pulse is permanently set to 10 pps and cannot be changed.

% BREAKOptions: 40% (F1), 50% (F2), 60% (F3)

Select the desired BREAK percentage.

• Percent break is the ratio of the break (IDLE) interval to the totalpulse cycle interval. It is used in Pulse dialing.

Ch. 3 Menus 117

3.6.7 Signal Meanings

Use the ITU-T Q.441 (F1) standard signal definitions for Groups I,II, A and B or set your own under one of the three USER (F2, F3,F4) labels. Upon press a USER F-key a setup screen is displayed,where you can make selections.

To set a signal, choose the F-key corresponding to your choice,from Digit 1-Digit 9, and Code 10-Code 15, or to the appropriatelabel definitions; for example, on the Group II Forward screen,SubWOP corresponds to the Group II Forward labels item Sub-scriber without Priority.

As different countries may have slight differences in their defini-tions and/or use of digits, this feature allows you to define yourown digits.

" <6

G5O<;8-$$G5O<;8-$$G5<B9O<;8-$$G5<B9O<;8-$$

8-$$ !

Figure 81 Signal Meanings Screen

The following tables and screens present the screens and theircorresponding Label tables.

118 SunSet E20/c

%

2J2.2J2.!2J2.!; 2J2.!; !$2J2.$; "2J2."$; $,2J2.,"; "02J2.012J2.1#2J2.#

"

2J2. 2J2.! 2J2.

Figure 82 Group 1 Forward Signals

I-1 Digit 1 I-9 Digit 9 I-2 Digit 2 I-10 Digit 0 I-3 Digit 3 I-11 Code 11 I-4 Digit 4 I-12 Code 12 I-5 Digit 5 I-13 Code 13 I-6 Digit 6 I-14 Code 14 I-7 Digit 7 I-15 Code 15 I-8 Digit 8

Table 4 Group 1 Forward Labels

Ch. 3 Menus 119

%

G4%5OP.P!G4%5< <23. >!5< $5< 5< "5 <.$5< ,<.<+"5< 0G4OP.1<.<+#G4O5

",,

G4% G4% <23. >

Figure 83 Group II Forward Screen

Signal Label Meaning II-1 Sub w/o p Subscriber without priority II-2 Sub w pri Subscriber with priority II-3 Maint Eqp Maintenance equipment II-4 Spare Spare II-5 Operator Operator II-6 Data Tran Data Transmission

II-7 Sub woft Subscriber (or operator without forward transfer facility)

II-8 Data Tran Data Transmission II-9 Sub w pri Subscriber with priority

II-10 Opr wftf Operator with forward transfer facility II-11 Spare Spare II-12 Spare Spare II-13 Spare Spare II-14 Spare Spare II-15 Spare Spare

Table 5 Group II Forward Labels

120 SunSet E20/c

%

3/5< !3BB2;B5!C<3$3<.3B"B5B$ 823P,;B5"23.03!13#5<

!#

3/ 3 ;B5

Figure 84 Group A Backward Signals Screen

Signal Label Meaning A-1 Send (n+1) Send next digit (n+1) A-2 Send (n-1) Send last but one digit (n-1)

A-3 Adr cmp B Address-complete, changeover to reception of Group B signals

A-4 Cong Nat Congestion in the national network A-5 Send CPG Send calling party’s category

A-6 Adr cmp S Address-complete, charge, set-up speech conditions

A-7 Send (n-2) Send last but two digits (n-2) A-8 Send (n-3) Send last but three digits (n-3) A-9 Spare Spare

A-10 Spare Spare A-11 Send CCI Send country code indicator A-12 Send LoDD Send language or discriminating digit A-13 Send NOC Send nature of circuit

A-14 Req. info Request for information on use of an echo suppressor

A-15 Cong Int Congestion in an international exchange or at its output

Table 6 Group A Backward Signal Labels

Ch. 3 Menus 121

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Figure 85 Group B Backwards Signals Screen

Signal Label Meaning B-1 Spare Spare B-2 Send SIT Send special information tone B-3 Sub LB Subscriber line busy B-4 Congestion Congestion B-5 Unalloc# Unallocated number B-6 Sub LFC Subscriber line free, charge B-7 Sub LFNC Subscriber line free, no charge B-8 Sub LOOO Subscriber line out of order B-9 Spare Spare

B-10 Spare Spare B-11 Spare Spare B-12 Spare Spare B-13 Spare Spare B-14 Spare Spare B-15 Spare Spare

Table 7 Group B Backward Labels

122 SunSet E20/c

3.6.8 View/Print Trace Results

• Access stored records.• View, print, or delete previously stored records.• You must have a memory card in order to have saved traces

(as indicated by ‘CARD’ beneath the record number).• Records are stored via a F-key in most VF screens.

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Figure 86 View Test Records

As shown in Figure 86, the first record is saved the test set’sinternal NV RAM memory, indicated by the ‘E20’ marker. The restof the records are stored in the memory card; indicated by the‘CARD’ marker. Current results are stored in the 001 position.

View Test Records has the following F-keys.

EDIT (F1): Press to give the selected record a new name. TheLABEL screen, described in the Edit a Trace Record is displayed.

PAGE-UP (F2), PAGE-DN (F3): Use to scroll through availablescreens.

VIEW (MORE, F1): Press to view the selected record.

LOCK (MORE, F2): Press to lock the selected record.

UNLOCK (MORE, F3): Press to unlock the selected record.

CLR (MORE, F2): Press to delete the selected record.

CLR-ALL (MORE, F3): Press to delete all records.

Ch. 3 Menus 123

Viewing a Trace1. Select the desired record from VIEW TEST RECORDS and

press VIEW (MORE, F1).

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Figure 87 View a Trace

In this screen the following F-keys are available:

PRINT (F1): Press to send the record to the serial port.

PAGE-UP (F2)/PAGE-DN (F3): Use to scroll through availablescreens.

SAVE (F4): Use to save a trace from the number 1 (stored in NVram) position to a position on the SRAM memory card.

Printing a Trace1. Follow step 1 of Viewing a Trace2. Press PRINT (F1)

124 SunSet E20/c

Edit a Trace Record

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Figure 88 Toggle Screen

Here you can give a label to the trace you want to save. Use thisprocedure:

1. Press TOGGLE (F3). The ‘A’ in the character grid will behighlighted, and SELECT (F4) will appear.

2. Use the keypad arrow keys to select a character, pressSELECT (F4) to enter the character into the LABEL line. Repeatuntil the label is complete.

3. When done, press TOGGLE (F3) to exit the character grid andthen press ENTER. The selected traces will be saved under thelabel you have entered. The label will appear in the VIEW TESTRECORD VF list.

Note : If no space is available to save the message, you will seea “Delete a Trace to Save”’ message. You must then delete a storedtrace in order to save a new one.

Ch. 3 Menus 125

3.7 Other FeaturesRefer to Figure 89 for the OTHER FEATURES Menu.

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Figure 89 Other Features Menu

126 SunSet E20/c

3.7.1 Error Injection

Figure 90 shows the ERROR INJECTION screen.If you have test set with a color display, selectERROR INJECTION from the Alarm/Error screento access this feature.

7

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Figure 90 Error Injection Screen

To start error injection, press the ERR INJ key. The test set willinsert errors as you specify. If the error injection is set to RATEmode, an ‘ERR-INJ’ indicator will be displayed on the screen.

TYPEOptions: CODE (F1), BIT (F2), BIT + CODE (F3), CRC-4 (MORE,F2), FRAME (MORE, F2), E-BIT (MORE, F3)

This item specifies the type of errors to be inserted.

MODEOptions: BURST (F1), RATE (F2)

This item specifies the mode of error injection.

• RATE mode applies only to CODE and BIT errors. Errors areinjected at a constant rate.

• Other types of errors may be inserted one at a time underBURST mode, which injects a set number of errors.

Ch. 3 Menus 127

COUNTOptions: 1 to 9999 or 1e-9 to 2e-3

For BURST MODE, choose the COUNT of errors to be inserted.For RATE MODE, choose the error RATE number and exponent

• For BURST, press SHIFT, then use the keypad to enter anynumber between 1 and 9999. The errors will be inserted inapproximately 1 second or less, and will cause from 1 to 3errored seconds.

• Applies only to BIT and CODE errors. All other errors will beinjected singly.

• For RATE, the errors will be inserted at a continuous rate asspecified in this entry, and a ‘ERR-INJ’ display will appear at thetop of the screen.

Programming a Burst of 10 Errors1. Select ERROR INJECTION.2. Press CODE (F1) to select the error type.3. The cursor automatically moves to MODE. Press BURST (F1).4. The cursor automatically moves to COUNT. Press SHIFT to

display the ‘SHIFT’ indicator.5. Enter 10 using the keypad. COUNT should show 10.6. Press the SHIFT key to turn off the ‘SHIFT’ indicator.7. Press ENTER; you have just programmed the test set to inject

10 CODE errors each time you press the ERR INJ key.

Programming a 10 -6 Bit Error Rate1. Select ERROR INJECTION.2. Press BIT (F2) to select the error type.3. The cursor automatically moves to MODE. Press RATE (F2).4. The cursor automatically moves to COUNT. Press SHIFT5. Press 1 on the keypad. The multiplier position shows 1. The

cursor moves to the exponent position.6. Press 6 on the keypad.7. Press SHIFT key to remove the ‘SHIFT’ indicator.8. Press ENTER. You have just programmed the test set to inject

Bit errors at 1x10-6 rate each time the ERR INJ key is pressed.• To turn off the error rate injection, press ERR INJ once, then

verify that the ‘ERR INJ’ indicator has turned off.

128 SunSet E20/c

3.7.2 Alarm Generation

For the SunSet E20c, select ALARM GENERA-TION from the Alarm/Error screen to access thisfeature. Figure 91 depicts the ALARM GENERA-TION screen.

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Figure 91 Alarm Generation Screen

In this screen you can view a listing of the alarms you may trans-mit. These alarms allow you to test the response of various net-work equipment to alarms, and thus ensure that the network isperforming as expected.

To Invoke an Alarm:Select the desired alarm and press ENABLE (F1).

• Some alarms conflict with the transmission of other alarms orselected framing.

• The test set will transmit the enabled alarm after exiting theALARM GENERATION screen.

• You can continue to transmit alarms while making measure-ments, viewing data, performing talk/listen, etc.

• If you do not intend to transmit alarms when you exit thisscreen, be sure to DISABLE (F2) all the alarms first.

Ch. 3 Menus 129

Notes on the Alarms:FAS DISTANT• The test set transmits a 1 in every third bit of each timeslot 0

frame that does not contain frame alignment signal.• FAS DISTANT alarm may be transmitted only with PCM-30 or

PCM-31 framing.

MFAS DISTANT• The test set transmits a 1 in the sixth bit of each time slot 16

in the zero frame.• The MFAS distant alarm may be transmitted only with PCM

framing.

AIS• The test set transmits all ones in an unframed signal.• This alarm overrides the framing choice in the TEST CON-

FIGURATION menu. For instance, even though you haveselected MFAS framing, generating an AIS alarm will cause thetest set to transmit an unframed signal (all ones).

T/S-16 AIS• The test set transmits all ones in timeslot 16 of all frames.• T/S-16 AIS overwrites the MFAS, MultiFrame Alignment Signal.• A test set or network equipment that receives this alarm will

lose PCM-30 framing.• This alarm should be transmitted only when the test set is

configured for FAS framing.• Voice frequency signalling bits can’t be transmitted while

sending this alarm, because the T/S-16 AIS signal overwritesall the channel associated signalling (CAS) information.

130 SunSet E20/c

3.7.3 View Results Records

A total of ten Measurement Results with histo-grams may be stored in this menu, in addition tothe current results (record 01; stored in the testset’s memory). Figure 92 depicts the VIEW TESTRECORD screen. Records are stored by settingPRINT RESULT to LAST and PRINT EVENT to ENABLE in theSYSTEM PARAMETERS > MEAS CONFIGURATION screen.

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Figure 92 View Test Record

The Measurement Results numbers are shown in accordance withthe events and results that are in memory. Events are errors andalarms.

1. Select the Measurement Result record you want to view.2. Press VIEW (F1).

In addition to PAGE-UP (F2) and PAGE-DN (F3), the following F-keys are available:

EDIT (F1): Allows you to label the selected record. The followingscreen is displayed:

Ch. 3 Menus 131

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Figure 93 Memory Record Label

• Press TOGGLE (F3). The first letter in the character grid will behighlighted.

• Select each letter you want to use with the keypad arrow keys,and press ENTER. Repeat until the label is finished.

• Use INSERT (F1) and DELETE (F2) if you need to correct anerror.

• Press ENTER to return to the VIEW RESULTS RECORDSscreen.

VIEW (more, F1): Press to view the selected record. The RE-SULTS screen will be displayed. Press ESC to return to the VIEWTEST RECORD screen.

LOCK (more, F2)/UNLOCK (more, F3): Press to lock the record,so it can not be deleted. Press UNLOCK to delete the record.

DELETE (more, F1): Press to delete the selected record. If 10records are already stored, you will need to delete a record beforestoring a new one.

CLR-ALL (more, F2): Press to delete all of the records, exceptthe current record.

PRINT (more, F3) : Press to send the record to the serial port.

132 SunSet E20/c

3.7.4 Send Frame Words

• Manually specify the E and Sa bit states, andthe MFAS ABCD.

• Transmit the desired FAS and MFAS framinginformation.

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Figure 94 Send Frame Words

• You may not change certain items in this screen.• You can only select items that can be changed.• Use the left/right arrow keys to move the cursor to the desired

location. Reenter the left-hand side of the screen by pressingthe left arrow key.

• DEFAULT will set the bits to the factory default settings.• AUTO is only displayed for E-bit selections.• The bits will be sent as soon as the function key is pressed.

The following information is shown on this screen:

CRCView the CRC option chosen in the TEST CONFIGURATIONscreen. This line is for viewing only.

• Change the CRC option in the TEST CONFIGURATION screen.

E-BITOptions: SET=0 (F1), SET=1 (F2), DEFAULT (F3), AUTO (F4)

Ch. 3 Menus 133

• E-bit may be changed only if CRC is activated in the TESTCONFIGURATION screen, and consequently, YES is dis-played in the CRC slot in this screen.

• If E-bit is set to AUTO, the E-bits will be transmitted on the Tx/INSERT side anytime a CRC error is received on the Tx/INSERT side Rx (Figure 95).

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7 8

9

A B C D

E * 1 2 3

F # 4 5 6

F1 F2 F3 F4

PRINT GRAPH ERR INJ

LEDMEAS

SHIFT ESC ENTER

POWER

1

2

SIGNAL

CODE ERR

PCM-31

ERROR

SIGNAL

PCM-30

CRC DET

PCM-31

PAT SYNC

BIT ERROR

POWER

BATTERY

AIS

ALARM

USER1

USER2

RTS

CTSRxDTE

RxDCE

ERROR

PCM-30

CRC DET

AIS

ALARM

CODE ERR

" $

L1-Rx

L1-Tx

1 CRC Error

1 E-bit Error

E20 TEST CONFIGURATIONTx/INSERT: L1-TxRx/DROP: L1-Rx or L2-RxE-bit: AA

Figure 95 Automatic E-Bit Transmission

To Manually Transmit the E-bits:Use the SET=0 (F1) and SET=1 (F2) keys to enter the two bits.

• 11 is used for no E-bit errors, this is the default setting.• 10 or 01 for 500 E-bit errors per second.• 00 for 1000 E-bit errors per second.

FAS WORDFAS WORD displays the FAS (Frame Alignment Signal-0011011)Words. This line is for viewing only.

MFAS WORDSet bits 5-8 to any combination.

• Bits 5-8 have the pattern xyxx, where x represents spare bits;they should be set to 1 when not used.

• Y is used for the MFAS remote alarm; it should be set to 1 ifMFAS synchronization is lost.

MFAS ABCDThese are the default ABCD bits used for channels 1-30 in PCM-

134 SunSet E20/c

30 Framing.

• ABCD bits are transmitted in timeslot 16 of frames 2-16 of theMFAS.

• Avoid using 0000 which will cause false framing for PCM-30.

NFAS WORDSThese are the Non Frame Alignment Signal words. See Chapter 6for the definitions.

Press ENTER to send your selections.

Ch. 3 Menus 135

3.8 System ParametersFigure 96 shows the SYSTEM PARAMETERSmenu.

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Figure 96 System Parameters Menu

3.8.1 Version/Option

Figure 97 shows the software version, type, serial number, andoptions installed in a test set. Use PAGE-UP (F1) and PAGE-DN(F2) as necessary.

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Figure 97 Version/ Option Screen

136 SunSet E20/c

3.8.2 System Profiles

You may save up to 10 System Profiles in the test set. Theseprofiles can save time in configuring the test set for an applica-tion. The test set can store the current configuration as a systemprofile. You provide a name for the profile so that it may be conve-niently recalled at a later time.

Items that are stored in the profile are: TEST CONFIGURATION,TEST PATTERN, ERROR INJECTION, ALARM GENERATION,GENERAL CONFIG (except for date and time), SUPERVISIONSETUP, SIGNAL MEANINGS, DIAL PARAMETERS, and MEASCONFIGURATION. Refer to Figure 98.

Note: The SYSTEM PROFILES menu does not operate like theuser pattern menus. You may not edit an existing system profile inthe SYSTEM PROFILES menu. If you wish to modify an existingprofile, use the modification procedure described in this section.

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Figure 98 System Profiles List

Enter a New System Profile1. From the main menu, select SYSTEM PARAMETERS >

SYSTEM PROFILES and select a blank line.2. Press STORE (F1) and the LABEL screen (Figure 99) is

displayed.3. Type in the LABEL you wish to give the profile. Do this by

pressing TOGGLE (F3) to enter the character grid.A. Select the desired letter with the keypad arrow keys and

press SELECT (F4). Repeat until the label is completed.B. Press TOGGLE (F3) to exit the character grid.

4. Press ENTER to store the SYSTEM PROFILE.

Ch. 3 Menus 137

!

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Figure 99 System Profiles Label Screen

Invoke a Stored System Profile1. Select SYSTEM PROFILES and select the desired profile.2. Press LOAD (F3).

Activate the Default ProfileThis returns the test set to the factory default settings.

1. Select SYSTEM PROFILES and press DEFAULT (F3)2. Press ENTER and the test set reverts to the default settings.

Delete a Profile1. Select SYSTEM PROFILES and select the desired profile.2. Press DELETE (F1).• Press CLEAR-ALL (F2) to delete all stored profiles.

Modify an Existing Profile1. Select SYSTEM PROFILES and select the desired profile2. Press LOAD (F3) to invoke the profile.3. Move to the other menus within the test set where you will

change the setup items.4. Select SYSTEM PROFILES and press STORE (F2).5. Give the profile a new name. If you want, you can give this

modified profile the same name as the original, but pay closeattention to which file number it is stored under so that you willbe able to tell which profile is old, which is new.

6. Press ENTER to return to SYSTEM PROFILES and select theold version of the profile which you no longer need.

7. Press DELETE (F1) to delete the old profile.8. Select the new profile and press LOAD (F3) to finish.

138 SunSet E20/c

3.8.3 MEAS Configuration

There are two Measurement Configuration screens that you mayadjust. Refer to Figures 100 and 101.

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Figure 100 Measurement Configuration Screen

MEAS DURATIONOptions: TIMED (F1), CONTINU (F2)

Set the Measurement Duration.

• A timed measurement will stop when the specified amount oftime has elapsed. This is useful for making measurements ofa specified length. When a timed test is in progress, theRemaining Time (RT) counter shows how much time is leftbefore the end of the test.

• If you select TIMED, press SHIFT to display the ‘SHIFT’indicator. Then enter a number between 1 min to 999 hr usingthe keypad.

• A continuous test will run indefinitely until you press theRESTART key, or until you change some other setting on thetest set that restarts the test.

STARTOptions: PROGRAM (F1), MANUAL (F2)

Select the method to begin your test measurements.

• PROGRAM: This allows you to program a specified time in thefuture to begin taking measurements. Once you have selectedPROGRAM, you must enter the desired time in the next twoitems.

• MANUAL: In this mode you must manually begin the testmeasurements at the desired time.

Ch. 3 Menus 139

PROG DATE YMDApplies if you have selected PROGRAM for START above.

• Enter the Year, Month, and Day to begin measurements, usingthe SHIFT and keypad number keys.

PROG TIME HMSApplies if you have selected PROGRAM for START

• Specify the Hour, Minute, and Seconds to begin measure-ments, using the SHIFT and keypad numeric keys.

CODE CONFIGUROptions: HDB3 (F1), AMI (F2)

Select the line coding. HDB3 line coding is used almost every-where throughout the world in 2.048M transmission. An explana-tion of the related technology is located in Chapter 5.

MEASURE MODEOptions: BER (F1), LIVE (F2), AUTO (F3)

• BER: Use to search for the test pattern, and make bit errormeasurements with all other measurements.

• LIVE: Use to ignore the test pattern and make all measure-ments, except for bit error measurement.

• AUTO: The test set will try to detect the data pattern as in BERmode, then if the data pattern cannot be detected, the test setwill turn to LIVE mode.

Notes:• Most technicians leave the test set in BER mode, even when

they are monitoring live, in-service circuits. In this case, theyexpect the PAT SYNC light to remain RED, because there isno pattern synchronization. The bit error measurements willalso show 100% UAS.

• If the LIVE mode is selected, the PAT SYNC LED is turnedOFF and the bit error measurement screen is not displayed inMEASUREMENT RESULTS.

BLOCK SIZEOptions: 1000 (F1), 2e15-1 (F2), 2e11-1 (F3), 2e9-1 (MORE, F1),2e6-1 (MORE, F2)

Determines the block size used in the Block Error Ratio measure-ment. One block is typically 1000 bits long.

• BLER (Block Error Ratio) is the fraction of blocks in error (thenumber of blocks received with one or more bit errors dividedby the total number of blocks transmitted).

140 SunSet E20/c

PRINT RESULTOptions: TIMED (F1), LAST (F2)

• TIMED: Use to have the test results printed every 1 to 999hours and 99 minutes. Press the SHIFT key, then enter thenumber of hours and minutes.

• LAST: The test results are printed only at the end of a timedtest, or a continuous test that has ended due to a RESTART.

PRINT EVENTOptions: ENABLE (F1), DISABLE (F2)

• ENABLE: Use to print out a time and date-stamped errormessage every second that one or more errors occur.

• DISABLE: Use if you do not want to print out a result each time.

Select the second Measurement Configuration screen by press-ing the keypad down arrow key . This configuration screen relatesto ITU standards for 2.048 Mbit/s transmission, G.821, G.826, andM.2100.

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Figure 101 MEAS Configuration, Screen 2

The first three items relate to ITU standards on measurementsand performance characteristics for 2.048 Mbit/s.

G.821Options: ON (F1), OFF (F2)

When the G.821 Measurement is ON, the LINE 1 BIT ERRORscreen is shown in Measurement Results. This Bit Error screenpresents the measurement parameters specified in ITU G.821.

DGRMOptions: ON (F1), OFF (F2)

When the Degraded Minutes measurement is ON, DGRM is shownin MEASUREMENT RESULTS, G.821.

Ch. 3 Menus 141

G.826Options: ON (F1), OFF (F2)

When the G.826 Measurement is ON, the G.826 screen is dis-played in MEASUREMENT RESULTS. This G.826 screen pre-sents the measurement parameters defined in G.826.

M.2100Options: ON (F1), OFF (F2)

When the M.2100 is ON, the M.2100 screen is shown in MEA-SUREMENT RESULTS. This section refers to ITU specificationsused when a 2.048 Mbit/s circuit passes through internationalboundaries. It allocates a certain allowable error rate to each na-tion that carries the circuit. The technician needs to enter theappropriate percentage allowed for the line. The test set makesthe M.2100/550 calculations and reports pass/fail in MEASURE-MENT RESULTS, M.2100/550.

The next two settings refer to the M.2100/550 measurements:

MEAS PERIODOptions: 01-99 min.

This setting controls how often a new result is displayed in MEA-SUREMENT RESULTS, LINE 1(2)–M.2100/550.

• Use the SHIFT key and the numeric keys to set the period.

HRP MODEL %Options: .1 to 99.9 %

Refer to M.2100, or to the older M.550, for information on how toselect the Hypothetical Reference Performance model percent(HRP %).

IDLE CHNL CODEOptions: Any 8-bit pattern

Program the idle code to be any 8-bit pattern.

• This code is used during VF channel access operations, whenthe TxSource is set to the TESTPAT mode.

• The idle code is also used in fractional E1 testing to fill up theunused channels.

IDLE CHNL A/B/C/DOptions: Any 4-bit pattern

Program the idle channel signalling bits of channels 1-30 in theMFAS framing mode.

• These signalling bits are found in time slot 16 of frames 1-15.• The factory default, 1101, is set in accordance with ITU G.704.

142 SunSet E20/c

3.8.4 General Configuration

• Set the correct time and date.• Set the backlight duration.• Set printing options.

!!

(*!!(*!!$ #, & 1 & /

Figure 102 General Configuration Screen

The following items are available for configuration:

DATE (Y- M - D)Set the current date by using SHIFT and the numeric keypad. Thetest set inserts the hyphens for you. Numbers that are out ofrange will be rejected.

TIME (H :M :S)Set the time by using SHIFT and the numeric keypad. The testset inserts the colons for you. Numbers that are out of range willbe rejected.

BACK LIGHTOptions: TIMED (F1), CONTINU (F2)

This timer controls how long the backlight will stay on when youpress the Light key.

• CONTINU: The backlight will stay on continuously until youpress the Light key. CONTINU is the default setting.

• TIMED: The backlight will automatically turn off after theindicated number of minutes. Set the timer using SHIFT and thenumeric keypad. Setting range is 1-99 minutes.

PRINTERThe next six items are for setting up the serial port for printing orremote control. For more information on these features refer toChapter 2, Section 2.3.3.2.

Ch. 3 Menus 143

BAUD RATEOptions: 1200 (F1), 2400 (F2), 9600 (F3), 19200 (MORE, F1),38500 (MORE, F2)

The Baud rate determines the number of shortest signalling ele-ments per second on a transmission medium. The default settingis 9600; this setting is recommended for remote control opera-tions. 1200 and 2400 will not support remote control features.

PARITYOptions: NONE (F1), EVEN (F2), ODD (F3)

An extra bit, known as a parity bit, is added to the data as an accuracycheck. The receiving element checks the parity bit, and indicates anerror if the total number of ones does not add up to the correct total.

• ODD: The total number of ones (including the added parity bit)is odd.

• EVEN: The total number of ones (including the added parity bit)is even.

• NONE: This is the default setting, signifies no parity checking.

STOP BITOptions: 1-BIT (F1), 2-BIT (F2)

In asynchronous transmission, the stop bit is the last transmittedcharacter which permits the receiver to come into an idle conditionbefore accepting another character. The default setting is 1-BIT.

BITS/CHAROptions: 7-BIT (F1), 8-BIT (F2)

BITS/CHAR determines the number of bits per character, select one.

CR/LF INSRTOptions: CR (F1), CR+LF (F2)

CR: Selects carriage return.

CR+LF: Selects carriage return and line feed.

• In carriage return and line feed, an extra line space is insertedafter every line.

PRINT FORMATOptions: PRINTER (F1), PC (F2)

• PRINTER: This sends the results to a printer. The test set willsend control digits before printing, to configure the printer.

• PC: This sends results to a PC. The test set will not send thecontrol digits, which allows results to be transferred to a PCprogram, such as HyperterminalTM.

144 SunSet E20/c

3.8.5 Erase NV Ram

ERASE NV (Non Volatile) RAM erases all user-stored information.This operation should always be performed when inserting a newsoftware cartridge. Try this if the test set is not performing prop-erly. If this is the case, initiate Erase NV RAM only after attempt-ing to correct the problem by:

1. Making sure that the test set is properly configured for theapplication being attempted.

2. Cycle the test set off and on.3. Perform a self test and cycling the test set off and on.

Use the following procedure to perform ERASE NV RAM:

Caution! Performing NV RAM ERASE will erase all the user-storedinformation. All user transmit patterns, telephone numbers, andsystem profiles will be erased.

1. From the main menu, select SYSTEM PARAMETERS (Sys-tem icon-color test set) > ERASE NV RAM.

2. Press ENTER after the warning message is displayed. AWORKING message will be displayed.

3. When the test set is finished with the operation, turn the test setoff for 5 seconds, then turn the it back on.

4. Re-configure the test set for the operations you need toperform.

3.8.6 Self Test

This performs a hardware test. If an error message is shown afterthe test is completed, contact Sunrise Telecom Customer Ser-vice at 1-408-363-8000 or 1-408-363-8313 (fax) for assistance. Torun the self test:

1. Select SYSTEM PARAMETERS > SELF TEST and pressENTER. Follow the on-screen instructions.

3.8.7 Factory Defaults

This resets all settings to the factory default settings. Upon press-ing ENTER at FACTORY DEFAULTS, the test set resets. There isno Factory Defaults screen, and this process does not include asecond step. Therefore, do not press ENTER on the Factory De-fault selection, unless you want all the settings to return to thedefault settings.

Ch. 3 Menus 145

3.9 Language SelectionSelect the test set’s display language.

-

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Figure 103 Language Selection Screen

Press the corresponding F-key to select a language: English (F1),French (F2), Italian (F3) or Spanish (F4)

• All menu choices and settings will be shown in the languageselected.

146 SunSet E20/c

Ch. 4 Applications 147

Chapter 4 Applications

4.1 Connecting the CordsCaution!• Plugging into a live E1 circuit may cause a loss of service for

multiple customers. Be sure you are properly trained beforeproceeding.

• For BRIDGE access, do not plug into the circuit until you havepre-selected the L1/2-Rx Port = BRIDGE level. The SunSetE20 will not place isolation resistors on the line unless this RxPort is specified.

The next three figures show various ways in which to connect thetest set to the circuit.

MON

Tx

Rx

EQUIPMENT


L1-TX75 120 L1-RX75 120

SUNRISE

SU

NR

ISE

SU

NR

ISE

SUNRISE

Figure 104 Plugging in-TERM Mode

148 SunSet E20/c

SU

NR

ISE

SU

NR

ISE

7 8

9

A B C D

E * 1 2 3

F # 4 5 6

F1 F2 F3 F4

PRINT GRAPH ERR INJ

LEDMEAS

SHIFT ESC ENTER

POWER

1

2

SIGNAL

CODE ERR

PCM-31

ERROR

SIGNAL

PCM-30

CRC DET

PCM-31

PAT SYNC

BIT ERROR

POWER

BATTERY

AIS

ALARM

USER1

USER2

RTS

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RxDCE

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ALARM

CODE ERR

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EQUIPMENT

MON

Tx

Rx

EQUIPMENT

MON

Tx

Rx

SU

NR

ISES

UN

RIS

E

Figure 105 Plugging in-Monitor Mode

EQUIPMENT EQUIPMENT

Tx

Rx

Tx

Rx

CROSS CONNECTJACKS

SUN

RIS

E

5-Line 2 TX

8

SUN

RISE

4

1-Line 1 TX

7

SUN

RISE

6-Line 2 RX

3

SUN

RIS

E

SU

NR

ISE

SU

NR

ISE

SU

NR

ISE

7 8

9

A B C D

E * 1 2 3

F # 4 5 6

F1 F2 F3 F4

PRINT GRAPH ERR INJ

LEDMEAS

SHIFT ESC ENTER

POWER

1

2

SIGNAL

CODE ERR

PCM-31

ERROR

SIGNAL

PCM-30

CRC DET

PCM-31

PAT SYNC

BIT ERROR

POWER

BATTERY

AIS

ALARM

USER1

USER2

RTS

CTSRxDTE

RxDCE

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2-Line 1 RX

Notes:L1-Rx Port = TERMPlug in the cords in the order shown.

SS210 Cable

Figure 106 Plugging in-THRU Mode


4.2 Basic Applications4.2.1 Accept a New Circuit

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Figure 107 Accept a New Span

Here is a procedure for accepting a new span . The setup is illus-trated in Figure 107.

1. Verify that the span is not in service. This acceptance test willdisrupt service. Ensure that there is a loopback device at thefar end of the span.

2. Enter the TEST CONFIGURATION screen (Setup icon-colortest set), and configure as follows:TEST MODE: E1SINGLTx SOURCE: TESTPATFRAMING: as specified by the circuit designCRC-4: as specified by the circuit designTEST RATE: 2.048ML1-Rx Port: TERMTX CLOCK: INTERNPress ENTER when configured.

3. From the main menu select TEST PATTERN.4. Select the desired test pattern and press ENTER.5. Connect the test set to the circuit in order as shown in Figure 107.

150 SunSet E20/c

6. Press LED to acknowledge any history lights and verify that thePAT SYNC LED is green.

7. From the main menu select MEASUREMENT RESULTS(Results icon-color test set) and press START (F3).

8. Verify that the circuit performs to your company’s requirementsfor the service delivered. Use PAGE-UP (F1) and PAGE-DN(F2) to access each of the individual measurement screens.

9. When MEASUREMENT RESULT have been completed, pressESC to return to the main menu.

10.Remove the loop at the far end of the circuit.


4.2.2 Monitor an In-Service Circuit

Here is a procedure for monitoring a span that is in-service. Thesetup is illustrated in Figures 108 and 109.

1. This test may be performed while the span is carrying livecustomer traffic.

2. From the main menu, select TEST CONFIGURATION (Setupicon-color test set), and configure as follows:TEST MODE: E1DUALTx SOURCE: TESTPATFRAMING: as specified by the span designCRC-4: as specified by the span designTEST RATE: 2.048ML1-Rx PORT: MONITOR or BRIDGEL2-Rx PORT: MONITOR or BRIDGETX CLOCK: INTERNPress ENTER when configured.

Note: If you are not sure what RX Port level to use, then useBRIDGE. MONITOR should be used when you have a ProtectedMonitoring Point (PMP) access.

3. Connect the test set to the circuit as shown in Figure 108 or 109.4. Press LED to acknowledge any history lights.

E1Terminal

Equipment

E1Terminal

Equipment

7 8

9

A B C D

E * 1 2 3

F # 4 5 6

F1 F2 F3 F4

PRINT GRAPH ERR INJ

LEDMEAS

SHIFT ESC ENTER

POWER

1

2

SIGNAL

CODE ERR

PCM-31

ERROR

SIGNAL

PCM-30

CRC DET

PCM-31

PAT SYNC

BIT ERROR

POWER

BATTERY

AIS

ALARM

USER1

USER2

RTS

CTSRxDTE

RxDCE

ERROR

PCM-30

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ALARM

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MON

OUT

IN

MON

OUT

IN

Figure 108 Monitor an In-Service Circuit-Monitor Mode

152 SunSet E20/c


L1-TX75 120 L1-RX75 120

SUNRISE

Figure 109 Monitor an In-Service Circuit-Bridge Mode

5. Examine the LEDs for both lines and the GRAPHIC screen forinformation about the circuit under test:

• The SIGNAL LED should be green, red indicates no signal.• A valid framing type should be indicated.• A steady ERROR or CODE LED indicates that the circuit is

working but is experiencing trouble.• An ALARM indication will show a problem on the other side of

the circuit.• AIS may indicate a trouble condition where a network element

transmitting to the test set has lost its incoming signal and hasreplaced it with the AIS signal.

• The graphic will confirm your test setup.

6. To make a basic measurement, select from the main menu,TEST CONFIGURATION (Setup icon-color test set), and pressSTART (F3).

7. Verify that the span performs to your company's requirementsfor the service delivered.


4.2.3 Checking for Frequency Synchronization

E1Terminal

Equipment

E1Terminal

Equipment

7 8

9

A B C D

E * 1 2 3

F # 4 5 6

F1 F2 F3 F4

PRINT GRAPH ERR INJ

LEDMEAS

SHIFT ESC ENTER

POWER

1

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SIGNAL

CODE ERR

PCM-31

ERROR

SIGNAL

PCM-30

CRC DET

PCM-31

PAT SYNC

BIT ERROR

POWER

BATTERY

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ALARM

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MON

OUT

IN

MON

OUT

IN

Figure 110 Frequency Synchronization

Frequency synchronization can be a problem when:

• the customer purchases a channelized E1 circuit• the customer’s circuit passes through a synchronous network

element such as an exchange, PBX, or a digital cross-connectsystem

• the E1 circuit passes through more than one carrier.

Frequency synchronization problems result in bit slips, a majorsource of service impairment. Refer to Figure 104 for the setup anduse this procedure to identify frequency synchronization problems:

1. This test may be performed while the span is carrying livecustomer traffic.

2. Obtain a 2.048 Mbit/s reference frequency source. On a 2.048Mbit/s circuit, one side will usually be known to generate asynchronized signal. This side can be used as the reference.The other side can be measured for frequency synchronization.

3. From the main menu, select TEST CONFIGURATION (Setupicon-color test set), and configure as follows:TEST MODE: E1SINGLTx SOURCE: TESTPATFRAMING: as specified by the span design

154 SunSet E20/c

CRC-4: as specified by the span designTEST RATE: 2.048ML1-Rx PORT: MONITORTX CLOCK: L2-RxPress ENTER when configured.

4 Refer to Figure 110 and plug the reference E1 signal into theLine 2 RX jack, this is usually the MONITOR jack of the knownsynchronized signal.

5. Plug the Line 1 RX jack into the MONITOR jack of the side tobe tested.

6 Press LED to acknowledge any history lights.7. From the main menu , select MEASUREMENT RESULTS

(Results icon-color test set) and press START (F3).8. Press PAGE-DN (F2) until the FREQUENCY screen is dis-

played.• Observe if the frequency value varies from the 2.048 MHz

reference frequency. You will see >>> or <<< indicating the rateof frequency slippage.

• Note the WNDR value. This will provide an indication of any low-frequency variation in the E1 signal's frequency.


4.2.4 Measure Signal Level


L1-TX75 120 L1-RX75 120

SUNRISE

EQUIPMENT

MON

Tx

Rx

EQUIPMENT

MON

Tx

Rx

E1TERMINAL

EQUIPMENT

SUNRISE

Figure 111 Measuring Signal Level

A signal level measurement can be performed by itself or in con-junction with one of the other tests.

1. Select the L1-Rx Port level you want to use.• You can make the measurement in TERM, MONITOR, or

BRIDGE modes.• An all ones pattern in L1-Rx Port TERM and BRIDGE provides

the most accurate results.• MONITOR may be the most convenient mode. MONITOR

measurement should generally show a result of about -20 dB or-30 dB.

• TERM will disrupt service.• A BRIDGE measurement result may be degraded by a low-

quality termination at the network element terminating the E1line.

156 SunSet E20/c

2. The rest of this procedure will use the TERM mode forillustrative purposes. Verify that the span is not in service.

3. From the main menu, select TEST CONFIGURATION (Setupicon-color test set), and configure as follows:TEST MODE: E1SINGLTx SOURCE: TESTPATFRAMING: as specified by the circuit designCRC-4: as specified by the circuit designTEST RATE: 2.048ML1-Rx PORT: TERMTX CLOCK : INTERNPress ENTER when configured.

4. Plug the test set into the circuit as shown in Figure 111.5. Press LED to acknowledge the blinking history lights.6. Select MEASUREMENT RESULTS (Results icon-color test

set) and press START (F3).7 Press PAGE-DN (F2) until the LINE 1-ALM/SIG screen is

displayed8. Read the signal level. Note that separate readings are given for

the positive and negative signals so that you can get moreaccurate information on a faulty regenerator.


4.2.5 V.54 Channel Loopback Test

1. From the main menu, select TEST CONFIGURATION (Setupicon-color test set), and configure as follows:TEST MODE: E1 SINGL/ E1 DUALTx/INSERT and Tx/DROP: L1/L2 (as required)Tx SOURCE: TESTPATTEST RATE: Nx64/2.048M (as required)Press ENTER when configured.

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Figure 112 V.54 Application

2. Select from the main menu, select OTHER MEASUREMENT(Setup icon-color test set) > CHANNEL LOOPBACK and selectMODE: LOOP UP.

• If the loop up is successful, you will see a LOOP UP OK!message, if not, you will see LOOP UP ERROR.

3. From the main menu, select MEASUREMENT RESULTS(Results icon-color test set) and run a BERT.

4. Stop the test.5. Select from the main menu, OTHER MEASUREMENT (Setup

icon-color test set) > CHANNEL LOOPBACK and selectMODE: LOOP DOWN.

• A ‘LOOP DOWN OK’ message is displayed when the loop downhas completed.

158 SunSet E20/c

4.2.6 Running a Timed Test

Many network tests require the use of an exact time period suchas 15 minutes, 1 hour, or 24 hours over which to conduct a test. Inthis section you will configure the timer for one of these tests.Use the following procedure:

4.2.6.1 Manual Start

1. Use a desired application for your test.2. Select from the main menu, select SYSTEM PARAMETERS

(System icon-color test set) > MEAS CONFIGURATION.3. At the MEAS DURATION line press TIMED (F1)4. Press SHIFT to display the SHIFT indicator.5. Enter in the number of hours and minutes that you want the test

to run using the keypad.6. When done, press SHIFT.7. Select the START line and press MANUAL (F2).8. Press ESC until the main menu is displayed.9. Proceed with the desired application for your test.• The test will now be timed when MEASUREMENT RESULT is

performed.• Observe the remaining time by viewing the RT (Remaining

Time) indicator in the upper right-hand portion of the screen.

4.2.6.2 Auto Start

To program the test set to begin measuring at a future date andtime, use the following procedure:

1. In MEAS CONFIGURATION, at the MEAS DURATION line,press TIMED (F1).

2. Press SHIFT to display the SHIFT indicator.3. Enter in the number of hours and minutes that you want the test

to run using the keypad.4. Press SHIFT when done.5. Select the START line and press PROGRAM (F1).6. Select the PROG DATE YMD line. Use the SHIFT and number

keys to enter the Year, Month, and Day you wish the timed testto begin.

7. Press SHIFT when done.8 Select the PROG TIME HMS line. Use the SHIFT and number

keys to enter the Hour, Minute, and Second you wish the test tobegin.

9. When done press SHIFT.10.The test set will begin measuring at your programmed date and

time.


4.2.7 Observe Network Codes or Channel Data

Observe live data:

• Binary• Hexadecimal• ASCII translations• Decode E1 network control codes that are in use• Verify the content of individual channels

Refer to Figure 113.

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Figure 113 View Received Data

Use this procedure:

1. From the main menu, select TEST CONFIGURATION (Setupicon-color test set) and configure the interface (L1-Rx, L2-RxPort-depending on the TEST MODE configuration) using thefollowing guidelines:• If in service use BRIDGE or MONITOR• If out of service use TERM

Specify the other TEST CONFIGURATION settings as re-quired. The test set must detect valid framing on the receivedsignal.

2. Connect the test set to the circuit as shown in Figure 108 or 109.3. Press LED to acknowledge the history lights.4. Press ESC to display the main menu and select OTHER

MEASUREMENT (Results icon-color test set) >VIEW RE-CEIVED DATA.

• You will now receive a live display of the E1 data.• Scroll down through 64 pages of information• Observe the changes which have occurred over time

160 SunSet E20/c

6. Review the live data as it is displayed.A. When the codes that you are interested in appear, press

PAUSE (F3) to trap 64 pages of data.B. Press PAGE-DN (F2) to scroll through the data.• The data is presented as it appears in the E1 bit stream and

is broken out into timeslots.• View control information in time slot 00 for FAS framing.• View control information in time slots 00 and 16 for MFAS

framing.• All other channels (time slots) should contain actual voice/

data signals (or your the received test pattern).


4.2.8 Monitor a Voice Frequency Channel

Here is a procedure for monitoring a voice frequency channel withinan E1 circuit.

1. This test may be performed while the span is carrying livetraffic.

2. From the main menu, select TEST CONFIGURATION (Setupicon-color test set) and configure as followsTEST MODE: E1SINGLTx SOURCE: TESTPATFRAMING: as specified by the circuit designCRC-4: as specified by the circuit designTEST RATE: 2.048ML1-Rx Port: MONITOR or BRIDGETX CLOCK: INTERNPress ENTER when configured.

4. Plug the set into the circuit as shown in Figure 108 or 109.5. Press LED to acknowledge the blinking history lights.6. Verify that PCM-30 or PCM-31 LED is lit.7. Press ESC until the main menu is reached.8. Select VF CHANNEL ACCESS (VF icon-color test set) and

select. VF & NOISE MEASUREMENTS.9. Enter the desired transmit and receive timeslots.• The channel number will bypass any time slots containing the

E1 framing information.• In FAS framing, no access is granted to time slot 00• In MFAS framing, access to time slots 00 and 16 is denied.

10.Use either TALK or TONE for TxMODE and L1 for the IN/DROPitems (if you are in E1DUAL mode).

11.Adjust the volume to the desired level by pressing the volumekey, then using the UP (F1) or DOWN (F2) key.

Note: If you are not able to monitor the channel:• Verify that the AUTO framing of the test set was able to synch

on a recognized framing pattern• Press the AUTO key to restart the auto framer if a valid frame

pattern is not shown.• If this doesn't work, try unplugging and re-plugging the receive

cord. This will positively verify that there is no recognizableframing at this moment.

162 SunSet E20/c

4.2.9 Simple Talk/Listen

Here is the simplest procedure for talking and listening on an E1circuit. The setup is illustrated in Figure 107. However, instead ofhaving a loopback at the far end of the circuit, your setup mayhave another test set, a channel bank, a switch, or other E1 ter-minating network element. Use this procedure:

1. Verify that the span is not in service. This test will disruptservice for all of the channels you are not using. If a hitless dropinsert is required, read Section 4.3.1.

2. From the main menu, select TEST CONFIGURATION (Setupicon-color test set) and configure as follows:TEST MODE : E1SINGLTx SOURCE: TESTPATFRAMING: as specified by the span designCRC-4: as specified by the span designTEST RATE: 2.048ML1-Rx Port: TERMTX CLOCK: INTERNPress ENTER when configured.

Notes:• It is not possible to perform talk and listen on an unframed

signal.• One of the framing LEDs must light for this procedure to work.

3. Connect the test set to the circuit as shown in Figure 107.4. Press LED to acknowledge any blinking history lights.5. Press ESC to reach the main menu and select VF CHANNEL

ACCESS (VF icon-color test set) > VF & NOISE MEASURE-MENTS.

6. Select the receive (listen) and transmit (talk) channels (they areusually the same channel number).

7. Select TALK for the TxMODE. You can now talk and listen onthe channel which you have selected. Adjust the volume to thedesired level by using the volume key.


4.2.10 Send a Tone

1. This is an intrusive test. Be sure the E1 line is not carryingtraffic or that it will be able to withstand any hits that thisprocedure will introduce. If a hitless drop insert is required, readSection 4.3.1.

2. From the main menu, select TEST CONFIGURATION (Setupicon-color test set) and configure as follows:TEST MODE: E1SINGLETx SOURCE: TESTPATFRAMING: as specified by the span designCRC-4: as specified by the span designTEST RATE: 2.048ML1-Rx Port: TERMTX CLOCK: INTERNPress ENTER when configured.

4. Connect the test set to the circuit as in Figure 104.5. Press LED to acknowledge any blinking history lights.6. Press ESC until you reach the main menu and select VF

CHANNEL ACCESS (VF icon-color test set) > VF & NOISEMEASUREMENTS.

7. Use NEXT (F1) or PREVIUS (F2) to set up the receive andtransmit channels (timeslots). Select the rest of the menuitems as follows:Tx A/B/C/D: change as requiredTxMODE: TONETONE FREQ : enter the desired frequencyTx LVL (dBm): enter the desired tone levelLISTEN SIDE: L1+L2 (if in E1Dual Mode)

• You are now transmitting a tone on the selected channel.• View the received Frequency and noise measurements.

164 SunSet E20/c

4.2.11 Nx64 kbit/s Testing

Fractional E1 circuits are circuits of data rate Nx64 kbit/s, where Ncan be anywhere from 1 to 31 channels. N channels of the E1 lineare dedicated to the fractional E1 circuit, and the remaining chan-nels of the E1 line are either filled with an idle code, other revenuetraffic or framing information. Use the following procedure:

1. Verify that the fractional circuit is not in service. This test willdisrupt service. If a hitless drop insert is required, read Section4.3.1.

2. From the main menu, select TEST CONFIGURATION (Setupicon-color test set) and configure as follows:TEST MODE: E1SINGLTx SOURCE: TESTPATFRAMING: as specified by the span designCRC-4: as specified by the span designTEST RATE: Nx64K, the fractional SELECT TIME SLOTscreen is displayed. Manually configure the timeslots or useAUTO configure.L1-Rx Port: TERMTX CLOCK: INTERNPress ENTER when configured.

Note : AUTO configuration may not yield the proper channels if:• Any of the active channels are transmitting an idle code• The idle code (set up in the SYSTEM PARAMETERS > MEAS

CONFIGURATION page 2 > IDLE CHNL CODE) item is not thesame as the idle code of the circuit being tested.


To Observe the Idle and Active Channels:3. Plug-in the test set using the 2.048 Mbit/s test rate4. From the main menu, select OTHER MEASUREMENTS (Re-

sults icon-color test set) > VIEW RECEIVED DATA, this willallow double checking the information being transmitted on achannel-by-channel basis.

5. Press ENTER when the timeslot settings are as desired. Thiswill return you to the TEST CONFIGURATION menu.

6. When the TEST CONFIGURATION settings are as desired,press ENTER.

7. Connect the test set to the circuit as shown in Figure 114.8. Ensure that a loop is in place at the far end of the circuit.9. Press LED to acknowledge any blinking history lights.10 Select MEASUREMENT RESULTS and press START (F3) to

perform the acceptance test.11.Verify the fractional service performs to your company’s

requirements for the service delivered.


L1-TX75 120 L1-RX75 120

MON

OUT

IN

EQUIPMENT

Central Office

LoopbackDevice

Multiport

Figure 114 Fractional E1 Testing

166 SunSet E20/c

4.3 Advanced Applications4.3.1 In-Service Dual Drop & Insert THRU Testing

To conduct a dual drop and insert THRU mode test on a line thatis in service, make sure all the connections are made in accor-dance with the numbering procedure in Figure 115 to ensure theleast amount of interruption on the live circuits.

Cautions!• Only experienced technicians should perform this procedure.

Any mistakes will result in a longer service disruption.• Don’t perform this test on battery power, or turn off the test set,

doing so will cut off service.

Use the following procedure. If performed properly, this test shoulddisrupt the service for a very short duration.

1. From the main menu, select TEST CONFIGURATION (Setupicon-color test set) and configure as follows:TEST MODE: E1DUALTx/INSERT: L1-TxRx/DROP: L2-RxTx SOURCE: THRUFRAMING: as specified by the circuit designCRC-4: as specified by the circuit designTEST RATE: 2.048M or Nx64K ( fractional E1)L1-Rx Port: MONITOR, BRIDGEL2-Rx Port: MONITOR, BRIDGETX CLOCK: L1-Rx

2. Connect the test set to the circuit as shown in one of the nexttwo figures. Figure 115 shows a THRU mode test configuredwith L1-Rx Port as BRIDGE, while Figure 116 shows a THRUmode test configured with L1-Rx Port as MONITOR.

• THRU mode allows an in-service 2.048 Mbit/s circuit to passthrough the test set.

A. Plug in cords 1 through 6. Be sure to plug in the cords in theorder shown.

B. Verify that the test Line 1 and Line 2 LEDs show properframing, coding, and no errors.

C. Press GRAPH and verify that the test set is in THRU mode.D. Plug in cords seven and eight. Be sure to plug in the cords

in the order shown.

Note : You may need to modify this procedure to fit the type ofconnection panels in your network; therefore you should practicethe required connection procedure on an out-of-service circuit toreduce the risk of cutting off an in-service circuit.


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Figure 116 Dual Drop & Insert THRU Mode, L1-Tx Port MONITOR

168 SunSet E20/c

Note : The circuit will be disrupted for two or more seconds whilethe cords are moved.

3. Depending on the test application you may wish to do thefollowing:

• For Talk and Listen:A. Press ESC to return to the main menu and select VF

CHANNEL ACCESS (VF icon-color test set) >VF & NOISEMEASUREMENTS.

B. Select the receive (listen) and transmit (talk) channels (theyare usually the same channel number).

C. Select TALK for the TxMODE and L1 (or L1+L2) for theSPEAKER. You can now talk and listen on the channel youhave selected.

• To Send and Receive a Tone:A. Press ESC to return to the main menu and select VF

CHANNEL ACCESS (VF icon-color test set) >VF & NOISEMEASUREMENTS.

B. Use NEXT (F1) or PREVIUS (F2) to set up the receive andtransmit channels.

C. Select the rest of the menu items as follows:TxMODE: TONETx FREQ: enter desired tone frequencyTxLVL (dbm): enter desired tone levelTx ABCD: pick or enter desired supervision bitsSPEAKER: L1+L2• You are now transmitting a tone on the selected channel.• You can also view the received Level, Frequency, and

noise measurements.

• To Test Nx64 kbit/s, Fractional E1:A. From the main menu, select TEST CONFIGURATION

(Setup icon-color test set) and confirm that TEST RATE isset for Nx64K.

B. Press ESC to get to the main menu and select MEASURE-MENT RESULTS (Results icon-color test set) and pressSTART to perform your acceptance test.

C. Verify that the fractional E1 service performs to yourcompany’s requirements for the service delivered.


4.3.2 Testing a Terminal Multiplex

The test set can perform an out-of-service through multiplex test.Here is the procedure.

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Figure 117 MUXTEST Setup

1. Connect the test set as shown in Figure 117.2. Select from the main menu, TEST CONFIGURATION (Setup

icon-color test set) and for TEST MODE select MUXTEST(more, F1). Configure the rest as shown in Figure 118.

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Figure 118 E20 MUXTEST Configuration

170 SunSet E20/c

Notes:• In this procedure the multiplex must be DCE. The test set is

DTE. The Figure 118 uses RS232S as the Datacom Type. Youmay also select G.703, V.35, RS449, or X.21.

• The test set transmits an idle code out the multiport.

3. Set TX CLOCK to INTERN, if the multiplex receives timingfrom the test set’s 2.048 Mbit/s TX or set the TX CLOCK to L1-Rx, if the test set should receive timing from the multiplex.

4. Verify that the PAT SYNC LED is green. The result depends onyour B-LED setting; i.e., if the B-LED is set to E1, then you areverifying the E1 side with the LED, and vice versa.

5. Press ERR INJ to insert a bit error. You should see flashing redLEDs for both ERROR and BIT ERROR to indicate that a biterror has taken place. You have just injected an error from theE1 side through the multiplex to the datacom port.

6. Press LED to acknowledge any blinking history lights.7. Check to see if you can inject an error from the datacom port

through the multiplex to the E1 side.• Set the BERT B-LED to DTCM; this is the datacom type that

you selected in DATACOM TYPE.

8. Verify that PAT SYNC is green.9. Inject one bit error by pressing ERR INJ once. You should now

see flashing red LEDs for both ERROR and BIT ERRORindicating one bit error has occurred.

10 Press LED to acknowledge any blinking history lights.11 If more comprehensive tests are required, you may wish to

change the test patterns and other settings in TEST CONFIGU-RATION such as TX CLK.


4.3.3 Emulating a Terminal Multiplex

In the E1-MUX Mode, the test set emulates a 64 kbps to 2 Mbpsmultiplexer. Use the following procedure to multiplex one 64kbpssignal onto a 2 Mbps signal.

1. Select from the main menu, TEST CONFIGURATION (Setupicon-color test set) and configure as follows:TEST MODE:E1-MUX

E1Tx/INSERT: L1-TxRx/DROP: L1-RXFRAMING: As specified by the span designCRC-4: As specified by the span designL1-Rx Port: TERML2-Rx Port : TERMTX CLK : L1-RX

DATACOMTYPE: Select the datacom interface type that will provide the64 kbps frame.TxSRC: E1DRP

MUXB-LED: E1drpE1INS: DTCME1T/s: Nx64: Select the 64 kbit/s timeslot to be multiplexed

from the datacom to the E1 side:A. Press Nx64K (F1) to enter the SELECT TIME SLOT screen.B. Use the arrow keys to move the flashing cursor to the

desired receive timeslot.C. Once the desired timeslot is flashing, press SELECT (F2).• Press UN-SEL (F3) to deselect a particular timeslot• Press CLR-ALL (F4) to erase all the selected timeslots and

start with a clear screen.

D. If necessary, repeat this procedure for the Transmit timeslot.• You may select only one receive and one transmit timeslot

at a time. The receive and transmit timeslots are normallybe set to the same number.

2. Connect the test set to the circuit as shown in Figure 119.3. Press LED to acknowledge any blinking history lights.4. Verify that the PAT SYNC LED is green.

172 SunSet E20/c

Nx64 kbps

DCE

TerminalEquipment

7 8

9

A B C D

E * 1 2 3

F # 4 5 6

F1 F2 F3 F4

PRINT GRAPH ERR INJ

LEDMEAS

SHIFT ESC ENTER

POWER

1

2

SIGNAL

CODE ERR

PCM-31

ERROR

SIGNAL

PCM-30

CRC DET

PCM-31

PAT SYNC

BIT ERROR

POWER

BATTERY

AIS

ALARM

USER1

USER2

RTS

CTSRxDTE

RxDCE

ERROR

PCM-30

CRC DET

AIS

ALARM

CODE ERR

" $

L1-Tx

L1-Rx

2.048 Mbps

E1-MUX

DTE

Multiport

Figure 119 Emulating a Terminal Multiplex

The DTE supplies the 64 kbit/s signal, which is transmitted to thetest set through the multiport. The test set multiplexes this 64kbit/s signal onto a 2 Mbit/s signal, which is then transmitted outthe E1 L1-Tx jack. In Figure 119 the test set is connected to a IN/OUT monitor jack. The 2M signal is passed from the IN to theOUT jack and back to the L1-Rx jack on the test set. This allowsyou to check the multiplexed signal. The following steps outlinethe procedure for checking the multiplexed 2M signal.

4. Inject an error from the Data Terminal Equipment.A. Make sure that the B-LED setting in TEST CONFIGURATION

is set to E1DRP. This means that the PAT SYNC LED will showinformation about the signal received on the E1-L1Rx port.

B. Upon injecting the error, a red error PAT SYNC LED shouldlight up on the test set; verify you recorded a Bit Error in theMeasurement Results Line 1 Summary and Datacom Sum-mary screens. If it does, you have just verified the propermultiplexing ability of the test set.

You may also want to check the results for the other side. To doso, keep the same setup as shown in Figure 119, only this timeyou insert an error from the 2.048 Mbit/s terminal equipment.Change the B-LED setting in TEST CONFIGURATION to DTCM.


4.3.4 Emulating an Add/Drop Multiplexer

The test set has the capability to emulate an Add/Drop Multiplex.Use the following procedure to drop and insert 64 kbit/s timeslotsbetween a datacom device and E1 lines.

1. Select TEST CONFIGURATION and configure as follows:TEST MODE: E1 DUALTx/INST: L1-TXRX/DROP: L2-RXTxSOURCE: THRUFRAMING: As provisionedCRC-4: As provisionedTEST RATE: Nx64kL1-Rx Port: TERML2-Rx Port: TERMTX CLOCK: L1-RX

2. Connect the test set to two terminal equipments in the ordershown in Figure 120.

TerminalEquipment

2

Test Pattern1-4

OUT

IN

MON

3

8

TerminalEquipment

1

Test Pattern0000

OUT

IN

MON

1

7

7 8

9

A B C D

E * 1 2 3

F # 4 5 6

F1 F2 F3 F4

PRINT GRAPH ERR INJ

LEDMEAS

SHIFT ESC ENTER

POWER

1

2

SIGNAL

CODE ERR

PCM-31

ERROR

SIGNAL

PCM-30

CRC DET

PCM-31

PAT SYNC

BIT ERROR

POWER

BATTERY

AIS

ALARM

USER1

USER2

RTS

CTSRxDTE

RxDCE

ERROR

PCM-30

CRC DET

AIS

ALARM

CODE ERR

" $

L1-Tx

L1-RxL2-Tx

L2-Rx

2

4

5

6

Figure 120 Emulating an Add/Drop Multiplex

A. Plug into the OUT jack of Equipment 1; connect the samecord to Line 1 RX on the test set.

B. Plug a second BNC cord to The OUT jack on Equipment 2;connect this cord to Line 2 RX on the test set.

C. Plug your third BNC cord to Line 1 TX of the test setD. Plug a fourth cord into Line 2 TX.

Note: Do not connect either of these cords to the Terminal equip-ment yet.

174 SunSet E20/c

E. Verify that the test set’s LEDs for Line 1 and Line 2 showproper framing, and no errors.

• You should see green LEDs for CODING, framing, and nored LEDs.

F. Press GRAPH and verify that you are in THRU Mode.G. Connect the cord from Line 2 TX to the IN jack of Equipment 1.H. Connect the cord from Line 1 TX to the IN jack of Equipment 2.

Note : The circuit will be disrupted for a few seconds while thecords are moved.

3. Press LED to acknowledge any blinking LEDs.• Verify that the PAT SYNC LED is green.

4. Press ESC to return to the main menu and select OTHERMEASUREMENTS > VIEW RECEIVED DATA (Results icon-color test set). Since you selected Rx/DROP= L2-Rx in TESTCONFIGURATION, the data displayed refers to Line 2 Rx.

• Verify that the pattern sent by Equipment 2 is shown on all thetimeslots. According to Figure 120, you should see the 1-4pattern. You have just verified that Line 2 is being receivedproperly by the test set.

6. Press ESC to return to the main menu and select TESTCONFIGURATION (Setup icon-color test set). Change Rx/DROP to L1-Rx.

7. Press ESC to return to the main menu and select OTHERMEASUREMENTS > VIEW RECEIVED DATA (Results icon-color test set). The data displayed refers to Line 1 Rx.

• Verify that the pattern transmitted by Equipment 1 is shown onall available timeslots in this screen. With reference to Figure120, you should see the 0000 pattern on all timeslots. You havejust verified the Line 1 signal is being received properly by thetest set.

8. Press ESC to return to the main menu and select TESTCONFIGURATION (Setup icon-color test set). Configure asfollows:TEST MODE: E1-MUXE1TX/INST: L1-TXRX/DROP: L2-RXFRAMING: as provisionedCRC-4: as provisionedL1-Rx Port: TERML2-Rx Port: TERMTX CLOCK: L1-RX


DATACOMTYPE: Interface type of connectorTxSRC: E1DRPMUXB-LED : DTCME1INS: E1DRPE1T/S: as required

9. Connect the test set to the datacom device through themultiport as shown in Figure 121.

TerminalEquipment

2

Test Pattern1-4

OUT

IN

MON

TerminalEquipment

1

Test Pattern0000

OUT

IN

MON

7 8

9

A B C D

E * 1 2 3

F # 4 5 6

F1 F2 F3 F4

PRINT GRAPH ERR INJ

LEDMEAS

SHIFT ESC ENTER

POWER

1

2

SIGNAL

CODE ERR

PCM-31

ERROR

SIGNAL

PCM-30

CRC DET

PCM-31

PAT SYNC

BIT ERROR

POWER

BATTERY

AIS

ALARM

USER1

USER2

RTS

CTSRxDTE

RxDCE

ERROR

PCM-30

CRC DET

AIS

ALARM

CODE ERR

" $

L1-Tx

L1-RxL2-Tx

L2-Rx

Multiport

DatacomDeviceDTE

Test Pattern511

Figure 121 Emulating Add/Drop MUX

10.Press LED to acknowledge any blinking LEDs.• Verify that the PAT SYNC LED is green and no red error LEDs

are present.

11.Press ESC to return to the main menu and select OTHERMEASUREMENTS > VIEW RECEIVED DATA (Results icon-color test set). Verify that the test set is receiving the DTE’stest pattern on its multiport. Since you have selected thedatacom type for BERT on TEST CONFIGURATION, thepattern received on the multiport should be displayed.

• For Figure 121, you should see 511.• Even if you have selected only a few Nx64 timeslots in TEST

CONFIGURATION, expect to see the datacom pattern on alltimeslots here.

176 SunSet E20/c

12. In the previous steps, you have verified that the test set isreceiving a proper signal on both E1 Line receive jacks, as wellas on the TX/multiport. Next, you must verify that the test setis inserting the datacom’s signal on the selected timeslots. OnLine 1, the test set transmits the signal received on L1-Rx, butit inserts the signal received on the multiport on the Nx64Ktimeslots selected in TEST CONFIGURATION on L1-Tx. Forthis reason, Equipment 2 is the best place to check the testset’s insert capability. Equipment 2 should receive the Datacom’spattern, here 511, on the selected timeslots and Equipment 1’spattern, here ALL ZEROES, on all the other timeslots.

13. If Test Equipment 2 is not capable of displaying its receiveddata, you will need to plug a second test set into its monitor jack.

14.On the second test set, for the main menu select TESTCONFIGURATION and configure as follows:TEST MODE: E1DUALTx/INSERT: L1-TXRX/DROP: L1-RXTXSRC: TESTPATFRAMING: as requiredCRC-4: as requiredTEST RATE: 2.048ML1-Rx Port: MONITORL2-Rx Port: MONITORTX CLOCK: INTERN

15.Connect Line 1 RX to the MON jack of Equipment 2.16.Press LED to acknowledge any blinking LEDs.17.Press ESC to return to the main menu and select OTHER

MEASUREMENTS > VIEW RECEIVED DATA (Results icon-color test set). Verify that the Datacom’s pattern is on theselected timeslots and that Equipment 1’s pattern is on theother timeslots.

18.You have just verified the proper insert operation of the test set.

Ch. 5 Datacom 177

Chapter 5 Datacom

5.1 Technology Overview-IntroductionData communication touches upon every area of our lives. Sincethe rapid technological development in the areas of ICs (Inte-grated Circuits), almost every form of communication can be trans-mitted digitally. Most people associate data communication withcomputers; however, recent applications of data communicationinclude voice, video and image digitization.

Due to the accuracy and cost effectiveness of digitizing, it isimportant to understand the components and the process in adata communications network.

5.1.1 Communication Components

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Figure 122 Data Communication Facilities

In digital computers, data is stored in individual bits. These bits canhave two defined states; 1 (on) and 0 (off). On the other hand,analog logic has a range of possible states. When graphed, analogsignals are sine waves, while digital signals are square. Sound,since it is always changing, is analog. Therefore, phone lines carryanalog signals. In order for a computer to send its digital data overthe phone line, this data must be converted into an analog signal.A modem reads the computer’s digital signals and converts theminto tones that can be sent over the phone line. The modem on theother end picks up these tones and turns them back into digitalsignals that are sent to the receiving computer.

Modulation is the process of converting the digital waveform intoan analog signal suitable for phone line transmission; demodula-tion is the inverse, analog to digital. A Modem (as in Modulation/

178 SunSet E20/c

Demodulation) carries out these processes.

The three major components of data communication are: the termi-nal, the modem, and the host computer. At the terminal, analog infor-mation (meaning information from the outside world) is translatedinto digital format. This digital data is then transmitted to a host com-puter. A host computer is a large computer system which is able torun programs from several different users at the same time.

The terminal equipment is referred to as DTE (Data Terminal Equip-ment). The Modem is called DCE (Data Communication Equip-ment) and sometimes Data Set. Figure 122 depicts the relation-ship between these data communication terms and your every-day equipment.

5.1.2 Transmission Basics

The communications medium is composed of a primary channeland a secondary channel. A secondary channel is not always presentin modems. A channel has the capacity to transfer data in eitherdirection; each channel actually has two signals, one for each direc-tion. When both directions can be active simultaneously, then thechannel is called full-duplex. When only one direction can be activeat a time, the channel is half-duplex. The channel’s capacity is equalto the number of bits per second it can carry. The secondary channel’scapacity is always less than that of the primary channel.

Another associated concept is that of carrier. A carrier is a con-tinuous sine wave signal that passes over the medium. This isthe actual pipeline that allows the data to travel from DCE toDCE. The presence of carrier does not necessarily mean thatthere is data transfer. In order to send data from DCE to DCE, thedata must be modulated.

Ch. 5 Datacom 179

5.1.3 Data Networks

Here is a brief introduction to the various options available in datanetworks. Circuits can differ in the following ways:

• The direction of transmission• The number of devices that are connected to the network• The method of customer payment• The method of transmission

The Direction of TransmissionA simplex channel transmits data in only one direction. A half-duplex channel transmits in either direction; however, only onedirection can be active at a time. A full-duplex channel can senddata in both directions simultaneously.

The Number of Connected DevicesA Point-to-Point circuit connects two devices. For example, a lineconnecting two modems is Point-to-Point. A Point-to-Multipointcircuit can connect several different devices.

The Method of PaymentIn a Switched circuit, a customer is charged for the setup, dura-tion, and termination of the call. A normal telephone call uses aswitched circuit. A dedicated, aka leased, line maintains a per-manent connection between two points. The customer pays a fixedrate for this connection.

The Method of TransmissionIn asynchronous transmission, data is coded into a series of pulseswith a start and stop bit. A start bit is sent by the sending modemto say that it is going to send a character. It then sends the char-acter and follows with a stop bit which states that the transfer iscomplete. After transmission of the character, the line can sendthe next character with start/stop bits or can go into an idle state(here it remains in the mark 1 position).

In synchronous transmission, data is sent via a bit stream, whichsends groups of characters in a single stream. Modems gathergroups of characters into a buffer, where they are prepared to besent in a stream. In order for this stream to be sent, the modemsmust be in perfect synchronization with each other. The idle timebetween characters is eliminated. The first bit of a character im-mediately follows the last bit of the previous character; there areno start/stop bits.

180 SunSet E20/c

5.1.4 Call Control Procedure

West DTE East DTEEast DCEWest DCE

AnalogPhoneLine

ActivateCarrierRTS On CAR_DET

On

DigitalRS232Cable

RTS OnEastboundCarrierPresent

CTS On

BothCarriersPresent

CAR_DETOn

Tx Data On ModulateCarrier

DemodulateCarrier Rx Data On

Tx Data OnModulateCarrier

DemodulateCarrierRx Data On

Tx Data Off Rx Data Off

CTS On

RTS Off

CAR_DETOff

Modulation

DigitalRS232Cable

Figure 123 Full-Duplex Call Procedure

A standard call procedure is outlined in Figure 123 and describedbelow. This procedure pertains to a full-duplex circuit. Since bothcarriers can be present simultaneously in a full-duplex circuit, itdoes not matter which side turns on RTS first. In Figure 123, theWest DTE happens to be first. For half-duplex circuits, the side totransmit first must be arranged beforehand.

The West DTE sends RTS to the West DCE. RTS, Request ToSend, tells the modem to activate its outgoing carrier. RTS re-sults in two steps for the West DCE. It turns on the Eastboundcarrier, as shown in Figure 123, and also sends CTS back to theWest DTE. CTS, Clear To Send, indicates that the carrier hasbeen turned on and so the DTE may begin to transmit its data.The East DCE senses that the Eastbound carrier from the WestDCE is now present. Consequently, it sends CAR_DET to theEast DTE. CAR_DET, Carrier Detect, means that the DCE hassensed an incoming carrier. This alerts the East DTE that it shouldshortly receive data from the West.

Ch. 5 Datacom 181

The East DTE also turns on its RTS. This results in the samesteps as outlined above for the West. The RTS is received by theEast DCE. The East DCE now activates its Westbound carrierand thus, both carriers are present. It also sends CTS back toEast DTE. The West DCE, recognizing the incoming (Westboundcarrier) turns on the CAR_DET to the West DTE. At this stage,both carriers are active, but no modulation or data transfer hastaken place.

When the West and East DTE recognize that the CTS signal ison, they can begin to transmit data on the Transmit Data wire.When the West DTE places data on its Tx wire, the West DCEbegins to modulate its carrier. The data is sent to the East DTE,where it is demodulated and sent on the Receive data wire. TheEast DTE receives exactly what was sent by the West DTE. Asimilar procedure takes place when the East DTE places data onits Tx wire. The East DCE begins modulation and sends the ana-log information to the West DCE. The West DCE demodulatesthis data and sends it to the West DTE on the Rx wire.

When the West (or East) DTE has sent all its data, it turns off itsTX wire and the East DTE turns off its Rx wire. The West DTEturns off RTS. The West DCE turns off CTS and deactivates itscarrier. The East DCE senses the loss of carrier and turns offCAR_DET. When the East DTE has finished transmitting its data,the same steps are followed.

182 SunSet E20/c

5.1.5 Physical Layer Protocol

Data communication processes involves protocol. The OSI stan-dard is commonly used.

At the upper layer protocol, some frequently used standards areTCP/IP, HDLC and X.25, etc. The physical level also has an ex-tensive suite of standards available. For the physical layer func-tions, V.35 is the more dominant standard used internationally.

For discussion, we will use a V.35 DB-34 pin connector to illustratethe physical layer functions. Also for the purpose of discussion,DCE and DTE are represented by a modem and a computer re-spectively. Figure 124 shows the pin assignment of a V.35 inter-face. Refer to Figure 124 for a brief description of each pin function:

Pinout & Usage

Pin B : Ground

Pins P, S & R, T : The DTE transmits data on pins P, S,and receivesdata on pins R, T. This is reversed for the DCE.

Pins C & D : The DTE can use RTS (Request to Send) on pin C, andreceives CTS (Clear to Send) on pin D, from the DCE.

Pins E & H : When the DCE is powered on, and is not in test mode,the DTE receives a DSR (Data Set Ready) on pin E. When terminalis ready, it transmits a DTR (Data Terminal Ready) on pin H.

Pin F : The modem asserts DCD (Data Carrier Detect) whenever it rec-eives a signal on the telephone line that meets its internal criteria foramount of energy at the carrier frequency.

Pin N : Initiates a remote loopback (RL)

Pin L : Initiates a local loopback (LL)

Pin Y, AA : Used for the transmit clock

Pin V, X : Used for the receive clock

The following pin connections are required as minimum between a DTEand DCE: P, S; R, T; Y, AA; V, X; and B.

Pin P, S and R, T are for the DTE to transmit and receive data.

Pin Y, AA and V, X are used for clocking purposes.

Pin B is the signal ground between the DTE and the DCE.

NN JJ DD Z V R L F B

LL FF BB X T N J D

MM HH CC Y U P K E A

KK EE AA W S M H C

Figure 124 V.35 DB-34 Interface

Ch. 5 Datacom 183

5.2 Datacom Menus5.2.1 Datacom Mode Test Configuration

The DATACOM Test Mode provides testing using stan-dard protocols V.35, RS449, X.21, G.703, and RS232.

• The 2.048 Mbit/s interfaces are ignored.• You test only the low speed synchronous/asynchronous signal

on the DATACOM port.• Figure 125 displays the DATACOM Configuration screen.

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-" 1-$9+ + !

-" $$# '-!

Figure 125 Test Configuration-DATACOM

5.2.1.1 Test Configuration

The following items should be configured for the DATACOM Mode:

TYPEOptions: V.35 (F1), RS449 (F2), X.21 (F3), G.703 (more, F1),RS232S (more, F2), RS232A (more, F3)

Type determines the electrical interface at the multiport. Pressthe F-key corresponding to the desired interface type:

• RS449 is analogous to V.36; also select RS449 for an RS530/EIA530 interface

• X.21 is analogous to V.11• RS232S and RS232A is analogous to V.24. A is Asynchronous

and S is Synchronous.

184 SunSet E20/c

MODEOptions: DTE (F1), DCE (F2), MON (F3)

The MODE options depend upon the specific chosen TYPE.

For V.35, RS449, X.21, RS232A/S:

• DTE: Use to emulate Data Terminal Equipment to plug the testset into DCE equipment.

• DCE: Use to emulate Data Circuit Equipment, to plug the testset into DTE equipment.

For G.703, Mode is forced to CO-DIRectional.

Notes:• Make sure to use connectors specific to the SunSet E20

(SS253/Y, SS254/Y, SS255/Y, SS256B, SS262-B, SS267/Y);other connectors may look similar (such as those provided forthe SunSet E8 or SunSet E10), but they can vary considerably.Specifically, do not use the SS252 for SunSet E20/E20c DTEor DCE testing. Make sure to use a V.35 adapter without atermination resistor (SS267) with the SunSet E20. Misuse ofthe adapter could lead to uncertain results.

• In some cases the SunSet E20/E20c may overload datacomsignals in the bidirectional monitor mode.

• For V.35 and RS449 monitoring, the test set will present aterminating resistor to the line which could cause a doubletermination, and affect signal amplitude.

TEST RATEOptions: The TEST RATE options available to you depend uponthe TYPE and MODE selected. Refer to Table 8.

TEST RATE TYPE/MODE F1 F2 F3 F4 V.35/DTE or DCE 300

2400 14.4K 48K

600 4800 19.2K Nx56K

1200 9600 38.4K Nx64K

MORE

RS449/DTE or DCE 300 2400 14.4K 48K

600 4800 19.2K Nx56K

1200 9600 38.4K Nx64K

MORE

X.21/DTE RECEIVE X.21/DCE 300

2400 14.4K 48K

600 4800 19.2K Nx56K

1200 9600 38.4K Nx64K

MORE

G.703/CO-DIR Nx64K, select from 01-08 for N RS232S/DTE or DCE 300

2400 14.4K 48K

600 4800 19.2K 1x56K

1200 9600 38.4K 1x64K

MORE

RS232A/DTE or DCE 50 600

4800 19.2K

150 1200 9600 38.4K

300 2400 14.4K

MORE

Table 8 Type Versus Test Rate

Ch. 5 Datacom 185

If selecting any of the Nx56K or Nx64K rates the following screenappears.

1. Use the keypad arrow keys to select the rate2. Press ENTER to return to TEST CONFIGURATION.

$"!$"

!$",01#!$",01#!!!!!!$!"!,!0!1!#!

Figure 126 Select Fractional Rate

Note : If you are in G.703 Mode and you attempt to select a rate of9 or above you will see a ‘Not valid for G.703’ message.

TxDATA CLKOptions: INTERN (F1), RECEIVE (F2).

This determines the transmit signal clock source. Clocking ap-plies only to synchronous transmission. Thus, this setting doesnot apply to RS232 Asynchronous signals.

• INTERN: Use to select the test set’s internal clock. The test setis the master timing source on the circuit.

• RECEIVE: This uses the signal received at the DATACOM portas the transmit signal clock source. The test set is then in slavetiming.

Notes:• For DCE, the TxDATA CLK is set by default to INTERN.• For DTE, the TxDATA CLK is set by default to RECEIVE.• For X.21 (where DTE is automatically receive and DCE is

automatically internal), this item will not appear in the menu.

186 SunSet E20/c

CLK POLAR/TX CLK POLAR/ RCV CLK POLAROptions: NORMAL (F1), INVERT (F2)

• The Clock Polarity affects both TX and RX at the same time.This applies to the co-directional G.703 interface

• When the transmit or receive clock polarity is inverted, the testset will assume data is received with 180 degree phasedifference with the clock, and the test set will transmit data with180 degree phase difference with the clock.

• When the transmit or receive clock polarity is NORMAL, thetest set will receive and transmit data in alignment with theclocking.

The following three items apply only to asynchronous datacomtransmission. They appear in the menu if the RS232A Mode isselected:

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!! 1-$9& 1 !

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Figure 127 Datacom RS232A Configuration Screen

BIT/ CHAROptions: 6 (F1), 7 (F2), 8 (F3)

Determine how many bits will be transmitted for each character ofinformation.

STOP BITSOptions: 1 (F1), 2 (F2)

Determine how many stop bits will be transmitted for each char-acter of information. A stop bit signifies the end of a byte.

Ch. 5 Datacom 187

PARITYOptions: EVEN (F1), ODD (F2), NONE (F3)

Determine how many parity bits are transmitted for each charac-ter of information. Parity is a method of checking the accuracy oftransmitted or stored data. An extra bit, known as a parity bit isadded to the data as an accuracy check. The receiving elementchecks the parity bit and indicates an error if the total number ofones does not add up to the correct total.

• ODD: the total number of ones (including the added parity bit)is odd.

• EVEN: the total number of ones (including the added parity bit)is even.

• NONE: signifies no parity checking

USER LED 1/2Options: Depends on your TYPE and MODE; see Table 9 andrefer See Section 2.2 for further explanation.

Select the lead states you want the USER LEDs to show.

DTE/ DCE

Asynchronous Synchronous

Leads RS232 RS232/ V.24 V.35 X.21

RE449/ V.36

EIA530/ RS422

DSR X X X X X DTR X X X X X DCD X X X X X

T (REF) CLK

X X X X

TxCLK X X X X RxCLK X X X X

RL X X X X X LL X X X X X C X I X S X

Table 9 Lead States

188 SunSet E20/c

5.2.2 Datacom Interface

When you have selected E1-MUX, MUXTEST, orDATACOM Mode in the TEST CONFIGURATIONscreen, the DATACOM INTERFACE item appears inthe main menu of the SSE20. In color test set’s, theINTERFACE is found in the Results icon.

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G3 .!

Figure 128 Main Menu/Datacom Interface

When you enter DATACOM INTERFACE, you will go into theDATACOM TIMING ANALYSIS screen.

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Figure 129 Datacom Timing Analysis Menu

Ch. 5 Datacom 189

5.2.2.1 Live Tracer

The LIVE TRACER screen displays the MODE and TYPE selectedin TEST CONFIGURATION, as well as the received signals. It alsoallows you to turn on/off the transmit signals. Refer to Figure 130.

!!,"

!!'

Figure 130 Datacom Interface Screen-Graph

Signals available in this screen depend on the selected MODEand TYPE. For example, when MODE is set to DTE (Figure 130),the test set emulates Data Terminal Equipment.

For DCE, in V.35, RS449, and RS232, the available transmit sig-nals to set are: CTS (Clear To Send), DSR (Data Set Ready), andDCD (Data Carrier Detect)

For DTE, in V.35, RS449, and RS232, the received signals avail-able to monitor are: RTS (Ready To Send), DTR (Data TerminalReady), RL (Remote Loopback), and LL (Local Loopback)

For V.35, RS449, and RS232, when the MODE is set to DTE, thetest set emulates Data Terminal Equipment. The receive and trans-mit signals are reversed. CTS, DSR, and DCD are now the re-ceive signals to monitor. RTS, DTR, RL, and LL may be set fortransmitting

For X.21, the transmit and receive signals change. Signal C, Con-trol, is used as the receive signal for DCE MODE and as thetransmit signal for DTE MODE. Signal I, Indication, is the trans-mit signal for DCE and the receive signal for DTE.

Note: When the Test Mode is E1-MUX, the test set always emu-lates Data Circuit Equipment (DCE). Thus, CTS, DSR, and DCDwill always be the transmit signals for E1-MUX Mode.

190 SunSet E20/c

When the Test Mode is MUXTEST, the test set always emulatesData Terminal Equipment (DTE). Thus, RTS, DTR, RL, and LL willalways be the transmit signals for MUXTEST Mode.

When G.703 Type is chosen in the TEST CONFIGURATIONscreen, the Datacom Interface screen is not available.

Datacom TimingThe timing in Datacom Analysis is often a critical issue. Thisfeature allows the user to change the status the control leads,and observe the response time of the system. The user may alsoobserve how long each datacom lead was active, and in whichstate. Refer to Figure 131.

1. Observe each lead, and its On/Off state; indicated by theheight of the graph line. The arrowhead on the graph lineindicates when the test set is capturing traces.

• The leads available to observe depend on your TYPE andMODE settings.

2. You may change the status of the RTS, RL, DTR, and LL leads:A. Move the cursor to the control leads you want to change,

using the keypad arrow keys.B. Press ON (F1) or OFF (F2) to change the state.


On (F1) and OFF (F2): Use to change the state of the highlightedlead.

FREEZE/RESUME (F3): Use to stop or restart the reporting oflead state data.

TABLE/GRAPH (F4) : Use to change the presentation of the data(Figure 131).

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Figure 131 Datacom Interface-Table

Ch. 5 Datacom 191

In TABLE mode, you will also see the TIME the state of a leadlast changed.

TRIGON (more, F1 ): Press to set a Trigger; this way the test setwill only capture the specific data you are looking for. For ex-ample, your trigger could be a loss of data; a change of state atthe DTR falling edge.

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663. . .E

Figure 132 Start Trigger

Start Trigger1. LEAD: Determine which Lead you want to capture.

Options: RTS (F1), CTS (F2), DTR (F3), DSR (MORE, F1),DCD (MORE, F2), RL (MORE, F3), LL (MORE, F1)

2. EDGE: Determine which edge to look at for a change of state.Options: RISING (F1), FALLING (F2)

3. Press ENTER and the test set will begin to look for a changeof state as defined by the LEAD and EDGE parameters above.You will return to the display screen. The word ‘Trig’ will bepresent at the top of the screen, indicating the test set is inTrigger mode. Press ESC to return to the display without settinga trigger.

• When a change of state is found, the test set will present thedata.

4. When FREEZE is selected, new F-keys appear:• Use PREVIUS (F1) and NEXT (F2) to scroll through the pages

of data. A page is available for each change of state.

192 SunSet E20/c

5.2.3 View/Print Buffer

Observe or print the stored captured data; the last 40 seconds ofcaptured control lead status for Graphic mode, and up to 100pages of control lead state changes and status with time stampfor Table mode. Refer to Figure 133 for a sample screen:

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Figure 133 View/Print Buffer-Graph

• Use PREV (F1) and NEXT (F2) to move the lines, though time.• Press TABLE (F3) to see a TABLE view of the data, including

time of each change of lead state. In Table mode, F3 becomesGRAPH, to return to the Graph screen.

• Press PRINT (F4) to print the results as they are currentlydisplayed on the screen. See Figure 134 for a sample of eachdisplay.

Ch. 5 Datacom 193

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Figure 134 Datacom Printouts

194 SunSet E20/c

5.2.4 Datacom Measurement Results

• Observe results for both directions of the Datacomsignal.

• 3 pages of measurement results are available forDatacom.

• See Chapter 3 for Measurement Results Defini-tions.

Figure 135 shows you the Datacom Summary screen. See Figure136 for page 1 bit error results, and Figure 137 for page 2 block errorresults. The results screen present some common information:

TYPE: Datacom type, as selected in TEST CONFIGURATION.

MODE: Selected mode, as set in TEST CONFIGURATION.

TxHz: Transmitted data rate, in kilohertz.

RxHz: Received data rate, in hertz.

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-" +:$19 +:$1 ! "

+ +

"!$,

Figure 135 Datacom Summary Results-Page 1

Here are the definitions specific to this screen:

RxDL: This is a count of the number of occurrences of receivedData Loss.

RxDLS: This is the number of seconds during which data was lost.

PATL: This is a count of the number of occurrences of PatternLoss.

PATLS : Pattern Loss Seconds indicates the number of secondsduring which pattern was lost.

Ch. 5 Datacom 195

,$"!

$"" +:$19 +:$1"

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Figure 136 Datacom Measurement Results-Page 2

Results definitions specific to this screen are:

SLIP: This is the number of pattern slips which have occurred.

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) ,1,11 - "

"!$, <6

Figure 137 Datacom Measurement Results-Page 3

Definitions specific to this screen are:

# of BLOCKS: This shows the total number of blocks received

BLOCK ERROR: Block error shows the number of blocks whichcontain any number of bit errors.

BLK ERR RATE: The block error rate refers to the fraction ofblocks in error- the number of blocks received with 1 or more biterrors (BLOCK ERROR) divided by the total number of blocksreceived (# of BLOCKS).

196 SunSet E20/c

Here is the DATAMON Summary screen:

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$$#

+:! +:! +< +<

+ + +,, +! -

Figure 138 DATAMON Results

Here is the measurement specific to this screen:

RxPA : This is the received pattern; 1010 in Figure 138.

DATAMON presents you with a G.821 Bit Error screen, similar toFigure 136, for both the DTE and DCE sides.

5.2.5 Other Measurements

See the X.50 manual for information on using X.50.

Ch. 5 Datacom 197

5.2.5.1 View Received Data

• Observe the digits for each byte.• Use PAGE-UP (F1) and PAGE-DN (F2) to scroll

through the results.• Press PAUSE (F3) to freeze the results for easy

viewing, then press RESUME (F3) to continue thelive presentation of data.

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% -" !$",0

Figure 139 Datacom View Received Data

198 SunSet E20/c

5.2.5.2 Propagation Delay

The PROPAGATION DELAY screen (Figure 140) dis-plays the propagation delay of a looped back signal.The circuit must be looped back at the far end inorder for the test set to perform this measurement.

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Figure 140 Propagation Delay

The test set measures the number of unit intervals required for around trip through the line. This number is translated into an exactnumber of µS of round trip delay. A UI (Unit Interval) equals 488 µS,at 2.048 Mbit/s. The unit will be able to measure delays of up to fiveseconds at a rate of 2.048 Mbit/s; representing 10,240,000 unitintervals at 2.048 Mbit/s. Use this procedure:

1. From the main menu, select OTHER MEASUREMENTS >PROPAGATION DELAY (color test set-Results icon).

2. The measurement will automatically be performed and displayed.• Press CALIB (F2) if you have more than one looped device on

the line, and want to recalibrate the measurement to see thepropagation delay between two devices, not including the testset. Observe the OFFSET to see the delay between the twodevices (taking the test set to Equipment 1 measurement outof the delay measurement). Press CALIB again to take mea-surements further down the line.

• Press RESTART (F1) to perform another measurement.

5.2.6 Protocols

Frame RelayRefer to the Frame Relay user’s manual.

Ch. 5 Datacom 199

5.3 Datacom Interface Pin-outsFigures 141-148 depict the datacom interface pin-outs. The avail-able interfaces are:

• V.35 (ISO 2593)• G.703 kbit/s co-directional• RS-449 (ISO 4902)• X.21 (ISO 4903)• RS-232 (ISO 2110)• RS-530 (ISO 2110)

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Figure 141 RS530 Pin-out

200 SunSet E20/c

SS255Y

1 19

20 37

1

19

20

37

1

19

20

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Function

DB-37Female

DB-37Female

Shield 1 29 1Signal Ground

DB-37Male

DB-37Male

DB-37Male

DB-37Male

RD (a) from DCERD (b)SD (a) to DCESD (b)ST (a) from DCEST (b)RT (a) from DCERT (b)TT (a) to DCETT (b)RS (a) to DCERS (b)CS (a) from DCECS (b)RR (a) from DCERR (b)DM (a) from DCEDM (b)TR (a) to DCETR (b)LL to DCRRL to DCE

196

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Figure 142 RS449 Y Cable Pin-out

Ch. 5 Datacom 201

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202 SunSet E20/c

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Ch. 5 Datacom 203

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204 SunSet E20/c

Function 34 PinFemale

Shield 29Signal GND

34 PinMale

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TD (a) to DCETD (b)RD (a) from DCERD (b)SCTE (a) to DCESCTE (b)SCR (a) from DCESCR (b)SCT (a) from DCESCT (b)RTS to DCECTS from DCEDSR from DCEDTR to DCELL to DCERL to DCEDCD from DCE

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Ch. 5 Datacom 205

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206 SunSet E20/c

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Ch. 5 Datacom 207

5.4 Applications5.4.1 Point-to-Point Datacom Testing

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LEDMEAS

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V.35 DCEInterface

V.35 DCEInterface

V.35 DTEInterface

V.35 DTEInterface

Modem Modem

Test set 2Datacom

Port

Test set 1Datacom

Port

Figure 149 V.35 Datacom Test

Data communication uses a standard interface in order for twoequipment elements to communicate with each other. For example,V.35 is a commonly used interface. In this test, we will use theV.35 as the data communication interface. Use the test set tosend an receive the signals with another data communicationequipment. Use the following procedure:

1. Verify that the datacom circuit is not in service. This test willdisrupt the service.

2. Select TEST CONFIGURATION and configure the interface asfollows:TEST MODE: DATACOMTYPE: V.35MODE: DTETEST RATE: as specified by the span designTxDATA CLK: RECEIVECLK POLAR: as specified by the span designUSER LED 1/2: as desired

208 SunSet E20/c

Note: If the test set must supply the clock then select INTERNfor TxDATA CLK. If the test set should follow timing from the net-work select RECEIVE.

3. Connect the two test sets to the circuit as shown in Figure 149.4. Press ENTER to return to the main menu and select DATACOM

INTERFACE > LIVE TRACER (Results icon-color test set).5. Examine the status of the control leads. The terms are defined

as follows:CTS: Clear to SendDSR: Data Set ReadyDCD: Data Carrier Detect

6. On the transmit side, turn the following signals ON or OFF, totest whether the other data communication equipment isreceiving the test set's signal:RTS: Ready to SendDTR: Data Terminal Ready

7. Verify that the PAT SYNC LED is green on both test sets.8. Press ESC to return to the main menu and select, MEASURE-

MENT RESULTS (Results icon-color test set), View the mea-surement information.

• Verify the RxHz matches the TxHz.• Verify there are no slips or errors.

9. Press ERR INJ to verify that you can inject a bit error:• Confirm that the error was received by the far test set.

Ch. 5 Datacom 209

5.4.2 2M Multiplex Datacom Port Testing

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Figure 150 2M Multiplex Datacom Port Testing

Test the low speed datacom port of a 2M multiplex using the testset in DATACOM mode.

1. From the main menu, select TEST CONFIGURATION (Setupicon-color test set) and configure as follows:TEST MODE: DATACOMTYPE: as requiredMODE: DTETEST RATE: as desiredTxDATA CLK: RECEIVEUSER LED 1/2: as desiredTxCLK POLAR: as specified by the span designWhen your settings are correct, press ENTER.

2. Connect the test set to the circuit as shown in Figure 150.3. Press the LED key to acknowledge any blinking LEDs.4. From the main menu, select DATACOM INTERFACE > LIVE

TRACER and verify that DATA on the receive side says LIVE.5. Press ERR INJ to inject an error from the test set.• You can verify that this error returns to the test set by seeing

if the BIT ERROR LED lights red.• You may also want to enter MEASUREMENT RESULTS (from

the main menu) and make sure that an error has been recorded.

6. You have just checked the low-speed datacom port of the 2Mmultiplex.

210 SunSet E20/c

5.4.3 Datacom Monitoring

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1

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Figure 151 Datacom Monitoring

This test uses a RS449 interface. A terminating resistor will bepresent in RS449 and V.35 monitoring. This could cause a doubletermination and affect signal amplitude. Follow this procedure:

1. From the main menu, select TEST CONFIGURATION (Setupicon-color test set) and configure as follows:TEST MODE: DATACOMINTERFACE: RS449MODE: MONUSER LED1/2: as desiredWhen your settings are complete, press ENTER.

2. Connect the test set to both the DCE and the DTE equipment,using a Y cable (SS255Y for RS449), as in Figure 151.

3. From the main menu, select DATACOM INTERFACE > LIVETRACER and observe the control lead changes. The terms areshown in Figure 151.

4. Press TRIGON (F2) to select Trigger states; LEAD and EDGE,such as the DCD lead on a RISING edge to see when DataCarrier Detect goes On, then press ENTER. Observe theTrigger events.

5. Press ESC to return to the main menu and select MEASURE-MENT RESULTS (Results icon-color test set).A. Verify RxHz, no loss of data, and no errors.B. Page through the results screens using the F1 and F2 keys.

Observe the DTE and DCE results. You should see one BitError recorded on the DCE screen.

C. Repeat the procedure, this time injecting from the DCE tothe DTE, and looking at the DTE G.821 screen.

Ch. 5 Datacom 211

5.4.4 Fault Location with Remote & Local Loopbacks

This application provides a troubleshooting procedure using theremote and local loopback capabilities of the test set. Figure 152shows a remote and local loopback.

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Figure 152 Local and Remote Loopback

1. From the main menu, select TEST CONFIGURATION (Setupicon-color test set) and configure as follows:TEST MODE: DATACOMTYPE: per interfaceMODE: DTERATE: per modemTxDATA CLK: INTERNCLK POLAR: NORMALUSER LED 1/2: as desiredWhen your settings are complete, press ENTER.

2. Connect the test set to the modem under test.3. From the main menu, select DATACOM INTERFACE (Re-

sults icon-color test set).A. Make sure that the transmit leads RTS and DTR are turned

on. If not, select the lead and press ON (F1).B. Select LL (Local Loop) and press ON (F1). This activates a loop

on your modem; the receive data LED should light up. If theReceived data LED of the modem lights up, but not theTransmit data LED, then the modem under test is faultybecause it can’t transmit the received data back to the test set.

4. Press ESC to return to the main menu and select MEASURE-MENT RESULTS (Results icon-color test set) and verify that theRxHz is equivalent to your Test Rate. If there is a discrepancy,your modem has a problem retransmitting the clock.

5. Confirm that the receive and transmit patterns are the sameand that the PAT SYNC LED is green. If not, press AUTO. If

212 SunSet E20/c

the LED is still red, your local modem may have a problemregenerating the pattern.

6. Press ERR INJ to test the validity of your loop.• Verify that these errors are received by the test set. The BIT

ERROR LED should be red and a bit error should be recordedin MEASUREMENT RESULTS.

7. If you have completed the above steps successfully, then thelocal modem is not at fault.

8. Select DATACOM INTERFACE and turn off the Local Loop.

9. Now that you have established that the problem is not with thelocal modem, test the far end modem using a remote loopback.A. To test remote loopback, confirm that the far end modem

has loopback capability at the interface (confirm that themodem can loop TxDATA to the RxDATA , and also TxCLK,RxCLK, and TCLK).

B. To use the modem, it may be necessary to connect a PC todial out. Once the connection is made, disconnect the PCand replace it with the test set datacom connector.

• It may also be necessary to set DTR to be always on byusing the PC so you don’t drop the line when switching fromthe PC to test set datacom connector.

10.Press ESC to return to the main menu and select DATACOMINTERFACE (Results icon-color test set).A. Make sure that the transmit leads RTS and DTR are turned

on. If not, select the lead and press ON (F1).B. Select RL and press ON (F1).

11.Press ESC to return to the main menu and select MEASURE-MENT RESULTS (Results icon-color test set) and verify thatthe RxHz is equivalent to the Test Rate. If you have a low RxHz,then the clock is not being received properly from the far endmodem.

12.Check the PAT SYNC LED. It should be green.A. If it is, perform a BERT test by pressing the ERR INJ key.B. Verify that these errors come back to you. The BIT ERROR

LED should light red and a bit error should be recorded inMEASUREMENT RESULTS. If this is successful, then thephone line and the far end modem are working properly.

13. If the BERT test is unsuccessful, this indicates a problem witheither the phone line or far end modem. To test the far endmodem, perform a local loopback on that end, following theprocedure outlined in steps 4-8. If there are no problems withthis local loopback, then the problem is with the phone line. Ifthere are problems, the modem is at fault.

Ch. 6 Reference 213

Chapter 6 Reference

6.1 Standard Test Patterns2m-1: where m=15, 20, 23: are pseudo random bit sequences. Thesignal is formed from a 15, 20 or 23-stage shift register and is notzero-constrained. The patterns conform to the ITU O.151 techni-cal standard.

20ITU: 20ITU is the 2e20-1 pseudo random bit sequence. This sig-nal is formed from a 20-stage shift register and is not zero-con-strained. This pattern conforms to the ITU O.153 technical stan-dard. This pattern is not identical to 2e20, because different feed-back mechanisms are used when the patterns are produced bymeans of shift registers. 20ITU suppresses consecutive sequencesof more than 18 zeros, as opposed to 14 zeros in 2e20.

2047: The 2047 code, also known as 2e-11. Conforms to ITU-T O.152.

511: The 511 code, also known as 2e-9. Conforms to ITU-T O.152.

1111: This pattern is used for stress testing circuits. If the pattern is sentunframed, it will be interpreted as an AIS (Alarm Indication Signal).

1010: This is the alternating ones and zeros pattern. The patternis frame aligned with ‘f’ showing the location of the framing bit.The pattern is: f 0101 0101

0000: 0000 is the all zeros pattern. If the circuit is AMI, the pat-tern synch and/or signal will be lost.

FOX: The FOX pattern, which is used in data communications ap-plications. The ASCII translation of the pattern is the ‘Quick brownfox jumps over the lazy dog 1234567890’ sentence. The hexadeci-mal pattern is frame aligned to ensure proper ASCII translation ofthe bits. Hex is a 16-digit number system. These digits are: 0, 1, 2,3, 4, 5, 6, 7, 8, 9, A, B, C, D, E, and F. It is recommended that thepattern be sent with framed signals; otherwise, ASCII translation isnot possible. Here is the pattern: 2A, 12, A2, 04, 8A, AA, 92, C2,D2, 04, 42, 4A, F2, EA, 72, 04, 62, F2, 1A, 04, 52, AA, B2, 0A, CA,04, F2, 6A, A2, 4A, 04, 2A, 12, A2, 04, 32, 82, 5A, 9A, 04, 22, F2,E2, 04, 8C, 4C, CC, 2C, AC, 6C, EC, 1C, 9C, 0C, B0, 50

QRS: This is the Quasi Random Signal pattern. It is formed froma 20-stage shift register and is zero-constrained for a maximumof 14 consecutive zeros. When transmitted in a framed signal, upto 15 consecutive zeros will occur, in accordance with AMI mini-mum density requirements.

1-4, 1-8, or 3-24 : These patterns are used for stress testing cir-cuits. The patterns are frame aligned (‘f’ is the framing bit), asshown in its binary form; as an example, 1-4 : f 010

214 SunSet E20/c

6.2 E1 Technology OverviewThis E1 Technology Overview covers the fundamental conceptsin 2.048 Mbit/s technology: sampling a signal, converting thisinformation into a bitstream, and dividing the bitstream into seg-ments (channels). This section also touches upon the basics ofsignalling technologies like MFR2 and CAS.

6.2.1 Technical Standards

E1 transmission technology is defined by a number of technologystandards. Such standards allow equipment designers and ser-vice providers to ensure that various pieces of equipment arecompatible and that networks operate in a predictable, reliablemanner.

The following standards cover many of the important aspects ofE1 transmission technology:

• ITU G.703 Physical/electrical characteristics of interfaces• ITU G.704 Synchronous frame structures• ITU G.706 Frame alignment and CRC• ITU G.821 Error performance of an international connection• ITU G.826• ITU M.550/M.2100 Bringing an international connection into

service• Q.140• Q.400

Consult these standards when you need detailed information onparticular aspects of E1 transmission technology.

6.2.2 Basic Definitions

Binary Data : A signal which has been converted into a format of0s and 1s.

Bit Stream : Binary Data which has been placed in a sequence ata fixed rate.

Channel : A single portion of the bit stream which is available forbidirectional communication.

Ch. 6 Reference 215

6.2.3 Converting a Voice Signal

To transmit voice in a digital medium, such as a 2.048 Mbit/s line,we first need to encode the analog voice signal in a binary format.Then it must be converted to a bit stream suitable for digital trans-mission. This conversion can be achieved through Pulse CodeModulation. Refer to Figure 153.

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Figure 153 Converting a Voice Signal

The Nyquist theorem requires that the signal be sampled at twice thesignal's maximum frequency in order for the signal to be reproducedwithout a loss of information. For voice signals, the maximum fre-quency is approximately 4000 Hz. This provides adequate clarity whileconserving transmission bandwidth. Thus, we must sample our 4000Hz voice signal at a frequency of 8000 Hz (8000 samples/second).

The amplitude of the analog voice signal is sampled 8000 timesper second. Each amplitude value is expressed as an 8-bit code‘word’. These 8-bit words occurring 8000 times per second form a64 kbit/s digital bit stream.

The 8-bit code word is formed by comparing the amplitude of theanalog sample to a ‘companding characteristic’. The compandingcharacteristic is a formula which translates the amplitudes of thesamples into the 8-bit code words. Internationally, a compandingcharacteristic known as ‘A-law’ is used. The purpose of A-law is toprovide optimum signal to noise performance over a wide rangerof transmission levels. Linear encoding provides a poorer signalto noise ratio at the -20 dB level typical of speech. In NorthAmerica, the encoding is done according to the Mu-Law. There-fore, the companding law used for encoding the voice signal mustmatch that for decoding, for distortion-free transmission.

216 SunSet E20/c

6.2.4 2.048 Mbit/s Data Rate

The E1 signal (bitstream) is transmitted at a rate of 2.048 Mbit/s(2 048 000 bits per second). This transmission rate is achieved bycombining 32 individual 64 kbit/s bitstreams:

64 (kbit/s /Channel) x 32 (Channels) = 2048 kbit/s = 2.048 Mbit/s

This 2.048 Mbit/s signal is the overall E1 transmission rate.

6.2.5 Line Coding

Two common types of line coding are defined for use in a E1network: AMI or HDB3.

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3 #'$#'%

@2:

:

@2:

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@2:

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Figure 154 AMI & HDB3 Line Codings

AMI: This is the simplest of the two line coding formats. AMIstands for Alternate Mark Inversion, and is used to represent suc-cessive 1 values in a bitstream with alternating positive and nega-tive pulses. Figure 154 depicts these alternating pulses. AMI isnot used in most 2.048 Mbit/s transmission because synchroni-zation loss occurs during long strings of data zeros.

HDB3 :The HDB3 line coding format was adopted in order to elimi-nate these synchronization problems occurring with AMI. In theHDB3 format, a string of four consecutive zeros is replaced with asubstitute string of pulses containing an intentional bipolar viola-

Ch. 6 Reference 217

tion. As the far end equipment receives the E1 signal, it examinesthe bit stream for these intentional bipolar code violations. It thenextracts the code and reconstruct the original data. The HDB3 codesubstitutions provide high pulse density so that the receiving equip-ment is always able to maintain synchronization with the receivedsignal. For example, in the code 1000 0000, HDB3 coding substi-tutes bipolar violations for the string of zeros.

General rules apply to the substitutions. The particular substitu-tion made is governed by the polarity of the last inserted bit, aswell as the number of pulses following the previous violation bit. Ifthere is an odd number of pulses, 000V is substituted; the polarityof V is the same as that of the bit immediately preceding it. Ifthere is an even number of pulses, B00V is inserted; the polarityof B is opposite to that of the bit immediately preceding it and thepolarity of V is the same as that of B. Refer to Figure 155 to seethe types of HDB3 zero substitution codes.

Numberof pulses(since last

substitution)

Even(substitute

B00V)

Odd(substitute

000V)

Polarity of Previous Pulse

1 0 0 1 1 0 0 1

0 0 0 1 0 0 0 1

Figure 155 HDB3 Encoding

The SunSet E20 is configured to detect the two types of HDB3substitution codes, even if they are not matched to the propernumber of pulses since the last substitution.

218 SunSet E20/c

6.2.6 Signal Levels

Once a signal has been encoded into a binary format and as-sembled into a bit stream, the pulses in the bit stream are thenconverted to actual voltage levels suitable for E1 transmission.

Referring to Figure 154, you can see that a typical signal level foran E1 pulse with 75Ω impedance is either ± 2.37 volts (for abinary ‘1’ value) or 0 volts (for a binary ‘0’ value). Real-world signalvalues would typically be ± 10%.

Ideally, each pulse transmitted would be perfectly symmetrical.However, in a real-world situation, each pulse becomes slightlydistorted when it is generated and when it travels down the E1line. Refer to Figure 156 for the shape of an ‘ideal’ pulse vs. anactual pulse that would be encountered on an E1 line.

An E1 pulse may be required to conform to a standardized pulseshape. This is often determined by comparing it to a specified‘mask’. A common pulse mask is given by the ITU-T G.703 rec-ommendation.

Note: For an E1 pulse with 120Ω impedance, the signal level iseither ± 3 volts (for a binary ‘1’ value) or 0 volts (for a binary ‘0’value) with real world values typically be ± 10%.

G.703 Mask

Actual PulseIdeal Pulse

Figure 156 Pulse Shape

Ch. 6 Reference 219

6.2.7 2.048 Mbit/s Framing

E1 transmission utilizes two main types of framing: Frame Align-ment Signal (FAS) and MultiFrame Alignment Signal (MFAS). Fram-ing is necessary so that the equipment receiving the E1 signal isable to identify and extract the individual channels. PCM-31 usesFAS framing and PCM-30 uses MFAS framing with FAS framing.

Frame Alignment Signal (FAS)The 2.048 Mbit/s frame consists of 32 individual time slots (num-bered 0-31). As described previously, each time slot consists ofan individual 64 kbit/s channel of data. PCM-31 uses FAS.

In the FAS format, time slot 0 of every other frame is reserved for theframe alignment signal (FAS) pattern. Alternate frames contain theFAS Distant Alarm indication bit and other bits reserved for Nationaland International use. Hence, there are 31 time slots into which wecan place data (Figure 157).

Even Frame: Contains Frame Alignment Signal (FAS)

BITS

Time Slot 0 31...1

One 2.048 Mbit/s Frame

1 2 3 4 5 6 7 8

E 0 0 1 1 0 1 1

E 1 A Sa Sa Sa Sa Sa

Notes

Sa: This bit is reserved for national use

E: This is the error indication bit

Odd Frame: No Frame Alignment Signal (NFAS)

A: This is remote alarm indication bit (FAS)

0011011: Frame Alignment Signal

8 bits per timeslot x 8000 frames per second = 2.048 Mbps

Figure 157 FAS Framing Format

220 SunSet E20/c

The FAS format does not accommodate voice channel signalling.

The first bit (c or Si) of these frames is reserved for international use.It can be used for the CRC-4, Cyclic Redundancy Check-4, whenenhanced performance monitoring is required. Therefore, when CRCis enabled in the TEST CONFIGURATION screen, these bits de-pend upon the CRC calculation and should continually change be-tween 0 and 1. When CRC-4 is not enabled, these bits are set to 1.

In FAS framing, the odd frames do not contain the frame align-ment signal. The bits are defined as follows:

• When CRC is enabled, bit 1 is used for the Cyclic RedundancyCheck-4 performance monitoring. When CRC is enabled, thisbit may not be changed here. It may be changed when CRC isdisabled.

• The second bit is always set to 1 to avoid FAS signalsimulations.

• Bit A is used for the Remote (FAS) Distant Alarm. Set this bitto 1 to indicate an alarm condition. For undisturbed operation,this bit is set to 0.

• (bits 4-8): Spare bits; they should be set to 1 for crossing aninternational border, when not in use, as defined by ITU-T G.704.

The first bits of frames 13 and 15 transmit the two E-bits, whichare CRC-4 error indication bits. A zero in this bit denotes receivederrored sub-multiframes; a one represents received frames freeof errors.

Ch. 6 Reference 221

MultiFrame Alignment Signal (MFAS)MFAS framing provides Channel-Associated Signalling (CAS) totransmit A/B/C/D bit supervision information for each channel.This method uses the 32 timeslot frame format including timeslot0 for the FAS. This method also uses timeslot 16 for the MultiFrameAlignment signal and the Channel Associated Signalling. It takes16 frames to make up a MultiFrame.

When the MFAS frame is transmitted, all of the individual FASframes and framing information intact is left intact. The 16 FASframes are assembled together, dedicating timeslot 16 of the firstframe to MFAS framing information, then dedicating timeslot 16of the remaining 15 frames to A/B/C/D bits (Figure 158).

BITS

1 2 3 4 5 6 7 8

B C A B C DA D

Ch 1 (TS-1) Ch 16 (TS-17)

BITS

1 2 3 4 5 6 7 8

B C A B C DA D

Ch 15 (TS-15) Ch 30 (TS-31)

TS 31TS 0 -------- TS 16 --------TS 31TS 0 -------- TS 16 --------TS 31TS 0 -------- TS 16 --------

FRM 15FRM 0 FRM 3FRM 1 FRM 2 ---------

BITS

1 2 3 4 5 6 7 8

0 0 X Y X X0 0

Notes

NMFAS=XYXXX=spare bits (=1 if not used)Y=MFAS remote alarm (=1 if MFAS synchronization is lost)

MFAS multiframe consists of 16 frames

Frame 0, timeslot 16: 8-bit MFAS signal

Frames 1-15, timeslot 16:

(4 signalling bits/channel)(30 Chs)

(8 signalling bits/frame timeslot 16)= 15 frames of timeslot

16 signalling

Frame 0 TS 16 bits: MFAS=0000

Frames are transmitted with 30 voice channels intimeslots 1-15 and 17-31

Timeslot 16 (TS16) contains A/B/C/D bits for signalling(CAS)

Figure 158 MFAS Framing Format

222 SunSet E20/c

CRC-4 Error Checking in a MultiFrame Format

6

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0#

0#

3333

3333

0#

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"

"

"

"

"

"

"

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"+

"+

"+

"+

"+

"+

"+

"+

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",

",

",

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"-

"-

"-

"-

"-

"-

"-

"-

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Figure 159 CRC-4 Multiframe Format

A Cyclic Redundancy Check-4 (CRC-4) is often used in E1 trans-mission to identify possible bit errors. CRC-4 allows the detectionof errors within the 2.048 Mbit/s signal while it is in service.

CRC-4 is based on a simple mathematical calculation performedon each submultiframe of data. The equipment which originates theE1 data calculates the CRC-4 bits for one submultiframe. Next itinserts the CRC-4 bits in the CRC-4 positions in the next

Ch. 6 Reference 223

submultiframe. The receiving equipment performs the reverse math-ematical computation on the submultiframe. It examines the CRC-4 bits which were transmitted in the next submultiframe, then itcompares the transmitted CRC-4 bits to the calculated value. Ifthere is a discrepancy in the two values, a CRC-4 error is reported.

There are two things to remember when using CRC-4 errors todetermine the performance of an E1 circuit. Each individual CRC-4 error does not necessarily correspond to a single bit error. Mul-tiple bit errors within the same submultiframe will lead to only oneCRC-4 error for the block. Also, it is possible that errors couldoccur such that the new CRC-4 bits are calculated to be the sameas the original CRC-4 bits.

CRC-4 error checking provides a convenient method of identifyingbit errors within an in-service system. On an in-service system, itis generally not possible to measure the actual bit errors becausethere is no pattern synch. Bit error measurement is used on an out-of-service system because the results are slightly more precise.

CRC-4 also uses a multiframe structure consisting of 16 frames,as shown in Figure 159. However, the CRC-4 multiframe is notnecessarily aligned with the MFAS multiframe. Each CRC-4 mul-tiframe can be divided into 2 sub multiframes (SMF). These arelabeled SMF#1 and SMF#2 and consist of 8 frames apiece. Fourbits of CRC information are associated with each submultiframe.

The CRC-4 bits are calculated for each submultiframe, buffered,and inserted into the following submultiframe to be transmittedacross the E1 span.

When the terminating equipment calculates an error using CRC-4, it should transmit an E-bit to the far end, thus informing the farend equipment of the error.

224 SunSet E20/c

E-bit Performance MonitoringWhen the terminal equipment of a 2.048 circuit is optioned forCRC-4 transmission, E-bit transmission may also be enabled. E-bit performance monitoring of the circuit is now possible. The ter-minating equipment transmits an E-bit error on the 2.048 Mbit/sline, when it receives a CRC-4 error. However, E-bit error trans-mission is a relatively new feature in 2.048 transmission. There-fore, it is likely that the embedded equipment does not transmitthe E-bit error information correctly. You should check the specifi-cations of your network. Refer to Figure 160.

3

&&

&&

&>?

3

&&

Figure 160 In-service E-bit Performance Monitoring

When this type of terminal equipment detects an incoming CRC-4error, it will respond by transmitting an E-bit error toward the otherterminal. Test set 2, shown in Figure 160, will be able to see the E-bit errors by plugging into a protected monitoring point. Note that thetest set can not see the actual code errors, framing bit errors andCRC errors introduced at the trouble point. The test set can see onlythe E-bit errors transmitted by Terminal B. Thus, E-bit error trans-mission allows a 2.048 Mbit/s in-service circuit to be reliably moni-tored for transmission performance from any point on the circuit.

Without E-bit error transmission, only a complete circuit failurecan be reliably determined at any point on the circuit. With a com-plete circuit failure, the test set will see either loss of signal, alarmindication signal, or remote alarm indication.

Ch. 6 Reference 225

6.2.8 MFR2/DTMF/DP Technology

There are a number of signalling methods used by public tele-phone networks. The methods are divided between the local loopand interoffice signalling. Referring to Figure 161, the signallingapplied for each environment is as follows:

LOCAL LOOP:• Pulse• DTMF (Dual Tone Multi-Frequency)• ISDN (Integrated Services Digital Network)

INTEROFFICE:• MFR2 (Multi-Frequency)• MFC (Multi-Frequency Compelled)• SS7 (Signalling System #7)

C.O.

MFMFCSS7

Inter-office

PulseDTMFISDN

LocalLoop

LocalLoop

C.O.

Figure 161 Local Loop & Interoffice Signalling Method

Local LoopIn the local loop environment, a common signalling method isDTMF. It uses two tones, a high and a low, to represent a digit.The frequency chart is indicated in Figure 162.

1 2 3

4 5 6

7 8 9

0 #*

Low Frequency

697

770

852

941

High Frequency1209 1336 1477

Figure 162 DTMF Frequency Keypad

226 SunSet E20/c

For example, if the number 5 button is pressed, frequencies of1336 Hz and 770 Hz are generated. DTMF registers, converters,or receivers then recognize these tones as representing the digit5 and translate them into digital signals.

Pulse signalling is an older technology than DTMF, and was origi-nally used for rotary phone sets. When a number is dialled, aseries of short IDLE/SEIZURE signals are created with specifictiming, usually 10 pulses per second. If a number 3 is dialed, thewheel will send 3 IDLE/SEIZURE signals with a specific inter-digit timing between the digits. The switch will interpret the num-ber of IDLE/SEIZURE signals, and the inter-digit duration to de-termine the digit that has been dialled.

B-bit dialing is used to toggle the B-bit when seizing the line. Inthe seizure state, the B supervision bit is toggled (ABCD ABCD).If the number 463 is dialled, the B bit will flash 4 times, then restfor approximately one second, toggle six times, rest again, andtoggle 3 times.

ISDN provides digital services to end users with regular phonelines.

Interoffice SignallingMFR2 is a common signalling method used in the interoffice envi-ronment. Similar to DTMF, MFR2 uses two tones for each digitbeing dialled. However, these tones are selected from a group ofonly six frequencies. A and B bit signalling is used to seize andacknowledge the line. The references can be found in the follow-ing standards tables:

• ITU Q.441 Tables 5-9

MFC (Multi Frequency Compelled) dialling allows the two ex-changes to send digits to each other in both the forward and back-ward direction. This helps ensure accurate transmission of thedigits in a noisy environment.

Ch. 6 Reference 227

6.3 AbbreviationsAACK: Acknowledge. A control character signalling that the receiveris ready to accept the next block.

AFBER: Average Framing Bit Error Rate

AIS: Alarm Indication Signal. Indicates an all ones signal on theactive receive jack.

AISS: Alarm Indication Signal Seconds. The count of the numberof seconds in which AIS was detected.

ALM: Alarm

AMI: Alternate Mark Inversion. A method of transmitting binarydigits, in which successive ‘marks’ are of alternating polarity.

AS: Available Second

AVBER: Average Bit Error Rate

AVCER: Average CRC-4 block Error Rate

BB Channel: Bearer Channel is a 64 kbit/s ISDN user channel whichcarries digital data, PCM-encoded digital voice, or a mixture oflower-speed data traffic.

BERT: Bit Error Rate Testing

BIB: Backward Indicator Bit. Bit inverted for the negative acknowl-edgment of the BSN message.

BIT: Bit Error

BPV: Bipolar Violation

BRI: Basic Rate Interface

BSC: Base Station Controller. Part of the GSM network; managesthe radio resources for one or more BTS.

BSN: Backward Sequence Number. Indication of the last mes-sage received.

BSS: Base Station Subsystem. A major component of the GSMnetwork; contains the radio link with the Mobile Station.

BTS: Base Transceiver Station. Part of the BSS; contains theradio transmitters and receivers.

BTSLP: Bit Slip. Occurs when the synchronized pattern eitherloses a bit or gains an extra bit through stuffing.

BUFF: Buffer. A device that stores data temporarily from a fasterdevice.

228 SunSet E20/c

CCAS: Channel Associated Signalling

CC: Connection Confirm

CCH: Control Channels

CER: CRC-4 Error Rate

CIC: Circuit Identification Code is a label for circuit-related messages.

CK: Checksum. The total of a group of data items used for errorchecking purposes.

CLKSLP: Clock Slip

COD: Code

CONFIG: Configuration

CR: Connection Request.

C/R: Command/ Response. A field bit indicating whether the frametransmitted is a command or response.

CRC-4: Cyclic Redundancy Check Code-4

DD Channel: Demand Channel; carries signalling information

DASS2: Digital Access Signalling System 2

dBdsx: decibel referenced to G.703 power level

DCE: Data Circuit Equipment

DCS: Digital Cross-connect System

DET: Detected

DGRM: Degraded Minute

DIG: Digital

DPNSS: Digital Private Network Signalling System

DTE: Data Terminal Equipment

DTMF: Dual Tone Multi Frequency

EE1: 2.048 Mbit/s signal

EBER: E-bit Error Rate

EBIT: E-bit

EIR: Equipment Identity Register

ERR INJ: Error Injection

ES: Errored Second

ESF: Extended Super Frame

Ch. 6 Reference 229

FFALM: Frame Alarm

FAS: Frame Alignment Signal

FBE: Framing Bit Error

FBER: Framing Bit Error Rate

FE: Frame Error

FRM: Frame

GGSM: Global System for Mobile communications

HHDB3: High Density Bipolar Three

HEX: hexadecimal

HOLDSCRN: Hold Screen

HLR: Home Location Register

IINV: Inverted

ISDN: Integrated Services Digital Network

ISUP: ISDN User Part

KKbit/s: One thousand bits per second

LLAP-B: Link Access Protocol - Balance

LBO: Line Build Out

LOFS: Loss of Frame Second

LOG: Logical Error (BIT error)

LOS: Loss of Signal

LOSS: Loss of Signal Second

Lpp: Level peak-to-peak

LVL: Level

230 SunSet E20/c

MMbit/s: One million bits per second

MFAL: Multiframe Alarm Seconds

MFAS: Multiframe Alignment Signal

MFC: Multi-Frequency Compelled

MFE: Multiframe Bit Error

MIN: Minimum

MSC: Mobile Switching Centre

MON: Monitor

msec: 1 millisecond (1/1000 of a second)

µ-law: mu-law; voice companding law

µsec: 1 microsecond (1 millionth of a second)

Nnsec: nano second (one billionth of a second)

NE: Network Element

NT: Network Termination

NV RAM: Non Volatile Random Access Memory

PP/F: Pass/Fail

PAT: Pattern

PBX: Private Branch Exchange

ppm: parts per million

PRBS: Pseudo Random Bit Sequence

PRI: Primary Rate Interface

PRN SCRN: Print Screen

QQRS: Quasi Random Signal

RRAI: Remote Alarm Indication

RCV: Receive

REF: Reference

RESYNCH: Resynchronization

RLL: Radio Link Layer

RT: Remaining Time

RX: Receive

Ch. 6 Reference 231

SSABME: Set Asynchronous Balanced Mode Extended

SAPI: Service Access Point Identifier

SCCP: Signalling Connection Control Part

SES: Severely Errored Second

SF: Super Frame

SIG: Signal

SLIPS: Clock Slips

SYNC - Synchronized

TT: Transmit

TCH: Traffic Channels

TE: Terminal Equipment

TEI: Terminal Endpoint Identifier

TERM: Terminated

T/S: Time Slot

TS-16: Time Slot 16

TERM: Terminated

TRAU: Transcoder and Rate Adaptation Unit

TX: Transmit

UUAS: Unavailable Second

UI: Unit Interval

VVF: Voice Frequency

WWNDR: Wander

XXMT: Transmit

232 SunSet E20/c

6.4 TroubleshootingHere are some helpful suggestions for when your test set is notperforming as expected.

General troubleshooting procedure1. Check the manual for instructions on how to perform the

desired procedure.2. Verify that the TEST CONFIGURATION screen is setup

properly.3. Check that cords are connected properly to the right jacks.4. If the test set still does not behave as expected, try turning the

power off, then on.5. If the test set still does not behave properly, try ERASE

NVRAM. Refer to Chapter 3, Section 3.8.5 for the procedure.

Here are some helpful suggestions for specific problems whichmight occur.

Problem: CODE LED, frame loss LED and other error LEDs areon, but there should be no problem.

1. TEST CONFIGURATION-MODE may be wrong. Try, TERM,BRIDGE, MONITOR.

2. Check the cords; they may be loose or dirty.3. Try reversing the TX and RX cords.

Problem: CODE ERR LED is lit continuously for no apparent reason.

1. The Line Code might accidentally be set to AMI, even thoughthe received code is HDB3. Try pressing the AUTO key toautomatically reconfigure the line code. Or, you may manuallyconfigure the line code in SYSTEM PARAMETERS > MEASCONFIGURATION > CODE CONFIGUR.

Problem: Keys do not work properly.

1. Verify shift status by pressing and releasing the SHIFT key.Press and release the SHIFT key until the SHIFT statusindicator in the upper left hand side of the screen achieves thedesired condition.

2. Do not press SHIFT simultaneously with another key.3. Press the key again. The test set may not have registered it the

first time.4. Verify the LOCK indicator is not on. If it is, from MEASURE-

MENT RESULTS, press F2 to UNLOCK the keypad.

Ch. 6 Reference 233

Problem: Test set will not power up properly.

1. Make sure the battery is charged or the charger is plugged in.2. Make sure the software cartridge is inserted firmly and seated

correctly.

Problem: Test set shows Security Violation when switched on.

1. Make sure the serial number of the software cartridge matchesthe serial number of the test set.

Problem: Test set performs improperly.

1. Try switching the test set off, then switch it on.2. Try ERASE NVRAM. Refer to Chapter 3, Section 3.8.5 for the

procedure.

Problem: Measurements are not working properly (Loss of Signal,no Pattern Synch).

1. Verify signal interface and mode settings in the TEST CON-FIGURATION screen.

2. Verify that all jacks are connected properly, according to thecircuit graphic.

3. Twist the connectors inside of the jacks and ensure that allconnectors are fully inserted.

Problem: Test Patterns will not synchronize.

1. Press AUTO to force the test set to resynchronize on thePattern, Framing type, and line Coding type.

2. Verify in SEND TEST PATTERN that the desired pattern isbeing sent.

Problem: Test patterns will not synchronize with another test set.

1. Verify that PATTERN INVERSION is DISABLED in TESTPATTERN.

2. Use VIEW RECEIVED DATA to examine the pattern beingreceived.

If you are still having difficulty, contact your distributor directly orrefer to Section 6.6 of this chapter.

234 SunSet E20/c

6.5 CalibrationThe SunSet E20/c calibrates every time a full self test is per-formed. This auto calibration should take care of all the adjust-ment that the test set will need during normal operation. However,once per year the test set may also be given the following calibra-tion test procedure. If the test set fails any part of this procedure,contact Sunrise Telecom Customer Service or your national dis-tributor for further advice about possible repairs. This acceptancetest procedure may be used as part of an equipment mainte-nance program.

1. Connect a cable from LINE 1 Tx to LINE 1 Rx.A. Select SYSTEM PARAMETERS > SELF TEST (System

icon-color test set).B. Confirm that all LED's function correctly. They should turn

green first and then red during the self test (except POWERand BATTERY).

C. Error codes should not be displayed on the SELF TESTCOMPLETE screen.

D. Error codes should not be displayed in the upper left handcorner of the screen during power-up.

E. Perform ERASE NVRAM. Refer to Chapter 3, Section 3.8.5for the procedure.

2. Verify that the backlight and contrast controls work.3. Select TEST CONFIGURATION (Setup icon-color test set)

and configure as follows:TEST MODE: E1SINGLTxSOURCE: TESTPATFRAMING: PCM-30CRC-4: YESTEST RATE: 2.048ML1-Rx Port: TERMTx CLOCK: INTERNWhen finished, press ESC to return to the main menu.

4. Select SEND TEST PATTERN, select 2e23 and press ENTER.• Verify that line 1 LEDs; SIGNAL, PCM-30, CRC DET, and PAT

SYNC are green (press LED if necessary) all other LED'sshould be off.

5. Select MEASUREMENT RESULT (Results icon-color test set)and press ERR INJ 3 times.

• Verify that 3 code errors were detected.

A. Page down to the LINE 1 - FREQUENCY screen.• Verify that RCV/hz is 2048000.

Ch. 6 Reference 235

B. Page down to the LINE 1-G.821 screen.• Verify that 3 BIT errors were detected.

C. Page down to the LINE 1-ALM/SIG screen.• FOR BNC (75Ω) CONNECTORS ONLY: Verify that +LVL

and -LVL are both ± 1 db.

6. Press ESC to return to the main menu, select OTHER MEA-SUREMENTS > PULSE MASK ANALYSIS > START NEWANALYSIS and press G.703 (F1).

• Verify that the pulse shape does not fall outside the templateboundaries by more than 2 pixels.

7. Press ESC to return to the main menu and select SEND TESTPATTERN. Select FOX.

• Verify that the LED's are as they were in step 4.

8. Press ESC to return to the main menu and select > OTHERMEASUREMENTS >VIEW RECEIVED DATA. Press PAUSE(F3), then press PAGE-DN several times.

• Verify that the FOX pattern is displayed correctly in the ASCIIcolumn inside the parentheses. (THE QUICK BROWN FOXJUMPS OVER THE LAZY DOG 1234567890). Note that themessage is not displayed in time slots 00 and 16.

9. Press ESC to return to the main menu and select VF CHANNELACCESS > VF & NOISE MEASUREMENTS. Change TxMODEto TONE and listen to the speaker and verify that the volumecontrol keys work.

• Verify that Rx-1 FRQ is between 1019 and 1021 (working withethe default 1020 hz tone), and that Rx-1 LVL is between -00.5and +00.5.

9. Change INSERT TYPE to TALK and check the microphone bytalking into it and hearing your voice on the speaker.

10.Connect a cable from LINE 2 TX to LINE 2 RX.11. Press ESC to return to the main menu and select TEST CONFIGU-

RATION (Setup icon-color test set), configure as follows:

TEST MODE: E1DUALTx/INSERT: L2-TxTx SOURCE: L2-RxTxSource: TESTPATFRAMING: PCM-30CRC-4: YESTEST RATE: 2.048ML1-Rx PORT: TERML2-Rx PORT: TERMTx CLOCK: INTERN

236 SunSet E20/c

12.Verify that line 2 LEDs; SIGNAL, PCM-30, and CRC DET aregreen; all other line 2 LED's should be off (press LED ifnecessary).

• Verify that the PAT SYNC LED is green and the BIT ERRORLED is off, line 1 LED's don't matter.

13.Obtain another, known good SunSet E20/c. Connect an SCSI-36 to DB37 (female) interface cable to the first test set, whichshould be configured for DCE.A. To this cable, connect an RS449/V.36 DCE adapter cable

(DB37 male to DB37 female).B. To this cable, connect a Sunrise Telecom RS449/V.36 DTE

adapter cable (DB37 male to DB37 male).C. Make sure that the ends of the cables with the labels are

together (they should be the ends without the nuts).D. Finally, connect another SCSI-36 to DB37 (female) cable

between the second SunSet E20/E20c and the other cables.E. The PAT SYNC LED should be green; all other LED's should

be off (press LED if necessary).

14.Select MEASUREMENT RESULT (Results icon-color test set)for both test sets and press START (F3) on each.

15. Inject 3 errors, using ERR INJ, from each test set and verifythat both test sets report 3 BIT's.

16.Press ESC to return to the main menu.17. If you purchased a printer with the test set, plug the printer into

the test set and press PRINT. Observe the main menu beingprinted on the printer.

18.The procedure is now complete.

Ch. 6 Reference 237

6.6 Customer ServiceSunrise Telecom Customer Service is available from 7:30 AM to5:00 PM Pacific Standard Time (California).

Customer Service performs the following functions:

• Answers customer questions over the phone on such topics asproduct operation and repair

• Repairs malfunctioning test sets promptly• Provides information about product upgrades

The warranty period covering the SunSet E20/c is 1 year from thedate of shipment. A Return Merchandise Authorization (RMA)number is required before any product may be shipped to SunriseTelecom for warranty repair. All test sets are ‘burn-in’ tested for 24hours after repair. All repairs are warranted for 90 days. Out-of-warranty repairs require both an RMA and a Purchase Order be-fore the test set is returned.

Customer ServiceSunrise Telecom Incorporated302 Enzo DriveSan Jose, CA 95138-1860U.S.A.

7:30 AM to 5:00 PM Pacific Standard Time (California)Tel: 408-363-8000 or 1-800-701-5208Fax: 408-363-8313

Technical Support(24 hours) 1-800-701-5208E-mail: [email protected]: http://www.sunrisetelecom.com

238 SunSet E20/c

6.7 Express Limited WarrantyA. Hardware Coverage. COMPANY warrants hardware products

against defects in materials and workmanship. During thewarranty period COMPANY will, at its sole option, either (i) refundof CUSTOMER’S purchase price without interest, (ii) repair saidproducts, or (iii) replace hardware products which prove to bedefective; provided, however, that such products which COM-PANY elects to replace must be returned to COMPANY byCUSTOMER, along with acceptable evidence of purchase,within twenty (20) days of request by COMPANY, freight prepaid.

B. Software and Firmware Coverage. COMPANY warrants soft-ware media and firmware materials against defects in materialsand workmanship. During the warranty period COMPANY will, atits sole option, either (i) refund of CUSTOMER’S purchase pricewithout interest, (ii) repair said products, or (iii) replace softwareor firmware products which prove to be defective; provided,however, that such products which COMPANY elects to replacemust be returned to COMPANY by CUSTOMER, along withacceptable evidence of purchase, within twenty (20) days ofrequest by COMPANY, freight prepaid. In addition, during thewarranty period, COMPANY will provide, without charge toCUSTOMER, all fixes, patches, new releases and updateswhich COMPANY issues during the warranty period. COMPANYdoes not warrant or represent that all software defects will becorrected. In any case where COMPANY has licensed a soft-ware product ‘AS-IS’, COMPANY’S obligation will be limited toreplacing an inaccurate copy of the original material.

C. Period. The warranty period for Hardware, Software and Firm-ware will be One (1) Year from date of shipment to CUSTOMER.The COMPANY may also sell warranty extensions or providea warranty term of three years with the original sale, whichprovide a longer coverage period for the test set chassis,software and firmware, in which case the terms of the expresslimited warranty will apply to said specified warranty term.

D. Only for CUSTOMER. COMPANY makes this warranty only forthe benefit of CUSTOMER and not for the benefit of anysubsequent purchaser or licensee of any merchandise.

E. LIMITATION ON WARRANTY. THIS CONSTITUTES THESOLE AND EXCLUSIVE WARRANTY MADE BY COMPANYWITH RESPECT TO HARDWARE, SOFTWARE AND FIRM-WARE. THERE ARE NO OTHER WARRANTIES, EXPRESSOR IMPLIED. COMPANY SPECIFICALLY DISCLAIMS THEIMPLIED WARRANTIES OF MERCHANTABILITY AND FIT-NESS FOR A PARTICULAR PURPOSE. COMPANY’S LI-ABILITY UNDER THIS AGREEMENT WITH RESPECT TO APRODUCT, INCLUDING COMPANY’S LIABILITY FOR FAIL-

Ch. 6 Reference 239

URE AFTER REPEATED EFFORTS TO INSTALL EQUIP-MENT IN GOOD WORKING ORDER OR TO REPAIR ORREPLACE EQUIPMENT, SHALL IN NO EVENT EXCEEDTHE PURCHASE PRICE OR LICENSE FEE FOR THATPRODUCT, NOR SHALL COMPANY IN ANY EVENT BELIABLE FOR ANY INCIDENTAL, CONSEQUENTIAL, INDI-RECT, OR SPECIAL DAMAGES OF ANY KIND OR NATUREWHATSOEVER, ARISING FROM OR RELATED TO THESALE OF THE MERCHANDISE HEREUNDER, INCLUDINGBUT NOT LIMITED TO DAMAGES ARISING FROM ORRELATED TO LOSS OF BUSINESS, LOSS OF PROFIT,LOSS OF GOODWILL, INJURY TO REPUTATION, OVER-HEAD, DOWNTIME, REPAIR OR REPLACEMENT, ORCHARGE-BACKS OR OTHER DEBITS FROM CUSTOMEROR ANY CUSTOMER OF CUSTOMER.

F. No Guaranty, Nonapplication of Warranty. COMPANY doesnot guaranty or warrant that the operation of hardware, soft-ware, or firmware will be uninterrupted or error-free. Further, thewarranty shall not apply to defects resulting from:(1) Improper or inadequate maintenance by CUSTOMER;(2) CUSTOMER-supplied software or interfacing;(3) Unauthorized modification or misuse;(4) Operation outside of the environmental specifications for

the product;(5) Improper site preparation or maintenance; or(6) Improper installation by CUSTOMER.

240 SunSet E20/c

6.8 Certificate of OriginTo Whom It May Concern:

We, Sunrise Telecom, with principle loca-tion of business at 302 Enzo Dr., San JoséCA 95138, do hereby certify that the follow-ing product is manufactured in the UnitedStates of America.

Model NameSSE20 SunSet E20SSE20c SunSet E20cAll versions of software.

6.9 Declaration of Conformity

Index 241

IndexAABCD bits, default; 133Acceptance Test; 234AIS; 129, 213AlarmAlarm Generation; 128

Alarm Error iconAlarm Generation; 128Error Injection; 126

ALARM LED; 20AlarmsAIS; 129FAS DISTANT; 129MFAS DISTANT; 129T/S-16 AIS; 129

ALM/SIG Screen; 68AMI; 139, 216ApplicationsAccept a New Circuit; 149Checking for Frequency Synchronization; 153Connecting the Cords; 147Datacom; 207Datacom Monitoring; 210Emulating a Terminal Multiplex; 171Emulating an Add/Drop Multiplexer; 173Fault Location with Loopbacks; 211In Service Dual Drop & Insert THRU Testing; 166Measure Signal Level; 155Monitor a Voice Frequency Channel; 161Monitor an In-Service Circuit; 151Nx64 kbit/s Testing; 164Observe Network Codes or Channel Data; 159Point-to-Point Datacom Testing; 207Running a Timed Test; 158Send a Tone; 163Simple Talk/Listen; 162Testing a Terminal Multiplex; 169V.54 Channel Loopback Test; 157

ASCII; 75Automatic configuration; 16Availability; 61

BB-bit dialing; 226Backlight; 15Bandwidth, voice channel; 215

242 SunSet E20/c

Bargraph; 66BatteryCharger; 9, 18Charger Port; 22Replacing; 11Using; 23

BAUD RATE; 143BINARY; 75Binary Data; 214Bipolar Violation; 216Bit Stream; 214BLOCK; 114Block Error Ratio, Block Size; 139BREAK percentage; 116

CC-BitDefinitions; 83

CALIB; 89Calibration; 234Call Analysis; 97Call Control Procedure; 180Call Emulation; 103Receive a Call; 107Standard Emulations; 103User emulation; 109

CAS; 94, 113CASS; 221Cautions; 23, 38, 48, 53, 144, 147Certificate of Origin; 240Channel; 214Channel Bandwidth; 215Channel Data; 95Channel Loopback; 90Clear Back; 114Clear Forward; 114Clock Slips; 66Code Error; 216CoderOffset; 95Peak; 95

Coding; 139, 216Configuration, General; 142Connector Panel; 21CONTINU; 61CRCDET; 36

Index 243

Send Frame Words; 132CRC-4; 36, 42, 48, 52, 76, 220, 222CTS; 20, 180Current Histogram; 85, 88Customer Service; 237Cyclic Redundancy Check Code; 222

DData Networks; 179Data Rate; 216Datacom; 49CLK POLAR; 186DL; 194Equipment; 177Interface; 188Interface pins; 182Live Tracer; 189Monitoring; 210PATL; 194Point to Point Testing; 207port; 21Propagation Delay; 198SLIP; 195Start Trigger; 191Summary Results; 194Technology; 177Test Configuration; 183Test Mode; 183Testing, point to point; 207Timing; 190Trigger; 191View Received Data; 197View/Print Buffer; 192

Datacom Measurement Results# of BLOCKS; 195BLK ERR RATE; 195BLOCK ERROR; 195PATL; 194PATLS; 194RxDL; 194RxDLS; 194RxHz; 194RxPA; 196SLIP; 195TxHz; 194

CRC continued

244 SunSet E20/c

Date; 142DDS Shift; 39Definitions, Basic; 214Dial Parameters; 115% BREAK; 116B-BIT; 116DIAL PERIOD; 115Dial pulse; 116INTERDIGIT PRD; 115SILENT PERIOD; 115TONE LEVEL dbm; 115

Digit Analysis; 101DTMF; 97Dialing; 106

EE-BitError Transmission; 223Performance Monitoring; 224Send Frame Words; 132

E1CRC-4; 36DUAL Mode Configuration; 40Fractional; 168MUX, BERT; 49MUX Mode Configuration; 47Mux Mode Datacom Side; 49Mux Mode E1 Side; 47MUX Mode Measurement Results; 71Mux Mode MUX side; 49Pulse Quality; 79Test Mode; 35

E1DRP; 49, 50E1T/S; 50, 54Edit EmulatorReceive Side; 111Send Side; 111

Erase NV Ram; 144Error Injectionconfiguration; 126ERR INJ Key; 16LED; 16Programming Burst of 10 Errors; 127

ET; 62External Timing; 45

Index 245

FFactory Defaults; 144FAS; 219FAS DISTANT; 129FAS WORD; 133Figures001 Cartridge Installation; 10002 Replacing the Battery Pack; 11003 Configuration Screen with More Indicator; 12004 SunSet E20 Front View; 13005 F-Keys; 14006 Graphic Screen; 15007 Connector Panels; 21008 SunSet E20 Top Panel; 22009 SS115B Printer Cable Pin Assignments; 25010 Menus; 27011 Color Main Menu; 28012 Arrange Icons; 31013 Icons Profiles Screen; 31014 Icon Profiles Label Screen; 32015 Test Configuration Menu; 34016 E1 SINGL Mode Graphic; 35017 Select a Timeslot; 36018 DDS Shift; 39019 E1DUAL Mode; 40020 E1 Dual Graphic; 40021 Slave to Slave Timing; 44022 Loop/Slave Timing; 44023 External Timing; 45024 DDS Shift; 46025 E1-MUX Menu; 47026 MUXTEST Menu; 51027 MUXTEST Configuration; 51028 Internal Timing; 53029 Slave Timing; 54030 MUXTEST Configuration; 55031 Test Pattern Screen; 56032 User Test Pattern Screen; 57033 User Test Pattern Screen; 58034 Measurement Results Screen; 60035 Line 1 Summary Screen (E1 Mode); 66036 Line Frequency Screen (E1 Mode); 67037 Line Frequency/No Ref Signal; 67038 G.821 Logical Screen; 68039 ALM/SIG Screen (E1 Mode); 68040 Line 1- M.2100/550 screen (E1 Mode); 69

246 SunSet E20/c

041 Line 1- G.826 Screen (E1 Mode); 70042 Datacom Summary Results (E1-MUX Mode); 71043 Datacom Bit Error Results; 71044 Datacom Block Error Measurement; 72045 Other Measurements Menu Screen; 73046 View Received Data; 74047 FAS Frame Words; 76048 FAS Words; 77049 MFAS Frame Words; 78050 Pulse Shape Analysis Menu; 79051 Pulse Shape Analysis; 80052 C-bit Analysis; 82053 Histogram Analysis Menu; 84054 Current Histogram Menu; 85055 View Current Histogram; 86056 Saved Histogram Screen; 88057 Propagation Delay; 89058 V.54 Application; 90059 V.54 Channel Loopback Screen; 90060 VF Channel Access Menu; 91061 VF Measurements; 92062 View Line 1 & 2 CAS; 96063 Call Analysis; 97064 Call Analysis, with Trigger; 98065 DTMF Call Analysis Sample; 99066 MFR2 Call Analysis Screen; 100067 DTMF Digit Analysis Screen; 101068 Pulse Digit Analysis; 102069 Call Emulator List; 103070 DTMF Receive Sequence; 103, 104071 Call Emulation/MFCR2 Call Screen; 105072 Call Emulation/Sample Call; 106073 Receive Setup; 107074 Receive Screen Sample; 108075 User Call Emulator Screen; 109076 Call Emulator Profiles; 110077 Edit Emulator; 110078 Start User Emulation; 112079 Supervision Setup Screen; 113080 Dial Parameters; 115081 Signal Meanings Screen; 117082 Group 1 Forward Signals; 118083 Group II Forward Screen; 119084 Group A Backward Signals Screen; 120085 Group B Backwards Signals Screen; 121

Figures continued

Index 247

086 View Test Records; 122087 View a Trace; 123088 Toggle Screen; 124089 Other Features Menu; 125090 Error Injection Screen; 126091 Alarm Generation Screen; 128092 View Test Record; 130093 Memory Record Label; 131094 Send Frame Words; 132095 Automatic E-Bit Transmission; 133096 System Parameters Menu; 135097 Version/ Option Screen; 135098 System Profiles List; 136099 System Profiles Label Screen; 137100 Measurement Configuration Screen; 138101 MEAS Configuration, Screen 2; 140102 General Configuration Screen; 142103 Language Selection Screen; 145104 Plugging in-TERM Mode; 147105 Plugging in-Monitor Mode; 148106 Plugging in-THRU Mode; 148107 Accept a New Span; 149108 Monitor an In-Service Circuit-Monitor Mode; 151109 Monitor an In-Service Circuit-Bridge Mode; 152110 Frequency Synchronization; 153111 Measuring Signal Level; 155112 V.54 Application; 157113 View Received Data; 159114 Fractional E1 Testing; 165115 Dual Drop & Insert THRU Mode, L1-Tx Port BRI; 167116 Dual Drop & Insert THRU Mode, L1-Tx Port MON; 167117 MUXTEST Setup; 169118 E20 MUXTEST Configuration; 169119 Emulating a Terminal Multiplex; 172120 Emulating an Add/Drop Multiplex; 173121 Emulating Add/Drop MUX; 175122 Data Communication Facilities; 177123 Full-Duplex Call Procedure; 180124 V.35 DB-34 Interface; 182125 Test Configuration-DATACOM; 183126 Select Fractional Rate; 185127 Datacom RS232A Configuration Screen; 186128 Main Menu/Datacom Interface; 188129 Datacom Timing Analysis Menu; 188130 Datacom Interface Screen-Graph; 189

Figures continued

248 SunSet E20/c

131 Datacom Interface-Table; 190132 Start Trigger; 191133 View/Print Buffer-Graph; 192134 Datacom Printouts; 193135 Datacom Summary Results-Page 1; 194136 Datacom Measurement Results-Page 2; 195137 Datacom Measurement Results-Page 3; 195138 DATAMON Results; 196139 Datacom View Received Data; 197140 Propagation Delay; 198141 RS530 Pin-out; 199142 RS449 Y Cable Pin-out; 200143 RS232 Pin-out; 201144 X.21 Pin-out; 202145 G.703 Pin-out; 203146 V.35 Pin-out; 204147 V.35 DCE Pin-out; 205148 V.35 DTE Pin-out; 206149 V.35 Datacom Test; 207150 2M Multiplex Datacom Port Testing; 209151 Datacom Monitoring; 210152 Local and Remote Loopback; 211153 Converting a Voice Signal; 215154 AMI & HDB3 Line Codings; 216155 HDB3 Encoding; 217156 Pulse Shape; 218157 FAS Framing Format; 219158 MFAS Framing Format; 221159 CRC-4 Multiframe Format; 222160 In-service E-bit Performance Monitori; 224161 Local Loop & Interoffice Signalling Method; 225162 DTMF Frequency Keypad; 225

Frame Alignment Signal; 76, 219Frame WordsSend frame words; 132

Framing; 35, 41, 48, 52, 219FRM; 62Multiframe; 78PCM-30; 37, 42PCM-31; 37, 42VF Analysis; 91

Frequency Screen-Meas. Results; 66

Figures continued

Index 249

GG.703; 79, 80, 214Pulse Mask; 80

G.704; 214G.706; 214G.821; 68, 214Measurement Results; 68

G.826%BBE; 70BBE; 70EB; 70Measurement Results; 70SES; 70

General ConfigurationBACK LIGHT; 142BAUD RATE; 143BITS/CHAR; 143CR/LF INSRT; 143DATE (Y- M - D); 142PARITY; 143PRINT FORMAT; 143STOP BIT; 143TIME (H :M :S); 142

Graphic Display; 16Graphic Screen; 35

HHDB3; 48, 52, 139HDLC; 182HEADPHONE; 21HEX; 75Hexadecimal keys; 17Histogram Analysis; 84Current Histogram; 85, 88

HOLDSCR; 61HRP MODEL % Configuration; 141

IIcon; 28Deleting an Icon Profile; 33Invoking an Icon Profile; 33Menus; 29Setup, Channel Loopback; 90Setup, Datacom Mode Test Configuration; 183Setup, Test Configuration; 34Storing an Icon Profile; 32System, Erase NV Ram; 144

250 SunSet E20/c

System, Factory Defaults; 144System, General Configuration; 142System, MEAS Configuration; 138System Profiles; 136System, Self Test; 144System, Version/Option; 135VF & Noise Measurements; 92VF Call Analysis; 97VF Call Emulator; 103VF Channel Access; 91VF Dial Parameters; 115VF Signal Meanings; 117VF Supervision Setup; 113VF, View Line CAS; 96

Idle; 113Channel Signalling; 141Code; 141Signal; 91

Intentional BPV; 216Interdigit Period; 115Interface Pins; 182, 199Internal Timing; 38, 45INVERT; 56ITU-T Q.441; 117

KKeypad Keys; 14–260, 1, 2, 3, 4, 5, 6, 7, 8, 9; 17A, B, C, D, E*, F#; 17Arrows; 16AUTO; 16, 34Contrast; 16ENTER; 17ERR INJ; 16ESC; 17F-keys; 14GRAPH; 15Light; 15MEAS; 16POWER; 17PRINT; 15SHIFT; 14Volume; 16

Icon continued

Index 251

LL1+L2; 94L1-Rx; 38PORT; 37

L2-Rx; 38Language; 145LEDs; 18AIS; 19Alarm; 20Code error; 19CRC Detect; 19CTS; 20Datacom; 20Green; 18PCM-30; 19PCM-31; 19POWER; 18Power; 18Red; 18RTS; 20RxDCE; 20Signal; 19USER1 & USER 2; 20User1/User2; 187

Line 1 TX; 22Line code; 48, 52Line Coding; 216LINE FREQUENCY screen; 67Line1 RX; 22Live Tracer; 189Local Loop; 225LOCK/UNLOCK; 61Loss of Frame; 36

MM.2100; 214M.2100/550; 69M.550; 214M2100/500 Screen; 69%ES; 69%SES; 69P/F; 69PERIOD; 69

MEAS ConfigurationBLOCK SIZE; 139CODE CONFIGUR; 139DGRM; 140

252 SunSet E20/c

G.821; 140G.826; 141IDLE CHNL A/B/C/D; 141IDLE CHNL CODE; 141M.2100; 141MEAS DURATION; 138MEASURE MODE; 139PRINT EVENT; 140PRINT RESULT; 140

Measurement Result Definitions%AS; 63%DGRM; 64%EFS; 64%ES; 64%SES; 65%UAS; 65(CODE) RATE; 63(CRC) RATE; 64+LVL; 64+WANDR; 65-LVL; 64-WANDR; 65± RxLVL; 65AISS; 63AS; 63BER; 63BIT; 63CLK SLIP; 63CODE; 63CRC; 63DGRM; 64EBER; 64EBIT; 64EFS; 64ES; 64FALM; 64FE; 64Hz/PPM; 64LOFS; 64LOSS; 64Lpp; 65MAX Hz; 65MFAL; 65MFE; 65MIN Hz; 65

M2100/500 Screen continued

Index 253

RCV Hz; 65RxCLK; 65SES; 65SLIP; 65UAS; 65

Measurement ResultsDATACOM; 194E1-MUX mode; 71MUXTEST mode; 72VF; 94

MeasurementsDuration of; 138Start; 138

Memory Card, SRAM; 10, 84Menu Tree; 27MFAS; 219, 221DISTANT; 129DISTANT Alarm; 129Framing Bits; 78WORD, Send Frame Words; 133

MFC; 226MFR2; 97, 106, 226More Indicator; 12MultiFrame Alignment Signa; 221MultiFrame Alignment Signal; 219Multiplexing Capabilities; 47MUXTEST mode; 51BERT side; 54Datacom side; 54E1 side; 51Measurement Results; 72Timing; 53

NNFAS WORDS-Send Frame Words; 134Noise 1010 Hz Measurement; 95Noise Psophometric Measurement; 95Nyquist Theorem; 215

Measurement Result Definitions continued

254 SunSet E20/c

OOC-48; 28Off Hook Signalling; 226OFFSET; 38Options; 135OSI Standard; 182Other Features; 125Other Measurements; 73

PPARITY; 143PAT SYNC; 18Pattern Synchronization; 18PCM; 215PCM-30; 19, 219PCM-31; 219Physical Layer Protocol; 182Printer; 24Port; 22Print Format; 143Settings; 142

Printing; 24Profiles; 33Propagation Delay; 89Pulse; 116Pulse Code Modulation; 215Pulse Digit Analysis; 102Pulse Mask Analysis; 79View Last Pulse Shape; 81

Pulse Signalling; 97

QQ.422; 113Q.441; 226QRS; 213Quasi; 213

RReceiver; 37Receivers; 43e1-mux; 48

Reference Clock; 66Replacing the Battery; 11Results IconC-Bit Analysis; 82Datacom Interface; 188Datacom Menus; 183Histogram Analysis; 84

Index 255

Measurement Results; 60Other Measurements; 73Propagation Delay; 89Send Frame Words; 132View FAS Words; 76View MFAS Words; 78View Received Data; 74View Results Records; 130

RMA (Return Merchandise Authorization); 237RS-232 Interface; 22RT; 62RTS; 20, 180Rx/DROP; 41, 47, 52RxDTE; 20

SSeizure; 114Select Timeslot Screen; 36, 42Self Test; 144Send and Receive a Tone; 168Send Frame Words; 132Serial Port; 22Settings; 24

Signal Level; 218Signal Meanings; 117Signal-to-Noise measurement; 94Signalling; 96, 113Slave Timing; 43Software; 7Cartridge; 9, 144Serial Number; 10Version; 135

SS#5; 97Stop Bit; 143Summary Screens; 66Supervision; 113System Parameters; 135System Profiles; 136Default; 137Delete; 137Enter a New Profile; 136Stored; 137

Results Icon continued

256 SunSet E20/c

TT/S; 75T/S-16, AIS Alarm; 129Tables01 Headphone Coversion; 2102 SS118B/C/D Printer Switch Settings; 2503 C-bit Definitions; 8304 Group 1 Forward Labels; 11805 Group II Forward Labels; 11906 Group A Backward Signal Labels; 12007 Group B Backward Labels; 12108 Type Versus Test Rate; 18409 Lead States; 187

TCP/IP; 182Technical Standards; 214Technology Overview; 214Test Configuration; 34Test Pattern; 56, 2130000; 2131-4; 2131010; 2131111; 2132047; 21320ITU; 2132e23, 2e20, 2e15; 2133-24; 213511; 213Create a User Pattern; 57Delete a User Test Pattern; 59Editing a User Pattern; 58FOX; 213Sending a User Test Pattern; 57Standard Patterns; 56User; 57User Test Patterns; 57Viewing a User Test Pattern; 57

Test Rate; 36, 42Time; 142Time slots; 219Timing; 43Tone Level; 115TOUT; 111Transmission Basics; 178Trigger; 191TRIGON; 191Troubleshooting; 232

Index 257

TTL-L2; 39TX CLOCK; 38dual E1; 43

Tx SOURCE; 35, 41Tx/INSERT; 47, 52TYPE; 54e1 mux; 49

UUnit Interval (UI); 89, 198Unpacking; 9User Emulation; 109USER1 & USER 2 LEDs; 20

VV.35; 182, 207V.54; 90VF & Noise Measurements; 923-K Flat measurement; 94

VF Channel Access; 91Dial Parameters; 115View CAS; 96

VF Digit AnalysisdBm; 101H/L Hz; 101INTD; 101PERD; 101PPRD; 102PPS; 102TWIST; 101

VF Meas. Results1010 (dBm); 953K (dBm); 94frequency; 94level; 94OFFSET; 95PEAK; 95PSOP (dBm); 95RxABCD; 94RxDATA; 95S/N (dB); 94

Voice bandwidth; 215

WWarnings; 8Warranty; 237Registration; 9

258 SunSet E20/c

XX.21Datacom Interface; 189

XMT CLOCK; 53INTERN; 45

sunset e20c manual

Documents

muxtest mode results

e1 results

e1singl mode

e1dual mode

histogram analysis

trade secrets of sunrise

summary screens

almsig screens