SURFPAK®-SJ/SV/PRO is a dedicated software for Mitutoyo Surftest surface roughness testing

instruments. It utilizes the Windows®OS, and provides advanced data processing capabilities — an

intuitive graphical interface speed, calculation and display of measurement results, etc. for surface

texture analysis. The SURFPAK® Series software includes a variety of evaluation parameters

conforming to most of the world's standards, analysis graphs, and digital filters. In addition, the

optional printer allows reports to be generated at the time of measurement.

CATALOG No. E4170 -178

SURFPAK®-SJ/SV/PROSurface Texture Analysis Software

2

• Enhanced with various control functions to support automatic measurement.• Equipped with a variety of evaluation parameters conforming to most of the world standards

and various analyzing functions.• Allows the operator to perform a complicated measurement easily and speedily with mouse.• SURFPAK®-SJ is an optional software package for Mitutoyo SJ-201/301/401 Surftest.• SURFPAK®-SV is the standard software package provided for Mitutoyo SV-Series Surftest.

Measuringconditionsetting window

Surface texture-analyzing program

SURFPAK®-SJ, SURFPAK®-SV

Assessed profilewindow:The size of theassessed profiledisplay can befreely changed.

Measurementresult window:Provides a greatvariety ofparametersconforming tomost of theworld's standards.

Analysis graphwindow:Various analysisgraphs can becreated.

Evaluationconditionswindow:For variousrecalculations ofthe measureddata.

Easy operation with mouse• The arrangement of machine control icons deffers depending upon the Surftest measuring unit to be used with.

Machine operationicons for the SV-SeriesSurftest

Machine operation iconsfor the SJ-201/301/401Surftest

Window in measuring...

SURFPAK®-SV

SURFPAK®-SJ

Surface texture-analyzing program

SURFPAK®-SJ, SURFPAK®-SV

SURFPAK-SJ/SV/PRO

5

L

∆y

∆x

θ

SURFPAK®-SJ and SURFPAK®-SV SpecificationsIndustrial standards to be conformed

Assessed profiles

Evaluation P, R, WC, WCA, WE,parameters WEA, DIN4776, E

R-motif

W-motif

Analysis graphs

Digital filter

Cutoff length*

Sampling length (L)*

Data compensation

Data deletion function

Recording magnifications

Special functions for report generation

OS requirement

ISO 4287:1997, ANSI/ASME B46.1-1995, JIS B0601 1994, JIS B0601 2001 etc.

P (primary profile), R (roughness profile), WC, WCA, WE, WEA, DIN4776 profile,E (envelope residual profile), R-motif (roughness motif), W-motif (waviness motif)

Ra, Rq, Rz, Rz(JIS), Ry, Ry(DIN), Rc, Rpi, Rp, Rpmax, Rvi, Rv, Rvmax, Rti, Rt, R3zi, R3z, R3y, S, Pc (Ppi), Sm, HSC,mr, δc, plateau ratio, mrd, Rk, Rpk, Rvk, Mr1, Mr2, ∆a, ∆q, λa, λq, Sk, Ku, Lo, Lr, A1, A2

Rx, R, AR, SR, SAR, NR, NCRX, CPM

Wte, Wx, W, AW, SW, SAW, NW

ADC, BAC1, BAC2, power spectrum chart, auto-correlation chart, Walsh power spectrum chart, Walshauto-correlation chart, slope distribution chart, local peak distribution chart, parameter distribution chart

2CR-75%, 2CR-50%, 2CR-75% (phase corrected), 2CR-50% (phase corrected), Gaussian-50% (phasecorrected)

λc: 0.025mm†, 0.08mm†, 0.25mm, 0.8mm, 2.5mm, 8mm, 25mm† or arbitrary value(.001"†, .003"†, .01", .03", .1", .3", 1"† or arbitrary value)

fl: 0.08mm†, 0.25mm, 0.8mm, 2.5mm, 8mm, 25mm† or arbitrary value(.003"†, .01", .03", .1", .3", 1"† or arbitrary value)

fh: 0.08mm†, 0.25mm, 0.8mm, 2.5mm, 8mm or arbitrary value(.003"†, .01", .03", .1", .3" or arbitrary value)

0.025mm†, 0.08mm†, 0.25mm, 0.8mm, 2.5mm, 8mm, 25mm† or arbitrary value(.001"†, .003"†, .01", .03", .1", .3", 1"† or arbitrary value)

Tilt compensation, R-plane (curved surface) compensation, ellipse compensation, parabola compensation,hyperbola compensation, quadric curve automatic compensation, polynomial compensation, polynomialautomatic compensation

• Data deletion to avoid an over-range error• Data deletion in a specific range to perform recalculation• Automatic data deletion (according to a condition preset)

Vertical: 100X - 500,000XHorizontal: 1X - 10,000X

• Bit-map image paste-up function• Multiple data layout function

Windows®NT4.0/Windows®2000/Windows®XP

*Arbitrary value can be specified in the following range: SURFPAK®-SJ — from 0.3mm (.012") to the maximum traverse length.SURFPAK®-SV — from 0.025mm (.001") to the maximum traverse length.

†Not available on SURFPAK®-SJ

Data communication with Surftest SJ-201/301/401• The assessed profiles, calculation results, measuring conditions, and comments can be

freely laid out and printed out as reports.• Cut and paste-up not only the measurement data but also image files (bit map) to create

unique reports with photos and company logos.

12AAA88212AAA208

12AAA841

Order No.

Applicable Surftest

Connector type

Cable length

12AAA208

SJ-201

12AAA882

SJ-301, SJ-401 Order No.

Data storage media

Data capacity

12AAA841

COMPACTFLASH™

8MB

D-SUB (9-pin)

2m (6.56 feet)

RS-232C Connecting Cables• The RS-232C Connecting Cables connect the Surftest SJ-201,

SJ-301, or SJ-401 with the external PC.• Compatible with the RS-232C Interface.• By using the software, SURFPAK®-SJ, measurement results and

measuring conditions can be output to the PC. It also allowsthe operator to operate the Surftest from the PC.

Memory Card• For storing the evaluation, sampling, and statistical analysis

result data acquired with the Surftest SJ-301 and SJ-401.• Can store the maximum of 20 measuring conditions.• The optional card reader allows the data collected at the

measurement site with the SJ-301 or SJ-401 to be broughtinto the laboratory, etc. where the data can be analyzedusing SURFPAK®-SJ.

3

Various Types of Analysis Graphs• Provides various types of analysis graphs, such as BAC

(material ratio curve), ADC (profile height amplitude curve),power spectrum chart, etc. for diverse evaluations of surfacetextures.

• The graph profiles help visual assessment of the surfacetexture of workpiece.

Straightness Compensation Function• Improves the mechanical straightness of the X-axis drive unit.• Eliminates straightness error from the measured data, based

on the drive unit error data obtained from the measurementof a master plain such as an optical flat.

Auto-correlationchart

ADC (profileheightamplitudecurve) & BAC(material ratiocurve)

Enlarged displayof measuredprofile

Conforming to the World's Standards• Conforming to the world surface roughness standards including DIN, ISO, JIS, Motif, etc.• Combinations of a variety of evaluation profiles and parameters satisfy various needs for surface roughness evaluations.

Measuring conditions settingwindows (SURFPAK®-SV)

Easy Calibration Operation• Calibration can be easily performed by measuring a reference

roughness specimen the reference value of which wasentered with the ten-key.

Measuring conditions settingwindow (SURFPAK®-SJ)

Calibrationwindows

SURFPAK-SJ/SV/PRO

4

Recalculation Function• Once the measured data is stored in the hard disk, the

operator is able to perform recalculation on the measureddata by changing evaluation range, cutoff length, etc. oradding evaluation parameters and analysis graphs asrequired.

• Measurement conditions once set can be easily retrieved.

Data Compensation Function• Tilt compensation: Compensates tilt in the measured data. In

addition to the compensation of the entire data, thecompensation of a desired area is also possible.

• R-plain compensation: Compensates the measured data toeliminate curvature in the measurement of the surface textureof R (curved surface such as cylinder or sphere), processingthe data as those of a flat surface.

• Equipped with polynomial automatic compensation functionfor the elimination of irregular surface texture elements, etc.

Effective range

Delete Delete Delete

Unnecessary Data Deletion• Deletes unnecessary data points, then recalculates the data or

resets the evaluation length and the evaluation range.• Automatically deletes unnecessary data points when

conditions are set at the time of measurement. (Theworkpiece surface, as shown below, can be automaticallyevaluated with the groove excluded, for example.)

Layout edit window

Bit-map image paset-up function

Printout examples

Report Generation Function• The assessed profiles, calculation results, measuring

conditions, and comments can be freely laid out and printedout as reports.

• Cut and paste-up not only the measurement data but alsoimage files (bit map) to create unique reports with photosand company logos.

• Create one layout and use it also for other measurements.• Reports can be printed on large size paper or in color using

the optional color printer.

Evaluating conditionssetting windows

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• SURFPAK®-PRO provides a variety of graphics methods and evaluation parameters for varioussurface texture evaluations from the three-dimensional topography data.

• A desired topographic profile can be analyzed two-dimensionally, thus allowing the evaluationof fine contour and fine texture at the same time.

• SURFPAK®-PRO is the standard software package provided for Mitutoyo Surftest SV-3000•3D.

3-D topography (contour lines) display

Surface texture-analyzing program

SURFPAK®-PRO

Peak height distribution chart

3-D topography display

Cross-section analysis display

Probability distribution chart BAC (material ratio curve) &ADC (profile height amplitude curve)

Measurement result windows

Surface texture-analyzing program

SURFPAK®-PRO

7SURFPAK-SJ/SV/PRO

Industrial standards to be conformed

Assessed profiles

P, R, WC, WCA, WE,WEA, DIN4776, E

R-motif

W-motif

Three-dimensional evaluation parameters(Can be obtained from a dense group ofassessped profiles — primary profiles,roughness profiles, or waviness profiles)

Topographic profile sampling function

Analysis graphs Two-dimensional

Three-dimensional

Digital filter Two-dimensional

Three-dimensional

Cutoff length*

Sampling length (L)*

Data compensation (Two-dimensional)

Trend compensation (Three-dimensional)

Data deletion function

Recording magnifications

Special functions for report generation

OS requirement

SURFPAK®-PRO SpecificationsISO 4287:1997, ANSI/ASME B46.1-1995, JIS B0601 1994, JIS B0601 2001 etc.

P (primary profile), R (roughness profile), WC, WCA, WE, WEA, DIN4776 profile,E (envelope residual profile), R-motif (roughness motif), W-motif (waviness motif)

Ra, Rq, Rz, Rz(JIS), Ry, Ry(DIN), Rc, Rpi, Rp, Rpmax, Rvi, Rv, Rvmax, Rti, Rt, R3zi, R3z, R3y, S, Pc (Ppi), Sm,HSC, mr, δc, plateau ratio, mrd, Rk, Rpk, Rvk, Mr1, Mr2, ∆a, ∆q, la, lq, Sk, Ku, Lo, Lr, A1, A2

Rx, R, AR, SR, SAR, NR, NCRX, CPM

Wte, Wx, W, AW, SW, SAW, NW

Sa (arithmatic mean deviation), Sq (root-mean-square deviation), Sz (ten-point height of irregularities),Sp (maximum profile height), Sv (maximum profile valley depth), St (total height), S3y (third maximumpeak-to-valley height), Spc (peak count), Svc (valley count), Spd (peak density), Svd (valley density),Ssk (skewness), Sku (kurtosis), S∆q (root-mean-square slope), Sλ (root-mean-sqaure wavelength),So (developed area), Sr (developed area ratio)

A desired corss-section which is included in a three-dimensional topography data can be analyzed two-dimensionally.

ADC, BAC1, BAC2, power spectrum chart, auto-correlation chart, Walsh power spectrum chart, Walshauto-correlation chart, slope distribution chart, local peak distribution chart, parameter distribution chart

3-D topography display, 3-D topography (contour line) display, topographic profile (cross-section)analysis, ADC, BAC1, BAC2, power spectrum chart, probability distribution chart, local peak distributionchart, parameter distribution chart, slope enhansement

2CR-75%, 2CR-50%, 2CR-75% (phase corrected), 2CR-50% (phase corrected), Gaussian-50%

Moving average filter, Gaussian filter

λc: 0.025mm, 0.08mm, 0.25mm, 0.8mm, 2.5mm, 8mm, 25mm or arbitrary value(.001", .003", .01", .03", .1", .3", 1" or arbitrary value)

fl: 0.08mm, 0.25mm, 0.8mm, 2.5mm, 8mm, 25mm or arbitrary value(.003", .01", .03", .1", .3", 1" or arbitrary value)

fh: 0.08mm, 0.25mm, 0.8mm, 2.5mm, 8mm or arbitrary value(.003", .01", .03", .1", .3" or arbitrary value)

0.025mm, 0.08mm, 0.25mm, 0.8mm, 2.5mm, 8mm, 25mm or arbitrary value(.001", .003", .01", .03", .1", .3", 1" or arbitrary value)

Tilt compensation, R-plane (curved surface) compensation, ellipse compensation, parabolacompensation, hyperbola compensation, quadric curve automatic compensation, polynomialcompensation, polynomial automatic compensation

Plane compensation, sphere compensation, cylinder compensation, polyhedron compensation

• Data deletion to avoid an over-range error• Data deletion in a specific range to perform recalculation• Automatic data deletion (according to a condition preset)

Vertical: 100X - 500,000XHorizontal: 1X - 10,000X

• Bit-map image paste-up function• Multiple data layout function

Windows®NT4.0/Windows®2000/Windows®XP*Arbitrary value can be specified in the range from 0.025mm (.001") to the maximum traverse length.

Leveling is complete

Leveling is not complete

Can be used with 3-DAuto-leveling TableThe 3-D auto-leveling table, which is astandard accessory for Mitutoyo SurftestSV-3000•3D, adjusts the level of themeasuring surface of the workpieceautomatically. This relieves the operatorfrom the time-consuming manualadjustment that a conventional typemachine would require, thus greatlyimproving work efficiency.

Two-dimensionalevaluationparameters

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Various Contour Evaluation Commands• By combining contour elements such as point, line, circle,

and coordinates, various evaluations can be performed,including the length measurement of step and pitch, the areacalculation, etc.

Data Processing Function• Allows assessed profile filtration, deletion of data, data cut-off,

and combination of data from multiple measurements.

Data Compensation Function• Circular error compensation function: Compensates circular-

movement error of the stylus to reduce distortion, thusobtaining the data that is closest to the actual contour data.

• Stylus-tip diameter compensation: Offsets the measured datafor the stylus-tip diameter.

Data display window

Report Generation Function• Just like the SURFPAK® series software, FORMPAK®-SV allows

measurement results to be freely laid out and printed out asreport. This program also supports the optional color printer.

Operation guide window

Operation procedure window

Command icons

Measurement result window

• Evaluates the fine texture of the workpiece surface that cannot be evaluated in the surfaceroughness parameters.

• Performs various analyses/evaluations including the contour evaluation of step and pitch andthe calculation of areas.

• In addition to dimensional measurement capabilities (angles, radii, and distancesmeasurement), the contour tolerancing function for evaluating "form".

Fine contour analyzing software for Surftest

FORMPAK®-SVFine contour analyzing software for Surftest

FORMPAK®-SV

9SURFPAK-SJ/SV/PRO

Measureddata

Tolerancing Nominaldata

Best-fitprocessing

Tolerancingcalculation

Tolerancingresults display

Contour tolerancing flow

• Created by the function• Converted from the

master measured data• Input from CAD

Measureddata

Tolerancing Nominaldata

Best-fitprocessing

Tolerancingcalculation

Tolerancingresults display

FORMPAK®-SV SpecificationsCompatibleSURFPAK®

Series

Operationcommands

Contourtolerancing

Specialfunctions

OSrequirement

SURFPAK®-SV, SURFPAK®-PRO

Point measurement: Point, peak, contact, intersection,bisector-point (between elements/between piecesof measured data)

Line measurement: Line, tangent line, perpendicular,parallel line, bisector

Circle measurement: Circle (multi-point/range/centerand radius), contact circle

Position/difference: Coordinate difference, trueposition judgment

Distance/angle: Distance, groove width, step pitch,angle, reference setting (point/line/circle)

Coordinate system setting: Origin setting, coordinatesystem rotation

Calculation/statistics: Arithmetic calculation, absolutevalue, square root, maximum value, minimum value,mean, sum, standard deviation, unbiased standarddeviation, area, automatic circle/line definition

Editing of measured points: Data deletion,translation, rotation, mirror image, positioning,combination, separation, projection, offsetting,idealizing

• Nominal data creation: Function specification (line/circle/aspheric surface, etc.), CAD data input (IGES/DXF), measured data conversion, text file conversion

• Tolerancing direction setting: Normal direction, X-axisdirection, Z-axis direction

• Reference coordinate system translation/rotation• Best-fit: X-axis translation, Z-axis translation, rotation,

combination of several motions• Nominal data tolerancing• Result display: Lists, graphics

(i) Sub-part program: Calculation procedure can beregistered as a sub-part program. The sub-partprogram can be integrated into a part program,facilitating measurement of a batch of workpieces.

(ii) Measured data/condition saving: Measured data andanalysis procedure can be saved in the hard disk.

(iii) Report creation function: Recorded profiles,measurement results and measurement conditionscan be arranged in a form and laid out as desired.This function allows an original result report to becreated and printed out.

(iv) External output of data: Analysis results (numericalvalues) can be output in the CSV format, andtherefore, can be easily accessed by spreadsheetsoftware on the market. Also, measured data(multi-point data) can be output in the ASCII code.

(v) Part program creation: Measurement procedurescomplete with measurement, analysis, contourtolerance judgment, print, and save as a file, can beregistered as a part program. The part program canbe used for automatic measurements.

(vi) Polar coordinate development display: Develops acircular form on to the polar coordinate system,where the range for circle calculation can bespecified.

Windows®NT4.0/Windows®2000/Windows®XP

Contour tolerancingfunction• This function compares measured form

data with nominal data, displays thedeviation, and then stores it. Formdata is different from dimensionalmeasurement of angle, radius, etc. Inaddition to values obtained from anideal contour in a CAD drawing,nominal values can also be created byconverting the measured data of amaster.

Tolerancing result window

Developed error display window

External output function• Calculation results and tolerancing

results can be output in a readableformat to commercial spreadsheetsoftware. This function increasesprocessing capabilities includingstatistical calculation, saving, andmanagement of measurement results.It also allows measured point groupdata to be output in a text format.

Icon editing function• Measurement icons can be rearranged

or replaced as desired. It is alsopossible to enlarge the icons forgreater visibility.

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Rolling circle

Locus of the rolling circle

Enveloperesidual

100λc= 0.08 λc= 0.8 λc= 8

λc= 0.25 λc= 2.5Unit: mm

50

0.025 0.08 0.25 0.8Wavelength (mm)

2.5 8 25

10

Am

plit

ud

e tr

ansm

issi

bili

ty (

%)

Damping characteristics of cutoff filter (Gaussian-50% type)

Primary profile

Roughnessprofile

Wavinessprofile

Longwavelength

Shortwavelength

Roughnesscomponent

Wavinesscomponent

SURFTESTTERMINOLOGYSURFTESTTERMINOLOGY

DIN4776 profileFor surfaces to be measured having deepvalleys with respect to the irregularity on thesurface, the position of the mean line may becalculated to the position shifted from theposition where it is supporsed to be for

P: Primary profileThe primary profile is a profile obtained byintersecting a surface with a plane normal tothe nominal surface. It is a representation ofthe real profile (a profile of the real surface)obtained by a Surftest.

R: Roughness profileThe roughness profile is an assessed profilewhich is obtained from the primary profile byfiltering longer waves (waviness components)as specified by cutoff length λc.

W: Filtered waviness profileThe filtered waviness profile is a profileresulting from a primary profile that has itsshorter wavelength components and longerwavelength components removed throughfiltering.

WCA: Filtered center linewaviness profileThe filtered center line waviness profile is anassessed profile which is obtained from theprimary profile by filtering longer waves(waviness components), as specified by fl, andshorter waves (roughness components), asspecified by fh, while passing mid-rangewaves.

WE: Rolling circle waviness profileA rolling circle waviness profile is the locus ofpoints formed by the center of a circle with agiven radius that rolls over the workpiecesurface (while removing roughnesscomponents). This circle is called the rollingcircle.

WEA: Rolling circle center linewaviness profileA rolling circle center line waviness profile isthe profile that results from a rolling circlewaviness profile that has its longerwavelength components (called "wavinesscomponents") filtered out.

E: Envelope residual profileAn envelope residual profile is a profile of theresidual (deviation) of a calculated rolling circlewaviness profile from the primary profile.

Cutoff lengthThe cutoff length is a sampling length (e.g.wavelength: λ) to be used to filter the primaryprofile. The cutoff length to reject longwavelength (or low frequency) data to obtainthe roughness profile is known as λc; thecutoff length to reject short wavelength (orhigh frequency) data to obtain the wavinessprofile is known as fh; and the cutoff lengthused together with fh to reject longwavelength (or low frequency) data to obtainthe filtered center line waviness profile is fl.

surface roughness evaluation. However, byusing the DIN4776 profile calculatingprocedure, those negative effect can beavoided to a certain extent.

Cutoff filterCutoff filter rejects data in a particular range(or ranges) of wavelengths from the primaryprofile.

11SURFPAK-SJ/SV/PRO

Post-travel

L: Sampling length

Pre-travel

Mean line

ln: Evaluation length

lt: Traverse length

λc= 0.8mm Ra: 3.5 to 4.2µm

λc= 0.25mm Ra: 1.8 to 2.2µm

λc= 0.08mm Ra: 0.95 to 1.05µm

Primary profile1mm

Roughness profile

2.5µm

Peak Highest peak Mean line

Deepest valley

ValleySampling length L

Local peak

Local valley

Mean line

L

Yi

L

Yp1

Yv2

Yp5

Yv4

Yp3

Yv5

Yp4

Yv1

Yp2

Yv3

Rz(JIS)

L

Yp

Yv

Ry(JIS)

L

V1

P2

V4

P4

V5

P6

V7

Pn

Vn

P1

V2

V3

P3 P5

V6Rc

Vi

Pi

Zi

ln

L

ln

L

Rpi

Effect of data filteringDifferent roughness profiles will be obtainedfrom the same primary profile according tothe different cutoff lengths of the filter. Ra: Arithmetic mean deviation of

the profileRa is the arithmetic mean of the absolutevalues of the profile deviation Yi from themean line. Ra(ANSI) is defined over the entireevaluation length.

Rq: Root-mean-square deviationof the profileRq is the square root of the arithmetic mean ofthe squares of profile deviations Yi from themean line. Rq(ANSI) is defined over the entireevaluation length.

Rz(JIS): Ten-point height ofirregularitiesRz(JIS) is the sum of the mean height of thefive highest profile peaks and the mean depthof the five deepest profile valleys measuredfrom a line parallel to the mean line.

Ry(JIS): Maximum height of theprofileRy(JIS) is the sum of height Yp of the highestpeak from the mean line and depth Yv of thedeepest valley from the mean line.

Rc: Mean peak-to-valley height ofthe profileRc is the distance between the average of allpeak heights from the mean line and theaverage of all valley depths from the meanline.

Rz: Maximum height of the profileRy(DIN): Maximum height of theprofileObtain the sum Zi of profile peak height Pi andprofile valley depth Vi for each samplinglength. Rz is the mean value of all Zi's over theevaluation length. Ry(DIN) is the maximumvalue of all Zi's over the evaluation length.

Rp, Rpmax: Maximum profileheightObtain the profile peak height Rpi for eachsampling length of the assessed profile. Rp isthe mean value of the Rpi's obtained over theevaluation length. Rp(ANSI) (=Rpmax) is themaximum value of the Rpi's obtained over theevaluation length.

Roughness analysis parameters

Profile peak and profile valleyWhen a profile is sliced by its mean line, theportion that projects upward from the meanline is called the "profile peak", and that whichprojects downward is called the "profilevalley".

SURFTEST TERMINOLOGY

Sampling length (L)The sampling length is the minimumevaluation length used to obtain anevaluation value from an assessed profile,according to the selected parameter. Thesampling lengths of roughness and wavinessprofiles are identical to cutoff length λc andfh, respectively. The sampling length of WCAcorresponds to fl.

Traverse length (lt)The traverse length equals the sum of theevaluation length, pre-travel length, and post-travel length.

Marginal length (pre-travel andpost-travel)In addition to the start-up travel of the Surftestdetector itself, a pre-travel and post-travel arealso required for data filtering.

Evaluation length (ln)The evaluation length is the sum of n(successive integers) pieces of samplinglengths. (Usually an evaluation lengthcomprises five sampling lengths.) In generalevaluation of surface texture, all of the datalogged in each sampling length is averagedthroughout the evaluation length, yielding theevaluation value (such as Ra, Rq, Ry, Pc, Sm,HSC, and S). However, depending on theparameters, the evaluation value may use themaximum value in the entire evaluation length(e.g. Ry(DIN), Rp, Rv, and Rt).

Mean lineThe mean line is a reference line for parametercalculation. It uses the filtered waviness profileof an assessed profile, which is determined byeliminating surface roughness componentsshorter than the specified wavelength fromthe primary profile using a high-pass filter.

12

L

PnP3P2P1

Count level

Count level

L

0% (0µm)

50% (Rt•1/2µm)

100% (Rt µm)

Rt

L

0% (0µm)

50% (Rt•1/2µm)

100% (Rt µm)

Rt

L0% (0µm)

50% (Rt•1/2µm)

100% (Rt µm)

Rt

Slice level

Slice level

Slice level

L0

50

100

(%)

0 100 (%)

Rvi

ln

L

3zi

ln

L

S1

L

S2 S3 S4 S5 •••••• Sn

L1 2 34 5 6 nCount level

Rpk

Rk

A1

A

B

40%

A2

Mr2 100(%)Mr1

Rvk

0(%)

(µm)

L

SnS3S2S1

Count level

Count level

Rv, Rvmax: Maximum profilevalley depthObtain the profile valley depth Rvi for eachsampling length of the assessed profile. Rv isthe mean of the Rvi's obtained over theevaluation length. Rv(ANSI) (=Rvmax) is themaximum value of the Rvi's obtained over theevaluation length.

Rt: Total height of the profileRt is the sum of the maximum profile peakheight Rpmax and the maximum profile valleydepth Rvmax obtained over the evaluationlength.

R3z, R3y: Third maximum peak-to-valley heightObtain, for each sampling length, the sum(3zi) of the height of the third highest profilepeak above the mean line and the depth(absolute value) of the third deepest profilevalley below the mean line. R3z is thearithmetic mean of the all 3zi's obtained overthe evaluation length. R3y is the maximumvalue of the 3zi's obtained over the evaluationlength.

HSC: High spot countOn the assessed profile provided a line (calleda "count level") which is parallel to and locatedabove the mean line. A profile peak thatprojects above the count level line and has alocal peak* is called a "peak for high spotcount". HSC (high spot count) is thenumber of these peaks per 1cm or 1 inch.

*A local peak is the highest point of a convexportion of an assessed profile, which hasconcavities on both sides. The distancebetween adjacent concavities should be morethan 1% of L, or the depth of the concavitiesshould be more than 10% of Rz.

SURFTEST TERMINOLOGY

BAC1, BAC2: Material ratio curveof the profileThe material ratio curve is the graph obtainedby plotting mr values (%) of the assessedprofile on the X coordinate against theircorresponding slice level depths or heights onthe Y coordinate. BAC1 is the graph thatshows the relative depths of the slice level(100% down to 0% of Rt) on the Y coordinate;BAC2 is the one that shows the actual heights(µm or µinch) on the Y coordinate.

S: Mean spacing of local peaks ofprofileS is the arithmetic mean of peak-to-peakdistances of the local peaks.

mr, mrd: Material ratio of theprofileδc (plateau ratio): Profile sectionheight differenceThe material ratio of the profile is the ratio ofthe bearing length to the evaluation length. Itis represented as a percentage (%). Thebearing length is the sum of section lengthsobtained by cutting the profile with a line(slice level) drawn parallel to the mean line ata given level. The ratio is assumed to be 0% ifthe slice level is at the highest peak, and 100%if it is at the deepest valley. Parameter mrdetermines the percentage of each bearinglength ratio of a single slice level or 19 slicelevels which are drawn at equal intervals (5%)with Rt; parameter δc (or plateau ratio)determines the distance (µm or µinch)between the two slice levels which arerepresented by two different mr values (%);and parameter mrd determines the mr value(%) of a slice level each time it is moved downat equal intervals from a given level in theprofile.

Pc (Pci): Peak countPc (or Pci) is the number of peak-valley pairs(= cycles) per unit length 1cm (or 1 inch)along the mean line of the profile within thesampling length. Two lines (count levels) thatare parallel to the mean line are drawn atequal distances above and below the meanline. Each profile cycle between intersectionsof the profile and the mean line, betweenwhich a peak projects above the upper countlevel and an adjacent valley drops below thelower count level, is counted as one peak-valley cycle.

Sm: Mean width of the profileelementsSm is equal to the mean wavelength of thepeak-valley cycles. It is the reciprocal of the Pc(peak count) value

Rk: Core roughness depthAssume that a straight line (function) passesthrough two points that pinpoint the 40%difference in mr and the minimum differencein height on the BAC2 graph. The coreroughness depth Rk is the difference betweenthe heights of the slice level at 0% of mr andat 100% of mr on this straight line.

Rpk: Reduced peak heightRvk: Reduced valley heightA1: Peak areaA2: Valley areaMr1: Material portion 1Mr2: Material portion 2These parameters, along with Rk, are obtainedfrom the BAC2 graph.

13SURFPAK-SJ/SV/PRO

L (µm)

0(%)

Upper slice line

Lower slice line

Sk=0

Sk<0

Sk>0

(Abrasion resistance: large)

(Abrasion resistance: small)

ADCAssessed profileMean line

Ku is large

Ku is small

ADCAssessed profile

Waviness motif

Roughness motif

Sk: Skewness of the profileSk is the degree of bias of an amplitudedistribution curve either above or below themean line.

Ku: KurtosisKu is the degree of concentration around themean value of an amplitude distribution curve.

λa: Average wavelength of theprofileλa is an average wavelength that can becalculated from Ra (µm or µinch) and ∆a(degree) using the following formula.λa = 2π•Ra/∆a

λq: Root-mean-square wavelengthλq is a mean wavelength that can becalculated from Rq (µm or µinch) and ∆q(degree) using the following formula.λq = 2π•Rq/∆q

Lo: Developed profile lengthlr: Profile length ratioLo is the length of a straight line which isobtained by developing an assessed profile.lr is the ratio of a developed profile length Loto the sampling length. It represents thedegree of profile irregularities.

MotifMotifs are used to evaluate an assessed profilewhich is compensated according to a Frenchstandard to remove arbitrary wavinesscomponents from a primary profile withoutdistorting it.Two motif modes are available: roughnessmotif and waviness motif.

Rx, R, AR, SR, SAR, NR, NCRX,CPMParameters calculated from a roughness motif.Rx is the maximum value of roughness motifheights. R is the mean of roughness motifheights. AR is the mean of roughness motifwidths. SR is the standard deviation ofroughness motif heights. SAR is the standarddeviation of roughness motif widths. NR is thenumber of roughness motifs. NCRX is thenumber of vertexes of concavities extractedbefore the composition of roughness motifs.CPM is the average number of valleys perroughness motif.

Wte, Wx, W, AW, SW, SAW, NWParameters calculated from a waviness motif.Wte is the difference between the maximumheight and the minimum height of the profile.Wx is the maximum value of waviness motifheights. W is the mean of waviness motifheights. AW is the mean of waviness motifwidths. SW is the standard deviation ofwaviness motif heights. SAW is the standarddeviation of waviness motif widths. NW is thenumber of waviness motifs.

Auto-correlation chartThe auto-correlation function represents thedegree of consistency between two pointsapart from a definite distance on the entireprofile. If a height (depth) appears again in adefinite distance, the value of the correlationfunction will be 1. Generally, the correlationfunction will take a large value at a periodicinterval, which is equal to the wavelength ofthe primary component of the profile.Therefore, the primary wave component ofthe profile can be seen from the variation ofthe auto-correlation function values.

Power spectrum chartAssuming that the profile is a sum of wavecomponents with different wavelengths, it canbe characterized by the distribution pattern ofthe wavelengths. A power spectrum chart iscreated plotting the wavelength (mm) orspatial frequency (c/mm) on the X coordinateand the intensity (amplitude) on the Ycoordinate to display the distribution of wavecomponents. A power spectrum and an auto-correlation share the same information in thespatial field and the wavelength field,respectively. In other words, they representthe same information in different formats.

Slope distribution chartDivide the profile into sections at a constantwidth and obtain the angle of inclination of aline that connects the start point and the endpoint of the profile in each section. A slopedistribution chart is created by plotting theangles on the X coordinate and the ratio (%)of slope distributions on the Y coordinate.

Local peak distribution chartAssume that the assessed profile is divided bylines parallel to the mean line at constantintervals and count the number local peaks ateach slice level. A local peak distribution chartis created by plotting the number of localpeaks per 1mm on the X coordinate and thedepths of the slice level (100% down to 0% ofRt) on the Y coordinate.

Parameter distribution chartTo obtain the continuous distribution of aroughness parameter, set an evaluating spanwith a definite length, shorter than theevaluation length of the profile, and shift it ata predetermined length along the samplingdirection in order to calculate the parametervalue at each position. A parameterdistribution chart is created by plotting thedistance in the shift direction on the Xcoordinate and the parameter values on the Ycoordinate. One of the following 22parameters can be specified at a time: Ra, Rq,Ry, Rz, Rc, S, Pc, Sm, HSC, ∆a, ∆q, λa, λq, Sk,Ku, Lo, lr, Rpmax, Rvmax, Rt, R3y, R3z.

ADC: Profile height amplitudecurveAssume that the assessed profile is divided bylines parallel to the mean line at constantintervals and the ratio of each area (which isdetermined by summing the sampling dots)between two adjacent lines to the area overthe evaluation length is defined as theamplitude density. The ADC (profile heightamplitude curve) is created by plotting thelevel (µm) of each of the parallel lines on the Ycoordinate and the amplitude density (%)corresponding to the depth on the Xcoordinate.

∆a: Arithmetic mean slope of theprofile∆a is the arithmetic mean of the absolutevalues of the local slope (δz/δx) of the assessedprofile.

∆q: Root-mean-square slope of theprofile∆q is the square root of arithmetic mean ofthe squares of the local slope (δz/δx) of theassessed profile.

SURFTEST TERMINOLOGY

Automatic leveling using the auto-leveling table is available

Various evaluations/analyses using a variety of surface roughness parameters and analysis graphs

3-axis Adjustment Table is available for easy alignment of workpiece

In a completedreport format

Setting upworkpiece

Savingfile

Leveladjustment

Startmeasurement

Calculation/analysis

Printeroutput

Straightnessadjustment

Part programs can be created for a series of operations from a "level adjustment"

to a "printer output" for automatic measurement.

Data Management

Windows is a registered trademark of Microsoft Corporation.

Specifications are subject to change without notice.

JSAQ-052ISO 9001

Mitutoyo Scandinavia ABSläntv. 6 • Box 712SE-194 27 Upplands VäsbyTel: 08-594 109 50 • Fax: 08-590 924 10info@mitutoyo.se • www.mitutoyo.se

SURFPAK®-SVSV-2000/3000

SURFPAK®-SJSJ-201/301/401

SURFPAK®-PROSV-3000•3D

Note: The procedure isslightly different with aportable model and amanual column-movementtype model.

Part Program Creation and Execution

FORMPAK®-SV

• SURFPAK® Series software greatlyreduces the amount of manualoperations by easy mouse-operation,the on-screen instruction on theoperation procedures, and the repeatmeasurement by automatic executionof a part program.

• All the SURFPAK® Series surfaceroughness-analyzing programs havehigh operability, and they canexchange data with each other.SURFPAK®-SJ is the software for theportable type model, SURFPAK®-SV foruse in the inspection room, andSURFPAK®-PRO for models with three-dimensional surface measuring.(Control method for the machinediffers, depending on the model.)

• SURFPAK® Series software makes iteasier to manage data, from themanufacturing site to the laboratory,as the same format can be used in thesurface roughness measurement and

the storage and analysis of themeasured data.

• Optional program FORMPAK®-SV isavailable to evaluate the fine texture ofworkpiece surfaces.

Printed in Japan

129.000412 (4) ANE