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The top documents tagged [long test time]
Medical device reliability program
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Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock Priyadharshini Shanmugasundaram
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Vishwani D. Agrawal
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By Praveen Venkataramani Vishwani D. Agrawal TEST PROGRAMMING FOR POWER CONSTRAINED DEVICES 5/9/201322ND IEEE NORTH ATLANTIC TEST WORKSHOP 1
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By Praveen Venkataramani Committee Prof. Vishwani D. Agrawal (Advisor) Prof. Adit D. Singh Prof. Fa Foster Dai REDUCING ATE TEST TIME BY VOLTAGE AND FREQUENCY
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Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock
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Test Programming for power constrained devices
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Dynamic Scan Clock Control In BIST Circuits
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