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The top documents tagged [port measurements]
Bodway 1968 - Circuit Design and Characterization of Transistors by Means of Three-Port Scattering Parameters
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In-Fixture Measurements Using VNA
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Microwave Site Master™ S820E “ Site Master: Proven Accuracy and Reliability you can trust ” Slide 1
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Asics for MEMS BRILLANT Grégory 2 th of October 2006
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Asics for MEMS
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