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The top documents tagged [test economics]
April 29, 2001Essentials of Test: Agrawal & Bushnell1 Essentials of Testing Vishwani D. Agrawal Agere Systems, Murray Hill, NJ 47974
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Michael
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1 Introduction VLSI Testing. 2 Overview First digital products (mid 1940's) Complexity:low MTTF:hours Cost:high Present day products (mid 1980's) Complexity:high
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1. Introduction 1.Faults and their manifestation (4) 2.Analysis of faults (12) 3.Classification of tests (5) 4.Fault coverage requirements (3) 5.Test economics
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Economic Methods Course – A Self Study
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