technical report
DESCRIPTION
Technical Report. High Speed CMOS A/D Converter Circuit for Radio Frequency Signal. Kyusun Choi. Computer Science and Engineering Department The Pennsylvania State University. Project Goals. Core development and silicon test of 6 and 8 bit TIQ based flash ADC. - PowerPoint PPT PresentationTRANSCRIPT
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Technical Report
High Speed CMOS A/D Converter Circuit forRadio Frequency Signal
Kyusun Choi
Computer Science and Engineering DepartmentThe Pennsylvania State University
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Project Goals
1. High speed circuit and layout design
2. Prototype chip fabrication 0.25um and 0.18um CMOS
3. Test and evaluate, explore and improve
Core development and silicon test of6 and 8 bit TIQ based flash ADC
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Project Milestones
1. 1st Chip design, 0.25um 12/01/20002. Chip fabrication 02/05/20013. Chip testing 04/04/2001 1st report4. 2nd chip design, 0.18um 07/10/2001 2nd report, chip5. Chip fabrication 10/08/20016. Chip testing 11/09/2001 3rd report7. Project ending 12/31/2001 Chip8. Project presentation 02/15/2002 Final report
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Project Feature
1. High speed ADC, 1 GSPS
2. RF applications
3. SOC applications, digital CMOS
4. Future-ready, < 0.10um, < 1.0V
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TIQ flash ADC
gain booste
rgain
booster
gain booste
r
gain booste
rThermometer
code tobinary encoder
Vn
V3
V2
V1
Vin
D1
D2
D3
Dk
gain boostercircuit
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Other flash ADC
Thermometer code to
binary encoder
–
+
Vin
D1D2D3
Dk
V1
V2
V3
–
+
–
+
–
+
Vn
V1
V2
V3
Vn
R
R
R
R
Vref
Resistor laddercircuit
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TIQ comparator
Vr is provided by a voltage references source,External to the voltage comparator
Vm is an internal parameter of an inverter,fixed by the transistor sizes
Vr
_
+
Vin
VinVinVr Vm
Vout Vout
Vout Vin
Vout
Vm
DIFFERENTIAL INPUTVOLTAGE COMPARATOR INVERTER
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TIQ comparator
• High speed• Less area• No resistor ladder and reference voltages• No capacitor switching• Future ready
• Scale down• Low supply voltage• Standard digital logic technology• Ideal for SOC
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Prototype Test Results
1st prototype chip (0.25um), six ADCs on chip
ADCs Precision Delay Power
6bit0.25 4 bits 3.799 ns 109.38
6bit1.00 6 bits 21.404 ns 35.25
8bit0.25 5 bits 7.249 ns 170.50
8bit0.50 7 bits 18.612 ns 121.25
9bit0.50 6 bits 27.762 ns 200.375
9bit1.00 8 bits 83.595 ns 179.625
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Prototype Test Results
2nd prototype chip (0.18um), ten ADCs on chip
ADCs Precision Delay Power
6bit1.00FAT 6 bit 2.65 ns 27.0 mW
6bit1.00ROM 6 bit 4.50 ns 21.6 mW
6bit0.50ROM 3 bit 2.97 ns 36.0 mW
6bit0.18ROM 3 bit 3.35 ns 77.4 mW
8bit1.0ROM 6 bit 15.45 ns 64.8 mW
8bit0.50ROM 5 bit 6.65 ns 75.6 mW
9bit1.50ROM 5 bit 29.20 ns 64.8 mW
9bit1.00ROM 5 bit 36.50 ns 111.6 mW
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Prototype Test Results
ADC: 6 bit 1.00um, ROM, 0.18um prototype chip
Input: 100 KHz Saw wave
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Prototype Test Results
ADC: 6 bit 1.00um, FAT, 0.18um prototype chip
Input: 100 KHz Saw wave
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Prototype Test Results
ADC: 9 bit 1.00um, ROM, 0.25um prototype chip
Input: 100 KHz Saw wave
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Prototype Test Results
ADC: 6 bit 1.00um, FAT, 0.18um prototype chipInput: DC
DNL = 0.36 LSB INL = 1.36 LSB
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Prototype Test Results
ADC: 6 bit 1.00um, FAT, 0.18um prototype chipInput: 80KHz sign wave, f_sample = 10 MHz
SNR = 23.40 dBSNDR = 21.83 dBSFDR = 9.13 dBENOB = 3.33 bits
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Prototype Test Results
ADC: ideal 6 bitInput: 1MHz sign wave, f_sample = 200 MHz
SNR = 37.78 dBSNDR = 36.56 dBSFDR = 37.86 dBENOB = 5.78 bits
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Summary
•High speed ADC for RF application
• ADC core - 6 and 8 bit design
• prototype chips (silicon test)
• 0.25 m and 0.18 m
• CMOS digital logic technology
• SOC beyond 0.10um & 1.00V
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Innovation/enhancement challenges
• 1 GSPS with digital CMOS• Custom layout generation and modeling CAD tool• 8bit and 10bit ADC• Low power• Low noise• Dynamic calibration
• Offset• Gain• Temperature• Power supply voltage• Process parameter variation
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Summary
•High speed ADC for RF application
• ADC core - 6 and 8 bit design
• prototype chips (silicon test)
• 0.25 m and 0.18 m
• CMOS digital logic technology
• SOC beyond 0.10um & 1.00V
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Chip1 6bit 1.00um, A1:20KH Sine Input A2: Vdd, w/o R on Probs
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Chip1 6bit 1.00um, A1: 20KH Sine Input A2: Vddw/ 4.7K Ohm on Probs
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Chip1 6bit 1.00um, A1: 20KH Sine Input A2: Vddw/ R on Probs
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1st Prototype Chip Test Board
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2nd Prototype Chip Test Board