test reportfaenl.msi.com/ftp/ce documents/notebook/ms-1461x (x410... · 2015. 9. 9. · report...

Test Report

Product Name ： Notebook PC

Model No. ： MS-1461

Marketing Name ： X410

Applicant ： Micro-Star Int’L Co., Ltd.

Address ： No. 69, Li-De St., Chung-Ho City, Taipei Hsien, Taiwan

Date of Receipt ： 2009/06/01

Issued Date ： 2009/06/18

Report No. ： 096S040-IT-CE-P07V04

Report Version. ： V1.0

The test results relate only to the samples tested.The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by CNLA, NVLAP or any agency of the Government.The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

Report No： 096S040-IT-CE-P07V04

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Test Report Cert i f icat ion Issued Date : 2009/06/18 Report No. : 096S040-IT-CE-P07V04

Product Name : Notebook PC

Applicant : Micro-Star Int’L Co., Ltd.

Address : No. 69, Li-De St., Chung-Ho City, Taipei Hsien, Taiwan

Manufacturer : MSI ELECTRONICS (KUNGSHAN) CO., LTD.

Model No. : MS-1461

Marketing Name : X410

Rated Voltage : AC 230 V / 50 Hz

EUT Voltage : AC 100-240 V / 50-60 Hz

Trade Name : msi

Applicable Standard : EN 55022: 2006+A1: 2007 Class B

EN 61000-3-2: 2006

EN 61000-3-3: 1995+A1: 2001+A2: 2005

EN 55024: 1998+A1: 2001+A2: 2003

Test Result : Complied

Performed Location : Suzhou EMC laboratory

No.99 Hongye Rd., Suzhou Industrial Park Loufeng

Hi-Tech Development Zone.,Suzhou, China

TEL: +86-512-6251-5088 / FAX: +86-512-6251-5098

Documented By :

( Any Liu )

Reviewed By :

( Coffon Ye )

Approved By :

( Gene Chang )


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Laboratory Information

We , QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited by the following accreditation Bodies in compliance with ISO 17025, EN 45001 and Guide 25:

The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation’s Web Site : http://tw.quietek.com/modules/myalbum/ The address and introduction of QuieTek Corporation’s laboratories can be founded in our Web site : http://www.quietek.com/ If you have any comments, Please don’t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory :

No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL:+886-3-592-8858 / FAX:+886-3-592-8859 E-Mail : [email protected]

LinKou Testing Laboratory :

No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : +886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : [email protected]

Suzhou Testing Laboratory : No.99 Hongye Rd., Suzhou Industrial Park Loufeng Hi-Tech Development Zone., SuZhou, China

TEL : +86-512-6251-5088 / FAX : 86-512-6251-5098 E-Mail : [email protected]

Taiwan R.O.C. : BSMI, DGT, CNLA

Germany : TUV Rheinland

Norway : Nemko, DNV

USA : FCC, NVLAP

Japan : VCCI


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TABLE OF CONTENTS Description Page 1. General Information........................................................................................................7 1.1. EUT Description.........................................................................................................7 1.2. Mode of Operation...................................................................................................10 1.3. Tested System Details .............................................................................................13 1.4. Configuration of Tested System...............................................................................14 1.5. EUT Exercise Software............................................................................................14 2. Technical Test ..............................................................................................................16 2.1. Summary of Test Result...........................................................................................16 2.2. List of Test Equipment .............................................................................................17 2.3. Measurement Uncertainty........................................................................................20 2.4. Test Environment .....................................................................................................22 3. Conducted Emission (Main Ports) ...............................................................................23 3.1. Test Specification.....................................................................................................23 3.2. Test Setup................................................................................................................23 3.3. Limit… .....................................................................................................................23 3.4. Test Procedure ........................................................................................................24 3.5. Deviation from Test Standard...................................................................................24 3.6. Test Result...............................................................................................................25 3.7. Test Photograph ......................................................................................................37 4. Conducted Emissions (Telecommunication Ports).......................................................39 4.1. Test Specification.....................................................................................................39 4.2. Test Setup................................................................................................................39 4.3. Limit… .....................................................................................................................39 4.4. Test Procedure ........................................................................................................40 4.5. Deviation from Test Standard...................................................................................40 4.6. Test Result...............................................................................................................41 4.7. Test Photograph ......................................................................................................53 5. Radiated Emission.......................................................................................................54 5.1. Test Specification.....................................................................................................55 5.2. Test Setup................................................................................................................55 5.3. Limit… .....................................................................................................................56 5.4. Test Procedure ........................................................................................................57 5.5. Deviation from Test Standard...................................................................................57 5.6. Test Result...............................................................................................................58 5.7. Test Photograph ......................................................................................................70 6. Harmonic Current Emission .........................................................................................74 6.1. Test Specification.....................................................................................................74


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6.2. Test Setup................................................................................................................74 6.3. Limit… .....................................................................................................................74 6.4. Test Procedure ........................................................................................................76 6.5. Deviation from Test Standard...................................................................................76 6.6. Test Result...............................................................................................................77 6.7. Test Photograph ......................................................................................................81 7. Voltage Fluctuation and Flicker....................................................................................82 7.1. Test Specification.....................................................................................................82 7.2. Test Setup................................................................................................................82 7.3. Limit… .....................................................................................................................82 7.4. Test Procedure ........................................................................................................83 7.5. Deviation from Test Standard...................................................................................83 7.6. Test Result...............................................................................................................84 7.7. Test Photograph ......................................................................................................86 8. Electrostatic Discharge ................................................................................................86 8.1. Test Specification.....................................................................................................87 8.2. Test Setup................................................................................................................87 8.3. Limit… .....................................................................................................................87 8.4. Test Procedure ........................................................................................................88 8.5. Deviation from Test Standard...................................................................................88 8.6. Test Result...............................................................................................................89 8.7. Test Photograph ......................................................................................................91 9. Radiated Susceptibility ................................................................................................92 9.1. Test Specification.....................................................................................................92 9.2. Test Setup................................................................................................................92 9.3. Limit… .....................................................................................................................92 9.4. Test Procedure ........................................................................................................93 9.5. Deviation from Test Standard...................................................................................93 9.6. Test Result...............................................................................................................94 9.7. Test Photograph ......................................................................................................96 10. Electrical Fast Transient/Burst ................................................................................97 10.1. Test Specification...................................................................................................97 10.2. Test Setup..............................................................................................................97 10.3. Limit.. .....................................................................................................................97 10.4. Test Procedure ......................................................................................................98 10.5. Deviation from Test Standard.................................................................................98 10.6. Test Result.............................................................................................................99 10.7. Test Photograph ..................................................................................................101


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11. Surge…. ...................................................................................................................103 11.1. Test Specification .................................................................................................103 11.2. Test Setup............................................................................................................103 11.3. Limit. ....................................................................................................................103 11.4. Test Procedure.....................................................................................................104 11.5. Deviation from Test Standard ...............................................................................104 11.6. Test Result ...........................................................................................................105 11.7. Test Photograph...................................................................................................107 12. Conducted Susceptibility ..........................................................................................107 12.1. Test Specification.................................................................................................108 12.2. Test Setup............................................................................................................108 12.3. Limit.. ...................................................................................................................109 12.4. Test Procedure ....................................................................................................109 12.5. Deviation from Test Standard............................................................................... 110 12.6. Test Result........................................................................................................... 111 12.7. Test Photograph .................................................................................................. 113 13. Power Frequency Magnetic Field ............................................................................. 114 13.1. Test Specification................................................................................................. 115 13.2. Test Setup............................................................................................................ 115 13.3. Limit.. ................................................................................................................... 115 13.4. Test Procedure .................................................................................................... 116 13.5. Deviation from Test Standard............................................................................... 116 13.6. Test Result........................................................................................................... 117 13.7. Test Photograph .................................................................................................. 119 14. Voltage Dips and Interruption ...................................................................................120 14.1. Test Specification.................................................................................................120 14.2. Test Setup............................................................................................................120 14.3. Limit. ....................................................................................................................120 14.4. Test Procedure ....................................................................................................121 14.5. Deviation from Test Standard...............................................................................121 14.6. Test Result...........................................................................................................122 14.7. Test Photograph ..................................................................................................126 15. Attachment ...............................................................................................................127 　 EUT Photograph .................................................................................................127


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1. General Information 1.1. EUT Description

Product Name Notebook PC

Trade Name msi

Model No. MS-1461

Marketing Name X410

Note: The EUT includes two models. MS-1461 is Model Number and X410 is Marketing Name.


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Keypart List

Item/manufactory Model Remark

Motherboard

MSI MS-14611

CPU

AMGMV40OAX4DX 1.6GHz, BGA-812pin AMD

SMG210UOAX3DV 1.5GHz, BGA-812pin

LCD

CHI MEI N140B6-L02 14 inch, WXGA, 1366x768,GLARE, LED

SAMSUNG LTN140AT01-G01 14 inch, WXGA, 1366x768,GLARE, LED

AUO B140XW01 V0 14 inch, WXGA, 1366x768,GLARE, LED

HDD

WD2500BEVT SYS HDD, SATA, 2.5 inch, 250GB, 5400RPM,

WD3200BEVT SYS HDD, SATA, 2.5 inch, 320GB, 5400RPM WD

WD5000BEVT SYS HDD, SATA, 2.5 inch, 500GB, 5400RPM

MHZ2160BH SYS HDD, SATA, 2.5 inch, 160GB, 5400RPM

MJA2250BH SYS HDD, SATA, 2.5 inch, 250GB, 5400RPM

MJA2320BH SYS HDD, SATA, 2.5 inch, 320GB, 5400RPM Fujitsu

MJA2500BH SYS HDD, SATA, 2.5 inch, 500GB, 5400RPM

MK1655GSX SYS HDD, SATA, 2.5 inch, 160GB, 5400RPM


MK3255GSX SYS HDD, SATA, 2.5 inch, 320GB, 5400RPM Toshiba


Memory

Transcend TS256MSQ64V8U DDR2 SDRAM, 2GB, 400(800) MHz

SAMSUNG M470T5663QZ3-CF7 DDR2 SDRAM, 2GB, 400(800) MHz

HYNIX HYMP125S64CP8-S6 DDR2 SDRAM, 2GB, 400(800) MHz

SAMSUNG M470T5663EH3-CF7, DDR2 SDRAM, 2GB, 400(800) MHz

Samsung M470T2864QZ3-CF7 DDR2 SDRAM, 1GB, 400(800) MHz

HYNIX HYMP112S64CP6-S6 DDR2 SDRAM, 1GB, 400(800) MHz

SAMSUNG M470T2864EH3-CF7 , DDR2 SDRAM, 1GB, 400(800) MHz

WLAN

Ralink RT3090 Wireless 802.11b/g/n 1T1R mini-card

Realtek RTL8192E Wireless 802.11b/g/n 1T2R mini-card

Battery

SIMPLO BTY-S31 14.8V, 2150mAh


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Adapter

LI SHIN 0225A2040 Input: 100-240V, 50-60Hz, 1.7A

Output: 20V, 2.0A

DELTA ADP-40MH BD Input: 100-240V, 50-60Hz, 1.2A

Output: 20V, 2.0A

Keyboard

VJ3522BJLV1 91KEY,Japanese, WHITE

VJ3522AJLV1 91KEY,Japanese, BLACK

VJ3522BKLA1 87KEY,US, WHITE

VJ3522AKLA1 87KEY,US, BLACK

VJ3522BKLB1 87KEY,UK, WHITE

Sunrex

VJ3522AKLB1 87KEY,UK, BLACK

Bluetooth

MSI MS-6837D

Touch pad

SENTELIC TPA2D2IC99RA1

SYNAPTICS TM61PDZG300

Camera

BISON BN82M6S8-000 CMOS CAMERA MODULE/1.3M

AzureWave AM-1S004 CMOS CAMERA MODULE/1.3M


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1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode

Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) Mode 3: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Mode 4: LCD (1024*600@60Hz) + HDMI (1024*600@60Hz) Mode 5: LCD (1024*768@60Hz) + VGA (1024*768@60Hz) Mode 6: LCD (1024*600@60Hz) + HDMI (1024*600@60Hz) Mode 7: LCD (800*600@60Hz) + VGA (800*600@60Hz) Mode 8: LCD (800*600@60Hz) + HDMI (800*600@60Hz) Mode 9: LCD (800*600@60Hz) + VGA (800*600@60Hz) Mode 10: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) Mode 11: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Mode 12: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz)

Final Test Mode

EMI Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz)

EMS Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz)


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Mode 1 Mode 2

M/B MS-14611 MS-14611

CPU SMG210UOAX3DV AMGMV40OAX4DX

Battery BTY-S31 BTY-S31

HDD MK5055GSX MJA2320BH

Adapter 0225A2040 0225A2040

LCD B140XW01 V0 N140B6-L02

DDR TS256MSQ64V8U M470T5663QZ3-CF7

Camera BN82M6S8-000 BN82M6S8-000

Bluetooth MS-6837D MS-6837D

WLAN RTL8192E RT3090

Mode 3 Mode 4

M/B MS-14611 MS-14611

CPU AMGMV40OAX4DX SMG210UOAX3DV


HDD WD2500BEVT WD5000BEVT

Adapter ADP-40MH BD ADP-40MH BD

LCD LTN140AT01-G01 B140XW01 V0

DDR GU332G0ALEPR8H2F6F1 HYMP125S64CP8-S6

Camera BN82M6S8-000 AM-1S004


WLAN RT3090 RTL8192E

Mode 5 Mode 6

M/B MS-14611 MS-14611

CPU AMGMV40OAX4DX AMGMV40OAX4DX


HDD WD3200BEVT MHZ2160BH

Adapter ADP-40MH BD 0225A2040

LCD N140B6-L02 LTN140AT01-G01

DDR M470T5663EH3-CF7 M470T2864QZ3-CF7



WLAN RT3090 RT3090


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Mode 7 Mode 8

M/B MS-14611 MS-14611

CPU SMG210UOAX3DV AMGMV40OAX4DX


HDD MJA2250BH MJA2500BH

Adapter 0225A2040 0225A2040

LCD B140XW01 V0 N140B6-L02

DDR GU331G0ALEPR612F6F1 HYMP112S64CP6-S6


Bluetooth AM-1S004 MS-6837D

WLAN RTL8192E RT3090

Mode 9 Mode 10

M/B MS-14611 MS-14611

CPU AMGMV40OAX4DX SMG210UOAX3DV


HDD MK3255GSX MK1655GSX

Adapter ADP-40MH BD ADP-40MH BD

LCD LTN140AT01-G01 B140XW01 V0

DDR M470T2864EH3-CF7 M470T2864QZ3-CF7



WLAN RT3090 RTL8192E

Mode 11 Mode 12

M/B MS-14611 MS-14611

CPU AMGMV40OAX4DX AMGMV40OAX4DX


HDD MK2555GSX MJA2320BH

Adapter ADP-40MH BD 0225A2040

LCD N140B6-L02 N140B6-L02

DDR HYMP125S64CP8-S6 M470T5663QZ3-CF7



WLAN RT3090 RT3090


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1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord

1 CRT ‘’21 IBM 6652-U3N 1 Non-Shielded, 1.8m

2 LCD Monitor DELL 3008WFPT 7735432490P08B Non-Shielded, 1.8m

3 iPod Apple A1199 YM715J43VQ5 Power by PC

4 USB Mouse DELL MO56UOA F1B03EZZ Power by PC

5 Microphone & Earphone SOMIC SM-510 N/A N/A

6 SD Card Kingston 1GB N/A N/A

7 MacBook Apple MB061CH W8732B4TZ5V Power by adapter


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1.4. Configuration of Tested System

Connection Diagram

Signal Cable Type Signal cable Description A VGA Cable Shielded, 1.8m, with two ferrite cores Bonded B HDMI Cable Shielded, 1.8m C USB Cable Shielded, 1.0m D USB Mouse Cable Shielded, 1.8m E Earphone & Microphone Cable Non-Shielded, 2.1m F LAN Cable Non-Shielded, >10m


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1.5. EUT Exercise Software

1 Setup the EUT and simulators as shown above.

2 Turn on the power of all equipment.

3 Execute the HDD running Program using BurnIn Test v5.1 software.

4 Run EMC test program using BurnIn Test v5.1 software and send “H” pattern to the monitor.

5 EUT will send and receive data through LAN using “Ping” function.

6 Communicate with another notebook by WLAN and Bluetooth.

7 Open the camera and play music using media player program.


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2. Technical Test 2.1. Summary of Test Result

No deviations from the test standards Deviations from the test standards as below description:

Emission

Performed Test Item Normative References Test

Performed Deviation

Conducted Emission

(Mains Ports)

EN 55022: 2006+A1: 2007 Class B Yes No

Conducted Emission

(Telecommunication Ports)

EN 55022: 2006+A1: 2007 Class B

Yes No

Radiated Emission EN 55022: 2006+A1: 2007 Class B

Yes No

Harmonic Current Emission EN 61000-3-2: 2006 Yes No

Voltage Fluctuation and Flicker EN 61000-3-3: 1995+A1: 2001+A2: 2005 Yes No

Immunity

Performed Test Item Normative References Test

Performed Deviation

Electrostatic Discharge IEC 61000-4-2: 2001 Yes No

Radiated Susceptibility IEC 61000-4-3: 2006 Yes No

Electrical Fast Transient/Burst IEC 61000-4-4: 2004 Yes No

Surge IEC 61000-4-5: 2005 Yes No

Conducted Susceptibility IEC 61000-4-6: 2006 Yes No

Power Frequency Magnetic Field IEC 61000-4-8: 2001 Yes No

Voltage Dips and Interruption IEC 61000-4-11: 2004 Yes No


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2.2. List of Test Equipment Conducted Emission / SR-1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCI 100726 2009/04/23 Two-Line V-Network R&S ENV216 100013 2009/06/11 Two-Line V-Network R&S ENV216 100014 2009/04/23 Balanced Telecom ISN Fischer FCC-TLISN-T2-02 20352 2009/02/03 Balanced Telecom ISN Fischer FCC-TLISN-T4-02 20353 2009/02/03 Balanced Telecom ISN Fischer FCC-TLISN-T8-02 20354 2009/02/03 Current Probe R&S EZ-17 100255 2009/04/18 50ohm Coaxial Switch Anritsu MP59B 6200464462 2008/11/24 50ohm Termination SHX TF2 07081401 2008/09/28 50ohm Termination SHX TF2 07081402 2008/09/28 50ohm Termination SHX TF2 07081403 2008/09/28 Coaxial Cable Luthi RG223 SR1-C2 2009/05/25 Temperature/Humidity Meter zhicheng ZC1-2 SR1-TH 2009/03/31 Radiated Emission / AC-1 Instrument Manufacturer Type No. Serial No Cal. Date Spectrum Analyzer Agilent E4403B MY45102715 N/A Spectrum Analyzer Agilent E4403B MY45102798 N/A EMI Test Receiver R&S ESCI 100175 2008/11/15 Preamplifier Quietek AP-025C CHM-0511006 2008/11/24 Preamplifier Quietek AP-025C CHM-0609028 2008/11/24 Bilog Type Antenna Schaffner CBL6112B 2933 2008/11/24 Bilog Type Antenna Schaffner CBL6112B 2931 2008/11/24 50ohm Coaxial Switch Anritsu MP59B 6200447303 2008/11/24 50ohm Coaxial Switch Anritsu MP59B 6200464461 2008/11/24 50ohm Coaxial Switch Anritsu MP59B 6200447305 2008/11/24 Coaxial Cable Huber+Suhner SUCOFLEX 106 AC1-L 2009/05/25 Coaxial Cable Huber+Suhner SUCOFLEX 106 AC1-R 2009/05/25 Coaxial Cable Huber+Suhner SUCOFLEX 106 AC1-C 2009/05/25 Temperature/Humidity Meter zhicheng ZC1-2 AC1-TH 2009/03/31 Radiated Emission / AC-2 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCI 100573 2009/04/23 Bilog Antenna Teseq GmbH CBL6112D 27611 2009/02/25 Coaxial Cable Huber+Suhner SUCOFLEX 106 AC2-C 2009/05/25 Temperature/Humidity Meter zhicheng ZC1-2 AC1-TH 2009/03/31 Radiated Emission / AC-3 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCI 100176 2008/11/15 Bilog Antenna Teseq GmbH CBL6112D 27613 2009/02/25 Coaxial Cable Huber+Suhner SUCOFLEX 106 AC3-C 2009/05/25 Temperature/Humidity Meter zhicheng ZC1-2 AC3-TH 2009/03/31 Harmonic Current Emission / SR-1 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source California 5001iX-208 56741 2008/11/18 Power Analyzer California PACS-1 72419 2008/11/18 Temperature/Humidity Meter zhicheng ZC1-2 SR1-TH 2009/03/31


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Voltage Fluctuation and Flicker / SR-1 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source California 5001iX-208 56741 2008/11/18 Power Analyzer California PACS-1 72419 2008/11/18 Temperature/Humidity Meter zhicheng ZC1-2 SR1-TH 2009/03/31 Electrostatic Discharge / SR-3 Instrument Manufacturer Type No. Serial No Cal. Date ESD Simulator KeyTek MZ-15/EC 0511209 2009/05/05 ESD Simulator EM TEST dito V0616101367 2008/08/08 Barometer Fengyun DYM3 0506048 2008/12/07 Temperature/Humidity Meter zhicheng ZC1-2 SR3-TH 2009/03/31 Radiated Susceptibility / AC-4 Instrument Manufacturer Type No. Serial No Cal. Date Signal Generator R&S SML03 102324 2008/10/21 Power Meter Boonton 4231A 144502 2008/10/21 Power Sensor Boonton 51011-EMC 33859 2008/10/21 RF Switch Network Schaffner RFS N100 21799 N/A Power Amplifier Schaffner CBA9428 43516 N/A Power Amplifier Schaffner CBA9413B 43526 N/A Directional Coupler A&R DC7144A 312249 N/A Directional Coupler Schaffner CHA 9652B 0121 N/A Electric Field Probe Type 8.3 narda 2244/90.21 AZ-0030 2009/06/11 Electromagnetic Radiation Meter narda 2244/70 AW-0074 2009/06/11

Bilog Type Antenna Schaffner CBL6141A 4278 N/A Horn Antenna A&R AT4002A 312312 N/A Temperature/Humidity Meter zhicheng ZC1-2 AC4-TH 2009/03/31 Electrical Fast Transient/Burst / SR-2 Instrument Manufacturer Type No. Serial No Cal. Date Immunity Test System KeyTek EMCpro 508273 2009/04/23 CCL KeyTek CCL 0510181 2009/04/23 Temperature/Humidity Meter zhicheng ZC1-2 SR3-TH 2009/03/31 Surge / SR-2 Instrument Manufacturer Type No. Serial No Cal. Date Immunity Test System KeyTek EMCpro 508273 2009/04/23 Coupler/Decoupler Telecom line KeyTek CM-TELCD 0506277 N/A

Coupler/Decoupler Signal line KeyTek CM-I/OCD 0508206 N/A

Temperature/Humidity Meter zhicheng ZC1-2 QT-TH005 2009/03/31


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Conducted Susceptibility / SR-2 Instrument Manufacturer Type No. Serial No Cal. Date RF-Generator Schaffner NSG2070 1120 2008/11/12 Attenuator Schaffner INA2070-1 2120 2008/11/12 CDN Schaffner CDN M016 21249 2008/11/12 CDN Teseq GmbH CDN M016 24484 2008/09/03 CDN Schaffner CDN T400 19083 2008/11/12 CDN Teseq GmbH CDN T400 22461 2008/09/03 EM Clamp Schaffner KEMZ 801 21041 2008/11/12 50ohm Termination SHX TF2 07081404 2008/09/28 50ohm Termination SHX TF2 07081405 2008/09/28 50ohm Termination SHX TF2 07081406 2008/09/28 Temperature/Humidity Meter zhicheng ZC1-2 SR2-TH 2009/03/31 Power Frequency Magnetic Field / SR-2 Instrument Manufacturer Type No. Serial No Cal. Date Immunity Test System KeyTek EMCpro 508273 2009/04/23 CM-HCOIL H-Field Loop KeyTek F-1000-4-8/9/10-L-1M 05016 2009/04/23 Clamp Meter Fluke 312 89390047 2009/03/31 Temperature/Humidity Meter zhicheng ZC1-2 SR2-TH 2009/03/31 Voltage Dips and Interruption / SR-2 Instrument Manufacturer Type No. Serial No Cal. Date Immunity Test System KeyTek EMCpro 508273 2009/04/23 Temperature/Humidity Meter zhicheng ZC1-2 SR2-TH 2009/03/31


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2.3. Measurement Uncertainty Conducted Emission (Mains Ports)

The measurement uncertainty is evaluated as ± 2.26 dB.

Conducted Emission (Telecommunication Ports) The measurement uncertainty is evaluated as ± 2.26 dB.

Radiated Emission The measurement uncertainty is evaluated as ± 3.19 dB.

Harmonic Current Emission The measurement uncertainty is evaluated as ± 1.2 %.

Voltage Fluctuations and Flicker The measurement uncertainty is evaluated as ± 1.5 %.

Electrostatic Discharge As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 2005[E], the requirements for measurement uncertainty in ESD testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant ESD standards. The immunity test signal from the ESD system meet the required specifications in IEC 61000-4-2 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%.

Radiated Susceptibility As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 2005[E], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC 61000-4-3 through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 dB.

Electrical Fast Transient/Burst As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant FT/Burst standards. The immunity test signal from the FT/Burst system meet the required specifications in IEC 61000-4-4 through the calibration report with the calibrated uncertainty for the waveform of voltage. Frequency and timing as being 1.63%, 2.8 10-10 and 2.76%.

Surge As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 2005[E], the requirements for measurement uncertainty in Surge testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant Surge standards. The immunity test signal from the Surge system meet the required specifications in IEC 61000-4-5 through the calibration report with the calibrated uncertainty for the waveform of


Page: 21 of 132

voltage and timing as being 1.63 % and 2.76%. Conducted Susceptibility

As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 2005[E], the requirements for measurement uncertainty in CS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant CS standards. The immunity test signal from the CS system meet the required specifications in IEC 61000-4-6 through the calibration for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 3.72 dB and 2.78 dB.

Power Frequency Magnetic Field As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 2005[E], the requirements for measurement uncertainty in PFM testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant PFM standards. The immunity test signal from the PFM system meet the required specifications in IEC 61000-4-8 through the calibration report with the calibrated uncertainty for the Gauss Meter to verify the output level of magnetic field strength as being 2 %.

Voltage Dips and Interruption As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 2005[E], the requirements for measurement uncertainty in DIP testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant DIP standards. The immunity test signal from the DIP system meet the required specifications in IEC 61000-4-11 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%.


Page: 22 of 132

2.4. Test Environment Performed Item Items Required Actual Temperature (°C) 15-35 23 Conducted Emission (Mains Ports) Humidity (%RH) 25-75 44

Barometric pressure (kpa) 86-106 95-105 Temperature (°C) 15-35 23 Conducted Emission (Telecommunication Ports)

Humidity (%RH) 25-75 44

Barometric pressure (kpa) 86-106 95-105 Temperature (°C) 15-35 25 Radiated Emission Humidity (%RH) 25-75 44 Barometric pressure (kpa) 86-106 95-105 Temperature (°C) 15-35 23 Harmonic Current Emission Humidity (%RH) 25-75 44

Barometric pressure (kpa) 86-106 95-105 Temperature (°C) 15-35 23 Voltage Fluctuation and Flicker Humidity (%RH) 25-75 44

Barometric pressure (kpa) 86-106 95-105 Temperature (°C) 15-35 23 Electrostatic Discharge Humidity (%RH) 30-60 44 Barometric pressure (kpa) 86-106 95-105 Temperature (°C) 15-35 23 Radiated Susceptibility Humidity (%RH) 25-75 44 Barometric pressure (kpa) 86-106 95-105 Temperature (°C) 15-35 23 Electrical Fast Transient/Burst Humidity (%RH) 25-75 44

Barometric pressure (kpa) 86-106 95-105 Temperature (°C) 15-35 23 Surge Humidity (%RH) 10-75 44 Barometric pressure (kpa) 86-106 95-105 Temperature (°C) 15-35 23 Conducted Susceptibility Humidity (%RH) 25-75 44

Barometric pressure (kpa) 86-106 95-105 Temperature (°C) 15-35 23 Power Frequency Magnetic Field Humidity (%RH) 25-75 44

Barometric pressure (kpa) 86-106 95-105 Temperature (°C) 15-35 23 Voltage Dips and Interruption Humidity (%RH) 25-75 44

Barometric pressure (kpa) 86-106 95-105


Page: 23 of 132

3. Conducted Emission (Main Ports)

3.1. Test Specification

According to EMC Standard: EN 55022 Class B

3.2. Test Setup

3.3. Limit

Limits for Class A Equipment

Frequency (MHz)

QP (dBuV)

AV (dBuV)

0.15 - 0.50 79 66

0.50 - 30 73 60

Note: The lower limit shall apply at the transition frequencies.


Page: 24 of 132

Limits for Class B Equipment

Frequency (MHz)

QP (dBuV)

AV (dBuV)

0.15 - 0.50 66 - 56 56 - 46

0.50 - 5.0 56 46

5.0 - 30 60 50

Note 1: The lower limit shall apply at the transition frequencies. Note 2: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz

to 0.5 MHz.

3.4. Test Procedure The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a receiver bandwidth of 9kHz.

3.5. Deviation from Test Standard No deviation.


Page: 25 of 132

3.6. Test Result Engineer : Peter

Site : SR-1 (Conducted Emission and Power

Disturbance Test)

Time : 2009/06/03 - 04:44

Limit : EN55022_B_00M_QP Margin : 0

EUT : Notebook PC Probe : ENV216_100014(0.009-30MHz) - Line1

Power : AC 230V/50Hz Note : Mode 1: LCD (1366*768@60Hz) + VGA

(1366*768@60Hz)


Page: 26 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 04:45




(1366*768@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.150 10.160 18.900 29.060 -36.940 66.000 QUASIPEAK

2 * 0.198 9.580 38.800 48.380 -16.249 64.629 QUASIPEAK

3 0.262 9.469 30.100 39.569 -23.231 62.800 QUASIPEAK

4 0.330 9.514 26.000 35.514 -25.343 60.857 QUASIPEAK

5 0.458 9.599 26.900 36.499 -20.701 57.200 QUASIPEAK

6 20.398 10.448 26.100 36.548 -23.452 60.000 QUASIPEAK

Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor


Page: 27 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 04:45

Limit : EN55022_B_00M_AV Margin : 0



(1366*768@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.150 10.160 4.600 14.760 -41.240 56.000 AVERAGE

2 0.198 9.580 32.400 41.980 -12.649 54.629 AVERAGE

3 0.262 9.469 24.400 33.869 -18.931 52.800 AVERAGE

4 0.330 9.514 23.200 32.714 -18.143 50.857 AVERAGE

5 * 0.458 9.599 25.900 35.499 -11.701 47.200 AVERAGE

6 20.398 10.448 19.000 29.448 -20.552 50.000 AVERAGE



Page: 28 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 04:47




(1366*768@60Hz)


Page: 29 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 04:49




(1366*768@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.150 10.006 18.400 28.406 -37.594 66.000 QUASIPEAK

2 * 0.198 9.664 36.300 45.964 -18.665 64.629 QUASIPEAK

3 0.262 9.584 28.000 37.584 -25.216 62.800 QUASIPEAK

4 0.326 9.590 24.400 33.990 -26.981 60.971 QUASIPEAK

5 3.870 9.720 21.500 31.220 -24.780 56.000 QUASIPEAK

6 20.334 10.420 25.000 35.420 -24.580 60.000 QUASIPEAK



Page: 30 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 04:49




(1366*768@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.150 10.006 3.600 13.606 -42.394 56.000 AVERAGE

2 * 0.198 9.664 31.700 41.364 -13.265 54.629 AVERAGE

3 0.262 9.584 23.900 33.484 -19.316 52.800 AVERAGE

4 0.326 9.590 21.700 31.290 -19.681 50.971 AVERAGE

5 3.870 9.720 19.000 28.720 -17.280 46.000 AVERAGE

6 20.334 10.420 17.900 28.320 -21.680 50.000 AVERAGE



Page: 31 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 05:51



Power : AC 230V/50Hz Note : Mode 2: LCD (1280*720@60Hz) + HDMI

(1280*720@60Hz)


Page: 32 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 05:53




(1280*720@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.150 10.160 38.400 48.560 -17.440 66.000 QUASIPEAK

2 * 0.206 9.526 41.500 51.026 -13.374 64.400 QUASIPEAK

3 0.262 9.469 33.700 43.169 -19.631 62.800 QUASIPEAK

4 0.294 9.490 24.800 34.290 -27.596 61.886 QUASIPEAK

5 12.678 10.170 27.400 37.570 -22.430 60.000 QUASIPEAK

6 23.566 10.660 31.300 41.960 -18.040 60.000 QUASIPEAK



Page: 33 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 05:53




(1280*720@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.150 10.160 22.200 32.360 -23.640 56.000 AVERAGE

2 0.206 9.526 29.700 39.226 -15.174 54.400 AVERAGE

3 0.262 9.469 20.000 29.469 -23.331 52.800 AVERAGE

4 0.294 9.490 12.900 22.390 -29.496 51.886 AVERAGE

5 12.678 10.170 19.300 29.470 -20.530 50.000 AVERAGE

6 * 23.566 10.660 25.300 35.960 -14.040 50.000 AVERAGE



Page: 34 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 05:55




(1280*720@60Hz)


Page: 35 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 05:57




(1280*720@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.150 10.006 37.400 47.406 -18.594 66.000 QUASIPEAK

2 0.194 9.680 41.600 51.280 -13.463 64.743 QUASIPEAK

3 0.266 9.586 32.300 41.886 -20.800 62.686 QUASIPEAK

4 * 0.582 9.682 34.200 43.882 -12.118 56.000 QUASIPEAK

5 0.654 9.730 33.300 43.030 -12.970 56.000 QUASIPEAK

6 21.690 10.470 31.200 41.670 -18.330 60.000 QUASIPEAK



Page: 36 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 05:57




(1280*720@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.150 10.006 22.600 32.606 -23.394 56.000 AVERAGE

2 * 0.194 9.680 32.100 41.780 -12.963 54.743 AVERAGE

3 0.266 9.586 22.000 31.586 -21.100 52.686 AVERAGE

4 0.582 9.682 20.900 30.582 -15.418 46.000 AVERAGE

5 0.654 9.730 20.700 30.430 -15.570 46.000 AVERAGE

6 21.690 10.470 26.000 36.470 -13.530 50.000 AVERAGE



Page: 37 of 132

3.7. Test Photograph Test Mode: Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Description: Front View of Conducted Emission Test Setup for Main

Test Mode: Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Description: Back View of Conducted Emission Test Setup for Main


Page: 38 of 132

Test Mode: Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) Description: Front View of Conducted Emission Test Setup for Main

Test Mode: Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) Description: Back View of Conducted Emission Test Setup for Main


Page: 39 of 132

4. Conducted Emissions (Telecommunication Ports)

4.1. Test Specification According to EMC Standard: EN 55022 Class B

4.2. Test Setup

4.3. Limit


Voltage Current Frequency

(MHz) QP (dBuV)

AV (dBuV)

QP (dBuA)

AV (dBuA)

0.15 - 0.50 97 - 87 84 - 74 53 - 43 40 - 30

0.50 - 30 87 74 43 30

Note: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz to 0.50 MHz.


Page: 40 of 132


Voltage Current Frequency

(MHz) QP (dBuV)

AV (dBuV)

QP (dBuA)

AV (dBuA)

0.15 - 0.50 84 - 74 74 - 64 40 - 30 30 - 20

0.50 - 30 74 64 30 20

Note: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz to 0.50 MHz.

4.4. Test Procedure

The mains voltage shall be supplied to the EUT via the LISN when the measurement of telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz.



Page: 41 of 132

4.6. Test Result Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 05:32

Limit : ISN_Voltage_B_00M_QP Margin : 0

EUT : Notebook PC Probe : FCC-TLISN-T4_20353(0.15-30MHz) - Line1


(1366*768@60Hz) – LAN 10Mbps


Page: 42 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 05:34




(1366*768@60Hz) – LAN 10Mbps

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 3.698 9.800 42.500 52.300 -21.700 74.000 QUASIPEAK

2 4.078 9.810 40.900 50.710 -23.290 74.000 QUASIPEAK

3 4.838 9.840 41.300 51.140 -22.860 74.000 QUASIPEAK

4 5.598 9.860 42.000 51.860 -22.140 74.000 QUASIPEAK

5 7.502 9.913 51.300 61.213 -12.787 74.000 QUASIPEAK

6 * 12.502 10.030 52.600 62.630 -11.370 74.000 QUASIPEAK



Page: 43 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 05:34

Limit : ISN_Voltage_B_00M_AV Margin : 0



(1366*768@60Hz) – LAN 10Mbps

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 3.698 9.800 36.000 45.800 -18.200 64.000 AVERAGE

2 4.078 9.810 36.100 45.910 -18.090 64.000 AVERAGE

3 4.838 9.840 36.700 46.540 -17.460 64.000 AVERAGE

4 5.598 9.860 37.100 46.960 -17.040 64.000 AVERAGE

5 7.502 9.913 45.400 55.313 -8.687 64.000 AVERAGE

6 * 12.502 10.030 45.400 55.430 -8.570 64.000 AVERAGE



Page: 44 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 05:37




(1366*768@60Hz) – LAN 100Mbps


Page: 45 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 05:39




(1366*768@60Hz) – LAN 100Mbps

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.934 9.797 46.300 56.097 -17.903 74.000 QUASIPEAK

2 * 1.022 9.790 50.300 60.090 -13.910 74.000 QUASIPEAK

3 1.266 9.780 49.800 59.580 -14.420 74.000 QUASIPEAK

4 13.418 10.050 48.900 58.950 -15.050 74.000 QUASIPEAK

5 16.226 10.110 49.200 59.310 -14.690 74.000 QUASIPEAK

6 19.710 10.190 47.500 57.690 -16.310 74.000 QUASIPEAK



Page: 46 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 05:39




(1366*768@60Hz) – LAN 100Mbps

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.934 9.797 43.100 52.897 -11.103 64.000 AVERAGE

2 * 1.022 9.790 47.800 57.590 -6.410 64.000 AVERAGE

3 1.266 9.780 47.400 57.180 -6.820 64.000 AVERAGE

4 13.418 10.050 46.600 56.650 -7.350 64.000 AVERAGE

5 16.226 10.110 47.000 57.110 -6.890 64.000 AVERAGE

6 19.710 10.190 44.000 54.190 -9.810 64.000 AVERAGE



Page: 47 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 06:07



Power : AC 230V/50Hz Note : Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) - LAN 10Mbps


Page: 48 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 06:09




(1280*720@60Hz) - LAN 10Mbps

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 3.694 9.800 41.900 51.700 -22.300 74.000 QUASIPEAK

2 7.502 9.913 51.600 61.513 -12.487 74.000 QUASIPEAK

3 9.402 9.950 45.100 55.050 -18.950 74.000 QUASIPEAK

4 * 12.502 10.030 53.000 63.030 -10.970 74.000 QUASIPEAK

5 14.838 10.080 40.800 50.880 -23.120 74.000 QUASIPEAK

6 21.094 10.226 44.800 55.026 -18.974 74.000 QUASIPEAK



Page: 49 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 06:09




(1280*720@60Hz) - LAN 10Mbps

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 3.694 9.800 38.200 48.000 -16.000 64.000 AVERAGE

2 * 7.502 9.913 46.000 55.913 -8.087 64.000 AVERAGE

3 9.402 9.950 37.200 47.150 -16.850 64.000 AVERAGE

4 12.502 10.030 45.300 55.330 -8.670 64.000 AVERAGE

5 14.838 10.080 34.100 44.180 -19.820 64.000 AVERAGE

6 21.094 10.226 39.200 49.426 -14.574 64.000 AVERAGE



Page: 50 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 06:12




(1280*720@60Hz) - LAN 100Mbps


Page: 51 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 06:14




(1280*720@60Hz) - LAN 100Mbps

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 1.270 9.780 46.300 56.080 -17.920 74.000 QUASIPEAK

2 11.894 10.010 47.200 57.210 -16.790 74.000 QUASIPEAK

3 13.602 10.050 48.100 58.150 -15.850 74.000 QUASIPEAK

4 16.230 10.110 48.900 59.010 -14.990 74.000 QUASIPEAK

5 18.242 10.160 48.500 58.660 -15.340 74.000 QUASIPEAK

6 * 21.662 10.240 50.200 60.440 -13.560 74.000 QUASIPEAK



Page: 52 of 132

Engineer : Peter


Disturbance Test)

Time : 2009/06/03 - 06:14




(1280*720@60Hz) - LAN 100Mbps

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 1.270 9.780 43.500 53.280 -10.720 64.000 AVERAGE

2 11.894 10.010 43.700 53.710 -10.290 64.000 AVERAGE

3 13.602 10.050 45.300 55.350 -8.650 64.000 AVERAGE

4 * 16.230 10.110 46.900 57.010 -6.990 64.000 AVERAGE

5 18.242 10.160 45.600 55.760 -8.240 64.000 AVERAGE

6 21.662 10.240 46.000 56.240 -7.760 64.000 AVERAGE



Page: 53 of 132

4.7. Test Photograph Test Mode: Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Description: Front View of Conducted Emission Test Setup for LAN

Test Mode: Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Description: Back View of Conducted Emission Test Setup for LAN


Page: 54 of 132

Test Mode: Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) Description: Front View of Conducted Emission Test Setup for LAN

Test Mode: Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) Description: Back View of Conducted Emission Test Setup for LAN


Page: 55 of 132

5. Radiated Emission

5.1. Test Specification According to EMC Standard: EN 55022 Class B

5.2. Test Setup

Below 1GHz Test Setup:

Above 1GHz Test Setup:


Page: 56 of 132

5.3. Limit


Frequency (MHz)

Distance (m)

QP (dBuV/m)

30 - 230 10 40

230 - 1000 10 47


Frequency (GHz)

Distance (m)

Average (dBuV/m)

Peak (dBuV/m)

1 - 3 3 56 76

3 - 6 3 60 80

Note 1: The lower limit shall apply at the transition frequency. Note 2: Distance refers to the distance in meters between the measuring instrument antenna

and the closed point of any part of the device or system.


Frequency (MHz)

Distance (m)

QP (dBuV/m)

30 - 230 10 30

230 - 1000 10 37


Frequency (GHz)

Distance (m)

Average (dBuV/m)

Peak (dBuV/m)

1 - 3 3 50 70

3 - 6 3 54 74

Note 1: The lower limit shall apply at the transition frequency. Note 2: Distance refers to the distance in meters between the measuring instrument antenna

and the closed point of any part of the device or system.


Page: 57 of 132

5.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters for below 1GHz and 3 meters for above 1GHz. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement.

The bandwidth below 1GHz setting on the field strength meter is 120 kHz and above 1GHz is 1MHz. Conditional testing procedure: The highest internal source of an EUT is defined as the highest frequency generated or used within the EUT or on which the EUT operates or tunes.

Highest frequency generated or used in the device or on which the device operates or tunes

(MHz)

Upper frequency of measurement range (MHz)

< 108 1000

108 - 500 2000

500 - 1000 5000

Above 1000 5th harmonic of the highest frequency or 6

GHz, whichever is less

5.5. Deviation from Test Standard

No deviation.


Page: 58 of 132

5.6. Test Result Engineer : Seven

Site : AC-1 (10m Semi-Anechoic Chamber) Time : 2009/06/03 - 20:04


EUT : Notebook PC Probe : CBL6112B_2931(30-1000MHz) - HORIZONTAL


(1366*768@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type Ant Pos

(cm)

Table Pos

(deg)

1 59.100 -26.770 45.866 19.096 -10.904 30.000 QUASIPEAK 387.200 359.400

2 66.375 -27.040 47.475 20.435 -9.565 30.000 QUASIPEAK 220.300 200.300

3 102.750 -21.270 43.055 21.785 -8.215 30.000 QUASIPEAK 126.500 360.000

4 240.975 -19.570 48.565 28.995 -8.005 37.000 QUASIPEAK 100.000 165.200

5 265.225 -17.765 45.585 27.820 -9.180 37.000 QUASIPEAK 100.000 59.700

6 * 721.125 -7.890 37.544 29.654 -7.346 37.000 QUASIPEAK 100.000 260.300

Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor


Page: 59 of 132

Engineer : Seven



EUT : Notebook PC Probe : CBL6112B_2933(30-1000MHz) - VERTICAL


(1366*768@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)


(cm)

Table Pos

(deg)

1 37.275 -17.830 41.352 23.522 -6.478 30.000 QUASIPEAK 168.500 205.300

2 59.100 -26.600 48.518 21.918 -8.082 30.000 QUASIPEAK 315.600 43.200

3 66.375 -26.890 46.626 19.736 -10.264 30.000 QUASIPEAK 352.100 123.600

4 93.050 -22.720 46.068 23.348 -6.652 30.000 QUASIPEAK 309.200 275.100

5 265.225 -17.190 44.816 27.626 -9.374 37.000 QUASIPEAK 100.000 263.500

6 * 759.925 -7.205 37.889 30.684 -6.316 37.000 QUASIPEAK 100.000 25.300



Page: 60 of 132

Engineer : Seven


Limit : EN55022_B_(Above_1G)_03M_PK Margin : 0

EUT : Notebook PC Probe : 9120D_499(1-18GHz) - HORIZONTAL


(1366*768@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)


(cm)

Table Pos

(deg)

1 * 1050.000 -10.430 57.361 46.931 -23.069 70.000 PEAK 100.000 281.200

2 1345.000 -9.254 48.459 39.205 -30.795 70.000 PEAK 100.000 167.300

3 1600.000 -9.008 49.292 40.284 -29.716 70.000 PEAK 100.000 76.500

Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor. 4. The average measurement was not performed when the peak measured data under the limit of average detection. If the readings given are average, peak measurement should also be supplied.


Page: 61 of 132

Engineer : Seven


Limit : EN55022_B_(Above_1G)_03M_AV Margin : 0



(1366*768@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)


(cm)

Table Pos

(deg)

1 * 1050.000 -10.430 45.160 34.730 -15.270 50.000 AVERAGE 100.000 281.200

2 1345.000 -9.254 34.920 25.666 -24.334 50.000 AVERAGE 100.000 167.300

3 1600.000 -9.008 36.290 27.282 -22.718 50.000 AVERAGE 100.000 76.500



Page: 62 of 132

Engineer : Seven



EUT : Notebook PC Probe : 9120D_499(1-18GHz) - VERTICAL


(1366*768@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)


(cm)

Table Pos

(deg)

1 1110.000 -10.322 60.588 50.266 -19.734 70.000 PEAK 100.000 318.200

2 1170.000 -10.218 60.872 50.654 -19.346 70.000 PEAK 100.000 149.700

3 * 1605.000 -9.005 64.750 55.745 -14.255 70.000 PEAK 100.000 349.600



Page: 63 of 132

Engineer : Seven





(1366*768@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)


(cm)

Table Pos

(deg)

1 1110.000 -10.322 46.330 36.008 -13.992 50.000 AVERAGE 100.000 318.200

2 1170.000 -10.218 45.820 35.602 -14.398 50.000 AVERAGE 100.000 149.700

3 * 1605.000 -9.005 49.750 40.745 -9.255 50.000 AVERAGE 100.000 349.600



Page: 64 of 132

Engineer : Seven



EUT : Notebook PC Probe : CBL6112B_2931(30-1000MHz) - HORIZONTAL


(1280*720@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)


(cm)

Table Pos

(deg)

1 56.675 -26.360 43.559 17.199 -12.801 30.000 QUASIPEAK 100.000 270.600

2 216.725 -22.970 44.667 21.697 -8.303 30.000 QUASIPEAK 103.200 332.000

3 * 240.975 -19.570 51.239 31.669 -5.331 37.000 QUASIPEAK 120.200 10.600

4 265.225 -17.765 47.085 29.320 -7.680 37.000 QUASIPEAK 132.200 65.000

5 316.150 -17.050 40.355 23.305 -13.695 37.000 QUASIPEAK 100.000 32.200

6 793.875 -7.120 34.480 27.360 -9.640 37.000 QUASIPEAK 100.000 240.600



Page: 65 of 132

Engineer : Seven



EUT : Notebook PC Probe : CBL6112B_2933(30-1000MHz) - VERTICAL


(1280*720@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)


(cm)

Table Pos

(deg)

1 37.275 -17.830 39.463 21.633 -8.367 30.000 QUASIPEAK 356.200 214.000

2 83.350 -24.550 45.607 21.057 -8.943 30.000 QUASIPEAK 400.000 265.000

3 93.050 -22.720 44.462 21.742 -8.258 30.000 QUASIPEAK 400.000 325.100

4 240.975 -19.170 46.672 27.502 -9.498 37.000 QUASIPEAK 216.000 21.000

5 265.225 -17.190 45.209 28.019 -8.981 37.000 QUASIPEAK 168.000 320.000

6 * 781.750 -6.660 37.392 30.732 -6.268 37.000 QUASIPEAK 155.200 112.300



Page: 66 of 132

Engineer : Seven





(1280*720@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)


(cm)

Table Pos

(deg)

1 * 1050.000 -10.430 51.964 41.534 -28.466 70.000 PEAK 100.000 214.500

2 1245.000 -9.865 46.166 36.301 -33.699 70.000 PEAK 100.000 10.000

3 1640.000 -9.002 44.896 35.894 -34.106 70.000 PEAK 100.000 291.600



Page: 67 of 132

Engineer : Seven



EUT : Notebook Probe : 9120D_499(1-18GHz) - HORIZONTAL


(1280*720@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)


(cm)

Table Pos

(deg)

1 * 1050.000 -10.430 36.450 26.020 -23.980 50.000 AVERAGE 100.000 214.500

2 1245.000 -9.865 31.350 21.485 -28.515 50.000 AVERAGE 100.000 10.000

3 1640.000 -9.002 30.600 21.598 -28.402 50.000 AVERAGE 100.000 291.600



Page: 68 of 132

Engineer : Seven





(1280*720@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)


(cm)

Table Pos

(deg)

1 1345.000 -9.254 51.077 41.823 -28.177 70.000 PEAK 100.000 94.600

2 * 1560.000 -9.042 52.972 43.931 -26.069 70.000 PEAK 100.000 228.300

3 1645.000 -9.000 52.097 43.096 -26.904 70.000 PEAK 100.000 119.500



Page: 69 of 132

Engineer : Seven





(1280*720@60Hz)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)


(cm)

Table Pos

(deg)

1 1345.000 -9.254 36.310 27.056 -22.944 50.000 AVERAGE 100.000 94.600

2 1560.000 -9.042 37.590 28.549 -21.451 50.000 AVERAGE 100.000 228.300

3 * 1645.000 -9.000 38.510 29.509 -20.491 50.000 AVERAGE 100.000 119.500



Page: 70 of 132

5.7. Test Photograph Test Mode : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Description : Front View of Radiated Emission Test Setup (Below 1GHz)

Test Mode : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Description : Back View of Radiated Emission Test Setup (Below 1GHz)


Page: 71 of 132

Test Mode : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Description : Front View of Radiated Emission Test Setup (Above 1GHz)

Test Mode : Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz) Description : Back View of Radiated Emission Test Setup (Above 1GHz)


Page: 72 of 132

Test Mode : Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) Description : Front View of Radiated Emission Test Setup (Below 1GHz)

Test Mode : Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) Description : Back View of Radiated Emission Test Setup (Below 1GHz)


Page: 73 of 132

Test Mode : Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) Description : Front View of Radiated Emission Test Setup (Above 1GHz)

Test Mode : Mode 2: LCD (1280*720@60Hz) + HDMI (1280*720@60Hz) Description : Back View of Radiated Emission Test Setup (Above 1GHz)


Page: 74 of 132

6. Harmonic Current Emission

6.1. Test Specification According to EMC Standard: EN 61000-3-2

6.2. Test Setup

6.3. Limit

(a) Limits of Class A Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current

A

Harmonics Order

n


A

Odd harmonics Even harmonics

3 2.30 2 1.08

5 1.14 4 0.43

7 0.77 6 0.30

9 0.40 8 ≤ n ≤ 40 0.23 * 8/n

11 0.33

13 0.21

15 ≤ n ≤ 39 0.15 * 15/n


Page: 75 of 132

(b) Limits of Class B Harmonics Currents

For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table that is the limit of Class A multiplied by a factor of 1.5.

(c) Limits of Class C Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency

％

2 2

3 30．λ＊

5 10

7 7

9 5

11 ≤ n ≤ 39 (odd harmonics only)

3

＊λ is the circuit power factor

(d) Limits of Class D Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current per watt

mA/W


A

3 3.4 2.30

5 1.9 1.14

7 1.0 0.77

9 0.5 0.40

11 0.35 0.33

11 ≤ n ≤ 39 (odd harmonics only)

3.85/n See limit of Class A


Page: 76 of 132

6.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed.



Page: 77 of 132

6.6. Test Result Product Notebook PC

Test Item Harmonic Current Emission

Test Mode Mode 1: LCD (1366*768@60Hz) + VGA (1366*768@60Hz)

Date of Test 2009/06/03

Test Site SR-1

Test Result: Pass Source qualification: Normal

Current & voltage waveforms

-3-2-10123

-300-200-1000100200300

Cur

rent

(Am

ps)

Voltage (V

olts)

Harmonics and Class D limit line European Limits

0.0000.0250.0500.0750.1000.1250.1500.1750.200

Cur

rent

RM

S(A

mps

)

Harmonic #4 8 12 16 20 24 28 32 36 40

Test result: Pass


Page: 78 of 132

Test Result: N/L Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000 Highest parameter values during test:

V_RMS (Volts): 230.06 Freq

test reportfaenl.msi.com/ftp/ce documents/notebook/ms-1461x (x410... · 2015. 9. 9. · report...

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