test report - msi notebookfaenl.msi.com/ftp/ce documents/notebook/archive/ms-171ax, ms-171bx... ·...

Test Report

Product Name ： MEGA Book

Model No. ： MS-171B, MS-171A

Applicant ： Micro-Star Int’L Co.,Ltd.

Address ： No.69, Li-De St, Chung-Ho City, Taipei Hsien, Taiwan

Date of Receipt ： 2007/03/07

Issued Date ： 2007/05/28

Report No. ： 073S006-IT-CE-P11V04

The test results relate only to the samples tested.The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by CNLA, NVLAP or any agency of the Government.The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

Report No： 073S006-IT-CE-P11V04

Page: 2 of 224

Test Report Cert i f icat ion Issued Date : 2007/05/28 Report No. : 073S006-IT-CE-P11V04

Product Name : MEGA Book

Applicant : Micro-Star Int’L Co.,Ltd.

Address : No.69, Li-De St, Chung-Ho City, Taipei Hsien, Taiwan

Manufacturer : MSI ELECTRONICS(KUNSHAN)CO., LTD

Model No. : MS-171B, MS-171A

Rated Voltage : AC 230 V / 50 Hz

EUT Voltage : AC 100-240 V / 50-60 Hz

Trade Name : MSI

Applicable Standard : EN 55022: 1998+A1: 2000+A2: 2003 Class B

EN 61000-3-2: 2000

EN 61000-3-3:1995+A1: 2001

EN 55024: 1998+A1: 2001+A2: 2003

AS/NZS CISPR 22: 2004

Test Result : Complied

Performed Location : Suzhou EMC laboratory

No.99 Hongye Rd., Suzhou Industrial Park Loufeng

Hi-Tech Development Zone.,Suzhou, China

TEL:+86-6251-5088 / FAX: +86-6251-5098

Documented By :

( Mandy Liu )

Reviewed By :

( Dream Cao )

Approved By :

( Gene Zhang )


Page: 3 of 224

Laboratory Information

We , QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited by the following accreditation Bodies in compliance with ISO 17025, EN 45001 and Guide 25:

The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation’s Web Site : http://tw.quietek.com/modules/myalbum/ The address and introduction of QuieTek Corporation’s laboratories can be founded in our Web site : http://www.quietek.com/ If you have any comments, Please don’t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory :

No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL:+886-3-592-8858 / FAX:+886-3-592-8859 E-Mail : [email protected]

LinKou Testing Laboratory :

No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : +886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : [email protected]

Suzhou Testing Laboratory : No.99 Hongye Rd., Suzhou Industrial Park Loufeng Hi-Tech Development Zone., SuZhou, China

TEL : +86-512-6251-5088 / FAX : 86-512-6251-5098 E-Mail : [email protected]

Taiwan R.O.C. : BSMI, DGT, CNLA

Germany : TUV Rheinland

Norway : Nemko, DNV

USA : FCC, NVLAP

Japan : VCCI

0914

1313

1596


Page: 4 of 224

TABLE OF CONTENTS Description Page 1. General Information .......................................................................................................7 1.1. EUT Description .........................................................................................................7 1.2. Mode of Operation ...................................................................................................14 1.3. Tested System Details..............................................................................................17 1.4. Configuration of Tested System ...............................................................................18 1.5. EUT Exercise Software ............................................................................................19 2. Technical Test ..............................................................................................................20 2.1. Summary of Test Result ...........................................................................................20 2.2. List of Test Equipment ..............................................................................................21 2.3. Measurement Uncertainty ........................................................................................24 2.4. Test Environment .....................................................................................................26 3. Conducted Emission (Main Terminals).........................................................................27 3.1. Test Specification .....................................................................................................27 3.2. Test Setup ................................................................................................................27 3.3. Limit…. .....................................................................................................................27 3.4. Test Procedure .........................................................................................................28 3.5. Deviation from Test Standard ...................................................................................28 3.6. Test Result ...............................................................................................................29 3.7. Test Photograph .......................................................................................................53 4. Conducted Emissions (Telecommunication Ports).......................................................57 4.1. Test Specification .....................................................................................................57 4.2. Test Setup ................................................................................................................57 4.3. Limit…. .....................................................................................................................57 4.4. Test Procedure .........................................................................................................58 4.5. Deviation from Test Standard ...................................................................................58 4.6. Test Result ...............................................................................................................59 4.7. Test Photograph .....................................................................................................107 5. Radiated Emission..................................................................................................... 119 5.1. Test Specification ................................................................................................... 119 5.2. Test Setup .............................................................................................................. 119 5.3. Limit…. ................................................................................................................... 119 5.4. Test Procedure .......................................................................................................120 5.5. Deviation from Test Standard .................................................................................120 5.6. Test Result .............................................................................................................121 5.7. Test Photograph .....................................................................................................129 6. Harmonic Current Emission .......................................................................................133 6.1. Test Specification ...................................................................................................133


Page: 5 of 224

6.2. Test Setup ..............................................................................................................133 6.3. Limit…. ...................................................................................................................133 6.4. Test Procedure .......................................................................................................135 6.5. Deviation from Test Standard .................................................................................135 6.6. Test Result .............................................................................................................136 6.7. Test Photograph .....................................................................................................144 7. Voltage Fluctuation and Flicker..................................................................................146 7.1. Test Specification ...................................................................................................146 7.2. Test Setup ..............................................................................................................146 7.3. Limit…. ...................................................................................................................146 7.4. Test Procedure .......................................................................................................147 7.5. Deviation from Test Standard .................................................................................147 7.6. Test Result .............................................................................................................148 7.7. Test Photograph .....................................................................................................152 8. Electrostatic Discharge ..............................................................................................154 8.1. Test Specification ...................................................................................................154 8.2. Test Setup ..............................................................................................................154 8.3. Limit…. ...................................................................................................................154 8.4. Test Procedure .......................................................................................................155 8.5. Deviation from Test Standard .................................................................................155 8.6. Test Result .............................................................................................................156 8.7. Test Photograph .....................................................................................................160 9. Radiated Susceptibility ..............................................................................................162 9.1. Test Specification ...................................................................................................162 9.2. Test Setup ..............................................................................................................162 9.3. Limit…....................................................................................................................162 9.4. Test Procedure .......................................................................................................163 9.5. Deviation from Test Standard .................................................................................163 9.6. Test Result .............................................................................................................164 9.7. Test Photograph .....................................................................................................168 10. Electrical Fast Transient/Burst..................................................................................170 10.1. Test Specification...................................................................................................170 10.2. Test Setup .............................................................................................................170 10.3. Limit… ...................................................................................................................170 10.4. Test Procedure ......................................................................................................171 10.5. Deviation from Test Standard ................................................................................171 10.6. Test Result.............................................................................................................172 10.7. Test Photograph ....................................................................................................176


Page: 6 of 224

11. Surge…. ...................................................................................................................182 11.1. Test Specification...................................................................................................182 11.2. Test Setup..............................................................................................................182 11.3. Limit… ...................................................................................................................182 11.4. Test Procedure.......................................................................................................183 11.5. Deviation from Test Standard.................................................................................183 11.6. Test Result .............................................................................................................184 11.7. Test Photograph.....................................................................................................188 12. Conducted Susceptibility ..........................................................................................192 12.1. Test Specification...................................................................................................192 12.2. Test Setup .............................................................................................................192 12.3. Limit… ...................................................................................................................193 12.4. Test Procedure ......................................................................................................193 12.5. Deviation from Test Standard ................................................................................194 12.6. Test Result.............................................................................................................195 12.7. Test Photograph ....................................................................................................199 13. Power Frequency Magnetic Field .............................................................................205 13.1. Test Specification...................................................................................................205 13.2. Test Setup .............................................................................................................205 13.3. Limit… ...................................................................................................................205 13.4. Test Procedure ......................................................................................................205 13.5. Deviation from Test Standard ................................................................................205 13.6. Test Result.............................................................................................................206 13.7. Test Photograph ....................................................................................................210 14. Voltage Dips and Interruption ...................................................................................212 14.1. Test Specification...................................................................................................212 14.2. Test Setup .............................................................................................................212 14.3. Limit… ...................................................................................................................212 14.4. Test Procedure ......................................................................................................213 14.5. Deviation from Test Standard ................................................................................213 14.6. Test Result.............................................................................................................214 14.7. Test Photograph ....................................................................................................218 15. Attachment ...............................................................................................................220 　 EUT Photograph.....................................................................................................220


Page: 7 of 224

1. General Information

1.1. EUT Description

Product Name MEGA Book

Trade Name MSI

Model No. MS-171B, MS-171A Note: The new model of MS-171A is identical to the model MS-171B except adding a VGA Card. MS-171B was selected as representative model for the test and the data were recorded in this report.

Component

AC Adapter #1 Manufacturer: EDAC M/N: EA10953 Input: 100-240V~, 50/60Hz, 2.5A Output: 18-24VDC, 4.75A Cable Out: Non-Shielded, 1.8m with one ferrite core bonded

AC Adapter #2 Manufacturer: LI SHIN INTERNATION ENTERPRISE CORP. M/N: LSE0202C1990 Input: 100-240V~, 50/60Hz, 1.5A Output: 19V, 4.74A Cable Out: Non-Shielded, 1.8m with one ferrite core bonded

AC Adapter #3 Manufacturer: LITEON M/N: PA-1900-04 Input: 100-240V~, 50/60Hz, 1.5A Output: 19VDC, 4.74A Cable Out: Non-Shielded, 1.8m with one ferrite core bonded

AC Adapter #4 Manufacturer: FSP GROUP INC. M/N: FSP090-1ADC21 Input: 100-240V~, 50/60Hz, 1.6A Output: 19VDC, 4.7A Cable Out: Non-Shielded, 1.8m with one ferrite core bonded


Page: 8 of 224

Keypart list

Component Vendor VendrP/N Discription MSI P/N

AMD

TURION

X2,TL60,AMD/TMDT

L60HAX5CT,2.0GHz

TURION64-35W-2000MHz(

S1 SOCKET) TL60 512KBx2

L2 CACHE

A10-K82G056-A08

AMD

SEMPRON,AMD/SM

S3200HAX4CM,1.6G

Hz

SEMPRON(S1 SOCKET)

25W SERIES 3200+ A10-K81G6F6-A08

AMD

SEMPRON,AMD/SM

S3400HAX3CM,1.8G

Hz

SEMPRON(S1 SOCKET)

25W SERIES 3400+ A10-K81G8C6-A08

AMD

SEMPRON,AMD/SM

S3500HAX4CM,1.8G

Hz

SEMPRON(S1 SOCKET)

25W SERIES 3500+ A10-K81G8D6-A08

AMD

TURION

X2,TL50,AMD/TMDT

L50HAX4CT,1.6GHz



L2 CACHE

A10-K81G6G6-A08

AMD

TURION

X2,TL52,AMD/TMDT

L52HAX5CT,1.6GHz



L2 CACHE

A10-K81G6H6-A08

AMD

TURION,MT40,AMD/

TMSMT40BQX5LD,2

.2GHz

TURION64-25W-2200MHz

MT40 1MB L2 CACHE A10-K82G226-A08

AMD MK36,AMD/TMDMK

36HAX4CM,2.0GHz

TMDMK36HAX4CM,2.0GHz,

MPGA-638pin,TURION64-3

5W-2000MHz(S1 SOCKET)

MK36 512KB L2 CACHE

A10-K82G086-A08

AMD

TURION

X2,TL56,AMD/TMDT

L56HAX5CT



L2 CACHE

A10-K81G8E6-A08

CPU

AMD SMD3800HAX3CH

CPU,K9

SEMPRON,3800+,AMD/SM

D3800HAX3CH,2.2GHz,MP

GA-638pin,256KB L2

CACHE MOBILE

SEMPRON(S1 SOCKET)

35W SERIES 3800+

N/A


Page: 9 of 224

WD1600BEVS 160G S71-2416501-W36

WD1200BEVS 120G N/A WD

WD800BEVS 80G N/A

MHV2060BH 60GB;5400rpm S71-4401020-F06

MHV2080BH 80GB;5400rpm S71-4401030-F06

MHV2120BH 120GB;5400rpm S71-4401050-F06

Fujitsu

MHV2100BH 100GB;5400rpm S71-4401040-F06

MK1234GSX 120GB;5400rpm S71-4401050-F06

MK1032GSX 100GB;5400rpm S71-4401060-T14

MK6034GSX 80GB;5400rpm S71-4401070-T14

HDD

Toshiba

(ROHS) MK8032GSX 60GB;5400RPM S71-4401080-T14

PHILIPS SDVD8821

,SYS

ODD,PATA,12.7mm,SUPER

MULTI,PHILIPS/SDVD8821,

,8X-DVD±R/8X-DVD+RW/6

X-DVD-RW/4X-DVD±R

DL/5X-DVDRAM/8X-DVDRO

M/24X-CDR/24X-CDRW/24

X-CDROM/FOR MS-1016L1

S7A-1324010-P03

GMA-4082N

SYS/DVDRW/SLIM

TYPE/8X-DVD±R/8X-DVD+

RW/6X-DVD-RW/4X-DVD±

R

DL/5X-DVD-RAM/8X-DVDR

OM/24X-CDR/16X-CDRW/2

4X-CDROM/HLDS/GMA-408

2N/FOR MS-1016L1,RoHS

COMPLIANCE

S7A-1322010-H44

GSA-T20N ,,8X8X8X/8X6X8X/5X8X/24

X16X24X S7D-1270007-H44

LG

GCC-T10N GCC-T10N,,8x/24x24x24x S7D-1220004-H44

ODD

LITEON SSM-8515S super multi N/A

TWINMOS 8D-23JN5MHATP DDR2,333(667)MHz,512MB

,SODIMM/HYNIX CHIP, S78-2407560-T75

TS64MSQ64V6J;HY

NIX CHIP 333(667)MHz,512MB S78-2407330-T10

Memory

Transcend

78.02G63.423 333(667)MHz,1GB S78-2408120-T10


Page: 10 of 224

TS64MSQ64V6J

DDR2

SDRAM,333(667)MHz,512

MB,Micron CHIP

S78-2407331-T10

TS64MSQ64V6J 333(667)MHz,512MB,,SAM

SUNG CHIP S78-2407333-T10

TS64MSQ64V6M 333(667)MHz,512MB,INFIN

EON CHIP S78-2407430-T10

TS64MSQ64V6M

DDR2

SDRAM,333(667)MHz,512

MB/HYNIX CHIP

S78-2407431-T10

TS128MSQ64V6J,

DDR2

SDRAM,333(667)MHz,1GB/

SAMSUNG CHIP

S78-2408122-T10

78.02G63.423,ELPI

DA 333(667)MHz,1GB S78-2408100-A42

78.02G63.AF3,HYNI

X

DDR2,333(667)MHz,1GB,H

YNIX CHIP/ S78-2408210-A42

APACER

78.92G63.AF2,HYNI

X

DDR2 ,333(667)MHz,512M

B,SODIMM,//HYNIX CHIP S78-2407510-A42

EELOPE190834Z

DDR2

SDRAM,333(667)MHz,512

MB,

S78-2407610-A97

ADOPE1908342

DDR2

SDRAM,333(667)MHz,512

MB,SODIMM,

S78-2407600-A97

A-DATA

ADOPE1A16332 DDRII 667 1GB N/A

inverter Sampo YIVNMS0016D11 MODULE/Inverter S78-3300290-SG3

Isheng N/A

,EXT POWER

CORD,USA,1,1830mm,PLU

G-3P/CONN-3P,FOR

MS-1003,,

K33-3001020-I45 POWER

CORD

Battery

Isheng N/A

POWER

CORD,UK,1,1830mm,PLUG

-3P/CONN-2P

K33-3001046-I45


Page: 11 of 224

well top BTY-L71

SYS,BATTERY

PACK,LITHIUM-ION,WELLT

OP/GMS-BMS080AAA00,SO

NY/3.7V/2400mAh,9CELLS

/3S3P,11.1V,7200mAh,186

50,BLACK,,

S91-0300140-W38

Battery

Simplo BTY-M52

BATTERY,SMP/925C2310F,P

ANASONIC/3.6V/2200mAh,

6CELLS/3S2P,10.8V,4400m

Ah,18650,BLACK

S91-030003M-SB3

SPI FSP090-1ADC21

Power Supply Adaptor,

90W/100-240Vin,4.74A/19

Vout

S93-0406050-S14

LITEON PA-1900-04

90W,90-264Vin,4.74A,19Vo

ut,LITEON/PA-1900-04RM,

ALL,2.5/5.5/10.75mm,

S93-0406100-L05

EDAC EA10953

Power Supply

Adaptor/90W/100-240Vin/

4.73A/19Vout/EDAC/EA109

53(312109512)

os9-1034020

Adapter

LISHIN LSE0202C1990 90W/90-264Vin,4.74A/19V

out 3pin S93-0406090-L44

Chicony MP-03233US-359 US S11-00US140-C54

Chicony MP-03233RC-359 Taiwan S11-00TW060-C54

Chicony MP-03233F0-359 French S1N-3EFR121-C54

Chicony MP-03233D0-359 German S1N-3EDE111-C54

Chicony MP-03233SU-3596 RU S1N-3ERU111-C54

Chicony MP-03233CD-3596 103

KEY,Swiss-German,BLACK S1N-3ESG111-C54

Chicony MP-03233I0-359 Italian S1N-3EIT111-C54

K/B

Chicony MP-03233U4-3597

SYS

KEYBOARD,LARGE,103KEY,

US-International,BLACK

C,CHICONY/MP-03233U4-3

596,122mm

MEMBRANE,RoHS(EU

EXEMPTION)

S1N-3UUS141-C5

4


Page: 12 of 224

Chicony MP-03233GB-359 UK S11-00UK120-C54

Touch Pad ELANTECH 810406-5053 810406-1853 S78-3700118-E47

MDC Modem

AGERE

Systems

INC

D40 Plus Azalia

S52-2801150-Q09

WLAN TwinHan AW-GE780 Wireless 802.11b S57-3800010-T46

bison BN29M4SD07000

1.3M

Pixels/BISON/BN2M1304S

D963

S1F-0001070-B36

camera

CHICONY CMN571820304440

LL

1.3M

Pixels/CHICONY/CMN57182

0304440LL

S1F-0001030-C54

bluetooth msi MS-6837D

MS-6837D 10 Bluetooth

2.0+EDR USB Module, CSR

BC4 ROM, I-Pex antenna,

IVTSoftware

605-6837D-020

PRO-NETS N/A ANALOG TV OS3-1719040

PRO-NETS N/A DIGITAL TV OS3-1719020 tuner

module

PRO-NETS N/A

HYBRID TV(DIGITAL &

ANALOG) OS3-1719010

SAMSUNG LTN170WP-L02

17

inch,WSXGA+,1680x1050,

GLARE

S78-2311030-S02

SAMSUNG LTN170X2-L02

17.0

inch,WXGA+,1440x900,AN

TI-GLARE,

S1J-760A001-S02

SAMSUNG LTN170WX-L05 17", WXGA+, 1440x900

Glare S78-230A020-S02

AU

Optronics B170PW03 17" WXGA+ S78-230A072-A90

LCD

AU

Optronics B170PW01

17", WXGA+, 1440x900

Glare S78-230A010-A90

CIR MODULE FORMOSA MB603-860 FORMOSA/MB603-860/USB

PORT, S54-1200070-F43

Remoter

controller Formosa MP-RC115V 26key/IR/FORMOSA S10-1200540-F43


Page: 13 of 224

VGA CARD msi M76

MXMII GPU ATI M76-M

A13, VRAM Samsung

GDDR3 16Mx32bit, 256MB

171A


Page: 14 of 224

1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode

Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Mode 2: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Mode 3: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Mode 4: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Mode 5: LCD (1024*768@60Hz) +HDMI (1024*768@60Hz) Mode 6: HDMI (1440*900@60Hz) +VGA (1440*900@60Hz) Mode 7: LCD (800*600@60Hz) +VGA (800*600@60Hz) Mode 8: LCD (1440*900@60Hz) +HDMI (1440*900@60Hz) Mode 9: HDMI (1024*768@60Hz) +VGA (1024*768@60Hz) Mode 10: LCD (1024*768@60Hz) +VGA (1024*768@60Hz) Mode 11: LCD (800*600@60Hz) +HDMI (800*600@60Hz) Mode 12: HDMI (800*600@60Hz) +VGA (800*600@60Hz) Mode 13: LCD (1440*900@60Hz) + HDMI (1440*900@60Hz) Mode 14: LCD (1440*900@60Hz) + HDMI (1440*900@60Hz)

Final Test Mode

EMI Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz)

Mode 2: LCD (1440*900@60Hz) +VGA (1440*900@60Hz)

Mode 3: LCD (1440*900@60Hz) +VGA (1440*900@60Hz)

Mode 4: LCD (1440*900@60Hz) +VGA (1440*900@60Hz)

EMS Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz)

Mode 2: LCD (1440*900@60Hz) +VGA (1440*900@60Hz)

Mode 3: LCD (1440*900@60Hz) +VGA (1440*900@60Hz)

Mode 4: LCD (1440*900@60Hz) +VGA (1440*900@60Hz)

Mode 1 Mode 2

CPU AMD/ TURION,MT40,AMD/ TMSMT40BQX5LD,2.2GHz

TURION,MT40,AMD/TMSMT40BQX5LD,2.2GHz

HDD Fujitsu /MHV2100BH(RH),100GB Toshiba(ROHS)/ MK1234GSX,120G ODD PHILIPS/ SDVD8821 LG/ GCC-10N LCD SAMSUNG/ LTN170X2-L02-0 SAMSUNG/ LTN170WP-L02 Memery TWINMOS/ 8D-23KN5MHBTP Transcend/ TS64MSQ64V6J; HYNIX CHIP Adapter LISHIN/ LSE0202C1990 SPI/ FSP090-1ADC21


Page: 15 of 224

Mode 3 Mode 4

CPU AMD/ TURION X2,TL60,AMD/ TMDTL60HAX5CT,2.0GHz

AMD /MK36,AMD/TMDMK36HAX4CM,2.0GHz

HDD Toshiba(ROHS)/ MK1032GSX,100G

Fujitsu/ MHV2120BH(RH),120GB

ODD LG/ GSA-T20N LG/ GMA-4082N LCD SAMSUNG/ LTN170WX-L05-G AU ( B170PW03 V3 ) Memery Transcend/ 78.02G63.423 Transcend/ 78.02G63.423 Adapter EDAC/ EA10953 LITEON/ PA-1900-04

Mode 5 Mode 6

CPU AMD/ SEMPRON,AMD/ SMS3200HAX4CM,1.6GHz

AMD/ SEMPRON,AMD/SMS3400HAX3CM,1.8GHz

HDD WD/ WD1600BEVS Fujitsu / MHV2060BH(RH),60GB ODD PHILIPS/ SDVD8821 LG/ GCC-10N LCD AU/ B170PW01 V.1 SAMSUNG/ LTN170WP-L02 Memery Transcend/ TS64MSQ64V6J Transcend/ TS64MSQ64V6M Adapter SPI/ FSP090-1ADC21 LITEON/ PA-1900-04

Mode 7 Mode 8

CPU AMD/ TURION,MT40,AMD/ TMSMT40BQX5LD,2.2GHz

AMD/ TURION X2,TL50,AMD/TMDTL50HAX4CT,1.6GHz

HDD Fujitsu / MHV2080BH(RH),80GB Toshiba(ROHS)/ MK6034GSX,60GB ODD PHILIPS/ SDVD8821 LG/ GCC-10N LCD SAMSUNG/ LTN170X2-L02-0 SAMSUNG/ LTN170WX-L05-G Memery Transcend/ TS64MSQ64V6M ranscend/ TS128MSQ64V6J Adapter EDAC/ EA10953 LISHIN/ LSE0202C1990


Page: 16 of 224

Mode 9 Mode 10

CPU AMD/ TURION X2,TL52,AMD/TMDTL52HAX5CT,1.6GHz

TURION X2,TL56,AMD/TMDTL56HAX5CT

HDD Toshiba / MK8032GSX,80GB WD/ WD1600BEVS ODD PHILIPS/ SDVD8821 LG/ GSA-T20N LCD AU ( B170PW03 V3 ) AU /B170PW01 V.1 Memery APACER/ 78.02G63.423,ELPIDA APACER/ 78.02G63.AF3,HYNIX Adapter SPI/ FSP090-1ADC21 LITEON/ PA-1900-04

Mode 11 Mode 12

CPU AMD/ TURION X2,TL60,AMD/TMDTL60HAX5CT,2.0GHz

AMD/ SMD3800HAX3CH

HDD Fujitsu / MHV2060BH(RH),60GB WD / WD1200BEVS ODD LG/ GMA-4082N LITEON/ SSM-8515S LCD SAMSUNG/ LTN170X2-L02-0 SAMSUNG/ LTN170X2-L02-0 Memery APACER/ 78.92G63.AF2, HYNIX A-DATA/ EELOPE190834Z Adapter EDAC/ EA10953 LISHIN/ LSE0202C1990

Mode 13 Mode 14

CPU AMD/ SEMPRON,AMD/SMS3400HAX3CM,1.8GHz

AMD/ MK36,AMD/TMDMK36HAX4CM,2.0GHz

HDD WD / WD 800BEVS Fujitsu / MHV2060BH(RH),80GB ODD PHILIPS/ SDVD8821 LITEON/ SSM-8515S LCD SAMSUNG/ LTN170WX-L05-G SAMSUNG/ LTN170X2-L02-0 Memery A-DATA / ADOPE1908342 A-DATA/ ADOPE1A16332 Adapter SPI/ FSP090-1ADC21 LISHIN/ LSE0202C1990


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1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord

1 CRT ‘’21 IBM 6652-U3N 01 Non-Shielded, 1.8m

2 TV ASUS CX06112069 N/A Non-Shielded, 1.8m

3 Print EPSON B241A 7094256 Non-Shielded, 1.8m

4 TV Antenna N/A N/A N/A N/A

5 USB2.0 HDD Terasys F12-UF A0100215-64v0040 Power by adaptor

6 USB2.0 HDD Terasys F12-UF A0100215-63m0002 Power by PC

7 Microphone WEIDE N/A PMP01 N/A

8 Microphone & Earphone SOMIC SM-810 N/A N/A

9 USB Mouse Logitech M-BT96 N/A Power by PC

10 Switch XINLITONG 104B LC138104B200400014 N/A

11 Notebook ASUS W500 0W43-635-502-422 N/A


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1.4. Configuration of Tested System

Connection Diagram

Signal Cable Type Signal cable Description

A D-Sub Cable Shielded, 1.8m, with two ferrite core bonded

B HDMI Cable Shielded, 1.8m, with two ferrite core bonded

C USB Cable Shielded, 1.8m

D Antenna Cable Non-Shielded, 1.0m

E IEEE 1394 Cable Shielded, 1.2m

F USB Cable Shielded, 1.8m

G Microphone Cable Non-Shielded, 1.8m

H Earphone& Microphone Cable Non-Shielded, 1.8m

I USB Cable Shielded, 1.8m

J Telecom Cable Non-Shielded, >10m

K LAN Cable Non-Shielded, >10m


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1.5. EUT Exercise Software

1 Setup the EUT and simulators as shown on above.

2 Turn on the power of all equipment.

3 Notebook needs data from disk.

4 Notebook sends “H” pattern to monitor, and printer “H” pattern.

5 Notebook will send and receiver data by LAN, modem WLAN and Bluetooth.

6 Turn on the camera of Notebook.

7 Play DVD disk.

8 Repeat (3) to (7).


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2. Technical Test

2.1. Summary of Test Result

No deviations from the test standards Deviations from the test standards as below description:

Emission

Performed Test Item Normative References Test

Performed Deviation

Conducted Emission EN 55022: 1998+A1: 2000+A2: 2003 Class B


Yes No

Conducted Emissions

(Telecommunication Ports)

EN 55022: 1998+A1: 2000+A2: 2003 Class B


Yes No

Radiated Emission EN 55022: 1998+A1: 2000+A2: 2003 Class B


Yes No

Power Harmonics EN 61000-3-2: 2000 Yes No

Voltage Fluctuation and

Flicker

EN 61000-3-3: 1995+A1: 2001 Yes No

Immunity

Performed Test Item Normative References Test

Performed Deviation

Electrostatic Discharge IEC 61000-4-2: 2001 Yes No

Radiated susceptibility IEC 61000-4-3: 2006 Yes No

Electrical fast transient/burst IEC 61000-4-4: 2004 Yes No

Surge IEC 61000-4-5: 2005 Yes No

Conducted susceptibility IEC 61000-4-6: 2006 Yes No

Power frequency magnetic

field

IEC 61000-4-8: 2001 Yes No

Voltage dips and interruption IEC 61000-4-11: 2004 Yes No


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2.2. List of Test Equipment Conducted Emission / SR-1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCI 100175 2006/11/20 Two-Line V-Network R&S ENV216 100013 2006/11/20 Two-Line V-Network R&S ENV216 100014 2006/11/20 V-Network R&S ESH3-Z6 100248 2006/11/20 V-Network R&S ESH3-Z6 100249 2006/11/20 ISN Schaffner ISN T400 21648 2006/11/20 Current Probe R&S EZ-17 100252 2007/04/18 50ohm Coaxial Switch ANRITSU MP59B 6200447305 2006/11/25 50ohm Impedance SHX 50ohmI QT-IM001 2007/03/20 Matching network SHX TZ25 06062901 N/A Matching network SHX TZ25 06062902 N/A Matching network SHX TZ25 06062903 N/A Combining network SHX N-50KKK N/A N/A Temperature/Humidity Meter zhicheng ZC1-2 QT-TH004 2007/03/30 Radiated Emission / AC-1 Instrument Manufacturer Type No. Serial No Cal. Date Spectrum Analyzer Agilent E4403B MY45102715 N/A Spectrum Analyzer Agilent E4403B MY45102798 N/A Test Receiver R&S ESCI 100176 2006/11/25 Preamplifier Quietek AP-025C QT-AP001 2006/11/25 Preamplifier Quietek AP-025C QT-AP002 2006/11/25 Preamplifier Quietek AP-180C CHM-0602012 2006/11/25 Bilog Type Antenna Schaffner CBL6112B 2933 2006/11/22 Bilog Type Antenna Schaffner CBL6112B 2931 2006/11/22 Broad-Band Horn Antenna Schwarzbeck BBHA9120D 496 2006/11/25 Temperature/Humidity Meter zhicheng ZC1-2 QT-TH001 2007/03/30 Radiated Emission / AC-2 Instrument Manufacturer Type No. Serial No Cal. Date Spectrum Analyzer Agilent E4408B MY45102679 2006/11/20 EMI Test Receiver R&S ESCI 100175 2006/11/25 Preamplifier Quietek AP-025C QT-AP003 2006/11/25 Preamplifier Quietek AP-180C CHM-0602013 2006/11/25 Bilog Type Antenna Schaffner CBL6112B 2932 2006/10/26 Broad-Band Horn Antenna Schwarzbeck BBHA9120D 499 2006/11/30 Temperature/Humidity Meter zhicheng ZC1-2 QT-TH002 2007/03/30 Power Harmonics / SR-2 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source California 5001iX-208 56741 2006/11/22 Power Analyzer California PACS-1 72419 2006/11/22 Temperature/Humidity Meter zhicheng ZC1-2 QT-TH005 2007/03/30 Voltage Fluctuation and Flicker / SR-2 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source California 5001iX-208 56741 2006/11/22 Power Analyzer California PACS-1 72419 2006/11/22 Temperature/Humidity Meter zhicheng ZC1-2 QT-TH005 2007/03/30


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Electrostatic Discharge / SR-3 Instrument Manufacturer Type No. Serial No Cal. Date ESD Simulator KeyTek MZ-15/EC 0511209 2006/11/22 ESD Simulator EM TEST dito V0616101367 2007/03/26 Temperature/Humidity Meter zhicheng ZC1-2 QT-TH006 2007/03/20 Barometer Fengyun DYM3 0506048 2006/11/22 Radiated susceptibility / AC-3 Instrument Manufacturer Type No. Serial No Cal. Date Signal Generator R&S SML03 102324 2006/11/20 Power Meter Boonton 4231A 144502 2006/11/20 Power Sensor Boonton 51011-EMC 33859 2006/11/20 RF Switch network Schaffner RFS N100 21799 N/A Power amplifier Schaffner CBA9428 43516 2006/11/25 Power amplifier Schaffner CBA9413B 43526 2006/11/25 Directional Coupler A&R DC7144A 312249 N/A Directional Coupler Schaffner CHA 9652B 0121 2006/11/25 Electric Field Probe Type 8.3 narda 2244/90.21 AZ-0030 2006/11/21

Electromagnetic Radiation Meter narda 2244/70 AW-0074 2006/11/21

Bilog Type Antenna Schaffner CBL6141A 4278 2006/11/25 Horn Antenna A&R AT4002A 312312 N/A Temperature/Humidity Meter zhicheng ZC1-2 QT-TH003 2007/03/30 Electrical fast transient/burst / SR-2 Instrument Manufacturer Type No. Serial No Cal. Date Immunity Test System KeyTek EMCpro 508273 2006/11/22 CCL KeyTek CCL 0510181 2006/11/22 Temperature/Humidity Meter zhicheng ZC1-2 QT-TH005 2007/03/30 Surge / SR-2 Instrument Manufacturer Type No. Serial No Cal. Date Immunity Test System KeyTek EMCpro 508273 2006/11/22 Coupler/Decoupler Telecom line KeyTek CM-TELCD 0506277 2006/11/22

Coupler/Decoupler Signal line KeyTek CM-I/OCD 0508206 2006/11/22

Temperature/Humidity Meter zhicheng ZC1-2 QT-TH005 2007/03/30 Conducted susceptibility / SR-1 Instrument Manufacturer Type No. Serial No Cal. Date RF-Generator Schaffner NSG2070 1120 2006/11/23 CDN Schaffner CDN T400 19083 2006/11/23 CDN Schaffner CDN M016 21249 2006/11/23 EM Clamp Schaffner KEMZ 801 21041 2006/11/23 Attenuator Schaffner INA2070-1 2120 N/A 50ohm Impedance SHX 50ohmI QT-IM001 2007/03/20 Temperature/Humidity Meter zhicheng ZC1-2 QT-TH004 2007/03/30


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Power frequency magnetic field / SR-2 Instrument Manufacturer Type No. Serial No Cal. Date Immunity Test System KeyTek EMCpro 508273 2006/11/22

CM-HCOIL H-Field Loop KeyTek F-1000-4-8/9/10-L-1M 05016 2006/11/22

Temperature/Humidity Meter zhicheng ZC1-2 QT-TH005 2007/03/30 Voltage dips and interruption / SR-2 Instrument Manufacturer Type No. Serial No Cal. Date Immunity Test System KeyTek EMCpro 508273 2006/11/22 Temperature/Humidity Meter zhicheng ZC1-2 QT-TH005 2007/03/30


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2.3. Measurement Uncertainty Conducted Emission

The measurement uncertainty is evaluated as ± 2.26 dB.

Conducted Emissions (Telecommunication Ports) The measurement uncertainty is evaluated as ± 2.26 dB.

Radiated Emission The measurement uncertainty is evaluated as ± 3.19 dB.

Harmonic Current Emission The measurement uncertainty is evaluated as ± 1.2 %.

Voltage Fluctuations and Flicker The measurement uncertainty is evaluated as ± 1.5 %.

Electrostatic Discharge As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 2005[E], the requirements for measurement uncertainty in ESD testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant ESD standards. The immunity test signal from the ESD system meet the required specifications in IEC 61000-4-2 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%.

Radiated susceptibility As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 2005[E], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC 61000-4-3 through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 dB.

Electrical fast transient/burst As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant FT/Burst standards. The immunity test signal from the FT/Burst system meet the required specifications in IEC 61000-4-4 through the calibration report with the calibrated uncertainty for the waveform of voltage. Frequency and timing as being 1.63%, 2.8 10-10 and 2.76%.

Surge As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 2005[E], the requirements for measurement uncertainty in Surge testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant Surge standards. The immunity test signal from the Surge system meet the required specifications in IEC 61000-4-5 through the calibration report with the calibrated uncertainty for the waveform of


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voltage and timing as being 1.63 % and 2.76%. Conducted susceptibility

As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 2005[E], the requirements for measurement uncertainty in CS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant CS standards. The immunity test signal from the CS system meet the required specifications in IEC 61000-4-6 through the calibration for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 3.72 dB and 2.78 dB.

Power frequency magnetic field As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 2005[E], the requirements for measurement uncertainty in PFM testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant PFM standards. The immunity test signal from the PFM system meet the required specifications in IEC 61000-4-8 through the calibration report with the calibrated uncertainty for the Gauss Meter to verify the output level of magnetic field strength as being 2 %.

Voltage dips and interruption As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 2005[E], the requirements for measurement uncertainty in DIP testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant DIP standards. The immunity test signal from the DIP system meet the required specifications in IEC 61000-4-11 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%.


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2.4. Test Environment

Performed Item Items Required Actual Temperature (°C) 15-35 22

Conducted Emission Humidity (%RH) 25-75 45

Barometric pressure (mbar) 860-1060 950-1000 Temperature (°C) 15-35 24 Conducted Emissions (Telecommunication Ports)

Humidity (%RH) 25-75 52

Barometric pressure (mbar) 860-1060 950-1000 Temperature (°C) 15-35 21

Radiated Emission Humidity (%RH) 25-75 48

Barometric pressure (mbar) 860-1060 950-1000 Temperature (°C) 15-35 22 Electrostatic Discharge Humidity (%RH) 30-60 42

Barometric pressure (mbar) 860-1060 950-1000 Temperature (°C) 15-35 22 Radiated susceptibility Humidity (%RH) 25-75 46

Barometric pressure (mbar) 860-1060 950-1000 Temperature (°C) 15-35 22 Electrical fast transient/burst Humidity (%RH) 25-75 46

Barometric pressure (mbar) 860-1060 950-1000 Temperature (°C) 15-35 22

Surge Humidity (%RH) 10-75 45

Barometric pressure (mbar) 860-1060 950-1000 Temperature (°C) 15-35 21 Conducted susceptibility Humidity (%RH) 25-75 46

Barometric pressure (mbar) 860-1060 950-1000 Temperature (°C) 15-35 22 Power frequency magnetic field Humidity (%RH) 25-75 42

Barometric pressure (mbar) 860-1060 950-1000 Temperature (°C) 15-35 22 Voltage dips and interruption Humidity (%RH) 25-75 46

Barometric pressure (mbar) 860-1060 950-1000


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3. Conducted Emission (Main Terminals)

3.1. Test Specification According to EMC Standard: AS/NZS CISPR 22 and EN 55022 Class B

3.2. Test Setup

3.3. Limit

Limits

Frequency (MHz)

QP (dBuV)

AV (dBuV)

0.15 - 0.50 66 - 56 56 - 46

0.50 - 5.0 56 46

5.0 - 30 60 50

Note: The lower limit shall apply at the transition frequency.


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3.4. Test Procedure The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a receiver bandwidth of 9kHz.

3.5. Deviation from Test Standard No deviation.


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3.6. Test Result Engineer : Moon

Site : SR-1 (Conducted Emission) Time : 2007/03/22 - 15:36

Limit : EN55022_B_00M_QP Margin : 10

EUT : MEGA BOOK Probe : ENV216 - Line1

Power : AC 230V/50Hz Note : Mode 1


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Engineer : Moon





Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.186 9.590 39.970 49.560 -15.411 64.971 QUASIPEAK

2 0.258 9.355 34.908 44.263 -18.651 62.914 QUASIPEAK

3 0.450 9.561 32.939 42.500 -14.929 57.429 QUASIPEAK

4 * 0.514 9.637 31.631 41.268 -14.732 56.000 QUASIPEAK

5 0.578 9.650 28.495 38.145 -17.855 56.000 QUASIPEAK

6 0.775 9.675 28.470 38.145 -17.855 56.000 QUASIPEAK

Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor


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Engineer : Moon


Limit : EN55022_B_00M_AV Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.186 9.590 34.666 44.256 -10.715 54.971 AVERAGE

2 0.258 9.355 31.881 41.236 -11.678 52.914 AVERAGE

3 0.450 9.561 19.199 28.760 -18.669 47.429 AVERAGE

4 * 0.514 9.637 28.508 38.145 -7.855 46.000 AVERAGE

5 0.578 9.650 25.335 34.985 -11.015 46.000 AVERAGE

6 0.775 9.675 24.914 34.589 -11.411 46.000 AVERAGE



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.190 9.471 40.793 50.265 -14.592 64.857 QUASIPEAK

2 0.255 9.471 38.054 47.525 -15.475 63.000 QUASIPEAK

3 * 0.450 9.661 33.554 43.215 -14.214 57.429 QUASIPEAK

4 0.514 9.710 31.302 41.012 -14.988 56.000 QUASIPEAK

5 0.770 9.664 31.906 41.570 -14.430 56.000 QUASIPEAK

6 1.080 9.742 27.472 37.214 -18.786 56.000 QUASIPEAK



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.190 9.471 37.313 46.785 -8.072 54.857 AVERAGE

2 0.255 9.471 34.796 44.267 -8.733 53.000 AVERAGE

3 0.450 9.661 31.351 41.012 -6.417 47.429 AVERAGE

4 * 0.514 9.710 30.050 39.760 -6.240 46.000 AVERAGE

5 0.770 9.664 27.348 37.012 -8.988 46.000 AVERAGE

6 1.080 9.742 24.270 34.012 -11.988 46.000 AVERAGE



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 2.470 9.830 31.603 41.433 -14.567 56.000 QUASIPEAK

2 * 2.574 9.830 32.028 41.858 -14.142 56.000 QUASIPEAK

3 3.810 9.800 29.947 39.747 -16.253 56.000 QUASIPEAK

4 4.114 9.808 30.470 40.278 -15.722 56.000 QUASIPEAK

5 4.802 9.790 30.895 40.685 -15.315 56.000 QUASIPEAK

6 8.689 9.904 27.492 37.396 -22.604 60.000 QUASIPEAK



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 2.470 9.830 27.600 37.430 -8.570 46.000 AVERAGE

2 2.574 9.830 27.130 36.960 -9.040 46.000 AVERAGE

3 3.810 9.800 28.100 37.900 -8.100 46.000 AVERAGE

4 4.114 9.808 25.300 35.108 -10.892 46.000 AVERAGE

5 * 4.802 9.790 28.200 37.990 -8.010 46.000 AVERAGE

6 8.689 9.904 24.700 34.604 -15.396 50.000 AVERAGE



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 2.322 9.779 30.867 40.646 -15.354 56.000 QUASIPEAK

2 2.634 9.770 30.950 40.720 -15.280 56.000 QUASIPEAK

3 4.418 9.730 31.920 41.650 -14.350 56.000 QUASIPEAK

4 * 4.654 9.720 32.731 42.451 -13.549 56.000 QUASIPEAK

5 8.449 9.860 26.840 36.700 -23.300 60.000 QUASIPEAK

6 13.033 10.090 26.273 36.363 -23.637 60.000 QUASIPEAK



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 2.322 9.779 27.800 37.579 -8.421 46.000 AVERAGE

2 2.634 9.770 28.500 38.270 -7.730 46.000 AVERAGE

3 4.418 9.730 27.900 37.630 -8.370 46.000 AVERAGE

4 * 4.654 9.720 29.600 39.320 -6.680 46.000 AVERAGE

5 8.449 9.860 22.700 32.560 -17.440 50.000 AVERAGE

6 13.033 10.090 23.900 33.990 -16.010 50.000 AVERAGE



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 3.542 9.810 18.866 28.676 -27.324 56.000 QUASIPEAK

2 4.238 9.810 19.380 29.190 -26.810 56.000 QUASIPEAK

3 6.766 9.840 22.053 31.893 -28.107 60.000 QUASIPEAK

4 14.913 10.040 25.515 35.555 -24.445 60.000 QUASIPEAK

5 19.321 10.180 26.646 36.826 -23.174 60.000 QUASIPEAK

6 * 24.576 10.290 27.335 37.625 -22.375 60.000 QUASIPEAK



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 3.542 9.810 15.200 25.010 -20.990 46.000 AVERAGE

2 4.238 9.810 16.100 25.910 -20.090 46.000 AVERAGE

3 6.766 9.840 19.300 29.140 -20.860 50.000 AVERAGE

4 14.913 10.040 21.700 31.740 -18.260 50.000 AVERAGE

5 19.321 10.180 21.500 31.680 -18.320 50.000 AVERAGE

6 * 24.576 10.290 23.400 33.690 -16.310 50.000 AVERAGE



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 2.390 9.770 22.313 32.083 -23.917 56.000 QUASIPEAK

2 3.334 9.757 22.515 32.272 -23.728 56.000 QUASIPEAK

3 4.346 9.720 22.843 32.563 -23.437 56.000 QUASIPEAK

4 * 15.357 10.160 26.650 36.810 -23.190 60.000 QUASIPEAK

5 16.105 10.160 26.600 36.760 -23.240 60.000 QUASIPEAK

6 24.576 10.330 25.610 35.940 -24.060 60.000 QUASIPEAK



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 2.390 9.770 19.500 29.270 -16.730 46.000 AVERAGE

2 3.334 9.757 18.700 28.457 -17.543 46.000 AVERAGE

3 4.346 9.720 18.500 28.220 -17.780 46.000 AVERAGE

4 15.357 10.160 22.900 33.060 -16.940 50.000 AVERAGE

5 * 16.105 10.160 23.800 33.960 -16.040 50.000 AVERAGE

6 24.576 10.330 20.600 30.930 -19.070 50.000 AVERAGE



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.406 9.517 30.569 40.086 -18.600 58.686 QUASIPEAK

2 0.646 9.672 28.624 38.296 -17.704 56.000 QUASIPEAK

3 * 1.018 9.626 29.278 38.904 -17.096 56.000 QUASIPEAK

4 1.286 9.685 29.113 38.798 -17.202 56.000 QUASIPEAK

5 8.701 9.908 26.726 36.634 -23.366 60.000 QUASIPEAK

6 15.357 10.060 28.124 38.184 -21.816 60.000 QUASIPEAK



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.406 9.517 25.500 35.017 -13.669 48.686 AVERAGE

2 0.646 9.672 24.600 34.272 -11.728 46.000 AVERAGE

3 1.018 9.626 24.700 34.326 -11.674 46.000 AVERAGE

4 * 1.286 9.685 26.500 36.185 -9.815 46.000 AVERAGE

5 8.701 9.908 23.300 33.208 -16.792 50.000 AVERAGE

6 15.357 10.060 24.500 34.560 -15.440 50.000 AVERAGE



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.426 9.637 30.608 40.245 -17.869 58.114 QUASIPEAK

2 0.630 9.663 30.148 39.811 -16.189 56.000 QUASIPEAK

3 0.798 9.680 28.893 38.573 -17.427 56.000 QUASIPEAK

4 * 1.266 9.759 30.125 39.884 -16.116 56.000 QUASIPEAK

5 8.701 9.878 25.638 35.516 -24.484 60.000 QUASIPEAK

6 15.357 10.160 27.503 37.663 -22.337 60.000 QUASIPEAK



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.426 9.637 26.400 36.037 -12.077 48.114 AVERAGE

2 0.630 9.663 24.100 33.763 -12.237 46.000 AVERAGE

3 0.798 9.680 24.600 34.280 -11.720 46.000 AVERAGE

4 * 1.266 9.759 25.900 35.659 -10.341 46.000 AVERAGE

5 8.701 9.878 23.800 33.678 -16.322 50.000 AVERAGE

6 15.357 10.160 22.500 32.660 -17.340 50.000 AVERAGE



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3.7. Test Photograph Test Mode: Mode 1: LCD (1440*900@60Hz)+VGA(1440*900@60Hz) Description: Front View of Conducted Test

Test Mode: Mode 1: LCD(1440*900@60Hz)+VGA(1440*900@60Hz) Description: Back View of Conducted Test


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Test Mode: Mode 2: LCD(1440*900@60Hz)+VGA(1440*900@60Hz) Description: Front View of Conducted Test



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Page: 56 of 224




Page: 57 of 224

4. Conducted Emissions (Telecommunication Ports) 4.1. Test Specification

According to EMC Standard: AS/NZS CISPR 22 and EN 55022 Class B

4.2. Test Setup

4.3. Limit

Limits

Frequency (MHz)

QP (dBuV)

AV (dBuV)

0.15 - 0.50 84 - 74 74 - 64

0.50 - 30 74 64

Remarks: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50 MHz.


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4.4. Test Procedure Telecommunication Port:

The mains voltage shall be supplied to the EUT via the LISN when the measurement of telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 60dB LCL ISN is used for cat. 5 cable, 50dB LCL ISN is used for cat. 3 and 80dB LCL is used for alternative one.



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Limit : ISN_Voltage_B_00M_QP Margin : 10

EUT : MEGA BOOK Probe : ISN – LAN 10Mbps



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.194 9.400 49.800 59.200 -23.543 82.743 QUASIPEAK

2 0.210 9.400 49.700 59.100 -23.186 82.286 QUASIPEAK

3 0.386 9.401 45.900 55.301 -21.956 77.257 QUASIPEAK

4 0.426 9.390 41.900 51.290 -24.824 76.114 QUASIPEAK

5 * 10.000 9.570 60.900 70.470 -3.530 74.000 QUASIPEAK

6 30.000 9.850 49.100 58.950 -15.050 74.000 QUASIPEAK



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Engineer : Moon


Limit : ISN_Voltage_B_00M_AV Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.194 9.400 44.800 54.200 -18.543 72.743 AVERAGE

2 0.210 9.400 47.600 57.000 -15.286 72.286 AVERAGE

3 0.386 9.401 40.800 50.201 -17.056 67.257 AVERAGE

4 0.426 9.390 38.300 47.690 -18.424 66.114 AVERAGE

5 * 10.000 9.570 41.500 51.070 -12.930 64.000 AVERAGE

6 30.000 9.850 20.000 29.850 -34.150 64.000 AVERAGE



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.171 9.400 51.700 61.100 -22.300 83.400 QUASIPEAK

2 0.218 9.400 47.600 57.000 -25.057 82.057 QUASIPEAK

3 0.306 9.410 48.890 58.300 -21.243 79.543 QUASIPEAK

4 0.438 9.390 47.110 56.500 -19.271 75.771 QUASIPEAK

5 * 0.610 9.396 45.404 54.800 -19.200 74.000 QUASIPEAK

6 0.914 9.394 42.706 52.100 -21.900 74.000 QUASIPEAK


\


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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.171 9.400 38.100 47.500 -25.900 73.400 AVERAGE

2 0.218 9.400 39.100 48.500 -23.557 72.057 AVERAGE

3 0.306 9.410 42.190 51.600 -17.943 69.543 AVERAGE

4 0.438 9.390 39.510 48.900 -16.871 65.771 AVERAGE

5 * 0.610 9.396 41.804 51.200 -12.800 64.000 AVERAGE

6 0.914 9.394 38.206 47.600 -16.400 64.000 AVERAGE



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Engineer : Moon


Limit : ISN_CURRENT_B_00M_QP Margin : 10

EUT : MEGA BOOK Probe : EZ-17(0.15M-30MHz) – LAN 1Gbps

Power : AC 230V/50Hz Note : MODE 1


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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuA)

Measure Level

(dBuA)

Margin

(dB)

Limit

(dBuA)

Detector Type

1 0.166 6.949 19.500 26.449 -13.094 39.543 QUASIPEAK

2 0.218 4.580 21.600 26.180 -11.877 38.057 QUASIPEAK

3 * 0.330 1.868 26.100 27.968 -6.889 34.857 QUASIPEAK

4 0.438 -0.773 20.400 19.627 -12.144 31.771 QUASIPEAK

5 0.494 -2.060 11.000 8.941 -21.230 30.171 QUASIPEAK

6 0.658 -3.695 13.100 9.405 -20.595 30.000 QUASIPEAK



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Engineer : Moon


Limit : ISN_CURRENT_B_00M_AV Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuA)

Measure Level

(dBuA)

Margin

(dB)

Limit

(dBuA)

Detector Type

1 0.166 6.949 17.400 24.349 -5.194 29.543 AVERAGE

2 0.218 4.580 20.200 24.780 -3.277 28.057 AVERAGE

3 * 0.330 1.868 20.800 22.668 -2.189 24.857 AVERAGE

4 0.438 -0.773 18.700 17.927 -3.844 21.771 AVERAGE

5 0.494 -2.060 5.900 3.841 -16.330 20.171 AVERAGE

6 0.658 -3.695 7.800 4.105 -15.895 20.000 AVERAGE



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Engineer : Moon



EUT : MEGA BOOK Probe : ISN – LAN 10M



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.158 9.400 45.200 54.600 -29.171 83.771 QUASIPEAK

2 3.774 9.440 34.200 43.640 -30.360 74.000 QUASIPEAK

3 4.166 9.460 34.200 43.660 -30.340 74.000 QUASIPEAK

4 4.638 9.460 32.100 41.560 -32.440 74.000 QUASIPEAK

5 * 10.000 9.570 59.500 69.070 -4.930 74.000 QUASIPEAK

6 30.000 9.850 46.300 56.150 -17.850 74.000 QUASIPEAK



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.158 9.400 43.000 52.400 -21.371 73.771 AVERAGE

2 3.774 9.440 26.200 35.640 -28.360 64.000 AVERAGE

3 4.166 9.460 28.400 37.860 -26.140 64.000 AVERAGE

4 4.638 9.460 26.400 35.860 -28.140 64.000 AVERAGE

5 * 10.000 9.570 42.400 51.970 -12.030 64.000 AVERAGE

6 30.000 9.850 23.600 33.450 -30.550 64.000 AVERAGE



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 3.346 9.440 33.500 42.940 -31.060 74.000 QUASIPEAK

2 * 16.230 9.660 46.800 56.460 -17.540 74.000 QUASIPEAK

3 18.246 9.690 45.500 55.190 -18.810 74.000 QUASIPEAK

4 20.258 9.720 45.300 55.020 -18.980 74.000 QUASIPEAK

5 23.130 9.740 46.500 56.240 -17.760 74.000 QUASIPEAK



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 3.346 9.440 26.800 36.240 -27.760 64.000 AVERAGE

2 16.230 9.660 43.400 53.060 -10.940 64.000 AVERAGE

3 18.246 9.690 42.100 51.790 -12.210 64.000 AVERAGE

4 20.258 9.720 41.800 51.520 -12.480 64.000 AVERAGE

5 * 23.130 9.740 43.500 53.240 -10.760 64.000 AVERAGE



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Engineer : Moon



EUT : MEGA BOOK Probe : ISN – LAN 1G



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuA)

Measure Level

(dBuA)

Margin

(dB)

Limit

(dBuA)

Detector Type

1 0.166 9.400 20.500 29.900 -9.643 39.543 QUASIPEAK

2 0.274 9.410 17.500 26.910 -9.547 36.457 QUASIPEAK

3 4.346 9.450 7.800 17.250 -12.750 30.000 QUASIPEAK

4 5.214 9.480 8.200 17.680 -12.320 30.000 QUASIPEAK

5 5.450 9.480 10.200 19.680 -10.320 30.000 QUASIPEAK

6 * 5.846 9.490 12.500 21.990 -8.010 30.000 QUASIPEAK



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuA)

Measure Level

(dBuA)

Margin

(dB)

Limit

(dBuA)

Detector Type

1 0.166 9.400 14.600 24.000 -5.543 29.543 AVERAGE

2 0.274 9.410 11.300 20.710 -5.747 26.457 AVERAGE

3 4.346 9.450 2.600 12.050 -7.950 20.000 AVERAGE

4 5.214 9.480 3.500 12.980 -7.020 20.000 AVERAGE

5 * 5.450 9.480 6.100 15.580 -4.420 20.000 AVERAGE

6 5.846 9.490 5.400 14.890 -5.110 20.000 AVERAGE



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.190 9.400 53.400 62.800 -20.057 82.857 QUASIPEAK

2 0.222 9.400 52.500 61.900 -20.043 81.943 QUASIPEAK

3 0.330 9.410 53.300 62.710 -16.147 78.857 QUASIPEAK

4 0.442 9.390 52.200 61.590 -14.067 75.657 QUASIPEAK

5 * 10.000 9.570 59.800 69.370 -4.630 74.000 QUASIPEAK

6 30.000 9.850 46.700 56.550 -17.450 74.000 QUASIPEAK



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.190 9.400 52.000 61.400 -11.457 72.857 AVERAGE

2 0.222 9.400 50.400 59.800 -12.143 71.943 AVERAGE

3 0.330 9.410 51.000 60.410 -8.447 68.857 AVERAGE

4 0.442 9.390 48.100 57.490 -8.167 65.657 AVERAGE

5 * 10.000 9.570 48.600 58.170 -5.830 64.000 AVERAGE

6 30.000 9.850 25.800 35.650 -28.350 64.000 AVERAGE



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Page: 81 of 224

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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.190 9.400 61.200 70.600 -12.257 82.857 QUASIPEAK

2 0.222 9.400 50.700 60.100 -21.843 81.943 QUASIPEAK

3 0.286 9.410 48.400 57.810 -22.304 80.114 QUASIPEAK

4 0.378 9.404 51.500 60.904 -16.582 77.486 QUASIPEAK

5 0.442 9.390 51.500 60.890 -14.767 75.657 QUASIPEAK

6 0.570 9.400 44.300 53.700 -20.300 74.000 QUASIPEAK



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.190 9.400 55.100 64.500 -8.357 72.857 AVERAGE

2 0.222 9.400 46.900 56.300 -15.643 71.943 AVERAGE

3 0.286 9.410 40.100 49.510 -20.604 70.114 AVERAGE

4 0.378 9.404 48.000 57.404 -10.082 67.486 AVERAGE

5 0.442 9.390 47.500 56.890 -8.767 65.657 AVERAGE

6 0.570 9.400 43.000 52.400 -11.600 64.000 AVERAGE



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuA)

Measure Level

(dBuA)

Margin

(dB)

Limit

(dBuA)

Detector Type

1 0.194 9.400 14.600 24.000 -14.743 38.743 QUASIPEAK

2 0.278 9.410 12.400 21.810 -14.533 36.343 QUASIPEAK

3 0.382 9.402 11.500 20.902 -12.469 33.371 QUASIPEAK

4 1.706 9.390 7.600 16.990 -13.010 30.000 QUASIPEAK

5 * 5.118 9.490 10.000 19.490 -10.510 30.000 QUASIPEAK

6 13.713 9.614 9.200 18.814 -11.186 30.000 QUASIPEAK



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuA)

Measure Level

(dBuA)

Margin

(dB)

Limit

(dBuA)

Detector Type

1 0.194 9.400 10.500 19.900 -8.843 28.743 AVERAGE

2 0.278 9.410 10.100 19.510 -6.833 26.343 AVERAGE

3 * 0.382 9.402 9.800 19.202 -4.169 23.371 AVERAGE

4 1.706 9.390 2.100 11.490 -8.510 20.000 AVERAGE

5 5.118 9.490 6.200 15.690 -4.310 20.000 AVERAGE

6 13.713 9.614 3.000 12.614 -7.386 20.000 AVERAGE



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Page: 87 of 224

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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.166 9.400 48.700 58.100 -25.443 83.543 QUASIPEAK

2 0.214 9.400 49.900 59.300 -22.871 82.171 QUASIPEAK

3 0.214 9.400 49.400 58.800 -23.371 82.171 QUASIPEAK

4 0.322 9.410 44.300 53.710 -25.376 79.086 QUASIPEAK

5 2.070 9.390 44.500 53.890 -20.110 74.000 QUASIPEAK

6 10.000 9.570 60.530 70.100 -3.900 74.000 QUASIPEAK

7 * 30.000 9.850 60.420 70.270 -3.730 74.000 QUASIPEAK



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.166 9.400 44.400 53.800 -19.743 73.543 AVERAGE

2 0.214 9.400 45.200 54.600 -17.571 72.171 AVERAGE

3 0.322 9.410 38.300 47.710 -21.376 69.086 AVERAGE

4 2.070 9.390 38.900 48.290 -15.710 64.000 AVERAGE

5 * 10.000 9.570 48.900 58.470 -5.530 64.000 AVERAGE

6 30.000 9.850 44.400 54.250 -9.750 64.000 AVERAGE



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Page: 90 of 224

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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.162 9.400 51.500 60.900 -22.757 83.657 QUASIPEAK

2 0.214 9.400 60.800 70.200 -11.971 82.171 QUASIPEAK

3 0.330 9.410 54.600 64.010 -14.847 78.857 QUASIPEAK

4 0.406 9.394 44.700 54.094 -22.592 76.686 QUASIPEAK

5 * 1.378 9.371 54.600 63.971 -10.029 74.000 QUASIPEAK

6 1.726 9.390 50.900 60.290 -13.710 74.000 QUASIPEAK



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.162 9.400 42.900 52.300 -21.357 73.657 AVERAGE

2 * 0.214 9.400 61.200 70.600 -1.571 72.171 AVERAGE

3 0.330 9.410 51.800 61.210 -7.647 68.857 AVERAGE

4 0.406 9.394 37.500 46.894 -19.792 66.686 AVERAGE

5 1.378 9.371 51.800 61.171 -2.829 64.000 AVERAGE

6 1.726 9.390 48.400 57.790 -6.210 64.000 AVERAGE



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuA)

Measure Level

(dBuA)

Margin

(dB)

Limit

(dBuA)

Detector Type

1 0.170 9.400 16.200 25.600 -13.829 39.429 QUASIPEAK

2 0.234 9.400 14.200 23.600 -14.000 37.600 QUASIPEAK

3 0.278 9.410 11.300 20.710 -15.633 36.343 QUASIPEAK

4 6.858 9.510 8.100 17.610 -12.390 30.000 QUASIPEAK

5 8.540 9.540 7.100 16.640 -13.360 30.000 QUASIPEAK

6 * 9.217 9.550 9.800 19.350 -10.650 30.000 QUASIPEAK



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuA)

Measure Level

(dBuA)

Margin

(dB)

Limit

(dBuA)

Detector Type

1 0.170 9.400 13.000 22.400 -7.029 29.429 AVERAGE

2 0.234 9.400 11.300 20.700 -6.900 27.600 AVERAGE

3 0.278 9.410 6.900 16.310 -10.033 26.343 AVERAGE

4 6.858 9.510 2.100 11.610 -8.390 20.000 AVERAGE

5 8.540 9.540 1.800 11.340 -8.660 20.000 AVERAGE

6 * 9.217 9.550 4.200 13.750 -6.250 20.000 AVERAGE



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Engineer : Moon



EUT : MEGA BOOK Probe : ISN - Telecom



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.218 9.400 56.700 66.100 -15.957 82.057 QUASIPEAK

2 0.294 9.410 40.100 49.510 -30.376 79.886 QUASIPEAK

3 0.326 9.410 49.300 58.710 -20.261 78.971 QUASIPEAK

4 0.434 9.390 37.800 47.190 -28.696 75.886 QUASIPEAK

5 5.162 9.490 33.400 42.890 -31.110 74.000 QUASIPEAK

6 6.254 9.500 34.300 43.800 -30.200 74.000 QUASIPEAK



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Engineer : Moon



EUT : MEGA BOOK Probe : ISN - Line1

Power : AC 230V/50Hz Note : Mode 1(Telecom)

Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.218 9.400 55.800 65.200 -6.857 72.057 AVERAGE

2 0.294 9.410 35.300 44.710 -25.176 69.886 AVERAGE

3 0.326 9.410 46.600 56.010 -12.961 68.971 AVERAGE

4 0.434 9.390 35.500 44.890 -20.996 65.886 AVERAGE

5 5.162 9.490 27.300 36.790 -27.210 64.000 AVERAGE

6 6.254 9.500 30.900 40.400 -23.600 64.000 AVERAGE



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.202 9.400 42.800 52.200 -30.314 82.514 QUASIPEAK

2 0.302 9.410 37.500 46.910 -32.747 79.657 QUASIPEAK

3 * 0.414 9.392 40.700 50.092 -26.365 76.457 QUASIPEAK

4 0.610 9.396 32.200 41.596 -32.404 74.000 QUASIPEAK

5 0.710 9.400 28.200 37.600 -36.400 74.000 QUASIPEAK

6 2.050 9.390 26.500 35.890 -38.110 74.000 QUASIPEAK



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.202 9.400 22.800 32.200 -40.314 72.514 AVERAGE

2 0.302 9.410 18.400 27.810 -41.847 69.657 AVERAGE

3 * 0.414 9.392 21.500 30.892 -35.565 66.457 AVERAGE

4 0.610 9.396 13.900 23.296 -40.704 64.000 AVERAGE

5 0.710 9.400 12.200 21.600 -42.400 64.000 AVERAGE

6 2.050 9.390 10.000 19.390 -44.610 64.000 AVERAGE



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Site : SR-1 (Conducted Emission and Power Test) Time : 2007/05/26 - 05:33





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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.258 9.406 47.700 57.106 -23.808 80.914 QUASIPEAK

2 0.698 9.400 34.700 44.100 -29.900 74.000 QUASIPEAK

3 6.358 9.500 36.100 45.600 -28.400 74.000 QUASIPEAK

4 9.202 9.550 32.200 41.750 -32.250 74.000 QUASIPEAK

5 * 24.574 9.770 51.900 61.670 -12.330 74.000 QUASIPEAK

6 27.650 9.820 35.700 45.520 -28.480 74.000 QUASIPEAK



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Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.258 9.406 42.600 52.006 -18.908 70.914 AVERAGE

2 0.698 9.400 31.400 40.800 -23.200 64.000 AVERAGE

3 6.358 9.500 29.100 38.600 -25.400 64.000 AVERAGE

4 9.202 9.550 26.900 36.450 -27.550 64.000 AVERAGE

5 * 24.574 9.770 50.400 60.170 -3.830 64.000 AVERAGE

6 27.650 9.820 29.200 39.020 -24.980 64.000 AVERAGE



Page: 104 of 224

Engineer : Moon






Page: 105 of 224

Engineer : Moon





Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.198 9.400 45.900 55.300 -27.329 82.629 QUASIPEAK

2 0.230 9.400 46.600 56.000 -25.714 81.714 QUASIPEAK

3 * 0.282 9.410 45.300 54.710 -25.519 80.229 QUASIPEAK

4 0.334 9.410 39.700 49.110 -29.633 78.743 QUASIPEAK

5 0.406 9.394 33.200 42.594 -34.092 76.686 QUASIPEAK

6 0.746 9.400 31.500 40.900 -33.100 74.000 QUASIPEAK



Page: 106 of 224

Engineer : Moon





Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.198 9.400 42.800 52.200 -20.429 72.629 AVERAGE

2 0.230 9.400 44.000 53.400 -18.314 71.714 AVERAGE

3 * 0.282 9.410 42.900 52.310 -17.919 70.229 AVERAGE

4 0.334 9.410 36.200 45.610 -23.133 68.743 AVERAGE

5 0.406 9.394 32.700 42.094 -24.592 66.686 AVERAGE

6 0.746 9.400 29.000 38.400 -25.600 64.000 AVERAGE



Page: 107 of 224

4.7. Test Photograph Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Front View of Conducted Test for LAN (10M &100bps)

Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Back View of Conducted Test for LAN (10M &100bps)


Page: 108 of 224

Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Front View of Conducted Test for LAN (1Gbps)

Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Back View of Conducted Test for LAN (1Gbps)


Page: 109 of 224

Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Front View of Conducted Test for Telecom

Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Back View of Conducted Test for Telecom


Page: 110 of 224

Test Mode: Mode 2: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Front View of Conducted Test for LAN (10M &100bps)



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Page: 119 of 224

5. Radiated Emission

5.1. Test Specification According to EMC Standard: AS/NZS CISPR 22 and EN 55022 Class B

5.2. Test Setup

5.3. Limit

Limits Frequency

(MHz) Distance (m) dBuV/m

30 - 230 10 30

230 - 1000 10 37

Remark: 1. The tighter limit shall apply at the edge between two frequency bands. 2. Distance refers to the distance in meters between the measuring instrument antenna

and the closed point of any part of the device or system.


Page: 120 of 224

5.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. Radiated emissions were invested over the frequency range from 30MHz to1GHz using a receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10 meters.



Page: 121 of 224


Site : AC-1 (10m Radiated Emission) Time : 2007/03/18 - 11:25


EUT : MEGA BOOK Probe : CBL6112B_2933(30-2000MHz) - HORIZONTAL


Frequency

(MHz)

Correct Factor

(dB)

Reading

Level

(dBuV)

Measure

Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type Ant Pos

(cm)

Table

Pos (deg)

1 * 95.500 -11.798 33.960 22.162 -7.838 30.000 QUASIPEAK 400.000 198.500

2 120.000 -9.854 30.690 20.836 -9.164 30.000 QUASIPEAK 386.500 168.900

3 226.250 -11.367 31.900 20.533 -9.467 30.000 QUASIPEAK 325.000 193.200

4 399.500 -3.467 28.120 24.653 -12.347 37.000 QUASIPEAK 400.000 205.500

5 701.200 1.377 25.130 26.508 -10.492 37.000 QUASIPEAK 289.600 236.500

6 850.000 3.417 23.900 27.316 -9.684 37.000 QUASIPEAK 186.500 198.500

Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor


Page: 122 of 224

Engineer : Moon

Site : AC-1 (10m Radiated Emission) Time : 2007/03/18 - 11:22


EUT : MEGA BOOK Probe : CBL6112B_2933(30-2000MHz) - VERTICAL


Frequency

(MHz)

Correct

Factor (dB)

Reading

Level

(dBuV)

Measure

Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)


(cm)

Table Pos

(deg)

1 95.265 -11.842 34.286 22.444 -7.556 30.000 QUASIPEAK 100.000 235.600

2 107.600 -10.205 30.968 20.763 -9.237 30.000 QUASIPEAK 100.000 265.300

3 151.550 -10.932 30.652 19.720 -10.280 30.000 QUASIPEAK 100.000 214.300

4 195.000 -12.001 33.625 21.624 -8.376 30.000 QUASIPEAK 100.000 233.600

5 * 399.500 -3.467 33.260 29.793 -7.207 37.000 QUASIPEAK 100.000 266.400

6 942.100 3.846 24.980 28.825 -8.175 37.000 QUASIPEAK 123.500 189.600



Page: 123 of 224

Engineer : Moon

Site : AC-1(10m Radiated Emission) Time : 2007/05/22 - 18:38




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)


(cm)

Table Pos

(deg)

1 130.000 -10.758 26.500 15.741 -14.259 30.000 QUASIPEAK 400.000 235.600

2 192.500 -13.311 38.200 24.889 -5.111 30.000 QUASIPEAK 400.000 125.600

3 216.700 -13.488 39.200 25.712 -4.288 30.000 QUASIPEAK 400.000 125.600

4 255.000 -9.188 32.100 22.912 -14.088 37.000 QUASIPEAK 326.500 18.600

5 * 400.000 -4.842 37.800 32.959 -4.041 37.000 QUASIPEAK 400.000 126.800

6 958.500 2.724 24.900 27.624 -9.376 37.000 QUASIPEAK 315.600 189.600



Page: 124 of 224

Engineer : Moon





Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)


(cm)

Table Pos

(deg)

1 149.500 -10.743 35.400 24.657 -5.343 30.000 QUASIPEAK 100.000 235.600

2 160.500 -11.439 37.120 25.680 -4.320 30.000 QUASIPEAK 100.000 156.500

3 174.200 -12.255 38.100 25.845 -4.155 30.000 QUASIPEAK 100.000 245.600

4 192.600 -12.124 38.400 26.276 -3.724 30.000 QUASIPEAK 100.000 15.600

5 * 221.500 -11.956 39.556 27.600 -2.400 30.000 QUASIPEAK 0.000 0.000

6 398.225 -3.526 35.000 31.474 -5.526 37.000 QUASIPEAK 100.000 322.800



Page: 125 of 224

Engineer : Moon





Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)


(cm)

Table Pos

(deg)

1 120.000 -10.888 33.500 22.612 -7.388 30.000 QUASIPEAK 400.000 168.500

2 160.500 -12.614 36.100 23.486 -6.514 30.000 QUASIPEAK 400.000 18.900

3 173.500 -13.227 36.100 22.873 -7.127 30.000 QUASIPEAK 400.000 355.200

4 192.600 -13.302 36.400 23.097 -6.903 30.000 QUASIPEAK 400.000 12.500

5 * 221.500 -13.147 38.700 25.554 -4.446 30.000 QUASIPEAK 199.500 326.500

6 398.500 -4.948 37.400 32.452 -4.548 37.000 QUASIPEAK 356.500 126.800



Page: 126 of 224

Engineer : Moon





Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)


(cm)

Table Pos

(deg)

1 95.400 -11.817 38.100 26.284 -3.716 30.000 QUASIPEAK 100.000 196.800

2 102.500 -10.694 37.400 26.706 -3.294 30.000 QUASIPEAK 100.000 39.600

3 * 135.400 -9.903 37.600 27.696 -2.304 30.000 QUASIPEAK 100.000 169.800

4 170.000 -11.918 38.500 26.583 -3.417 30.000 QUASIPEAK 100.000 169.800

5 194.500 -12.030 38.700 26.670 -3.330 30.000 QUASIPEAK 100.000 236.800

6 398.500 -3.510 36.800 33.290 -3.710 37.000 QUASIPEAK 100.500 156.500



Page: 127 of 224

Engineer : Moon





Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)


(cm)

Table Pos

(deg)

1 175.600 -13.367 36.400 23.033 -6.967 30.000 QUASIPEAK 100.000 236.800

2 185.400 -13.666 35.100 21.434 -8.566 30.000 QUASIPEAK 400.000 16.900

3 192.600 -13.302 36.400 23.097 -6.903 30.000 QUASIPEAK 400.000 185.500

4 219.800 -13.332 38.200 24.868 -5.132 30.000 QUASIPEAK 355.200 147.300

5 * 400.500 -4.802 38.000 33.197 -3.803 37.000 QUASIPEAK 364.700 12.600

6 801.000 0.958 27.600 28.558 -8.442 37.000 QUASIPEAK 189.500 126.800



Page: 128 of 224

Engineer : Moon


Limit : CNS13438_B_10M_QP Margin : 6



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)


(cm)

Table Pos

(deg)

1 66.500 -16.691 40.100 23.410 -6.590 30.000 QUASIPEAK 100.000 325.600

2 95.400 -11.817 36.100 24.284 -5.716 30.000 QUASIPEAK 100.000 16.800

3 192.500 -12.132 38.000 25.869 -4.131 30.000 QUASIPEAK 105.600 12.600

4 224.600 -11.591 37.200 25.609 -4.391 30.000 QUASIPEAK 100.000 36.800

5 * 400.500 -3.433 37.000 33.567 -3.433 37.000 QUASIPEAK 100.000 169.800

6 928.000 3.993 26.800 30.793 -6.207 37.000 QUASIPEAK 100.000 169.500



Page: 129 of 224

5.7. Test Photograph Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Front View of Radiated Test

Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Back View of Radiated Test


Page: 130 of 224

Test Mode: Mode 2: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Front View of Radiated Test

Test Mode: : Mode 2: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Back View of Radiated Test


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Page: 133 of 224

6. Harmonic Current Emission

6.1. Test Specification According to EMC Standard: EN 61000-3-2

6.2. Test Setup

6.3. Limit (a) Limits of Class A Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current

A

Harmonics Order

n


A

Odd harmonics Even harmonics

3 2.30 2 1.08

5 1.14 4 0.43

7 0.77 6 0.30

9 0.40 8 ≤ n ≤ 40 0.23 * 8/n

11 0.33

13 0.21

15 ≤ n ≤ 39 0.15 * 15/n


Page: 134 of 224

(b) Limits of Class B Harmonics Currents

For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table that is the limit of Class A multiplied by a factor of 1.5.

(c) Limits of Class C Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency

％

2 2

3 30．λ＊

5 10

7 7

9 5

11 ≤ n ≤ 39 (odd harmonics only)

3

＊λ is the circuit power factor

(d) Limits of Class D Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current per watt

mA/W


A

3 3.4 2.30

5 1.9 1.14

7 1.0 0.77

9 0.5 0.40

11 0.35 0.33

11 ≤ n ≤ 39 (odd harmonics only)

3.85/n See limit of Class A


Page: 135 of 224

6.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed.



Page: 136 of 224

6.6. Test Result Product MEGA Book

Test Item Power Harmonics

Test Mode Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz)

Date of Test 2007/03/15 Test Site SR-2

Test Result: Pass Source qualification: Normal

Current & voltage waveforms

-0.9-0.6-0.30.00.30.60.9

-300-200-1000100200300

Cur

rent

(Am

ps)

Voltage (V

olts)

Harmonics and Class D limit line European Limits

0.000.050.100.150.200.250.300.350.400.45

Cur

rent

RM

S(A

mps

)

Harmonic #4 8 12 16 20 24 28 32 36 40

Test result: Pass Worst harmonic was #11 with 13.30% of the limit.


Page: 137 of 224

Test Result: Pass Source qualification: Normal THC(A): 0.04 I-THD(%): 12.11 POHC(A): 0.005 POHC Limit(A): 0.038 Highest parameter values during test:

V_RMS (Volts): 230.13 Frequency(Hz): 50.00 I_Peak (Amps): 0.641 I_RMS (Amps): 0.389 I_Fund (Amps): 0.383 Crest Factor: 1.720 Power (Watts): 87.9 Power Factor: 0.983

Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status

2 0.000 3 0.041 0.299 13.7 0.043 0.448 9.68 Pass 4 0.000 5 0.008 0.167 4.5 0.009 0.239 3.62 Pass 6 0.000 7 0.010 0.088 11.5 0.011 0.126 8.35 Pass 8 0.000 9 0.007 0.044 16.8 0.007 0.063 11.77 Pass 10 0.000 11 0.006 0.031 18.2 0.006 0.044 13.30 Pass 12 0.000 13 0.005 0.026 17.9 0.005 0.037 12.80 Pass 14 0.000 15 0.004 0.023 16.5 0.004 0.034 12.29 Pass 16 0.000 17 0.003 0.020 13.1 0.003 0.030 10.04 Pass 18 0.000 19 0.002 0.018 11.3 0.002 0.027 8.04 Pass 20 0.000 21 0.002 0.016 12.1 0.002 0.024 9.28 Pass 22 0.000 23 0.002 0.015 14.7 0.002 0.021 10.55 Pass 24 0.000 25 0.002 0.014 14.6 0.002 0.020 10.20 Pass 26 0.000 27 0.002 0.013 12.1 0.002 0.018 8.63 Pass 28 0.000 29 0.001 0.012 11.2 0.001 0.017 8.19 Pass 30 0.000 31 0.001 0.011 10.3 0.001 0.016 7.28 Pass 32 0.000 33 0.001 0.010 10.1 0.001 0.015 7.30 Pass 34 0.000 35 0.001 0.010 11.4 0.001 0.015 8.11 Pass 36 0.000 37 0.001 0.009 12.7 0.001 0.014 9.23 Pass 38 0.000 39 0.001 0.009 14.6 0.001 0.013 10.29 Pass 40 0.000

1. Dynamic limits were applied for this test. The highest harmonics values in the above table may

not occur at the same window as the maximum harmonics/limit ratio.

2. According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an

active input power >75W. Others the result should be pass.


Page: 138 of 224

Product MEGA Book






-69-46-23

0234669

-300-200-1000100200300

Cur

rent

(Am

ps)

Voltage (V

olts)


0

25

50

75

100

Cur

rent

RM

S(A

mps

)

Harmonic #4 8 12 16 20 24 28 32 36 40



Page: 139 of 224










Page: 140 of 224

Product MEGA Book






-0.9-0.6-0.30.00.30.60.9

-300-200-1000100200300

Cur

rent

(Am

ps)

Voltage (V

olts)


0.000.050.100.150.200.250.300.350.400.450.50

Cur

rent

RM

S(A

mps

)

Harmonic #4 8 12 16 20 24 28 32 36 40



Page: 141 of 224










Page: 142 of 224

Product MEGA Book






-0.9-0.6-0.30.00.30.60.9

-300-200-1000100200300

Cur

rent

(Am

ps)

Voltage (V

olts)


0.000.050.100.150.200.250.300.350.400.45

Cur

rent

RM

S(A

mps

)

Harmonic #4 8 12 16 20 24 28 32 36 40



Page: 143 of 224










Page: 144 of 224

6.7. Test Photograph Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Power Harmonics Test Setup

Test Mode: Mode 2: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Power Harmonics Test Setup


Page: 145 of 224




Page: 146 of 224

7. Voltage Fluctuation and Flicker

7.1. Test Specification According to EMC Standard: EN 61000-3-3

7.2. Test Setup

7.3. Limit The following limits apply:

－ the value of Pst shall not be greater than 1.0; － the value of Plt shall not be greater than 0.65; － the value of d(t) during a voltage change shall not exceed 3.3 ％ for more than 500

ms; － the relative steady-state voltage change, dc, shall not exceed 3.3 ％; － the maximum relative voltage change, dmax, shall not exceed;

a) 4 ％ without additional conditions; b) 6 ％ for equipment which is:

－ switched manually, or － switched automatically more frequently than twice per day, and also has either a

delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption.

Note: The cycling frequency will be further limited by the Pst and P1t limit. For example: a dmax of 6％producing a rectangular voltage change characteristic twice per

hour will give a P1t of about 0.65.


Page: 147 of 224

c) 7 ％ for equipment which is: － attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment

such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or

－ switched on automatically, or is intended to be switched on manually, no more than

twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption.

Pst and P1t requirements shall not be applied to voltage changes caused by manual switching.

7.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed.



Page: 148 of 224


Test Item Voltage Fluctuation and Flicker



Test Result: Pass Status: Test Completed

Psti and limit line European Limits

0.25

0.50

0.75

1.00

Pst

10:35:27

Plt and limit line

0.10.20.30.40.50.6

Plt

10:35:27

Parameter values recorded during the test: Vrms at the end of test (Volt): 229.98 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (mS): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.160 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.070 Test limit: 0.650 Pass


Page: 149 of 224

Product MEGA Book






0.25

0.50

0.75

1.00

Pst

10:21:22

Plt and limit line

0.10.20.30.40.50.6

Plt

10:21:22



Page: 150 of 224

Product MEGA Book






0.25

0.50

0.75

1.00

Pst

0:04:03

Plt and limit line

0.10.20.30.40.50.6

Plt

0:04:03



Page: 151 of 224

Product MEGA Book






0.25

0.50

0.75

1.00

Pst

0:19:22

Plt and limit line

0.10.20.30.40.50.6

Plt

0:19:22



Page: 152 of 224

7.7. Test Photograph Test Mode : Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description : Flicker Test Setup

Test Mode : Mode 2: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description : Flicker Test Setup


Page: 153 of 224




Page: 154 of 224

8. Electrostatic Discharge

8.1. Test Specification According to Standard: IEC 61000-4-2

8.2. Test Setup

8.3. Limit

Item Environmental Phenomena

Units Test Specification Performance Criteria

Enclosure Port

Electrostatic Discharge kV(Charge Voltage) ±8 Air Discharge ±4 Contact Discharge

B


Page: 155 of 224

8.4. Test Procedure

Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT.

Indirect application of discharges to the EUT:

Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point.

8.5. Deviation from Test Standard

No deviation.


Page: 156 of 224


Test Item Electrostatic Discharge



Item Amount of Discharge

Voltage kV

Required Criteria

Complied To Criteria (A,B,C)

Results

Air Discharge 500 ±8kV B A Pass

Contact Discharge 500 ±4kV B A Pass

Indirect Discharge (HCP)

200 ±4kV B A Pass

Indirect Discharge (VCP Front)

50 ±4kV B A Pass

Indirect Discharge (VCP Left)

50 ±4kV B A Pass

Indirect Discharge (VCP Back)

50 ±4kV B A Pass

Indirect Discharge (VCP Right)

50 ±4kV B A Pass

Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report.

Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information

EUT stopped operation and could / could not be reset by operator at kV. No false alarms or other malfunctions were observed during or after the test.

Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points.


Page: 157 of 224

Product MEGA Book





Voltage kV

Required Criteria


Results




200 ±4kV B A Pass


50 ±4kV B A Pass


50 ±4kV B A Pass


50 ±4kV B A Pass


50 ±4kV B A Pass






Page: 158 of 224

Product MEGA Book





Voltage kV

Required Criteria


Results




200 ±4kV B A Pass


50 ±4kV B A Pass


50 ±4kV B A Pass


50 ±4kV B A Pass


50 ±4kV B A Pass






Page: 159 of 224

Product MEGA Book





Voltage kV

Required Criteria


Results




200 ±4kV B A Pass


50 ±4kV B A Pass


50 ±4kV B A Pass


50 ±4kV B A Pass


50 ±4kV B A Pass






Page: 160 of 224

8.7. Test Photograph Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: ESD Test Setup

Test Mode: Mode 2: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: ESD Test Setup


Page: 161 of 224




Page: 162 of 224

9. Radiated Susceptibility


9.2. Test Setup

9.3. Limit


Units Test Specification

Performance Criteria

Enclosure Port

Radio-Frequency Electromagnetic Field Amplitude Modulated

MHz V/m(Un-modulated, rms)% AM (1kHz)

80-1000 3 80

A


Page: 163 of 224

9.4. Test Procedure

The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.

All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/m Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 80MHz - 1000MHz 4 Dwell Time 3 Seconds 5. Frequency step size ∆ f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s


No deviation.


Page: 164 of 224


Test Item RF Electromagnetic Field

Test Mode Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) with adapter #1

Date of Test 2007/03/16 Test Site AC-3

Frequency (MHz)

Position (Angle)

Polarity (H or V)

Field Strength

(V/m)

Required Criteria

Complied To Criteria

(A,B,C) Results

80-1000 Front H 3 A A Pass

80-1000 Front V 3 A A Pass

80-1000 Back H 3 A A Pass

80-1000 Back V 3 A A Pass

80-1000 Right H 3 A A Pass

80-1000 Right V 3 A A Pass

80-1000 Left H 3 A A Pass

80-1000 Left V 3 A A Pass

80-1000 Top H 3 A A Pass

80-1000 Top V 3 A A Pass

80-1000 Bottom H 3 A A Pass

80-1000 Bottom V 3 A A Pass

Note:

The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report.


There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m

at frequency MHz. No false alarms or other malfunctions were observed during or after the test.


Page: 165 of 224

Product MEGA Book




Frequency (MHz)

Position (Angle)

Polarity (H or V)

Field Strength

(V/m)

Required Criteria


(A,B,C) Results













Note:






Page: 166 of 224

Product MEGA Book




Frequency (MHz)

Position (Angle)

Polarity (H or V)

Field Strength

(V/m)

Required Criteria


(A,B,C) Results













Note:






Page: 167 of 224

Product MEGA Book




Frequency (MHz)

Position (Angle)

Polarity (H or V)

Field Strength

(V/m)

Required Criteria


(A,B,C) Results













Note:






Page: 168 of 224

9.7. Test Photograph Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: RF Electromagnetic Field Test Setup

Test Mode: Mode 2: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: RF Electromagnetic Field Test Setup


Page: 169 of 224




Page: 170 of 224

10. Electrical Fast Transient/Burst


10.2. Test Setup

10.3. Limit Item Environmental

PhenomenaUnits Test Specification Performance

Criteria I/O and communication ports Fast Transients Common Mode

kV (Peak) Tr/Th ns Rep. Frequency kHz

+0.5 5/50 5

B

Input DC Power Ports Fast Transients Common Mode


+0.5 5/50 5

B

Input AC Power Ports Fast Transients Common Mode


+1 5/50 5

B


Page: 171 of 224

10.4. Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on the table, and uses a 0.1m insulation between the EUT and ground reference plane. The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and projected beyond the EUT by at least 0.1m on all sides. Test on I/O and communication ports: The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1minute. Test on power supply ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT/B interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 minute. The length of the signal and power lines between the coupling device and the EUT is 0.5m.



Page: 172 of 224


Test Item Electrical fast transient/burst



Inject

Line Polarity

Voltage

kV

Inject

Time

(Second)

Inject

Method

Required

Criteria

Complied to

Criteria Result

L ± 1kV 120 Direct B A Pass

N ± 1kV 120 Direct B A Pass

PE ± 1kV 120 Direct B A Pass

L+N ± 1kV 120 Direct B A Pass

L+PE ± 1kV 120 Direct B A Pass

N+PE ± 1kV 120 Direct B A Pass

L+N+PE ± 1kV 120 Direct B A Pass

LAN ± 0.5 kV 120 Clamp B A Pass

Telecom ± 0.5 kV 120 Clamp B A Pass

Note:


Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information

EUT stopped operation and could / could not be reset by operator at kV of Line .

No false alarms or other malfunctions were observed during or after the test.


Page: 173 of 224

Product MEGA Book




Inject

Line Polarity

Voltage

kV

Inject

Time

(Second)

Inject

Method

Required

Criteria

Complied to

Criteria Result










Note:






Page: 174 of 224

Product MEGA Book




Inject

Line Polarity

Voltage

kV

Inject

Time

(Second)

Inject

Method

Required

Criteria

Complied to

Criteria Result










Note:






Page: 175 of 224

Product MEGA Book




Inject

Line Polarity

Voltage

kV

Inject

Time

(Second)

Inject

Method

Required

Criteria

Complied to

Criteria Result










Note:






Page: 176 of 224

10.7. Test Photograph Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: EFT/B Test Setup for Main

Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: EFT/B Test Setup for LAN


Page: 177 of 224

Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: EFT/B Test Setup for Telecom

Test Mode: Mode 2: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: EFT/B Test Setup for Main


Page: 178 of 224




Page: 179 of 224




Page: 180 of 224




Page: 181 of 224




Page: 182 of 224

11. Surge


11.2. Test Setup

11.3. Limit Item Environmental Phenomena Units Test Specification Performance

Criteria Signal Ports and Telecommunication Ports(See 1) and 2) ) Surges Line to Ground

Tr/Th us kV

1.2/50 (8/20) ± 1 B

Input DC Power Ports Surges Line to Ground

Tr/Th us kV

1.2/50 (8/20) ± 0.5 B

AC Input and AC Output Power Ports Surges Line to Line Line to Ground

Tr/Th us kV kV

1.2/50 (8/20) ± 1 ± 2

B

Notes:

1) Applicable only to ports which according to the manufacturer’s may directly to outdoor cables.

2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT, no immunity test shall be required.


Page: 183 of 224

11.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700 and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min.


No deviation.


Page: 184 of 224


Test Item Surge



Inject Line

Polarity Angle Voltage

kV

Time Interval

(Second)

Inject Method

Required Criteria

Complied to

Criteria Result

L-N ± 0 1kV 60 Direct B A Pass




L+PE ± 0 2kV 60 Direct B A Pass




N+PE ± 0 2kV 60 Direct B A Pass




Telecom ± N/A 1kV 60 Direct B B Pass

Note:

The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information




Page: 185 of 224

Product MEGA Book

Test Item Surge



Inject Line


kV

Time Interval

(Second)

Inject Method

Required Criteria

Complied to

Criteria Result














Note:





Page: 186 of 224

Product MEGA Book

Test Item Surge



Inject Line


kV

Time Interval

(Second)

Inject Method

Required Criteria

Complied to

Criteria Result














Note:





Page: 187 of 224

Product MEGA Book

Test Item Surge



Inject Line


kV

Time Interval

(Second)

Inject Method

Required Criteria

Complied to

Criteria Result














Note:





Page: 188 of 224

11.7. Test Photograph Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Surge Test Setup for Main

Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Surge Test Setup for Telecom


Page: 189 of 224

Test Mode: Mode 2: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Surge Test Setup for Main



Page: 190 of 224




Page: 191 of 224




Page: 192 of 224

12. Conducted Susceptibility


12.2. Test Setup

CDN Test

EM Clamp Test


Page: 193 of 224

12.3. Limit

Item Environmental Phenomena Units Test Specification


Signal Ports and Telecommunication Ports Radio-Frequency Continuous Conducted

MHz V (rms, Un-modulated) % AM (1kHz)

0.15-80 3 80 A

Input DC Power Ports Radio-Frequency Continuous Conducted


0.15-80 3 80 A

Input AC Power Ports Radio-Frequency Continuous Conducted


0.15-80 3 80 A

12.4. Test Procedure The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz – 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size ∆ f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s


Page: 194 of 224



Page: 195 of 224


Test Item Conducted susceptibility



Frequency Range

(MHz)

Voltage Applied

dBuV(V)

Inject

Method

Tested Port

of

EUT

Required Criteria


Complied To

Result

0.15~80 130 (3V) CDN AC IN A A Pass

0.15~80 130 (3V) CDN LAN A A Pass

0.15~80 130 (3V) CDN Telecom A A Pass



EUT stopped operation and could / could not be reset by operator at dBuV(V) at frequency MHz.

No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test.


Page: 196 of 224

Product MEGA Book




Frequency Range

(MHz)

Voltage Applied

dBuV(V)

Inject

Method

Tested Port

of

EUT

Required Criteria


Complied To

Result


0.15~80 130 (3V) CDN LAN A A Pass







Page: 197 of 224

Product MEGA Book




Frequency Range

(MHz)

Voltage Applied

dBuV(V)

Inject

Method

Tested Port

of

EUT

Required Criteria


Complied To

Result


0.15~80 130 (3V) CDN LAN A A Pass







Page: 198 of 224

Product MEGA Book




Frequency Range

(MHz)

Voltage Applied

dBuV(V)

Inject

Method

Tested Port

of

EUT

Required Criteria


Complied To

Result


0.15~80 130 (3V) CDN LAN A A Pass







Page: 199 of 224

12.7. Test Photograph Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Conducted Susceptibility Test Setup for Main

Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Conducted Susceptibility Test Setup for LAN


Page: 200 of 224

Test Mode: Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Conducted Susceptibility Test Setup for Telecom

Test Mode: Mode 2: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Conducted Susceptibility Test Setup for Main


Page: 201 of 224




Page: 202 of 224

Test Mode: Mode 3: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Conducted Susceptibility Test Setup for main



Page: 203 of 224


Test Mode: Mode 4: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description: Conducted Susceptibility Test Setup for main


Page: 204 of 224




Page: 205 of 224

13. Power Frequency Magnetic Field


13.2. Test Setup

13.3. Limit Item Environmental

Phenomena Units Test Specification Performance

Criteria Enclosure Port Power-Frequency

Magnetic Field Hz A/m (r.m.s.)

50 1

A

13.4. Test Procedure

The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT.

And the induction coil shall be rotated by 90° in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations).



Page: 206 of 224


Test Item Power frequency magnetic field



Polarization Frequency (Hz)

Magnetic Strength

(A/m)

Required Performance

Criteria


Complied To

Test Result

X Orientation 50 1 A A Pass

Y Orientation 50 1 A A Pass

Z Orientation 50 1 A A Pass

Note:

The acceptance criteria were met, and the EUT passed the test.





Page: 207 of 224

Product MEGA Book





Magnetic Strength

(A/m)


Criteria


Complied To

Test Result




Note:






Page: 208 of 224

Product MEGA Book





Magnetic Strength

(A/m)


Criteria


Complied To

Test Result




Note:






Page: 209 of 224

Product MEGA Book





Magnetic Strength

(A/m)


Criteria


Complied To

Test Result




Note:






Page: 210 of 224

13.7. Test Photograph Test Mode : Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description : Power Frequency Magnetic Field Test Setup

Test Mode : Mode 2: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description : Power Frequency Magnetic Field Test Setup


Page: 211 of 224




Page: 212 of 224

14. Voltage Dips and Interruption


14.2. Test Setup

14.3. Limit


Units Test Specification Performance Criteria

Input AC Power Ports

% Reduction ms

30 500

C Voltage Dips

% Reduction ms

>95 10

B

Voltage Interruptions % Reduction ms

>95 5000

C


Page: 213 of 224

14.4. Test Procedure

The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test: The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods, for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 250 Periods with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 00, 450, 900, 1350, 1800, 2250, 2700, 3150 of the voltage.


No deviation.


Page: 214 of 224


Test Item Voltage dips and interruption



Voltage Dips and

Interruption Reduction(%)

Angle Test Duration

(ms)


Criteria


Complied To

Test Result

>95(0V) 0 10 B A Pass >95(0V) 45 10 B A Pass >95(0V) 90 10 B A Pass >95(0V) 135 10 B A Pass >95(0V) 180 10 B A Pass >95(0V) 225 10 B A Pass >95(0V) 270 10 B A Pass >95(0V) 315 10 B A Pass 30(161V) 0 500 C A Pass 30(161V) 45 500 C A Pass 30(161V) 90 500 C A Pass 30(161V) 135 500 C A Pass 30(161V) 180 500 C A Pass 30(161V) 225 500 C A Pass 30(161V) 270 500 C A Pass 30(161V) 315 500 C A Pass >95(0V) 0 5000 C B Pass >95(0V) 45 5000 C B Pass >95(0V) 90 5000 C B Pass >95(0V) 135 5000 C B Pass >95(0V) 180 5000 C B Pass >95(0V) 225 5000 C B Pass >95(0V) 270 5000 C B Pass >95(0V) 315 5000 C B Pass

Note: The acceptance criteria were met, and the EUT passed the test.





Page: 215 of 224

Product MEGA Book




Voltage Dips and


Angle Test Duration

(ms)


Criteria


Complied To

Test Result







Page: 216 of 224

Product MEGA Book




Voltage Dips and


Angle Test Duration

(ms)


Criteria


Complied To

Test Result







Page: 217 of 224

Product MEGA Book




Voltage Dips and


Angle Test Duration

(ms)


Criteria


Complied To

Test Result







Page: 218 of 224

14.7. Test Photograph Test Mode : Mode 1: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description : Voltage Dips Test Setup

Test Mode : Mode 2: LCD (1440*900@60Hz) +VGA (1440*900@60Hz) Description : Voltage Dips Test Setup


Page: 219 of 224




Page: 220 of 224

15. Attachment EUT Photograph

(1) EUT Photo

(2) EUT Photo


Page: 221 of 224

(3) EUT Photo

(4) EUT Photo


Page: 222 of 224

(5) EUT Photo

(6) EUT Photo


Page: 223 of 224

(7) EUT Photo

(8) EUT Photo


Page: 224 of 224

(9) EUT Photo

(10) EUT Photo

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