Supplementary information

Synergetic strengthening of additively manufactured

(CoCrFeMnNi)99C1 high-entropy alloy by heterogeneous anisotropic

microstructure

Jeong Min Parka, Jungho Choeb, Hyung Keun Parka, Sujung Sona, Jaimyun Junga, Taek-Soo

Kimc, Ji-Hun Yub, Jung Gi Kimd, Hyoung Seop Kima *

aDepartment of Materials Science and Engineering, POSTECH (Pohang University of Science

and Technology), Pohang 37673, Republic of KoreabPowder & Ceramic Division, Korea Institute of Materials Science (KIMS), Changwon 51508,

Republic of KoreacKorea-Russia Innovation Center, Korea Institute of Industrial Technology (KITECH), Incheon

22004, Republic of KoreadDepartment of Metallurgical and Materials Engineering, Gyeongsang National University,

Jinju 52828, Republic of Korea

*Corresponding author. Tel.: +82 54 279 2150; E-mail address: hskim@postech.ac.kr (H.S.

Kim)

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Supplementary figures

Figure S1. A schematic of the scanning strategy in the present SLM process. The

parallel and perpendicular directions of the laser-scanning path are denoted as X and Y

directions, respectively. The building direction is labeled as Z direction.

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Figure S2. OM images on the finely polished surface of the samples processed by

different scanning speeds in SLM: (a) 100 mm/s, (b) 200 mm/s, (c) 400 mm/s, and (d)

600 mm/s. The volume fraction of pores is measured using 2D image-processing

program ‘Image J’. The sample built at 600 mm/s exhibits the minimum volume

fraction of pore (~ 0.14 vol%).

Figure S3. OM images for the etched surface of the SLM-processed HEAs with respect

to (a) X, (b) Y, and (c) Z planes.

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Figure S4. The inverse pole figures (IPFs) of (a) X, (b) Y, and (c) Z planes of the

SLM-processed samples. The dotted contour lines overlayed on the IPFs represent the

level of Taylor factors.

Figure S5. The results of CMWP fitting on the XRD patterns of the as-built samples

oriented along (a) X, (b) Y and (a) Z directions: experimental (black solid line) and

fitted (red solid line) diffraction patterns and the difference (blue dotted line) between

experimental and fitted diffraction patterns. The experimental XRD patterns are well

matched with the CMWP fitted curves.

Figure S6. The simulated stress-strain curves for the samples deformed along (a) X, (b)

Y and (c) Z directions.

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Figure S7. The Taylor factor maps (with respect to tensile direction) overlaid on IQ

maps at the regions of the local strains of (a) ~30.15%, (b) ~36.38%, and (c) ~32.30% in

the samples deformed along X, Y, and Z directions, respectively. Deformation twin

bundles are highlighted by yellow arrows in the EBSD maps. It is noted that the

deformation twins are mainly found in the grains having large grain size and high

Taylor factor.

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