tms 4116 - dynamic random access memory

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G Rajesh [U4ECE 13117] 16,384-Bit Dynamic Random Access Memory TMS 4116

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Page 1: TMS 4116  - Dynamic Random Access Memory

G Rajesh [U4ECE 13117]

16,384-Bit Dynamic Random Access Memory

TMS 4116

Page 2: TMS 4116  - Dynamic Random Access Memory

Specifications16,834 x 1 OrganizationLow Power dissipation -operation : 462 Mw -Standby : 20mW1 T Cell Design, N channel Si-Gate

Technology16 pin ,7.62 mm package Config.

Page 3: TMS 4116  - Dynamic Random Access Memory

16,384 bit MOS RAM Organized as 16,384 one-bit words Single Transistor storage Cells & N-Channel si-Gates Only 10mW avg. power required to refresh and retain memory Compatible with series 74 TTL circuits

Page 4: TMS 4116  - Dynamic Random Access Memory

Pin Diagram A0-A6 - Addresses CAS - Column Address Strobe D - Data input Q - Data Output Ras - Row Address Strobe VBB - (-5V) Power Supply VCC - +5V Power Supply VDD - +12V Power Supply VSS - Ground W - Write Enable

Page 5: TMS 4116  - Dynamic Random Access Memory

Operation 14 Address Bits are

Required A0 – A6 are used Latched by RAS & CAS

To select Read/Write Mode Logic High – Read Mode Data i/p is disabled at Read Mode

Data is written during a Write cycle

For Reading a data

Page 6: TMS 4116  - Dynamic Random Access Memory

Must be refreshed at least every 2 mSec

Vbb Must be Removed LastElse dissipation in excess occurs due to internal forward bias conditions

Page 7: TMS 4116  - Dynamic Random Access Memory

Functional Diagram

Page 8: TMS 4116  - Dynamic Random Access Memory

Operation CyclesRead Cycle

Page 9: TMS 4116  - Dynamic Random Access Memory

Early Write Cycle

Page 10: TMS 4116  - Dynamic Random Access Memory

Write Cycle

Page 11: TMS 4116  - Dynamic Random Access Memory

Read-Write/Read-Modify-Write Cycle

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