v.a. kulbachinskii v.g. kytin, o.v. reukova, d.s. glebov, d.d. melnik, a.r. kaul, l.i. burova
DESCRIPTION
Structure and Electrophysical Properties of the Transparent Conducting Zinc and Indium Oxides Films. V.A. Kulbachinskii V.G. Kytin, O.V. Reukova, D.S. Glebov, D.D. Melnik, A.R. Kaul, L.I. Burova. M.V. Lomonosov Moscow State University, Moscow, Russia. Yu.M. Galperin, A.G. Ulyashin. - PowerPoint PPT PresentationTRANSCRIPT
Structure and Electrophysical Properties of the Transparent
Conducting Zinc and Indium Oxides Films
V.A. Kulbachinskii
V.G. Kytin, O.V. Reukova, D.S. Glebov, D.D. Melnik, A.R. Kaul, L.I. BurovaM.V. Lomonosov Moscow State University, Moscow, Russia
Yu.M. Galperin, A.G. UlyashinUniversity of Oslo, Oslo, Norway
Outline
1) Transparent conducting oxides
2) Zinc oxide: - crystal structure; - electronic structure; - defects and dopants
- MOCVD grown undoped - Ga doped ZnO films- Co doped ZnO films
3) Indium oxide (In2O3):- crystal structure
- electronic structure- properties of Sn doped In2O3
4) Summary
2
Transparent conducting oxides and their applications
3
Crystal structure of ZnO
Zn
O
Rocksalt
Zinc blende
Wurtzite
Basic structures of ZnO*
a=3.250 Åc=5.206 Å
4
Band structure of ZnO wurzite
Band structure of ZnO calculated by non-local (solid lines) and local (dashed lines) empirical pseudo potential method*
Brillouin zone of wurtzite ZnO
Electron effective mass: mII≈m┴≈(0.25-0.3)m0*
5
Defects in ZnONative donor defects:- Oxygen vacancies VO
- Zinc interstitials Zni
Calculated formation energies of native defects in ZnO*
Native acceptor defects:- Zn vacancies ZnV
- O interstitials Oi
Zn rich conditions O rich conditions
6
Structure of undoped ZnO films grown on R-Al2O3 and ZrO2(Y2O3)(111) substrates by oxygen assisted MOCVD
XRD data of ZnO films grown on R-Al2O3 and ZrO2(Y2O3) (111) substrates: a) and b) on R-Al2O3 θ-scan and φ-scan; c) and d) on ZrO2(Y2O3)(111) θ-scan and φ-scan
Epitaxial films with orientation determined by substrate 7
Structure of undoped ZnO films grown on MgAl2O4 (111) substrates by oxygen assisted MOCVD
a b
XRD data of ZnO films grown on MgAl2O4(111) substrates: a) θ-scan; b) φ-scan
Epitaxial films with 2 in-plain orientations of ZnO with respect to substrate
8
Structure of undoped ZnO films grown by water assisted MOCVD
20 25 30 35 40 45 50 55 60
r-Al2O
3
*(110)
* (101) *
(002)
lg(In
tens
ity),
a.u.
2degrees
*(100)
r-Al2O3 * - ZnO
20 25 30 35 40 45 50 55 60 65 70
CuK
log
(Inte
nsity
), a.
u.2deg.
YSZ(111)
YSZ(222)
ZnO(002)
ZnO(101)
XRD θ-scans of ZnO films grown on r-Al2O3 and ZrO2(Y2O3) (111) substrates at 300 0C by water assisted MOSVD
No visible structure from ZnO in φ-scans
Polycrystalline films with chaotic orientation of crystallites
9
Surface morphology of undoped ZnO films grown by oxygen and water assisted MOCVD
rms 4.68 nm rms 40.78 nm
H2O assisted MOCVD O2 assisted MOCVD
AFM images of the surface of ZnO films grown on ZrO2(Y2O3) (111) substrates at 600 0C
Surface of ZnO films grown by water assisted MOCVD is smoother than by oxygen assisted MOCVD
10
Surface morphology of undoped ZnO films grown by water assisted MOCVD at different temperatures
SEM image ZnO film grown on R-Al2O3 at 300 0C
SEM image ZnO film grown on R-Al2O3 at 500 0C
11
M(H) at room temperature for the films deposited by water-assisted CVD onr-sapphire substrates at 300 °C (R_W_300) and at 500 °C (R_W_500).
Magnetic properties of undoped ZnO films grown by water assisted MOCVD at different temperatures
12
Resistivity of undoped ZnO films grown by oxygen assisted MOCVD
0 50 100 150 200 250 300 3501
10
100
1000
10000
100000
1000000
10000000
100000000
T, K
ρ, m
Ohm
cm
substrate R-Al2O
3
substrate C-Al2O
3
substrate MgAl2O
4 (111)
deposited at 500 0C
0 50 100 150 200 250 300 3501
10
100
1000
10000
100000
1000000
T, Kρ,
mO
hm c
m
substrate ZtO2(Y
2O
3)(111)
substrate R-Al2O
3
substrate C-Al2O
3
substrate MgAl2O
4(111)
deposited 600 0C
Lowest resistivity have the most ordered films grown on R-Al2O3 and ZrO2(Y2O3)(111) substrateHighest resistivity have the films with 2 different orientation of crystallites grown on MgAl2O4(111) substrates
13
Hopping conductivity in undoped ZnO films grown by oxygen assisted MOCVD
0.2 0.3 0.4 0.5 0.6 0.73
5
7
9
11
T-1/4, K-1/4
ln(r,
mO
hmc
m)
T0=260 K
T0=2500 K
substrate C-Al2O
3
deposited at 500 0C
substrate MgAl2O
4(111)
deposited at 600 0C
r=r[(T 0
T )1 /4]
Mott's law:
T 0≈21.2
k B r03 g (EF )
14
Resistivity of undoped ZnO films grown by water assisted MOCVD
50 100 150 200 250 300 3501
10
100
1000
10000
T, K
ρ, m
Ohm
cm
substrate R-Al2O
3
substrate ZrO2(Y
2O
3)(111)
deposition at 600 0C
0.22 0.24 0.26 0.28 0.3 0.32 0.34 0.363
4
5
6
7
8
9
T-1/4, K-1/4
ln(r,
mO
hm c
m)
substrate R-Al2O
3
substrate ZrO2(Y
2O
3)(111)
T0=207000 K
T0=899000 K
deposition temperature 600 0C
Variable range hopping conductivity in a wide temperature range
15
Magnetoresistance of undoped ZnO films grown by oxygen assisted MOCVD
0 1 2 3 4 5 6 7 8-0.07
-0.06
-0.05
-0.04
-0.03
-0.02
-0.01
0
0.01
B, T
Δρ/
ρ(0)
substrate R-Al2O
3
Dep. temp. 500 0C
substrate R-Al2O
3
Dep. temp. 600 0C
substrate MgAl2O
4(111)
Dep. temp. 600 0C
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8-0.030
-0.025
-0.020
-0.015
-0.010
-0.005
0.000
substrate R-Al2O
3
substrate ZrO2(Y
2O
3)(111)
deposition temperature 600 0C
B, TDr/
r(0)
16
ZnO:Ga films
2θ, degree
Inte
nsity
, a.u
.
X-ray data of ZnO:Ga films deposited at 600 0C on ZrO2(Y2O3)(111) substrate by oxygen assisted MOCVD: a) 1.7 at. % Ga; b) 3.6 at. % Ga.
Shift of ZnO peak positions correspond to increase of lattice constant with increase of Ga content
17
Resistivity of ZnO:Ga films grown by oxygen assisted MOCVD
ZnO:Ga on R-Al2O3 substrate ZnO:Ga on ZrO2(Y2O3)(111) substrate
Resistivity decreases first with an increase of Ga content
0 50 100 150 200 250 300 3500
5
10
15
20
25
30
35
T, K
ρ, m
Ohm
cm
0 at. % Ga
5 at. % Ga7.2 at. % Ga
0 50 100 150 200 250 300 3500
2
4
6
8
10
12
14
16
T, Kρ,
mO
hm c
m
0 at. % Ga
1.7 at. % Ga
6.8 at. % Ga
18
Magnetoresistance of ZnO:Ga films grown by oxygen assisted MOCVD
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9-0.030
-0.025
-0.020
-0.015
-0.010
-0.005
0.000
B, T
Dr/
r(0) 0 at. % Ga
5 at. % Ga
7.2 at. % Ga
substrate R-Al2O
3
0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9-0.030
-0.025
-0.020
-0.015
-0.010
-0.005
0.000
B, TDr
/r(0
)
0 at. % Ga
1.7 at. % Ga
6.8 at. % Ga
substrate ZrO2(Y
2O
3)(111)
19
Resistivity of ZnO:Ga films grown by water assisted MOCVD
0 50 100 150 200 250 300 3500.01
0.1
1
10
100
1000
Т, К
r, O
hm c
m
subsrate ZrO2(Y
2O
3)(111)
7 at. % Ga
subsrate ZrO2(Y
2O
3)(111)
25 at. % Ga
subsrate R-Al2O
3
21 at. % Ga
0.2 0.3 0.4 0.5 0.6 0.7-3-2-101234567
Т-1/4, К-1/4ln
(r, O
hm c
m
subsrate ZrO2(Y
2O
3)(111)
7 at. % Ga
subsrate ZrO2(Y
2O
3)(111)
25 at. % Ga
subsrate R-Al2O
3
21 at. % Ga
Variable range hopping conductivity in investigated temperature range
r=r[(T 0
T )1/ 4] T 0≈
21.2k B r0
3 g (EF )
20
Magnetoresistance of ZnO:Ga films grown by water assisted MOCVD
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.85.4955.5005.5055.5105.5155.5205.5255.5305.5355.5405.545
B, Т
r, O
hm m
substrate ZrO2(Y
2O
3)(111)
7 at % Ga
0 1 2 3 4 5 60.0500.0510.0520.0530.0540.0550.0560.0570.0580.0590.060
B, T
r, O
hm m
substrate R-Al2O
3
21 at. % Ga
Estimate of r0 and g(EF) from positive magnetoresistance and ρ(T)
Substrate Ga content, at. % r0, nm g(EF), 1019 cm-3eV-1
R-Al2O3 25 7 13
ZrO2(Y2O3)(111) 7 8 3.8
ZrO2(Y2O3)(111) 21 7 25
4/3
02
240
2
201650ln
TTBre=
ρBρ
21
ZnO:Co films deposited by oxygen assisted MOCVD
20 25 30 35 40 45 50 55 60 65 70
ZnO(002)
lg(In
tens
ity),
a.u.
2deg.
ZnO:Co (7,7 at. % Co)
c-Al2O3(006)
0 60 120 180 240 300
с-Al2O3
ZnO:Co (7,7 at. % Co)
Inte
nsity
, a.u
.
, deg.
Epitaxial films with oriention determined by substrate
22
Structure of ZnO:Co films deposited by water assisted MOCVD
20 25 30 35 40 45 50 55 60
ZnO(110)
ZnO(102)
ZnO(100)
ZnO(101)
Al2O3 (006)
ZnO(002)
lg (I
nten
sity
), a.
u.
grad.
ZnO:Co(1,5 at. % Co)
20 25 30 35 40 45 50 55 60
ZnO(102)
ZnO(110)
ZnO(100)
ZnO(101)
ZnO(002)
Al2O3 (006)
deg.
lg (I
nten
sity
), a.
u.
12,4 at. % Co
No peaks in φ-scans. Polycrystalline structure with chaotic orientation of crystallites.
23
EXAFS (extended X ray absorption fine structure ) spectra and Co state in ZnO:Co films
Cobalt substitutes Zn up to 33 at. % content
EXAFS-спектроскопия — новый метод исследования вещества, позволяющий определять структурные параметры ближнего окружения атомов с выбранным Z, спектры которых изучаются. Среди этих параметров — межатомные расстояния, координационные числа, амплитуды тепловых колебаний. Существование дальнего порядка в исследуемых образцах не требуется. В зависимости от применяемой методики получения спектров можно анализировать ближнее окружение атомов, расположенных либо в объеме образца, либо на его поверхности.
24
Magnetic properties of ZnO:Co film
-1 ,0 -0 ,5 0,0 0,5 1,0-1,5
-1,0
-0,5
0,0
0,5
1,0
1,5
Zn0.937
Co0.063
O
M, 1
0-12 (A
. m2 )
B (T)
Zn0.985
Co0.015
O
25
Magnetoresistance of ZnO:Co films
0 1 2 3 4 5 6
0 .0 4
0 .0 6
0 .0 8
8 .0 x1 0-4
1 .0 x1 0-32 .5 x1 0-4
2 .5 x1 0-4
2 .6 x1 0-4
2 .6 x1 0-4
rО
мм
B (Т л)
Zn0.937
C o0.063
O
Zn 0.985C o 0.015O
ZnO
B, T
ρ, O
hm c
m
0 1 2 3 4 5 6 70
0.050.1
0.150.2
0.250.3
0.350.4
0.450.5
B,T
Dr/
r(0)
oxygen assisted MOCVD1.5 at. % Co
water assisted MOCVD1.9 at. % Co
substrate R-Al2O
3
Value of positive magnetoresistance increases with an increase of Co content
Value of positive magnetoresistance is larger for the films grown by oxygen assisted MOCVD
Possible origin of positive magnetoresistance: reduction of the density of states at Fermi energy in magnetic field
26
In2O3
Two inequivalent positions of In cations
27
Кубическая структура типа биксбита пространственной группы
3Ia.
3Ia
Band structure of In2O3
28
Band structure of In2O3Brillouin zone of In2O3
Investigated In2O3:Sn filmsDeposition method: magnetron sputtering
Targets: 1) Oxide target (baked In2O3 and SnO2 9:1); 2) metal target In-Sn alloySubstrate: glass
Target Deposition temperature, 0C Film thickness
oxide RT 80oxide 230 80oxide 230 75
Valence band XPS spectra of In2O3:Sn films
Bandgap states in films deposited from metal target
29
X-ray phoemission data about O state in In2O3:Sn films High resolution O 1s spectra acquired after slight sputtering using low energy (500 eV) Ar+
30
XPS spectra of In and Sn states in In2O3:Sn films High resolution In 3d XPS spectra of ITO films deposited at different conditions
High resolution Sn 3d XPS spectra of ITO filmsdeposited at different conditions
Estimate of the film composition determined from XPS data
Target Deposition temperature In content, at. % Sn content, at. % O content, at. %
oxide RT 47.41 3.65 0.96oxide 230 0C 47.66 3.50 0.95metal 230 0C 47.93 4.04 0.92
31
Resistivity of In2O3:Sn films deposited from oxide target
0 50 100 150 200 250 3000
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
deposited at RT
deposited at 230 0C
deposited at 230 0C 30 min H plasma
deposited at 230 0C 5 min in H plasma
T, K
r, m
Ohm
. cm
The conductivity of the films deposited at 230 0C is higher than the conductivity of the films deposited at room temperature. This correlates with the better
crystallinity of the film deposited at 230 0CTreatment in H plasma leads to the increase of conductivity. The Effect is larger
for 5 min treatment than for 30 min treatment 32
Magnetoresisitance of In2O3:Sn films deposited from oxide target
-5 -4 -3 -2 -1 0 10
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5
ln(B, T)
Δσ s/G
0
deposited at RTL
= 230 nm
deposited at 230 0CL
= 360 nm
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1-0.0040
-0.0035
-0.0030
-0.0025
-0.0020
-0.0015
-0.0010
-0.0005
0.0000
B, T
Dr/r
(0) deposited at 230 0C
deposited at RT
Negative magnetoresistance is explained by weak localization theory
D σ2D
G0≈−ln(4 L
l B )−1.96 l B=√ e B
33
Resistivity and magnetoresistance of In2O3:Sn films deposited from metal target in oxygen deficit conditions
2D variable range hopping conductivity. Large localization length r0>35 nm. Negative magnetoresistance could be caused by increase of localization length in magnetic field
34
Summary- Electron mobility in ZnO and In2O3:Sn films correlates with degree of crystallinity: the better is the crystallinity the larger is the electron mobility.
- Electron transport in highly crystalline ZnO, ZnO:Ga and films is bandlike.
- Electron transport in polycrystalline ZnO, ZnO:Ga films and oxygen deficient In2O3:Sn films is hopping.
- Electron concentration in ZnO:Ga films is essentially smaller than concentration of Ga atoms.
- Electron transport in ZnO:Co films is hopping at low temperatures.
-Increase of Co content in ZnO films leads to increase of paramagnetic susceptibility and large positive magnetoresistance at low temperatures. This magnetoresistance could be explained by Zeemann splitting of electronic energy levels in magnetic filed.
- Conductivity of In2O3:Sn films deposited from oxide target is larger than conductivity of ZnO:Ga films grown by oxygen assisted MOCVD due to larger electron concentration.
-The increase of substrate temperature from RT to 230 °C leads to essential increase of the electron mobility and film conductivity. 35