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    Accepted Manuscript

    Title: MEMS Microphones with Narrow SensitivityDistribution

    Author: S. Walser C. Siegel M. Winter G. Feiertag M. Loibl

    A. Leidl

    PII: S0924-4247(16)30196-0

    DOI:   http://dx.doi.org/doi:10.1016/j.sna.2016.04.051

    Reference: SNA 9635

    To appear in:   Sensors and Actuators A

    Received date: 30-11-2015

    Revised date: 8-4-2016

    Accepted date: 22-4-2016

    Please cite this article as: S.Walser, C.Siegel, M.Winter, G.Feiertag, M.Loibl, A.Leidl,

    MEMS Microphones with Narrow Sensitivity Distribution, Sensors and Actuators: A

    Physical http://dx.doi.org/10.1016/j.sna.2016.04.051

    This is a PDF  file of an unedited manuscript that has been accepted for publication.

    As a service to our customers we are providing this early version of the manuscript.

    The manuscript will undergo copyediting, typesetting, and review of the resulting proof before it is published in its  final form. Please note that during the production process

    errors may be discovered which could affect the content, and all legal disclaimers that

    apply to the journal pertain.

    http://dx.doi.org/doi:10.1016/j.sna.2016.04.051http://dx.doi.org/10.1016/j.sna.2016.04.051http://dx.doi.org/10.1016/j.sna.2016.04.051http://dx.doi.org/doi:10.1016/j.sna.2016.04.051

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    MEMS Microphones with Narrow Sensitivity Distribution

    S. Walser a* , C. Siegel b, M. Winter  b, G. Feiertaga, M. Loibla, A. Leidl b

    aMunich University of Applied Sciences, Munich, Germany bEPCOS AG a TDK group company, Munich, Germany

    * Corresponding author: Sebastian Walser, Email: [email protected], Tel: +49 089 54020 3160

    mailto:[email protected]:[email protected]

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    Abstract

    This paper presents a method for calibrating MEMS microphones after the fabrication process. This allows compensating process

    tolerances and packaging stress of the capacitive membrane-backplate system. A programmable MEMS microphone with

    variable bias voltage and variable gain was developed and fabricated. The sensitivity of this microphone can be adjusted within a

    range of 11 dB. The adjustability was used to trim the sensitivity towards a specified value and to reduce the variation of the

    sensitivity. In mass production a tight sensitivity of ±1 dB could be reached, for a specified sensitivity of -38 dBV/Pa @ 1 kHz.

    In addition the microphone signal to noise ratio was increased to values above 66 dB(A) by choosing high bias voltages and

    matching gain calibration. The relationship between bias supply voltage and the non-linear dynamics of a double backplate

    sensor is explained. The influence of programming on the sensitivity, noise, SNR, THD and frequency response was investigated.

    Keywords: MEMS, microphone, OTP, programming, high SNR, sensitivity, distribution

    1. 

    Introduction

    Today microelectromechanical systems (MEMS) are commonly used as sensors in electronic consumer products,

     because of the accurately controlled silicon micromachining technology. MEMS microphones, which convert an

    acoustic signal into an electrical signal, reach a high degree of miniaturization [1]. In the last decades electret

    condenser microphones (ECM) have been replaced more and more by silicon MEMS microphones, because of theirdurable and reliable performance characteristics at high temperatures or high humidity [2]. For consumer audio

    applications, e.g. mobile phone communication, silicon MEMS microphones have become state of the art [3]. High

    signal to noise ratios (SNR) of approximately 66 dB(A), sensitivities of -38 dBV/Pa and component sizes of

    approximately 3.5 x 2.5 x 1.0 mm3 are state of the art [4, 5].

    In addition to the continuous reduction in size, a new demand of the market is a narrow distribution of the

    sensitivities down to ±1 dB or beyond for analogue MEMS microphones [6]. The reasons for this demand are new

    audio signal processing applications like noise canceling. For noise canceling it is necessary to have microphones

    with similar electroacoustic characteristics assembled within one mobile phone [7].

    Sensitivity variations are caused by tolerances in the front-end processing of the sensor chip [8] and the

    application-specific integrated circuit (ASIC). Another source of variations is packaging stress on the sensor chip [9,

    10]. All these influences lead to wide sensitivity variation of MEMS microphones. An example of a measuredsensitivity distribution of MEMS microphones is given in [6]. A sensitivity span of 4 dB was measured. In case of a

    specified sensitivity tolerance of ±1 dB, this would result in low production yield.

    The simplest way to reach the specified sensitivity tolerances is to select the microphone modules after their

    fabrication. This can be done by production test results. A significant drawback of this method would be a low yield.

    Another possibility to reduce the sensitivity variations is to pair suitable ASIC and sensor chips. This pairing could

    reduce the sensitivity variations by compensating both chip tolerances. A drawback of pairing is that variations

    resulting from assembly cannot be compensated. An in situ way to reduce the variations by tuning is described in

    [11]. There the acoustic sensitivity tuning was done by using silver metallic electrodeposited nanostructures on the

    membrane. This technique offers a step toward reducing sensitivity tolerances after fabrication with the drawback of

    a low tuning range of 0.6 dB and the need of an additional external power source for growing mechanism.

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      Sensors and Actuators A 3 

    Another way to compensate the tolerances by trimming after completing the fabrication of the microphone

    modules is described in [6] and discussed more detailed in this paper. This method also allows compensating the

    variations caused by packaging stress. The principle and the benefits of programming are shown. For experimental

    characterization a new programmable, capacitive MEMS microphone has been developed. In addition to tight

    sensitivity specifications, high signal to noise ratios are also required. By using an appropriate programming

    algorithm, it is possible to produce microphones with tight sensitivity deviations and high SNR.

    2. Programmable MEMS microphones

    Condenser silicon MEMS microphones consist in most cases of two chips, a sensor and an ASIC chip, which are

     both integrated in a surface-mount device (SMD) package. During the last few years, two main packaging variants

    have been applied for bottom port MEMS microphones [12]. An example for a wire-bonding-type package is given

    in [13]. An example for a flip-chip package is given in [14].

    The sensor chip converts the incoming acoustic wave into a capacitive change. The ASIC chip transforms the

    capacitive into an electrical voltage. During the last few years a trend towards sensor chips with two backplates and

    a membrane in between, has become apparent [14, 15, and 16]. The main benefit in comparison to a single-

     backplate transducer is the differential output signal. This leads to a 6 dB higher sensitivity. The noise of two

    identical transducers is normally distributed and uncorrelated [2]. This results in a 3 dB(A) higher noise level of the

    double-backplate system in comparison to a single-backplate system [2]. As a result, this leads to a 3 dB(A) higherSNR in comparison to a single-backplate transducer [2]. For high performance recording the SNR is the most

    relevant parameter of a microphone. A detailed theoretical description of differential microphones with two

     perforated backplates and a membrane in between was published by Martin et al. [17 and 18].

    2.1.  Programmable interface

    The development of programmable microphones started around 2007 [19]. Figure 1 shows the schematic of the

    novel condenser MEMS microphone with a programmable interface for adjusting the acoustic microphone

    characteristics.

    For calibrating, a new non-volatile one-time-programmable (OTP) memory is integrated in the ASIC. The

     principle of the OTP memory is based on a very high cell resistance, which decreases significantly after programming and allows a single write [20]. The advantage of this technology is that an OTP logic can be integrated

    in a CMOS process technology without additional process steps or masking layers [20].

    A constant preload of the capacitive membrane-backplate system is provided by a programmable bias voltage

    generator module, for example by a charge pump. In case of a sound pressure, the oscillating membrane causes a

    differential capacitive change between the membrane and the rigid perforated backplates. Transformed into an

    electrical signal it is transmitted via a programmable amplifier stage to the differential microphone outputs. The

    output stage adapts the impedance and gain of the microphone output signal.

    For the programming sequence an external clock and a communication path are necessary. Disadvantages of

     programmable microphones are larger ASIC chip sizes and longer test times. The size of a programmable ASIC is

    larger, because of the additional area of the OTP module and the digital interface.

    With the OTP memory, it is possible to program the bias supply of the membrane-backplate system and the gainof the amplifier. Four bits of the memory cell are reserved for adjusting the amplifiers. The amplifier is designed

    with a programmable range of 7.5 dB. The amplifier is linear, so the sensitivity can be adjusted without changing the

    other acoustical microphone parameters. Five bits of the memory cell are reserved for adjusting the bias supply

    voltage. The choice of the bias working area depends on the sensor design. For a better understanding figure 2

    shows the membrane displacement over the bias voltage supply and the forces acting on the membrane for an

    incoming sound pressure.

    The membrane deflection x and the resulting forces are caused by incoming sound pressure. The mechanical

    force Fmech is described by a simplified linear spring model. In case of a double backplate system a capacitive

     preload voltage V bias causes two electrostatic forces Fel1 and Fel2.

    At the pull-in point, the deflection of the membrane has reached a value where the electrostatic attraction of one

     backplate is larger than the forces, which act in the other direction. For a system with only one backplate this point

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    is roughly reached at x = 2/3 · x0. [21, 22] For a double backplate system, this point is somewhat higher due to the

    second electrostatic force (Fel2). In literature [16] this benefit is given with a 30% higher bias field than for a single-

    ended sensor. The non-linearity of the system is small as long as the membrane deflection is far from the pull-in

     point. By increasing the bias voltage the pull-in point moves to lower sound pressure levels. In fact a pull-in can be

    reached even with a double backplate system by increasing bias voltage alone in case of an unstable balance point.

    Increasing bias supply voltage results in an increase in sensitivity. With bias voltages close to the pull-in point the

    system becomes non-linear. The drawback of this is an increase in the total harmonic distortions (THD). Some

    detailed investigations about the non-linear dynamics of double backplate capacitive MEMS microphones can also be found in [23]. So the adjustable bias supply voltage should be chosen within the easier to control linear area.

    Therefore, the bias supply was designed with a programmable range of 2.4 V and an upper corner of 12.3 V.

    2.2.  Fabrication of the programmable MEMS microphone

    For this research, a differential sensor chip is used. The sensor chip has a size of 1.45 x 1.45 x 0.45 mm3. A

     picture of this sensor chip is shown in figure 3.

    The differential sensor chip consists of two perforated backplates with a membrane in between. The diameter of

    the membrane and backplates is 1.2 mm. The membrane is coated with an anti-stiction layer and has a thickness ofaround 0.4 μm. The backplates have a thickness of 3 μm. The gap distance between backplate and membrane is

    around 2 μm. The venthole is necessary for the pressure exchange between frontvolume and backvolume.

    The package of the new programmable MEMS microphone is based on a flip-chip bottom port MEMS

    microphone package technology, which was presented in [5]. The microphone with a package size of

    3.35 x 2.5 x 1.0 mm3 consists of two chips, the sensor and the ASIC chip. The programmable ASIC chip has a size

    of 1.45 x 1.00 x 0.20 mm3. Figure 3a shows a sectional view of the fabricated programmable microphone. The

    sensor chip is flip-chip bonded on a ceramic substrate above its sound hole as shown in figure 4b. The separation of

    frontvolume and backvolume is done by a polymer foil as shown in figure 4c. The package is closed by a metal lid

    as shown in figure 4d. The package combines advantages of a small front-volume to avoid resonances in the

    acoustic frequency range and a large back-volume to increase the SNR. The detailed MEMS microphone fabrication

     process and the advantages of the package are explained in more detail in [5] and [24].

    3. Measurement results

    All measurements were carried out in an acoustic pressure chamber, calibrated to 1 Pa by a reference

    microphone. For some measurements, a trial mode in the ASIC design was used. This mode allows multiple

     programming, by using a volatile memory for debugging applications.

    3.1. Characterization of the programmable microphone

    To achieve the goal of a small sensitivity variation after MEMS microphone fabrication, the programmable

    interface is used. As explained in section 2.1, the microphone sensitivity can be adjusted by setting the gain factor of

    the amplifier and the bias supply voltage of the capacitive sensor.

    The amplifier with variable gain is part of the output stage of the ASIC. As long as the output stage does not

    contribute to non-linearity the signal and its harmonics are amplified linearly. This results in a simple linear shift of

    the sensitivity with a slope factor of 1.0 dBV/dB as shown in figure 5a. The noise floor has a slope factor of

    0.9 dBV/dB as shown in figure 5b. As a result, an increase in the SNR with increasing gain was measured as shown

    in figure 5c. The measured amplification of the noise is smaller than the amplification of the signal because of the

    self-noise of the amplifier output stage and the self-noise of the analog measurement input stage. As a consequence,

    the gain has no relevant influence the SNR.

    The THD influence is shown in figure 5d for a measured sound pressure level (SPL) of 110 dBSPL. Depending

    on the amplifier design the THD increases significantly for gain factors above 5 dB. The reason for this is clipping

    of the output signal of the microphone. Figure 5e shows the influence of the gain factor on the frequency response.

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      Sensors and Actuators A 5 

    Increasing the gain factor results in a linear shift to higher sensitivities, without changing the frequency response. A

    detailed view of the frequency response of flip-chip MEMS microphone packages is given in [5] and [24].

    However, adjusting the bias voltage changes the operating point of the MEMS sensor and thus has an influence

    on the overall performance including SNR and THD. Programming bias results in a linear shift of the sensitivity as

    shown in figure 5f, as well as of the noise floor as shown in figure 5g. For this sensor design, the sensitivity reacts to

    a change of the bias voltage with a slope of 1.5 dBV/V. The microphone noise floor is caused by different sources,

    in general the noise of the sensor, the noise of the ASIC and noise caused by the package. The noise reacts to achange of the bias voltage with a slope of 1.0 dBV/V.

    The different sensitivity and noise slopes result in a large influence of the bias voltage on the SNR as shown in

    figure 5h. With a slope of 0.5 dBV/V the SNR can be modified by the bias voltage. The drawback of high bias

    voltages is the THD increase shown in figure 5i. Higher bias voltages shift the sensor operating point closer to the

     pull-in point. The non-linear sensor behavior in this region leads to higher THD. Figure 5j shows the influence of

    the bias factor on the frequency response. Increasing the bias voltage results in a linear shift to higher sensitivities,

    without changing the frequency response.

    3.2.  Narrow sensitivity distribution

    Figure 6 shows the sensitivity distribution of one production lot directly after fabrication. The sensitivities weremeasured in the production end test. The mean value of the sensitivities is -38 dBV/Pa; the span has a value of

    3.4 dB. The standard deviation is 0.57 dB. With a specified sensitivity tolerance of ±1 dB the yield would be below

    90% for a well-centered process.

    To achieve the goal of reducing the sensitivity variation after MEMS microphone fabrication, the programmable

    interface is applied. By using 5 bits for bias and 4 bits for gain adjustment, a sensitivity calibration matrix follows

    for all possible programming combinations. Figure 7 shows the measured sensitivity for all possible gain and bias

    combinations measured for one programmable microphone. With the designed step sizes, the calibration matrix has

    a wide sensitivity range of 10.8 dBV. The gain adjustment for rough sensitivity approximation is shown in the

    sixteen steps between the different diagonal bias lines. The bias adjustment for precise sensitivity setting is shown in

    the diagonal lines with a step count of 32.

    The programming is done after completion of the fabrication process within a production test. First, ameasurement characterizes the sensitivity after fabrication and determines the calibration settings with regard to the

    required sensitivity specifications, e.g. -38 dBV/Pa. In the next step, the microphone is calibrated by gain and bias

    factors. After the programming sequence a complete electroacoustic production test is done. Figure 8 shows the

    sensitivity distribution, of the same production lot as in figure 6, before and after programming.

    The standard deviation of 0.57 dB before programming was reduced to a standard deviation of 0.06 dB by

     programming. With this value, all sensitivities are well within ±1 dB specification limits. The reason for the

    remaining variation after programming is that the sensitivity change caused by a bias shift is not well determined.

    The change depends on MEMS sensor parameters, like thickness, stress, membrane diameter and the distance

     between membrane and backplate.

    An even narrower sensitivity deviation could be reached by a precisely characterized bias slope factor. One

    solution for this problem could be the characterization of the bias slope factor for each individual microphone deviceand adapting these parameters to the calibration algorithm. The drawback of this characterization is a longer test

    time. Around 100 ms are necessary for a single programming cycle in the production test. Two power-ups for

     programming and for the normal modus and the first sensitivity measurement are included in this time. For a

    characterization of bias slope two additional measurements would be necessary. Additional 100 ms would be

    required for this characterization. For a specified sensitivity tolerance of ±1 dB, a calibration without individual bias

    slope characterization is sufficient.

    A further advantage of microphone calibration is that improvements of other electroacoustic microphone

     parameters, e.g. SNR are possible. By choosing the optimal bias and gain combination, the microphone SNR can be

    improved. Figure 9 shows SNR and sensitivity for all different settings of bias and gain for one microphone.

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    Compared to figure 8 the graph is more scattered due to the statistic character of a short noise measurement.

    High bias voltages lead to high SNR because the influence of the bias voltage on the sensitivity is higher than the

    influence on the noise. Therefore, by using a high bias voltage and a matching gain calibration the microphone can

     be trimmed to a high SNR. For a specified sensitivity of -38 dBV/PA a high SNR of up to 66.5 dB(A) was reached.

    Figure 10 shows the distribution of the SNRs measured at one hundred microphones. Both groups were

     programmed to a specified mean sensitivity of -38 dBV/Pa. After normal programming, the mean SNR was

    66.1 dB(A). With an optimized algorithm, a mean SNR of 66.4 dB(A) was achieved.

    4. Results and Discussion

    The calibration method for microphones after fabrication presented in this paper can be used to compensate

     process tolerances and packaging stress. The new programmable MEMS microphone uses an OTP module

    integrated in the ASIC to program the bias supply voltage and the gain factor. Trimming bias and gain results in a

     parallel shift of the frequency response. By using the optimal bias and gain combination a sensitivity adjustment

    with a wide range of approximately 11 dBV is can be achieved.

    The programming method allows compensating the sensitivity variations caused by process tolerances of the

    fabrication processes. Specification limits of ±1 dB can be fulfilled with a high production yield. In addition, MEMS

    microphones can be calibrated towards a higher SNR. High SNR above 66 dB(A) could be reached in mass production. High bias supply voltages shift the microphones closer towards the nonlinear region. Therefore, a

    drawback of programming towards high SNR are higher total harmonic distortions.

    An even narrower sensitivity deviation would be possible if the influence of the bias setting on the sensitivity was

    characterized for each single device. This would, of course, result in longer testing times.

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      Sensors and Actuators A 7 

    Literature

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    Germany, May 04, 2009, vol. 7362.

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    [23] J. Liu, Nonlinear Dynamics of a Dual-Backplate Capacitive MEMS Microphone, Dissertation, 2007, University of Florida, USA.[24] M. Winter, G. Feiertag, A. Leidl, H. Seidl, Influence of a chip scale package on the frequency response of a MEMS microphone,

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    M. Sc. Sebastian Walser

    Sebastian Walser received his diploma degree in electrical and information technology in 2011

    and his M.Sc. degree in electrical engineering in 2013 from the University of Applied Sciences

    Munich. Since 2013 he is with the University of Applied Sciences Munich and is working in a

    research project, called “twinMikro”, in cooperation with the EPCOS AG and the Fraunhofer

    IIS. Since 2014 he is also a Ph.D. student of the “Universität der Bundeswehr München”. His

    research interests include MEMS microphones, MEMS packaging, acoustic modeling.

    Dr. Christian Siegel

    Christian Siegel received his diploma degree in electrical engineering from the Technical

    University of Munich and his Ph.D. degree from the University of Ulm. His Ph.D. research wason the development of a new reliable RF-MEMS technology in cooperation with the EADS. He

    is currently working in the product development and engineering for MEMS microphones at

    EPCOS AG.

    Dr. Matthias Winter

    Matthias Winter received his diploma degree in physics in 2006 from the Technical University

    of Munich and his Ph.D. degree in 2011 from the University of Saarland. His Ph.D. research

    was on a new MEMS microphone chip-scale package in cooperation with the EPCOS AG. He

    is currently working in the product development and engineering for MEMS microphones at

    EPCOS AG.

    Prof. Dr. Gregor Feiertag

    Gregor Feiertag investigated the precision of the structure transfer of x-ray lithography at theInstitute for Micro Technology in Mainz (IMM) as part of his Ph.D. research work. From 1999

    to 2009 he developed packaging technologies for Surface Acoustic Wave Components (SAW),

    MEMS microphones and pressure sensors at EPCOS in Munich. He is now at the Munich

    University of Applied Sciences as a professor for electronic packaging and sensors in the

    department of electrical engineering. His main research subject is packaging of sensors and

    SAW-components.

    B. Eng. Michael Loibl

    Michael Loibl received his B.Eng. degree in electrical and information technology from the

    University of Applied Sciences Munich. Since 2013 he is with the University of Applied

    Sciences Munich and is working in a research project, called “twinMikro”, in cooperation withthe EPCOS AG and the Fraunhofer IIS.

    Dr. Anton Leidl

    Anton Leidl received his diploma degree in physics in 1992 from the Technical University in

    Munich and his Ph.D. degree in Electrical Engineering from the 'Universität der Bundeswehr'

    in 1998. From 1993 till 2000 he was responsible for the team 'Sensors for Liquids' at the

    Fraunhofer Insitute for Solid State Technology. Since 2001 Dr. Leidl is with EPCOS AG,

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      Sensors and Actuators A 9 

    Munich and is heading the Business Unit ‘MEMS Microphones and Pressure Sensors’ since 2010. 

    Fig. 1: Schematic of a programmable differential capacitive MEMS microphone: As transducer, a double-backplate sensor chip is used. By

     programming the one-time-programmable (OTP) module in the ASIC the gain and the bias voltage can be adjusted. Five bits are reserved for bias

    and four bits for gain setting.

    membrane

     backplate

    Sensor ASIC

    OUT+

    MEMS microphone

     backplateamplifier 

    Bias voltage

    generator 

    5-bits   4-bits

    4-bits

    OUT-

    VDD

    GND

    CLK 

    DATA

    amplifier 

    one-time-programmable

    (OTP) memory

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    Fig. 2: Top left: Illustration of a double backplate sensor with the membrane deflection x, the mechanical force Fmech and the two electrical forces

    Fel1 and Fel2 in case of a sound pressure. Lower graph: Membrane displacement as a function of the bias voltage for a constant sound pressure is.

       M  e  m   b  r  a  n  e   d   i  s  p   l  a  c  e  m  e  n   t

    Bias voltage supply0

    Membrane

    BP2

    BP1

    sound

     pressure

    2·x0

    0

    x0Fel2

    Fel1

    x

    Fmech

     backvolume

    V bias

    V bias

    non-linear 

    increasing

    to pull-in

    Fel2 ≈ ε·A· (V bias)2 / (2·(2x0 – x)

    2)

    Fel1 ≈ - ε·A· (V bias)2 / (2·x2)

    Fmech ≈ k membrane · (x0 – x)

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      Sensors and Actuators A 11 

    Fig. 3: Left: Double-backplate sensor chip with a size of 1.45 x 1.45 mm2; Bottom right: Backplate with perforation; Top right: Backplate with

    venthole for pressure exchange between frontvolume and backvolume.

    venthole

     backplate

    Sensor chip

    1.45 mm

       1 .   4

       5  m  m

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    Fig. 4: Sectional view of: a) Complete fabricated microphone [5]; b) Sensor chip flip-chip process; c) Separation of front- and back-volume by

     polymer foil lamination process; d) Closure of the microphone back-volume by a metal lid.

    Sensor Chip ASIC Chip

    Solder Balls

    Backplate

    Backplate

    Membrane

    Sound Hole

    Metal Cap

    Polymer Foil

    Ceramic Substrate

    (HTTC)

    Adhesive

    a)

    b) c) d)

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      Sensors and Actuators A 13 

    Fig. 5: Measured influence of programming on the electroacoustic microphone characteristics: a) Sensitivity as a function of the gain factor; b)

     Noise as a function of the gain factor; c) SNR as a function of the gain factor; d) THD as a function of the gain factor; e) frequency response for

    max and min gain factors; f) Sensitivity as a function of the bias voltage; g) Noise as a function of the bias voltage; h) SNR as a function of the

     bias voltage; i) THD as a function of the bias voltage; e) frequency response for max and min bias voltage.

    y = 1.0121x - 43.392

    y = 1.0093x - 39.525

    -45-43

    -41

    -39

    -37

    -35

    -33

    -31

       S  e

      n  s   i   t   i  v   i   t  y   /   d   B   V   /   P  a

    Minimum bias voltage Maximum bias voltagea)

    y = 1.6231x - 59.504

    y = 1.5877x - 51.48

    -45-43

    -41

    -39

    -37

    -35

    -33

    -31

       S  e

      n  s   i   t   i  v   i   t  y   /   d   B   V   /   P  a

    Minimum gain factor Maximum gain factor f)

    y = 0.9188x - 108.18

    y = 0.9792x - 105.78

    -110

    -108

    -106

    -104

    -102

    -100

    -98

    -96

       N  o   i  s  e   /   d   B   V   (   A   )

    b)

    y = 1.0116x - 118.19

    y = 1.1472x - 112.61

    -110

    -108

    -106

    -104

    -102

    -100

    -98

    -96

       N  o   i  s  e   /   d   B   V   (   A   )

    g)

    y = 0.0931x + 64.792

    y = 0.0299x + 66.257

    64.5

    65.0

    65.5

    66.0

    66.5

    67.0

       S   N   R   /   d   B   (   A   )

    c)

    y = 0.6119x + 58.686

    y = 0.4409x + 61.124

    64.5

    65.0

    65.5

    66.0

    66.5

    67.0

       S   N   R   /   d   B   (   A   )

    h)

    0.00

    0.05

    0.10

    0.15

    0.20

    0.25

    0.30

    0 2 4 6 8   T   H   D   @    1

       1   0

       d   B   S   P   L   /   %

    Programmed gain factor / dB

    d)amplifier influence

    y = 0.0258x - 0.2055

    y = 0.0454x - 0.3121

    0.00

    0.05

    0.10

    0.15

    0.20

    0.25

    0.30

    9.5 10.0 10.5 11.0 11.5 12.0 12.5   T   H   D   @    1

       1   0

       d   B   S   P   L

       /   %

    Programmed bias voltage / V

    i)

    -46-44

    -42

    -40

    -38

    -36

    -34

    -32

    100 1000 10000

       S  e  n  s   i   t   i  v   i   t  y   /   d   B   V   /   P  a

    Frequency / Hz

    e)

    shift

    ▲ Minimum gain factor 

    ■ Maximum gain factor 

    -46-44

    -42

    -40

    -38

    -36

    -34

    -32

    100 1000 10000

       S  e  n

      s   i   t   i  v   i   t  y   /   d   B   V   /   P  a

    Frequency / Hz

     j)

    shift

    ■ Maximum bias voltage

    ▲ Minimum bias voltage

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    Fig. 6: Measured sensitivity distribution of one MEMS microphone production lot after fabrication: For a designed mean sensitivity value of -

    38 dBV/Pa a standard deviation of 0.57 dB was reached. For a specified sensitivity tolerance of ±1 dB, the yield would be below 90 %.

    0

    20

    40

    60

    80

    100

      -   4   0 .   0

      -   3   9 .   8

      -   3   9 .   6

      -   3   9 .   4

      -   3   9 .   2

      -   3   9 .   0

      -   3   8 .   8

      -   3   8 .   6

      -   3   8 .   4

      -   3   8 .   2

      -   3   8 .   0

      -   3   7 .   8

      -   3   7 .   6

      -   3   7 .   4

      -   3   7 .   2

      -   3   7 .   0

      -   3   6 .   8

      -   3   6 .   6

      -   3   6 .   4

      -   3   6 .   2

      -   3   6 .   0

       N  u  m   b  e  r  o   f  m  e  a  s  u  r  e   d

      m   i  c  r  o  p   h  o  n  e  s

    Sensitivity (@ 1kHz) / dBV/Pa

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      Sensors and Actuators A 15 

    Fig. 7: Sensitivity for all gain and bias combinations, exemplarily measured at one microphone device: gain adjustment shown in 16 steps

     between the 32 different diagonal bias lines.

    -44

    -42

    -40

    -38

    -36

    -34

    -32

    -30

       S  e  n  s   i   t   i  v   i   t  y   (   @    1   k

       H  z   )   /   d   B   V   /   P  a

    Different programmed settings

    all prog. values MIN gain MIN bias MAX bias MAX gain

    gain steps

     bias ↑

    gain ↑

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    Fig. 8. Sensitivity distribution of one production lot after fabrication (“before programming”) and after trimming (“after programming”): The

    standard deviation of the sensitivity was reduced from 0.57 dB to 0.06 dB by programming.

    0

    20

    40

    60

    80

    100

    120

    140

    160

    180

      -   4   0 .   0

      -   3   9 .   8

      -   3   9 .   6

      -   3   9 .   4

      -   3   9 .   2

      -   3   9 .   0

      -   3   8 .   8

      -   3   8 .   6

      -   3   8 .   4

      -   3   8 .   2

      -   3   8 .   0

      -   3   7 .   8

      -   3   7 .   6

      -   3   7 .   4

      -   3   7 .   2

      -   3   7 .   0

      -   3   6 .   8

      -   3   6 .   6

      -   3   6 .   4

      -   3   6 .   2

      -   3   6 .   0

       N  u  m   b  e  r  o   f  m  e  a  s  u  r  e   d  m   i  c  r  o  p   h  o  n  e  s

    Sensitivity (@ 1kHz) / dBV/Pa

     before programming (standard deviation = 0.57 dB) after programming (standard deviation = 0.06 dB)

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      Sensors and Actuators A 17 

    Fig. 9. SNR and sensitivity for all different settings of bias and gain for one microphone: By increasing bias voltages the SNR increases

    significantly, Gain can be used for programming sensitivity without significant influence on SNR.

    64.5

    65.0

    65.5

    66.0

    66.5

    67.0

    -44 -42 -40 -38 -36 -34 -32 -30

       S   N   R   /   d   B   (   A   )

    Sensitivity (@ 1kHz) / dBV/Pa

    min GAIN max GAIN min BIAS max BIAS

    high SNR 

    for a specified

    sensitivity

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     Fig. 10. SNR distribution of one hundred microphones programmed to a mean sensitivity of -38 dBV: with an optimized algorithm, the SNR was

    trimmed to a higher mean SNR value of 66.4 dB(A).

    0

    5

    10

    15

    20

    25

    65.5 65.6 65.7 65.8 65.9 66.0 66.1 66.2 66.3 66.4 66.5 66.6 66.7 66.8 66.9 67.0

       N  u  m   b  e  r  o   f  m  e  a  s  u  r  e   d  m   i  c  r  o

      p   h  o  n  e  s  a  m  p   l  e  s

    Signal to noise ratio / dB(A)

    Prog. (-38dBV) Prog. (-38dBV and high SNR)