ΗΛΕΚΡΟΝΙΚΗ ΜΙΚΡΟΣΚΟΠΙΑ
DESCRIPTION
ΗΛΕΚΡΟΝΙΚΗ ΜΙΚΡΟΣΚΟΠΙΑTRANSCRIPT
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.
FORTH / IESL / TCM
@ Vassilios Binas
Crete Center for Quantum Complexity and
Nanotechnology
Department of Physics, University of Crete
Transparent Conductive Materials (Head prof. G. Kiriakidis)
Institute of Electronic Structure & Laser IESL
Foundation for Research and Technology - FORTH
Post Doc Researcher, Chemist
, Email: [email protected]
Thl. 1269
-
~ 1700
1942
Scanning Electron Microscopy (SEM)
1931
Transmition Electron Microscopy (TEM)
1981
Scanning Tunneling Microscopy (STM)
1986
Atomic Force Microscopy (AFM)
FORTH / IESL / TCM
@ Vassilios Binas
ATOMIC FORCE MICROSCOPY (AFM)
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Scanning Tunneling Microscopy (STM)
Atomic Force Microscopy (AFM)
3
AFM
1.000.000
FORTH / IESL / TCM
@ Vassilios Binas
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SCANNING PROBE MICROSCOPY (SPM)
Scanning Tunneling Microscope (STM)
Atomic Force Microscope (AFM)
, -277 FORTH / IESL / TCM @ Vassilios Binas
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STM
AFM
LFM
.
MFM
4.
5.
1.
2.
3.
SPM
SCANNING PROBE MICROSCOPY (SPM)
, -277 FORTH / IESL / TCM @ Vassilios Binas
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, -277 FORTH / IESL / TCM @ Vassilios Binas
SCANNING PROBE MICROSCOPY (SPM)
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SCANNING PROBE MICROSCOPY (SPM)
, -277 FORTH / IESL / TCM @ Vassilios Binas
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STM AFM
, -277 FORTH / IESL / TCM @ Vassilios Binas
SCANNING PROBE MICROSCOPY (SPM)
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SCANNING TUNNELING MICROSCOPY (STM)
STM
Source: http://mrsec.wisc.edu/Edetc/modules/MiddleSchool/SPM/MappingtheUnknown.pdf
- electron tunneling current
, -277 FORTH / IESL / TCM @ Vassilios Binas
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SCANNING TUNNELING MICROSCOPY (STM)
Source: http://mrsec.wisc.edu/Edetc/modules/MiddleSchool/SPM/MappingtheUnknown.pdf
Tunneling current
STM
, -277 FORTH / IESL / TCM @ Vassilios Binas
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SCANNING TUNNELING MICROSCOPY (STM)
Source: http://www.chem.qmw.ac.uk/surfaces/scc/scat7_6.htm
x 106
x 108
x 108
e-
, -277 FORTH / IESL / TCM @ Vassilios Binas
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SCANNING TUNNELING MICROSCOPY (STM)
, -277 FORTH / IESL / TCM @ Vassilios Binas
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SCANNING TUNNELING MICROSCOPY (STM)
Source: http://www.chem.qmw.ac.uk/surfaces/scc/scat7_6.htm
(Vibrational interference) ( )
& ( )
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
1. Laser
2. (cantilever)
3.
4.
5.
6. Scanner with sample
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
19
Contact mode
Non Contact mode
Lateral Force Microscopy
Tapping mode
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
20
Contact mode
Non Contact mode
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
&
Van der Waals
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
25-300m
10-30 m
0.5-3 m
Si Si3N4
(. )
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
( )
( )
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
Laser &
.
laser
(
)
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
Laser &
.
z.
?
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
;
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
.
.
x,y
.
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
.
( ).
.
.
.
10 ~ 100 64 ~ 512 points/line
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
1)
2)
3)
4)
5) DVD
6)
7)
..
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
1)
Carbon
Nanotubes GaAs
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
2)
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
3)
AFM
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
4)
.
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
5) DVD
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
6)
35 , -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
7)
, , , ,
DNA
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
, -277 FORTH / IESL / TCM @ Vassilios Binas
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38
SO WHAT DO WE SEE?
Sources: http://www.almaden.ibm.com/vis/stm/blue.html
http://www.asylumresearch.com/ImageGallery/Mat/Mat.shtml#M7
Nickel from an STM ZnO from an AFM
, -277 FORTH / IESL / TCM @ Vassilios Binas
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39
Xenon atoms
Carbon monoxide molecules
Source: http://www.almaden.ibm.com/vis/stm/atomo.html
AND WHAT CAN WE
DO?
Using STMs and AFMs in Nanoscience
Allows atom by atom (or clumps of atoms by clumps of atoms) manipulation as shown by the images below
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
(.. )
( )
, -277 FORTH / IESL / TCM @ Vassilios Binas
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ATOMIC FORCE MICROSCOPY (AFM)
(mm x mm)
( )
. .