ΗΛΕΚΡΟΝΙΚΗ ΜΙΚΡΟΣΚΟΠΙΑ

41
ΗΛΕΚΤΡΟΝΙΚΗ ΜΙΚΡΟΣΚΟΠΙΑ ΔΡ. ΒΑΣΙΛΕΙΟΣ ΜΠΙΝΑΣ FORTH / IESL / TCM @ Vassilios Binas Crete Center for Quantum Complexity and Nanotechnology Department of Physics, University of Crete Transparent Conductive Materials (Head prof. G. Kiriakidis) Institute of Electronic Structure & Laser IESL Foundation for Research and Technology - FORTH Post Doc Researcher, Chemist Τμήμα Φυσικής, Πανεπιστήμιο Κρήτης Email: [email protected] Thl. 1269

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ΗΛΕΚΡΟΝΙΚΗ ΜΙΚΡΟΣΚΟΠΙΑ

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  • .

    FORTH / IESL / TCM

    @ Vassilios Binas

    Crete Center for Quantum Complexity and

    Nanotechnology

    Department of Physics, University of Crete

    Transparent Conductive Materials (Head prof. G. Kiriakidis)

    Institute of Electronic Structure & Laser IESL

    Foundation for Research and Technology - FORTH

    Post Doc Researcher, Chemist

    , Email: [email protected]

    Thl. 1269

  • ~ 1700

    1942

    Scanning Electron Microscopy (SEM)

    1931

    Transmition Electron Microscopy (TEM)

    1981

    Scanning Tunneling Microscopy (STM)

    1986

    Atomic Force Microscopy (AFM)

    FORTH / IESL / TCM

    @ Vassilios Binas

    ATOMIC FORCE MICROSCOPY (AFM)

  • Scanning Tunneling Microscopy (STM)

    Atomic Force Microscopy (AFM)

    3

    AFM

    1.000.000

    FORTH / IESL / TCM

    @ Vassilios Binas

  • SCANNING PROBE MICROSCOPY (SPM)

    Scanning Tunneling Microscope (STM)

    Atomic Force Microscope (AFM)

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • STM

    AFM

    LFM

    .

    MFM

    4.

    5.

    1.

    2.

    3.

    SPM

    SCANNING PROBE MICROSCOPY (SPM)

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • , -277 FORTH / IESL / TCM @ Vassilios Binas

    SCANNING PROBE MICROSCOPY (SPM)

  • SCANNING PROBE MICROSCOPY (SPM)

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • STM AFM

    , -277 FORTH / IESL / TCM @ Vassilios Binas

    SCANNING PROBE MICROSCOPY (SPM)

  • SCANNING TUNNELING MICROSCOPY (STM)

    STM

    Source: http://mrsec.wisc.edu/Edetc/modules/MiddleSchool/SPM/MappingtheUnknown.pdf

    - electron tunneling current

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • SCANNING TUNNELING MICROSCOPY (STM)

    Source: http://mrsec.wisc.edu/Edetc/modules/MiddleSchool/SPM/MappingtheUnknown.pdf

    Tunneling current

    STM

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • SCANNING TUNNELING MICROSCOPY (STM)

    Source: http://www.chem.qmw.ac.uk/surfaces/scc/scat7_6.htm

    x 106

    x 108

    x 108

    e-

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • SCANNING TUNNELING MICROSCOPY (STM)

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • SCANNING TUNNELING MICROSCOPY (STM)

    Source: http://www.chem.qmw.ac.uk/surfaces/scc/scat7_6.htm

    (Vibrational interference) ( )

    & ( )

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    1. Laser

    2. (cantilever)

    3.

    4.

    5.

    6. Scanner with sample

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    19

    Contact mode

    Non Contact mode

    Lateral Force Microscopy

    Tapping mode

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    20

    Contact mode

    Non Contact mode

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    &

    Van der Waals

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    25-300m

    10-30 m

    0.5-3 m

    Si Si3N4

    (. )

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    ( )

    ( )

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    Laser &

    .

    laser

    (

    )

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    Laser &

    .

    z.

    ?

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    ;

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    .

    .

    x,y

    .

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    .

    ( ).

    .

    .

    .

    10 ~ 100 64 ~ 512 points/line

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    1)

    2)

    3)

    4)

    5) DVD

    6)

    7)

    ..

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    1)

    Carbon

    Nanotubes GaAs

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    2)

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    3)

    AFM

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    4)

    .

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    5) DVD

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    6)

    35 , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    7)

    , , , ,

    DNA

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • 38

    SO WHAT DO WE SEE?

    Sources: http://www.almaden.ibm.com/vis/stm/blue.html

    http://www.asylumresearch.com/ImageGallery/Mat/Mat.shtml#M7

    Nickel from an STM ZnO from an AFM

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • 39

    Xenon atoms

    Carbon monoxide molecules

    Source: http://www.almaden.ibm.com/vis/stm/atomo.html

    AND WHAT CAN WE

    DO?

    Using STMs and AFMs in Nanoscience

    Allows atom by atom (or clumps of atoms by clumps of atoms) manipulation as shown by the images below

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    (.. )

    ( )

    , -277 FORTH / IESL / TCM @ Vassilios Binas

  • ATOMIC FORCE MICROSCOPY (AFM)

    (mm x mm)

    ( )

    . .