03ch075e rpt-泓格 i-7560, i-7561, i-7563

Report No： 03CH075E

Page:1 of 54 Version:1.0

Test Report

Product Name ： ICPCON CPU with Converter

Model No. ： I-7560, I-7561, I-7563, I-7513, I-7551, I-7017R, I-7017C,

I-7018R, SG-3071, SG-3081, PW-3090-24S,

PW-3090-12S, PW-3090-5S, PW-3090-5D, PW-3090-15D,

I-7188E3D-232, I-7188E5D-485, I-7188E3-232,

I-7188E5-485, NS-108

Applicant ： ICP DAS CO., LTD. Address ：No. 111, Kuangfu N. Rd., Hukou Shiang, Hsinchu, Taiwan

303, R.O.C.

Date of Receipt ： 2003/12/23 Date of Test ： 2003/12/23 Report No. ： 03CH075E

The test results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

Declaration of Conformity

The following products is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). The listed standard as below were applied: The following Equipment:

Product : ICPCON CPU with Converter Trade Name : ICP DAS Model Number : I-7560, I-7561, I-7563, I-7513, I-7551, I-7017R, I-7017C, I-7018R,

SG-3071, SG-3081, PW-3090-24S, PW-3090-12S, PW-3090-5S, PW-3090-5D, PW-3090-15D, I-7188E3D-232, I-7188E5D-485, I-7188E3-232, I-7188E5-485, NS-108

This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC).For the evaluation regarding EMC, the following standards were applied:

RFI Emission:

EN55022: 1998+A1:2000 Class A : Emission standard

EN 61000-3-2: 2000 Class A

: Limits for harmonic current emission

EN 61000-3-3:1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system

Immunity :

EN 55024:1998+A1: 2001 : Immunity standard

The following importer/manufacturer is responsible for this declaration: Company Name :

Company Address :

Telephone : Facsimile :

Person is responsible for marking this declaration:

Name (Full Name) Position/ Title

Date Legal Signature

QuieTek Corporation / No.75-1, Wang-Yeh Valley, Yung-Hsing, Chiung-Lin, Hsin-Chu County, Taiwan, R.O.C. Tel: 886-3-5928858, Fax: 886-3-5928859, E-mail: [email protected]

Date: Dec. 24, 2003 QTK No.: 03CH075E

S t a t e m e n t o f C o n f o r m i t y

The certifies that the following designated product

Product : ICPCON CPU with Converter

Trade name : ICP DAS

Model Number : I-7560, I-7561, I-7563, I-7513, I-7551, I-7017R, I-7017C, I-7018R, SG-3071, SG-3081, PW-3090-24S, PW-3090-12S, PW-3090-5S, PW-3090-5D, PW-3090-15D, I-7188E3D-232, I-7188E5D-485, I-7188E3-232, I-7188E5-485, NS-108

Company Name : ICP DAS CO., LTD.

This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC).For the evaluation regarding EMC, the following standards were applied:

RFI Emission:

EN55022: 1998+A1: 2000 Class B : Emission standard

EN 61000-3-2: 2000 Class A

: Limits for harmonic current emission

EN 61000-3-3:1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system

Immunity :

EN 55024:1998+A1: 2001 : Immunity standard

TEST LABORATORY

Kevin Wang / Vice President

The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo.

EMC/Safety Test Laboratory Accredited by DNV, TUV, Nemko and NVLAP



Test Repor t Cer t i f icat ion Test Date : 2003/12/23 Report No. : 03CH075E

Product Name ： ICPCON CPU with Converter Applicant ： ICP DAS CO., LTD. Address ： No. 111, Kuangfu N. Rd., Hukou Shiang, Hsinchu, Taiwan 303,

R.O.C. Manufacturer ： ICP DAS CO., LTD. Model No. ： I-7560, I-7561, I-7563, I-7513, I-7551, I-7017R, I-7017C, I-7018R,


Rated Voltage : AC 230 V / 50 Hz Trade Name ： ICP DAS Measurement Standard ： EN 55022:1998+A1:2000

EN 61000-3-2:2000,EN61000-3-3:1995+A1:2001, EN55024:1998+A1:2001

Measurement Procedure ： EN 55022:1998+A1:2000, EN 61000-3-2:2000, EN 61000-3-3:1995+A1:2001, IEC 61000-4-2:1995, IEC 61000-4-3:1995, IEC 61000-4-4:1995, IEC 61000-4-5:1995, IEC 61000-4-6:1996, IEC 61000-4-8:1993, IEC 61000-4-11:1994

Classification ： A Test Result ： Complied

The test results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

Documented By ：

( J o y c e L i n )

Tested By ：

( M a t e T s e n g )

Approved By ：

( K e v i n W a n g )

Accredited by TUV, DNV, Nemko and NIST (NVLAP)



TABLE OF CONTENTS Description Page 1. General Information........................................................................................................6 1.1. EUT Description ................................................................................................................ 6 1.2. Test Mode.......................................................................................................................... 7 1.3. Tested System Details ...................................................................................................... 7 1.4. Configuration of tested System ........................................................................................ 8 1.5. EUT Exercise Software..................................................................................................... 8 1.6. Test Facility ....................................................................................................................... 9 2. Conducted Emission .................................................................................................... 11 2.1. Test Equipment ................................................................................................................11 2.2. Test Setup ........................................................................................................................11 2.3. Limits ............................................................................................................................... 12 2.4. Test Procedure................................................................................................................ 12 2.5. Test Specification ............................................................................................................ 12 2.6. Test Result ...................................................................................................................... 13 3. Radiated Emission........................................................................................................14 3.1. Test Equipment ............................................................................................................... 14 3.2. Test Setup ....................................................................................................................... 14 3.3. Limits ............................................................................................................................... 15 3.4. Test Procedure................................................................................................................ 15 3.5. Test Specification ............................................................................................................ 15 3.6. Test Result ...................................................................................................................... 16 3.7. Test Photo ....................................................................................................................... 18 4. Power Harmonics..........................................................................................................19 4.1. Test Equipment ............................................................................................................... 19 4.2. Test Setup ....................................................................................................................... 19 4.3. Limits ............................................................................................................................... 20 4.4. Test Procedure................................................................................................................ 21 4.5. Test Specification ............................................................................................................ 21 4.6. Test Result ...................................................................................................................... 22 5. Voltage Fluctuation and Flicker...................................................................................23 5.1. Test Equipment ............................................................................................................... 23 5.2. Test Setup ....................................................................................................................... 23 5.3. Limits ............................................................................................................................... 24 5.4. Test Procedure................................................................................................................ 24 5.5. Test Specification ............................................................................................................ 24 5.6. Test Result ...................................................................................................................... 25 6. Electrostatic Discharge (ESD).....................................................................................26 6.1. Test Equipment ............................................................................................................... 26 6.2. Test Setup ....................................................................................................................... 26 6.3. Limits ............................................................................................................................... 27 6.4. Test Procedure................................................................................................................ 27 6.5. Test Specification ............................................................................................................ 27 6.6. Test Result ...................................................................................................................... 28 6.7. Test Photo ....................................................................................................................... 29



7. Radiated Susceptibility (RS)........................................................................................30 7.1. Test Equipment ............................................................................................................... 30 7.2. Test Setup ....................................................................................................................... 30 7.3. Limits ............................................................................................................................... 31 7.4. Test Procedure................................................................................................................ 31 7.5. Test Specification ............................................................................................................ 31 7.6. Test Result ...................................................................................................................... 32 7.7. Test Photo ....................................................................................................................... 33 8. Electrical Fast Transient/Burst (EFT/B)......................................................................34 8.1. Test Equipment ............................................................................................................... 34 8.2. Test Setup ....................................................................................................................... 34 8.3. Limits ............................................................................................................................... 35 8.4. Test Procedure................................................................................................................ 35 8.5. Test Specification ............................................................................................................ 35 8.6. Test Result ...................................................................................................................... 36 8.7. Test Photo ....................................................................................................................... 37 9. Surge ..............................................................................................................................38 9.1. Test Equipment ............................................................................................................... 38 9.2. Test Setup ....................................................................................................................... 38 9.3. Limits ............................................................................................................................... 39 9.4. Test Procedure................................................................................................................ 39 9.5. Test Specification ............................................................................................................ 39 9.6. Test Result ...................................................................................................................... 40 9.7. Test Photo ....................................................................................................................... 41 10. Conducted Susceptibility (CS)....................................................................................42 10.1. Test Equipment ............................................................................................................... 42 10.2. Test Setup ....................................................................................................................... 42 10.3. Limits ............................................................................................................................... 43 10.4. Test Procedure................................................................................................................ 43 10.5. Test Specification ............................................................................................................ 43 10.6. Test Result ...................................................................................................................... 44 10.7. Test Photo ....................................................................................................................... 45 11. Power Frequency Magnetic Field................................................................................46 11.1. Test Equipment ............................................................................................................... 46 11.2. Test Setup ....................................................................................................................... 46 11.3. Limits ............................................................................................................................... 47 11.4. Test Procedure................................................................................................................ 47 11.5. Test Specification ............................................................................................................ 47 11.6. Test Result ...................................................................................................................... 48 11.7. Test Photo ....................................................................................................................... 49 12. Voltage Dips and Interruption......................................................................................50 12.1. Test Equipment ............................................................................................................... 50 12.2. Test Setup ....................................................................................................................... 50 12.3. Limits ............................................................................................................................... 51 12.4. Test Procedure................................................................................................................ 51 12.5. Test Specification ............................................................................................................ 51 12.6. Test Result ...................................................................................................................... 52



Attachement ............................................................................................................................................ 53 �� EUT Photograph ............................................................................................................. 53

Reference : Laboratory of License



1. General Information

1.1. EUT Description

Product Name ICPCON CPU with Converter Trade Name ICP DAS Model No. I-7560, I-7561, I-7563, I-7513, I-7551, I-7017R, I-7017C, I-7018R,


EUT Voltage AC 230 V / 50 Hz

Component USB Cable Shielded, 1.2m, a ferrite core bonded. LAN Cable Non-Shielded, 1.4m, a ferrite core bonded.

Note:

1. Regarding to the different construction of the EUT, the model number were shown in the table as

following:

Model NO. Description

I-7560 USB to RS-232 Converter

I-7561 USB to RS-232/422/485 Converter

I-7563 USB to 3-channel RS-485 Converter Hub

I-7513 Three-way Isolated RS-485 to 3 port RS-485 Hub

I-7551 Isolated RS-232 to RS-232 Converter

I-7017R 8-channel Analog Input Module (Robust version)

I-7017C 8-channel Current input Module

I-7018R 8-channel Analog Input Module (Robust version)

I-7188E3-232 I-7188E3D-232 without LED display

I-7188E3D-232 Internet communication controller with two RS-232, one RS-485 and one Ethernet

I-7188E5-485 I-7188E5D-485 without LED display

I-7188E5D-485 Internet Communication Controller with one RS-232 , four RS-485 and one Ethernet

SG-3071 Isolated DC Voltage Input, Voltage / Current Output Module

SG-3081 Isolated DC Current Input, Voltage / Current Output Module

PW-3090-24S Isolated Power Supply Module, Output Power Voltage +24V



PW-3090-15D Isolated Power Supply Module, Output Power Voltage ±15V

PW-3090-5D Isolated Power Supply Module, Output Power Voltage ±5V

NS-108 Industrial Ethernet Switch Hub



1.2. Test Mode

QuieTek has verified the construction and function in typical operation. All the test modes were

carried out with the EUT in normal operation, which was shown in this test report and defined

as:

Pre-Test Mode

EMC Normal operation

Final Test Mode

EMI Normal operation

EMS Normal operation

1.3. Tested System Details

The types for all equipments, plus descriptions of all cables used in the tested system

(including inserted cards) are:

Test Mode Normal operation Product Manufacturer Model No. Serial No. Power Cord

1 PC COMPAQ PD1100 SG30801006 Non-Shielded, 1.8m

2 Monitor VIEWSNOIC VCDT21490-1P ER01502850 Non-Shielded, 1.8m

3 Keyboard ACER 6311-TW4C/6 N/A --

4 Mouse HP M-S69 FbAB70S5B0S2SSK --

5 Printer HP C2642A MY75L1D2XN Non-Shielded, 0.7m

6 Modem ACEEX DM-1414 980033034 Non-Shielded, 1.6m

7 Microphone & Earphone

TOKTO SX-MI N/A --

8 Earphone KOKA CD-1200 N/A --

9 STEREO COMPACT DISC PLAYER

MIZDA CD-11 N/A --

10 Portable Hard DISK

FUJITSU MMA2200VB R129Y19003JC Non-Shielded, 1.8m


Top Disk Enterprise Me-910 217974 --









1.4. Configuration of tested System

Test Mode Normal operation

Connection Diagram

Monitor(2)

STEREOCOMPACT DISC

PLAYER(9)

Keyboard(3)

PC(1)

Earphon(8)

EUT Printer(5)

PortableHard DISK

(10)

PortableHard DISK

(11)

PortableHard DISK

(12)

PortableHard DISK

(13)

PortableHard DISK

(14)

Mouse(4)

Modem(6)

Microphone& Earphone

(7)

A

B

C

DE

GH

I F

II

I I

JK

Signal Cable Type Signal cable Description

A VGA Cable Shielded, 1.6m, with one ferrite core bonded B Keyboard Cable Shielded, 1.8m C Mouse Cable Shielded, 1.8m D Printer Cable Shielded, 1.2m E Modem Cable Shielded, 1.5m F Earphone & Microphone Cable Non-Shielded, 1.2m G Earphone & Microphone Cable Non-Shielded, 1.2m H Walkman Cable Non-Shielded, 1.6m I USB Hard Disk Cable Shielded, 1.2m, five PCS. J LAN Cable Non-Shielded, 1.4m, with one ferrite core bonded K USB Cable Shielded, 1.2m, with one ferrite core bonded

1.5. EUT Exercise Software

Test Mode Normal operation 1 Setup the EUT and simulators as shown on 1.3. 2 Turn on the power of all equipment. 3 Boot the PC from Hard Disk. 4 Data will be communicated between computer and EUT. 5 The personal computer monitors’ will show the transmitting and receiving

characteristics when the communication is success. 6 Repeat the above procedure (4) to (5).



1.6. Test Facility

Ambient conditions in the laboratory:

Items Test Item Required (IEC 68-1) Actual

Temperature (°C) EN55022 CE 15 - 35

Humidity (%RH) 25 - 75

Barometric pressure (mbar) 860 - 1060 950-1000

Temperature (°C) EN55022 ISN 15 - 35


Barometric pressure (mbar) 860 - 1060

Temperature (°C) EN55022 RE 15 - 35 22

Humidity (%RH) 25 - 75 48


Temperature (°C) EN61000-3-2 15 - 35



Temperature (°C) EN61000-3-3 15 - 35



Temperature (°C) IEC61000-4-11 15 - 35



Temperature (°C) IEC61000-4-2 15 - 35 20



Temperature (°C) IEC 61000-4-3 15 - 35 20

















Site Description:

September 30, 2003 Accreditation on NVLAP

NVLAP Lab Code: 200347-0

February 23, 1999 Accreditation on DNV

Statement No. : 413-99-LAB11

January 04, 1999 Accreditation on TUV Rheinland

Certificate No.: I9865712-9901

October 08, 2003 Accreditation on Nemko

Certificate No.: ELA 165

Site Name: Quietek Corporation

Site Address: No.75-1, Wang-Yeh Valley, Yung-Hsing,

Chiung-Lin, Hsin-Chu County,

Taiwan, R.O.C.

TEL : 886-3-5928858 / FAX : 886-3-5928859 E-Mail : [email protected]



2. Conducted Emission

2.1. Test Equipment

The following test equipment are used during the test:

Item Equipment Manufacturer Model No. / Serial No. Last Cal. Remark

1 Test Receiver R & S ESCS 30/825442/018 Sep.,2003

2 Artificial Mains Network R & S ENV4200/848411/10 Feb.,2003 Peripherals

3 LISN R & S ESH3-Z5/825562/002 Feb.,2003 EUT

4 Pulse Limiter R & S ESH3-Z2/357.8810.52 Feb.,2003

5 No.2 Shielded Room N/A

Note: All equipment upon which need to calibrated are with calibration period of 1 year.

2.2. Test Setup



2.3. Limits

EN 55022 Limits (dBuV)

Class A Class B Frequency

MHz QP AV QP AV

0.15 - 0.50 79 66 66-56 56-46

0.50-5.0 73 60 56 46

5.0 - 30 73 60 60 50

Remarks : In the above table, the tighter limit applies at the band edges.

2.4. Test Procedure

The EUT and simulators are connected to the main power through a line impedance

stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the

measuring equipment. The peripheral devices are also connected to the main power

through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination.

(Please refers to the block diagram of the test setup and photographs.)

Both sides of A.C. line are checked for maximum conducted interference. In order to find

the maximum emission, the relative positions of equipment and all of the interface cables

must be changed according to EN 55022: 1998+A1: 2000 on conducted measurement.

Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz

using a receiver bandwidth of 9kHz.

2.5. Test Specification

According to EN 55022: 1998+A1: 2000



2.6. Test Result

Product ICPCON CPU with Converter Test Mode Normal operation Date of Test 2003/12/23 Test Site SR2 Test Condition Line1 Test Range 0.15~30MHz

Owing to the DC operation of EUT, this test item is not performed.



3. Radiated Emission

3.1. Test Equipment

The following test equipment are used during the test:

Item Equipment Manufacturer Model No. / Serial No. Last Cal.

1 X Test Receiver R & S ESCS 30 / 836858/023 Jan.,2003

2 X Spectrum Analyzer Advantest R3261C / 81720471 N/A

3 X Pre-Amplifier QuieTek QTK-AMP / AMP1 N/A

4 X Bilog Antenna Chase CBL6112B / 2708 Sep.,2003

5 No.2 OATS Sep.,2003

Note: 1. All equipments that need to calibrate are with calibration period of 1 year. 2. Mark “X” test instruments are used to measure the final test results.

3.2. Test Setup



3.3. Limits

EN 55022 Limits (dBuV/m)

Class A Class B Frequency

MHz Distance

(m) dBuV/m Distance

(m) dBuV/m

30 – 230 10 40 10 30

230 – 1000 10 47 10 37

Remark: 1. The tighter limit shall apply at the edge between two frequency bands.

2. Distance refers to the distance in meters between the measuring

instrument antenna and the closed point of any part of the device or

system.

3. RF Voltage (dBuV/m) = 20 log RF Voltage (uV/m)

3.4. Test Procedure

The EUT and its simulators are placed on a turn table which is 0.8 meter above ground.

The turn table can rotate 360 degrees to determine the position of the maximum emission

level. The EUT was positioned such that the distance from antenna to the EUT was 10

meters.

The antenna can move up and down between 1 meter and 4 meters to find out the

maximum emission level.

All cable leaving the table-top EUT for a connection outsidethe test site (for example, mains

cable, telephone lines, connections to auxiliary equipment located outside the test area) shall

be fitted with ferrite clamps placed on the floor at the point where the cable reached the floor.

Both horizontal and vertical polarization of the antenna are set on measurement. In order

to find the maximum emission, all of the interface cables must be manipulated according

to EN 55022: 1998+A1: 2000 on radiated measurement.

Radiated emissions were invested over the frequency range from 30MHz to1GHz using a

receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of

10 meters.


According to EN 55022: 1998+A1: 2000



3.6. Test Result

Product ICPCON CPU with Converter Test Mode Normal operation Date of Test 2003/12/23 Test Site Site2 Test Condition Horizontal Test Range 30~1000MHz

Frequency Cable Probe PreAMP Reading Emission Margin Limit

Loss Factor Level Level

MHz dB dB/m dB dBuV dBuV/m dB dBuV/m

==========================================================

Horizontal:

43.325 1.28 11.49 0.00 7.00 19.77 20.23 40.00

66.000 1.50 6.16 0.00 11.78 19.44 20.56 40.00

125.000 2.07 11.84 0.00 9.99 23.90 16.10 40.00

200.025 2.78 9.30 0.00 9.99 22.07 17.93 40.00

250.025 3.27 12.61 0.00 9.42 25.30 21.70 47.00

360.025 4.07 14.70 0.00 4.16 22.93 24.07 47.00

* 500.045 4.79 17.34 0.00 10.15 32.28 14.72 47.00

625.045 5.44 19.30 0.00 3.54 28.29 18.71 47.00

Note:

1. All Reading Levels are Quasi-Peak value.

2. “ * ”, means this data is the worst emission level.

3. Emission Level = Reading Level + Probe Factor + Cable Loss.



Product ICPCON CPU with Converter Test Mode Normal operation Date of Test 2003/12/23 Test Site Site2 Test Condition Vertical Test Range 30~1000MHz

Frequency Cable Probe PreAMP Reading Emission Margin Limit

Loss Factor Level Level

MHz dB dB/m dB dBuV dBuV/m dB dBuV/m

==========================================================

Vertical:

35.050 1.20 14.68 0.00 15.58 31.45 8.55 40.00

45.050 1.30 9.96 0.00 16.84 28.10 11.90 40.00

76.000 1.59 7.23 0.00 16.57 25.39 14.61 40.00

123.900 2.06 11.39 0.00 17.63 31.08 8.92 40.00

* 200.025 2.78 9.07 0.00 21.72 33.58 6.42 40.00

250.025 3.27 12.26 0.00 10.04 25.57 21.43 47.00

360.025 4.07 15.48 0.00 6.50 26.04 20.96 47.00

500.025 4.79 17.14 0.00 6.63 28.56 18.44 47.00

625.050 5.44 18.50 0.00 3.76 27.71 19.29 47.00

Note:

1. All Reading Levels are Quasi-Peak value.

2. “ * ”, means this data is the worst emission level.

3. Emission Level = Reading Level + Probe Factor + Cable Loss.



3.7. Test Photo

Test Mode ： Normal operation Description： Front View of Radiated Test

Test Mode ： Normal operation Description： Back View of Radiated Test



4. Power Harmonics

4.1. Test Equipment

The following test equipment are used during the test: Item Equipment Manufacturer Model No. / Serial No. Last Cal.

1 Power Frequency Test System HAEFELY PHF-555 / 080 419-29 Apr.,2003



4.2. Test Setup



4.3. Limits

ØLimits of Class A Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current

A

Harmonics Order

n


A

Odd harmonics Even harmonics

3 2.30 2 1.08

5 1.14 4 0.43

7 0.77 6 0.30

9 0.40 8 ≤ n ≤ 40 0.23 * 8/n

11 0.33

13 0.21

15 ≤ n ≤ 39 0.15 * 15/n

ØLimits of Class B Harmonics Currents

For Class B equipment, the harmonic of the input current shall not exceed the maximum

permissible values given in table that is the limit of Class A multiplied by a factor of 1.5.

ØLimits of Class C Harmonics Currents

Harmonics Order n

Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency

％

2 2

3 30．?＊

5 10

7 7

9 5

11 ≤ n ≤ 39

(odd harmonics only) 3

＊? is the circuit power factor



ØLimits of Class D Harmonics Currents

Harmonics Order n

Maximum Permissible harmonic current per watt

mA/W


A

3 3.4 2.30

5 1.9 1.14

7 1.0 0.77

9 0.5 0.40

11 0.35 0.33

11 ≤ n ≤ 39

(odd harmonics only) 3.85/n See limit of Class A

4.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same

normal voltage and frequency as the rated supply voltage and the equipment under test.

And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be

performed.


According to EN 61000-3-2: 2000



4.6. Test Result

Product ICPCON CPU with Converter Test Mode Normal operation Date of Test 2003/12/23 Test Site SR1 Test Condition Power Harmonics Test Range




5. Voltage Fluctuation and Flicker

5.1. Test Equipment


1 Power Frequency Test System HAEFELY PHF-555 / 080 419-29 Apr.,2003



5.2. Test Setup



5.3. Limits

The following limits apply:

－ the value of Pst shall not be greater than 1.0;

－ the value of P1t shall not be greater than 0.65;

－ the value of d(t) during a voltage change shall not exceed 3.3 ％ for more than 500 ms;

－ the relative steady-state voltage change, dc, shall not exceed 3.3 ％;

－ the maximum relative voltage change, dmax, shall not exceed;

a) 4 ％ without additional conditions;

b) 6 ％ for equipment which is:

－ switched manually, or

－ switched automatically more frequently than twice per day, and also has either a

delayed restart (the delay being not less than a few tens of seconds), or manual restart,

after a power supply interruption.

NOTE The cycling frequency will be further limited by the Pst and P1t limit. For example: a dmax

of 6％producing a rectangular voltage change characteristic twice per hour will give a

P1t of about 0.65.

c) 7 ％ for equipment which is:

－ attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment

such as mixers, garden equipment such as lawn mowers, portable tools such as electric

drills), or

－ switched on automatically, or is intended to be switched on manually, no more than

twice per day, and also has either a delayed restart (the delay being not less than a few

tens of seconds) or manual restart, after a power supply interruption.

Pst and P1t requirements shall not be applied to voltage changes caused by manual

switching.

5.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same

normal voltage and frequency as the rated supply voltage and the equipment under test.

And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be

performed.


According to EN 61000-3-3:1995+A1:2001



5.6. Test Result

Product ICPCON CPU with Converter Test Mode Normal operation Date of Test 2003/12/23 Test Site SR1 Test Condition Flicker Test Range




6. Electrostatic Discharge (ESD)

6.1. Test Equipment


1 EM TEST EM UCS 500-M / UCS500M4 Jan.,2003

2 Electrostatic Discharge EM P18 / 1198-34 Jan.,2003

3 Horizontal Coupling Plane(HCP)

QuieTek HCP AL50 N/A

4 Vertical Coupling Plane(VCP)

QuieTek VCP AL50 N/A



6.2. Test Setup



6.3. Limits

Item Environmental Phenomena Units Test Specification Performance Criteria

Enclosure Port

Electrostatic Discharge kV(Charge Voltage) ±8 Air Discharge

±4 Contact Discharge

B

6.4. Test Procedure

Direct application of discharges to the EUT:

Contact discharge was applied only to conductive surfaces of the EUT.

Air discharges were applied only to non-conductive surfaces of the EUT.

During the test, it was performed with single discharges. For the single discharge

time between successive single discharges will be keep longer 1 second. It was at

least ten single discharges with positive and negative at the same selected point.

The selected point, which was performed with electrostatic discharge, was marked

on the red label of the EUT.

Indirect application of discharges to the EUT:

Vertical Coupling Plane (VCP):

The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned

at a distance 0.1m from, the EUT, with the Discharge Electrode touching the

coupling plane.

The four faces of the EUT will be performed with electrostatic discharge. It was at


Horizontal Coupling Plane (HCP):

The coupling plane is placed under to the EUT. The generator shall be positioned

vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching

the coupling plane.

The four faces of the EUT will be performed with electrostatic discharge. It was at



According to IEC 61000-4-2: 1995



6.6. Test Result

Product ICPCON CPU with Converter Test Mode Normal operation Date of Test 2003/12/23 Test Site SR1 Test Condition ESD Test Range

Item Amount of

Discharge Voltage

Required

Criteria

Complied To

Criteria (A,B,C) Results

Air Discharge 10

10

+8kV

-8kV

B

B

A

A

Pass

Pass

Contact Discharge 10

10

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(HCP)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Front)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Left)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Back)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Right)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

NR: No Requirement

Meet criteria A: Operate as intended during and after the test

Meet criteria B: Operate as intended after the test

Meet criteria C: Loss/Error of function

Additional Information

EUT stopped operation and could / could not be reset by operator at kV.

No false alarms or other malfunctions were observed during or after the test.

Remark:

The Contact discharges were applied-at least total 200 discharges at a minimum of four test points.



6.7. Test Photo

Test Mode ： Normal operation Description： ESD Test Setup



7. Radiated Susceptibility (RS)

7.1. Test Equipment


1 Signal Generator R & S SYM02 / 825454/029 Jan.,2003

2 Power Amplifier A & R 100W10000M7 / A285000010

N/A

3 RF Power Amplifier OPHIRRF 5022F / 1075 N/A

4 Bilog Antenna Chase CBL6112B / 2452 Sep.,2003

5 Power Meter R & S NRVD / 100219 Sep.,2003

6 Directional Coupler A & R DC6180 / 22735 Feb.,2003

7 No.4 EMC Fully Chamber Jul.,2003


7.2. Test Setup



7.3. Limits


Enclosure Port Radio-Frequency

Electromagnetic Field

Amplitude Modulated

MHz

V/m(Un-modulated, rms)

% AM (1kHz)

80-1000

3

80

A

7.4. Test Procedure

The EUT and load, which are placed on a table that is 0.8 meter above ground, are

placed with one coincident with the calibration plane such that the distance from antenna

to the EUT was 3 meters.

Both horizontal and vertical polarization of the antenna and four sides of the EUT are set

on measurement.

In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.

All the scanning conditions are as follows:

Condition of Test Remarks

1. Field Strength 3 V/m Level 2

2. Radiated Signal AM 80% Modulated with 1kHz

3. Scanning Frequency 80MHz - 1000MHz

4 Dwell Time 3 Seconds

5. Frequency step size ∆ f : 1%

6. The rate of Swept of Frequency 1.5 x 10-3 decades/s





7.6. Test Result

Product ICPCON CPU with Converter Test Mode Normal operation Date of Test 2003/12/23 Test Site Chamber4 Test Condition RS Test Range 80~1000

Frequency

(MHz)

Position

(Angle)

Polarity

(H or V)

Field

Strength

(V/m)

Required

Criteria

Complied To

Criteria

(A,B,C)

Results

80-1000 0 H 3 A A Pass

80-1000 0 V 3 A A Pass

80-1000 90 H 3 A A Pass

80-1000 90 V 3 A A Pass

80-1000 180 H 3 A A Pass

80-1000 180 V 3 A A Pass

80-1000 270 H 3 A A Pass

80-1000 270 V 3 A A Pass

Meet criteria A : Operate as intended during and after the test

Meet criteria B : Operate as intended after the test

Meet criteria C : Loss/Error of function


EUT stopped operation and could / could not be reset by operator at V/m at frequency

MHz.

No false alarms or other malfunctions were observed during or after the test. The acceptance

criteria were met, and the EUT passed the test.



7.7. Test Photo

Test Mode ： Normal operation Description： Radiated Susceptibility Test Setup



8. Electrical Fast Transient/Burst (EFT/B)

8.1. Test Equipment



2 Clamp HAEFELY 093 506.1 / 083 593-23 Jan.,2003



8.2. Test Setup



8.3. Limits


Signal Ports and Telecommunication Ports

Fast Transients Common

Mode

kV (Peak)

Tr/Th ns

Rep. Frequency kHz

+0.5

5/50

5

B

Input DC Power Ports


Mode

kV (Peak)

Tr/Th ns

Rep. Frequency kHz

+0.5

5/50

5

B

Input AC Power Ports


Mode

kV (Peak)

Tr/Th ns

Rep. Frequency kHz

+1

5/50

5

B

8.4. Test Procedure

The EUT and load are placed on a table that is 0.8 meter above a metal ground plane

measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least

0.1m on all sides.

For Signal Ports and Telecommunication Ports:

The EFT interference signal is through a coupling clamp device couples to the signal

and control lines of the EUT with burst noise for 1min.

For Input DC and AC Power Ports:

The EUT is connected to the power mains through a coupling device that directly

couples the EFT interference signal.

Each of the Line and Neutral conductors is impressed with burst noise for 1 min.

The length of power cord between the coupling device and the EUT shall be 1m.





8.6. Test Result

Product ICPCON CPU with Converter Test Mode Normal operation Date of Test 2003/12/23 Test Site SR1 Test Condition EFT/B Test Range

Inject

Line Polarity

Voltage

kV

Inject

Time

(Second)

Inject

Method

Required

Criteria

Complied to

Criteria Result

L ± 1kV 60 Direct B A Pass

N ± 1kV 60 Direct B A Pass

L+N ± 1kV 60 Direct B A Pass





EUT stopped operation and could / could not be reset by operator at kV of

Line .




8.7. Test Photo

Test Mode ： Normal operation Description： EFT/B Test Setup



9. Surge

9.1. Test Equipment





9.2. Test Setup



9.3. Limits


Signal Ports and Telecommunication Ports(See 1) and 2) )

Surges

Line to Ground

Tr/Th us

kV

1.2/50 (8/20)

± 1

B


Surges

Line to Ground

Tr/Th us

kV

1.2/50 (8/20)

± 0.5

B

AC Input and AC Output Power Ports

Surges

Line to Line

Line to Ground

Tr/Th us

kV

kV

1.2/50 (8/20)

± 1

± 2

B

Notes:

1) Applicable only to ports which according to the manufacturer’s may directly to outdoor

cables.

2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT,

no immunity test shall be required.

9.4. Test Procedure

The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane

measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m

on all sides. The length of power cord between the coupling device and the EUT shall be 2m

or less.

For Input and Output AC Power or DC Input and DC Output Power Ports:

The EUT is connected to the power mains through a coupling device that directly couples

the Surge interference signal.

The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700

and the peak value of the a.c. voltage wave. (Positive and negative)

Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with

interval of 1 min.





9.6. Test Result

Product ICPCON CPU with Converter Test Mode Normal operation Date of Test 2003/12/23 Test Site SR1 Test Condition Surge Test Range

Inject

Line Polarity Angle

Voltage

kV

Time

Interval

(Second)

Inject

Method

Required

Criteria

Complied

to

Criteria

Result

L-N ± 90 1kV 60 Direct B A Pass








EUT stopped operation and could / could not be reset by operator at kV of

Line .




9.7. Test Photo

Test Mode ： Normal operation Description： SURGE Test Setup



10. Conducted Susceptibility (CS)

10.1. Test Equipment


1 Signal Generator R & S SYM01 / 10065 Jan.,2003

2 Power Amplifier A & R 150A220 / 23076 N/A

3 Power Meter HP EPM-4418A / GB37482040 Feb.,2003

4 Power Sensor Agilent 8482A / MY41091031 Aug.,2003

5 Directional Coupler A & R DC2600 / 23325 Feb.,2003

6 CDN Lüthi CDN L-801 M1 / 2047 Jun.,2003

7 CDN Lüthi CDN L-801 M2/M3 / 2043 Jun.,2003

8 FIXED PAD TRILITHIC HFP-525-3/6-NF/NF / N/A N/A

9 EM Clamp Lüthi EM101 / 3552C Apr.,2003



10.2. Test Setup



10.3. Limits


Signal Ports and Telecommunication Ports

Radio-Frequency

Continuous Conducted

MHz

V (rms, Un-modulated)

% AM (1kHz)

0.15-80

3

80

A


Radio-Frequency


MHz


% AM (1kHz)

0.15-80

3

80

A


Radio-Frequency


MHz


% AM (1kHz)

0.15-80

3

80

A

10.4. Test Procedure

The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on

the table, EUT are placed upon table and use a 10cm insulation between the EUT and

Ground reference plane.

For Signal Ports and Telecommunication Ports

The disturbance signal is through a coupling and decoupling networks (CDN) or

EM-clamp device couples to the signal and Telecommunication lines of the EUT.

For Input DC and AC Power Ports

The EUT is connected to the power mains through a coupling and decoupling networks

for power supply lines. And directly couples the disturbances signal into EUT.

Used CDN-M2 for two wires or CDN-M3 for three wires.

All the scanning conditions are as follows:

Condition of Test Remarks

1. Field Strength 130dBuV(3V) Level 2

2. Radiated Signal AM 80% Modulated with 1kHz

3. Scanning Frequency 0.15MHz – 80MHz

4 Dwell Time 3 Seconds

5. Frequency step size ∆ f : 1%

6. The rate of Swept of Frequency 1.5 x 10-3 decades/s





10.6. Test Result

Product ICPCON CPU with Converter Test Mode Normal operation Date of Test 2003/12/23 Test Site SR4 Test Condition CS Test Range 0.15~80

Frequency

Range

(MHz)

Voltage

Applied

dBuV(V)

Inject

Method

Tested Port of

EUT

Required

Criteria

Performance

Criteria

Complied To

Result

0.15~80 130 (3V) CDN AC IN A A PASS





EUT stopped operation and could / could not be reset by operator at dBuV(V) at

frequency MHz.





10.7. Test Photo

Test Mode ： Normal operation Description： Conducted Susceptibility Test Setup



11. Power Frequency Magnetic Field



1 Magnetic Field Testing HAEFELY MAG100 / 080 938-05 May,2003

2 Triaxial ELF Magnetic Field Meter

F.B.BELL 4090 / 9852 Apr.,2003



11.2. Test Setup



11.3. Limits


Enclosure Port

Power-Frequency Magnetic Field

Hz A/m (r.m.s.)

50 1

A


The EUT and its load are placed on a table which is 0.8 meter above a metal ground

plane measured at least 1m*1m min. The test magnetic field shall be placed at central of

the induction coil.

The test magnetic Field shall be applied 10minutes by the immersion method to the EUT.

And the induction coil shall be rotated by 90° in order to expose the EUT to the test field

with different orientation (X, Y, Z Orientations).





11.6. Test Result

Product ICPCON CPU with Converter Test Mode Normal operation Date of Test 2003/12/23 Test Site SR1 Test Condition PMag Test Range

Polarization Frequency

(Hz)

Magnetic

Strength

(A/m)

Required

Performance

Criteria

Performance

Criteria

Complied To

Test Result

X Orientation 50 1 A A PASS

Y Orientation 50 1 A A PASS

Z Orientation 50 1 A A PASS





EUT stopped operation and could / could not be reset by operator at A/m.





11.7. Test Photo

Test Mode ： Normal operation Description： Power Frequency Magnetic Field Test Setup



12. Voltage Dips and Interruption






12.2. Test Setup



12.3. Limits



Voltage Dips % Reduction

Period

30

25

C

% Reduction

Period

>95

0.5

B

Voltage Interruptions % Reduction

Period

> 95

250

C


The EUT and its load are placed on a table which is 0.8 meter above a metal ground

plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at

least 0.1m on all sides. The power cord shall be used the shortest power cord as

specified by the manufacturer.

For Voltage Dips/ Interruptions test:

The selection of test voltage is based on the rated power range. If the operation

range is large than 20% of lower power range, both end of specified voltage shall be

tested. Otherwise, the typical voltage specification is selected as test voltage.

The EUT is connected to the power mains through a coupling device that directly

couples to the Voltage Dips and Interruption Generator.

The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25

Periods,

for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of

three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of

supplied voltage and duration 250 Periods with a sequence of three voltage

interruptions with intervals of 10 seconds.

Voltage phase shifting are shall occur at 00, 450, 900 ,1350 ,1800 ,2250, 2700 ,3150 of

the voltage.





12.6. Test Result

Product ICPCON CPU with Converter Test Mode Normal operation Date of Test 2003/12/23 Test Site SR1 Test Condition Dip Test Range




Attachement

Ø EUT Photograph

(1) EUT Photo

(2) EUT Photo



Reference : Laboratory of License

03ch075e rpt-泓格 i-7560, i-7561, i-7563

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