2007.08.30 icis2007@jeju, korea highly charged ion beam applied to ... - kochi-tech… ·...
TRANSCRIPT
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2007.08.30 ICIS2007@Jeju, Korea
Highly charged ion beam applied to
lithography technique
Sadao MomotaKochi University of Technology
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ContentsObjectivePrinciple of IBLApplication of HCI beams to IBLHCI beam facilityExperimental resultsDiscussionConclusion
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Objective
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Integration of 2D patternDesign rule of LSI
ArF (193 nm)KrF (248 nm)
Laser 100 nm 70 nm130 nm
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Integration of 2D patternDesign rule of LSI
ArF (193 nm)KrF (248 nm)
Laser 100 nm 70 nm
EUV 32 nm on TOKSelete-EUVA-Canon
F2 (157 nm)
130 nm
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Integration of 2D patternDesign rule of LSI
ArF (193 nm)KrF (248 nm)
Laser 100 nm 70 nm
EUV 32 nm on TOKSelete-EUVA-Canon
F2 (157 nm)
130 nm
20 nm wide bridgeIBM
e-Beam
Ion beam
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Applications of 3D micro-nano structures
MEMS Micro Electro Mechanical System
Optical deviceMoldBiochipMicro-machining tool
3-Axis Accelerometer
Analog Devices Co.
20 µm
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MEMS Micro Electro Mechanical System
Optical deviceMoldBiochipMicro-machining tool
Photonic crystal
Applications of 3D micro-nano structures
National Inst. for Material Sciencehttp://www.nims.go.jp/jpn/news/nimsnow/Vol4/2004-03/05.html
Pile up of layers
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MEMS Micro Electro Mechanical System
Optical deviceMoldBiochipMicro-machining tool
Pattern transfer
Applications of 3D micro-nano structures
10nm diam. & 60nm pitch
SiO2/Si PMMA
S.Y. Chou et al. J. Vac. Sci. Technol., B15(1997)2897
100 nm
100 nm
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MEMS Micro Electro Mechanical System
Optical deviceMoldBiochipMicro-machining tool
Micro inspection chip
Applications of 3D micro-nano structures
Hitachi, Ltd.
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MEMS Micro Electro Mechanical System
Optical deviceMoldBiochipMicro-machining tool
Diamond array tool
Applications of 3D micro-nano structures
Morita Gr. (Toyama Univ.)
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Feasibility of IBL to fabricate 3D structures
Ion range controlled by beam energy• E ∝ V
Small lateral stragglingHigh reactivity• Large energy deposition in materials
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Goal of this researchFabrication of 3D nano-scale structure
Application of HCI to IBL technique⇓
Efficient fabricationControllability/Enhancement of fabrication depth compared with conventional IBL
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Principle of IBL
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Exposure processIrradiation of ion beam• Mask or FIB
Irradiation effect• Implantation of impurities
• Change in chemical structure / component Crystal ⇔ Amorphous Polymer ⇔ Monomer
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Exposure processIrradiation of ion beam• Mask or FIB
Irradiation effect• Implantation of impurities
•Change in chemical structure / component Crystal ⇔ Amorphous Polymer ⇔ Monomer
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Exposure processIrradiation of ion beam• Mask or FIB
Irradiation effect• Implantation of impurities
•Change in chemical structure / component Crystal ⇔ Amorphous Polymer ⇔ Monomer
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Development processEtching by chemicals• Wet / Dry
Difference in etching rate caused by• Impurity• Change in chemical
structure / component
Fabricated structure•Concave : positive•Hillock : negative
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Development processEtching by chemicals• Wet / Dry
Difference in etching rate caused by• Impurity• Change in chemical
structure / component
Fabricated structure•Concave : positive•Hillock : negative
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Development processEtching by chemicals• Wet / Dry
Difference in etching rate caused by• Impurity• Change in chemical
structure / component
Fabricated structure•Concave : positive•Hillock : negative
Positive
Negative
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Development processEtching by chemicals• Wet / Dry
Difference in etching rate caused by• Impurity• Change in chemical
structure / component
Fabricated structure•Concave : positive•Hillock : negative
Positive
Negative
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Development processEtching by chemicals• Wet / Dry
Difference in etching rate caused by• Impurity• Change in chemical
structure / component
Fabricated structure•Concave : positive•Hillock : negative
Positive
Negative
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Application of HCI beams to IBL
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Why HCI beam?
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Why HCI beam?Availability of HCI sources• ECRIS, EBIS, Laser IS
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Why HCI beam?Availability of HCI sources• ECRIS, EBIS, Laser IS
Expected advantages to use HCIcompared with singly charged ion
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Expected advantage to apply HCI beams
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Expected advantage to apply HCI beams
Efficient fabrication• High reactivity of HCI beams in materials
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Expected advantage to apply HCI beams
Efficient fabrication• High reactivity of HCI beams in materials
Controllability/Enhancement of fabrication depth ⇐ E ∝ qVAcl.
compared with conventional lithography technique
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Unique phenomena induced by HCI beams
Enhancement of dE
Pot. emission
Hollow atom
Local modification
Coulomb explosion etc.
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Unique phenomena induced by HCI
Enhancement of dE
Pot. emission
Hollow atom
Local modification
Coulomb explosion etc.
Enhancement of dry etching process
Mat. Sci. Eng. B74 (2000) 40 T. Meguro et al.
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Unique phenomena induced by HCI
Enhancement of dE
Pot. emission
Hollow atom
Local modification
Coulomb explosion etc.
Creation of nano-diamonds in HOPG
Appl. Phys. Lett. 79 (2001) pp. 3866, T. Meguro et al. sp2 -> sp3
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Xe44+ from EBIT at NIST(11x106 ions/s)
L.P. Ratliff et al.Appl. Phys. Lett. 75 (1999) pp.590
Exposure : Xe44+ (350keV) Ar* (~0.1 eV)
Development : Remove Au in irradiated region
Measurement : Loss of reflectivity
IBL of self-assembled monolayers
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Xe44+ from EBIT at NIST(11x106 ions/s)
L.P. Ratliff et al.Appl. Phys. Lett. 75 (1999) pp.590
Exposure : Xe44+ (350keV) Ar* (~0.1 eV)
Development : Remove Au in irradiated region
Measurement : Loss of reflectivity
Epot. (keV)
Dose(ions/cm2)
Xe44+ 51.3 1.3x1011
Ar* 0.012 6.6x1015
IBL of self-assembled monolayers
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Xe44+ from EBIT at NIST(11x106 ions/s)
L.P. Ratliff et al.Appl. Phys. Lett. 75 (1999) pp.590
Exposure : Xe44+ (350keV) Ar* (~0.1 eV)
Development : Remove Au in irradiated region
Measurement : Loss of reflectivity
Epot. (keV)
Dose(ions/cm2)
Xe44+ 51.3 1.3x1011
Ar* 0.012 6.6x1015x 4400 x 1/50000
2D pattern
IBL of self-assembled monolayers
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Exposure : Xe44+ (210keV) on PMMA
Development : Remove PMMA in irradiated region
Measurement : SEM, AFM
IBL of PMMAXe44+ from EBIT at NIST(11x106 ions/s)
J.D. Gillaspy et al., J. Vac. Sci. Technol. B16 (1998) pp.3294
"... the method demonstrated here can be extended deep into the submicrometer range."
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Exposure : Xe44+ (210keV) on PMMA
Development : Remove PMMA in irradiated region
Measurement : SEM, AFM
IBL of PMMAXe44+ from EBIT at NIST(11x106 ions/s)
J.D. Gillaspy et al., J. Vac. Sci. Technol. B16 (1998) pp.3294
Epot. (kV)
Dose(ions/cm2)
Xe44+ 51.3 2x1010
Xe1+ 0.011 4x1011
Ga1+ 0.006 6x1011
x 50,000 x 1/20"... the method demonstrated here can be extended deep into the submicrometer range."
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Goal of this research
Efficient fabrication• High reactivity of HCI beams with materials
Controllability/Enhancement of fabrication depth• Controlled by V and q• Application of larger q
Fabrication of 3D nano-scale structure
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HCI beam facility
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Production of HCI beams10GHz-NANOGAN• PRF = 0~80 W• VExt. = 0~30 kVVAcl. = 0~100 kVCompact installECRIS and acceleration system installed in L~1 m.
ICIS2003 : S. Momota et al., Rev. Sci. Instrum., 75(2004), pp.1497 - 1498
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Separation of HCI beamsRigidity analysis• θ = π/4 rad
• Bρ = 0~0.33 T⋅mIons• Ar1+~Ar9+
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Irradiation of HCI beamsStencil mask• Cu
On-line current monitor• Collimator• Secondary electron
suppressor• Current integration
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Irradiation of HCI beamsStencil mask• Cu
On-line current monitor• Collimator• Secondary electron
suppressor• Current integration
A
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Experimental results
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0.012
46
0.12
46
12
46
E Pot
. (ke
V)
12840 q
IBL on SOGIrradiation of Arq+
• q = +1~+9• 80~240 keV•Cu-Mask (43×43 μm)
Wet etching BHF (HF, NH4F)
Surface profile• Optical microscopy • Profilometer
EPot. of Ar ions
http://www.dreebit.com/en/highly_charged_ions/data/
Ar1+
0.015keV
Ar9+
1 keV
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IBL on SOGIrradiation of Arq+
• q = +1~+9• 80~240 keV•Cu-Mask (43×43 μm)
Wet etching BHF (HF, NH4F)
Surface profile• Optical microscopy • Profilometer
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IBL of SOGOptical micrograph
Irradiation of Arq+
• q = +1~+9• 80~240 keV•Cu-Mask (43×43 μm)
Wet etching BHF (HF, NH4F)
Surface profile• Optical microscopy • Profilometer
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IBL of SOGIrradiation of Arq+
• q = +1~+9• 80~240 keV•Cu-Mask (43×43 μm)
Wet etching BHF (HF, NH4F)
Surface profile• Optical microscopy • Profilometer
Profile observed by Alpha step
Depth
X (μm)
Dept
h (n
m)
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IBL on SiIrradiation of Arq+
• q = +1~9• E = 40~540 keV• Cu-Mask (43×43 μm)Etching• 46mass% HF
Surface profile• AFM
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IBL on SiIrradiation of Arq+
• q = +1~9• E = 40~540 keV• Cu-Mask (43×43 μm)Etching• 46mass% HF
Surface profile• AFM
Ar4+
240 keV, 1.3x1015 ions/cm2
Tetch. = 0 min. Tetch. = 120 min.Hillock structure
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Etching process of SOGAr1+: 90 keV, 6.3x1013 ions/cm2
200
150
100
50
0
Dept
h (n
m)
200150100500Eching time (sec)
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Etching process of SOGAr1+: 90 keV, 6.3x1013 ions/cm2
I II III
200
150
100
50
0
Dept
h (n
m)
200150100500Eching time (sec)
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Etching process of SOGAr1+: 90 keV, 6.3x1013 ions/cm2
200
150
100
50
0
Dept
h (n
m)
200150100500Eching time (sec)
200
150
100
50
0
Dept
h (n
m)
200150100500Eching time (sec)
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Etching process of SOGAr1+: 90 keV, 6.3x1013 ions/cm2
200
150
100
50
0
Dept
h (n
m)
200150100500Eching time (sec)
200
150
100
50
0
Dept
h (n
m)
200150100500Eching time (sec)
Initial depth
T1
Etching rate
Etching depth
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400
300
200
100
0
Dept
h (n
m)
12080400Eching time (min.)
Etching process of SiAr4+: 240 keV, 1.3x1015 ions/cm2
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400
300
200
100
0
Dept
h (n
m)
12080400Eching time (min.)
Etching process of SiAr4+: 240 keV, 1.3x1015 ions/cm2
Hillock structure
Etching-resistant layer
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40
30
20
10
0
Dept
h (n
m)
6 81013
2 4 6 81014
2 4 6 8
Dose (ions/cm2)
Ar1+ Ar9+
Fabrication of concave structureSputtering of SOG
200
150
100
50
0
Dept
h (n
m)
200150100500Eching time (sec)
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40
30
20
10
0
Dept
h (n
m)
6 81013
2 4 6 81014
2 4 6 8
Dose (ions/cm2)
Ar1+ Ar9+
Fabrication of concave structureSputtering of SOG
Removal of etching-resistant
layer
200
150
100
50
0
Dept
h (n
m)
200150100500Eching time (sec)
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50
40
30
20
10
0
Heig
ht (n
m)
4 6 81015
2 4 6 81016
2
Dose (ions/cm2)
4+
Protrusion of SiFabrication of hillock structure
Dose dep.Increase with dose.
E dep.Increase with E.
q dep.Not depend on q.
Ar4+, 240 keV
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15
10
5
0
Heig
ht (n
m)
5004003002001000E (keV)
V = 20~100 kV, q = 4+
Protrusion of SiFabrication of hillock structure
Ar4+, 1.5×1015 ions/cm2
Dose dep.Increase with dose.
E dep.Increase with E.
q dep.Not depend on q.
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120
80
40
0
T 1 (s
ec)
6 81013
2 4 6 81014
2 4 6 8
Dose (ions/cm2)
Ar1+ Ar9+
T1 of SOGArq+, E = 90 keV
200
150
100
50
0
Dept
h (n
m)
200150100500Eching time (sec)
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120
80
40
0
T 1 (s
ec)
6 81013
2 4 6 81014
2 4 6 8
Dose (ions/cm2)
Ar1+ Ar9+
T1 of SOGArq+, E = 90 keV
200
150
100
50
0
Dept
h (n
m)
200150100500Eching time (sec)
40
30
20
10
0
Dept
h (n
m)
6 81013
2 4 6 81014
2 4 6 8
Dose (ions/cm2)
Ar1+ Ar9+
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2.5
2.0
1.5
1.0
0.5
0.0Etch
ing
rate
(nm
/sec
)
1013 1014 1015
Dose (ions/cm2)
Ar1+ Ar9+
Etching rate of SOGArq+, E = 90 keV
200
150
100
50
0
Dept
h (n
m)
200150100500Eching time (sec)
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300
200
100
0
Dept
h (n
m)
6 81013
2 4 6 81014
2 4 6 8
Dose (ions/cm2)
Ar1+ Ar9+
Etching depth of SOGArq+, E = 90 keV
200
150
100
50
0
Dept
h (n
m)
200150100500Eching time (sec)
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300
200
100
0
Dept
h (n
m)
6 81013
2 4 6 81014
2 4 6 8
Dose (ions/cm2)
Ar1+ Ar9+
Etching depth of SOGArq+, E = 90 keV
200
150
100
50
0
Dept
h (n
m)
200150100500Eching time (sec)
HCI effect
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800
600
400
200
0
Etching depth [nm]
6004002000
E (keV)
Ar4+
Etching depth of SOGAr4+ on SOG
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Ion range
800
600
400
200
0
Etching depth [nm]
6004002000
E (keV)
Ar4+ Ar9+
Etching depth of SOGAr4+ on SOG
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800
600
400
200
0
Etching depth [nm]
6004002000
E (keV)
q = 4+
Etching depth of SiAr4+ on Si
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800
600
400
200
0
Etching depth [nm]
6004002000
E (keV)
V=20̃100kV, q = +4 V=60 kV, q = +1̃+9
Arq+ on Si
Etching depth of Si
Ion rangeDefect
Ar1+
Ar8+Ar9+
Ar6+
Ar4+
Ar2+
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800
600
400
200
0
Etching depth [nm]
6004002000
E (keV)
V=20̃100kV, q = +4 V=60 kV, q = +1̃+9
Arq+ on Si
Etching depth of Si
Ion rangeDefect
Ar1+
Ar8+Ar9+
Ar6+
Ar4+
Ar2+
No HCI effect on Si
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100
80
60
40
20
0
T 1 (s
ec)
6004002000E (keV)
Ar4+, 20~80kV
T1 vs. E : SiEtching start time increases withE.
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100
80
60
40
20
0
T 1 (s
ec)
6004002000E (keV)
Ar4+, 20~80kV Ar1+~9+, 60kV
T1 vs. E : SiEtching start time increases withE.
Ar1+
Ar8+
Ar4+Ar2+
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100
80
60
40
20
0
T 1 (s
ec)
6004002000E (keV)
Ar4+, 20~80kV Ar1+~9+, 60kV
T1 vs. E : SiEtching start time increases withE.
Ar1+
Ar8+
Ar4+Ar2+
Deeper but longer time with high energy ions
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Discussion
![Page 75: 2007.08.30 ICIS2007@Jeju, Korea Highly charged ion beam applied to ... - kochi-tech… · 2017-06-15 · J. Vac. Sci. Technol., B15(1997)2897 100 nm 100 nm. MEMS Micro Electro Mechanical](https://reader034.vdocuments.net/reader034/viewer/2022050420/5f8fcefba826771ea826b289/html5/thumbnails/75.jpg)
Modification of surface: SOGTop surface : resistant layer for etching
Energy deposition at surface
Promotion of sputtering/modification
Concave structure
Removal of resistant layer
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Modification of surface: SOGTop surface : resistant layer for etching
Energy deposition at surface
Promotion of sputtering/modification
Concave structure
Removal of resistant layer
1+ ⇒ 9+
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Modification of surface: SOGTop surface : resistant layer for etching
Energy deposition at surface
Promotion of sputtering/modification
Concave structure
Removal of resistant layer
1+ ⇒ 9+
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Modification of surface: SiTop surface : resistant layer for etching
Energy deposition at surface
Promotion of amorphousization
Hillock structure Rise of etching rate
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Modification of surface: SiTop surface : resistant layer for etching
Energy deposition at surface
Promotion of amorphousization
Hillock structure Rise of etching rate
Beam energy
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Modification of surface: SiTop surface : resistant layer for etching
Energy deposition at surface
Promotion of amorphousization
Hillock structure Rise of etching rate
Why?Depth
Beam energy
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Reduction of energy deposition at surfaceBecause
calculated by SRIM
Defect density distribution in Si induced by Ar irradiation
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Modification of inside: SOGEtching rate
not depend on q
Etching depthanomalously deeper than ion rangeincrease with q
q dep. does not observed for Si.
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Indirect irradiation effectAnomalously deep structural change• Secondary e-
• Shock waves
• Stress etc.
Remarkable for glassesA. Deshkovskaya, Nucl. Instr. and Meth. in Phys. Res. B166-167 (2000) pp.511
HCI effect is material dependent.
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Modification of mechanical properties
Nano-indentation meas.12
8
4
0
Nano
hard
ness
[GPa
]
3002001000Depth [nm]
SiO2 SiPreliminary
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Modification of mechanical properties
Nano-indentation meas.12
8
4
0
Nano
hard
ness
[GPa
]
3002001000Depth [nm]
SiO2 SiPreliminary
After irradiationAr4+, 1.25×1015 ions/cm2
12
8
4
0
Nano
hard
ness
[GPa
]
3002001000Depth [nm]
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Conclusion
![Page 87: 2007.08.30 ICIS2007@Jeju, Korea Highly charged ion beam applied to ... - kochi-tech… · 2017-06-15 · J. Vac. Sci. Technol., B15(1997)2897 100 nm 100 nm. MEMS Micro Electro Mechanical](https://reader034.vdocuments.net/reader034/viewer/2022050420/5f8fcefba826771ea826b289/html5/thumbnails/87.jpg)
HCI effect on IBLHCI beams reduces etching time.• Reduction of T1
HCI enhances fabrication depth.• Anomalously deep structural change
(Material dependent)• HCI beams
Fabrication depth can be controlled.• ±10nm• V and q
![Page 88: 2007.08.30 ICIS2007@Jeju, Korea Highly charged ion beam applied to ... - kochi-tech… · 2017-06-15 · J. Vac. Sci. Technol., B15(1997)2897 100 nm 100 nm. MEMS Micro Electro Mechanical](https://reader034.vdocuments.net/reader034/viewer/2022050420/5f8fcefba826771ea826b289/html5/thumbnails/88.jpg)
For deep fabricationEnergy deposition promotes fabrication.
More energy deposition at surface.
• Co-irradiation of low energy IB
• Irradiation of HCI beams
Defect density distribution
calculated by SRIM
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ProspectsFurther development of IBL with HCI beams• Application of higher Epot.
• Fabrication of unique structure
Further development of ion source• More intense / more focused HCI
beams
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Collaboration
Kochi Univ. of Tech.
Tokyo Univ. of Sci.
Univ. of Toyama
Y. Nojiri, S. Momota Irradiation of HCI beam
J. Taniguchi, I. Miyamoto IBL process, Measurements
N. Morita, N. Kawasegi Etching, Measurements
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Collaboration
Kochi Univ. of Tech.
Tokyo Univ. of Sci.
Univ. of Toyama
Y. Nojiri, S. Momota Irradiation of HCI beam
J. Taniguchi, I. Miyamoto IBL process, Measurements
N. Morita, N. Kawasegi Etching, Measurements
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Appendix
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80
60
40
20
0
-20
dW (n
m)
76543210Etching time (min.)
1 leyer, ~500 nm 2 leyer, ~1000 nm
Change in thickness of SOG by etching process
dW vs. etching time
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Enhancement of E-lossdE of HCI beam in C-foil (~10 nm)
E = 35.5 ± 0.2 (16O), 92.3 ± 0.6 (40Ar),197.7 ± 1.0 (86Kr), 312.4 ± 2.0 (136Xe), and 454.4 ± 3 (197Au) keV
T. Schenkel et al., Phys. Rev. Lett. 79 (1997) pp.2030