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LATIPAT

November 5-7, 2012

Medellin (CO)

Medellin, 5 November 2012

CCD : Common Citation Document

Wistre Rodriguez Del Amo PD-PG - Information AcquisitionEuropean Patent Office

Introduction

• Proposed by Trilateral Industry.

• Pilot and then A Production version by Trilateral Offices

• Citation data from Trilateral Offices - Priority-based Family - cited prior art for each family member.

• CCD is based on published data or on data made publicly available by Patent Offices.

• CCD involves the commitment of the Trilateral Offices to engage into the exchange of the relevant citation data.

Main functionalities

• The CCD can be invoked with domestic application number formats for most Trilateral applications after 2005 and also suggests possible matching applications.

• CCD has a broader data coverage than the Trilateral Offices, including relevant citation data made available to EPO by any IPO.

• Identifies equivalent citations in the citation view by citation grouping.

• Supports an ergonomic double viewing.

• Comprehensive User Guide and Online Help available.

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CCD Progress - Overview

• CCD improvements since launch

• CCD situation in spring 2012

• CCD enhancements for winter 2012

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CCD Progress - Overview

• CCD improvements since launch

• CCD situation in spring 2012

• CCD enhancements for winter 2012

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• Printing support

• "Citation Only View" improvements:– emphasis of related items in the citation only view.– "Citation only view" sorted by default in reverse chronological order.– In the "citation only view" replaced the "sort by date" by the "sort by

country" function.

• Multiple timeline views, to manage complex timelines.

• Basic help instructions in the opening screen.

• CCD Application corrections:– corrected the facsimile display for USPTO publications (corrective

document was shown instead of the main document).– Improved IE8 support for larger families.– Corrected the case of a blocked help window while viewing facsimiles.

CCD Progress – Improvements since launch

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CCD Progress – Improvements since launch

• "Citation Only View" improvements:– emphasis of related items in the citation only view.– "Citation only view" sorted by default in reverse chronological order.– In the "citation only view" replaced the "sort by date" by the "sort by country"

function.

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• Multiple timeline views, to manage complex timelines

CCD Progress – Improvements since launch

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CCD Progress – Improvements since launch

• Basic help instructions in the opening screen

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• Current CCD Data coverage overview

CCD Progress – Situation in spring 2012

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• CCD Data coverage enhancements– Inclusion of USPTO A publication citations.

Overview citation data (EPO, JPO, USPTO and KIPO, WIPO)

CCD Progress – Situation in spring 2012

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• CCD Data coverage enhancements– Review of the citation phase label of US Applications

in CCD.– Inclusion of the "I" relevancy Indicator for EPO

citations.

• Application Improvements– Review of the help window positioning, layout and

navigation.– Update help content.

CCD Progress – Situation in spring 2012

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CCD Progress – Enhancements for winter 2012

• Application improvements– Assessment of W3C accessibility compliancy.– Add publication date for NPL citations, when provided in data

exchange Improve the behaviour of the application in error situations

– Update Help content.

• System efficiency improvement: – Transition from a single "Get all family members" to multiple

"Load more family members".

• Integration with other systems– Integration with Espacenet, tentatively planned for 2012/2013

will provide• Generation of CCD as exportable list.• Generation of CCD covers as a PDF document.

– Linking to the EPO register and other deep linkable IP5 systems if supported.

Invocation

• CCD is available from of the Trilateral's home page (www.trilateral.net)

• or directly from the URL www.trilateral.net/ccd

The input mask

• The input mask accepts domestic application number formats for most Trilateral applications after 2005, e.g. EP09151293

• A list of compatible input numbers is given below

The model for the display of the results: PCT/ISA/210

Classification of S-M

Fields searched

Documents consideredto be relevant

CCD Initial Output

Documents considered to be relevant

Fields searched

Classifications

CCD Window Definitions

CCD VIEWER Inspector(s)

CCD Viewer: Citations Grouped by Application

• In this example, the list of the citations are expanded, in light blue the non-patent literature.

CCD Viewer: Citations by Phase

• The citations further subgrouped by the phase at which they were retrieved, here "National Search Report", and "National Examination", but also e.g. "Applicant"

CCD Viewer: Expanded view

• All the citations are listed; click "compact view" or the "-" to switch to compact view

CCD Viewer: Compact View

• All the citations are hidden; click "expand view" or the "+" to switch to compact view

Filtering out applications w/o citations, applicant's citation 1/2

• It is possible to filter our applications without citations (here the JP), and applicant's citation (here from the US application) using the filters

Filtering out applications w/o citations, applicant's citation 2/2

• The JP application, and the applicant's citations of the US application are hidden

The CCD Viewer

• By default CCD will retrieve the simple family. It is however possible to retrieve the complete, extended family and to view all simple families and their members; this requires clicking the button at the bottom of the CCD Viewer.

– In this example the simple family has 8 members

– getting all the family members adds a family, with a single member

CCD Viewer: Sort by Country

• Sorts by country and allows to expand compact citations of each country individually; the grouping is done across extended families

CCD Viewer: Citations Only 1/2

• To view the citations as list, rather than grouped by applications, simple family

CCD Viewer: Citations Only 2/2

• To view the citations as list, rather than grouped by applications, extended family

The Inspector: EC Class Definition and Clippings

• The definition of the class will expand when clicking an EC class; it is then possible to see representative example of 1st page clippings

The Inspector: Documents

• Selecting e.g. the EP application, sends it to the first inspector (and replaces the class/fields viewer if it was displayed)

The Inspector: Documents

• It is possible to visualise any application, or its citations in one of the two inspectors (right click over reference, e.g. the EP, select inspector)

The Inspector: the Double Inspector

• As an example, the first patent literature citation of the EP application is sent to the second inspector

Toggling the CCD Viewer, Single/Double Inspector

• It is possible to expand/compact the area of the inspector(s) by hiding/show the CCD Viewer, or to toggle between a single an a double inspector

Navigation in the Inspector: Documents 1/3

• The Inspector provides multiple views and navigation options for each document:

– the biblio (default view),

– the fulltext description or claims (when available),

– the original document in image format,

Navigation in the Inspector: Documents 2/3

– family members in different languages (for citations)

Navigation in the Inspector: Documents 3/3

– navigation with the original document in image format

Navigation in the Inspector

• It is possible display the fields/classification viewer instead of the documents in the inspector, by clicking the specific button

Ambiguity in the input

• If the input is ambiguous, CCD will suggest results. It is possible to distinguish the expected results using the data in list (applicant, inventor, etc.)

Limited CQL in the Input

• The input supports a limited CQL language

– pa : applicant's name

– pd : publication date

– ia : inventor's or applicant's name

– ec : ecla

– only AND expression

e.g. ia=mazda AND ec=F02B75/22

Data Coverage

• The information concerning the main offices:

– EP citation data available includes references to both patent and non-patent citations and covers all possible procedures: applicant citations, search citations, examination citations, observations by third parties and opposition citations. The search citations are made available when the application is published (EP-A1, A3 or A4). The database currently available contains approximately 1.6 million citing EP publications from 1978 to the present, with more than 7.1 million cited patents and almost 2 million cited NPL documents.

– US citation data available includes references to both patent and non-patent citations and covers only applicant and search citations, which are made available at the time of grant (US-A before the year 2001 and US-B1/B2 from 2001, also US-E* and P*). The database currently available contains approximately 5.4 million citing US publications from 1947 to the present for search citations and from 2001 to the present for applicant citations, with more than 63 million cited patents and more than 11.5 million cited NPL documents.

– The JP citation data available includes only references to patent citations and covers all search, examination, opposition and appeal procedures, but does not include applicant citations. The search and examination citations are made available when the application is published (JP-A or B1/B2 and JP-U or Y1/Y2). The database currently available contains approximately 2.9 million cited JP publications from 1965 to the present, with more than 7.2 million cited patents.

– WO citation data includes references to both patent and non-patent citations and covers only applicant and search citations, which are made available when the application is published (WO-A1 or A3). The database currently available contains approximately 1.9 million WO publication citations from 1978 to the present, with more than 8.7 million cited patents and more than 1.8 million cited non-patent literature (NPL) documents.

– For the above coverage, the intention is for the data to be as comprehensive as possible. However, the CCD web application does not guarantee this.

Data Quality

• Accuracy of the data retrieved by the CCD web application engine relies on the extent to which data is exchanged between the participating offices. In particular, delays in bibliographic data delivery can vary depending on the country and the time period involved. Before relying on the completeness of a CC document, one should check where there are gaps or if there are delays in certain areas. This information is available in the PFS and PRS statistics (updated weekly) which provide indications of missing or delayed document series'.

• In addition, particular attention should be given to European patents which have entered into the national phase. In these cases completeness of a document series and its data accuracy can vary significantly between countries. A good overview can be found in the raw data resources (INPADOC) FAQ on epo.org.

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Need more information?

www.epo.org

www.cpcinfo.org

www.trilateral.net/ccd

Thank you for your attention!ndasneves@epo.org