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    Manometers

    Pitot tubes

    Thermocouples o w re sys ems

    a. Anemometers

    b. Probes

    - Simple- Slented

    - Cross-wire

    LDA (Laser Doppler Anemometry)

    PIV (Particle Image Velocimetry)

    ----------------------------------------------

    Data Acquisition System

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    Typical PC-Based DAQ System

    Transducers

    Signal conditioning

    DAQ hardwareSoftwarehttp://zone.ni.com/

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    Data Acquisition (DAQ) Fundamentals

    Data acquisition involves gathering signals from measurement sources

    and digitizing the signal for storage, analysis, and presentation on a PC.

    Data acquisition (DAQ) systems come in many different PC technology formsor grea ex y w en c oos ng your sys em.

    Scientists and engineers can choose from PCI (Peripheral Component

    , , , , , ,

    Ethernet data acquisition for test, measurement, and automation applications.

    system :

    Transducers and sensors

    Signal conditioning

    DAQ hardware

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    http://zone.ni.com/devzone/cda/tut/p/id/4811

    PXI is the open, PC-based platform for test, measurement, and control

    PXI systems are composed of three basic components chassis, systemcontroller, and peripheral modules

    Standard 8-Slot PXI Chassis

    Embedded System Controller andSeven Peripheral Modules

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    A t ical DAQ s stem with National Instruments SCXI si nal conditionin

    accessories

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    Transducers and sensors

    rans ucer s a ev ce a conver s a p ys ca p enomenon n o ameasurable electrical signal, such as voltage or current.

    the transducers to convert the physical phenomena into signals measurable

    by the DAQ hardware.

    Phenomenon Transducer

    Temperature Thermocouple, RTD, Thermistor Light Photo Sensor

    Sound Microphone

    Force and Pressure Strain Gage

    Piezoelectric Transducer

    Position and Displacement Potentiometer, LVDT, Optical Encodercce era on cce erome er

    pH pH Electrode

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    Signals

    The a ro riate transducers convert h sical henomena into measurable

    signals.

    However different si nals need to be measured in different wa s. For this

    reason, it is important to understand the different types of signals and their

    corresponding attributes.

    Signals can be categorized into two groups:

    Analog

    Digital

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    Analog Signals

    .

    signals include voltage, temperature, pressure, sound, and load. The three primary

    characteristics of an analog signal include level, shape, and frequency

    Because analog signals can take on any value, level gives vital

    information about the measured analog signal. The intensity of a

    light source, the temperature in a room, and the pressure insidea c am er are a examp es a emons ra e e mpor ance o

    the level of a signal.

    Primary Characteristics of an Analog Signal

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    Digital Signals

    A digital signal cannot take on any value with respect to time.Instead, a digital signal has two possible levels: high and low.

    Digital signals generally conform to certain specifications that define characteristics

    of the signal. Digital signals are commonly referred to as transistor-to-transistor logic

    (TTL). TTL specifications indicate a digital signal to be low when the level falls within

    0 to 0.8 V, and the signal is high between 2 to 5 V.

    The useful informationthat can be measured

    includes the state (on or

    off, high or low ) and the

    rate of a di ital how thedigital signal changes

    state with respect to time

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    Signal Conditioning

    Sometimes transducers generate signals too difficult or too dangerous tomeasure directly with a DAQ device.

    For instance, when dealing with high voltages, noisy environments, extreme high

    and low signals, or simultaneous signal measurement, signal conditioning is

    essential for an effective DAQ system. Signal conditioning maximizes the

    accuracy of a system, allows sensors to operate properly, and guarantees safety.

    Signal conditioning accessories can be used in

    a variety of applications including:

    AttenuationIsolation (The system being monitored may

    -

    damage the computer without signal

    conditioning)

    Simultaneous sampling

    Sensor excitation

    Multi lexin A common techni ue for

    measuring several signals with a singlemeasuring device is multiplexing.)

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    Signal

    conditioning

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    DAQ Hardware

    .

    It primarily functions as a device that digitizes incoming analog signals so that the

    computer can interpret them. Other data acquisition functionality includes:

    Analog Input/Output

    Digital Input/Output

    Counter/Timers Multifunction - a combination of analog, digital, and counter operations on a single

    device

    NI Wi-Fi Data Acquisition

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    CPU

    Central Processing

    101011

    Unit

    Address ControlData

    A/D

    ConverterSampled Analog

    Input Signal Digital Output

    Input

    Device

    Keyboard

    Disk

    A/D Converter

    111

    Buss

    110

    101Digital

    OutputMemory

    010

    011

    Output

    Device

    CRT

    Printer

    Disk

    000

    001

    0 Full

    Scale1/2 LSB

    Computer monitors

    na og npu

    LSB: least significant bitRef: http://cobweb.ecn.purdue.edu/~aae520/

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    Full scale volta e=23range R=8V

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    Dynamic Response of

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    A static measurement of a physical quantity is

    time.

    The deflection of a beam under a constant load

    deflection would vary with time (dynamic

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    - - -,

    A system may be described in terms of a general

    var a e x t wr tten n erent a equat on orm as:

    where F(t) is some forcing function imposed on the system.

    .

    A zeroth-order system would be governed by:

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    A first-order system is governed by:

    A second-order system is governed by:

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    The zeroth order system indicates that the system variable x(t) will

    follow the input forcing function F(t) instantly by some constant

    value:

    e cons an a0 s ca e e s a c sens v y o e sys em.

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    The first order system may be expressed as:

    The = a1/a0 has the dimension of timean s usua y ca e e me cons an

    of the system.

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    For step input : F(t)=0 at t=0F(t)=A for t>0

    Along with the initial condition x=x at t=0

    The solution to the first order system is:

    where

    Steadystate

    Transientresponse of

    (call x)

    The same solution can be written in dimensionless forms as:

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    Dynamic Response of Measurement

    Systems

    ero r er ys em:

    Input signalOutput signal

    )()( tFKtx =

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    npu s gna examp es:

    - 0

    Unit step function

    (Heaviside function)Shifted unit step function

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    Dynamic Response of Measurement

    dx=

    Systems

    Step response

    -

    dt

    Impulse response

    )1()0( /teFKx =

    /)0( teFKx =11

    5.=

    ude

    0.6

    0.70.8

    .

    0.6

    0.7

    0.8

    0.9

    litude

    1=2=

    Amplit

    0.3

    0.4

    0.5

    2=0.3

    0.4

    0.5Am

    0 2 4 6 8 100

    0.1

    .

    /t

    1=

    5.=

    /t0 2 4 6 8 10

    0

    0.1

    .

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    Dynamic Response of Measurement

    First Order S stemInput OutputSystems

    Sinusoidal Response )sin(1 22

    ++

    = tx

    s n=

    -

    tan =

    Amplitude Decrease and Phase Shift

    0.6

    0.8

    1

    -20

    -10

    0

    GaindB

    Input

    -0.2

    0

    0.2

    .

    amplitude

    10-1

    100

    101-30

    0

    deg

    Output

    -0.8

    -0.6

    -0.4

    -1 0 1

    -

    -60

    -90

    Phase

    0 0.5 1 1.5 2 2.5-1

    time

    Bode Plot

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    Dynamic Response of Measurement

    Systems

    Step response - Second Order System

    1.8

    2

    22

    2

    dxxd =

    1.2

    1.4

    .

    ude

    -

    frequencynatural-

    2

    n

    nnndtdt

    0.6

    0.8

    1

    Am

    plit

    res onsefastestfor-7.

    nsoscillationo-dampingcritical-1

    =

    =

    0.2

    0.4

    dam ed criticallfortimethehalfin

    valuestaticof5%tocomesSystem

    overshoot5%

    0 5 10 15 20tn

    systems

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    Dynamic Response of Measurement

    Second Order S stem - Sinusoidal Res onseSystems

    =+

    ==

    2

    1

    22

    2

    1

    2

    tan)sin()0(

    x)sin()0( ntFK

    tFF

    n

    nn

    (dB)

    ase

    (deg)

    n/

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    Dynamic Response of Measurement

    Systems

    econ r er ys em - mpu se esponse

    )1sin()0( 2 += teFKx

    n

    tn

    0.8

    1Impulse response - Second Order System

    0.4

    0.6

    e

    -0.2

    0

    0.2

    Amplitu

    -0.6

    -0.4

    0 20 40 60 80 100-0.8

    time

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    1

    1 .2

    1

    1 .2

    0 .2

    0 .4

    0 .6

    .

    AmplitudeRatio

    0 .2

    0 .4

    0 .6

    .

    AmplitudeRatio

    0 1 0 2 0 3 0 4 0 5 00

    F r equenc y ( H z )

    0 1 0 2 0 30

    F r equenc y ( H

    Low Pass Filter High Pass Filter

    Removes High Frequency Noise

    (Such as 60, 120 Hz)

    0 .8

    1

    1 .2

    eR

    atio 0 .8

    1

    1 .2

    eR

    atio

    0

    0 .2

    0 .4

    .

    Amplitud

    0

    0 .2

    0 .4

    .

    Amplitud

    F re q ue nc y (H z) F re q ue nc y (H z)

    Band Pass Band Stop

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    Example: MUSIC

    Basically, the equalizer in your stereo is nothing more than a set of band

    pass filters in parallel. Each filter has a different frequency band that it

    con ro s. e equa zer s use o a ance e s gna over eren

    frequencies to shape the noise (music)

    amplitude

    Dr. Peter Avitabile University of Massachusetts Lowell

    frequency

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    The instrument that is used to make measurements will have some verydefinite frequency characteristics. This defines the usable frequency range

    of the instrument. As art of the lab and measurements taken there was a

    different usable frequency range for the oscilloscope and the digital

    multimeter

    amp u e amp u e

    Dr. Peter Avitabile University of Massachusetts Lowell

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    amplitude amplitude

    Dr. Peter Avitabile University of Massachusetts Lowell

    frequency requency

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    In addition to instruments, the actual transducers used to makemeasurements also have useful frequency ranges. For instance, a strain

    gage accelerometer and a peizoelectric accelerometer have different useful

    frequency ranges

    amp u e amp u e

    Dr. Peter Avitabile University of Massachusetts Lowell

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    Fs = 100;t = 0:1/Fs:1;

    * * * * * * *

    . .

    % DC plus 5 Hz signal and 40 Hz signal sampled at 100 Hz for 1 sec

    2

    1.5Total Signal

    DC Level

    0.5

    plitude(volts)

    Signal

    -0.5

    0A g requency

    0 0.2 0.4 0.6 0.8 1-1

    Time (sec)

    http://cobweb.ecn.purdue.edu/~aae520/

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    1 .5

    2

    Original1

    1.2

    - 1

    - 0 . 5

    0

    0 .5

    1

    Amplitud

    e(volts) Signal

    Filter

    Filtfilt0.2

    0.4

    0.6

    0.8

    AmplitudeRatio

    Low Passecovers

    DC + 3Hz

    . . .T i m e ( s e c )

    0 .5

    1

    1 .5

    2

    de(vo

    lts)

    0 10 20 30 40 50Frequency (Hz)

    0.8

    1

    1.2

    eRatio

    Cheby2

    High Pass Recovers

    0 0 . 2 0 . 4 0 . 6- 1

    - 0 . 5

    0

    T i m e ( s e c )

    Amplit

    2

    0 10 20 30 40 500

    0.2

    0.4

    .

    Frequency (Hz)

    Amplitud

    1 2

    - 0 . 5

    0

    0 .5

    1

    1 .5

    Amplitude(volts)

    0.4

    0.6

    0.8

    1

    .

    AmplitudeRatio Cheby2Band Pass Recovers

    3Hz

    0 0 . 2 0 . 4 0 . 6- 1 . 5

    - 1

    T i m e ( s e c )

    1 .5

    2

    0 10 20 30 40 500

    0.2

    Frequency (Hz)

    1

    1.2

    - 1

    - 0 . 5

    0

    0 .5

    1

    Amplitude(volts)

    0.2

    0.4

    0.6

    0.8

    AmplitudeRatio

    Cheby2

    Stop Band

    ecovers

    DC + 40Hz

    . . .T i m e ( s e c )0 10 20 30 40 50

    Frequency (Hz)

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    easuremen rror

    True Value

    as rror

    Systematic Error

    Remains Constant During Test

    i

    Bias Error

    Calibration

    or judgement

    Random ErrorPrecision ( Random Error )Precision Index - Estimate ofxxii =

    Total Error

    Deviation

    A statistic, s, is calculated

    from data to estimate the recisionerror and is called the precision

    index

    N

    i = + i

    11

    = N

    xx

    s

    i

    We may categorize bias into five classes :

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    o large known biases,

    o small known biases,

    o large unknown biases and

    o small unknown biases that may have unknown sign () or known sign.

    The large known biases are eliminated by comparing the instrument to a standard

    instrument and obtaining a correction. This process is called calibration.

    Small known biases may or may not be corrected depending on the difficulty of the

    correction and the magnitude of the bias.

    The unknown biases, are not correctable. That is, we know that they may exist but we do

    not know the sign or magnitude of the bias.

    Five types of bias errors

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    .

    The introduction of such errors converts the controlled measurement process

    into an uncontrolled worthless effort.

    Large unknown biases usually come from human errors in data processing,

    incorrect handling and installation of instrumentation, and unexpectedenvironmental disturbances such as shock and bad flow profi les. We

    must assume that in a well controlled measurement process there are no

    large unknown biases. To ensure that a controlled measurement process

    exists, all measurements should he monitored with statistical quality control

    charts.

    Measurement Error

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    Precise, Accurate (Unbiased) Precise, Inaccurate (Biased)

    Im recise Accurate Unbiased Im recise Inaccurate Biased

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    Instrument

    Readin s

    Truea ue

    &precise

    butprecise

    butaccurate

    &imprecise

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    arame er s ma on

    A desirable criterion in a statistical estimator is unbiasedness. A statistic is

    unbiased if the expected value of the statistic is equal to the parameter being

    estimated.

    Unbiased estimators of the parameters, , the mean, and , the standarddeviation are:

    xN

    i Estimation of meanN

    x=

    [ mean(data) ]

    )(1

    2

    =

    xxN

    i Estimation of standard deviation,

    1N

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    Estimate of the Probability Density Function

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    Estimate of the Probability Density Function

    [ hist(data,# of bins) ]

    700

    800

    500

    600

    200

    300

    850 900 950 1000 1050 11000

    100

    (data measured)

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    Examine the data for consistent. No matter how hard one tries, there will always be some datapoints that appear to be grossly in error. The data should follow common sense consistency, and

    points that do not appear "proper" should be eliminated. If very many data points fall in the

    category of "inconsistent" perhaps the entire experimental procedure should be investigated for

    gross mistakes or miscalculations.

    Perform a statistical analysis of data where appropriate. A statistical analysis is only appropriatewhen measurements are repeated several times. If this is the case, make estimates of such

    parameters as standard deviation, etc.

    Estimate the uncertainties in the results. These calculations must have been performed in

    advance so that the investigator will already know the influence of different variables by the time

    the final results are obtained.

    Anticipate the results from theory. Before trying to obtain correlations of the experimental data,

    the investigator should carefully review the theory appropriate to the subject and try to think some

    information that will indicate the trends the results may take. Important dimensionless groups,

    pertinent functional relations, and other information may lead to a fruitful interpretation of the data.

    Correlate the data. The experimental investigator should make sense of the data in terms of

    physical theories or on the basis of previous experimental work in the field. Certainly, the results

    of the experiments should be analyzed to show how they conform to or differ from previous

    investigations or standards that may be employed for such measurements.

    (Ref. Holman, J. P., Experimental Methods for Engineers")