keti ferrite beads x-rayユーザー会用 pptx20 summary and j-chip judgement optical analyses...

(2016.03.11 )

Introduction

4

• Specimen: Chip Bead

• Test: - Electrical property measurements- X-ray analyses- SEM analyses- Environmental tests

• Test term: 2015. 12. 10 ~ 2016. 03. 08

• Test environment: (25 ± 5) ℃, Below 75% room humidity

• Test apparatuses:- Precision impedance analyzer (4294A, Agilent, USA)- X-ray (Revolution, X-tek, USA)- Focused ion beam (Quanta 3D DualBeam, FEI, Netherland)- Temperature and humidity environmental test chamber (Excal 5425H,

Climates, France)

• Etc: Blind test

• Contact: Lee, Ju Ho ☎ +82-31-789-7282 / leejuho@keti.re.kr

Introduction

5

• Test apparatuses:- Precision impedance analyzer (4294A, Agilent, USA)

Introduction

6

• Test apparatuses:- X-ray (Revolution, X-tek, USA)

Introduction

7

• Test apparatuses:- Focused ion beam (Quanta 3D DualBeam, FEI, Netherland)

Introduction

8

• Test apparatuses:- Temperature and humidity environmental test chamber

(Excal 5425H, Climates, France)

Specimens

9

A社社社社 1608

11

With a small dent

MAXECHO

A社社社社 2125

12

MAXECHO

A社社社社 2125

13

MAXECHO

B社社社社 1608

14

MURATA

B社社社社 2125

15

MURATA

B社社社社 2125

16

MURATA

C社社社社 1608

17

Samwha

C社社社社 2125

18

Samwha

C社社社社 2125

19

Samwha

20

Summary and J-chip judgement

Optical analyses result

<J-chip comment>

All of specimens are on problem except A1608. But, A1608 phenomenon is not severe which influence the electrical quality.

With a small dent

<A1608 optical analyses>

A社社社社 1608

22

MAXECHO

A社社社社 2125

23

MAXECHO

B社社社社 1608

24

MURATA

B社社社社 2125

25

MURATA

C社社社社 1608

26

Samwha

C社社社社 2125

27

Samwha

28

Summary and J-chip judgement

<J-chip comment>

All of specimens are no problem( satisfied with our expectations.)

<Multi layer ferrite beads>

X-ray analyses result