an 800-mhz embedded dram with a concurrent refresh mode toshiaki kirihata, senior member, ieee, paul...

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An 800-MHz Embedded DRAM With a Concurrent Refresh m Toshiaki Kirihata, Senior Member, IEEE, Paul Parries, David R. Hanson, Hoki Kim, Member, IEEE, John Golz, Gregory Fredeman, Raj Rajeevakumar , Member, IEEE, John Griesemer, Norman Robson, Alberto Cestero, Babar A. Khan, Geng Wang, Member, IEEE, Matt Wordeman, Senior Member, IEEE, and Subramanian S. Iyer, Fellow, IEEE IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 40, NO. 6, JUNE 2005

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Page 1: An 800-MHz Embedded DRAM With a Concurrent Refresh mode Toshiaki Kirihata, Senior Member, IEEE, Paul Parries, David R. Hanson, Hoki Kim, Member, IEEE,

An 800-MHz Embedded DRAMWith a Concurrent Refresh mode

Toshiaki Kirihata, Senior Member, IEEE, Paul Parries, David R. Hanson, Hoki Kim, Member, IEEE,John Golz, Gregory Fredeman, Raj Rajeevakumar, Member, IEEE, John Griesemer, Norman Robson,Alberto Cestero, Babar A. Khan, Geng Wang, Member, IEEE, Matt Wordeman, Senior Member, IEEE, andSubramanian S. Iyer, Fellow, IEEE

IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 40, NO. 6, JUNE 2005

Page 2: An 800-MHz Embedded DRAM With a Concurrent Refresh mode Toshiaki Kirihata, Senior Member, IEEE, Paul Parries, David R. Hanson, Hoki Kim, Member, IEEE,

Highlights

Size:256 Mb Cell Size : Cell Area : External IO Voltage : 1.5V Word line material: CoSi2 (Cobalt Silicide) Banks: 16 Embedded DRAM High performance cell 2.2nm Gate oxide Concurrent Refresh Mode Concurrent Refresh Scheduler Command Multiplier for 800MHz memory frequency.

20.168mμ0.300.56mmμμ×

Page 3: An 800-MHz Embedded DRAM With a Concurrent Refresh mode Toshiaki Kirihata, Senior Member, IEEE, Paul Parries, David R. Hanson, Hoki Kim, Member, IEEE,

2.High Performance Cell Scaling of the cell is achieved by reducing the gate oxide

thickness to 2.2nm. 10% Cell size reduction over the conventional memory cell

(Gate-oxide thickness:5.2nm). Enables use of reduced voltages in memory cell and the

wordline driverDisadvantage: Results in short data retention time of For example a 4 Mb memory having 8K wordlines, requires 8K

refresh cycles within ,this will require one refresh command in 8 ns, resulting in 0% memory available for an 8ns memory cycle.

Solution: Refresh more cells per refresh command by activating multiple

wordlines, which requires more current. 25% increase in current is observed by lower threshold, shorter

channel, and thinner oxide.

64sμ

64sμ

Integrates a DRAM on the same die with microprocessor.

1.Embedded DRAM

Page 4: An 800-MHz Embedded DRAM With a Concurrent Refresh mode Toshiaki Kirihata, Senior Member, IEEE, Paul Parries, David R. Hanson, Hoki Kim, Member, IEEE,

Concurrent Refresh Mode

Refreshes memory by bank select signal while concurrently enabling the memory access operation.

For 16 banks, we have two sets of ports BSEL0-15 :

o Memory access operation. o Each port activates the corresponding array Bank0-15

RBSEL0-15 :

o Refresh operation.o Refresh bank select ports activate the corresponding array

independent from memory access operation.o The addresses BSEL0-15 and RBSEL0-15 are fetched at the clock

edge along with read and write signals.o Correct management of BSEL0-15 and RBSEL0-15 can give 99-

100% memory utilization.

Page 5: An 800-MHz Embedded DRAM With a Concurrent Refresh mode Toshiaki Kirihata, Senior Member, IEEE, Paul Parries, David R. Hanson, Hoki Kim, Member, IEEE,

Concurrent Refresh Mode - Architecture

Page 6: An 800-MHz Embedded DRAM With a Concurrent Refresh mode Toshiaki Kirihata, Senior Member, IEEE, Paul Parries, David R. Hanson, Hoki Kim, Member, IEEE,

Concurrent Refresh Mode - Architecture

Page 7: An 800-MHz Embedded DRAM With a Concurrent Refresh mode Toshiaki Kirihata, Senior Member, IEEE, Paul Parries, David R. Hanson, Hoki Kim, Member, IEEE,

Concurrent Refresh Scheduler

Examines the incoming memory access addressing.

Decides which bank to refresh.

Two shift registers (up -count and down-count) are used to identify two memory banks to refresh. (FU & FD)

To avoid contention with memory access operation the each bit from the ‘OR’ is gated with a BSEL.

When BSEL is high RBSEL is blocked.

Page 8: An 800-MHz Embedded DRAM With a Concurrent Refresh mode Toshiaki Kirihata, Senior Member, IEEE, Paul Parries, David R. Hanson, Hoki Kim, Member, IEEE,

Questions??