an introduction to x-analysis integration (xai) part 3: example applications georgia tech...
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An Introduction toX-Analysis Integration (XAI)
Part 3:Example Applications
Georgia Tech
Engineering Information Systems Lab
eislab.gatech.edu
Contact: Russell S. Peak
Revision: March 15, 2001
Copyright © 1993-2001 by Georgia Tech Research Corporation, Atlanta, Georgia 30332-0415 USA. All Rights Reserved.Developed by eislab.gatech.edu. Permission to use for non-commercial purposes is hereby granted provided this notice is included.
2Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
An Introduction to X-Analysis Integration (XAI) Short Course Outline
Part 1: Constrained Objects (COBs) Primer– Nomenclature
Part 2: Multi-Representation Architecture (MRA) Primer – Analysis Integration Challenges – Overview of COB-based XAI
Part 3: Example Applications» Airframe Structural Analysis (Boeing)» Circuit Board Thermomechanical Analysis
(DoD: ProAM; JPL/NASA)» Chip Package Thermal Analysis (Shinko)
– Summary
Part 4: Advanced Topics & Current Research
3Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Airframe Structural AnalysisGIT Work in Boeing PSI Project
Current Situation: Limited Analysis Integration
Manually-MaintainedAssociativity
Error-Prone, Labor-Intensive,Little Knowledge Capture
flap support assembly inboard beam (a.k.a. “bike frame”)
bulkhead assembly attach point
diagonal braceattach point
AnalysisDocumentationDesign Objects
4Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Airframe Structural AnalysisTarget Situation: Enhanced Analysis Interoperability
Analysis Objects
Modular, Integrated, Active, Multidirectional, Reusable, User-Definable
diagonal brace lug jointj = top
0.7500 in
0.35 in
0.7500 in
1.6000 in
2
0.7433
14.686 K
2.40
4.317 K
8.633 K
k = norm
Max. torque brake settingdetent 30, 2=3.5º
7050-T7452, MS 7-214
67 Ksi
L29 -300
Outboard TE Flap, Support No 2;Inboard Beam, 123L4567
Diagonal Brace Lug Joint
Program
Part
Feature
Lug JointAxial Ultimate Strength Model
Template
j = top lugk = normal diameter (1 of 4)
Dataset
material
deformation model
max allowable ultimate stress, FtuL
effective width, W
analysis context
objective
mode (ultimate static strength)
condition
estimated axial ultimate strength
Margin of Safety(> case)
allowable
actual
MS
normal diameter, Dnorm
thickness, t
edge margin, e
Plug joint
size,n
lugs
lugj hole
diameters
product structure (lug joint)
r1
n
P jointlug
L [ j:1,n ]
Plug
L [ k]Dk
oversize diameter, DoverD
PaxuW
e
t
Ftuax
Kaxu
Lug Axial UltimateStrength Model
BDM 6630
0.4375 in
0.5240 in
0.0000 in
2.440 in
1.267 in
0.307 in
0.5 in
0.310 in
2.088 in
1.770 in
67000 psi
65000 psi
57000 psi
52000 psi
39000 psi
0.067 in/in
0.030 in/in
5960 Ibs
1
10000000 psi
9.17
5.11
9.77
rear spar fitting attach point
BLE7K18
2G7T12U (Detent 0, Fairing Condition 1)
L29 -300
Outboard TE Flap, Support No 2;Inboard Beam, 123L4567
Bulkhead Fitting Joint
Program
Part
Feature
Channel FittingStatic Strength Analysis
Template
1 of 1Dataset
strength model
r1
e
b
h
tb
te
Pu
Ftu
E
r2
r0
a
FtuLT
Fty
FtyLT
epuLT
tw
MSwall
epu
jm
MSepb
MSeps
Channel FittingStatic Strength Analysis
Fsu
IAS FunctionRef D6-81766
end pad
base
material
wall
analysis context
mode: (ultimate static strength)
condition:
heuristic: overall fitting factor, Jm
bolt
fitting
headradius, r1
hole radius, ro
width, b
eccentricity, e
thickness, teheight, h
radius, r2
thickness, tb
hole
thickness, twangled height, a
max allowable ultimate stress,
allowable ultimate long transverse stress,
max allowable yield stress,
max allowable long transverse stress,
max allowable shear stress,
plastic ultimate strain,
plastic ultimate strain long transverse,
young modulus of elasticity,
load, Pu
Ftu
Fty
FtyLT
Fsu
epu
epuLT
E
FtuLT
product structure (channel fitting joint)flap support assembly inboard beam (a.k.a. “bike frame”)
bulkhead assembly attach point
diagonal braceattach point
Pullable Views
lug analysis fitting analysis
Design Objects
5Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Analysis Tools
0.4375 in
0.5240 in
0.0000 in
2.440 in
1.267 in
0.307 in
0.5 in
0.310 in
2.088 in
1.770 in
67000 psi
65000 psi
57000 psi
52000 psi
39000 psi
0.067 in/in
0.030 in/in
5960 Ibs
1
10000000 psi
9.17
5.11
9.77
rear spar fitting attach point
BLE7K18
2G7T12U (Detent 0, Fairing Condition 1)
L29 -300
Outboard TE Flap, Support No 2;Inboard Beam, 123L4567
Bulkhead Fitting Joint
Program
Part
Feature
Channel FittingStatic Strength Analysis
Template
1 of 1Dataset
strength model
r1
e
b
h
tb
te
Pu
Ftu
E
r2
r0
a
FtuLT
Fty
FtyLT
epuLT
tw
MSwall
epu
jm
MSepb
MSeps
Channel FittingStatic Strength Analysis
Fsu
IAS FunctionRef D6-81766
end pad
base
material
wall
analysis context
mode: (ultimate static strength)
condition:
heuristic: overall fitting factor, Jm
bolt
fitting
headradius, r1
hole radius, ro
width, b
eccentricity, e
thickness, teheight, h
radius, r2
thickness, tb
hole
thickness, twangled height, a
max allowable ultimate stress,
allowable ultimate long transverse stress,
max allowable yield stress,
max allowable long transverse stress,
max allowable shear stress,
plastic ultimate strain,
plastic ultimate strain long transverse,
young modulus of elasticity,
load, Pu
Ftu
Fty
FtyLT
Fsu
epu
epuLT
E
FtuLT
product structure (channel fitting joint)
Flexible High Diversity Design-Analysis Integration Phase 1 Airframe Examples:
“Bike Frame” / Flap Support Inboard Beam
Analysis Modules (CBAMs) of Diverse Feature:Mode, & Fidelity
Design Tools
Materials DBFEA
Elfini*MATDB-like
Analyzable Product Model
XaiTools
XaiTools
Fitting:Bending/Shear
3D
1.5D
Modular, ReusableTemplate Libraries
MCAD ToolsCATIA
Lug:Axial/Oblique; Ultimate/Shear
1.5D
Assembly:Ultimate/
FailSafe/Fatigue*
* = Item not yet available in toolkit (all others have working examples)
diagonal brace lug jointj = top
0.7500 in
0.35 in
0.7500 in
1.6000 in
2
0.7433
14.686 K
2.40
4.317 K
8.633 K
k = norm
Max. torque brake settingdetent 30, 2=3.5º
7050-T7452, MS 7-214
67 Ksi
L29 -300
Outboard TE Flap, Support No 2;Inboard Beam, 123L4567
Diagonal Brace Lug Joint
Program
Part
Feature
Lug JointAxial Ultimate Strength Model
Template
j = top lugk = normal diameter (1 of 4)
Dataset
material
deformation model
max allowable ultimate stress, FtuL
effective width, W
analysis context
objective
mode (ultimate static strength)
condition
estimated axial ultimate strength
Margin of Safety(> case)
allowable
actual
MS
normal diameter, Dnorm
thickness, t
edge margin, e
Plug joint
size,n
lugs
lugj hole
diameters
product structure (lug joint)
r1
n
P jointlug
L [ j:1,n ]
Plug
L [ k]Dk
oversize diameter, Dover
D
PaxuW
e
t
Ftuax
Kaxu
Lug Axial UltimateStrength Model
BDM 6630
Fasteners DB
FASTDB-like
General Math Mathematica
In-HouseCodes
Image API(CATGEO)
6Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Today’s Fitting Catalog Documentation from DM 6-81766 Design Manual
Channel Fitting End Pad Bending Analysis
AngleFitting
BathtubFitting
ChannelFitting
Categories of Idealized FittingsCalculation Steps
7Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Object-Oriented Hierarchy of Fitting ABBs
Fitting Casing Body
Channel Fitting Casing Body*
Bathtub Fitting Casing Body
Angle FittingCasing Body
Fitting System ABB
Fitting Wall ABBFitting End Pad ABB
Fitting Bolt Body*
Open Wall FittingCasing Body
Fitting End Pad Bending ABB Fitting End Pad
Shear ABB*
Open Wall Fitting End Pad Bending ABB
Channel FittingEnd Pad Bending ABB*
e
se
tr
Pf
02
3 )2( b 1 teKC
21
e
be
ht
PCf
21 1 KKC
),,,( 011 erRrfK
),(2 we ttfK
),,( 13 hbrfK
baR
2
dfRe
),min( wbwaw ttt
bolt
load
Fitting Washer Body
Specialized Analysis Body
P
ABB
Specialized Analysis System
washercasing
* = Working Examples
8Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
r1
sefactual shear stress,bolt.head.radius, r0
end_pad.thickness, te
load, P e
setr
Pf
02
Channel Fitting System ABBs
End Pad Bending Analysis
End Pad Shear Analysis
e n d _ p a d .e cce n tr ic ity , e
e n d _ p a d .w id th , b
b o lt.h o le .ra d iu s , r1
r2 r3
r1
h
r1
h
be n d _ p a d .h e ig h t, h3K
befa c tu a l b e n d in g s tre ss ,
ch a n n e l f itt in g fa c to r,
D M 6 -8 1 7 6 6 F ig u re 3 .3
b a se .th ickn e ss , tb
e n d _ p a d .th ickn e ss , te
lo a d , P
23 )2(e
bbeht
PteKf
0.1
0.2
0.3
0.41
1.5
2
2.5
3
0.4
0.6
0.8
1
0.1
0.2
0.3
0.4
9Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
0.1
0.2
0.3
0.41
1.5
2
2.5
3
0.4
0.6
0.8
1
0.1
0.2
0.3
0.4
Implementation of Channel Fitting Factor, K3 as a Reusable Relation in an External Tool
r_1/h = 0.1 r_1/h = 0.2 r_1/h = 0.3 r_1/h = 0.4b/h K_3 b/h K_3 b/h K_3 b/h K_31.0 0.836 1.0 0.5525 1.0 0.395 1.0 0.281.04 0.8575 1.04 0.575 1.04 0.415 1.04 0.29751.1 0.8752 1.1 0.596 1.1 0.437 1.1 0.3171.2 0.898 1.2 0.618 1.2 0.461 1.18 0.3351.34 0.92 1.34 0.641 1.34 0.485 1.34 0.3591.5 0.938 1.5 0.66 1.5 0.505 1.5 0.3751.8 0.9645 2.0 0.705 2.02 0.55 2.0 0.4152.1 0.985 2.54 0.74 2.4 0.575 2.52 0.4453.0 1.035 3.0 0.756 3.0 0.607 3.0 0.468
DM 6-81766 Graph (Figure 3.3) 1.5 2 2.5 3
0.45
0.5
0.55
0.60.15 0.2 0.25 0.3 0.35 0.4
0.5
0.6
0.7
0.8
0.9
Mathematica Implementation
3K
3K
3K
h
b
h
r1
h
b
h
r1
Design Manual Curves
10Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Reusable Channel Fitting Analysis Module (CBAM)
strength model
r1
e
b
h
tb
te
Pu
Ftu
E
r2
r0
a
FtuLT
Fty
FtyLT
epuLT
tw
MSwall
epu
jm
MSepb
MSeps
Channel FittingStatic Strength Analysis
Fsu
IAS FunctionRef DM 6-81766
end pad
base
material
wall
analysis context
mode: (ultimate static strength)
condition:
heuristic: overall fitting factor, Jm
bolt
fitting
headradius, r1
hole radius, ro
width, b
eccentricity, e
thickness, teheight, h
radius, r2
thickness, tb
hole
thickness, twangled height, a
max allowable ultimate stress,
allowable ultimate long transverse stress,
max allowable yield stress,
max allowable long transverse stress,
max allowable shear stress,
plastic ultimate strain,
plastic ultimate strain long transverse,
young modulus of elasticity,
load, Pu
Ftu
Fty
FtyLT
Fsu
epu
epuLT
E
FtuLT
product structure (channel fitting joint)
11Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Diagonal Brace Lug Bulkhead Fitting Casing
Application to an Airframe PartAPM Associativity with Tagged CATIA Model
Bike Frame CATIA CAD Model
rib8.thickness
cavity3.inner_width
12Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
APM Interface with Tagged CAD Models
APMCOB Tool
7) Solve idealizations8) Use in analysis
part_number : “9162”; hole1.radius : ?;hole2.radius : ?;length1 : ?;
tk/tclCATGEOwrapper
CATIA(CAD tool)
part_number : “9162”; hole1.radius : 2.5;hole2.radius : 4.0;length1 : 20.0;
1) 2) request
4)
5)
6) response
GITInterfaceprogram
0) Designer - Creates design geometry - Defines APM-compatible parameters/tags
3)
3 and 4 similar to other CAD APIs
COB instance format
13Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Bike Frame APM Constraint SchematicBulkhead Fitting Portion (partial)
bulkhead assy attach, point fitting
cavity 3
rib 8
bike_frame
rib 9
end_pad
base
wall
width, b
base
inner_width
min_thickness
thickness, t8
thickness, t9
...
hole
thickness, te
2
1
Idealization Relations- Reuse from standard APM fitting template
or adapt for part feature-specific cases (as here)
Idealizedfeatures(std. APMtemplate)
Detaileddesignfeatures
14Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Explicit Capture of Idealizations
(part-specific template adaptation in bike frame case)
Features/ParametersTagged in CAD Model (CATIA)
zf
xf
cavity3.base.minimum_thickness
yf
xf
rib8
cavity 3
rib9
= t8,t 9
rib8.thicknessrib9.thickness
cavity3.width, w3
zf
yf
xf
zfxf
yf
i - Relations between CAD parameters and idealized parameters1 : b = cavity3.inner_width + rib8.thickness/2 + rib9.thickness/22 : te = cavity3.base.minimum_thickness
Idealized Features
Tension Fitting Analysis
yf
Missing in
Today’s Process
2
1
15Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Typical Analysis Results DocumentationMissing Explicit Design-Analysis Associativity
CAD Modelbulkhead assembly attach point
CAE Model channel fitting analysis
materialproperties
idealizedanalysis
geometry
analysisresults
detaileddesigngeometry
No explicit
fine-grained
CAD-CAE
associativity
inconsisten
cy littleautomationlittleknowledge capture
16Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Bike Frame Bulkhead Fitting AnalysisCOB-based Analysis Template (CBAM) - Constraint Schematic
0.4375 in
0.5240 in
0.0000 in
2.440 in
1.267 in
0.307 in
0.5 in
0.310 in
2.088 in
1.770 in
67000 psi
65000 psi
57000 psi
52000 psi
39000 psi
0.067 in/in
0.030 in/in
5960 Ibs
1
10000000 psi
9.17
5.11
9.77
bulkhead fitting attach point
LE7K18
2G7T12U (Detent 0, Fairing Condition 1)
L29 -300
Outboard TE Flap, Support No 2;Inboard Beam, 123L4567
Bulkhead Fitting Joint
Program
Part
Feature
Channel FittingStatic Strength Analysis
Template
1 of 1Dataset
strength model
r1
e
b
h
tb
te
Pu
Ftu
E
r2
r0
a
FtuLT
Fty
FtyLT
epuLT
tw
MSwall
epu
jm
MSepb
MSeps
Channel FittingStatic Strength Analysis
Fsu
IAS FunctionRef DM 6-81766
end pad
base
material
wall
analysis context
mode: (ultimate static strength)
condition:
heuristic: overall fitting factor, Jm
bolt
fitting
headradius, r1
hole radius, ro
width, b
eccentricity, e
thickness, teheight, h
radius, r2
thickness, tb
hole
thickness, twangled height, a
max allowable ultimate stress,
allowable ultimate long transverse stress,
max allowable yield stress,
max allowable long transverse stress,
max allowable shear stress,
plastic ultimate strain,
plastic ultimate strain long transverse,
young modulus of elasticity,
load, Pu
Ftu
Fty
FtyLT
Fsu
epu
epuLT
E
FtuLT
product structure (channel fitting joint)
17Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Bike Frame Bulkhead Fitting AnalysisCOB-based Analysis Template (CBAM) - in XaiTools
Detailed CAD datafrom CATIA
Idealized analysis features in APM
Explicit multi-directional associativity between detailed CAD data & idealized analysis features
Modular generic analysis templates(ABBs)
Library data for materials & fasteners
Focus Point ofCAD-CAE Integration
18Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Bike Frame Diagonal Brace Lug Joint Analysis
Typical Current Approach
19Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Lug Template Applied to Bike Frame
diagonal brace lug jointj = top
0.7500 in
0.35 in
0.7500 in
1.6000 in
2
0.7433
14.686 K
2.40
4.317 K
8.633 K
k = norm
Max. torque brake settingdetent 30, 2=3.5º
7050-T7452, MS 7-214
67 Ksi
L29 -300
Outboard TE Flap, Support No 2;Inboard Beam, 123L4567
Diagonal Brace Lug Joint
Program
Part
Feature
Lug JointAxial Ultimate Strength Model
Template
j = top lugk = normal diameter (1 of 4)
Dataset
material
deformation model
max allowable ultimate stress, FtuL
effective width, W
analysis context
objective
mode (ultimate static strength)
condition
estimated axial ultimate strength
Margin of Safety(> case)
allowable
actual
MS
normal diameter, Dnorm
thickness, t
edge margin, e
Plug joint
size,n
lugs
lugj hole
diameters
product structure (lug joint)
r1
n
P jointlug
L [ j:1,n ]
Plug
L [ k]Dk
oversize diameter, DoverD
PaxuW
e
t
Ftuax
Kaxu
Lug Axial UltimateStrength Model
DM 6630
APM ABB
ABB
CBAM
SMM
*WIP items
Solution Tool Interaction
Boundary Condition Objects(links to other analyses)*
CAD-CAEAssociativity (idealization usage)
Material Models
PullableViews*
Geometry
Focus Point of
CAD-CAE IntegrationR
c
b
= f( c , b , R )W = f( R , D , )
axial direction
e
D
20Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Accomplishments - Phase 1 Developed analysis template language & techniques:
– Facilitates template generation & usage – Captures associativity with design information & other analyses – Aids integration of existing CAD & CAE capabilities
» Demonstrates concepts to include in current tools» Wraps and reuses current tools in next generation tools
Implemented representative examples:– Associativity with CATIA CAD models and libraries (materials, fasteners)– Use of existing solvers as black boxes (e.g., FEA, math, in-house tools) – Creation of modular, reusable template catalogs: lugs & fittings– Usage in “bike frame”:
» Bulkhead & rear spar channel fittings (part-specific adaptation)
» Diagonal brace lug joint
21Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Anticipated Benefits - Current Phases Provide methodology for bridging associativity gap
– Focus: Cases with different design vs. analysis geometries Ex. Multi-part built-up structure
– Reduce costs, decrease time, increase quality:» Improve engineering productivity» Reduce information inconsistencies» Increase analysis intensity & effectiveness» Capture engineering knowledge in a reusable form
Progress along production solution path for next.-generation structures environment– Clarify and evaluate recommended approaches– Build consensus with users and developers
(in incrementally larger groups)
See Advanced Topics
re: Current Work
22Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
An Introduction to X-Analysis Integration (XAI) Short Course Outline
Part 1: Constrained Objects (COBs) Primer– Nomenclature
Part 2: Multi-Representation Architecture (MRA) Primer – Analysis Integration Challenges – Overview of COB-based XAI
Part 3: Example Applications» Airframe Structural Analysis (Boeing)» Circuit Board Thermomechanical Analysis
(DoD: ProAM; JPL/NASA)» Chip Package Thermal Analysis (Shinko)
– Summary
Part 4: Advanced Topics & Current Research
23Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
ProAM Project Highlights
Title: Product Data-Driven Analysis in a Missile Supply Chain (ProAM)
Sponsor: National ECRC Program
From DoD DLA/DISA Joint Electronic Commerce Program Office (JECPO),
via subcontract under Concurrent Technologies Corp. (CTC)
Technical Team: AMCOM - Stakeholder, Atlanta ECRC/Georgia Tech (lead)
SMEs: Circuit Express (Tempe), S3 (Huntsville)
Duration: 8/97-6/99
Focus: - X-Analysis Integration (XAI) techniques
- Engineering Service Bureau (ESB) paradigm for SMEs
- Electronics domain (PWA/Bs) - STEP AP210, etc.
Extensions: - Transform demo ESB into SME commercial pilot
- Release next-generation XAI toolkitSME = small-medium enterprise
24Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
STEP AP 210PWA/B Design Information
Technology
Physical
Geometry
• Component Placement• Bare Board Geometry• Layout items• Layers non-planar, conductive & non-conductive• Material product
• Geometrically Bounded 2-D Shape• Wireframe with Topology • Advanced BREP Solids • Constructive Solid Geometry
Part• Functionality• Termination • Shape 2D, 3D • Single Level Decomposition• Material Product• Characteristics
Configuration Mgmt• Identification• Authority • Effectivity • Control• Requirement Traceability• Analytical Model• Document References
Product Structure/Connectivity
• Functional• Packaged
• Fabrication Design Rules• Product Design Rules
Requirements• Design• Allocation• Constraints• Interface
25Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
ProAM Technical Team
Circuit Express
AtlantaECRC
GeorgiaTech
AMCOM
S3
Missile supply chain SME• PWB fabrication expertise• Tool usage & feedback Electronic commerce resource center
• Mgt., ESB, computing support
Research & development lab• Program management• Technical concepts• Tool implementation
Missile supply chain SME• PWB design & fabrication expertise• Tool usage & feedback
Missile system end-users• Supply chain context• Technical oversight
26Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
ProAM Focus Highly Automated Internet-based Analysis Modules
World WideEnd UserAMCOM
Feedback,Products
AtlantaPhysical SimulationU-Engineer.com
Internet-basedEngineering Service
Bureau
Self-ServeResults
Response to RFP,Technical Feedback,Products
Missile Mfg.
Prime 1
TempePWB Fabricator
Life CycleNeeds
FrionaPWB Fabricator
SME 2
RockhillPWB Fabricator
SME 1 SME n
…
IdealizedProductData
ProAM Focus
RFP with Product Data (STEP, IPC, …)
27Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Why Do SME Manufacturers Need Analysis?
Typically niche-experts– Precise mfg. process knowledge – Specialized product design knowledge
(ex. PWB laminates) SME analysis needs
– Product improvements (DFM)– Mfg. process troubleshooting– Mfg. process optimization
More accurate data Better analysis Bottom line drivers:
Higher Yields, Lower Cost, Better Quality, Fewer Delays
28Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Barriers to Ubiquitous Analysis
Lack of awareness High costs of traditional analysis capability
– Secondary: Specialized Software, Training, Hardware – Primary: Model Access/Development, Validation,
Usage Lack of domain-specific integrated tools
Skilled PersonnelProduct Model Analysis Model
29Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
U-Engineer.comSelf-Serve Engineering Service Bureau
Lower cost, better quality, fewer delays in supply chain
Analysis Documentation Ready-to-Use Analysis Modules
30Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
ESB Analysis Module Catalogs & Documentation
31Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Analysis Modules Attributes
32Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Paper-based IPC-D-279 Plated Through Hole Fatigue Analysis
PTH/PTV Fatigue Life Estimation
Tedious to Use
33Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Web-basedIPC-D-279 PTH Analysis Module
Easy to Use
34Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Product Data-DrivenIPC-D-279 PTH Analysis Module
Data Driven aspect: Web Browser Processes Neutral File + Local Browser
Computation+ Less Errors than manual
idealization & re-entry+ Exhaustive search+ Data Compression
(e.g. 100x)+ Security
XparseJavaScriptparsing
GenCAM/GenXEasier to Use
35Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Analysis Data Flow Web-based Approach (c. 1997)
ANSYS
xxx.mailcommands.tmp
rcp
nnnn.gif
gif
xxxx.prep7
ANSYS
db.out
ANSYS
(Analysis Server: Sun)
Browser:PTH Input
(HTML Form)
(Client PC)
Perl CGI Script
xxxx.prep7
ANSYS
Linuxrshrcp
(Web Server: Linux PC)
nnnn.gif
gif
User
Unixmail
Unixrcp
EmailTool
(1)
(3a)(3)(2)
(4)
(3c2)
(3b)
(3c1)
(5) (6)
(n) <actor action>
Data Flow Legend: <tool> <file>
<format>
Possible Newer Methods (c. 2001)Constrained objects, Web application servers, Java-based middleware, XML, ...
36Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
ESB Characteristics
Self-serve analysis– Pre-developed analysis modules
presented in product & process contexts– Available via the Internet – Optionally standards-driven (STEP, GenCAM ...):
» Reduce manual data transformation & re-entry» Highly automated plug-and-play usage
– Enabled by X-analysis integration technology Full-serve analysis as needed Possible business models:
(beyond ProAM scope)
– Pay-per-use and/or Pay-per-period – Costs averaged across customer base
37Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
ProAM Design-Analysis IntegrationElectronic Packaging Examples: PWA/B
Analysis Modules (CBAMs) of Diverse Mode & Fidelity
Design Tools
Laminates DB
FEA Ansys
General MathMathematica
Analyzable Product Model
XaiToolsPWA-B
XaiToolsPWA-B
Solder JointDeformation*
PTHDeformation & Fatigue**
1D,2D
1D,2D,3D
Modular, ReusableTemplate Libraries
ECAD Tools Mentor Graphics,
Accel*
temperature change,T
material model
temperature, T
reference temperature, To
cte,
youngs modulus, E
force, F
area, A stress,
undeformed length, Lo
strain,
total elongation,L
length, L
start, x1
end, x2
mv6
mv5
smv1
mv1mv4
E
One D LinearElastic Model(no shear)
T
e
t
thermal strain, t
elastic strain, e
mv3
mv2
x
FF
E, A,
LLo
T, ,
yL
r1
12 xxL
r2
oLLL
r4
A
F
sr1
oTTT
r3L
L
m a t e r i a l
e f f e c t i v e l e n g t h , L e f f
d e f o r m a t i o n m o d e l
l i n e a r e l a s t i c m o d e l
L o
T o r s i o n a l R o d
G
J
r
2
1
s h e a r m o d u l u s , G
c r o s s s e c t i o n :e f f e c t i v e r i n g p o l a r m o m e n t o f i n e r t i a , J
a l 1
a l 3
a l 2 a
l i n k a g e
m o d e : s h a f t t o r s i o n
c o n d i t i o n r e a c t i o n
t s 1
A
S l e e v e 1
A t s 2
d s 2
d s 1
S l e e v e 2
L
S h a f t
L e f f
s
T
o u t e r r a d i u s , r o a l 2 b
s t r e s s m o s m o d e l
a l l o w a b l e s t r e s s
t w i s t m o s m o d e l
M a r g i n o f S a f e t y( > c a s e )
a l l o w a b l e
a c t u a l
M S
M a r g i n o f S a f e t y( > c a s e )
a l l o w a b l e
a c t u a l
M S
a l l o w a b l et w i s t Analysis Tools
PWBWarpage
1D,2D
Materials DB
PWB Stackup ToolXaiTools PWA-B
STEP AP210‡ GenCAM**,
PDIF*
‡ AP210 DIS WD1.7 * = Item not yet available in toolkit (all others have working examples) ** = Item available via U-Engineer.com
38Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Overview of PWB Stackup Design
Fabrication engineer designs PWB stackup details
Stackup Specs - PWA/B Designer
Layer 1: 1 Oz. Cu Foil
Layer 2: 2 Oz. Cu Foil
Layer 3: 1 Oz. Cu Foil
Layer 6: 1 Oz. Cu Foil
Layer 4: 1 Oz. Cu Foil
Layer 5: 2 Oz. Cu Foil
component
plane
signal
signal
plane
solder
Epoxy Glass GF/ PGF
Epoxy Glass GF/ PGF
Epoxy Glass GF/ PGF
Epoxy Glass GF/ PGF
Epoxy Glass GF/ PGF
.065
.055overbase
material
OR
1 Oz. Cu
1 Oz. Cu
1 Oz. Cu
1 Oz. Cu
2 Oz. Cu
2 Oz. CuM150P2P11184
M150P1P21184
3 x 1080
3 x 1080
2 x 2116
Design Alternative 1
Stackup Design - PWB Fabricator
3 X 106
3 X 106
M150P1P21184
M150P2P11184
M150P1P11184
1 Oz. Cu
1 Oz. Cu
1 Oz. Cu
2 Oz. Cu
2 Oz. Cu
…Design Alternative n
1 Oz. Cu
39Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Impact of Stackup Design
Stackup details impact PWB behavior: warpage, PTH reliability, crosstalk (impedance), etc.
Fabrication engineer needs tools to evaluate alternativesPrecise material and manufacturing process expertise of
fabrication engineer enables more accurate analysis
1 Oz. Cu
1 Oz. Cu
1 Oz. Cu
1 Oz. Cu
2 Oz. Cu
2 Oz. CuM150P2P111824 Polyclad -Tetra
M150P1P211824 Polyclad -Tetra
3 x 1080
3 x 1080
2 x 2116
ManufacturingConditions
Detailed Material Characterization Accurate Analysis Results
which can be compared to Prime’s Specs
40Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Post-LaminationThickness Calculation
Before: Typical Manual Worksheet(as much as 1 hour engr. time)
After: Tool-Aided Design (ProAM)
321
221
1 2/2/C
t
ytC
t
ytC
n
iii
n
iii
B
n
ithickessnestedthicknessationlapost1
__min_
filltoretkthicknessnestedp
isfnsetprepreg _sin__1
_
41Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Iterative Design & Analysis PWB Stackup Design & Warpage Analysis
AnalyzableProduct Model
PWB Stackup Design Tool
1 Oz. Cu
1 Oz. Cu
1 Oz. Cu
1 Oz. Cu
2 Oz. Cu
2 Oz. CuTetra GF
Tetra GF
3 x 1080
3 x 1080
2 x 2116
2D Plane Strain Model
b L T
t
2
Detailed FEA Check
bi i i
i
w y
t w
/ 2
1D Thermal Bending Model
LayupRe-design
PWB Warpage Modules
Quick Formula-based Check
(TIGER extensions)
42Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
PWB Warpage Modulesa.k.a. CBAMs: COB-based analysis templates
total_thicknesspwa
layup layers[0]
layers[1]
layers[2]
TOTAL
CU1T
CU2T
POLYT
PREPREGT
TETRA1T
EXCU
ALPXCU
EXEPGL
ALPXEGL
TO
deformation model
ParameterizedFEA Model
ux mos model
Margin of Safety(> case)
allowable
actual
MS
UX
condition
UY
SX
associated_pwb
nominal_thickness
prepregs[0] nominal_thickness
top_copper_layer nominal_thickness
related_core nominal_thickness
prepregs[0] nominal_thicknesslayers[3]
primary_structure_material linear_elastic_model E
cte
primary_structure_material linear_elastic_model E
cte
reference temperature
temperatureDELTAT
APM ABB
SMM
deformation model
Thermal Bending Beam
L
b
T
Treference
t
T
total diagonalassociated_pwb
total thickness
coefficient of thermal bending
al1
al2
al6
al3
t
TLb
2
warpage
wrapage mos model
allowable
MSactual
Marginof Safety
associated condition
al5
al4
temperature
reference temperature
pwa
APM
ABBPWB Thermal Bending Model (1D formula-based)
PWB Plane Strain Model (2D formula-based)
43Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Original design:– Six layer board– Unsymmetrical layup– Severe warpage– Analysis predicted
thermal distortion Alternate design:
– Modeled construction variables
– Analysis predicted improved distortion
New capability aided design improvement
Example SME Usage
44Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
ProAM Design-Analysis IntegrationElectronic Packaging Examples: PWA/B
Analysis Modules (CBAMs) of Diverse Mode & Fidelity
Design Tools
Laminates DB
FEA Ansys
General MathMathematica
Analyzable Product Model
XaiToolsPWA-B
XaiToolsPWA-B
Solder JointDeformation*
PTHDeformation & Fatigue**
1D,2D
1D,2D,3D
Modular, ReusableTemplate Libraries
ECAD Tools Mentor Graphics,
Accel*
temperature change,T
material model
temperature, T
reference temperature, To
cte,
youngs modulus, E
force, F
area, A stress,
undeformed length, Lo
strain,
total elongation,L
length, L
start, x1
end, x2
mv6
mv5
smv1
mv1mv4
E
One D LinearElastic Model(no shear)
T
e
t
thermal strain, t
elastic strain, e
mv3
mv2
x
FF
E, A,
LLo
T, ,
yL
r1
12 xxL
r2
oLLL
r4
A
F
sr1
oTTT
r3L
L
m a t e r i a l
e f f e c t i v e l e n g t h , L e f f
d e f o r m a t i o n m o d e l
l i n e a r e l a s t i c m o d e l
L o
T o r s i o n a l R o d
G
J
r
2
1
s h e a r m o d u l u s , G
c r o s s s e c t i o n :e f f e c t i v e r i n g p o l a r m o m e n t o f i n e r t i a , J
a l 1
a l 3
a l 2 a
l i n k a g e
m o d e : s h a f t t o r s i o n
c o n d i t i o n r e a c t i o n
t s 1
A
S l e e v e 1
A t s 2
d s 2
d s 1
S l e e v e 2
L
S h a f t
L e f f
s
T
o u t e r r a d i u s , r o a l 2 b
s t r e s s m o s m o d e l
a l l o w a b l e s t r e s s
t w i s t m o s m o d e l
M a r g i n o f S a f e t y( > c a s e )
a l l o w a b l e
a c t u a l
M S
M a r g i n o f S a f e t y( > c a s e )
a l l o w a b l e
a c t u a l
M S
a l l o w a b l et w i s t Analysis Tools
PWBWarpage
1D,2D
Materials DB
PWB Stackup ToolXaiTools PWA-B
STEP AP210‡ GenCAM**,
PDIF*
‡ AP210 DIS WD1.7 * = Item not yet available in toolkit (all others have working examples) ** = Item available via U-Engineer.com
45Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
PWA/B Analyzable Product Model(partial)
<component occurrences>
Resistor Capacitor
STEP EXPRESS-G Notation
attribute 2 S[1:?] (a set) Entity C
attribute 1 Entity B
Entity A1 (a subclass) [ISO 10303-11]
Entity = Class of Objects
Entity A
cost
Integer
Currency
part number
PhysicalObject
SolidMaterialdescription
Image
String
primary structural materialphotos
IntegratedComponent
DiscreteNetwork
Micro-Processor
PWB PWAbody style ElectricalComponent
pwb
PWB Layer
magnitudetolerance
Transistor
DiscreteComponent
Diode
Inductor
power ratingSolderJoint
PWAComponentOccurrence
ComponentOccurrence
referencedesignator
location
solder joint
surface
<location><component>
AssemblyMultimaterialPart
UnimaterialPart component occurrences
assembly
component
2DLocation
total length
total widthtotal height
rotation
xy
<assembly>layers
Part
46Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Solder Joint Deformation CBAMInformal Associativity Mapping
Plane Strain Bodies System
PWA Component Occurrence
CL
1
material ,E( , )geometry
body
plane strain body , i = 1...4PWB
SolderJoint
Epoxy
Componentbase: Alumina
core: FR4
Component Occurrence Plane Strain Model
total height, h
linear-elastic model
1
2
ABBPM
1
3 APM 4 CBAM
2 ABBc
4body 3body
2body
1h oT
primary structural material
3
2
ii
i
47Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
soldersolder joint
pwb
component
1.25
deformation model
total height
detailed shape
rectangle
[1.2]
[1.1]
average
[2.2]
[2.1]
cTc
Ts
inter-solder joint distanceapproximate maximum
sj
L s
primary structural material
total thickness
linear-elastic model
Plane Strain
geometry model 3
a
stress-strainmodel 1
stress-strainmodel 2
stress-strainmodel 3
Bodies System
xy, extreme, 3
T2
L1
T1
T0
L2
h1
h2
T3
Tsj
hs
hc
L c
xy, extreme, sjbilinear-elastoplastic model
linear-elastic model
primary structural material linear-elastic model
componentoccurrence
solder jointshear strainrange
[1.2]
[1.1]length 2 +
Solder Joint Deformation CBAMConstraint Schematic
3 APM 2 ABB2
1
48Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Summary of Accomplishments
General techniques: Internet-based engineering service bureau (ESB) X-analysis integration (XAI)
Product data-driven plug-and-play analysis modules
General purpose XAI toolkit
Applications in specific AMCOM context: U-Engineer.com pilot commercial ESB
with Internet-based PWA/B-specific analysis modules & toolkit
Usage by SMEs in AMCOM supply chain: Full-serve and self-serve missile examples
MaturePrototype
State
EarlyPilot State
49Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Summary of Benefits
Internet-based engineering service bureaus (ESBs)
Key step towards affordable SME analysis Product data-driven analysis technology
Analysis integration toolkit AMCOM missile supply chain application
U-Engineer.com & electronic packaging analysis Exemplar usage of electronic data files like STEP Applicability to other product industries Framework for automated analysis
Improved product performance, reliability, and manufacturability
50Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
An Introduction to X-Analysis Integration (XAI) Short Course Outline
Part 1: Constrained Objects (COBs) Primer– Nomenclature
Part 2: Multi-Representation Architecture (MRA) Primer – Analysis Integration Challenges – Overview of COB-based XAI
Part 3: Example Applications» Airframe Structural Analysis (Boeing)» Circuit Board Thermomechanical Analysis
(DoD: ProAM; JPL/NASA)» Chip Package Thermal Analysis (Shinko)
– Summary
Part 4: Advanced Topics & Current Research
51Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Development of AdvancedCollaborative Engineering Environments (CEEs)
Phase 1: CEE-based Stackup Design Tool
Period: December 2000 - September 2001
ContactsMichael L. Dickerson
[email protected] - NASA
Pasadena, California USAhttp://www.jpl.nasa.gov/
Russell S. [email protected] Institute of Technology
Atlanta, Georgia USAhttp://eislab.gatech.edu/
SynopsisCurrent engineering computing environments can be characterized as largely disjoint setsof tools that exchange information via labor-intensive processes. While some progresshas been made, a good deal of engineering knowledge is not available in effectiveelectronic forms, and interoperability among engineering processes is less than optimum.
For example, today engineers still often manually add numerous notes and sketches toCAD drawings. In spite of being in an electronic form, these notes and sketches are in arelatively low-level representation that is not easily processed by downstream tools.They are primarily intended for human consumption. These items typically requiremanual intervention and re-creation downstream, resulting in increased labor efforts andtranscriptions errors.
Thus, there is a great need to capture the higher level concepts behind these items (e.g.,PWB stackup design intent) in semantically rich knowledge containers. Associativitywith other types of information is also needed (e.g., other rich objects that exist in somecurrent CAD tools). This Phase 1 effort is aimed at a) developing a general methodologyand computing framework for capturing this ancillary information, and b) implementing aprototype PWB stackup tool in this framework to demonstrate this approach.
Phase 1 helps JPL/NASA move along the roadmap defined in Phase 0 to achieve a next-generation collaborative engineering environment. The target environment will leverageadvances in engineering information technology, including standards like STEP, toachieve fine-grain, modular interoperability among design objects and related tools.Techniques based on efforts including Georgia Tech CAD-CAE integration research willbe applied and enhanced, and new approaches will be developed as needed. The targetoutcome is a virtual collaborative engineering environment which increases product lifecycle effectiveness by an order of magnitude or greater.
52Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Outline
AP210-based Environment - JPL/NASA Phase 1– Ancillary Information Problem– Phase 1 Scope (work-in-progress)
» Background: ProAM/TIGER Projects, XAI» Phase 1 Architectures
– Collaboration– Expected Benefits
53Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Design Hub
Central group for CAx tools & processes Supports NASA space system design activities at JPL Management has diverse background:
– Mechanical systems, electronics, systems engineering
“The Design Hub provides computerized tools for JPL engineers
so they may design electrical and mechanical devicesand software programs
for spacecraft.”
54Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
AncillaryInformation
Needed Tools
Tool B1 Tool C1... Tool Bn
Typical end-user tools (for novices experts)
Instance population tools(for experts)
Problem:Insufficient Information Capture
Existing Tools
Tool A1 Tool An
Product Model(e.g., AP210 + AP2xx + ...)
...
“dumb” information capture(only human-sensible,I.e., not computer-sensible)
Legend
55Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Example PWA Ancillary Information
Component AssemblyInstructions
Maximum HeightRestrictions
Stackup Notes
Conformal CoatingRestrictions
PWA = printed wiring assemblyPWB = printed wiring board
56Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Example PWB Ancillary Information
Outline DetailStackup Specs
Stackup Notes
57Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Current Situation (typical) CAx tools of diverse disciplines Each focuses on information subset
(some overlap) Much ancillary information
– Some captured as “dumb” notes & sketches in CAD » Human-oriented, not computer-sensible
– Much not captured at all – Lack of fine-grain explicit associativity
Problems – Manually intensive transformations– Error-prone transcription / re-creation downstream – Little knowledge capture
58Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Target Situation (longer term)
Collaborative Engineering Environment with Advanced Interoperability
Domain Specific Analysis
Cross Domain Analysis
CAx Applications and PDMs
PDMSchema
AnalysisSchema(AP209)
Repository Schema Generator
Requirements Design & Analysis
Data Viewer
SystemEngineeringSchema
Catalog &ViewSchemas
Application Access/Translation Layer
ElectricalSchema(AP210)
MechanicalSchema(AP203)
Documentation Facility
(UML)
Mfg.Capabilities(AP220)
(Text, XML,
SGML, etc.)
(STEP)
(STEP)
(STEP)
(STEP, XML)
(STEP)
Model Development and Interactive Environment
RequestBrokerOrRemoteAccessMech.
ObjectsEntities,Relations &AttributesObject Oriented or Object Relational DBMS
Data Views and PDM
AnalysisAgents
Negotiation/CommunicationsAgents
Data Dictionary Facility
(Express)
Potential Standards-based Architecture (after G. Smith, Boeing)
59Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Outline
AP210-based Environment - JPL/NASA Phase 1– Ancillary Information Problem– Phase 1 Scope (work-in-progress)
» Background: ProAM/TIGER Projects, XAI» Phase 1 Architectures
– Collaboration– Expected Benefits
60Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Phase 1 ScopeWork-in-Progress
Initial step towards vision Capture of representative ancillary information
– Focus: PWB stackup information – Extend Georgia Tech stackup tool (from ProAM) – STEP AP210 as information container structure– Develop & demonstrate method
Initial steps (Phase 1): file-oriented– Use Metaphase as PDM capability– Manage files: ECAD file, MCAD file, Gerber file,
stackup tool file (AP210 subset), ... Next steps (Phase 1+, 2):
Fine-grained interactive sharing (Accelis-type tools)
See ProAMslides forstackupoverview
61Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
LKSoftLKSoft
Collaborative Engineering Environment Initial Steps - Phase 1
Design Tools
Laminates Library
Product KnowledgeManagement System
Metaphase
ECAD Tools Mentor Graphics,
Cadence
Materials Library
PWB Stackup ToolXaiTools PWA-B
Nativefiles
AP210 file CC24
LKSoftSTEP s/w
JSD
AI
LKSoft, ...
Instance Browser/EditorSTEP-Book AP210,
SDAI-Edit,STI AP210 Viewer, ...
Work-In-Progress
AP210 file CCx1-xn
62Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Collaborative Engineering Environment Next Steps - Phase 1+,2
MetaphaseAccelis
Standards-BasedCoarse/Fine-Grained
Interoperability
Notes:Accelis & Metaphase are SDRC products.
Product KnowledgeManagement System
EngineeringMiddleware
LKSoftLKSoft
Design Tools
Laminates Library
ECAD Tools Mentor Graphics, Cadence
Materials Library
PWB Stackup ToolXaiTools PWA-B
LKSoftSTEP s/w
JSD
AI
LKSoft, ...
Instance Browser/EditorSTEP-Book AP210,
SDAI-Edit,STI AP210 Viewer, ...
J2EE-compliantWeb Application Server
Other Tools
AP210 content
63Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
MentorGraphics
LKSoft, …
AncillaryInformation
Added Tools
XaiToolsPWA-B LKSoft, …
Typical end-user tools (for novices experts)
Instance population tools(for experts)
Phase 1 View
Existing ToolsMentor
Graphics
Product Model(AP210)
“dumb” information capture(only human-sensible,I.e., not computer-sensible)
Legend
AP210 Viewer,STEP-Book AP210,
SDAI-Edit, ...
Instance Browser/EditorPWB Stackup Tool
ECAD Tools
64Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Collaboration
JPL/NASA– Primary stakeholder, end users, tool experts
Georgia Tech– Architecture/method, PWB stackup tool, XAI
methods AP210 Implementers Forum
– Common interests & techniques– Cooperative exchanges
JPL/NASA suppliers– Software vendors
65Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Expected Benefits: Phase 1 STEP AP 210-based method
» Depth, extendibility Capture of ancillary information
– Representative tool: PWB stackup design» Graphics, automation» Tangible end user benefits» Technique illustration
– “Better, faster, cheaper”» Increased product model completeness» Reduced downstream errors» Increased automation» Increased knowledge retention
66Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
An Introduction to X-Analysis Integration (XAI) Short Course Outline
Part 1: Constrained Objects (COBs) Primer– Nomenclature
Part 2: Multi-Representation Architecture (MRA) Primer – Analysis Integration Challenges – Overview of COB-based XAI
Part 3: Example Applications» Airframe Structural Analysis (Boeing)» Circuit Board Thermomechanical Analysis
(DoD, JPL/NASA)» Chip Package Thermal Analysis (Shinko)
– Summary
Part 4: Advanced Topics & Current Research
67Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Phase 1 Summary - Shinko Project (Phase 2 is underway and evaluating usage of STEP AP210)
Abstract Accepted for InterPACK'01http://www.asme.org/conf/ipack01/
An Object-Oriented Internet-based Framework forChip Package Thermal and Stress Simulation
1Russell S. Peak, 2Ryuichi Matsuki, 1Miyako W. Wilson, 1Donald Koo,1Andrew J. Scholand, 2Yukari Hatcho, 1Sai Zeng
1Engineering Information Systems LabGeorgia Institute of Technology
Atlanta, Georgia USAhttp://eislab.gatech.edu/
2Package Design CenterShinko Electric Industries Co., Ltd.
Nagano, Japanhttp://www.shinko.co.jp/
AbstractSimulating the behavior of electronic chip packages like ball grid arrays (BGAs) is important to guide andverify their designs. Thermal resistance, thermomechanical stress, and electromagnetics impose some ofthe main challenges that package designers need to address. Yet because packages are composed ofnumerous materials and complex shapes, with current methods an analyst may spend hours to days creatingsimulations like finite element analysis (FEA) models.
This paper overviews work to reduce design cycle time by automating key aspects of FEA modeling andresults documentation. The main objective has been automating FEA-based thermal resistance modelcreation for a variety of package styles: quad flat packs (QFPs), plastic BGAs (PBGAs), and enhancedBGAs (EBGAs). Pilot production tools embody analysis integration techniques that leverage rich productmodels and idealize them into FEA models. We have also demonstrated how the same rich product modelscan drive basic stress models with different idealizations.
In this framework, Internet standards like CORBA enable worldwide access to simulation solvers (e.g.,Ansys and Mathematica). Automation and ease-of-use enable access by chip package designers and otherswho are not simulation specialists. Pilot industrial usage has shown that total simulation cycle time can bedecreased 75%, while modeling time itself can be reduced 10:1 or more (from hours to minutes).
68Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Chip Package Products Shinko
Plastic Ball Grid Array (PBGA) Packages
Quad Flat Packs (QFPs)
69Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Flexible High Diversity Design-Analysis Integration
Electronic Packaging Examples: Chip Packages/Mounting Shinko Electric Project: Phase 1 (completed 9/00)
EBGA, PBGA, QFP
CuGround
PKG
Chip
Analysis Modules (CBAMs) of Diverse Behavior & Fidelity
FEAAnsys
General MathMathematica
Analyzable Product Model
XaiTools
XaiToolsChipPackage
ThermalResistance
3D
Modular, ReusableTemplate Librariestemperature change,T
material model
temperature, T
reference temperature, To
cte,
youngs modulus, E
force, F
area, A stress,
undeformed length, Lo
strain,
total elongation,L
length, L
start, x1
end, x2
mv6
mv5
smv1
mv1mv4
E
One D LinearElastic Model(no shear)
T
e
t
thermal strain, t
elastic strain, e
mv3
mv2
x
FF
E, A,
LLo
T, ,
yL
r1
12 xxL
r2
oLLL
r4
A
F
sr1
oTTT
r3L
L
m a t e r i a l
e f f e c t i v e l e n g t h , L e f f
d e f o r m a t i o n m o d e l
l i n e a r e l a s t i c m o d e l
L o
T o r s i o n a l R o d
G
J
r
2
1
s h e a r m o d u l u s , G
c r o s s s e c t i o n :e f f e c t i v e r i n g p o l a r m o m e n t o f i n e r t i a , J
a l 1
a l 3
a l 2 a
l i n k a g e
m o d e : s h a f t t o r s i o n
c o n d i t i o n r e a c t i o n
t s 1
A
S l e e v e 1
A t s 2
d s 2
d s 1
S l e e v e 2
L
S h a f t
L e f f
s
T
o u t e r r a d i u s , r o a l 2 b
s t r e s s m o s m o d e l
a l l o w a b l e s t r e s s
t w i s t m o s m o d e l
M a r g i n o f S a f e t y( > c a s e )
a l l o w a b l e
a c t u a l
M S
M a r g i n o f S a f e t y( > c a s e )
a l l o w a b l e
a c t u a l
M S
a l l o w a b l et w i s t Analysis Tools
Design Tools
PWB DB
Materials DB*
Prelim/APM Design ToolXaiTools ChipPackage
ThermalStress
Basic3D**
** = Demonstration module
BasicDocumentation
AutomationAuthoringMS Excel
70Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Traditional VTMB FEA Model Creation
Manually Intensive: 6-12 hours
FEA Model Planning Sketches - EBGA 600 Chip Package
VTMB = variable topology multi-body
71Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
APM Design ToolPreliminary Design of Packages - PBGA Screens
APM = analyzable product model
72Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Test Cases - ShinkoExample Chip Package Idealizations (PBGA)
[ Outer Balls ] Average Thermal Conductivity
x 1
x 2
y 1y 2
% Ball Area = (Pi * (ball diameter / 2)^ 2) / (x2 * y2 - x1 * y1 )
Vertical Direction v: v = Vff+(1-Vf )m [W/mK]Horizontal Direction h: 1/h = Vf/f+(1-Vf )/m [W/mK]
Where: f: thermal conductivity of solder ball [W/mK] m: thermal conductivity of air [W/mK] Vf: volume ratio of solder ball
- =
V i a + A i r A i r V i a
R r
S R r n 2 2
E q u a t i o n f o r T o t a l S e c t i o n a l V i a A r e a
S : t o t a l s e c t i o n a r e a o f v i a sR : o u t e r r : i n n e r n : n u m b e r o f v i a
l x r y 2r : a radius of balll : a side length of squarex : number of ballsy : number of squares
l
l
r + r r =5 - 10 Balls
[ Inner Balls (Thermal Balls) ]
(Ball value in all directions)
Thermal Conductivity
Idealization for solder-joint/thermal ball
Idealization for thermal via
Courtesy of Shinko - see [Koo, 2000]
73Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Generic COB Browser with design and analysis objects
(attributes and relations)
CustomizedAnalysis Module Tool
with idealized package cross-section
COB-based Analysis Tools
Typical Input Objects
COB = constrainedobject
74Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
COB-based Analysis Tools
Typical Highly Automated Results
COB = constrainedobject
FEATemperature Distribution
Thermal Resistancevs.
Air Flow Velocity
Auto-CreatedFEA Inputs
(for Mesh Model)
Analysis Module Tool
75Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Using Internet/Intranet-based Analysis SolversThick Client Architecture
Client PCs
XaiTools
Thick Client
Users
Internet
June’99-Present:EIS Lab - Regular internal use
U-Engineer.com - Demo usage: - US - Japan
Nov.’00-Present:Electronics Co. - Began production usage (dept. Intranet)
Future:Company Intranet and/or
U-Engineer.com(commercial) - Other solvers
Iona orbixdj
Mathematica
Ansys
Internet/Intranet
XaiTools AnsysSolver Server
XaiTools AnsysSolver Server
XaiTools Math.Solver Server
CORBA Daemon
XaiTools AnsysSolver Server
FEA Solvers
Math Solvers
CORBA Servers
CO
RB
A IIO
P..
.
Engineering Service BureauHost Machines
76Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Test Cases - ShinkoAuto-Generated FEA Model of PBGA 256 with Thermal Vias
FEA Model Relational Complexity
29 idealized bodies10 idealized materials
1 main pattern~3 sub patterns
Small Idealized Vias
Thin Copper Layers
77Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Results ValidationEBGA 352 (4L-PCB)
0
2
4
6
8
10
12
14
0 1 2 3 4
Air Flow Velocity [m/s]
ja
[d
egre
eC/W
] COSMOS (PB)
COSMOS (BB)
ANSYS (PB)
ANSYS (BB)
Measure
Thermalresistance
Good comparisons: (a) simulation via VTMB algorithm (in XCP)(b) simulation via traditional manual approach (c) physical measurements
(a)
(b)(c)
78Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
1
2
3
1
2
3
12
4
1a
2
3a
1b
1c
3b 3c
3a 3b
2
1a 1b 1c
1d 1e
3
1a 1b
1c1d
23
4a 4b 4c
Analytical Bodies FEA Model Decomposed Volumes
original
topology change (no body change)
variable body change(includes topology change)
Variable Topology Multi-Body (VTMB) FEA Meshing Challenges
See Advanced Topics
re: Current Work
Labor-intensive “chopping”
79Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Design Changes with Large Topology Impact Example Variations: PBGAs & EBGAs
EBGA 600with2 Steps
EBGA 325withNo Steps
PBGA 313with
Thermal Vias &Thermal Balls
2D partial views of 3D models
80Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Idealized Analytical Models
FEA Mesh Models
thin & large thick & small
2D partial views of 3D models
z-direction topology changes
Design Change with Small Topology Impact
Heat Spreader Size Variations - EBGA 600
81Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Product Information-Driven FEA MethodologyPurpose of VTMB Methodology
algorithmij
Design Types i = 1…m Analysis Types j = 1…n
Design Instances Analysis Instances
VTMB FEA ModelsVTMB
Methodologycreate algorithmij
once
for a given ij j{1…n} (not all design types have all analysis types)e.g.) for i=1(EBGA), j=1(thermal resistance) j=2 (thermal stress) for i=2 (PWB), j=1 (warpage)
Chip package APMs thermal resistance CBAMs
PWB APMsthermal stress CBAMs
ANSYS SMMs
VTMB= variable topology multi-body
use algorithmij
many times
82Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
MethodologyScope of VTMB algorithmij for cbamij
Conditions &Next-Higher
CBAMs
Boundary Condition Objects & Discipline
Analyzable Product Model
Part Feature& Assembly Structure
Behavior/Mode
MoSallowableactual
Objectives
AnalysisContext
Context-BasedAnalysis Model
(CBAM)idealizations,
allowables
Step 1a
boundary variables
Step 1b
AssociativityLinkages,
Step 4
Pseudo-Analysis Building Blocks(pseudo-ABBs)
Analysis Subsystems
SolutionMethod Models
(SMMs)
transformations,Step 2
Step 3
VTMBalgorithmij
for cbamij
[Tamburini, 1999]
[Peak, 2001]
83Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Test Cases - ShinkoAuto-Generated FEA Model: QFP PCDPH
FEA Model Relational Complexity23 idealized bodies
9 idealized materials1 main pattern~3 sub patterns
84Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Design Changes with Large Topology Impact
Example Variations: QFPs
QFP 128 SLDie Pad
QFP 208 DPHHS/Tape
2D partial views of 3D models
85Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Basic Stress Analysis Module Tool
Highly automated FEA model creation
Uses same:• APM• CORBA-based solvers, etc.
Pattern-based meshing• Adjustable mesh density
PBGA 625
86Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Multi-Fidelity IdealizationsMode-dependent Idealized Geometries; Same Dimension
Thermal Resistance
Thermal Stress
FEA ModelIdealized Geometry (3D)
Common Design ModelCu(0.15)BT-Resin (0.135)
0.56
(Air)
(0.135)
Al Fin (1.5)Adhesive(0.05)
FEA ModelIdealized Geometry (3D)
87Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Pilot & Initial Production Usage Results
Product Model-Driven Analysis
Analysis Model Creation ActivityWith TraditionalPractice
With VTMBMethodology* Example
Create initial FEA model (QFP cases) 8-12 hours 10-20 minutes QFP208PIN
Create initial FEA model (EBGA cases) 6-8 hours 10-20 minutes EBGA352PIN
Create initial FEA model (PBGA cases) 8-10 hours 10-20 minutes PBGA256PIN
Create variant - small topology change 0.3-6 hours (10-20 minutes) - Moderate dimension change
(e.g., EBGA 600 heat sink size variations)
Create variant - moderate topology change (6-8 hours)- (10-20 minutes) - Add more features
(e.g., increase number of EBGA steps)
Create variant - large topology change (6-8 hours)+ (10-20 minutes)-or N/A
Add new types of features
(e.g., add steps to EBGA outer edges)
Reduced FEA modeling time > 10:1 (days/hours minutes) Reduced simulation cycle > 75%
Enables greater analysis intensity Better designs
References[1] Shinko 5/00 (in Koo, 2000)[2] Shinko evaluation 10/12/00
VTMB = variable topology multi-body technique [Koo, 2000]
88Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
An Introduction to X-Analysis Integration (XAI) Short Course Outline
Part 1: Constrained Objects (COBs) Primer– Nomenclature
Part 2: Multi-Representation Architecture (MRA) Primer – Analysis Integration Challenges – Overview of COB-based XAI
Part 3: Example Applications» Airframe Structural Analysis (Boeing)» Circuit Board Thermomechanical Analysis
(DoD, JPL/NASA)» Chip Package Thermal Analysis (Shinko)
– Summary
Part 4: Advanced Topics & Current Research
89Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Advanced Topics & Current ResearchOutline
Advanced Product Information-Driven FEA Modeling– Focus on cases with:
» Variable topology multi-body geometries» Different design & analysis geometries» Mixed analytical bodies and idealized interfaces
Constrained Object (COB) Extensions– Automating support for multiple views– Next-generation capabilities
Optimization and the MRA
90Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Cost of Associativity Gaps
000,000,10$gap
$10 gaps000,000,1
gaps000,000,1analysis
variables 10
part
analyses 10parts 000,10
OOO
OOOO
e
setr
Pf
02
21
e
beht
PCf
),,( 13 hbrfK
Analysis Model(with Idealized Features)
Detailed Design Model
Channel Fitting Analysis
idealizations
No explicit
fine-grained
CAD-CAE
associativity
Categories of Gap Costs Associativity time & labor
– Manual maintenance– Little re-use– Lost knowledge
Inconsistencies Limited analysis usage
– Few iterations/part– Limited part coverage
“Wrong” values – Too conservative:
Extra costs, inefficiencies– Too loose:
Re-work, failures, law suits
91Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
XAI Summary Emphasis on X-analysis integration (XAI) for design reuse (DAI,SBD) Multi-Representation Architecture (MRA)
– Addressing fundamental XAI/DAI issues» Explicit CAD-CAE associativity: multi-fidelity, multi-directional, fine-grained
– General methodology --> Flexibility & broad application Research advances & applications
– Product data-driven analysis (STEP AP210, GenCAM, etc.)– Internet-based engineering service bureau (ESB) techniques– Object techniques for next-generation aerospace analysis systems– FEA modeling time reduction in pilot tests (chip packages):
> 10:1 (days/hours to minutes)
Improved Simulation-Based Designs Tools and development services
– Analysis integration toolkit: XaiTools™ and applications– Pilot commercial ESB: U-Engineer.com– Company-tailored engineering information system solutions
Motivated by industry & government collaboration
92Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Selected Tools and Services Offered via Georgia Tech Research Corp.
http://eislab.gatech.edu/
XaiTools Framework™
– General-purpose analysis integration toolkit Product-Specific Toolkits
– XaiTools PWA-B™
– XaiTools ChipPackage™
U-Engineer.com™
– Internet-based engineering service bureau (ESB)
– Self-serve automated analysis modules Full-serve consulting Research, Development, and Consulting
– Analysis integration & optimization
– Product-specific analysis module catalogs
– Internet/Intranet-based ESB development
– Engineering information technology
» PDM, STEP, GenCAM, XML, UML, Java, CORBA, Internet, …
– CAD/CAE/CAM, parametric FEA, thermal & mechanical analysis
93Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
For Further Information ...
EIS Lab web site: http://eislab.gatech.edu/– Publications, project overviews, tools, etc.– See: Publications DAI/XAI Suggested Starting Points
X-Analysis Integration (XAI) Technologyhttp://eislab.gatech.edu/pubs/reports/EL002/
XaiTools™ home page: http://eislab.gatech.edu/tools/XaiTools/
Pilot commercial ESB: http://www.u-engineer.com/– Internet-based self-serve analysis– Analysis module catalog for electronic packaging– Highly automated front-ends to general FEA & math tools
94Engineering Information Systems Lab eislab.gatech.edu© 1993-2001 GTRC
Nomenclature ABB-SMM transformation idealization relation between design and analysis attributes APM-ABB associativity linkage indicating usage of one or more i
ABB analysis building blockAMCOM U. S. Army Aviation and Missile CommandAPM analyzable product modelCAD computer aided designCAE computer aided engineeringCBAM context-based analysis modelCOB constrained objectCOI constrained object instanceCOS constrained object structureCORBA common ORB architectureDAI design-analysis integrationEIS engineering information systemsESB engineering service bureauFEA finite element analysisFTT fixed topology templateGUI graphical user interfaceIIOP Internet inter-ORB protocolMRA multi-representation architectureORB object request brokerOMG Object Management Group, www.omg.comPWA printed wiring assembly (a PWB populated with components)PWB printed wiring boardSBD simulation-based designSBE simulation-based engineeringSME small-to-medium sized enterprise (small business)SMM solution method modelProAM Product Data-Driven Analysis in a Missile Supply Chain (ProAM) project (AMCOM)PSI Product Simulation Integration project (Boeing)STEP Standard for the Exchange of Product Model Data (ISO 10303).VTMB variable topology multi-bodyXAI X-analysis integration (X= design, mfg., etc.)XCP XaiTools ChipPackage™
XFW XaiTools FrameWork™
XPWAB XaiTools PWA-B™