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Living in a 3D World: Why not Make 3D Integrated Circuits? Yang (Cindy) Yi Electrical Engineering and Computer Science University of Kansas

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Page 1: Analog Integrated Circuit Design EE401AN/EE5590AN

Living in a 3D World: Why not Make 3D Integrated Circuits?

Yang (Cindy) YiElectrical Engineering and Computer Science

University of Kansas

Page 2: Analog Integrated Circuit Design EE401AN/EE5590AN

Outline• Introduction• Advantages of 3D IC• 3D IC Development and Challenges • Through Silicon Via (TSV) Modeling and

Design• 3D Stacking for Neuromorphic Computing • Summary

2DASS 2016

Page 3: Analog Integrated Circuit Design EE401AN/EE5590AN

Living in a 3D World

3DASS 2016

Page 4: Analog Integrated Circuit Design EE401AN/EE5590AN

Why not Make 3D Circuit?

4DASS 2016

Page 5: Analog Integrated Circuit Design EE401AN/EE5590AN

What is 3D Integrated Circuit• A chip with active

electronic components stacked on one or more layers.

• Each block placed on a separate layer of Si.

• Each die is stacked on top of another and communicated by Through-Silicon Vias (TSVs).

5DASS 2016

Source: ITRI

Page 6: Analog Integrated Circuit Design EE401AN/EE5590AN

3D IC is like a 3D Hamburger

Source: Terahertz Interconnection and Package Lab at KAIST

6DASS 2016

Page 7: Analog Integrated Circuit Design EE401AN/EE5590AN

3D IC is also like a 3D Skyscrapers

New York City in 1800 New York City in 2000

3D space with skyscrapers

7DASS 2016

Page 8: Analog Integrated Circuit Design EE401AN/EE5590AN

Package FunctionProvides mechanical, electrical, and thermal connections necessary for system functionality.

8DASS 2016

Page 9: Analog Integrated Circuit Design EE401AN/EE5590AN

Traditional Technologies

Wire bonding Flip Chip

9DASS 2016

Page 10: Analog Integrated Circuit Design EE401AN/EE5590AN

Device Packaging – Changing Landscape

Critical performance metrics are shiftingfrom CMOS Scaling and Package Form Factor to SYSTEM LEVEL Power Consumption and Bandwidth.

10DASS 2016

Page 11: Analog Integrated Circuit Design EE401AN/EE5590AN

Communication Bottleneck• Architectural issues

– Traditional shared buses do not scale well – bandwidth saturation

– Chip IO is pad limited• Physical issues

– On-chip Interconnects become increasingly slower w.r.t. logic

– IOs are increasingly expensive• Consequences

– Performance losses– Power/Energy cost– Design closure issues or

infeasibility

11DASS 2016

Page 12: Analog Integrated Circuit Design EE401AN/EE5590AN

Vertical IntegrationOne solution: Go vertical!• Dies with different functions fabricated with

different technologies are integrated.

12

Schematic of a System-on-a-Chip design using a planar (2-D) IC

Schematic of a 3-D chip showing integrated heterogeneous technologies

DASS 2016

Page 13: Analog Integrated Circuit Design EE401AN/EE5590AN

Example• Apple A4 Chip (for 1st Gen iPad and iPhone 4)

13DASS 2016

Off-chip vertical connectionsSource: Apple Inc.

Page 14: Analog Integrated Circuit Design EE401AN/EE5590AN

3D IC Market Drivers

Form factor driven

Density Achieving the highest capacity / volume ratio “Short term”

driver: > 2008

Cost driven

3D vs. “More Moore” Can 3D be cheaper than going to the next lithography node?

“Long term” driver: > 2012

3D ICOptimum Market

Access Conditions

CPU GPU

MEMS

CIS

DRAM

Flash

RF

Performance driven

Heterogeneous integration Co-integration of RF + logic + memory + sensors in a reduced space

Electrical performance Interconnect speed and reduced parasitic power consumption

“More than Moore”

Source: Yole Development

14DASS 2016

Page 15: Analog Integrated Circuit Design EE401AN/EE5590AN

System in Package (SiP)

Long Interconnection Long RC Delays High Impedance for Power Distribution

Network High Power Consumption Poor Heat Dissipation (Thick Substrate)

Bonding Wire located in Chip Perimeter Low Density Chip Wiring Limited Number of I/O Limited I/O Pitch Large Area Package

Wire Bonding Stacked Chip Package

15DASS 2016

Page 16: Analog Integrated Circuit Design EE401AN/EE5590AN

3D IC with TSVs

Short Interconnection Reduced RC Delays Low Impedance for Power

Distribution Network Low Power Consumption Heat Dissipation Through Via

No Space Limitation for Interconnection High Density Chip Wiring No Limitation of I/O Number No Limitation of I/O Pitch Small Area Package

First Chip

Second Chip

Bottom Chip

TSV

Bump to TSV

16DASS 2016

Page 17: Analog Integrated Circuit Design EE401AN/EE5590AN

Benefit of 3D IC with TSVs3D IC is considered one of the most promising alternatives at the limit of device scaling:

• Reduced interconnect length• Reduced delay• Comparable with current technology• Heterogeneous integration

Through-silicon vias (TSVs) for vertical signal link

17DASS 2016

Page 18: Analog Integrated Circuit Design EE401AN/EE5590AN

Example

Source: Samsung

Source: Samsung Inc.

18DASS 2016

Page 19: Analog Integrated Circuit Design EE401AN/EE5590AN

Manufacturing Cost Reduction

19

Source: Market trends & Cost analysis for 3D ICs, JC Eloy

DASS 2016

Page 20: Analog Integrated Circuit Design EE401AN/EE5590AN

3D IC Applications

20DASS 2016

Source: QUALCOMM Inc.

Page 21: Analog Integrated Circuit Design EE401AN/EE5590AN

Market Evolution

21DASS 2016

Page 22: Analog Integrated Circuit Design EE401AN/EE5590AN

Challenges & Opportunities in EDA

Challenges

Design3D IC EDA Tool Environment3D IC Design Flow from IC to System

ElectricalTSV Modeling and Characterization System-level Signal Integrity/Power Integrity

Thermal3D IC Thermal ModelsThermally Aware Design & Management

22DASS 2016

Page 23: Analog Integrated Circuit Design EE401AN/EE5590AN

23

3D IC Modeling and Design

DASS 2016

Page 24: Analog Integrated Circuit Design EE401AN/EE5590AN

TSV Structures• TSVs are fabricated by high aspect ratio deep silicon etching, lining

with dielectric layer, and super conformal filling with copper.

• A metal insulator semiconductor (MIS) device in which a dielectriclayer SiO2 is deposited to isolate the metals from the substrate.

24DASS 2016

Page 25: Analog Integrated Circuit Design EE401AN/EE5590AN

TSV MIS Interface• TSV MIS interface can be in

accumulation, depletion, inversion regions.

• Flat Band Voltage VFB

• if V < VFB, the positively charged holes in silicon are dragged to Si-SiO2 interface, and an accumulation layer is formed.

• if V > VFB, holes are pushed away and a depletion region is formed.

SFB m si

ox

QVC

ϕ ϕ= − −

25DASS 2016

TSV Capacitance Table

Page 26: Analog Integrated Circuit Design EE401AN/EE5590AN

High Frequency Effect• Skin/Proximity effects

266/4/2016

Proximity effect:opposite currents in nearby conductors attract each other

Skin effect:high frequency currents crowd toward the surface of conductors

Simple Example

Resistance increases

26DASS 2016

Page 27: Analog Integrated Circuit Design EE401AN/EE5590AN

Skin Effect The field amplitude decreases exponentially into the

thickness of the conductor – skin depth Defined as the penetration depth at a given frequency

where the amplitude is attenuated 63% (e-1) of initial value

µπρδf

=

Skin Depth In Copper

0

1

2

3

4

5

6

7

8

9

10

0.E+00 1.E+09 2.E+09 3.E+09 4.E+09 5.E+09 6.E+09

Frequency, Hz

Skin

Dep

th, m

icro

ns

X

Ampl

itude

Penetration into conductor

Electromagnetic Wave

27DASS 2016

Page 28: Analog Integrated Circuit Design EE401AN/EE5590AN

TSV Rough Surface• Mainly occurred due to the etching of TSV and the poor

polymer deposition during passivation.

• At ultra high frequency, TSV skin depth and root-mean-square (rms) height of the rough surface are comparable.

• Badly impact on current flowing through TSV in highfrequency range.

Figure courtesy: Tomoji Nakamura et al28DASS 2016

Page 29: Analog Integrated Circuit Design EE401AN/EE5590AN

Small Perturbation Method• Analyze the effect of surface roughness at millimeter wave

frequencies by using analytic small perturbation method.• Analytical expression of modeling and associated

equivalent circuit are based on these structures.

Signal TSV Ground TSV

TSV pair with surface roughness

Signal TSV Ground TSV

TSV pair without surface roughness

29DASS 2016

Page 30: Analog Integrated Circuit Design EE401AN/EE5590AN

Skin Effect and Surface Roughness ModelingConsidering the skin effect in high frequency TSV, additional

resistance and inductance occurs.

Using Gaussian distribution function, an increased in conductorresistance due to the roughness of TSV.

𝐿𝐿0 =𝜇𝜇𝜇2𝜋𝜋

𝑙𝑙𝑙𝑙 1 +2.84𝜇𝜋𝜋𝜋𝜋

+𝑅𝑅02𝜋𝜋𝜋𝜋

𝑅𝑅𝑆𝑆 =𝑎𝑎 𝜇 − 𝑎𝑎𝜎𝜎𝑔𝑔3 2𝜋𝜋

𝑒𝑒− ℎ−𝑎𝑎 2

2𝜎𝜎𝑔𝑔2𝑘𝑘𝑐𝑐

𝜎𝜎𝑐𝑐𝑐𝑐𝜋𝜋 𝑟𝑟 + ∆𝑥𝑥 2 − 𝑟𝑟2

𝑅𝑅0 =𝜇

𝜎𝜎𝜋𝜋 𝑟𝑟2 − 𝑟𝑟 − 𝜎𝜎𝐶𝐶𝑐𝑐 2

=𝜇𝜋𝜋𝜎𝜎𝐶𝐶𝑐𝑐

𝑑𝑑 𝜋𝜋𝜋𝜋𝜇𝜇0𝜎𝜎𝐶𝐶𝑐𝑐 − 1

30DASS 2016

Page 31: Analog Integrated Circuit Design EE401AN/EE5590AN

Pseudo-random data transmitted over wafer level, chip level, and interposer TSV.

Eye Diagram of TSVs

31DASS 2016

Page 32: Analog Integrated Circuit Design EE401AN/EE5590AN

TSV Design Optimization

• Smaller TSV capacitance -> faster signal response and lower signal distortion.

• Nature of TSV C-V characteristics depends on TSV process and architecture.

• Achieve minimum TSV capacitance in the desired operating voltage region by tuning TSV process and geometry parameters.

32DASS 2016

Static C-V Curve of MIS

Page 33: Analog Integrated Circuit Design EE401AN/EE5590AN

Eye Diagram of Interposer TSV• Optimize TSV depletion capacitance at 25 Gbps.• Achieved by biasing the TSV into the deep depletion

region with low work function metal for p-type Si.

33DASS 2016

Page 34: Analog Integrated Circuit Design EE401AN/EE5590AN

Outline• Introduction• Advantages of 3D IC• 3D IC Development and Challenges • Through Silicon Via (TSV) Modeling and

Design• 3D Stacking for Neuromorphic Computing• Summary

34DASS 2016

Page 35: Analog Integrated Circuit Design EE401AN/EE5590AN

Neuromorphic Computing

• Inspired by the working mechanism of human brain• Use analog, digital, mixed-mode very-large-scale integration

(VLSI) circuits to implement the neural systems

Computers will help people to understand brains better; understanding brains will help people to build better computers.

http://www.economist.com/news/science-and-technology//better-and-understanding-brains

35DASS 2016

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Who is this Guy?

Albert Einstein

36DASS 2016

Page 37: Analog Integrated Circuit Design EE401AN/EE5590AN

Brain Inspired vs. Traditional Computing

37

Human Brain Traditional Computers(example taken Tianhe-2)

Speed: 10 PFLOPS (Floating-pointOperations Per Second)

Speed: 33.86 PFLOPS

Storage: 3.5 PB (1000 terabytes) Storage: 12.4 PBWeight: 1350 g Weight: 10 Tons (9.07e7 g)Power: 20 W Power:17.6 MegaWatt

Cost: $390 millionSize: 1195 cm3

(1 http://www.thehindu.com/sci-tech/health/medicine-and-research/brain-circuits-behind-hearing-develop-without-sensory-experience/article477048.ece)

Size: 7,750 sq. ft.(2 http://spectrum.ieee.org/techtalk/computing/hardware/chinese-supercomputer-tianhe2-continues-reign-as-worlds-best-super-computer)

DASS 2016

Page 38: Analog Integrated Circuit Design EE401AN/EE5590AN

Biological vs. Hardware

“Neuromorphic Architectures” James Kempsell

38DASS 2016

Page 39: Analog Integrated Circuit Design EE401AN/EE5590AN

3D Stacking is Essential for Neuromorphic IC

IBM TrueNorth Chip:• Neurosynaptic core contains 256

neurons, and a 64k synaptic crossbar. • 4096 neurosynaptic cores in a 2-D array

occupies 4.3 cm. • Consumes 65 mW of power while

running a typical computer vision application.

2

39

Source: IBM Inc.

DASS 2016

DARPA SyNAPSE 16 chip board with IBM TrueNorth Source: IBM Inc.

Page 40: Analog Integrated Circuit Design EE401AN/EE5590AN

Neuromorphic 3D Stacking

• Provide massive parallelism among neurons that is required for highlydemanding computational task.

• Offer high device integration density using fast and energy efficient link.

• Provide higher bandwidth and lower routing cost between the layers byminimizing the obstacles introduced by 2D circuits.

40DASS 2016

Page 41: Analog Integrated Circuit Design EE401AN/EE5590AN

2D vs. 3D

The Improbable But Highly Appropriate Marriage of 3D Stacking and Neuromorphic Accelerators

Characteristics and breakdown of (two-layer) 3D circuit.

Characteristics and breakdown of (two-layer) 2D circuit.

2D over 3D ratios for main characteristics: time to process an image, energy per image, energy per spike, power, area.

41DASS 2016

Page 42: Analog Integrated Circuit Design EE401AN/EE5590AN

Step Response

42DASS 2016

Page 43: Analog Integrated Circuit Design EE401AN/EE5590AN

Summary• 3D IC is considered one of the most emerging technologies

at the limit of device scaling.• Needs strong EDA tools for automated design.• Our study helps in developing design guidelines for TSVs in

3D IC.– Proposed an accurate broadband circuit model. – Optimized the parameters of TSVs architecture and manufacturing

process to obtain the minimum depletion.

• 3D stacking is essential for neuromorphic IC design.

43DASS 2016

IC

Page 44: Analog Integrated Circuit Design EE401AN/EE5590AN

Thank you very much!