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  • 8/13/2019 AO4912

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    Symbol Max Q2 Units

    VDS V

    VGS V

    IDM

    IAR A

    EAR

    mJ

    TJ, TSTG C

    Symbol

    VDS

    IFM

    TJ, T

    STGJunction and Storage Temperature Range

    Power DissipationA

    W1.28

    -55 to 150 C

    2

    Pulsed Diode Forward CurrentB

    Continuous Forward

    CurrentAF

    PD

    IF

    TA=25C

    TA=70C

    30 V

    TA=25C

    Parameter

    Reverse Voltage

    A2.2

    20

    3

    TA=70C

    Maximum Schottky

    Max Q1

    30

    20

    8.5

    17

    43

    15

    34

    Units

    TA=25C

    TA=70C

    Power DissipationPD

    Pulsed Drain CurrentB

    Continuous Drain

    CurrentAF ID

    -55 to 150 -55 to 150Junction and Storage Temperature Range

    2

    1.28 1.28

    TA=25C

    TA=70C

    2

    Avalanche CurrentB

    12

    30

    Absolute Maximum Ratings TA=25C unless otherwise notedParameter

    Drain-Source Voltage

    Repetitive avalanche energy 0.3mHB

    Gate-Source Voltage

    W

    A6.4

    40 30

    7

    6.8

    AO4912

    Asymmetric Dual N-Channel Enhancement Mode Field Effect

    Transistor

    Features

    Q1 Q2VDS(V) = 30V VDS(V) = 30V

    ID= 8.5A ID=7A (VGS= 10V)

    RDS(ON) < 17m

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    AO4912

    Symbol Units

    RJL

    Symbol Units

    RJL

    RJL

    THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL

    COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING

    OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,

    FUNCTIONS AND RELIABILITY WITHOUT NOTICE.

    74 110

    Maximum Junction-to-LeadC Steady-State 35 40

    Max

    C/W

    C/W

    Parameter: Thermal Characteristics MOSFET Q2 Typ Max

    Maximum Junction-to-AmbientA t 10s

    RJA48

    40

    Thermal Characteristics Schottky

    62.5

    40

    48

    74

    62.5

    C/WMaximum Junction-to-AmbientA Steady-State

    Maximum Junction-to-LeadC Steady-State 35

    Typ

    Maximum Junction-to-AmbientA Steady-State

    Parameter: Thermal Characteristics MOSFET Q1

    Maximum Junction-to-AmbientA t 10s

    47.5

    RJA

    62.5Maximum Junction-to-Ambient t 10sRJA

    Maximum Junction-to-Ambient Steady-State 110

    110

    Maximum Junction-to-LeadC Steady-State

    71

    32

    A: The value of R JAis measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a still air environment with

    TA=25C. The value in any given application depends on the user's specific board design.

    B: Repetitive rating, pulse width limited by junction temperature.

    C. The RJAis the sum of the thermal impedence from junction to lead R JLand lead to ambient.

    D. The static characteristics in Figures 1 to 6 are obtained using

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    AO4912

    Symbol Min Typ Max Units

    BVDSS 30 V

    1

    TJ=55C 5IGSS 100 nA

    VGS(th) 1 1.5 2 V

    ID(ON) 25 A

    20 26

    TJ=125C 31.6 38

    24.3 31 m

    gFS 22 S

    VSD 0.78 1 V

    IS 3 A

    Ciss 590 710 pF

    Coss 162 pF

    Crss 40 56 pF

    Rg 0.2 0.45 0.6

    Qg 6.04 7.3 nC

    Qgs 1.46 nC

    Qgd 2.56 nC

    tD(on) 3.7 5.5 ns

    tr 3.5 5.5 nstD(off) 14.9 22 ns

    tf 2.5 4 ns

    trr Body Diode Reverse Recovery time IF=7A, dI/dt=100A/s 21.2 26 ns

    Qrr Body Diode Reverse Recovery charge IF=7A, dI/dt=100A/s 14.2 21 nC

    THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL

    COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISIN

    OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,

    FUNCTIONS AND RELIABILITY WITHOUT NOTICE.

    Q2 Electrical Characteristics (TJ=25C unless otherwise noted)

    Parameter Conditions

    STATIC PARAMETERS

    Drain-Source Breakdown Voltage ID=250A, VGS=0V

    IDSS Zero Gate Voltage Drain CurrentVDS=30V, VGS=0V

    A

    Gate-Body leakage current VDS=0V, VGS= 12V

    Gate Threshold Voltage VDS=VGS ID=250A

    On state drain current VGS=4.5V, VDS=5V

    RDS(ON) Static Drain-Source On-Resistance

    VGS=10V, ID=7.0Am

    VGS=4.5V, ID=6.0A

    Maximum Body-Diode Continuous Current

    DYNAMIC PARAMETERSInput Capacitance

    VGS=0V, VDS=15V, f=1MHzOutput Capacitance

    Reverse Transfer Capacitance

    Forward Transconductance VDS=5V, ID=7A

    Diode Forward Voltage IS=1A

    SWITCHING PARAMETERS

    Total Gate Charge

    Gate resistance VGS=0V, VDS=0V, f=1MHz

    Gate Source Charge

    Gate Drain Charge

    Turn-On DelayTime

    VGS=10V, VDS=15V, RL=2.2,RGEN=3

    VGS=4.5V, VDS=15V, ID=7.0A

    Turn-On Rise TimeTurn-Off DelayTime

    Turn-Off Fall Time

    A: The value of R JAis measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a still air environment with

    TA=25C. The value in any given application depends on the user's specific board design.

    B: Repetitive rating, pulse width limited by junction temperature.

    C. The RJAis the sum of the thermal impedence from junction to lead R JLand lead to ambient.

    D. The static characteristics in Figures 1 to 6 are obtained using

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    AO4912

    Q2 TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS

    0

    5

    10

    15

    20

    25

    30

    0 1 2 3 4 5

    VDS(Volts)

    Fig 1: On-Region Characteristics

    ID(A)

    VGS=2.5V

    3.5V

    3V4.5V

    10V

    0

    4

    8

    12

    16

    20

    0 0.5 1 1.5 2 2.5 3 3.5

    VGS(Volts)

    Figure 2: Transfer Characteristics

    ID(A)

    16

    18

    20

    22

    24

    26

    28

    30

    0 5 10 15 20

    ID(A)Figure 3: On-Resistance vs. Drain Current and

    Gate Voltage

    RDS(ON)

    (m)

    1.0E-05

    1.0E-04

    1.0E-03

    1.0E-02

    1.0E-01

    1.0E+00

    1.0E+01

    0.0 0.2 0.4 0.6 0.8 1.0

    VSD(Volts)

    Figure 6: Body-Diode Characteristics

    IS(A)

    125C

    0.8

    1

    1.2

    1.4

    1.6

    1.8

    0 50 100 150 200Temperature (C)

    Figure 4: On resistance vs. Junction Temperature

    NormalizedOn-Resistance

    VGS=10VVGS=4.5V

    10

    20

    30

    40

    50

    60

    70

    2 4 6 8 10

    VGS(Volts)

    Figure 5: On resistance vs. Gate-Source Voltage

    RDS(ON)

    (m)

    VDS=5V

    VGS=4.5V

    VGS=10V

    ID=7A

    25C

    ID=7A

    125C

    25C

    25C125C

    Alpha & Omega Semiconductor, Ltd. www.aosmd.com

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    AO4912

    Q2 TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS

    0

    1

    2

    3

    4

    5

    0 1 2 3 4 5 6

    Qg(nC)

    Figure 7: Gate-Charge Characteristics

    VGS

    (Volts)

    0

    150

    300

    450

    600

    750

    0 5 10 15 20 25 30

    VDS(Volts)

    Figure 8: Capacitance Characteristics

    Capacitance(pF)

    Ciss

    0

    10

    20

    30

    40

    0.001 0.01 0.1 1 10 100 1000

    Pulse Width (s)

    Figure 10: Single Pulse Power Rating Junction-to-Ambient (Note E)

    Power(W)

    0.01

    0.1

    1

    10

    0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000

    Pulse Width (s)

    Figure 11: Normalized Maximum Transient Thermal Impedance

    ZJA

    NormalizedTransient

    ThermalResistance

    Coss

    Crss

    0.1

    1.0

    10.0

    100.0

    0.1 1 10 100

    VDS(Volts)

    ID(A)

    Figure 9: Maximum Forward Biased Safe

    Operating Area (Note E)

    100s

    10ms

    1ms

    0.1s

    1s

    10s

    DC

    RDS(ON)

    limited 10s

    VDS=15V

    ID=7A

    Single Pulse

    D=Ton/T

    TJ,PK=TA+PDM.ZJA.RJA

    RJA=62.5C/W

    TonT

    PD

    In descending order

    D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse

    TJ(Max)=150C

    TA=25C

    f=1MHz

    VGS=0V

    TJ(Max)=150C, TA=25C

    Alpha & Omega Semiconductor, Ltd. www.aosmd.com

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    AO4912

    Symbol Min Typ Max Units

    BVDSS 30 V

    0.007 0.05

    3.2 10

    12 20

    IGSS 100 nA

    VGS(th) 1 1.8 3 V

    ID(ON) 30 A

    13.8 17

    TJ=125C 20 24

    19.7 25 m

    gFS 23 S

    VSD 0.45 0.5 V

    IS 3.5 A

    Ciss 971 1165 pFCoss 190 pF

    Crss 110 154 pF

    Rg 0.35 0.7 0.85

    Qg(10V) 19.2 23 nC

    Qg 9.36 11.2 nC

    Qgs 2.6 nC

    Qgd 4.2 nC

    tD(on) 5.2 7.5 ns

    tr 4.4 6.5 ns

    tD(off)

    17.3 25 ns

    tf 3.3 5 ns

    trr Body Diode + Schottky Reverse Recovery Time IF=8.5A, dI/dt=100A/s 19.3 23 ns

    Qrr Body Diode + Schottky Reverse Recovery Charge IF=8.5A, dI/dt=100A/s 9.4 11 nC

    THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL

    COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING

    OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,

    FUNCTIONS AND RELIABILITY WITHOUT NOTICE.

    VGS=10V, VDS=15V, ID=8.5A

    Total Gate Charge

    Turn-On Rise Time

    Turn-Off DelayTime

    Turn-Off Fall Time

    Reverse Transfer Capacitance

    SWITCHING PARAMETERS

    Total Gate Charge

    Gate Source Charge

    Gate Drain Charge

    Turn-On DelayTime

    VGS=10V, VDS=15V, RL=1.8,

    RGEN

    =3

    Gate resistance VGS=0V, VDS=0V, f=1MHz

    Forward Transconductance VDS=5V, ID=8.5A

    Diode+Schottky Forward Voltage IS=1A

    Maximum Body-Diode+Schottky Continuous Current

    DYNAMIC PARAMETERS

    Input CapacitanceVGS=0V, VDS=15V, f=1MHzOutput Capacitance (FET + Schottky)

    RDS(ON) Static Drain-Source On-Resistance

    VGS=10V, ID=8.5A

    VGS=4.5V, ID=7A

    mA

    Gate-Body leakage current VDS=0V, VGS= 20V

    m

    Gate Threshold Voltage VDS=VGS ID=250A

    On state drain current VGS=4.5V, VDS=5V

    Drain-Source Breakdown Voltage ID=250A, VGS=0V

    IDSSZero Gate Voltage Drain Current. (Set

    by Schottky leakage)

    VR=30V

    VR=30V, TJ=125C

    VR=30V, TJ=150C

    Q1 Electrical Characteristics (TJ=25C unless otherwise noted)

    Parameter Conditions

    STATIC PARAMETERS

    A: The value of R JAis measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a still air environment with

    TA=25C. The value in any given application depends on the user's specific board design.

    B: Repetitive rating, pulse width limited by junction temperature.

    C. The RJAis the sum of the thermal impedence from junction to lead R JLand lead to ambient.

    D. The static characteristics in Figures 1 to 6 are obtained using

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    AO4912

    Q1 TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS

    1040

    180

    110

    0.7

    VGS=10V, VDS=15V, RL=1.8, RGEN=3

    0

    5

    10

    15

    20

    25

    30

    0 1 2 3 4 5

    VDS(Volts)

    Fig 1: On-Region Characteristics

    ID(A)

    VGS=3V

    3.5V

    4V

    4.5V

    10V

    0

    5

    10

    15

    20

    25

    30

    1 1.5 2 2.5 3 3.5 4

    VGS(Volts)

    Figure 2: Transfer Characteristics

    ID(A)

    10

    14

    18

    22

    26

    0 5 10 15 20 25 30

    ID(A)Figure 3: On-Resistance vs. Drain Current and

    Gate Voltage

    RDS(ON)

    (m)

    1.0E-05

    1.0E-04

    1.0E-03

    1.0E-02

    1.0E-01

    1.0E+00

    1.0E+01

    0.0 0.2 0.4 0.6 0.8 1.0

    VSD(Volts)

    Figure 6: Body-Diode Characteristics

    (Note F)

    IS(A)

    125C

    FET+SCHOTTKY

    0.9

    1

    1.1

    1.2

    1.3

    1.4

    1.5

    1.6

    1.7

    0 50 100 150 200

    Temperature (C)

    Figure 4: On resistance vs. Junction Temperature

    NormalizedOn-Resistance

    VGS=10VVGS=4.5V

    10

    20

    30

    40

    50

    60

    2 4 6 8 10

    VGS(Volts)

    Figure 5: On resistance vs. Gate-Source Voltage

    RDS(ON)

    (m)

    VDS=5V

    VGS=4.5V

    VGS=10V

    ID=8.5A

    25C

    ID=8.5A

    125C

    25C

    25C

    125C

    Alpha & Omega Semiconductor, Ltd. www.aosmd.com

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    AO4912

    Q1 TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS

    1040

    180

    110

    0.7

    VGS=10V, VDS=15V, RL=1.8, RGEN=3

    0

    2

    4

    6

    8

    10

    0 4 8 12 16 20

    Qg(nC)

    Figure 7: Gate-Charge Characteristics

    VGS

    (Volts)

    0

    250

    500

    750

    1000

    1250

    1500

    0 5 10 15 20 25 30

    VDS(Volts)

    Figure 8: Capacitance Characteristics

    Capacitance(pF)

    Ciss

    Coss FET+SCHOTTKY

    0

    10

    20

    30

    40

    0.001 0.01 0.1 1 10 100 1000

    Pulse Width (s)

    Figure 10: Single Pulse Power Rating Junction-to-

    Ambient (Note E)

    Power(W)

    0.01

    0.1

    1

    10

    0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000

    Pulse Width (s)

    Figure 11: Normalized Maximum Transient Thermal Impedance

    ZJAN

    ormalizedTransient

    Th

    ermalResistance

    Crss

    0.1

    1.0

    10.0

    100.0

    0.1 1 10 100

    VDS(Volts)

    ID(A)

    Figure 9: Maximum Forward Biased Safe

    Operating Area (Note E)

    100s

    10ms

    1ms

    0.1s

    1s

    10s

    DC

    RDS(ON)

    limited

    10s

    VDS=15V

    ID=8.5A

    Single Pulse

    D=Ton/T

    TJ,PK=TA+PDM.ZJA.RJA

    RJA=62.5C/W

    TonT

    PD

    In descending order

    D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse

    TJ(Max)=150C

    TA=25C

    f=1MHz

    VGS=0V

    TJ(Max)=150C, TA=25C

    Alpha & Omega Semiconductor, Ltd. www.aosmd.com