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Ben Blalock - 1 Analog Layout – Fall 2002 Electrical Electrical & Computer & Computer Engineering Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

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Page 1: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 1Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Analog Layout

Page 2: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 2Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Analog Layout

• MOSFET Layout

layout example (with schematic):

Page 3: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 3Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Analog Layout

• CMOS Passive Elements

Poly1-poly2 capacitor structure

Page 4: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 4Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Analog Layout

• CMOS Passive Elements

Parasitics associated with the poly1-poly2 capacitor structure

Page 5: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 5Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Analog Layout

• CMOS Passive Elements

Careful layout can reduce parasitic resistance associated with cap structure

Page 6: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 6Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Analog Layout

• CMOS Passive Elements

Additional options for implementing capacitors in CMOS technology include:

metal1-metal2 capacitors

MOS caps (drain shorted to source MOSFET operating in SI)

n+ or p+ diffusions to well or substrate

Well-to-substrate

Page 7: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 7Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Analog Layout

• CMOS Passive Elements

Good analog design utilizes ratioing of components:

Page 8: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 8Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Analog Layout

• CMOS Passive Elements

Guard ring components to isolate them from substrate noise:

Page 9: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 9Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Analog Layout

• CMOS Passive Elements

Good example of layout of matched elements (R1 & R2):

consistent orientation (horizontal in this case)

consistent parasitics

don’t forget to guard ring!

Page 10: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 10Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Analog Layout

• CMOS Passive Elements

Common-centroid layout improves element matching (at the expense of uneven parasitics between the elements):

in Fig. 7.7(a), RA = ‘16’ and RB = ‘20’

in Fig. 7.7(b), RA = ‘18’ and RB = ‘18’

Page 11: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 11Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Analog Layout

• Common-centroid structure for four elements (resistors, MOSFETs, or capacitors):

Page 12: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 12Analog Layout – Fall 2002

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Analog Layout

• Also use dummy elements to improve matching:

Page 13: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 13Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Analog Layout

• Beware of poly under etching in layout of capacitor unit cells!

Circular poly structures guarantee consistent under etching:

Page 14: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 14Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Analog Layout

Good layout practices for analog circuits:

• Use gate lengths several times larger than the technology’s minimum gate length if all possible. This helps reduces effects while improving matching.

• Use multiple source/drain contacts along the width of the transistor to reduce parasitic resistance and provides evenly distributed current through the device.

Page 15: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 15Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Analog Layout

Good layout practices for analog circuits (continued):

• Interdigitize large aspect ratio devices to reduce source/drain depletion capacitance. Using an even number (n) of gate fingers can reduce Cdb, Csb by

one-half or (n + 2)/2n depending on source/drain designation. Typically it is preferred to reduce drain capacitance more so than source capacitance. Also use dummy poly strips to minimize mismatch induced by etch undercutting during fab.

Page 16: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 16Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Analog Layout

Good layout practices for analog circuits (continued):

• Matched devices should have identical orientation. An example of what not to do is shown below.

Page 17: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 17Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Good layout practices for analog circuits (continued):

• Interdigitization can be used in a multiple transistor circuit layout to distribute process gradients across the circuit. This improves matching.

• Use common-centroid structures.

Analog Layout

Page 18: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 18Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Analog Layout

Matching Errors in MOSFET Current Mirrors:

• Good layout design is essential for circuits needing matched devices.

• Layout techniques are effectively used to minimize first-order mismatch errors due to variations in these process parameters: gate-oxide thickness, lateral diffusion, oxide encroachment, and oxide charge density.

Page 19: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 19Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Analog Layout

Matching Errors in MOSFET Current Mirrors (continued):

• Considering only the effects of threshold voltage mismatch within the simple current mirror, its current ratio is described by

for SI saturation operation if a symmetric distribution in threshold voltage across the circuit is assumed (i.e., VTHN1 = VTHN 0.5VTHN and VTHN2 = VTHN +

0.5VTHN). Note the dependence on VGS. A reduction in VGS increases the

input/output error in current mirrors induced by threshold voltage mismatch.

2

2

2

2

1

21

21

5.0

5.0

THNGS

THN

THNGS

THN

THNTHNGS

THNTHNGS

D

o

VVV

VVV

VVV

VVV

I

I

THNGS

THN

D

o

VV

V

I

I

2

11

Page 20: Ben Blalock - 1 Analog Layout – Fall 2002 Electrical & Computer Engineering Figures ©Baker, Li, & Boyce 1998 Analog Layout

Ben Blalock - 20Analog Layout – Fall 2002

Electrical & Electrical & ComputerComputer

EngineeringEngineeringFigures ©Baker, Li, & Boyce 1998

Analog Layout

Matching Errors in MOSFET Current Mirrors (continued):

• Considering only transconductance parameter mismatch,

where the value of KPn is the average transconductance parameter between

the two transistors within the simple current mirror.

• Considering only VDS and effects [SI sat.] ,

These, too, can be a significant source of error (e.g., 11%! if VDS1 = 2V,

VDS2 = 4V, (c + m)1 = 0.04V-1, and (c + m)1 = 0.05V-1).

n

n

D

o

KP

KP

I

I 1

1

11

22

1 1

1

DSmc

DSmc

D

o

V

V

I

I