colmar setember 2002 m. dentan, ph. farthouat 1 out of 38 radiation assurance in the lhc experiments...
TRANSCRIPT
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Radiation Assurance in the LHC experiments
Martin DentanCEA Saclay
Philippe FarthouatCERN
With the help of
Francis AnghinolfiJorgen Christiansen
Mika HuhtinenPeter Sharp
Giorgio Stefanini
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Outline
Radiation Issues Radiation constraints in the experiments Radiation hardness assurance in the
experiments A few examples of difficulties Conclusions
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Radiation Issues (1)
Cumulative effects– Total Ionising Dose (TID)
» Energy deposited in the electronics by radiation in the form of ionization.
» Unit:Gray (Gy), 1 Gy = 100 rad» Affects all electronics devices
– Non Ionising Energy Loss (NIEL)» Displacement damage» Unit: particles/cm2 » Complex radiation 1 MeV neutrons equivalent» CMOS devices are not affected
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Radiation Issues (2)
Single Event Effect (SEE)– Destructive effects: SEL, SEB, SEGR, …– Upsets: SEU (logic), SET (linear)– Instantaneous effect: may occur just after the
beam is switched on.
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Radiation Issues: TID
Charge trapping in oxides and interfaces Vt shift, change gm, leakage current, noise, … Cumulated damage => delayed effect Dose rate and temperature dependence Effects on MOSFETs, BJTs, diodes, … May appear after only few krads
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Radiation Issues: NIEL
Bulk defects in semiconductors , noise, … Cumulated damage => delayed effect Effects on bipolar devices No effect on MOSFETs
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Radiation Issues: SEE
Energy deposition in the component Can change the state of logic node (SEU) or generate
transients in linear circuitry (SET) Can trigger parasitic components and generate latch-up
(SEL), burn-out (SEB),.. A work done by M. Huhtinen, F. Faccio has shown that only the
hadrons of E > 20 MeV have to be considered
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Radiation constraints: ALICE
TID (10 years) – 2.5kGy (pixels
inner layer @ 3.9cm radius)
– 1 Gy (in the experimental hall)
NIEL (10 years)– 2.1012 n.cm-2 (pixels
inner layer @ 3.9cm radius)
– 108 n.cm-2 (in the experimental hall)
Radiation levels: internal note with updated calculations–A. Morsch, B. Pastircak (to become available end Sept 02)
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Radiation constraints: ATLAS
TID (10 years)– 3 MGy (Pixels)– 5 Gy (Cavern)
NIEL (10 years)– 2 1015 n.cm-2 (Pixels)– 2 1010 n.cm-2
(Cavern) SEE (10 years)
– 3 1013 h.cm-2 (Pixels)– 2 109 h.cm-2
(Cavern)– h > 20 MeV
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Radiation constraints: CMS
TID (10 years)– 8 MGy (Pixels)– 5 Gy (Cavern)
NIEL (10 years)– 2.5 1015 n.cm-2
(Pixels)– 2 1010 n.cm-2
(Cavern) SEE (10 years)
– 3 1013 h.cm-2 (Pixels)
– 2 109 h.cm-2 (Cavern)
– h > 20 MeV
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Radiation constraints: LHCb
TID (10 years)– 0.1 MGy (vertex)– < 100 Gy (cavern)
NIEL (10 years)– 1015 n.cm-2
(vertex)– 2 1012 n.cm-2
(cavern)
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Radiation constraints: summary
ATLAS and CMS are very similar– 10’s of MRad in the trackers– 100 – 1000 kRad in the calorimeters (Em)– A few kRad in the muon spectrometers and the
caverns LHCb
– A few Mrad in the vertex– A few kRad in the calorimeter and muon
» Although the muon electronics has more ALICE has lower levels
– 250 kRad in the pixel– Less than a kRad in the cavern– SEE have still to be taken into account
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Radiation Hardness Assurance
Goal: reliability of the experiment with respect to radiation
The radiation hardness assurance methods must be applied to each sub-system of the experiments– Particular attention should be paid to the
identification of critical elements and to the possible failure modes
Should be coherent– Same rules for every system
Apart for the tracker electronics, there are differences between the experiments
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Radiation hardness for inner trackers
Very uniform policy within the four experiments– Use of radiation hard technology (DMILL)– Use of DSM technology with a rad-hard lay-out– Very strict qualification for other components
» e.g the optical links components
Status of design and production
Experiment Detector Chips Techno Status ALICE Pixels FE DSM Pre-production Si Strip HAL25 DSM Prototyped Si Drift PASCAL, AMBRA
/ CARLOS DSM Prototyped
ATLAS Pixels FE DSM Prototyped
Control DSM Prototyped
SCT ABCD DMILL Production almost finished TRT ASDBLR DMILL On going pre-production
DTMROC DSM Fully working prototype
CMS Pixels FE DMILL Prototyped FE DSM Being designed Tracker APV25 DSM Production started LHCb Vertex FE DSM Prototyped Beetle DSM Prototyped
Others SCTA DMILL Prototyped
Otis DSM Prototyped Carioca DSM Prototyped Dialog DSM Prototyped Sync DSM Prototyped GOL DSM Prototyped
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Radiation Hardness Assurance: Constraints
Basis for the tests to be done Needed:
– TID (Gy), NIEL (1 MeV equiv. N.cm-2), “SEE” h.cm-2 (E > 20 MeV) Very desirable to have tools to get these constraints in
small elementary domains– Averaging may lead to optimism
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Radiation Hardness Assurance: Constraints
ATLAS MDT readout ASICLeakage current versus TID
Average constraint
Hot points(a few 10’s of ASICs)
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Radiation Hardness Assurance: Constraints
Constraints from simulation tools (Fluka, Gcalor, Mars)– There are uncertainties due to the physics models,
to the detector model, …– There are uncertainties with the electronics
Safety Factors
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Safety Factors
Simulation uncertainties (location and type dependent)– ALICE proposes from 2 to 3 – ATLAS ranges from 1.5 to 6 – LHCb uses 2– CMS quotes from 1.3 to 3
Electronics effects– Low dose rate effects
» ATLAS ranges from 1 to 5 depending on radiation type, technology and tests procedures (e.g. annealing at high temperature)
– Lot to lot variation for the COTS» ATLAS ranges from 1 to 5» LHCb ranges from 2 to 100
– Safety factors are there to flag possible problems Dosimetry uncertainties
– LHCb applies a factor 2– Others trust the dosimetry
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Testing Procedures
Testing electronics against radiation is complex– Tests conditions– Type of radiation– Biasing conditions– Annealing conditions
Better to base the tests on standard methods– ESA or MIL
Tests to be done several times– Pre-selection– Qualification of production lots
Experiments policy– ATLAS has defined some testing procedures– LHCb is pointing to them
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Results book keeping
Very desirable to have a standard radiation test report– To be sure that nothing is forgotten– To be easily reviewed and shared
A central place to store them is also desirable– To share the results between different groups
A data base accessible through the WEB is available– Developed by Chris Parkman for ATLAS– Adopted by RD49 i.e available for all experiments– Not sufficiently used
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Management
Two main types Radiation Hardness treated centrally
– One responsible for the experiment, One per sub-system, one per electronics entity (boards)
– Common rules for everybody– Common rules for the reviews– Preselection and qualification processes
Radiation Hardness treated by each sub-system – As an extra specification– No specified rules
ATLAS is using the first model, CMS the second one
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Interpretation of the results
Assuming a perfect procedure has been applied we should know when launching the production– How the electronics will behave in time with respect to
cumulative effects– What is the cross-section of SEE
The agreement for starting the production still needs some extra thinking– Can we have some maintenance for cumulative effects
» Physical access and financial capability
– Can we overcome the effects of SEE» In the design in implementing special techniques (e.g
redundancy)» In the system in implementing reset sequences or continuous
monitoring of the key data» In the power supplies for latch-up detection and automatic
switch off» In just living with them (e.g data corruption)
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Interpretation of the results –cont.-
The most difficult point concerns the SEE as this is a statistical process and that it is not needed to have high doses to be disturbed
The experience that we have got in ATLAS is that there has not been a single SEE test not leading to problems
FPGA are particularly sensitive– LHCb has issued a rule for using only antifuse FPGA and triple
redundancy– Several systems are going to use ASICs or Gate Arrays instead of
FPGA (ATLAS Liquid Argon and Muon trigger) or are moving the complexity at safer places (ATLAS Muon tracking, LHC machine)
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A few examples of difficulties
ATLAS Liquid Argon electronics and power supplies
ELMB Low voltage regulators
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Liquid Argon Electronics
Radiation Tolerance Criteria for LAr– TID = 525–3500 Gy/10yr – NIEL = 1.6–3.2 1013 N/cm2/10yr– SEE = 7.7-15 1012 h/cm2/10yr
Electronics in crates around the detectorG’dammI am good!
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Liquid Argon Electronics
1 responsible per board– FEB (1600 boards) : J. Parsons– Calib (120 boards) : N seguin– Controller (120 boards) : B. Laforge– Tower builder (120 boards) : J. Pascual– Tower driver board (23 boards) : E.Ladyguin– LV distrib ( ) : H. Brettel– Purity (?) : C. Zeitnitz– Temperature : ?
1 representant for power supplies– Helio Takai
1 representant for optical links– Jingbo Yee
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Liquid Argon Electronics
First tests made with COTS were very disappointing…
Decision to avoid them as much as possible
A lot of extra design work
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Liquid Argon Electronics: FEB
10 different custom rad-tol ASICs, relatively few COTs
DMILL
DSM
AMS
COTS
32 SCA 16 ADC 8 GainSel
1 GLink1 Config.2 SCAC
1 SPAC
1 MUX32 Shaper
1 TTCRx7 CLKFO14 pos. Vregs+6 neg. Vregs
2 LSB
32 0T
128input
signals
1 fiber to RODAnalog
sumsto TBB
2 DCU
TTC,SPACsignals
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Liquid Argon Electronics: ASICs
LARG Chip Techno Status HAMAC-SCA DMI LL Production on- going SCA Controller DSM Working prototype Gain Selector DSM Working prototype BiMUX DMI LL Production on- going Clock FO DSM Prototyped DAC DMI LL Production on- going SPAC slave DMI LL Prototyped OpAmp DMI LL Production on- going Config. Controller DMI LL Ready for production MUX DMI LL Redesign Calibration Logic DMI LL Ready for production
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Liquid Argon Electronics
Tracking of the status of radiation hardness of components
Still possible to forget a component– E.g opto-receiver of the TTC
Complete crate with radiation tolerant electronics to be ready in 2003
Part Responsible for RHA
Pre-selection Qualification
AD9042AST CMS completed by CMS. Reports missing.
to be done by CMS (date?)
AD8042AR LARG/FEB Group
SEE and NIEL test completed (150 MeV protons); reports missing. TID test to be done separately.
to be done (date?)
HDMP-1022 LARG/Links Group (SMU)
completed by LARG/Links Group (SMU); reports missing.
to be done by LARG/Links Group (SMU) (date?)
Optical Transmitter
LARG/Links Group (Taiwan)
completed by LARG/Links Group (Taiwan); reports missing.
to be done by LARG/Links Group (Taiwan) in March-April 2002
MC10H116D LARG/FEB Group
SEE and NIEL test completed (150 MeV protons); reports missing. TID test to be done separately.
to be done (date?)
AD8001 LARG/FEB Group ? CMS ?
completed by Tower builder. to be done by FEB or by CMS (date?)
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Liquid Argon Power Supplies
Each crate requires 3 kW 4 kW DC-DC based power supply has been designed
– To be located inside the detector– 300 V DC input
2-3 years of measurement and development to understand and solve radiation problems
Most severe problem was SEB (Single Event Burn-out)– SEB destroys the MOSFET.– SEB depends on how the MOSFET is biased and therefore on
the topology of the power supply. Resonant circuits for example are particularly bad for SEB because VDS depends on the load
– The second effect that one has to be aware is the asymmetric nature of the SEB cross section. When particles hit from the drain side it can be significantly larger than from the gate side. This has been determined for ~6 different power MOSFET.
Test Goal Achieved
Ionizing Radiation 10kRad 300kRad
NIEL 1.15x1012 5.0x1013
Hadrons E>20MeV 5x1011 SEB<1x10-16 cm2
SEL<7x10-13 cm2
Magnetic Field 20 G 120 G
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Liquid Argon Power Supplies –cont-
NOT because of loss of power supplies! SEB and SEGR are potential hazards that can short
converters and failure in protection systems could lead to instant fire hazard. Power supplies are rated to 4kW.
Note that they are located in places that are inaccessible in case of emergency.
Ionizing radiation damage leads to loss of regulation and potentially loss of electronics.
Magnetic Field saturates transformers and supplies ceases to work with possible short in the input stage.
Unknown background is the one that will do the job. Currently SEB for pions, kaons are unknown but we know that SEE induced by pions can be 5x larger than neutrons. Production of fragments in packaging, etc have not been considered.
Still a Lot of Concerns !!
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Embedded Local Monitor Box (ELMB)
Basic element for the slow control of the ATLAS muon chambers
Radiation constraints (including safety factors)– TID : 8.4 Gy in 10 years;– NIEL: 5.7E11 n/cm2 (1 MeV eq.) in 10 years;– SEE: 9.5E10 h/cm2 (>20 MeV) in 10 years.
CAN SAE81C91
3.3 to 5.4V option?
VSup
50 mm
67 mm
DIP-SWIDBAUD
ISP
OPTOs
Voltage regulators
ATMELmicros
CAN Tranceiver
ADC AnalogMUX
REF
Logic
Latch
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ELMB –cont-
Comparison GIF
99
104
109
114
119
124
0 10 20 30 40 50 60
TID (Gy)
Ch
an
ge
in
cu
rre
nt
(%)
ELMB3 ELMB5 ELMB6
GIF ELMB3 0.48 Gy/hcontinously
GIF ELMB5 0.45 Gy/h continously
ELMB5Reprog37% duty cycle~0.17 Gy/h
GIFELMB60.09 Gy/hcontinously
TID results: one of the processors is sensitive (although well within the requirements)
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ELMB –cont-
SEE results: requirement for an automatic power on-off
Care being taken for the use of the RAM– “SEE resistant” software
Requirements ELMB Result
6250 21 6
1429 5 1.4
45 4 1.2
0.0083 (0) (0)0)
for 9.5*1010 h/cm2
Soft SEE
Category
Hard SEE
SEE upsets forSEE upsets for3.3*1011p/cm2
automatic recovery
software reset
requiring power off-on
ELMB ResultsELMB Resultsfor 9.5*1010 h/cm2
Requirements ELMB Result
6250 21 6
1429 5 1.4
45 4 1.2
0.0083 (0) (0)0)
for 9.5*1010 h/cm2
Soft SEE
Category
Hard SEE
SEE upsets forSEE upsets for3.3*1011p/cm2
automatic recovery
software reset
requiring power off-on
ELMB ResultsELMB Resultsfor 9.5*1010 h/cm2
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ELMB –cont-
Additional work going on– Current design has two processors. Next will have
one only. Improved TID response– Software to counteract the SEE being improved
Production organisation– Qualification of batches of components
Safe definition of where the ELMB can be used:– TID > 40 Gy for protons – NIEL > 5*1012 neutrons/cm2– SEE >> MDT requirements
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Low Voltage Regulators
Radiation tolerant low voltage regulators (a few krad and a few 1012 n.cm-2) almost impossible to find– One from Intersil may be OK for ATLAS calorimeter
but costs too much RD49 has initiated a development with ST
Electronics– Positive and negative adjustable regulators– Very hard (several Mrad)
Positive version available Negative version had a bug
– Has been corrected– A few 100’s available in November (not lifetime
qualified)– Quantities in January-February 2002
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Summary-Conclusions
Radiation Hardness is still an issue in the experiments– SEE is a major concern
The knowledge of the problems has reached a reasonably good level in the community thanks to tutorials organised either in the experiments or by RD49
The radiation hardness assurance approaches are not identical in the experiments (or in the machine)
Book keeping is a key issue if one wants to benefit from the work done– The existing data base should be more widely used– It requires a effort of documentation from all of us
» Tests descriptions» Results