d. ugolini, joint aps-aapt meeting at ut-arlington, october 2006 developing a capacitive probe for...

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D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006 Developing a Capacitive Probe for Measuring Charging Effects on In-Vacuum Optics Dennis Ugolini, Robert McKinney Trinity University Fall 2006 Joint APS-AAPT Meeting October 6, 2006

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Page 1: D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006 Developing a Capacitive Probe for Measuring Charging Effects on In-Vacuum Optics Dennis

D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006

Developing a Capacitive Probe for MeasuringCharging Effects on In-Vacuum Optics

Dennis Ugolini, Robert McKinneyTrinity University

Fall 2006 Joint APS-AAPT MeetingOctober 6, 2006

Page 2: D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006 Developing a Capacitive Probe for Measuring Charging Effects on In-Vacuum Optics Dennis

D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006

Gravitational-Wave Interferometry

Gravitational-wave detectors such as LIGO use suspended optics in a Michelson interferometer geometry to measure curvature in space from the motions of massive astronomical bodies.

Page 3: D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006 Developing a Capacitive Probe for Measuring Charging Effects on In-Vacuum Optics Dennis

D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006

Problem: Surface Charge

Surface charge may build up on test masses» Friction with dust molecules

» Contact with conductors

» Cosmic rays

Potential concerns» Interferes with positioning

magnets

» Fluctuating electric fields

» Dust attracted to optic

Page 4: D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006 Developing a Capacitive Probe for Measuring Charging Effects on In-Vacuum Optics Dennis

D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006

The correlation time for charge mobility, which affects force as:

The effectiveness of charge reduction techniques» Slightly conducting ionic coating» Shield test mass with conductors to terminate electric fields» Discharge with UV light (LISA)

What We Know/Don’t Know

Optics experience drifts of ~105 e-/cm2/month, jumps of ~108

» Mitrofanov et al., Phys. Lett. A300, 370 (2002).

Negligible effects on mechanical Q» Mortonson et al., Rev. Sci. Inst. 74, 4840 (2003).

What we know:

What we don’t know:

(R. Weiss, LIGO-T960137-00-E)

Page 5: D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006 Developing a Capacitive Probe for Measuring Charging Effects on In-Vacuum Optics Dennis

D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006

The Kelvin Probe

We need a charge sensor that is small, vacuum-compatible, and inexpensive

The Kelvin probe measures the contact potential difference between the probe and sample

Commercial probes modulate the difference by vibrating the probe tip by PZT or voice coil -- expensive

Instead, modulate difference with optical chopper

Page 6: D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006 Developing a Capacitive Probe for Measuring Charging Effects on In-Vacuum Optics Dennis

D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006

Probe Designs

First -- area around tip too wide, collides with chopper

Second– lots of noise without grounding ring

Final version

In-vacuum model

Page 7: D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006 Developing a Capacitive Probe for Measuring Charging Effects on In-Vacuum Optics Dennis

D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006

Readout Frequency

= field lines

Because the chopper has a 50% duty cycle, the signal is generated at twice the chopping frequency. This helps avoid noise from the chopper’s current coil.

Page 8: D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006 Developing a Capacitive Probe for Measuring Charging Effects on In-Vacuum Optics Dennis

D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006

Calibration

The probe is calibrated by comparing the readout for a plastic sample to the reading from a surface DC voltmeter, whose reading can be converted to a charge density.

The ~1 μV fluctuations in the probe signal correspond to a charge density of 3 × 105 e/cm2.

Page 9: D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006 Developing a Capacitive Probe for Measuring Charging Effects on In-Vacuum Optics Dennis

D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006

Signal vs. Distance

Measured for metal sample at +15V

Used rotary chopper

Deviation from inverse square due to charge on chopper blade

Page 10: D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006 Developing a Capacitive Probe for Measuring Charging Effects on In-Vacuum Optics Dennis

D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006

Frequency Response

Probe Response vs. Frequency, Alum. Sample

0

10

20

30

40

50

60

0 200 400 600 800 1000 1200 1400

Frequency (Hz)

Pro

be

sig

nal

(u

V)

Page 11: D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006 Developing a Capacitive Probe for Measuring Charging Effects on In-Vacuum Optics Dennis

D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006

Charge Decay Over Time

0

0.5

1

1.5

2

2.5

3

0 20 40 60 80 100 120 140

Tim e (m inutes)

Pro

be

sig

nal

(m

V)

6/7/2006

6/8/2006

6/9/2006

Page 12: D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006 Developing a Capacitive Probe for Measuring Charging Effects on In-Vacuum Optics Dennis

D. Ugolini, Joint APS-AAPT Meeting at UT-Arlington, October 2006

Future Work

Move probe into ~10-5 torr vacuum chamber

Measure charge buildup and time constant for optical material

Measure variations for different coatings, cleaning methods, etc.