delivering success. modeling 32 v asymmetric ldmos using aurora and hspice level 66 by alhan...
TRANSCRIPT
Delivering Success.
Modeling 32 V Asymmetric LDMOS Using Aurora and Hspice Level 66
By
Alhan Farhanah, Mohd Shahrul Amran, Albert Victor Kordesch
Device Modeling Department, SILTERRA Malaysia Sdn. Bhd.
2007
ESSDERC 2007 MUNICH2
Delivering Success.
Outline
Aurora and HSPICE Level 66 Background
32V Asymmetric HV MOS Background Modeling Flow for Asymmetric HV
MOS Results and Discussion Self Heating Effect in HV MOS Conclusion
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Aurora and HSPICE Level 66 Background
Aurora o product of Synopsys Inc for Modeling. o Beside HSPICE Level 66, Aurora also
offers all types of models that normally offered by other products.
Contends for the modeling and SPICE simulation of digital CMOS, analog and RF circuit that operates up to 100V.
ESSDERC 2007 MUNICH4
Delivering Success.Aurora and HSPICE Level 66
Background (cont’d) HSPICE Level 66 is a proprietary product of
Synopsys.
HSPICE Level 66 model
o self heating, forward and reverse mode, asymmetric parasitic, and bias dependent RDS- based on BSIM4
o primarily targets for LDMOS (Lateral Double Diffused MOSFET) and EDMOS (Extended Drain MOSFET) device technologies.
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32V Asymmetric HV MOS Background (cont’d) Structure
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Modeling Flow For Asymmetric HV MOS
Golden Die
Asymmetric Behavior Checking
DC Measurement
AC Measurement
Aurora ExtractionAnd Optimization
Hspice Simulation
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Modeling Flow For Asymmetric HV MOS (cont’d)Asymmetric Behavior Checking
Purpose - check the asymmetric effect of the transistor.
Measurement - swapping the bias voltage of source and drain for each measurement.
Compare IdVd curve for forward and reverse mode measurement.
ESSDERC 2007 MUNICH8
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Long Channel Device(W/L=25u/25u)
Almost similar ID
Modeling Flow For Asymmetric HV MOS (cont’d) Asymmetric Behavior Checking
+++ forward mode___ reverse mode
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Delivering Success.Asymmetric Behavior Checking
Short Channel Device (W/L=25u/4.25u)
Significant ID decrease
+++ forward mode___ reverse mode
VGS
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The results showed that shorter length device exhibits quite significant Id decrease for reverse mode measurement while the long channel device exhibits almost similar Id curve for both modes of measurement
Modeling Flow For Asymmetric HV MOS (cont’d)
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Modeling Flow For Asymmetric HV MOS (cont’d) DC Measurement Measurements:
o IdVg@low Vdd with different Vbo IdVg@high Vdd with different Vbo IdVd @Vb=0 with different Vg o IdVd @high Vb with different Vg
Before measuring all the modeling devices, Wide Width and small Length transistor with different back biases and different temperatures must be evaluated first
ESSDERC 2007 MUNICH12
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To properly model the effect of asymmetric, the modeling structure for CV need to be designed with extra structures compare to symmetric structure.
All the CV modeling structures need to be separated into 2 different structures:
o Source design rule o Drain design rule.
Thus, the CV measurement for asymmetric transistor is almost double compare to symmetric transistor.
Modeling Flow For Asymmetric HV MOS (cont’d) CV Measurement
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Extraction strategy – almost similar to BSIM4
The preferred mobility model in Level 66 o MOBMOD=0
Source and Drain parameters are not equal. e.g RSW and RDW, RSWMIN and RDWMIN
Both drain side and source side bias dependence parameters of LDD resistance can be optimized.
Modeling Flow For Asymmetric HV MOS (cont’d) Extraction and Optimization
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Modeling Flow For Asymmetric HV MOS (cont’d) Extraction and Optimization There are reverse mode parameters available for
optimization i.e ETA0I, ETABI, DSUBI o Too many of these parameters are not
encouraged. Self heating effect can be turned on by setting
SHMOD=1 and RTH0>0. o Strongly advised to set TSHFLAG=1 during the
optimization - internal approximation of self heating effect will be used during the optimization. Hence, the speed of the optimization is significantly improved. In the final step, the optimization can be refined by setting TSHFLAG=0.
When self heating is turned on, the temperature parameters need to be extracted as much as possible before we do extraction for saturation region parameters.
ESSDERC 2007 MUNICH15
Delivering Success.Modeling Flow For Asymmetric HV
MOS (cont’d) Extraction and Optimization Disadvantages of Level 66 model:
Slower model evaluation -includes internal nodes (solver need to be invoked for every bias point)
There is no reliable way to extract thermal capacitance. Thus, we need to develop a method to include thermal time constant in our model.
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Delivering Success.Results and Discussion
W/L = 25um/25um
+++ Meas___ Model
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Delivering Success.Results and Discussion (cont’d)
W/L = 25um/4.25um
+++ Meas___ Model
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Delivering Success.Results and Discussion (cont’d)
W/L = 25um/25um
+++ Meas___ Model
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Delivering Success.Results and Discussion (cont’d)
W/L = 25um/4.25um
+++ Meas___ Model
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Delivering Success.Results and Discussion (cont’d)
Idsa
t (u
A/u
m)
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Delivering Success.Results and Discussion (cont’d)
Vth
(V
)
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Delivering Success.Results and Discussion (cont’d)
+++ Meas___ Model
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Delivering Success.Results and Discussion (cont’d)
+++ Meas___ Model
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Delivering Success.Results and Discussion (cont’d)
In this paper, IdVg and IdVd curves for 25um/25um and 25um/4.25um have been used to demonstrate model accuracy.
The model also correctly simulates self heating effect
The model scalability (across W and L) also showed a good agreement with measurement data. Less than 5%.
The accuracy of the AC behavior is excellent. Less than 1%.
ESSDERC 2007 MUNICH25
Delivering Success.
Self Heating Effect in HV MOSFET
HPWELL
N-DRIFT
POLY
STIN+
STIP+
P-Sub
N-DRIFT
N+
STIHEAT
GateSourc
eDrain
If P is moderate(mW), self heating is not severe sinceit reach its thermal equilibrium with its environment
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Experimental setup
VG
4.7F
50
VD
oscilloscope
VDD
Pulse Gen
Self Heating Effect in HV MOSFET (cont’d)
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Dynamic response of HV NMOS to typical gate pulse
VG
VD
Self Heating Effect in HV MOSFET (cont’d)
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Self Heating Effect in HV MOSFET (cont’d) RTH extraction RTH will be extracted from Aurora by fitting
the data for W=25um and different L. set SHMOD=1 and RTH0>0. This is to ensure that the RTH can be scaled
with L.
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Transient drain-current characteristics of HV NMOS
y = -0.4502Ln(x) + 13.612
11
11.5
12
12.5
13
13.5
1 10 100 1000Time (us)
I D (
mA
)
Due to SHE
ESSDERC 2007 MUNICH30
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Time constant for self heating of HV NMOS
y = 2.3011e-0.0546x
1.0
1.2
1.4
1.6
1.8
2.0
2.2
0 2 4 6 8 10
Time (us)
Delt
a I D (
mA
)
R*C = 1/0.0546R*C = 18.32 us
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Delivering Success.
Self Heating Effect in HV MOSFET (cont’d)Extracted time constant and CTH
Time constant is extracted from : y = 2.3011e-0.0546x
where thermal time constant, RTH CTH = 1/0.0546
= 18.32 us From Aurora extraction RTH = 6.85E-03 mºC/W
Hence the extracted thermal capacitance:
CTH = 18.32us/RTH
= 2.67E-03 (W*sec)/ mºC
ESSDERC 2007 MUNICH32
Delivering Success.Conclusion
Modeling strategies for 32V asymmetric HV MOSFET using Aurora and HSPICE level 66 has been presented
Model shows:o Excellent DC IV results for entire DC bias
rangeo Excellent behavior of junction capacitances
Model scalability (across W and L) also showed good agreement with measurement data. Less than 5%
Correctly simulate SHE
Extraction of Thermal resistance and capacitance by Pulsed gate measurement
ESSDERC 2007 MUNICH33
Delivering Success.
Thank You