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Optical Measurement Systems for Industrial Inspection

Modeling Aspects in Optical Metrology

Optics for Arts, Architecture, and Archaeology

Videometrics, Range Imaging, and Applications

Munich ICM—International Conference Centre Munich, Germany

23-26 May 2011

www.spie.org/om

Sponsored by:

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European Conference on Optical Metrology · www.spie.org/omprogramme2

Welcome!On behalf of SPIE, welcome to Munich and to SPIE Optical Metrology 2011. This week you will hear the latest research from the world’s leading experts in the field of optics and laser applications in metrology and art and archaeology conservation. Co-located with Laser World of Photonics 2011, this symposium gives you numerous opportunities to develop your career by networking with engineers, researchers, and developers from Europe and beyond. We hope you enjoy your time here at SPIE Optical Metrology 2011, the premier European optical metrology symposium, and we look forward to seeing you this week.

Symposium Chairs:

Wolfgang OstenUniv. Stuttgart (Germany)

Malgorzata KujawinskaWarsaw Univ. of Technology (Poland)

Pietro FerraroIstituto Nazionale di Ottica Applicata (Italy)

Conferences: 23–26 May 2011 Munich ICM — International Conference CentreMunich, Germany

Cooperating Organisations

(Wissenschaftliche GesellschaftLasertechnik e.V.)

German Scientific Laser Society



8082 Optical Measurement Systems for Industrial Inspection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

8083 Modeling Aspects in Optical Metrology . . . . . . 14

8084 O3A: Optics for Arts, Architecture, and Archaeology . . . . . . . . . . . . . . . . . . . . . . . . . . . 16

8085 Videometrics, Range Imaging, and Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 18

General Information . . . . . . . . . . . . . . . . . . . . . . . . 20-21

Index of Authors, Chairs, and Committee Members . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22-26

SPIE Proceedings/CD-ROM . . . . . . . . . . . . . . . . . . . . 27

Daily Events Schedule . . . . . . . . . . . . . . . . . . . . . . . . . . 4

Plenary Session . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

Workshop: Industry meets Academia (Sunday 22 May, 10.00 to 18.00) . . . . . . . . . . . . . . . 6

Special Events . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7

Technical Conferences

Technical CommitteeBernd Bodermann, Physikalisch-Technische

Bundesanstalt (Germany)

Harald Bosse, Physikalisch-Technische Bundesanstalt (Germany)

Pietro Ferraro, Istituto Nazionale di Ottica Applicata (Italy)

Kay Gastinger, SINTEF (Norway)

Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland)

Peter Lehmann, Univ. Kassel (Germany)

Wolfgang Osten, Univ. Stuttgart (Germany)

Luca Pezzati, National Institute of Applied Optics/CNR (Italy)

Fabio Remondino, FBK Trento (Italy)

Renzo Salimbeni, Institute of Applied Physics “N. Carrara”/CNR (Italy)

Richard M. Silver, NIST (USA)

Mark Shortis, RMIT Univ. (Australia)

Advisory Committee Werner Jüptner, Bremer Institut für Angewandte

Strahltechnik (Germany)

Ralph P. Tatam, Cranfield Univ. (UK)

SPIE would like to express its deepest appreciation to the symposium chairs, conference chairs, programme committees, session chairs, and authors who have so generously given their time and advice to make this symposium possible. The symposium, like our other conferences and activities, would not be possible without the dedicated contribution of our participants and members. This programme is based on commitments received up to the time of publication and is subject to change without notice.

EOM11 Final A4 v3.indd 1 5/10/11 7:19 AM

European Conference on Optical Metrology · www.spie.org/om2

Facility Plan



Daily Schedule

Conferences

Sunday Monday Tuesday Wednesday Thursday

Special Events

Conf. 8084: O3A: Optics for Arts, Architecture, and Archaeology (Pezzati, Salimbeni) p. 16

Conf. 8085: Videometrics, Range Imaging, and Applications (Remondino, Shortis) p. 18

Managed by Europe

SPIE Europe Ltd., a subsidiary of SPIE, is a not-for-profit UK-registered company serving SPIE constituents throughout Europe as an advocate and liaison to political and industry associations within the European optics and photonics community.

In addition to providing membership services, SPIE Europe Ltd. organises and manages internationally recognised conferences, education programmes, and technical exhibitions featuring emerging technologies in optics and photonics.

SPIE Europe 2 Alexandra GateFfordd Pengam, Cardiff, CF24 2SATel: +44 29 2089 4747Fax: +44 29 2089 [email protected]

SPIE

LibraryDigital

SPIEDigitalLibrary.orgFind the answer

Workshop: Industry meets Academia p. 6

Conf. 8083: Modeling Aspects in Optical Metrology (Bodermann) p. 14

Conf. 8082: Optical Measurement Systems for Industrial Inspection (Lehmann) p. 8

Poster Sessions p. 7 Poster Sessions p. 7

Plenary Session p. 5

Welcome Reception p. 7

Register today!

www.spie.org/om



Room 1, Wednesday, 10.30 to 11.20

Coherence Holography: Principle and Applications

Mitsuo Takeda, The Univ. of Electro-Communications, Japan

Traditionally, holography and statistical optics have been regarded as mutually separated fields of optics. For a long time, this seemed to have restricted synergy of knowledge in holography and coherence theory. Recently we proposed a new technique of unconventional holography, called coherence holography, which bridges the gap

between the two fields. The principle of coherence holography is based on the fact that a coherence function obeys the same wave equation as the optical field. In coherence holography, a hologram is illuminated by spatially incoherent light, and a 3D object is reconstructed as the 3D distribution of a spatial coherence function rather than the field itself. Just as a computer-generated hologram can create a 3-D image of a non-existing object, a computer-generated coherence hologram can create an optical field with a desired 3-D distribution of spatial coherence function. Thus coherence holography opens up a new possibility of optical tomography and profilometry based on a synthesized spatial coherence function, and a coherence hologram also serves as a generator of coherence vortices.

The principle and applications of coherence holography will be reviewed with particular emphasis on the space-time analogy in coherence theory, as well as the formal analogy between an optical field and its coherence function, which gives an insight into the methodology for coherence holography and the new concept of spatial frequency comb for dispersion-free optical coherence tomography and profilometry.

Biography: Mitsuo Takeda is a Professor of Engineering Science Department at the University of Electro-Communications (UEC), Tokyo, Japan. He received the BE degree in Electrical Engineering from UEC in 1969, and the ME and Ph.D. degrees in Applied Physics from the University of Tokyo, respectively, in 1971 and 1974. After working for Canon Inc., he joined the faculty of UEC in 1977. During 1985 he was a visiting scholar in Prof. Joseph W. Goodman’s Group at Stanford University.

His technical activities and interest include optical metrology, holography and its application to optical information processing. He is the 2010 recipient of SPIE Dennis Gabor Award, SPIE Fellow, OSA Fellow, and JSAP Fellow. He is a Member of International Order of Knights of Holography. His service to technical communities includes Board of Directors of SPIE, JSAP, and OSJ. At present he is President of Optical Society of Japan, an affiliate of JSAP.

Plenary Session



Workshop

Novotel München Messe Sunday 22 May, 10.00 to 18.00

Workshop: Industry meets Academia

NOTE: You must register to attend. Please see the registration desk for details.

Workshop Chairs: Wolfgang Osten, Univ. Stuttgart, Germany; Nadya Reingand, CeLight Inc., United StatesPhotonics is a key technology and an enabling technology as well. Photonic technologies and products gain increased impact in all sectors of the social and commercial life. Meanwhile the dissemination of photonic products can only be compared with microelectronics. One important basis for innovation is the consequent observation of the whole life cycle of products. The question, how technologically progressive industries and new products evolve from birth through maturity, has to consider the interaction of different players in various phases of the life cycle. In the early phase the interaction between partners from industry and academia plays a growing role.

This workshop is dedicated to the exchange of experiences among these partners acting actively within collaborative projects on European and national level. Based on the presentation of current running projects a vital information exchange is stimulated followed by specified courses that are addressing important subjects of cooperation: intellectual property, contracting and negotiation strategies.

Sponsored by Co-Organiser

ProgrammeMorning Workshop Session (includes IUC Meetings)

10.00 to 10:05: Welcome Address, K. Svanberg, SPIE 2011 President, Lund University Hospital, Lund, Sweden

10.05: Welcome & Introduction, W. Osten, ITO, Univ. Stuttgart

10.30 to 12.30: Presentation of current European and German Collaborative Research Projects: Benefits for Industry and Academia

10.30: European Research Project PHOSFOS, F. Berghmans, Vrije Univ. Brussel, Belgium

11.00: German Research Project OptAssyst, T. Hercke, Daimler Stuttgart, Germany

11.30: European Research Project SMARTIES, K. Gastinger, Univ. Trondheim, Norway

12.00: Discussion: Experiences and Future Potential of Cooperation between Industry and Academia

12.30: Lunch

Afternoon Session: Choose one 13.30 to 15.30: Workshops and Courses (parallel running meetings)

• Industrial User Club Meeting PHOSFOS

• Industrial User Club Meeting OptAssyst

• Industrial User Club Meeting SMARTIES

• 1st Course: Intellectual Property in academia: bringing university research to the market, N. Reingand, CeLight, Silver Spring, USA

• 2nd Course: Innovative approaches to valuation of emerging technologies, S. Spinler, M. Maiorov, Kuehne Foundation Chair in Logistics Maagement, WHU - Otto Beisheim School of Management, Vallendar, Germany and AKELA Laser Corp., USA

• 3rd Course: Negotiation of R&D and technology transfer agreements: good practice for academia, B. Seidel-Speer, Fraunhofer-Gesellschaft e.V., Patente and Lizenzen, Germany

16.00: German Agenda Photonics 2020, A. Tünnermann, Fraunhofer-Institut für Angewandte Optik und Feinmechanik, Germany

16.30 to 18.00: Get together

18.00: End of Workshop



Open Access in Scientific PublicationSunday 22 May . . . . . . . . . . . . . . . . . . . . . . 16.30 to 18.00 pm

Panel Chair: Frank Scholze, Head of KIT library (Karlsruhe Institute of Technology)

Organizers: Ulrike Küsters & Tina Klages, Competence-Center Fraunhofer-Online; Peter E. Andersen, Technical Univ. Denmark; Peter Loosen, Fraunhofer-ILT

Having entered the digital age, much owing to the widespread availability of the internet and the ability to reuse and distribute electronic data at low cost, the arguments for Open Access have gained new importance. Arguments for Open Access include information-sharing for the common good, improvement of visibility, and as a consequence the increase of citations. These arguments are currently debated among stakeholders in scientific publishing, including researchers, academics, librarians, university administrators, funding agencies, government officials, commercial publishers, and learned-society publishers. Although there is some agreement concerning the concept of Open Access, there is considerable debate about the economics of funding peer review in open-access publishing, and about the reliability and economic effects of self-archiving.

This panel discussion aims at shedding some light on these issues by first having short presentations from various stakeholders followed by a moderated debate.

All Students & SPIE Fellows LuncheonMonday 23 May . . . . . . . . . . . . . . . . . . . . . . 12.30 to 14.00 pm

Students: Advance Sign-up Required On-site.Seating Limited.

All students and SPIE Fellows are invited to this engaging networking opportunity. This event gives students an opportunity to network with SPIE Fellows who will share their insights into career paths in optics and photonics. Lunch is complimentary, but student sign-up is required.

Award CeremonyEducator Award Winners

Minella Alarcon, UNESCO, France Zohra Ben-Lakhdar, University El Manaur, Tunisia

G.G. Stokes Award Winner Johannes Fitzgerald de Boer, VU University, Amsterdam and

Rotterdam Ophthalmic Institute, Rotterdam, Netherlandswww.spie.org/om

Poster SessionsMonday 23 May . . . . . . . . . . . . . . . . . . . . . . . . . 16.40 to 18.00Wednesday 25 May . . . . . . . 16.00 to 16.40 and 16.40 to 17.20

All symposium attendees are invited to attend Monday and Wednesday Poster Sessions.

Please note that the Poster Session for Conferences 8082, Optical Measurement Systems for Industrial Inspection, and 8083, Modeling Aspects in Optical Metrology, will take place on Monday.

Please note that the Poster Session for Conferences 8084, O3A: Optics for Arts, Architecture, and Arts, and 8085, Videometrics, Range Imaging, and Applications, will take place on Wednesday.

Poster presenters may post their poster papers starting at 10.00 on Monday and at 10.00 on Wednesday in the Conference Area Hallway and present them during their respective Monday or Wednesday Poster Session. Any papers left on the boards following 12.00 hrs the following day will be considered unwanted and will be discarded.

SPIE assumes no responsibility for posters left up after the end of the Poster Session. Poster authors should be at their papers on Monday and Wednesday to answer questions from attendees. For specific times, please see the individual conference programmes. Attendees are requested to wear their conference registration badges to the poster sessions.

Welcome ReceptionPaulaner BräuhausWednesday 25 May . . . . . . . . . . . . . . . . . . . . . . 19.00 to 21.30

This evening event will feature a light meal and beverages at one of Munich’s premier breweries, the Paulaner Bräuhaus. All registered conference attendees are welcome. A guest may accompany a registered attendee for an additional charge (based on space available).

Special Events



Conference 8082Monday-Thursday 23-26 May 2011 • Proceedings of SPIE Vol. 8082

Optical Measurement Systems for Industrial InspectionConference Chair: Peter H. Lehmann, Univ. Kassel (Germany)

Conference Co-Chairs: Wolfgang Osten, Univ. Stuttgart (Germany); Kay Gastinger, Norwegian Univ. of Science and Technology (Norway)

Programme Committee: Astrid Aksnes, Norwegian Univ. of Science and Technology (Norway); Armando Albertazzi Gonçalves, Jr., Univ. Federal de Santa Catarina (Brazil); Oleg V. Angelsky, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine); Anand Krishna Asundi, Nanyang Technological Univ. (Singapore); Klaus-Friedrich Beckstette, Carl Zeiss AG (Germany); Ralf B. Bergmann, Bremer Institut für angewandte Strahltechnik (Germany); Harald Bosse, Physikalisch-Technische Bundesanstalt (Germany); Karsten Buse, Rheinische Friedrich-Wilhelms-Univ. Bonn (Germany); Yuri V. Chugui, Technological Design Institute of Scientific Instrument Engineering (Russian Federation); Jürgen W. Czarske, Technische Univ. Dresden (Germany); Peter J. de Groot, Zygo Corporation (United States); Cosme Furlong, Worcester Polytechnic Institute (United States); Marc P. Georges, Univ. de Liège (Belgium); Christophe Gorecki, Univ. de Franche-Comté (France); Roger M. Groves, Technische Univ. Delft (Netherlands); Roland Höfling, ViALUX GmbH (Germany); Pierre M. Jacquot, Ecole Polytechnique Fédérale de Lausanne (Switzerland); Eberhard Manske, Technische Univ. Ilmenau (Germany); Richard M. Kowarschik, Friedrich-Schiller-Univ. Jena (Germany); Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland); Andrew John Moore, Heriot-Watt Univ. (United Kingdom); Gunther Notni, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany); Eduard Reithmeier, Leibniz Univ. Hannover (Germany); Robert Schmitt, Fraunhofer-Institut für Produktionstechnologie (Germany); Jörg Seewig, Technische Univ. Kaiserslautern (Germany); Peter Markus Seitz, CSEM and Swiss Federal Institute of Technology EPFL (Switzerland); Marcus Steinbichler, Steinbichler Optotechnik GmbH (Germany); Mitsuo Takeda, The Univ. of Electro-Communications (Japan)

Monday 23 MayWelcome and Introduction

Room: 14c . . . . . . . . . . . . . . . . . . .Mon. 08.10 to 08.15Peter H. Lehmann, Univ. Kassel (Germany); Wolfgang Osten, Univ.

Stuttgart (Germany)

SESSION 1

Room: 14c . . . . . . . . . . . . . . . . . . .Mon. 08.15 to 09.15

Multisensor ApproachesSession Chairs: Wolfgang Osten, Univ. Stuttgart (Germany);

Peter H. Lehmann, Univ. Kassel (Germany)

08.15: Assistant systems for efficient multiscale measurement and inspection, Avinash Burla, Tobias Haist, Wolfram Lyda, Mohamed H. Aissa, Wolfgang Osten, Univ. Stuttgart (Germany) . . . . . . . . . . . . . . . . . . . . . .[8082-01]

08.35: Multi-sensor technology based on a laser focus probe for nanomeasuring applications over large areas, Eberhard Manske, Gerd Jäger, Tino Hausotte, Torsten Machleidt, Technische Univ. Ilmenau (Germany) [8082-02]

08.55: Optical metrology for in-line process control, David Fleischle, Univ. Stuttgart (Germany) and Graduate School of Excellence Advanced Manufacturing Engineering (Germany); Wolfram Lyda, Florian Mauch, Wolfgang Osten, Univ. Stuttgart (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-03]

Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .09.15 to 09.30

Congress-Wide Plenary Session

Room 1 . . . . . . . . . . . . . . . . . . . . .Monday 9.30 to 11.00

World of Photonics Congress 2011Opening Plenary Presentation

SESSION 2

Room: 14c . . . . . . . . . . . . . . . . . . .Mon. 11.10 to 13.00

Digital HolographySession Chair: Zeev Zalevsky, Bar-Ilan Univ. (Israel)

11.10: Some figures of merit so as to compare digital Fresnel holography and speckle interferometry (Invited Paper), Pierre R. L. Slangen, Ecole des Mines d’Alès (France); Mayssa Karray, LAUM CNRS, Univ. du Maine (France); Pascal Picart, Univ. du Maine (France) and ENSIM (France) . . . . . . . . .[8082-04]

11.40: Reference wave adaptation in digital lensless Fourier holography by means of a spatial light modulator, Thomas Meeser, Claas Falldorf, Christoph von Kopylow, Ralf B. Bergmann, Bremer Institut für angewandte Strahltechnik GmbH (Germany). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-05]

12.00: Self interference digital holographic microscopy approach for inspection of technical and biological phase specimens, Björn Kemper, Frank Schlichthaber, Angelika Vollmer, Steffi Ketelhut, Sabine Przibilla, Gert von Bally, Ctr. for Biomedical Optics and Photonics (Germany) . . . . . . . . . .[8082-06]

12.20: Stokes holography for recording and reconstructing objects using polarization fringes, Rakesh K. Singh, Dinesh N. Naik, Hitoshi Itou, Yoko Miyamoto, Mitsuo Takeda, The Univ. of Electro-Communications (Japan) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-07]

12.40: An algorithm for the estimation of the in-focus distance for speckle holograms, Pasquale Memmolo, Istituto Nazionale di Ottica Applicata (Italy) and Univ. degli studi di Napoli (Italy); Cosimo Distante, Consiglio Nazionale delle Ricerche (Italy) and Istituto Nazionale di Ottica Applicata (Italy) and Univ. del Salento (Italy); Melania Paturzo, Andrea Finizio, Pietro Ferraro, Istituto Nazionale di Ottica Applicata (Italy) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-08]

Lunch Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13.00 to 14.00

SESSION 3

Room: 14c . . . . . . . . . . . . . . . . . . .Mon. 14.00 to 16.40

Digital Holography and ApplicationsSession Chair: Pierre R. L. Slangen, Ecole des Mines d’Alès (France)

14.00: Synthetic aperture engineering for superresolved microscopy in digital lensless Fourier holography, Vicente Micó, Univ. de València (Spain); Luis Granero, AIDO Instituto Tecnológico de Óptica, Color e Imagen (Spain); Zeev Zalevsky, Bar-Ilan Univ. (Israel); Javier García, Univ. de València (Spain) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-09]

14.20: Optical characterization of phase gratings written by a UV femtosecond laser in PMMA, Riccardo Meucci, Sergio De Nicola, Sora Abdalah, Kais Al-Naimee, Andrea Geltrude, Massimiliano Locatelli, Istituto Nazionale di Ottica Applicata (Italy); Alexandra Baum, Walter Perrie, Patricia Scully, Anca Taranu, The Univ. of Manchester (United Kingdom) . . . . .[8082-79]

14.40: Dual-wavelength holographic shape measurement with iterative phase-unwrapping, Sara Rosendahl, Per Bergström, Per Gren, Mikael Sjödahl, Luleå Univ. of Technology (Sweden) . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-11]

15.00: Infrared digital holography for large object investigation, Andrea G. Geltrude, Massimiliano Locatelli, Pasquale Poggi, Anna Pelagotti, Melania Paturzo, Pietro Ferraro, Riccardo Meucci, Istituto Nazionale di Ottica Applicata (Italy) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-12]

15.20: Remote laboratory for digital holographic metrology, Guohai Situ, Marc Wilke, Mathias Riedel, I. Alekseenko, Giancarlo Pedrini, Wolfgang Osten, Univ. Stuttgart (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-13]

Coffee Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15.40 to 16.00

16.00: Simultaneous out-of-plane and in-plane displacements measurement by using digital holography around a hole or indentation, Matias R. Viotti, Christian Kohler, Armando Albertazzi, Jr., Univ. Federal de Santa Catarina (Brazil) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-14]

16.20: Measurement of temperature of axi-symmetric gaseous flames using digital holographis interferometry, Shobhna Sharma, Gyanendra Sheoran, Chandra Shakher, Indian Institute of Technology Delhi (India) . . . . . . . .[8082-15]



Posters —Monday

Room: 14c . . . . . . . . . . . . . . . . . . .Mon. 16.40 to 18.00All symposium attendees are invited to attend Monday Poster Session. Poster

presenters may post their poster papers starting at 10.00 on Monday in the Conference Area Hallway and present them during Monday Poster Session.

Please note that the Poster Session for Conferences 8084, O3A: Optics for Arts, Architecture, and Arts, and 8085 Videometrics, Range Imaging, and Applications will take place on Wednesday. Any papers left on the boards following 12.00 hrs on Tuesday will be considered unwanted and will be

discarded. SPIE assumes no responsibility for posters left up after the end of the Poster Session. Poster authors should be at their papers on Monday from 16.40 to 18.00 to answer questions from attendees. Attendees are requested to wear

their conference registration badges to the poster sessions.

Digital Holography and Holographic TechniquesMeasurement of surface resistivity/conductivity of carbon steel in 5-20ppm of KGR-134 inhibited seawater by optical interferometry techniques, Khaled J. Habib, Kuwait Institute for Scientific Research (Kuwait) . . . . . . . . . . .[8082-82]

Reconstruction of 3D refractive index distribution across the graded index optical fibre using digital holographic interferometry, Hamdy H. Wahba, Mamdouh A. Shams El-Din, Mansoura Univ. (Egypt) . . . . . . . . . . . . . . .[8082-83]

Characterization of a waveguide written by an UV- laser into a planar polymer chip by digital holographic interferometry, Mamdouh Shams El-Din, Hamdy Wahba, Mansoura Univ. (Egypt); Frank Vollertsen, Bremer Institut für angewandte Strahltechnik GmbH (Germany) . . . . . . . . . . . . . . . . . . . . .[8082-84]

Three-dimensional optical metrology using multiple-perspective digital holograms of an object, Nitesh Pandey, Bryan M. Hennelly, National Univ. of Ireland, Maynooth (Ireland) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-104]

Novel method for automatic filtering in the Fourier space applied to digital hologram reconstruction, Oscar J. Rincon Bohorquez, Ricardo Amezquita Orozco, Yaneth M. Torres Garcia, Viviana A. Agudelo Moreno, Combustion Ingenieros Ltda. (Colombia) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-123]

Digital holographic microscopy for dynamic imaging of hydrogels, Caojin Yuan, Giancarlo Pedrini, Univ. Stuttgart (Germany); Guodong Fu, Southeast Univ. (China); Jun Ma, Wolfgang Osten, Univ. Stuttgart (Germany) . . .[8082-125]

Particle concentration effect on diffraction efficiency in two views off-axis holograms, Larbi L. Bouamama, Soumaya Kara, Univ. Ferhat Abbas de Sétif (Algeria); Omar Chaab, Serge Simoëns, Ecole Centrale de Lyon (France) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-127]

Zero-order elimination in digital holography by using of two holograms: one is made by tilting the CCD, Mohammad Abolhassani, Yadollah Rostami, Arak Univ. (Iran, Islamic Republic of) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-151]

3D Interferometry and Speckle TechniquesCoherence effects in Makyoh topography, Ferenc Riesz, Research Institute for Technical Physics and Materials Science (Hungary) . . . . . . . . . . . . .[8082-88]

Spatial phase-shift interferometry: implementation of an effective phase-recovery algorithm, Maurizio Vannoni, Istituto Nazionale di Ottica Applicata (Italy); Mauro Melozzi, Marco Barilli, Selex Galileo S.p.A. (Italy); Andrea Sordini, Giuseppe Molesini, Istituto Nazionale di Ottica Applicata (Italy) . . . . . . .[8082-90]

Adaptive holographic illumination in comparative electronic speckle pattern interferometry, Richárd Séfel, János Kornis, Budapest Univ. of Technology and Economics (Hungary) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-108]

Transmission sphere calibration and its current limits, Pengqian Yang, Shanghai Institute of Optics and Fine Mechanics (China) and Institution (Germany); Jianqiang Zhu, Jia Xu, Shanghai Institute of Optics and Fine Mechanics (China); Stefan Hippler, Max-Planck-Institut für Astronomie (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-119]

Testing error simulation in cylindrical object measurement on interferometry, Li Zhao, Yingjie Yu, Shanghai Univ. (China) . . . . . . . .[8082-121]

Development of error estimation method for phase detection in phase shift method, Ryohei Hanayama, The Graduate School for the Creation of New Photonics Industries (Japan); Kenichi Hibino, National Institute of Advanced Industrial Science and Technology (Japan) . . . . . . . . . . . . . . . . . . . . .[8082-146]

White-Light Interferometry, OCT, and Multiwavelength Techniques

Hybrid light source for scanning white light interferometry-based MEMS quality control, Ville Heikkinen, Kalle Hanhijärvi, Ben Wälchli, Heikki Räikkönen, Ivan Kassamakov, Univ. of Helsinki (Finland); Juha Aaltonen, Helsinki Institute of Physics (Finland); Kestas Grigoras, Sami Franssila, Aalto Univ. School of Science and Technology (Finland); Edward Hæggström, Univ. of Helsinki (Finland) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-107]

Development of traceability methodology for optical coherence tomography (OCT) using depths of calibration grooves as transfer standards, Iakyra B. Couceiro, Thiago Ferreira da Silva, Luiz V. G. Tarelho, Igor Malinovski, Hans P. H. Grieneisein, Wellington S. Barros, INMETRO (Brazil); Giancarlo V. de Faria, Jean P. von der Weid, Pontificia Univ. Católica do Rio de Janeiro (Brazil); Marcello M. Amaral, Anderson Z. de Freitas, Marcus P. Raele, Instituto de Pesquisas Energéticas e Nucleares (Brazil) . . . . . . . . . . . .[8082-111]

Dispersion optimized white-light interferometer based on a Schwarzschild objective, Peter Kuehnhold, Peter Lehmann, Jan Niehues, Univ. Kassel (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-117]

Interferometric multiwavelength system for long gauge blocks measurements, Michal Wengierow, Leszek A. Salbut, Warsaw Univ. of Technology (Poland); Zbigniew J. Ramotowski, Central Office of Measures (Poland) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-144]

Investigation of organic light emitting diodes for interferometric purposes, Anna Pakula, Leszek A. Salbut, Warsaw Univ. of Technology (Poland) [8082-160]

Polarization-based TechniquesSpectral polarimetry-based measurement of the thickness of a thin film, Petr Hlubina, Jiri Lunacek, Dalibor Ciprian, Technical Univ. of Ostrava (Czech Republic) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-115]

Comparative analysis of interferometric measurements of PMD on optical fibers, Thiago Ferreira da Silva, INMETRO (Brazil) and Pontifícia Univ. Católica do Rio de Janeiro (Brazil); Janaina Ferreira, Giovanna Borghi, INMETRO (Brazil); Giancarlo Vilela de Faria, Pontificia Univ. Católica do Rio de Janeiro (Brazil); Jean Pierre von der Weid, Pontifícia Univ. Católica do Rio de Janeiro (Brazil) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-118]

Determination of the characteristics of the surface of objects at optical remote sensing by the polarization-holographic imaging stokes spectro-polarimeter, Barbara N. Kilosanidze, George Kakauridze, Institute of Cybernetics (Georgia) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-126]

Mueller matrix imaging of plasmonic polarizers on nanopatterned surface, Lars Martin S. Aas, Ingar Stian Nerbø, Morten Kildemo, Norwegian Univ. of Science and Technology (Norway); Daniele Chiappe, Christian Martella, Francesco Buatier de Mongeot, Univ. degli Studi di Genova (Italy) . . .[8082-138]

Triangulation and Structured Light TechniquesMeasurement of five-degrees-of-freedom error motions for a micro high-speed spindle using an optical technique, Hiroshi Murakami, Kyushu Sangyo Univ. (Japan) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-95]

Measurement system for hot heavy forgings and its calibration, Zhengchun Du, Shanghai Jiaotong Univ. (China) and State key Lab. of Mechanical System and Vibration (China); Yue-yang Du, Shanghai Jiaotong Univ. (China) .[8082-105]

3D shape measurement of optical free-form surface based on fringe projection, Shaohui Li, Shugui Liu, Hongwei Zhang, Tianjin Univ. (China) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-106]

Material tests using the ARAMIS system: a laboratory report, Carlos Acevedo Pardo, Jens Ohlendieck, Christian Hoenniger, Manuel Krahwinkel, Harald Sternberg, HafenCity Univ. Hamburg (Germany) . . . . . . . . . . .[8082-128]

Calibration routine for in-process roundness measurements of steel rings during heat treatment, Houcem Gafsi, Bremer Institut fuer Messtechnik, Automatisierung und Qualitaetswissenschaft (Germany) . . . . . . . . . . .[8082-129]

New type of color-coded light structures for an adapted and rapid determination of point correspondences for 3D reconstruction, Yannick Caulier, Fraunhofer-Institut für Integrierte Schaltungen (Germany); Luc Bernhard, Ecole des Mines de Nantes (France) . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-130]

Positioning of scanned part inside of the predictive laser triangulation system, Maciej Stankiewicz, Jacek Reiner, Grzegorz Kotnarowski, Wroclaw Univ. of Technology (Poland) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-156]

Surface Roughness and Microstructure Measurement Industrial surface inspection by wavelet analysis, Thomas M. Kreis, Lars Rosenboom, Werner Jüptner, Bremer Institut für angewandte Strahltechnik GmbH (Germany). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-94]

Design and fabrication of white light confocal microscope with tunable resolution and sensitivity, Hamid Latifi, Ebrahim Behroodi, Ali Mousavian, Shahid Beheshti Univ. (Iran, Islamic Republic of) . . . . . . . . . . . . . . . . . .[8082-98]

Shape and thickness measurements using a reconstruction method for linear sensor microscopy based on improvement of lateral resolution isotropy, Milton P. Macedo, Instituto Superior Engenharia de Coimbra (Portugal); Carlos M. Correia, Univ. of Coimbra (Portugal) . . . . . . . . . .[8082-113]

Monitoring reflection coefficient of polishing surfaces, Yuriy D. Filatov, Olexandr Y. Filatov, Olga O. Syrota, V. Bakul Institute for Superhard Materials NASU (Ukraine); Vasil P. Yashchuk, Taras Shevchenko Kiev State Univ. (Ukraine); Guy Monteil, Ecole Nationale Supérieure Mécanique et des Microtechniques de Besancon (France) . . . . . . . . . . . . . . . . . . . . . . . .[8082-122]

Mutliresolution analysis of ground surfaces seen in angle-resolved light scattering measurements, Johannes A. Böhm, AC2T Research GmbH (Austria); András Venres, AC2T Research GmbH (Austria) and Technische Univ. Wien (Austria); Georg Vorlaufer, AC2T Research GmbH (Austria); Michael J. Vellekoop, Technische Univ. Wien (Austria) . . . . . . . . . . . . . . . . . . . . .[8082-124]

Singular optics for metrological applications in nanotechnologies, Oleg V. Angelsky, Peter P. Maksymyak, Nina V. Gorodynska, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-148]

Surface topography and optical performance measurement of microlenses used in high power VCSEL systems, Iris Erichsen, Stefan Krey, TRIOPTICS GmbH (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-158]

Conference 8082



Measurement of Optical Systems and AlignmentDynamic concentricity measurement of large interval-diameter ratio holes with virtual annular quadrant method, Qian Liu, Weichuan Yang, Bing Yao, Jiadong Jang, Jun Hu, Chinese Academy of Engineering Physics (China) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-92]

Algorithms to improve the image process analysis in high-precision alignment techniques, Esther Oteo, Jose Fernandez-Dorado, SnellOptics (Spain); Josep Arasa Marti, Univ. Politècnica de Catalunya (Spain); Patricia Blanco, SnellOptics (Spain); Carles Pizarro, Univ. Politècnica de Catalunya (Spain) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-97]

Visual alignment of mechanical structures using a Bessel beam datum: practical implementation, David M. Gale, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-99]

Choice of the reflector for the autocollimating alignment telescope, Andrey G. Anisimov, Valery V. Korotaev, St. Petersburg State Univ. of Information Technologies, Mechanics and Optics (Russian Federation) . . . . . . . . .[8082-100]

Measuring the performance of visible, NIR and LWIR optical components: a reliable robust high-accuracy lens measurement system, Daniel Orband, Optikos Corp. (United States) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-139]

The Ronchi test using a liquid crystal display as a phase grating, Miguel Mora-González, Francisco J. Casillas, Jesús Muñoz-Maciel, Roger Chiu-Zarate, Francisco G. Peña-Lecona, Univ. de Guadalajara (Mexico) . . . . . . . . .[8082-141]

Software configurable optical test system for refractive optics, Margaret Z. Dominguez, Peng Su, Robert Parks, Lirong Wang, James Burge, The Univ. of Arizona (United States) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-149]

Optic Sensors and Vibration MeasurementHigh pressure measurement by fat long period garting sensor on a single mode optical fiber, Mohammad Zibaii, Shahid Beheshti Univ. (Iran, Islamic Republic of); Mohammad Kheiri, Shahid Behashti Univ. (Iran, Islamic Republic of); Sudabe Nori, Jalal Sadeghi, Hamed Pourbeyram, Hamid Latifi, Mohammad Hossein Ghezelaiagh, Shahid Beheshti Univ. (Iran, Islamic Republic of) [8082-93]

Time-resolved oblique incidence interferometer for vibration analysis of rough surface, Yasuhiro Mizutani, Takayuki Higuchi, Tetsuo Iwata, Univ. of Tokushima (Japan); Yukitoshi Otani, Utsunomiya Univ. (Japan) . . . . . .[8082-120]

Optimized dust-proof optical fiber sensing system for real-time monitoring of frequency, phase and vibration of rotating parts, Krzysztof Prokopczuk, Piotr Lesiak, Tomasz Poczesny, Krzysztof Rozwadowski, Andrzej W. Domanski, Warsaw Univ. of Technology (Poland) . . . . . . . . . . . . . . . . . . . . . . . . .[8082-136]

Optical fiber macro-bend seismic sensor for real-time vibration monitoring in harsh industrial environment, Tomasz Poczesny, Piotr Makowski, Krzysztof Prokopczuk, Andrzej W. Domanski, Warsaw Univ. of Technology (Poland) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-140]

High temperature sensing with FBGs using a tunable laser interrogation system, Bastian Eder, Markus Plattner, Thomas Zeh, Arnd Reutlinger, Philipp Putzer, Kayser-Threde GmbH (Germany) . . . . . . . . . . . . . . . . . . . . . . .[8082-142]

Optical vibration measurements of coupling effects in capacitive micromachined ultrasonic transducer arrays, Erlend Leirset, Astrid Aksnes, Norwegian Univ. of Science and Technology (Norway) . . . . . . . . . . . .[8082-147]

Distance and Displacement MeasurementSubmicron displacement measurement by measuring autocorrelation of the transmission function of a grating, Khosro Madanipour, Amirkabir Univ. of Technology (Iran, Islamic Republic of); Mohammad T. Tavassoly, Univ. of Tehran (Iran, Islamic Republic of) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-135]

Optical sensor based on combined GI/DSPI technique for strain monitoring in crucial points of big engineering structures, Dariusz Lukaszewski, Leszek A. Salbut, Malgorzata Kujawinska, Krzysztof Malowany, Warsaw Univ. of Technology (Poland) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-137]

Evaluation of thermal expansion coefficient of Fabry-Perot cavity using an optical frequency comb, Jindrich Oulehla, Radek Smid, Ondrej Cip, Martin Cizek, Bretislav Mikel, Zdenek Buchta, Petr Jedlicka, Josef Lazar, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic) . . . . . . . . .[8082-145]

Optic-electronic systems for measuring the angle deformations and line shifts of the reflecting elements at the rotatable radio-telescope, Igor A. Konyakhin, Alexandr N. Timofeev, Alexandr A. Usik, Dmitry V. Zhukov, Saint-Petersburg State Univ. of Information Technologies, Mechanics and Optics (Russian Federation) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-150]

Sub ppm absolute distance measurements using an optical frequency comb generated by a conventional dual-drive Mach-Zehnder modulator, Sébastien Le Floch, Miguel Llera, Yves Salvadé, Haute Ecole Arc Ingénierie Siège (Switzerland) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-153]

A novel diffractive encoding principle for absolute optical encoders, David Hopp, Christof Pruss, Wolfgang Osten, Univ. Stuttgart (Germany); D. Wibbing, Josef Binder, Festo AG & Co. KG (Germany); W. Schinköthe, Frank Sterns, Univ. Stuttgart (Germany); J. Seybold, K. P. Fritz, V. Mayer, Heinz Kück, Hahn-Schickard-Gesellschaft Institut für Mikroaufbautechnik (Germany) . . .[8082-154]

Laser Interferometry and Nano-MetrologyAFM nanometrology interferometric system with the compensation of angle errors, Jan Hrabina, Josef Lazar, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic); Petr Klapetek, Czech Metrology Institute (Czech Republic); Ondrej Cip, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-133]

Noncontact interferometric technique for calibration of coordinate measuring machines, Antonin Miks, Jiri Novak, Pavel Novak, Czech Technical Univ. in Prague (Czech Republic) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-134]

Nondestructive Testing and Process MonitoringInfluences of Colorful LED Emissions on Spectrophotometric Properties of a LED Based White Light source, Ferhat Sametoglu, Oguz Celikel, TÜBITAK National Metrology Institute (Turkey). . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-85]

Experimental study of the heat transfer process of air around atmospheric arc plasma, Fatemeh Salimi Meidanshahi, Shahid Beheshti Univ. (Iran, Islamic Republic of); Khosro Madanipour, Amirkabir Univ. of Technology (Iran, Islamic Republic of); Babak Shokri, Shahid Beheshti Univ. (Iran, Islamic Republic of) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-86]

Optical characterization of three-dimensional structures within a DRAM capacitor, Martin Krupinski, Namlab gGmbH (Germany) and Technische Univ. Dresden (Germany); Alexander Kasic, aleo solar AG (Germany); Thomas Hecht, Evonik Litarion GmbH (Germany); Matthias Klude, GLOBALFOUNDRIES Inc. (Germany); Johannes Heitmann, Technische Univ. Bergakademie Freiberg (Germany) and Namlab gGmbH (Germany); Elke Erben, Namlab gGmbH (Germany); Thomas Mikolajick, Namlab gGmbH (Germany) and Technische Univ. Dresden (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-89]

Inexpensive 3-D laser scanner system based on a galvanometer scan head for high temperature applications, Torunn Hegna, Katarina Grujic, Hans Pettersson, Teknova AS (Norway) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-91]

In-process fault detection for textile fabric production: onloom imaging, Florian Neumann, Dorian Schneider, Thomas Gries, Timm Holtermann, RWTH Aachen (Germany); Ashley Kulczycki, Michigan State Univ. (United States) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-103]

Fluorescence errors in integrating sphere measurements of remote phosphor type LED light sources, Arno Keppens, KaHo Sint-Lieven Hogeschool (Belgium); Yuqin Zong, Vyacheslav B. Podobedov, Maria E. Nadal, Yoshi Ohno, National Institute of Standards and Technology (United States); Peter Hanselaer, KaHo Sint-Lieven Hogeschool (Belgium) . . . . . . . . .[8082-109]

Optimization of measuring and calibration procedures for gas analyser based on acousto-optical tunable filters, Alexander V. Fadeyev, Vitold E. Pozhar, Scientific and Technological Ctr. for Unique Instrumentation (Russian Federation) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-110]

Spectrally resolved measurement of small optical losses by cavity enhanced spectroscopy techniques, Thomas Zeuner, Wolfgang Paa, Gabriele Schmidl, Christian Mühlig, Institut für Photonische Technologien e.V. (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-116]

16.40: Development of an optical calibration system for five-axis machine tools, W. Jywe, T. Hsu, C. Liu, National Formosa Univ. (Taiwan); T. H. Hsieh, National Cheng Kung Univ. (Taiwan); C. Hsu, M. Ji, National Formosa Univ. (Taiwan) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-155]

Microlens array manufactured by inkjet printing: study of the effects of the solvent and the polymer concentration on the microstructure shape, Immacolata A. Grimaldi, Anna De Girolamo Del Mauro, Fausta Loffredo, Giuseppe Nenna, Fulvia Villani, Carla Minarini, ENEA (Italy) . . . . . . . . .[8082-157]

Laser self-mixing sensor to monitor in-situ the penetration depth during short pulse laser drilling of metal targets, Francesco P. Mezzapesa, Sintesi S.C.p.A. (Italy) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-159]

Tuesday 24 MaySESSION 4

Room: 14c . . . . . . . . . . . . . . . . . . Tues. 08.10 to 10.00

Micro- and Nanostructure MeasurementSession Chair: Pietro Ferraro, Istituto Nazionale di Ottica (Italy)

08.10: Recent advances in the field of superresolution (Invited Paper), Zeev Zalevsky, Yevgeny Beiderman, Bar-Ilan Univ. (Israel); Vicente Micó, Javier Garcia, Univ. de València (Spain) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-16]

08.40: Advanced 2D die placement inspection system for reliable flip chip interconnections based on 3D information of die and substrate by a phase measuring profilometry, Min-Young Kim, Kyungpook National Univ. (Korea, Republic of) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-17]

09.00: 3D interconnect metrology in CMS/ITRI, Yi-sha Ku, Industrial Technology Research Institute (Taiwan) . . . . . . . . . . . . . . . . . . . . . . . . .[8082-18]

Conference 8082



09.20: Pattern placement metrology using PROVE TM high-precision optics combined with advanced correction algorithms, Mario Längle, Norbert Rosenkranz, Dirk Seidel, Carl Zeiss SMS GmbH (Germany); Alexander Hübel, Carl Zeiss SMT AG (Germany); Dirk Beyer, Carl Zeiss SMS GmbH (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-19]

09.40: Detection of micro-probe displacement using a Shack-Hartmann wavefront sensor, Hanno Dierke, Christian Schrader, Rainer Tutsch, Technische Univ. Braunschweig (Germany) . . . . . . . . . . . . . . . . . . . . . .[8082-20]

Coffee Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10.00 to 10.20

SESSION 5

Room: 14c . . . . . . . . . . . . . . . . . . Tues. 10.20 to 11.40

Phase RetrievalSession Chair: Wolfgang Osten, Univ. Stuttgart (Germany)

10.20: Optimal phase retrieval from multiple observations with Gaussian noise: augmented Lagrangian algorithm for phase objects, Artem S. Migukin, Vladimir Katkovnik, Jaakko Astola, Tampere Univ. of Technology (Finland) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-21]

10.40: The effect of misalignment in phase retrieval based on a spatial light modulator, Mostafa Agour, Bremer Institut für angewandte Strahltechnik GmbH (Germany) and South Valley Univ. (Egypt); Claas Falldorf, Christoph von Kopylow, Ralf Bergmann, Bremer Institut für angewandte Strahltechnik GmbH (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-22]

11.00: Quantitative determination of the optical properties of phase objects by using a real-time phase retrieval technique, Johannes Frank, Cologne Univ. of Applied Sciences (Germany); Guenther Wernicke, Humboldt-Univ. zu Berlin (Germany); Jan Matrisch, RheinAhrCampus Remagen (Germany); Sebastian Wette, Jan Beneke, Stefan Altmeyer, Cologne Univ. of Applied Sciences (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-23]

11.20: Phase extraction in microscopy using tunable defocusing by means of a SLM, Javier Garcia-Monreal, Vicente Micó, Luis Camacho, Univ. de València (Spain); Zeev Zalevsky, Bar-Ilan Univ. (Israel) . . . . . . . . . . . . . .[8082-24]

SESSION 6

Room: 14c . . . . . . . . . . . . . . . . . . Tues. 11.40 to 13.00

Optical ProfilometrySession Chair: Eberhard Manske,

Technische Univ. Ilmenau (Germany)

11.40: Three-dimensional refractive index and thickness distribution of thin film measurements through dynamic multiwavelength interferometry, Kai Wu, Cheng-Chung Lee, National Central Univ. (Taiwan) . . . . . . . . . . . .[8082-25]

12.00: Comparison of fast Fourier transform and convolution in wavelength scanning interferometry, Hussam Muhamedsalih, Xiangqian Jiang, Feng Gao, Univ. of Huddersfield (United Kingdom) . . . . . . . . . . . . . . . . . . . . . . . . .[8082-26]

12.20: Absolute surface profilometry of an object with large gaps by means of monochromatic laser interferometry, Zhiqiang Liu, Kiyoshi Uchikawa, Nikon Corp. (Japan); Mitsuo Takeda, The Univ. of Electro-Communications (Japan) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-27]

12.40: Structured-illumination microscopy on technical surfaces: 3D metrology with nanometer sensitivity, Markus Vogel, Zheng Yang, Alexander Kessel, Christoph Kranitzky, Christian Faber, Gerd Häusler, Institute of Optics, Information and Photonics/Univ. of Erlangen-Nürnberg (Germany) . . . .[8082-28]

Lunch Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13.00 to 14.00

SESSION 7

Room: 14c . . . . . . . . . . . . . . . . . . Tues. 14.00 to 15.40

White-Light InterferometrySession Chair: Mitsuo Takeda,

The Univ. of Electro-Communications (Japan)

14.00: Broad spectral range measurement of chromatic dispersion of polarization modes in holey fibers using spectral interferometry, Petr Hlubina, Dalibor Ciprian, Technical Univ. of Ostrava (Czech Republic); Tadeusz Martynkien, Wroclaw Univ. of Technology (Poland); Pawel Mergo, Maria Curie-Sklodowska Univ. (Poland); Waclaw Urbanczyk, Wroclaw Univ. of Technology (Poland) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-29]

14.20: Inspection of processes during silicon wafer sawing using low coherence interferometry in the near-infrared wavelength region, Kay Gastinger, Norwegian Univ. of Science and Technology (Norway); Lars Johnsen, SINTEF (Norway); Ove Simonsen, Astrid Aksnes, Norwegian Univ. of Science and Technology (Norway) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-30]

14.40: Uncertainty of height information in coherence scanning interferometry, Jörg Seewig, Technische Univ. Kaiserslautern (Germany); Thomas Böttner, Dyadic Computing (Germany) . . . . . . . . . . . . . . . . . . .[8082-31]

15.00: Improvement of lateral resolution and reduction of batwings in vertical scanning white-light interferometry, Jan Niehues, Peter Lehmann, Univ. Kassel (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-32]

15.20: Parallel optical coherence tomography (pOCT) for industrial 3D inspection, Patrick Lambelet, Heliotis AG (Switzerland) . . . . . . . . . . . .[8082-33]

Coffee Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15.40 to 16.10

SESSION 8

Room: 14c . . . . . . . . . . . . . . . . . . Tues. 16.10 to 17.50

High-Speed TechniquesSession Chair: Armando Albertazzi Gonçalves, Jr.,

Univ. Federal de Santa Catarina (Brazil)

16.10: High speed fringe projection for fast 3D inspection, Sandra Caspar, Marc Honegger, Interstaatliche Hochschule für Technik Buchs NTB (Switzerland); Patrick Lambelet, Heliotis AG (Switzerland); Carlo Bach, Interstaatliche Hochschule für Technik Buchs NTB (Switzerland); Andreas Ettemeyer, Interstaatliche Hochschule für Technik Buchs NTB (Switzerland) and Heliotis AG (Switzerland) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-34]

16.30: Radial expansion measurements of a high-speed rotor using an interferometric array sensor, Jürgen W. Czarske, Philipp Günther, Florian Dreier, Thorsten Pfister, Technische Univ. Dresden (Germany) . . . . . . .[8082-35]

16.50: High speed, on-line 4D microscopy using continuously scanning white light interference microscopy with a high-speed camera and real-time FPGA image processing, Paul C. Montgomery, Institut d’Électronique du Solide et des Systèmes (France); Freddy Anstotz, Jardel Montagna, Institut d’Electronique du Solide et des Systèmes (France) . . . . . . . . . . . . . . . .[8082-36]

17.10: 3D high-speed profilometer for micro-manufacturing, Dean M. Ljubicic, Brian W. Anthony, Massachusetts Institute of Technology (United States) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-37]

17.30: fringe projection based high speed 3D sensor for real-time measurements, Christian Bräuer-Burchardt, Fraunhofer Institut für Angewandte Optik und Feinmechanik (Germany); Peter Kühmstedt, Andreas Breitbarth, Ingo Schmidt, Matthias Heinze, Gunther Notni, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-38]

Wednesday 25 MaySESSION 9

Room: 14c . . . . . . . . . . . . . . . . . . .Wed. 08.20 to 10.00

Deflectometry, Fringe ProjectionSession Chair: Robert Sitnik, Warsaw Univ. of Technology (Poland)

08.20: Alignment methods for ultraprecise deflectometric flatness metrology, Gerd Ehret, Michael Schulz, Arne Fitzenreiter, Maik Baier, Wolfgang Joeckel, Clemens Elster, Manuel Stavridis, Physikalisch-Technische Bundesanstalt (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-39]

08.40: Measurement and characterization of cylindrical surfaces by deflectometry applied to ballistic identification, Analucia V. Fantin, Armando Albertazzi Gonçalves, Univ. Federal de Santa Catarina (Brazil); Celso L. Veiga, Photonita Ltd. (Brazil) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-40]

09.00: Endoscopic geometry inspection by modular fiber-optic sensors with increased depth of focus, Christoph Ohrt, Markus Kaestner, Eduard Reithmeier, Leibniz Univ. Hannover (Germany) . . . . . . . . . . . . . . . . . . . .[8082-41]

09.20: 3D-Measuring in the field of endoscopy, Anton Schick, Frank Forster, Michael Stockmann, Siemens AG (Germany) . . . . . . . . . . . . . . . . . . . . .[8082-42]

09.40: 3D shape measurement based on color-encoded sinusoidal fringe projection, Qican Zhang, Ke Ma, Sichuan Univ. (China) . . . . . . . . . . . .[8082-43]

Coffee Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10.00 to 10.30

Optical Metrology Plenary Session

Room 1 . . . . . . . . . . . . . . . . . Wednesday, 10.30 to 11.20Mitsuo Takeda, The Univ. of Electro-Communications, Japan


Conference 8082



SESSION 10

Room: 14c . . . . . . . . . . . . . . . . . . .Wed. 11.30 to 12.50

Structured Light TechniquesSession Chair: Gunther Notni, Fraunhofer-Institut für Angewandte

Optik und Feinmechanik (Germany)

11.30: Structured light measurement and calibration method for 3D documenting of engineering structures, Robert Sitnik, Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland) . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-44]

11.50: Fast 3D shape measurements using laser speckle projection, Martin Schaffer, Marcus Grosse, Bastian Harendt, Richard Kowarschik, Friedrich-Schiller-Univ. Jena (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-45]

12.10: Optical measurement and comparison of large free-form surfaces through a regular mesh, Tiago Loureiro Figaro da Costa Pinto, Univ. Federal de Santa Catarina (Brazil); Christian Kohler, Univ. Stuttgart (Germany); Armando A. Gonçalves, Jr., Univ. Federal de Santa Catarina (Brazil) . . . . . . . . . . . . .[8082-46]

12.30: Accurate calibration of a fringe projection system by considering telecentricity, Klaus Haskamp, Markus Kästner, Eduard Reithmeier, Leibniz Univ. Hannover (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-47]

Lunch Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12.50 to 14.00

SESSION 11

Room: B21 . . . . . . . . . . . . . . . . . . .Wed. 14.05 to 15.35

Joint Session I: Measurements of Optical Components and Systems

Session Chairs: Peter H. Lehmann, Univ. Kassel (Germany); Guus Taminiau, Photonics Cluster Netherlands (Netherlands)

Joint Session with EOS conference on Testing for Fabrication and Assembly

Welcome by Conference Chairs . . . . . . . . . . . . .Wed 14.00 to 14.05

Peter H. Lehmann, Univ. Kassel (Germany); Guus Taminiau, Photonics Cluster (Netherlands)

14.05: Some aspects of error influences in interferometric measurements of optical surface forms (Invited Paper), Michael Schulz, Physikalisch-Technische Bundesanstalt (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-48]

14.35: Diffractive simultaneous lateral shearing interferometry, Vanusch Nercissian, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany); Irina Harder, Klaus Mantel, Max Planck Institute for the Science of Light (Germany); A. Berger, Norbert Lindlein, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-49]

14.50: Aspherical surface measurement using quadri-wave lateral shearing interferometry, Benoit F. Wattellier, William Boucher, Pascal Delage, PHASICS S.A. (France) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-50]

15.05: Advances studies on the measurement of aspheres and freeform surfaces with the tilted-wave interferometer, Eugenio Garbusi, Goran Baer, Wolfgang Osten, Univ. Stuttgart (Germany) . . . . . . . . . . . . . . . . . . . . . .[8082-51]

15.20: A subaperture stitching algorithm for aspheric surfaces, Po-Chih Lin, Yi-Chun Chen, National Central Univ. (Taiwan); Chung-Min Lee, California State Univ., Long Beach (United States); Chao-Wen Liang, National Central Univ. (Taiwan) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-52]

Coffee Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15.35 to 16.00

SESSION 12

Room: B21 . . . . . . . . . . . . . . . . . . .Wed. 16.00 to 18.15

Joint Session II: Measurement of Optical Components and Systems

Session Chair: Michael Schulz, Physikalisch-Technische Bundesanstalt (Germany)

Joint Session with EOS conference on Testing for Fabrication and Assembly

16.00: Some challenges in shape measurements of optical freeform surfaces (Invited Paper), Gunther Notni, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-53]

16.30: Axicon metrology using high-line density computer-generated holograms, Jun Ma, Univ. Stuttgart (Germany) and Nanjing Univ. of Science & Technology (China); Christof Pruss, Matthias Häfner, Univ. Stuttgart (Germany); Rihong Zhu, Zhishan Gao, Nanjing Univ. of Science & Technology (China); Caojin Yuan, Wolfgang Osten, Univ. Stuttgart (Germany) . . . . . . . . . . . . . . . . .[8082-54]

16.45: 3D-profilometry on aspheric and freeform lenses, Andreas Beutler, Mahr GmbH (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-55]

17.00: Measurements of aberrations of aspherical lenses using experimental ray tracing, Ufuk Ceyhan, Thomas Henning, Friedrich Fleischmann, David Hilbig, Hochschule Bremen (Germany); Dietmar Knipp, Jacobs Univ. Bremen (Germany). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-56]

17.15: Automated alignment of aspheric and freeform surfaces in non-null test interferometry, Goran Baer, Univ. Stuttgart (Germany) . . . . . . . . .[8082-57]

17.30: Complete characterization of assembled optics with respect to centering error and lens distances, Josef Heinisch, Patrik Langehanenberg, Helge Pannhoff, Trioptics GmbH (Germany) . . . . . . . . . . . . . . . . . . . . . .[8082-58]

17.45: Interferometric measurement of profile deviations of large precision mirrors, Andreas Müller, Gerd Jäger, Eberhard Manske, Technische Univ. Ilmenau (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-59]

18.00: Measuring amplitude and phase of light emerging from microstructures with HRIM, Toralf Scharf, Myun-Sik Kim, Hans Peter Herzig, Ecole Polytechnique Fédérale de Lausanne (Switzerland) . . . . . . . . . . .[8082-60]

Thursday 26 MaySESSION 13

Room: 14c . . . . . . . . . . . . . . . . . Thurs. 08.00 to 10.10

3D Interferometric TechniquesSession Chair: Yuri V. Chugui, Technological Design Institute of

Scientific Instrument Engineering (Russian Federation)

08.00: Extended range metrology: an age old problem (Invited Paper), Catherine E. Towers, Univ. of Leeds (United Kingdom) . . . . . . . . . . . . .[8082-61]

08.30: Numerical noise reduction via diffraction for surface profiling interferometry, Hidemitsu Toba, Shigeru Nakayama, Hideaki Homma, Takashi Gemma, Kiyoshi Uchikawa, Nikon Corp. (Japan) . . . . . . . . . . . . . . . . . .[8082-62]

08.50: Dynamic measurements using a Fizeau interferometer, Daniel Sykora, Michael L. Holmes, Zygo Corporation (United States) . . . . . . . . . . . . . .[8082-63]

09.10: Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometer, María Frade, José María Enguita, Ignacio Álvarez, Silvia Rodríguez-Jiménez, Univ. de Oviedo (Spain) . . . . . . . . . . . . . . . .[8082-64]

09.30: State of polarization mapping using a calibrated interferometric polarimeter, Dinesh N. Naik, Rakesh K. Singh, Hitoshi Itou, Yoko Miyamoto, Mitsuo Takeda, The Univ. of Electro-Communications (Japan) . . . . . . .[8082-65]

09.50: High resolution speckle interferometry by replacing temporal information with spatial information, Yasuhiko Arai, Kansai Univ. (Japan) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-66]

Coffee Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10.10 to 10.30

Conference 8082



SESSION 14

Room: 14c . . . . . . . . . . . . . . . . . Thurs. 10.30 to 11.50

Interferometric Vibration MeasurementsSession Chair: Catherine E. Towers, Univ. of Leeds (United Kingdom)

10.30: SLM-based multipoint vibrometry, Tobias Haist, Alena Tarbeyevskaya, Michael Warber, Wolfgang Osten, Univ. Stuttgart (Germany); Christian Rembe, Mario Ludwig, Polytec GmbH (Germany); Wilhelm Stork, Karlsruher Institut für Technologie (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-67]

10.50: Adaptive optical head for industrial vibrometry applications, Reza Atashkhooei, Univ. Politècnica de Catalunya (Spain); Usman Zabit, Ecole Nationale Supérieure d´Electrotechnique, Electronique, Informatique, Hydraulique et des Téléco (France); Santiago Royo, Univ. Politècnica de Catalunya (Spain); Thierry M. Bosch, Francis Bony, Ecole Nationale Supérieure d´Electrotechnique, Electronique, Informatique, Hydraulique et des Téléco (France) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-68]

11.10: Vibration amplitude recovery from the time averaged interferograms using the directional spatial carrier phase shifting method, Adam R. Styk, Michal Brzezinski, Warsaw Univ. of Technology (Poland) . . . . . . . . . . . .[8082-69]

11.30: Application of wavelet transform and image morphology in processing vibration speckle interferogram for automatic analysis, Rajesh Kumar, Sant Longowal Institute of Engineering and Technology (India); Dibya P. Jena, Robert Bosch Engineering and Business Solutions (India); Chandra Shakher, Indian Institute of Technology Delhi (India) . . . . . . . . . . . . . . .[8082-70]

SESSION 15

Room: 14c . . . . . . . . . . . . . . . . . Thurs. 11.50 to 12.50

Particle MeasurementSession Chair: Catherine E. Towers, Univ. of Leeds (United Kingdom)

11.50: High-sensitivity low-coherence dynamic light scattering and particle sizing for nanoparticles, Katsuhiro Ishii, The Graduate School for the Creation of New Photonics Industries (Japan); Sohichiro Nakamura, Yuki Sato, FUJIFILM Corp. (Japan) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-71]

12.10: Novel non-contact optical characterisation methods of polymeric nanocomposite structures based on their particle loading and dispersion profile, Triantafillos Koukoulas, William R. Broughton, Matthew Tedaldi, Pete D. Theobald, National Physical Lab. (United Kingdom) . . . . . . . . . . . . . . . .[8082-72]

12.30: Mueller matrix imaging of nematic textures in colloidal dispersions of Na-fluorohectorite synthetic clay in solution, Morten Kildemo, Lars Martin S. Aas, Pål G. Ellingsen, Henrik Hemmen, Elisabeth Nilsen, Jon O. Fossum, Norwegian Univ. of Science and Technology (Norway) . . . . . . . . . . . . .[8082-73]

Lunch Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12.50 to 14.00

SESSION 16

Room: 14c . . . . . . . . . . . . . . . . . Thurs. 14.00 to 17.10

Nondestructive Inspection and Process MonitoringSession Chair: Kay Gastinger, Norwegian Univ. of Science and

Technology (Norway)

14.00: 3D optical measuring and laser technologies for scientific and industrial applications (Invited Paper), Yuri V. Chugui, Technological Design Institute of Scientific Instrument Engineering (Russian Federation) . . . .[8082-74]

14.30: Lockin-interferometric imaging of thermal waves for non-destructive testing, Philipp Menner, Gerd Busse, Univ. Stuttgart (Germany) . . . . . .[8082-75]

14.50: Laser ultrasonics evaluation and testing of coated HTR nuclear fuel, Ahmed Amziane, Mohamed Amari, Denis Mounier, Jean-Marc Breteau, Nicolas Joly, Mathieu Edely, Maxime Larcher, Paul Noiré, Univ. du Maine (France); Julien Banchet, David Tisseur, AREVA NP (France); Vitalyi Gusev, Univ. du Maine (France) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-76]

15.10: Laser-induced deflection (LID) method for absolute absorption measurements of optical materials and coatings, Christian Mühlig, Simon Bublitz, Wolfgang Paa, Institut für Photonische Technologien e.V. (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-77]

Coffee Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15.30 to 15.50

15.50: Reflectometry for TSV etching depth inspection, Wei-Te Hsu, Yi-Sha Ku, Industrial Technology Research Institute (Taiwan) . . . . . . . . . . . . . .[8082-78]

16.10: New method for evaluation of the high-quality fog protective coatings, Grzegorz Czeremuszkin, Revision Military Ltd. (Canada) . . .[8082-132]

16.30: Development of a frequency domain optical coherence tomography system (FD-OCT) for the inline process metrology in laser structuring systems, Robert Schmitt, RWTH Aachen (Germany) and Fraunhofer-Institut für Produktionstechnologie (Germany); Guilherme F. Mallmann, Fraunhofer-Institut für Produktionstechnologie (Germany); Pavel Peterka, Institute of Photonics and Electronics of the ASCR, v.v.i. (Czech Republic) . . . . . . . . . . . . . . . . . .[8082-80]

16.50: Turning process monitoring using a robust and miniaturized non-incremental interferometric distance sensor, Philipp Günther, Florian Dreier, Thorsten Pfister, Jürgen W. Czarske, Technische Univ. Dresden (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8082-81]

Closing Remarks

Room: 14c . . . . . . . . . . . . . . . . . Thurs. 17.10 to 17.15Kay Gastinger, SINTEF (Norway)

Conference 8082

www.spie.org/om



Conference 8083Monday-Tuesday 23-24 May 2011 • Proceedings of SPIE Vol. 8083

Modeling Aspects in Optical MetrologyConference Chair: Bernd Bodermann, Physikalisch-Technische Bundesanstalt (Germany)

Conference Co-Chairs: Harald Bosse, Physikalisch-Technische Bundesanstalt (Germany); Richard M. Silver, National Institute of Standards and Technology (United States)

Programme Committee: Markus Bär, Physikalisch-Technische Bundesanstalt (Germany); Jörg Bischoff, Osires Optical Engineering (Germany); Sven Burger, Konrad-Zuse-Zentrum für Informationstechnik Berlin (Germany); Andreas Erdmann, Fraunhofer-Institut für Integrierte System und Bauelementetechnologie (Germany); Christian Hafner, ETH Zurich (Switzerland); Wolfgang Holzapfel, DR. JOHANNES HEIDENHAIN GmbH (Germany); Bernd H. Kleemann, Carl Zeiss AG (Germany); Wolfgang Osten, Univ. Stuttgart (Germany); Andreas Rathsfeld, Weierstrass-Institute für Angewandte Analysis und Stochastik (Germany); Thomas Scheruebl, Carl Zeiss SMS GmbH (Germany); Patrick Schiavone, Lab. des Technologies de la Microelectronique CNRS (France); Irwan Setija, ASML Netherlands B.V. (Netherlands); Michael Totzeck, Carl Zeiss SMT AG (Germany); Jari Turunen, Univ. of Eastern Finland (Finland); Frank Wyrowski, Friedrich-Schiller-Univ. Jena (Germany)

Monday 23 MayWelcome and Introduction

Room: 12 . . . . . . . . . . . . . . . . . . . .Mon. 11.10 to 11.15Bernd Bodermann, Physikalisch-Technische Bundesanstalt

(Germany)

SESSION 1

Room: 12 . . . . . . . . . . . . . . . . . . . .Mon. 11.15 to 13.00

New Materials11.15: The promise of metamaterials for new applications in optics, Heinz C. Schweizer, Liwei Fu, Philipp Schau, Karsten Frenner, Wolfgang Osten, Harald W. Giessen, Univ. Stuttgart (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-01]

11.55: Rigorous modeling of meander-type metamaterials for sub-lambda imaging (Invited Paper), Philipp Schau, Karsten Frenner, Wolfgang Osten, Liwei Fu, Heinz C. Schweizer, Harald W. Giessen, Univ. Stuttgart (Germany) .[8083-02]

12.20: Simulating photonic structures in layered geometries by Multiple Multipoles Program, Aytac Alparslan, Christian Hafner, ETH Zurich (Switzerland) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-03]

12.40: Near-field introscopy of two-dimensional nonhomogeneous left-handed material slab, Mikhail Y. Barabanenkov, Institute of Microelectronics Technology and High Purity Materials (Russian Federation); Yuri N. Barabanenkov, Sergei A. Nikitov, Institute of Radio Engineering and Electronics (Russian Federation) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-04]

Lunch Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13.00 to 14.00

SESSION 2

Room: 12 . . . . . . . . . . . . . . . . . . . .Mon. 14.00 to 15.40

Scatterometry I14.00: Advanced data evaluation and determination of measurement uncertainties for scatterometry on a MoSi photo mask, Mark-Alexander Henn, Hermann A. Gross, Markus Bär, Matthias Wurm, Bernd Bodermann, Physikalisch-Technische Bundesanstalt (Germany) . . . . . . . . . . . . . . . .[8083-05]

14.20: A Bayesian Statistical Model for Hybrid Metrology to Improve Measurement Accuracy, Richard M. Silver, Bryan M. Barnes, Nien-Fan Zhang, Jing Qin, Hui Zhou, Ronald Dixson, National Institute of Standards and Technology (United States) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-06]

14.40: Reduced basis method for real-time inverse scatterometry, Jan Pomplun, JCMwave GmbH (Germany); Sven Burger, Konrad-Zuse-Zentrum für Informationstechnik Berlin (Germany) and JCMwave GmbH (Germany); Lin Zschiedrich, JCMwave GmbH (Germany); Frank Schmidt, Konrad-Zuse-Zentrum für Informationstechnik Berlin (Germany) and JCMwave GmbH (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-07]

15.00: Fast online inverse scattering with reduced basis method (RBM) for a 3D phase grating with specific line roughness, Bernd H. Kleemann, Carl Zeiss AG (Germany); Julian F. Kurz, Karlsruher Institut für Technologie (Germany); Jan Pomplun, Sven Burger, JCMwave GmbH (Germany); Jochen Hetzler, Carl Zeiss SMT AG (Germany); Lin Zschiedrich, Frank Schmidt, JCMwave GmbH (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-08]

15.20: Full-scale simulation of angle-resolved focused-beam scatterometry applied to aperiodic isolated features: model validity analysis and numerical results, Serge E. Kozik, Andrei G. Smirnov, B.I. Stepanov Institute of Physics (Belarus) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-09]

Coffee Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15.40 to 16.00

SESSION 3

Room: 12 . . . . . . . . . . . . . . . . . . . .Mon. 16.00 to 17.00

Maxwell Solvers and Wave Propagation 16.00: Physical optics light propagation through components with measured refractive, diffractive and hybrid surface profiles, Hagen Schweitzer, LightTrans GmbH (Germany); Frank Wyrowski, Friedrich-Schiller-Univ. Jena (Germany); Michael Kuhn, Christian Hellmann, LightTrans GmbH (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-10]

16.20: Modeling of profilometry with laser focus sensors, Jörg Bischoff, Osires Optical Engineering (Germany); Eberhard Manske, Henner Baitinger, Technische Univ. Ilmenau (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-11]

16.40: Study of the convergence behavior of the vectorial modal method for metallic lamellar gratings, Babar K. Minhas, King Saud Univ. (Saudi Arabia) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-12]

Posters—MondayRoom: 12 . . . . . . . . . . . . . . . . . . . .Mon. 17.00 to 18.00

All symposium attendees are invited to attend Monday Poster Session. Poster presenters may post their poster papers starting at 10.00 on Monday in the Conference Area Hallway and present them during Monday Poster Session.

Please note that the Poster Session for Conferences 8084, O3A: Optics for Arts, Architecture, and Arts, and 8085 Videometrics, Range Imaging, and Applications will take place on Wednesday. Any papers left on the boards following 12.00 hrs on Tuesday will be considered unwanted and will be

discarded. SPIE assumes no responsibility for posters left up after the end of the Poster Session. Poster authors should be at their papers on Monday from 17.00 to 18.00 to answer questions from attendees. Attendees are requested to wear

their conference registration badges to the poster sessions.

Method of adjusting an optical axis of receiving module of laser rangefinder to the main axis of space vehicle, Alexandr G. Ershov, S.I. Vavilov State Optical Institute (Russian Federation) . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-34]

Specification of optical surface accuracy using the structure function, Ross Zhelem, The Ohio State Univ. (United States) . . . . . . . . . . . . . . . . . . . . .[8083-35]

Analysis of the spectral-shadowing crosstalk in a quasi-distributed fibre sensor interrogated by an optical frequency-domain reflectometer, Kivilcim Yüksel, Patrice Mégret, Véronique Moeyaert, Marc Wuilpart, Univ. de Mons (Belgium) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-36]

The off-axis alignment of an asphere by a Fizeau interferometer, Yan-An Chen, Chao-Wen Liang, Cheng-Chung Lee, National Central Univ. (Taiwan) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-38]

Direct modeling of external quantum efficiency of silicon trap detectors, Thiago Menegotto, Maurício S. Lima, Giovanna B. Almeida, Iakyra B. Couceiro, Hans P. H. Grieneisen, INMETRO (Brazil) . . . . . . . . . . . . . . . . . . . . . . . .[8083-39]

Inverse calculation of position and tilt errors of optical components from wavefront data, Holger Gilbergs, Nicolai Wengert, Karsten Frenner, Peter Eberhard, Wolfgang Osten, Univ. Stuttgart (Germany) . . . . . . . . . . . . . .[8083-40]

Deconvolution of non-zero solid angles effect in bidirectional scattering distribution function measurements, Alejandro Ferrero, Ana Rabal, Joaquin Campos, Alicia A. Pons, Maria Luisa Hernanz, Antonio Corrons, Consejo Superior de Investigaciones Científicas (Spain) . . . . . . . . . . . . . . . . . . .[8083-41]

Analysis and application of refractive variable-focus lenses in optical microscopy, Pavel Novak, Jiri Novak, Antonin Miks, Czech Technical Univ. in Prague (Czech Republic) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-42]

Modeling the ultrafast optical response of a multilayered sample subject to transient distributed perturbations, Denis Mounier, Jean-Marc Breteau, Pascal Picart, Vitalyi Gusev, Univ. du Maine (France) . . . . . . . . . . . . . . . . . . . .[8083-43]

Analysis of servomechanisms for high-density optical disks with the vectorial and scalar diffraction theory, Shuhei Yoshida, Manabu Yamamoto, Tokyo Univ. of Science (Japan) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-44]



Optimization of scanning and command functions of galvanometer-based scanners, Virgil-Florin Duma, Corina Mnerie, Aurel Vlaicu Univ. of Arad (Romania) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-45]

Full vectorial finite element method for acoustic mode calculation of suspended core fiber, Soodabeh Nouri Jouybari, Hamid Latifi, Fahimeh Salehpoor, Shahid Beheshti Univ. (Iran, Islamic Republic of); Faramarz Farahi, The Univ. of North Carolina at Charlotte (United States) . . . . . . . . . . . .[8083-46]

Rigorous simulations of 3D patterns on extreme ultraviolet lithography masks, Sven Burger, Konrad-Zuse-Zentrum für Informationstechnik Berlin (Germany); Lin Zschiedrich, Jan Pomplun, JCMwave GmbH (Germany); Frank Schmidt, Konrad-Zuse-Zentrum für Informationstechnik Berlin (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-48]

Opto-mechanical modelling and experimental approach to the measurement of aerospace materials using shearography and thermal loading, Eduardo Corso Krutul, Technische Univ. Delft (Netherlands) and Univ. Federal de Santa Catarina (Brazil); Roger M. Groves, Technische Univ. Delft (Netherlands) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-49]

Modeling of photoluminescence intensity of ultrathin layer with silicon nanocrystals, Sergey A. Dyakov, Trinity College (Ireland) . . . . . . . . . . .[8083-50]

Tuesday 24 MaySESSION 4

Room: 12 . . . . . . . . . . . . . . . . . . . Tues. 08.10 to 10.00

Optical Systems08.10: Image simulation of projection systems in photolithography (Invited Paper), Peter Evanschitzky, Tim Fühner, Andreas Erdmann, Fraunhofer-Institut für Integrierte System und Bauelementetechnologie (Germany) . . . . . .[8083-13]

08.40: Combining rigorous diffraction calculation and GPU accelerated nonsequential raytracing for high precision simulation of a linear grating spectrometer, Florian Mauch, David Fleischle, Wolfram Lyda, Univ. Stuttgart (Germany); Torsten Krug, Reto Häring, Instrument Systems Optische Messtechnik GmbH (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-14]

09.00: Fast virtual shadow projection system as part of a virtual multisensor assistance system, Klaus Haskamp, Markus Kästner, Eduard Reithmeier, Leibniz Univ. Hannover (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-15]

09.20: Speckle pattern simulations for encoding applications, Yves Salvadé, Romain Bonjour, Haute Ecole Arc Ingénierie Siège (Switzerland) . . . . .[8083-16]

09.40: Modeling of modulation functions of different configurations of optical chopper wheels, Virgil-Florin Duma, Mirela Nicolov, Todorut Ilca, Lucian Szantho, Aurel Vlaicu Univ. of Arad (Romania) . . . . . . . . . . . . . . . . . . . .[8083-17]

Coffee Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10.00 to 10.30

SESSION 5

Room: 12 . . . . . . . . . . . . . . . . . . . Tues. 10.30 to 12.40

Scatterometry II 10.30: Alternative robust statistical methods to reduce parameters uncertainty: application to scatterometry (Invited Paper), Jerome Hazart, Fanny Sarrazy, CEA, LETI, MINATEC (France); Régis Buyssou, Christophe Dezauzier, STMicroelectronics (France) . . . . . . . . . . . . . . . . . . . . . . . . .[8083-18]

11.00: The effect of line roughness on the diffraction intensities in angular resolved scatterometry, Akiko Kato, Frank Scholze, Physikalisch-Technische Bundesanstalt (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-19]

11.20: Inverse scattering problem solving for low-dimensional periodically-arranged nanocrystals, Leonid I. Goray, Russian Academy of Sciences for Research and Education (Russian Federation) . . . . . . . . . . . . . . . . . . . .[8083-20]

11.40: Fourier scatterometry with white light for characterization of sub-100 nm periodic two-photon polymerization structures, Valeriano Ferreras Paz, Sandy Peterhänsel, Karsten Frenner, Wolfgang Osten, Univ. Stuttgart (Germany); Aleksandr Ovsianikov, Kotaro Obata, Boris Chichkov, Laser Zentrum Hannover e.V. (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-21]

12.00: Improved geometry reconstruction and uncertainty evaluation for EUV scatterometry based on maximum likelyhood estimation, Mark-Alexander Henn, Hermann A. Gross, Clemens Elster, Markus Bär, Physikalisch-Technische Bundesanstalt (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-22]

12.20: Perturbation method for scattering matrix interpolation: application to feature shape control by scatterometry, Kofi Edee, Jean-Pierre Plumey, Univ. Blaise Pascal (United States); Gérard Granet, Univ. Blaise Pascal (France) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-23]

Lunch Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12.40 to 13.50

SESSION 6

Room: 12 . . . . . . . . . . . . . . . . . . . Tues. 13.50 to 15.30

Interferometry and Phase13.50: Gradient reconstruction for the phase recovery from a single interferogram with closed fringes, Jesús Muñoz-Maciel, Francisco J. Casillas Rodriguez, Francisco G. Peña-Lecona, Victor M. Durán Ramírez, Miguel Mora-González, Univ. de Guadalajara (Mexico) . . . . . . . . . . . . . . . . . . . . . . . .[8083-24]

14.10: Physical marker based stitching process of circular and non-circular interferograms, Roland Maurer, Florian Schneider, Christian Vogt, Peter Sperber, Rolf Rascher, Fachhochschule Deggendorf (Germany) . . . . . .[8083-25]

14.30: Ronchigram analysis based on effective wavelength techniques and wavefront slope, Fermin-Salomon Granados-Agustin, Anmi Gracia-Arellano, Daniel Aguirre-Aguirre, Alejandro Cornejo-Rodriguez, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico) . . . . . . . . . . . . . . . . . . . . . . . .[8083-26]

14.50: Ronchi test for refractive optics off-axis using a nodal bench, Fermin-Salomon Granados-Agustin, Maria-Elizabteh Percino-Zacarías, Fausto M. Escobar-Romero, Alfonson Salas-Sanchez, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-37]

15.10: Diffraction limit and possible solution of white light interferometry, Zhengshan Sun, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-28]

Coffee Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15.30 to 16.00

SESSION 7

Room: 12 . . . . . . . . . . . . . . . . . . . Tues. 16.00 to 16.40

Surface Metrology 16.00: Ab initio intensity distribution of diffusely scattered light from rough metallic surfaces, Johannes A. Böhm, AC2T Research GmbH (Austria); András Vernes, AC2T Research GmbH (Austria) and Institute of Applied Physics (Austria); Michael J. Vellekoop, Technische Univ. Wien (Austria) . . . . . .[8083-29]

16.20: Modeling of the surface color controlled by Ag nanograin structure, Mizue Ebisawa, Tokyo Metropolitan Industrial Technology Research Institute (Japan); Satoru Hashimoto, HYOUKAKEN Co., Ltd. (Japan); Teruyoshi Hirano, GGK Co., Ltd. (Japan); Shuichi Maeda, Tokai Univ. (Japan); Toshihide Iwanaga, Tokyo Metropolitan Industrial Technology Research Institute (Japan); Yasuhiro Mizutani, Univ. of Tokushima (Japan) . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-30]

SESSION 8

Room: 12 . . . . . . . . . . . . . . . . . . . Tues. 16.40 to 18.00

Holography16.40: New high compression method for digital hologram recorded in microscope configuration, Pasquale Memmolo, Istituto Nazionale di Ottica Applicata (Italy) and Univ. degli Studi di Napoli (Italy); Melania Paturzo, Anna Pelagotti, Istituto Nazionale di Ottica Applicata (Italy); Andrea Finizio, Pietro Ferraro, Istituto di Cibernetica Eduardo Caianiello (Italy); Bahram Javidi, Univ. of Connecticut (United States) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-31]

17.00: Multi SLMs holographic display with inclined plane wave illumination, Weronika Zaperty, Tomasz Kozacki, Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-32]

17.20: An autometed method for increasing the numerical aperture of a IR digital holography recording system, Melania Paturzo, Anna Pelagotti, Andrea G. Geltrude, Massimiliano Locatelli, Pasquale Poggi, Riccardo Meucci, Pietro Ferraro, Istituto Nazionale di Ottica Applicata (Italy); Grzegorz F. Finke, Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland) . . . . . . .[8083-33]

17.40: Si micro-resonators realized in 1D and 2D photonic crystal structures (Presentation Only), Anna Baldycheva, Trinity College Dublin (Ireland); Vladimir Tolmachev, Julia A. Zharova, Galina Fedulova, Ekaterina Astrova, Ioffe Physico-Technical Institute (Russian Federation); Tatiana S. Perova, Trinity College Dublin (Ireland) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8083-51]

Closing RemarksRoom: 12 . . . . . . . . . . . . . . . . . . . Tues. 18.00 to 18.10

Bernd Bodermann, Physikalisch-Technische Bundesanstalt (Germany)

Conference 8083



Conference 8084Wednesday-Thursday 25-26 May 2011 • Proceedings of SPIE Vol. 8084

O3A: Optics for Arts, Architecture, and ArchaeologyConference Chairs: Luca Pezzati, Istituto Nazionale di Ottica, INO CNR (Italy); Renzo Salimbeni, Istituto di Fisica Applicata Nello Carrara, IFAC CNR (Italy)

Programme Committee: John F. Asmus, Univ. of California, San Diego (United States); Brunetto Giovanni Brunetti, Univ. degli Studi di Perugia (Italy); Andreas Burmester, Doerner Institut (Germany); Marta Castillejo, Consejo Superior de Investigaciones Científicas (Spain); Alberto de Tagle, Netherlands Institute for Cultural Heritage (Netherlands); John Delaney, National Gallery of Art (United States); Mady Elias, Univ. Pierre et Marie Curie (France); Raffaella E. M. Fontana, Istituto Nazionale di Ottica, INO CNR (Italy); Igor P. Gurov, Saint-Petersburg State Univ. of Information Technologies, Mechanics and Optics (Russian Federation); Alexander J. Kossolapov, The Hermitage Museum (Russian Federation); Haida Liang, Nottingham Trent Univ. (United Kingdom); David R. Saunders, The British Museum (United Kingdom); Piotr Targowski, Nicolaus Copernicus Univ. (Poland); Vivi Tornari, Foundation for Research and Technology-Hellas (Greece)

Wednesday 25 MayRoom: 12 . . . . . . . . . . . . . . . . . . . .Wed. 08.15 to 08.20

Opening RemarksLuca Pezzati, Istituto Nazionale di Ottica Applicata (Italy)

SESSION KS

Room: 12 . . . . . . . . . . . . . . . . . . . .Wed. 08.20 to 08.50

Keynote SessionSession Chair: Luca Pezzati,

Istituto Nazionale di Ottica, INO CNR (Italy)

08.20: A nuclear-free land for Kennewick Man, John F. Asmus, Univ. of California, San Diego (United States) . . . . . . . . . . . . . . . . . [8084-01]

SESSION 1

Room: 12 . . . . . . . . . . . . . . . . . . . .Wed. 08.50 to 10.00

Imaging and Spectral Methods ISession Chair: Mady Elias, Univ. Pierre et Marie Curie (France)

08.50: New portable instrument for combined reflectance, time-resolved and steady-state luminescence measurements on works of art (Invited Paper), Aldo Romani, C. Grazia, C. Anselmi, Costanza Miliani, Brunetto G. Brunetti, Univ. degli Studi di Perugia (Italy) . . . . . . . . . . . . . . . . . . . . . . .[8084-02]

09.20: Visible to infrared reflectance and luminescence imaging spectroscopy of works of art, John Delaney, National Gallery of Art (United States); Jason G. Zeibel, U.S. Army Night Vision & Electronic Sensors Directorate (United States); Mathieu Thoury, Paola Ricciardi, National Gallery of Art (United States); Roy T. Littleton, U.S. Army Night Vision & Electronic Sensors Directorate (United States); Mervin Richard, E. Rene de la Rie, National Gallery of Art (United States) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-03]

09.40: Autofocus laser system for multi-NIR scanning imaging of painting surfaces, Raffaella E. M. Fontana, Marco Barucci, Pierluigi Carcagnì, Claudia Daffara, Luca Pezzati, Istituto Nazionale di Ottica, INO CNR (Italy) . . . .[8084-04]

Coffee Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10.00 to 10.30

Optical Metrology Plenary Session

Room 1 . . . . . . . . . . . . . . . . . Wednesday, 10.30 to 11.20Mitsuo Takeda, The Univ. of Electro-Communications, Japan


SESSION 2

Room: 12 . . . . . . . . . . . . . . . . . . . .Wed. 11.30 to 12.40

Imaging and Spectral Methods IISession Chair: Marta Castillejo, Consejo Superior de Investigaciones

Científicas (Spain)

11.30: Wide-band IR imaging in the NIR-MIR-FIR regions for in-situ analysis of frescoes (Invited Paper), Claudia Daffara, Luca Pezzati, Istituto Nazionale di Ottica, INO CNR (Italy); Dario Ambrosini, Domenica Paoletti, Roberta Di Biase, Univ. degli Studi dell’Aquila (Italy); Paola Ilaria Mariotti, Cecilia Frosinini, Opificio delle Pietre Dure (Italy). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-05]

12.00: New trends in imaging spectroscopy: application for the non-invasive study of stained glass windows, Elena Rebollo San Miguel, Univ. degli Studi di Padova (Italy); Filippo Ratti, Istituto di Fotonica e Nanotecnologie (Italy); Guidomaria Cortelazzo, Univ. degli Studi di Padova (Italy); Luca Poletto, Istituto di Fotonica e Nanotecnologie (Italy); Renzo Bertoncello, Univ. degli Studi di Padova (Italy) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-06]

12.20: Open issues in hyperspectral imaging for diagnostics on paintings: when high-spectral and spatial resolution turns into data redundancy, Costanza Cucci, Andrea Casini, Marcello Picollo, Marco Poggesi, Lorenzo Stefani, Istituto di Fisica Applicata Nello Carrara (Italy) . . . . . . . . . . . . .[8084-07]

Lunch Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12.40 to 14.10

SESSION 3

Room: 12 . . . . . . . . . . . . . . . . . . . .Wed. 14.10 to 14.50

Imaging and Spectral Methods IIISession Chair: Marta Castillejo, Consejo Superior de Investigaciones

Científicas (Spain)

14.10: Terahertz pulse imaging of stratified architectural materials for cultural heritage studies, J. Bianca Jackson, Ecole Polytechnique-ParisTech (France) and Ctr. de Recherche et de Restauration des Musées de France (France); Julien Labaune, Gérard A. Mourou, Ecole Polytechnique-ParisTech (France); Gillian C. Walker, John W. Bowen, Wendy Matthews, The Univ. of Reading (United Kingdom); Irl N. Duling III, Picometrix-API, Inc. (United States); Michel Menu, Ctr. de Recherche et de Restauration des Musées de France (France) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-08]

14.30: New methodological analytical approach of wall painting studies using LIBS, Vincent Detalle, Stéphanie Duchêne, Dominique Bouchardon, Lab. de Recherche des Monuments Historiques (France) . . . . . . . . . . . . . . .[8084-09]

SESSION 4

Room: 12 . . . . . . . . . . . . . . . . . . . .Wed. 14.50 to 16.40

Data ProcessingSession Chair: Haida Liang, Nottingham Trent Univ. (United Kingdom)

14.50: Virtual restoration: detection and removal of craquelure in digitized image of old paintings, Giuseppe Schirripa Spagnolo, Univ. degli Studi di Roma Tre (Italy) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-10]

15.10: Development of a UV to IR extension to the standard colorimetry, based on a seven band modified DSLR camera to better characterize surfaces, tissues and fabrics, Marcello Melis, Alice Babbi, Matteo Miccoli, Profilocolore Srl (Italy) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-11]

Coffee Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15.30 to 16.00

16.00: Determination of the complex optical index of red pigments, vermillon and minium, Raphaelle Jarrige, Christine Andraud, Jacques Lafait, Univ. Pierre et Marie Curie (France); Myriam Eveno, Michel Menu, Ctr. de Recherche et de Restauration des Musées de France (France); Nuno Diniz, Glacier Group (France) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-12]

16.20: TBA, . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-13]



Posters—WednesdayRoom: 12 . . . . . . . . . . . . . . . . . . . .Wed. 16.40 to 17.20

All symposium attendees are invited to attend Wednesday Poster Session. Poster presenters may post their poster papers starting at 10.00 on Wednesday

in the Conference Area Hallway and present them during Wednesday Poster Session. Please note that the Poster Session for Conferences 8082, Optical

Measurement Systems for Industrial Inspection, and 8083 Modeling Aspects in Optical Metrology will take place on Monday. Any papers left on the boards following 12.00 on Thursday will be considered unwanted

and will be discarded. SPIE assumes no responsibility for posters left up after the end of the Poster Session. Poster authors should be at their papers on

Wednesday from 16.40 to 17.20 to answer questions from attendees. Attendees are requested to wear their conference registration badges to the Poster

Sessions.

A small-dimension portable instrument for in-situ multispectral imaging, Angela M. Piegari, Anna Sytchkova, ENEA (Italy); Andrea Della Patria, Istituto Nazionale di Ottica, INO CNR (Italy); Fernando Fermi, Claudio Oleari, Univ. degli Studi di Parma (Italy) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-23]

Colour measurements of surfaces to evaluate the restoration materials, Claudia Pelosi, Angela Lo Monaco, Maurizio Marabelli, Rodolfo Picchio, Univ. degli Studi della Tuscia (Italy) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-24]

Nanosecond and femtosecond UV lasers for varnish removal on tempera paints, Mohamed Oujja, Consejo Superior de Investigaciones Científicas (Spain); Ana García, Carolina Romero, Javier R. Vázquez de Aldana, Pablo Moreno, Univ. de Salamanca (Spain); Marta Castillejo, Consejo Superior de Investigaciones Científicas (Spain) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-26]

Importance of integrated results of different non-destructive techniques in order to evaluate defects in panel paintings: the contribution of infrared, optical and ultrasonic techniques, Stefano Sfarra, Univ. degli Studi dell’Aquila (Italy); Panagiotis Theodorakeas, National Technical Univ. of Athens (Greece); Clemente Ibarra-Castanedo, Univ. Laval (Canada); Nicolas P. Avdelidis, National Technical Univ. of Athens (Greece); Alfonso Paoletti, Domenica Paoletti, Univ. degli Studi dell’Aquila (Italy); Kostas Hrissagis, National Technical Univ. of Athens (Greece); Abdel Hakim Bendada, Univ. Laval (Canada); Maria Koui, National Technical Univ. of Athens (Greece); Xavier P. V. Maldague, Univ. Laval (Canada) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-27]

A new method to certificate the lithography authenticity: hylemetry versus biometry, Giuseppe Schirripa Spagnolo, Lorenzo Cozzella, Carla Simonetti, Univ. degli Studi di Roma Tre (Italy) . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-28]

Laser cleaning investigation to remove biological crust on stone, Mariela Speranza, Mikel Sanz, Mohamed Oujja, Asunción de los Ríos, Sergio Pérez-Ortega, Carmen Ascaso, Marta Castillejo, Consejo Superior de Investigaciones Científicas (Spain) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-30]

Hand-held 3D sensor for documentation of archaeological excavations, Peter Kühmstedt, Christian Bräuer-Burchardt, Franz Moeller, Eric Otto, Ingo Schmidt, Gunther Notni, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-31]

Assessment of the underlying structures in paintings with LCI and multispectral imaging techniques, Simonetta Chinellato, INAF - Osservatorio Astronomico di Padova (Italy); Anna Pelagotti, Istituto Nazionale di Ottica, INO CNR (Italy); Claudio Pernehcele, INAF - Osservatorio Astronomico di Cagliari (Italy) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-32]

“IRIS”: a novel spectral imaging system for the analysis of cultural heritage objects, Vassilis M. Papadakis, Yiannis Orphanos, S. Kogou, Kristalia Melessanaki, Paraskevi Pouli, Costas Fotakis, Foundation for Research and Technology-Hellas (Greece) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-33]

Optical techniques for the characetrization of surface-subsurface defects in painted layers, Claudia Daffara, Raffaella Fontana, Istituto Nazionale di Ottica, INO CNR (Italy); Marta Melchiorre Di Crescenzo, Silvia Scrascia, Elisabetta Zendri, Univ. Ca’ Foscari di Venezia (Italy) . . . . . . . . . . . . . . .[8084-35]

Remote multispectral imaging with PRISMS and XRF analysis of Tang Tomb Paintings, Haida Liang, Nottingham Trent Univ. (United Kingdom); Qunxi Zhang, Shaanxi History Museum (China); Rebecca Lange, Nottingham Trent Univ. (United Kingdom) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-36]


Room: B21 . . . . . . . . . . . . . . . . . Thurs. 08.30 to 10.00

TomographySession Chair: Vivi Tornari, Foundation for Research and Technology-

Hellas (Greece)

08.30: Non-invasive investigations of a wall painting using optical coherence tomography and hyperspectral imaging (Invited Paper), Haida Liang, Rebecca Lange, Nottingham Trent Univ. (United Kingdom); Helen Howard, The National Gallery (United Kingdom); Jane Spooner, Historic Royal Palaces (United Kingdom) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-14]

09.00: Application of optical coherence tomography (OCT) for real time monitoring of consolidation of the paint layer in Hinterglasmalerei objects, Magdalena A. Iwanicka, Ewa A. Kwiatkowska, Marcin Sylwestrzak, Piotr Targowski, Nicolaus Copernicus Univ. (Poland) . . . . . . . . . . . . . . . . . . .[8084-15]

09.20: OCT and NMR for non-invasive in-situ monitoring of the vulnerability of rock art monuments, Elizabeth Bemand, Haida Liang, Martin Bencsik, Nottingham Trent Univ. (United Kingdom) . . . . . . . . . . . . . . . . . . . . . . .[8084-16]

09.40: X-Ray “shape from silhouette” for three-dimensional reconstruction of ancient handworks, Emanuele Simioni, Univ. degli Studi di Padova (Italy); Filippo Ratti, Luca Poletto, Istituto di Fotonica e Nanotecnologie (Italy) [8084-17]

Coffee Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10.00 to 10.30

SESSION 6

Room: B21 . . . . . . . . . . . . . . . . . Thurs. 10.30 to 12.20

3D TechniquesSession Chair: Raffaella E. M. Fontana, Istituto Nazionale di Ottica,

INO CNR (Italy)

10.30: Preliminary investigation on monitoring transportation effects by full field methods: a digital holographic speckle pattern interferometry study on canvas paintings (Invited Paper), Elsa Tsiranidou, Vivi Tornari, Foundation for Research and Technology-Hellas (Greece); Thomas Fankhauser, Matthias Laeuchli, Nathalie Bäschlin, Hochschule der Künste Bern (Switzerland) [8084-18]

11.00: Infrared digital holography applications for virtual museums and diagnostics of cultural heritage, Melania Paturzo, Anna Pelagotti, Andrea G. Geltrude, Massimiliano Locatelli, Pasquale Poggi, Riccardo Meucci, Pietro Ferraro, Istituto Nazionale di Ottica, INO CNR (Italy); Elena V. Stoykova, Institute of Optical Materials and Technologies (Bulgaria); Fahri Yaras, Ali Özgür Yöntem, Hoonjong Kang, Levent Onural, Bilkent Univ. (Turkey) . . . . . . . . . . . . . .[8084-19]

11.20: Application of digital image correlation (DIC) for tracing of canvas painting deformation, Marcin R. Malesa, Krzysztof Malowany, Warsaw Univ. of Technology (Poland); Ludmila Tyminska-Widmer, Ewa A. Kwiatkowska, Nicolaus Copernicus Univ. (Poland); Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland); Piotr Targowski, Nicolaus Copernicus Univ. (Poland) . . . . . . .[8084-20]

11.40: Study on the currently accessible technology for 3D printing of color objects from the reproduction quality standpoint, Robert Sitnik, Jakub F. Krzeslowski, Grzegorz Maczkowski, Warsaw Univ. of Technology (Poland) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8084-21]

12.00: S. Peter Martyr (Rieti, Italy): a study case for 3D color laser scanner (RGB-ITR), Massimiliano Guarneri, Giorgio Fornetti, Mario Ferri De Collibus, Roberto Ricci, Massimo Francucci, Marcello Nuvoli, ENEA (Italy) . . . . .[8084-22]

Conference 8084

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Conference 8085Wednesday-Thursday 25-26 May 2011 • Proceedings of SPIE Vol. 8085

Videometrics, Range Imaging, and ApplicationsConference Chairs: Fabio Remondino, Fondazione Bruno Kessler (Italy); Mark R. Shortis, RMIT Univ. (Australia)

Programme Committee: J. Angelo Beraldin, National Research Council Canada (Canada); Jan Boehm, Univ. College London (United Kingdom); Werner Boesemann, AICON 3D Systems GmbH (Germany); Hirofumi Chikatsu, Tokyo Denki Univ. (Japan); Nicola D’Apuzzo, Homometrica Consulting (Switzerland); Sabry F. El-Hakim, Carleton Univ. (Canada); Gabriele Guidi, Politecnico di Milano (Italy); Jussi Heikkinen, Aalto Univ. School of Science and Technology (Finland); Derek D. Lichti, Univ. of Calgary (Canada); Hans-Gerd Maas, Technische Univ. Dresden (Germany); Jon P. Mills, Newcastle Univ. (United Kingdom); Norbert Pfeifer, Technische Univ. Wien (Austria); Stuart Robson, Univ. College London (United Kingdom); David Stoppa, Fondazione Bruno Kessler (Italy)

Wednesday 25 MayOpening Remarks

Room:14c . . . . . . . . . . . . . . . . . . .Wed. 13.00 to 13.10Mark R. Shortis, RMIT Univ. (Australia); Fabio Remondino,

Fondazione Bruno Kessler (Italy)

SESSION 1

Room: 14c . . . . . . . . . . . . . . . . . . .Wed. 13.10 to 15.30

Accuracy and Performance EvaluationSession Chair: Mark R. Shortis, RMIT Univ. (Australia)

13.10: 3D Imaging: how to achieve the highest accuracy (Invited Paper), Thomas Luhmann, Jade Univ. of Applied Sciences (Germany) . . . . . . .[8085-01]

13.50: Practical target detection and accuracy indicator in digital close range photogrammetry using consumer grade cameras, Gentaro Moriya, Hirofumi Chikatsu, Tokyo Denki Univ. (Japan) . . . . . . . . . . . . . . . . . . . .[8085-02]

14.10: Digital methodologies for 3D acquisition and representation of mosaics, Anna Maria Manferdini, Luca Cipriani, Univ. degli Studi di Bologna (Italy); Linda Kniffitz, Museo d’Arte della Città di Ravenna (Italy) . . . . . .[8085-03]

14.30: Self-calibration for a camera-projector pair, Alfredo Paolillo, Giuseppe Di Leo, Maurizio Bevilacqua, Marco Landi, Univ. degli Studi di Salerno (Italy) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-04]

14.50: Power-saving modulation technique for time-of-flight range imaging sensors, Richard M. Conroy, Adrian A. Dorrington, Andrew D. Payne, Rainer Kunnemeyer, Michael J. Cree, The Univ. of Waikato (New Zealand) . . .[8085-05]

15.10: Real-time image processing of TOF range images using a reconfigurable processor system, Stephan Hussmann, Torsten Edeler, Florian Knoll, Fachhochschule Westküste Heide (Germany) . . . . . . . . . . . . . . .[8085-06]

Coffee Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15.30 to 16.00

Posters—WednesdayRoom: 12 . . . . . . . . . . . . . . . . . . . .Wed. 16.00 to 16.40

All symposium attendees are invited to attend Wednesday Poster Session. Poster presenters may post their poster papers starting at 10.00 on Wednesday

in the Conference Area Hallway and present them during Wednesday Poster Session. Please note that the Poster Session for Conferences 8082, Optical

Measurement Systems for Industrial Inspection, and 8083 Modeling Aspects in Optical Metrology will take place on Monday. Any papers left on the boards following 12.00 on Thursday will be considered unwanted

and will be discarded. SPIE assumes no responsibility for posters left up after the end of the Poster Session. Poster authors should be at their papers

on Wednesday from 16.00 to 16.40 to answer questions from attendees. Attendees are requested to wear their conference registration badges to

the Poster Sessions.

3D documentation of historical sites and buildings for interdisciplinary works, Esra Tekdal-Emniyeti, Istanbul Teknik Üniv. (Turkey) and Karlsruher Institut für Technologie (Germany); Karl-Heinz Haefele, Joerg Isele, Karlsruher Institut für Technologie (Germany); Rahmi N. Celik, Istanbul Teknik Üniv. (Turkey) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-30]

Three-dimensional surface topography based on digital fringe projection, Fatemeh Mohammadi, Khosro Madanipour, Amir H. Rezaie, AmirKabir Univ. of Technology (Iran, Islamic Republic of) . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-31]

Large material stack-yard 3D reconstruction based on sequential stereo imagery and projected-contour, Jianliang Ou, Xiaohu Zhang, Yun Yuan, Qinhua Ma, Zhaokun Zhu, Qifeng Yu, Xianwei Zhu, National Univ. of Defense Technology (China) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-32]

A fast reconstruction and mesh simplification applied in FEM of dental model, Langming Zhou, Shunyi Zheng, Wuhan Univ. (China) . . . . . . . .[8085-33]

Infrared digital holography for 3D display, Melania Paturzo, Anna Pelagotti, Massimiliano Locatelli, Andrea G. Geltrude, Pasquale Poggi, Riccardo Meucci, Pietro Ferraro, Istituto Nazionale di Ottica Applicata (Italy) . . . . . . . . . . .[8085-34]

Robust Sharp Features Infer in Point Clouds, Juming Cao, Slam Wushour, Xi’an Jiaotong Univ. (China); Xinhui Yao, Baoji Univ. of Arts and Sciences (China); Naiqian Li, Jin Liang, Xinhe Liang, Jianwei Liu, Xi’an Jiaotong Univ. (China) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-35]

Longitudinal resolution improving of 3D range imaging Lidar through redundant detection and intensity distribution analysis, Weiguo Kong, Siying Chen, Yinchao Zhang, He Chen, Zongjia Qiu, Yuzhao Wang, Peng Liu, Guoqiang Ni, Beijing Institute of Technology (China) . . . . . . . . . . . . . . . . . . . . . . .[8085-36]

A novel color coding method for structured light 3D measurement, Junhui Huang, Zhao Wang, Zhihua Gao, Jianmin Gao, Xi’an Jiaotong Univ. (China) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-37]

Three-dimensional contour reconstruction of push-broom range-gated Lidar data: case studies, Jixian Xu, Siying Chen, Yinchao Zhang, He Chen, Pan Guo, Guoqiang Ni, Beijing Institute of Technology (China) . . . . . . . . . . .[8085-38]

SESSION 2

Room: 14c . . . . . . . . . . . . . . . . . . .Wed. 16.40 to 18.00

Image- and Range-based ModellingSession Chair: Fabio Remondino, Fondazione Bruno Kessler (Italy)

16.40: Accurate documentation in cultural heritage by merging TLS and high-resolution photogrammetric data, Pierre Grussenmeyer, Emmanuel Alby, Pierre Assali, Valentin Poitevin, Jean-François Hullo, Eddie Smigiel, Institut National des Sciences Appliquées de Strasbourg (France) . . . . . . . . . .[8085-07]

17.00: A parallel point cloud clustering algorithm for subset segmentation and outlier detection, Christian Teutsch, Dirk Berndt, Erik Trostmann, Fraunhofer-Institut für Fabrikbetrieb und -automatisierung (Germany) .[8085-08]

17.20: Integration of photogrammetry and acoustic emission analysis for assessing concrete structures during loading tests, Robert Koschitzki, Gregor Schacht, Danilo Schneider, Steffen Marx, Hans-Gerd Maas, Technische Univ. Dresden (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-17]

17.40: Performance analysis of different classification methods for hand gesture recognition using range cameras, Herve D. Lahamy, Derek D. Lichti, Univ. of Calgary (Canada) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-10]


Room: 12 . . . . . . . . . . . . . . . . . . Thurs. 08.30 to 10.10

Accuracy, System Performance and Orientation AnalysisSession Chair: Mark R. Shortis, RMIT Univ. (Australia)

08.30: Artefacts for surface measurement, Stuart Robson, Univ. College London (United Kingdom); J. Angelo Beraldin, National Research Council Canada (Canada); Andrew D. Brownhill, Lindsay W. MacDonald, Univ. College London (United Kingdom) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-11]

08.50: Illumination waveform optimization for time-of-flight range imaging cameras, Andrew D. Payne, Adrian A. Dorrington, Michael J. Cree, The Univ. of Waikato (New Zealand) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-12]

09.10: A descriptive geometry based method for total and common cameras fields of view optimization, Houssam Salmane, Univ. de Technologie de Belfort-Montbéliard (France) and Institut National de Recherche sur les Transports et leur Sécurité (France); Yassine Ruichek, Univ. de Technologie de Belfort-Montbéliard (France); Louahdi Khoudour, Institut National de Recherche sur les Transports et leur Sécurité (France). . . . . . . . . . . . . . . . . . . . . . .[8085-13]

09.30: Experiences of image sequence orientation in close-range photogrammetry, Luigi Barazzetti, Politecnico di Milano (Italy); Gianfranco Forlani, Univ. degli Studi di Parma (Italy); Fabio Remondino, Fondazione Bruno Kessler (Italy); Riccardo Roncella, Univ. degli Studi di Parma (Italy); Marco Scaioni, Politecnico di Milano (Italy) . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-14]

09.50: Geometric investigation of a gaming active device, Fabio Menna, Fabio Remondino, Roberto Battisti, Fondazione Bruno Kessler (Italy) . .[8085-15]

Coffee Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10.10 to 10.40



SESSION 4

Room: 12 . . . . . . . . . . . . . . . . . . Thurs. 10.40 to 12.20

3D ApplicationsSession Chair: Fabio Remondino, Fondazione Bruno Kessler (Italy)

10.40: Industrial photogrammetry: challenges and opportunities (Invited Paper), Werner Boesemann, AICON 3D Systems GmbH (Germany) . . .[8085-16]

11.20: Integration of range and image data for building reconstruction, Francesco Nex, Andrea Lingua, Politecnico di Torino (Italy); Fabio Remondino, Fondazione Bruno Kessler (Italy); Fulvio Rinaudo, Politecnico di Torino (Italy) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-09]

11.40: Vibration measurement of a model wind turbine using high speed photogrammetry, Dinesh S. Kalpoe, Kourosh S. Khoshelham, Ben G. H. Gorte, Technische Univ. Delft (Netherlands) . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-18]

12.00: Use of 3D range cameras for structural deformation measurements, Sonam Jamtsho, Derek D. Lichti, Univ. of Calgary (Canada) . . . . . . . . .[8085-19]

Lunch Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12.20 to 13.50

SESSION 5

Room: 12 . . . . . . . . . . . . . . . . . . Thurs. 13.50 to 15.30

3D Modelling and Motion CaptureSession Chair: Mark R. Shortis, RMIT Univ. (Australia)

13.50: Low-cost human motion capture system for postural analysis onboard ships, Fabio Menna, Univ. degli Studi di Napoli Parthenope (Italy); Erica Nocerino, Univ. degli Studi di Napoli Federico II (Italy); Sebastiano Ackermann, Silvio Del Pizzo, Salvatore Troisi, Univ. degli Studi di Napoli Parthenope (Italy) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-20]

14.10: A greedy multiresolution method for fully automatic texture mapping, Francesca Uccheddu, Univ. degli Studi di Firenze (Italy); Anna Pelagotti, Istituto Nazionale di Ottica Applicata (Italy); Francesco Picchioni, Univ. degli Studi di Firenze (Italy) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-21]

14.30: Shadow correction in high dynamic range image for generating ortho photos, Hideo Suzuki, Aero Asahi Corp. (Japan); Hirofumi Chikatsu, Tokyo Denki Univ. (Japan) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-22]

14.50: An approach for the calibration of a combined RGB-sensor and 3D-camera device, Marc Schulze, Technische Univ. Dresden (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-23]

15.10: Least squares embedded particle filter for model-based 3D object tracking, You Li, Qifeng Yu, National Univ. of Defense Technology (China) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-24]

Coffee Break . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15.30 to 16.00

SESSION 6

Room: 12 . . . . . . . . . . . . . . . . . . Thurs. 16.00 to 17.40

Calibration and Orientation AlgorithmsSession Chair: Fabio Remondino, Fondazione Bruno Kessler (Italy)

16.00: Comparison of single view calibration methods, Jussi A. Heikkinen, Keijo R. Inkilä, Aalto Univ. School of Science and Technology (Finland) [8085-25]

16.20: Planar metric rectification via parallelograms, Luigi Barazzetti, Politecnico di Milano (Italy) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-26]

16.40: Calibration of wide-angle lens cameras using perspective and non-perspective projections in the context of real-time tracking applications, Jochen Willneff, Advanced Realtime Tracking GmbH (Germany); Oliver Wenisch, SensoMotoric Instruments GmbH (Germany) . . . . . . . . . . . . . . . . . . . . .[8085-27]

17.00: Practical calibration for consumer grade digital camera with integrated high zooming lens, Ryuta Wakutsu, Hirofumi Chikatsu, Tokyo Denki Univ. (Japan) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-28]

17.20: Calibration of low-cost measurement system by using a consumer digital stereo camera, Ryuji Matsuoka, Infrastructure Innovation Institute, Inc. (Japan); Genki Takahashi, Kazuyoshi Asonuma, Kokusai Kogyo Co., Ltd. (Japan) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .[8085-29]

Conference 8085



Attendee Services

InternetWi-fi access for laptop users and a number of complimentary computer stations with timed access can be found in the ICM Foyer areas.

Registration HoursLocation—please read the following notes:Workshop Registration is open for Workshop attendees only on Sunday 22 May, 8.30 to 16.00, at the Novotel Messe Muenchen.

If you have not registered for the workshop, please check in at the ICM, Entrance West, Conference Registration, which is open during the following hours:

Sunday 22 May . . . . . . . . . . . . . . . . . . . . . . . . . 14.00 to 17.00Monday - Wednesday 23-25 May . . . . . . . . . . . 07.00 to 17.00Thursday 26 May . . . . . . . . . . . . . . . . . . . . . . . . 08.00 to 14.00

The Congress registration fee includes entry to the Laser World of Photonics Exhibition and Congress 2011.

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• Registration Payments - If you are paying by cash or check as part of your onsite registration, wish to add a workshop or special event requiring payment, or have questions regarding your registration, please see the onsite cashier at the Cashier station in the registration area.

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Food and Beverage

Coffee BreaksComplimentary coffee will be served twice each day in the Conference Foyer Area at the times indicated in the Final Programme. Please refer to individual conference programmes for timings of coffee and lunch breaks.

Refreshment PurchasesThe ICM has three permanent food-service operations in the foyer area – the ICM Bistro, ICM Bar and ICM Café – where guests can purchase food. There is also the “Am See” restaurant, located on the 1st floor.

There are also a number of bars and restaurants located in the Riem Arkaden complex on the other side of the underground station for the ICM.

Welcome ReceptionPaulaner BräuhausWednesday 25 May . . . . . . . . . . . . . . . . . . . . . . 19.00 to 21.30

This evening event will feature a light meal and beverages at one of Munich’s premier breweries, the Paulaner Bräuhaus. All registered conference attendees are welcome. A guest may accompany a registered attendee for an additional charge (based on space available).

Travel

How to reach the ICM-International Congress Center Munich

At Munich Central Station take the underground U2. The journey to the trade fair grounds takes about 17 minutes. Please refer to the Laser 2011 website for more detailed information on public transport: http://world-of-photonics.net/en/photonics-congress/travel-accomodation/getting-there/public-transport

Transportation from airport to city centre

The Franz Josef Strauss Airport (MUC) is located 17 miles (27 km) northeast of the center of Munich. Please refer to the Munich International Airport website for more detailed informationhttp://www.munich-airport.de/EN/index.html, or to the Laser 2011 site: http://world-of-photonics.net/en/photonics-congress/travel-accomodation/getting-there/plane/public-transport

General Information



Policies

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About MunichMunich, “the city with a heart,” is the capital of Bavaria, and has established itself as Germany’s high-tech hub (Silicon Bavaria) and is one of the most important industrial and economic centers in the European community. It boasts of such hi-tech corporations as BMW and Daimler-Chrysler Aerospace. In addition to being the country’s leading university center and hub for insurance, banking, electronic, and mechanical engineering, Munich offers its visitors shopping, music, art, gourmet restaurants, beer gardens, outdoor cafes, ethnic restaurants, popular night-spots, grand cathedrals and opulent palaces.

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http://www.muenchen-tourist.de/englisch/index_e.htm

http://www.munichfound.de/



A

Aaltonen, Juha [8082-107]SPSAas, Lars Martin S. [8082-73]

S15, [8082-138]SPSAbdalah, Sora [8082-79]S3Abolhassani, Mohammad [8082-

151]SPSAcevedo Pardo, Carlos [8082-128]

SPSAckermann, Sebastiano [8085-20]

S5Agour, Mostafa [8082-22]S5Agudelo Moreno, Viviana A.

[8082-123]SPSAguirre-Aguirre, Daniel [8083-

26]S6Aissa, Mohamed H. [8082-01]S1Aksnes, Astrid 8082 ProgComm,

[8082-30]S7, [8082-147]SPSAlbertazzi, Armando [8082-14]

S3, 8082 ProgComm, 8082 S8 SessChr, [8082-40]S9

Alby, Emmanuel [8085-07]S2Alekseenko, I. [8082-13]S3Almeida, Giovanna B. [8083-39]

SPSAl-Naimee, Kais [8082-79]S3Alparslan, Aytac [8083-03]S1Altmeyer, Stefan [8082-23]S5Álvarez, Ignacio [8082-64]S13Amaral, Marcello M. [8082-111]

SPSAmari, Mohamed [8082-76]S16Ambrosini, Dario [8084-05]S2Amezquita Orozco, Ricardo [8082-

123]SPSAmziane, Ahmed [8082-76]S16Andraud, Christine [8084-12]S4Angelsky, Oleg V. 8082

ProgComm, [8082-148]SPSAnisimov, Andrey G. [8082-100]

SPSAnselmi, C. [8084-02]S1Anstotz, Freddy [8082-36]S8Anthony, Brian W. [8082-37]S8Arai, Yasuhiko [8082-66]S13Arasa Marti, Josep [8082-97]SPSArnold, William H. MeetingVIPAscaso, Carmen [8084-30]SPSAsmus, John F. 8084 ProgComm,

[8084-01]SKSAsonuma, Kazuyoshi [8085-29]S6Assali, Pierre [8085-07]S2Astola, Jaakko [8082-21]S5Astrova, Ekaterina [8083-51]S8Asundi, Anand K. 8082

ProgCommAtashkhooei, Reza [8082-68]S14Avdelidis, Nicolas P. [8084-27]

SPS

B

Babbi, Alice [8084-11]S4Bach, Carlo [8082-34]S8Baer, Goran [8082-51]S11, [8082-

57]S12Baier, Maik [8082-39]S9Baitinger, Henner [8083-11]S3

Baldycheva, Anna [8083-51]S8Banchet, Julien [8082-76]S16Bär, Markus 8083 ProgComm,

[8083-05]S2, [8083-22]S5Barabanenkov, Mikhail Y. [8083-

04]S1Barabanenkov, Yuri N. [8083-04]

S1Barazzetti, Luigi [8085-14]S3,

[8085-26]S6Barilli, Marco [8082-90]SPSBarnes, Bryan M. [8083-06]S2Barros, Wellington S. [8082-111]

SPSBarucci, Marco [8084-04]S1Bäschlin, Nathalie [8084-18]S6Battisti, Roberto [8085-15]S3Baum, Alexandra [8082-79]S3Beckstette, Klaus-Friedrich 8082

ProgCommBehroodi, Ebrahim [8082-98]SPSBeiderman, Yevgeny [8082-16]S4Bemand, Elizabeth [8084-16]S5Bencsik, Martin [8084-16]S5Bendada, Abdel Hakim [8084-27]

SPSBeneke, Jan [8082-23]S5Beraldin, J. Angelo 8085

ProgComm, [8085-11]S3Berger, A. [8082-49]S11Bergmann, Ralf B. 8082

ProgComm, [8082-05]S2, [8082-22]S5

Bergström, Per [8082-11]S3Berndt, Dirk [8085-08]S2Bernhard, Luc [8082-130]SPSBertoncello, Renzo [8084-06]S2Beutler, Andreas [8082-55]S12Bevilacqua, Maurizio [8085-04]S1Beyer, Dirk [8082-19]S4Binder, Josef [8082-154]SPSBischoff, Jörg 8083 ProgComm,

[8083-11]S3Blanco, Patricia [8082-97]SPSBodermann, Bernd 8083 Chr,

[8083-05]S2Boehm, Jan 8085 ProgCommBoesemann, Werner 8085

ProgComm, [8085-16]S4Böhm, Johannes A. [8082-124]

SPS, [8083-29]S7Bonjour, Romain [8083-16]S4Bony, Francis [8082-68]S14Borghi, Giovanna [8082-118]SPSBosch, Thierry M. [8082-68]S14Bosse, Harald 8082 ProgComm,

8083 CoChrBöttner, Thomas [8082-31]S7Bouamama, Larbi L. [8082-127]

SPSBouchardon, Dominique [8084-

09]S3Boucher, William [8082-50]S11Bowen, John W. [8084-08]S3Bräuer-Burchardt, Christian [8082-

38]S8, [8084-31]SPSBreitbarth, Andreas [8082-38]S8Breteau, Jean-Marc [8082-76]S16,

[8083-43]SPSBroughton, William R. [8082-72]

S15

Brownhill, Andrew D. [8085-11]S3Brunetti, Brunetto G. 8084

ProgComm, [8084-02]S1Brzezinski, Michal [8082-69]S14Buatier de Mongeot, Francesco

[8082-138]SPSBublitz, Simon [8082-77]S16Buchta, Zdenek [8082-145]SPSBurge, James [8082-149]SPSBurger, Sven 8083 ProgComm,

[8083-07]S2, [8083-08]S2, [8083-48]SPS

Burla, Avinash [8082-01]S1Burmester, Andreas 8084

ProgCommBuse, Karsten 8082 ProgCommBusse, Gerd [8082-75]S16Buyssou, Régis [8083-18]S5

C

Camacho, Luis [8082-24]S5Campos, Joaquin [8083-41]SPSCao, Juming [8085-35]SPSCarcagnì, Pierluigi [8084-04]S1Casillas, Francisco J. [8082-141]

SPS, [8083-24]S6Casini, Andrea [8084-07]S2Caspar, Sandra [8082-34]S8Castillejo, Marta 8084 ProgComm,

8084 S2 SessChr, 8084 S3 SessChr, [8084-26]SPS, [8084-30]SPS

Caulier, Yannick [8082-130]SPSCelik, Rahmi N. [8085-30]SPSCelikel, Oguz [8082-85]SPSCeyhan, Ufuk [8082-56]S12Chaab, Omar [8082-127]SPSChen, He [8085-36]SPS, [8085-38]

SPSChen, Siying [8085-36]SPS,

[8085-38]SPSChen, Yan-An [8083-38]SPSChen, Yi-Chun [8082-52]S11Chiappe, Daniele [8082-138]SPSChichkov, Boris [8083-21]S5Chikatsu, Hirofumi 8085

ProgComm, [8085-02]S1, [8085-22]S5, [8085-28]S6

Chinellato, Simonetta [8084-32]SPS

Chiu-Zarate, Roger [8082-141]SPS

Chugui, Yuri V. 8082 S13 SessChr, 8082 ProgComm, [8082-74]S16

Cip, Ondrej [8082-133]SPS, [8082-145]SPS

Ciprian, Dalibor [8082-29]S7, [8082-115]SPS

Cipriani, Luca [8085-03]S1Cizek, Martin [8082-145]SPSConroy, Richard M. [8085-05]S1Cornejo-Rodriguez, Alejandro

[8083-26]S6Correia, Carlos M. [8082-113]SPSCorrons, Antonio [8083-41]SPSCorso Krutul, Eduardo [8083-49]

SPSCortelazzo, Guidomaria [8084-06]

S2

Couceiro, Iakyra B. [8082-111]SPS, [8083-39]SPS

Cozzella, Lorenzo [8084-28]SPSCree, Michael J. [8085-05]S1,

[8085-12]S3Cucci, Costanza [8084-07]S2Czarske, Jürgen W. 8082

ProgComm, [8082-35]S8, [8082-81]S16

Czeremuszkin, Grzegorz [8082-132]S16

D

Daffara, Claudia [8084-04]S1, [8084-05]S2, [8084-35]SPS

D’Apuzzo, Nicola 8085 ProgComm

de Faria, Giancarlo V. [8082-111]SPS

de Freitas, Anderson Z. [8082-111]SPS

De Girolamo Del Mauro, Anna [8082-157]SPS

de Groot, Peter J. 8082 ProgComm

de la Rie, E. Rene [8084-03]S1de los Ríos, Asunción [8084-30]

SPSDe Nicola, Sergio [8082-79]S3de Tagle, Alberto 8084 ProgCommDel Pizzo, Silvio [8085-20]S5Delage, Pascal [8082-50]S11Delaney, John 8084 ProgComm,

[8084-03]S1Della Patria, Andrea [8084-23]SPSDereniak, Eustace L. MeetingVIPDetalle, Vincent [8084-09]S3Dezauzier, Christophe [8083-18]

S5Di Biase, Roberta [8084-05]S2Di Leo, Giuseppe [8085-04]S1Dierke, Hanno [8082-20]S4Diniz, Nuno [8084-12]S4Distante, Cosimo [8082-08]S2Dixson, Ronald [8083-06]S2Domanski, Andrzej W. [8082-

136]SPS, [8082-140]SPSDominguez, Margaret Z. [8082-

149]SPSDorrington, Adrian A. [8085-05]

S1, [8085-12]S3Dreier, Florian [8082-35]S8, [8082-

81]S16Du, Yue-yang [8082-105]SPSDu, Zhengchun [8082-105]SPSDuchêne, Stéphanie [8084-09]S3Duling, Irl N. [8084-08]S3Duma, Virgil-Florin [8083-17]S4,

[8083-45]SPSDurán Ramírez, Victor M. [8083-

24]S6Dyakov, Sergey A. [8083-50]SPS

E

Eberhard, Peter [8083-40]SPSEbisawa, Mizue [8083-30]S7Edee, Kofi [8083-23]S5Edeler, Torsten [8085-06]S1

Index of Authors, Chairs, and Committee MembersBold = SPIE Member



Edely, Mathieu [8082-76]S16Eder, Bastian [8082-142]SPSEhret, Gerd [8082-39]S9El-Hakim, Sabry F. 8085

ProgCommElias, Mady 8084 ProgComm,

8084 S1 SessChrEllingsen, Pål G. [8082-73]S15Elster, Clemens [8082-39]S9,

[8083-22]S5Enguita, José María [8082-64]S13Erben, Elke [8082-89]SPSErdmann, Andreas 8083

ProgComm, [8083-13]S4Erichsen, Iris [8082-158]SPSErshov, Alexandr G. [8083-34]SPSEscobar-Romero, Fausto M.

[8083-37]S6Ettemeyer, Andreas [8082-34]S8Evanschitzky, Peter [8083-13]S4Eveno, Myriam [8084-12]S4

F

Faber, Christian [8082-28]S6Fadeyev, Alexander V. [8082-

110]SPSFalldorf, Claas [8082-05]S2,

[8082-22]S5Fankhauser, Thomas [8084-18]S6Fanti, Giulio [8084-25]SPSFantin, Analucia V. [8082-40]S9Farahi, Faramarz [8083-46]SPSFedulova, Galina [8083-51]S8Fermi, Fernando [8084-23]SPSFernandez-Dorado, Jose [8082-

97]SPSFerraro, Pietro SympChair,

8082 S4 SessChr, [8082-08]S2, [8082-12]S3, [8083-31]S8, [8083-33]S8, [8084-19]S6, [8085-34]SPS

Ferreira, Janaina [8082-118]SPSFerreira da Silva, Thiago [8082-

111]SPS, [8082-118]SPSFerreras Paz, Valeriano [8083-21]

S5Ferrero, Alejandro [8083-41]SPSFerri De Collibus, Mario [8084-22]

S6Filatov, Olexandr Y. [8082-122]

SPSFilatov, Yuriy D. [8082-122]SPSFinizio, Andrea [8082-08]S2,

[8083-31]S8Finke, Grzegorz F. [8083-33]S8Fitzenreiter, Arne [8082-39]S9Fleischle, David [8082-03]S1,

[8083-14]S4Fleischmann, Friedrich [8082-56]

S12Fontana, Raffaella E. M. 8084 S6

SessChr, 8084 ProgComm, [8084-35]SPS, [8084-04]S1

Forlani, Gianfranco [8085-14]S3Fornetti, Giorgio [8084-22]S6Forster, Frank [8082-42]S9Fossum, Jon O. [8082-73]S15Fotakis, Costas [8084-33]SPSFrade, María [8082-64]S13Francucci, Massimo [8084-22]S6

Frank, Johannes [8082-23]S5Franssila, Sami [8082-107]SPSFrenner, Karsten [8083-01]S1,

[8083-02]S1, [8083-21]S5, [8083-40]SPS

Fritz, K. P. [8082-154]SPSFrosinini, Cecilia [8084-05]S2Fu, Guodong [8082-125]SPSFu, Liwei [8083-01]S1, [8083-02]

S1Fühner, Tim [8083-13]S4Furlong, Cosme 8082 ProgComm

G

Gafsi, Houcem [8082-129]SPSGale, David M. [8082-99]SPSGao, Feng [8082-26]S6Gao, Jianmin [8085-37]SPSGao, Zhihua [8085-37]SPSGao, Zhishan [8082-54]S12Garbusi, Eugenio [8082-51]S11Garcia, Javier [8082-16]S4García, Ana [8084-26]SPSGarcía, Javier [8082-09]S3, [8082-

24]S5Gastinger, Kay 8082 S16 SessChr,

8082 CoChr, [8082-30]S7Geltrude, Andrea G. [8082-12]

S3, [8082-79]S3, [8083-33]S8, [8084-19]S6, [8085-34]SPS

Gemma, Takashi [8082-62]S13Georges, Marc P. 8082

ProgCommGhezelaiagh, Mohammad Hossein

[8082-93]SPSGiessen, Harald W. [8083-01]S1,

[8083-02]S1Gilbergs, Holger [8083-40]SPSGonçalves, Armando A. [8082-

46]S10Goray, Leonid I. [8083-20]S5Gorecki, Christophe 8082

ProgCommGorodynska, Nina V. [8082-148]

SPSGorte, Ben G. H. [8085-18]S4Gracia-Arellano, Anmi [8083-26]S6Granados-Agustin, Fermin-

Salomon [8083-26]S6, [8083-37]S6

Granero, Luis [8082-09]S3Granet, Gérard [8083-23]S5Grazia, C. [8084-02]S1Gren, Per [8082-11]S3Grieneisein, Hans P. H. [8082-111]

SPS, [8083-39]SPSGries, Thomas [8082-103]SPSGrigoras, Kestas [8082-107]SPSGrimaldi, Immacolata A. [8082-

157]SPSGross, Hermann A. [8083-05]S2,

[8083-22]S5Grosse, Marcus [8082-45]S10Groves, Roger M. 8082

ProgComm, [8083-49]SPSGrujic, Katarina [8082-91]SPSGrussenmeyer, Pierre [8085-07]S2Guarneri, Massimiliano [8084-22]

S6Guidi, Gabriele 8085 ProgComm

Günther, Philipp [8082-35]S8, [8082-81]S16

Guo, Pan [8085-38]SPSGurov, Igor P. 8084 ProgCommGusev, Vitalyi [8082-76]S16,

[8083-43]SPS

H

Habib, Khaled J. [8082-82]SPSHaefele, Karl-Heinz [8085-30]SPSHæggström, Edward [8082-107]

SPSHafner, Christian 8083

ProgComm, [8083-03]S1Häfner, Matthias [8082-54]S12Haist, Tobias [8082-01]S1, [8082-

67]S14Hanayama, Ryohei [8082-146]SPSHanhijärvi, Kalle [8082-107]SPSHanselaer, Peter [8082-109]SPSHarder, Irina [8082-49]S11Harendt, Bastian [8082-45]S10Häring, Reto [8083-14]S4Hashimoto, Satoru [8083-30]S7Haskamp, Klaus [8082-47]S10,

[8083-15]S4Häusler, Gerd [8082-28]S6Hausotte, Tino [8082-02]S1Hazart, Jerome [8083-18]S5Hecht, Thomas [8082-89]SPSHegna, Torunn [8082-91]SPSHeikkinen, Jussi 8085 ProgComm,

[8085-25]S6Heikkinen, Ville [8082-107]SPSHeinisch, Josef [8082-58]S12Heinze, Matthias [8082-38]S8Heitmann, Johannes [8082-89]

SPSHellmann, Christian [8083-10]S3Hemmen, Henrik [8082-73]S15Henn, Mark-Alexander [8083-05]

S2, [8083-22]S5Hennelly, Bryan M. [8082-104]SPSHenning, Thomas [8082-56]S12Hernanz, Maria Luisa [8083-41]

SPSHerzig, Hans Peter [8082-60]S12Hetzler, Jochen [8083-08]S2Hibino, Kenichi [8082-146]SPSHiguchi, Takayuki [8082-120]SPSHilbig, David [8082-56]S12Hippler, Stefan [8082-119]SPSHirano, Teruyoshi [8083-30]S7Hlubina, Petr [8082-29]S7, [8082-

115]SPSHoenniger, Christian [8082-128]

SPSHöfling, Roland 8082 ProgCommHolmes, Michael L. [8082-63]S13Holtermann, Timm [8082-103]SPSHolzapfel, Wolfgang 8083

ProgCommHomma, Hideaki [8082-62]S13Honegger, Marc [8082-34]S8Hopp, David [8082-154]SPSHoward, Helen [8084-14]S5Hrabina, Jan [8082-133]SPSHrissagis, Kostas [8084-27]SPSHsu, Wei-Te [8082-78]S16Hu, Jun [8082-92]SPS

Huang, Junhui [8085-37]SPSHübel, Alexander [8082-19]S4Hullo, Jean-François [8085-07]S2Hussmann, Stephan [8085-06]S1

I

Ibarra-Castanedo, Clemente [8084-27]SPS

Ilca, Todorut [8083-17]S4Inkilä, Keijo R. [8085-25]S6Isele, Joerg [8085-30]SPSIshii, Katsuhiro [8082-71]S15Itou, Hitoshi [8082-07]S2, [8082-

65]S13Iwanaga, Toshihide [8083-30]S7Iwanicka, Magdalena A. [8084-15]

S5Iwata, Tetsuo [8082-120]SPS

J

Jackson, J. Bianca [8084-08]S3Jacquot, Pierre M. 8082

ProgCommJäger, Gerd [8082-02]S1, [8082-

59]S12James, Ralph B. MeetingVIPJamtsho, Sonam [8085-19]S4Jang, Jiadong [8082-92]SPSJarrige, Raphaelle [8084-12]S4Javidi, Bahram [8083-31]S8Jedlicka, Petr [8082-145]SPSJena, Dibya P. [8082-70]S14Jiang, Xiangqian [8082-26]S6Joeckel, Wolfgang [8082-39]S9Johnsen, Lars [8082-30]S7Joly, Nicolas [8082-76]S16Jüptner, Werner [8082-94]SPS

K

Kaestner, Markus [8082-41]S9Kakauridze, George [8082-126]

SPSKalpoe, Dinesh S. [8085-18]S4Kang, Hoonjong [8084-19]S6Kara, Soumaya [8082-127]SPSKarray, Mayssa [8082-04]S2Kasic, Alexander [8082-89]SPSKassamakov, Ivan [8082-107]

SPSKästner, Markus [8082-47]S10,

[8083-15]S4Katkovnik, Vladimir [8082-21]S5Kato, Akiko [8083-19]S5Kemper, Björn [8082-06]S2Keppens, Arno [8082-109]SPSKessel, Alexander [8082-28]S6Ketelhut, Steffi [8082-06]S2Kheiri, Mohammad [8082-93]SPSKhoshelham, Kourosh S. [8085-

18]S4Khoudour, Louahdi [8085-13]S3Kildemo, Morten [8082-73]S15,

[8082-138]SPSKilosanidze, Barbara N. [8082-

126]SPSKim, Min-Young [8082-17]S4




Kim, Myun-Sik [8082-60]S12Klapetek, Petr [8082-133]SPSKleemann, Bernd H. 8083

ProgComm, [8083-08]S2Klude, Matthias [8082-89]SPSKniffitz, Linda [8085-03]S1Knipp, Dietmar [8082-56]S12Knoll, Florian [8085-06]S1Kogou, S. [8084-33]SPSKohler, Christian [8082-14]S3,

[8082-46]S10Kong, Weiguo [8085-36]SPSKonyakhin, Igor A. [8082-150]SPSKornis, János [8082-108]SPSKorotaev, Valery V. [8082-100]SPSKoschitzki, Robert [8085-17]S4Kossolapov, Alexander J. 8084

ProgCommKotnarowski, Grzegorz [8082-156]

SPSKoui, Maria [8084-27]SPSKoukoulas, Triantafillos [8082-72]

S15Kowarschik, Richard M. 8082

ProgComm, [8082-45]S10Kozacki, Tomasz [8083-32]S8Kozik, Serge E. [8083-09]S2Krahwinkel, Manuel [8082-128]

SPSKranitzky, Christoph [8082-28]S6Kreis, Thomas M. [8082-94]SPSKrey, Stefan [8082-158]SPSKrug, Torsten [8083-14]S4Krupinski, Martin [8082-89]SPSKrzeslowski, Jakub F. [8084-21]

S6Ku, Yi-sha [8082-18]S4, [8082-78]

S16Kück, Heinz [8082-154]SPSKuehnhold, Peter [8082-117]SPSKühmstedt, Peter [8082-38]S8,

[8084-31]SPSKuhn, Michael [8083-10]S3Kujawinska, Malgorzata

SympChair, 8082 ProgComm, [8082-44]S10, [8082-137]SPS, [8083-32]S8, [8083-33]S8, [8084-20]S6

Kulczycki, Ashley [8082-103]SPSKumar, Rajesh [8082-70]S14Kunnemeyer, Rainer [8085-05]S1Kurz, Julian F. [8083-08]S2Kwiatkowska, Ewa A. [8084-15]

S5, [8084-20]S6

L

Labaune, Julien [8084-08]S3Laeuchli, Matthias [8084-18]S6Lafait, Jacques [8084-12]S4Lahamy, Herve D. [8085-10]S2Lambelet, Patrick [8082-33]S7,

[8082-34]S8Landi, Marco [8085-04]S1Lange, Rebecca [8084-14]S5,

[8084-36]SPSLangehanenberg, Patrik [8082-58]

S12Längle, Mario [8082-19]S4Larcher, Maxime [8082-76]S16

Latifi, Hamid [8082-93]SPS, [8082-98]SPS, [8083-46]SPS

Lazar, Josef [8082-133]SPS, [8082-145]SPS

Le Floch, Sébastien [8082-153]SPS

Lee, Cheng-Chung [8082-25]S6, [8083-38]SPS

Lee, Chung-Min [8082-52]S11Lehmann, Peter H. 8082 Chr,

8082 S1 SessChr, 8082 S11 SessChr, [8082-32]S7, [8082-117]SPS

Leirset, Erlend [8082-147]SPSLesiak, Piotr [8082-136]SPSLi, Shaohui [8082-106]SPSLi, You [8085-24]S5Liang, Chao-Wen [8082-52]S11,

[8083-38]SPSLiang, Haida 8084 ProgComm,

8084 S4 SessChr, [8084-14]S5, [8084-16]S5, [8084-36]SPS

Liang, Jin [8085-35]SPSLichti, Derek D. 8085 ProgComm,

[8085-10]S2, [8085-19]S4Lima, Maurício S. [8083-39]SPSLin, Po-Chih [8082-52]S11Lindlein, Norbert [8082-49]S11Lingua, Andrea [8085-09]S2Littleton, Roy T. [8084-03]S1Liu, Peng [8085-36]SPSLiu, Qian [8082-92]SPSLiu, Shugui [8082-106]SPSLiu, Zhiqiang [8082-27]S6Ljubicic, Dean M. [8082-37]S8Llera, Miguel [8082-153]SPSLo Monaco, Angela [8084-24]SPSLocatelli, Massimiliano [8082-12]

S3, [8082-79]S3, [8083-33]S8, [8084-19]S6, [8085-34]SPS

Loffredo, Fausta [8082-157]SPSLoureiro Figaro da Costa Pinto,

Tiago [8082-46]S10Ludwig, Mario [8082-67]S14Luhmann, Thomas [8085-01]S1Lukaszewski, Dariusz [8082-137]

SPSLula, Brian MeetingVIPLunacek, Jiri [8082-115]SPSLyda, Wolfram [8082-01]S1,

[8082-03]S1, [8083-14]S4

M

Ma, Jun [8082-54]S12, [8082-125]SPS

Ma, Ke [8082-43]S9Ma, Qinhua [8085-32]SPSMaas, Hans-Gerd 8085

ProgComm, [8085-17]S4MacDonald, Lindsay W. [8085-11]

S3Macedo, Milton P. [8082-113]

SPSMachleidt, Torsten [8082-02]S1Maczkowski, Grzegorz [8084-

21]S6Madanipour, Khosro [8082-86]

SPS, [8082-135]SPS, [8085-31]SPS

Maeda, Shuichi [8083-30]S7

Makowski, Piotr [8082-140]SPSMaksymyak, Peter P. [8082-148]

SPSMaldague, Xavier P. V. [8084-27]

SPSMalesa, Marcin R. [8084-20]S6Malinovski, Igor [8082-111]SPSMallmann, Guilherme F. [8082-80]

S16Malowany, Krzysztof [8082-137]

SPS, [8084-20]S6Manferdini, Anna Maria [8085-03]

S1Manske, Eberhard 8082

ProgComm, 8082 S6 SessChr, [8082-02]S1, [8082-59]S12, [8083-11]S3

Mantel, Klaus [8082-49]S11Marabelli, Maurizio [8084-24]SPSMariotti, Paola Ilaria [8084-05]S2Martella, Christian [8082-138]SPSMartynkien, Tadeusz [8082-29]S7Marx, Steffen [8085-17]S4Matrisch, Jan [8082-23]S5Matsuoka, Ryuji [8085-29]S6Matthews, Wendy [8084-08]S3Mauch, Florian [8082-03]S1,

[8083-14]S4Maurer, Roland [8083-25]S6Mayer, V. [8082-154]SPSMeeser, Thomas [8082-05]S2Mégret, Patrice [8083-36]SPSMelchiorre Di Crescenzo, Marta

[8084-35]SPSMelessanaki, Kristalia [8084-33]

SPSMelis, Marcello [8084-11]S4Melozzi, Mauro [8082-90]SPSMemmolo, Pasquale [8082-08]S2,

[8083-31]S8Menegotto, Thiago [8083-39]SPSMenna, Fabio [8085-15]S3, [8085-

20]S5Menner, Philipp [8082-75]S16Menu, Michel [8084-08]S3, [8084-

12]S4Mergo, Pawel [8082-29]S7Meucci, Riccardo [8082-12]S3,

[8082-79]S3, [8083-33]S8, [8084-19]S6, [8085-34]SPS

Mezzapesa, Francesco P. [8082-159]SPS

Miccoli, Matteo [8084-11]S4Micó, Vicente [8082-09]S3, [8082-

16]S4, [8082-24]S5Migukin, Artem S. [8082-21]S5Mikel, Bretislav [8082-145]SPSMikolajick, Thomas [8082-89]SPSMiks, Antonin [8082-134]SPS,

[8083-42]SPSMiliani, Costanza [8084-02]S1Mills, Jon P. 8085 ProgCommMinarini, Carla [8082-157]SPSMinhas, Babar K. [8083-12]S3Miyamoto, Yoko [8082-07]S2,

[8082-65]S13Mizutani, Yasuhiro [8082-120]

SPS, [8083-30]S7Mnerie, Corina [8083-45]SPSMoeller, Franz [8084-31]SPSMoeyaert, Véronique [8083-36]

SPS

Mohammadi, Fatemeh [8085-31]SPS

Molesini, Giuseppe [8082-90]SPSMontagna, Jardel [8082-36]S8Monteil, Guy [8082-122]SPSMontgomery, Paul C. [8082-36]S8Moore, Andrew J. 8082

ProgCommMora-González, Miguel [8082-141]

SPS, [8083-24]S6Moreno, Pablo [8084-26]SPSMoriya, Gentaro [8085-02]S1Mounier, Denis [8082-76]S16,

[8083-43]SPSMourou, Gérard A. [8084-08]S3Mousavian, Ali [8082-98]SPSMuhamedsalih, Hussam [8082-

26]S6Mühlig, Christian [8082-77]S16,

[8082-116]SPSMüller, Andreas [8082-59]S12Muñoz-Maciel, Jesús [8082-141]

SPS, [8083-24]S6Murakami, Hiroshi [8082-95]SPS

N

Nadal, Maria E. [8082-109]SPSNaik, Dinesh N. [8082-07]S2,

[8082-65]S13Nakamura, Sohichiro [8082-71]

S15Nakayama, Shigeru [8082-62]S13Nenna, Giuseppe [8082-157]SPSNerbø, Ingar Stian [8082-138]SPSNercissian, Vanusch [8082-49]S11Neumann, Florian [8082-103]SPSNex, Francesco [8085-09]S2Ni, Guoqiang [8085-36]SPS,

[8085-38]SPSNicolov, Mirela [8083-17]S4Niehues, Jan [8082-32]S7, [8082-

117]SPSNikitov, Sergei A. [8083-04]S1Nilsen, Elisabeth [8082-73]S15Nocerino, Erica [8085-20]S5Noiré, Paul [8082-76]S16Nori, Sudabe [8082-93]SPSNotni, Gunther 8082 ProgComm,

8082 S10 SessChr, [8082-38]S8, [8082-53]S12, [8084-31]SPS

Nouri Jouybari, Soodabeh [8083-46]SPS

Novak, Jiri [8082-134]SPS, [8083-42]SPS

Novak, Pavel [8082-134]SPS, [8083-42]SPS

Nuvoli, Marcello [8084-22]S6

O

Obata, Kotaro [8083-21]S5Ohlendieck, Jens [8082-128]SPSOhno, Yoshi [8082-109]SPSOhrt, Christoph [8082-41]S9Oleari, Claudio [8084-23]SPSOnural, Levent [8084-19]S6Orband, Daniel [8082-139]SPSOrphanos, Yiannis [8084-33]SPS




Osten, Wolfgang SympChair, 8082 CoChr, 8082 S5 SessChr, 8082 S1 SessChr, [8082-01]S1, [8082-03]S1, [8082-13]S3, [8082-51]S11, [8082-54]S12, [8082-67]S14, [8082-125]SPS, [8082-154]SPS, 8083 ProgComm, [8083-01]S1, [8083-02]S1, [8083-21]S5, [8083-40]SPS

Otani, Yukitoshi [8082-120]SPSOteo, Esther [8082-97]SPSOtto, Eric [8084-31]SPSOu, Jianliang [8085-32]SPSOujja, Mohamed [8084-26]SPS,

[8084-30]SPSOulehla, Jindrich [8082-145]SPSOvsianikov, Aleksandr [8083-21]

S5

P

Paa, Wolfgang [8082-77]S16, [8082-116]SPS

Pakula, Anna [8082-160]SPSPandey, Nitesh [8082-104]SPSPannhoff, Helge [8082-58]S12Paoletti, Alfonso [8084-27]SPSPaoletti, Domenica [8084-05]S2,

[8084-27]SPSPaolillo, Alfredo [8085-04]S1Papadakis, Vassilis M. [8084-33]

SPSParks, Robert [8082-149]SPSPaturzo, Melania [8082-08]S2,

[8082-12]S3, [8083-31]S8, [8083-33]S8, [8084-19]S6, [8085-34]SPS

Payne, Andrew D. [8085-05]S1, [8085-12]S3

Pedrini, Giancarlo [8082-13]S3, [8082-125]SPS

Pelagotti, Anna [8082-12]S3, [8083-31]S8, [8083-33]S8, [8084-19]S6, [8084-32]SPS, [8085-21]S5, [8085-34]SPS

Pelosi, Claudia [8084-24]SPSPeña-Lecona, Francisco G. [8082-

141]SPS, [8083-24]S6Percino-Zacarías, Maria-

Elizabteh [8083-37]S6Pérez-Ortega, Sergio [8084-30]

SPSPernehcele, Claudio [8084-32]SPSPerova, Tatiana S. [8083-51]S8Perrie, Walter [8082-79]S3Peterhänsel, Sandy [8083-21]S5Peterka, Pavel [8082-80]S16Pettersson, Hans [8082-91]SPSPezzati, Luca 8084 Chr, 8084 SKS

SessChr, [8084-04]S1, [8084-05]S2

Pfeifer, Norbert 8085 ProgCommPfister, Thorsten [8082-35]S8,

[8082-81]S16Picart, Pascal [8082-04]S2, [8083-

43]SPSPicchio, Rodolfo [8084-24]SPSPicchioni, Francesco [8085-21]S5Picollo, Marcello [8084-07]S2Piegari, Angela M. [8084-23]SPS

Pizarro, Carles [8082-97]SPSPlattner, Markus [8082-142]SPSPlumey, Jean-Pierre [8083-23]S5Poczesny, Tomasz [8082-136]

SPS, [8082-140]SPSPodobedov, Vyacheslav B. [8082-

109]SPSPoggesi, Marco [8084-07]S2Poggi, Pasquale [8082-12]S3,

[8083-33]S8, [8084-19]S6, [8085-34]SPS

Poitevin, Valentin [8085-07]S2Poletto, Luca [8084-06]S2, [8084-

17]S5Pomplun, Jan [8083-07]S2, [8083-

08]S2, [8083-48]SPSPons, Alicia A. [8083-41]SPSPouli, Paraskevi [8084-33]SPSPourbeyram, Hamed [8082-93]

SPSPozhar, Vitold E. [8082-110]SPSPrivitera, Christian M. [8084-25]

SPSProkopczuk, Krzysztof [8082-136]

SPS, [8082-140]SPSPruss, Christof [8082-54]S12,

[8082-154]SPSPrzibilla, Sabine [8082-06]S2Putzer, Philipp [8082-142]SPS

Q

Qin, Jing [8083-06]S2Qiu, Zongjia [8085-36]SPS

R

R. Vázquez de Aldana, Javier [8084-26]SPS

Rabal, Ana [8083-41]SPSRaele, Marcus P. [8082-111]SPSRäikkönen, Heikki [8082-107]SPSRamotowski, Zbigniew J. [8082-

144]SPSRascher, Rolf [8083-25]S6Rathsfeld, Andreas 8083

ProgCommRatti, Filippo [8084-06]S2, [8084-

17]S5Rebollo San Miguel, Elena [8084-

06]S2Reiner, Jacek [8082-156]SPSReithmeier, Eduard 8082

ProgComm, [8082-41]S9, [8082-47]S10, [8083-15]S4

Rembe, Christian [8082-67]S14Remondino, Fabio 8085 Chr, 8085

S2 SessChr, 8085 S4 SessChr, 8085 S6 SessChr, [8085-09]S2, [8085-14]S3, [8085-15]S3

Reutlinger, Arnd [8082-142]SPSRezaie, Amir H. [8085-31]SPSRicci, Roberto [8084-22]S6Ricciardi, Paola [8084-03]S1Richard, Mervin [8084-03]S1Riedel, Mathias [8082-13]S3Riesz, Ferenc [8082-88]SPSRinaudo, Fulvio [8085-09]S2Rincon Bohorquez, Oscar J.

[8082-123]SPS

Robson, Stuart 8085 ProgComm, [8085-11]S3

Rodríguez-Jiménez, Silvia [8082-64]S13

Romani, Aldo [8084-02]S1Romero, Carolina [8084-26]SPSRoncella, Riccardo [8085-14]S3Rosenboom, Lars [8082-94]SPSRosendahl, Sara [8082-11]S3Rosenkranz, Norbert [8082-19]S4Rostami, Yadollah [8082-151]SPSRoyo, Santiago [8082-68]S14Rozwadowski, Krzysztof [8082-

136]SPSRuichek, Yassine [8085-13]S3

S

Sadeghi, Jalal [8082-93]SPSSalas-Sanchez, Alfonson [8083-

37]S6Salbut, Leszek A. [8082-137]SPS,

[8082-144]SPS, [8082-160]SPSSalehpoor, Fahimeh [8083-46]SPSSalimbeni, Renzo 8084 ChrSalimi Meidanshahi, Fatemeh

[8082-86]SPSSalmane, Houssam [8085-13]S3Salvadé, Yves [8082-153]SPS,

[8083-16]S4Sametoglu, Ferhat [8082-85]SPSSanz, Mikel [8084-30]SPSSarrazy, Fanny [8083-18]S5Sato, Yuki [8082-71]S15Saunders, David R. 8084

ProgCommScaioni, Marco [8085-14]S3Schacht, Gregor [8085-17]S4Schaffer, Martin [8082-45]S10Scharf, Toralf [8082-60]S12Schau, Philipp [8083-01]S1,

[8083-02]S1Scheruebl, Thomas 8083

ProgCommSchiavone, Patrick 8083

ProgCommSchick, Anton [8082-42]S9Schinköthe, W. [8082-154]SPSSchirripa Spagnolo, Giuseppe

[8084-10]S4, [8084-28]SPSSchlichthaber, Frank [8082-06]S2Schmidl, Gabriele [8082-116]SPSSchmidt, Frank [8083-07]S2,

[8083-08]S2, [8083-48]SPSSchmidt, Ingo [8082-38]S8, [8084-

31]SPSSchmitt, Robert 8082 ProgComm,

[8082-80]S16Schneider, Danilo [8085-17]S4Schneider, Dorian [8082-103]SPSSchneider, Florian [8083-25]S6Scholze, Frank [8083-19]S5Schrader, Christian [8082-20]S4Schulz, Michael 8082 S12

SessChr, [8082-39]S9, [8082-48]S11

Schulze, Marc [8085-23]S5Schweitzer, Hagen [8083-10]S3Schweizer, Heinz C. [8083-01]S1,

[8083-02]S1Scrascia, Silvia [8084-35]SPS

Scully, Patricia [8082-79]S3Seewig, Jörg 8082 ProgComm,

[8082-31]S7Séfel, Richárd [8082-108]SPSSeidel, Dirk [8082-19]S4Seitz, Peter M. 8082 ProgCommSetija, Irwan 8083 ProgCommSeybold, J. [8082-154]SPSSfarra, Stefano [8084-27]SPSShakher, Chandra [8082-15]S3,

[8082-70]S14Shams El-Din, Mamdouh A. [8082-

83]SPS, [8082-84]SPSSharma, Shobhna [8082-15]S3Sheoran, Gyanendra [8082-15]S3Shokri, Babak [8082-86]SPSShortis, Mark R. 8085 Chr, 8085

S5 SessChr, 8085 S3 SessChr, 8085 S1 SessChr

Silver, Richard M. 8083 CoChr, [8083-06]S2

Simioni, Emanuele [8084-17]S5Simoëns, Serge [8082-127]SPSSimonetti, Carla [8084-28]SPSSimonsen, Ove [8082-30]S7Singh, Rakesh K. [8082-07]S2,

[8082-65]S13Sitnik, Robert 8082 S9 SessChr,

[8082-44]S10, [8084-21]S6Situ, Guohai [8082-13]S3Sjödahl, Mikael [8082-11]S3Slangen, Pierre R. L. 8082 S3

SessChr, [8082-04]S2Smid, Radek [8082-145]SPSSmigiel, Eddie [8085-07]S2Smirnov, Andrei G. [8083-09]S2Sordini, Andrea [8082-90]SPSSperanza, Mariela [8084-30]SPSSperber, Peter [8083-25]S6SPIE, Proceedings of [8082-00]SSpooner, Jane [8084-14]S5Stankiewicz, Maciej [8082-156]

SPSStavridis, Manuel [8082-39]S9Stefani, Lorenzo [8084-07]S2Steinbichler, Marcus 8082

ProgCommSternberg, Harald [8082-128]SPSSterns, Frank [8082-154]SPSStockmann, Michael [8082-42]S9Stoppa, David 8085 ProgCommStork, Wilhelm [8082-67]S14Stoykova, Elena V. [8084-19]S6Styk, Adam R. [8082-69]S14Su, Peng [8082-149]SPSSun, Zhengshan [8083-28]S6Suzuki, Hideo [8085-22]S5Sykora, Daniel [8082-63]S13Sylwestrzak, Marcin [8084-15]S5Syrota, Olga O. [8082-122]SPSSytchkova, Anna [8084-23]SPSSzantho, Lucian [8083-17]S4

T

Takahashi, Genki [8085-29]S6Takeda, Mitsuo 8082 ProgComm,

8082 S7 SessChr, [8082-07]S2, [8082-27]S6, [8082-65]S13

Taminiau, Guus 8082 S11 SessChr




Taranu, Anca [8082-79]S3Tarbeyevskaya, Alena [8082-67]

S14Tarelho, Luiz V. G. [8082-111]

SPSTargowski, Piotr 8084

ProgComm, [8084-15]S5, [8084-20]S6

Tavassoly, Mohammad T. [8082-135]SPS

Tedaldi, Matthew [8082-72]S15Tekdal-Emniyeti, Esra [8085-30]

SPSTeutsch, Christian [8085-08]S2Theobald, Pete D. [8082-72]S15Theodorakeas, Panagiotis [8084-

27]SPSThoury, Mathieu [8084-03]S1Timofeev, Alexandr N. [8082-150]

SPSTisseur, David [8082-76]S16Toba, Hidemitsu [8082-62]S13Tolmachev, Vladimir [8083-51]S8Tornari, Vivi 8084 S5 SessChr,

8084 ProgComm, [8084-18]S6Torres Garcia, Yaneth M. [8082-

123]SPSTotzeck, Michael 8083 ProgCommTowers, Catherine E. 8082 S14

SessChr, 8082 S15 SessChr, [8082-61]S13

Troisi, Salvatore [8085-20]S5Trostmann, Erik [8085-08]S2Tsiranidou, Elsa [8084-18]S6Turunen, Jari 8083 ProgCommTutsch, Rainer [8082-20]S4Tyminska-Widmer, Ludmila [8084-

20]S6

U

Uccheddu, Francesca [8085-21]S5

Uchikawa, Kiyoshi [8082-27]S6, [8082-62]S13

Urbanczyk, Waclaw [8082-29]S7Usik, Alexandr A. [8082-150]SPS

V

Vannoni, Maurizio [8082-90]SPSVeiga, Celso L. [8082-40]S9Vellekoop, Michael J. [8082-124]

SPS, [8083-29]S7Venres, András [8082-124]SPS,

[8083-29]S7Vilela de Faria, Giancarlo [8082-

118]SPSVillani, Fulvia [8082-157]SPSViotti, Matias R. [8082-14]S3Vogel, Markus [8082-28]S6Vogt, Christian [8083-25]S6Vollertsen, Frank [8082-84]SPSVollmer, Angelika [8082-06]S2von Bally, Gert [8082-06]S2von der Weid, Jean P. [8082-111]

SPS, [8082-118]SPSvon Kopylow, Christoph [8082-05]

S2, [8082-22]S5Vorlaufer, Georg [8082-124]SPS

W

Wahba, Hamdy H. [8082-83]SPS, [8082-84]SPS

Wakutsu, Ryuta [8085-28]S6Wälchli, Ben [8082-107]SPSWalker, Gillian C. [8084-08]S3Wang, Lirong [8082-149]SPSWang, Yuzhao [8085-36]SPSWang, Zhao [8085-37]SPSWarber, Michael [8082-67]S14Wattellier, Benoit F. [8082-50]S11Wengert, Nicolai [8083-40]SPSWengierow, Michal [8082-144]

SPSWenisch, Oliver [8085-27]S6Wernicke, Guenther [8082-23]S5Wette, Sebastian [8082-23]S5Wibbing, D. [8082-154]SPSWilke, Marc [8082-13]S3Willneff, Jochen [8085-27]S6Wu, Kai [8082-25]S6Wuilpart, Marc [8083-36]SPSWurm, Matthias [8083-05]S2Wyrowski, Frank 8083

ProgComm, [8083-10]S3

X

Xu, Jia [8082-119]SPSXu, Jixian [8085-38]SPS

Y

Yamamoto, Manabu [8083-44]SPS

Yang, Pengqian [8082-119]SPSYang, Weichuan [8082-92]SPSYang, Zheng [8082-28]S6Yao, Bing [8082-92]SPSYaras, Fahri [8084-19]S6Yashchuk, Vasil P. [8082-122]SPSYöntem, Ali Özgür [8084-19]S6Yoshida, Shuhei [8083-44]SPSYu, Qifeng [8085-24]S5, [8085-32]

SPSYu, Yingjie [8082-121]SPSYuan, Caojin [8082-54]S12, [8082-

125]SPSYuan, Yun [8085-32]SPSYüksel, Kivilcim [8083-36]SPS

Z

Zabit, Usman [8082-68]S14Zalevsky, Zeev 8082 S2 SessChr,

[8082-09]S3, [8082-16]S4, [8082-24]S5

Zaperty, Weronika [8083-32]S8Zeh, Thomas [8082-142]SPSZeibel, Jason G. [8084-03]S1Zendri, Elisabetta [8084-35]SPSZeuner, Thomas [8082-116]SPSZhang, Hongwei [8082-106]SPSZhang, Nien-Fan [8083-06]S2Zhang, Qican [8082-43]S9Zhang, Qunxi [8084-36]SPSZhang, Xiaohu [8085-32]SPSZhang, Yinchao [8085-36]SPS,

[8085-38]SPSZhao, Li [8082-121]SPSZharova, Julia A. [8083-51]S8Zhelem, Ross [8083-35]SPSZheng, Shunyi [8085-33]SPSZhou, Hui [8083-06]S2Zhou, Langming [8085-33]SPSZhu, Jianqiang [8082-119]SPSZhu, Rihong [8082-54]S12Zhu, Xianwei [8085-32]SPSZhu, Zhaokun [8085-32]SPSZhukov, Dmitry V. [8082-150]SPSZibaii, Mohammad [8082-93]SPSZong, Yuqin [8082-109]SPS




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8082 Optical Measurement systems for industrial inspection Vii . . . . . . . . . . . . . . . €120 ($160)

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8083 Modeling Aspects in Optical Metrology iii . . €52 ($70) (b. bodermann)

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European Conference on Optical Metrology · www.spie.org/omprogramme4

Location The Square Conference Centre brussels, belgium

conference dates 16–20 April 2012

www.spie.org/photonicseurope

Advances in applications of photonics, optics, lasers, and micro/nanotechnologies

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Photonics2012

16-20 April 2012

Call for Papers online in June 2011


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