effect of surface preparation of copper on self-assembly

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Effect of Surface Preparation of Copper on Self-Assembly of Fullerene Molecules Dongni Ma, Selene Sandoval, Krishna Muralidharan, Srini Raghavan University of Arizona Department of Materials Science and Engineering Department of Chemical and Environmental Engineering

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Page 1: Effect of Surface Preparation of Copper on Self-Assembly

Effect of Surface Preparation of Copper on Self-Assembly of Fullerene Molecules

Dongni Ma, Selene Sandoval, Krishna Muralidharan, Srini Raghavan

University of Arizona

Department of Materials Science and Engineering Department of Chemical and Environmental Engineering

Page 2: Effect of Surface Preparation of Copper on Self-Assembly

Objective

• Effect of surface preparation of copper on: Substrate mediated controllable self-assembly of fullerene rods

C60 buckyball C60 nano-rods

Ultimately enable high-aspect ratio molecular C60 wires as interconnects

Page 3: Effect of Surface Preparation of Copper on Self-Assembly

Background:

Conventional Methods for Fullerene Nanostructures

Template based self-assembly: longer processing time, expensive and broken nanotubes obtained—Porous alumina template to be infiltrated by fullerene solution.

Conventional synthesis techniques

Liquid-Liquid Interfacial Precipitation (LLIP): time consuming (a few hours - two weeks)—no substrate needed.

Page 4: Effect of Surface Preparation of Copper on Self-Assembly

Background: Surface mediated synthesis

Directed Air Stream: leads to fullerene rods

Self-assemblies size:

Length: ~2 µm

Width: ~500-700 nm

C60 dissolved in Toluene

2 psig

Page 5: Effect of Surface Preparation of Copper on Self-Assembly

Current Method: Spin coating based substrate mediated route

Substrates Solution Spin coating procedure Spin coating RPM

Cold rolled Cu

Fullerene dispersed in

Toluene (2mg/ml)

Repeated 1-4 procedure for total of 4 times.

200-500 RPMAnnealed Cu

Electropolished Cu

Graphene coated Cu

Overall processing

time: < 10 minutes

for one substrate of

size 𝟏 𝒄𝒎𝟐. 1) Dispense

2) Waiting

time

3) Ramp-up

spreading

4) 30 seconds

RPM. Drying

2. Wait for 1 minute.3. Spin substrate at a predetermined RPM.4. Spin for 30 seconds.

1. Dispense solution.

Page 6: Effect of Surface Preparation of Copper on Self-Assembly

Substrate Preparation

Cold rolled Cu (Contact angle of 72°)

Annealed Cu (Contact angle of 64°)

Graphene on Cu(Contact angle of 80°)

Electropolished Cu(Contact angle of 72°)

Organic impurities removal: IPA rinsed, DI water rinsed, and blown dry with nitrogen.

Annealed in a tube furnace (Lindberg Blue M) for 2 hours at 1050°C.

Graphene on Cu via chemical vapor deposition (CVD).

Acetic acid treatment:1) Immersed in 2M acetic acid solution at 60°C for 10 min. 2) DI water rinsed and blown dry with nitrogen.

Electropolishing procedure shown on next slide.

Copper foil (0.25 mm thick, 99.99% metals basis, Alfa Aesar Puratronic®)

Page 7: Effect of Surface Preparation of Copper on Self-Assembly

Preparation of Substrates: Electropolishing Procedure

Solution: 85% phosphoric acid.

Applied a constant potential of 1.5 V vs. SCE for 1 hour.

0 10 20 30 40 50 600

20

40

60

80

100

OCP:0.018 V

Three-electrode system

Working electrode: Cu

Counter electrode: Pt foil

Reference electrode: SCE (sat'd KCl)

Cu (250 m thickness)

Cu

rre

nt

de

nsity (

mA

/cm

2)

Time (min)

Page 8: Effect of Surface Preparation of Copper on Self-Assembly

Graphene grown via chemical vapor deposition (CVD)

CVD grown graphene shows characteristic ripple structure.

Raman

G

2D

CVD conditions: Pressure of 200 mTorrTemperature of 1050°C100 sccm Argon60 sccm Hydrogen20 sccm Methane

Page 9: Effect of Surface Preparation of Copper on Self-Assembly

SURFACE CHARACTERIZATION

Page 10: Effect of Surface Preparation of Copper on Self-Assembly

Cold rolled Cu (surface roughness rms : 15.5nm)

Electropolished Cu (surface roughness rms: 4.7nm)

Surface Roughness of

Cold Rolled Cu and Electropolished Cu

an AFM Analysis

Page 11: Effect of Surface Preparation of Copper on Self-Assembly

Surface Roughness of

Annealed Cu and Graphene Coated Cu

an AFM Analysis

Graphene Coated Cu (surface roughness rms: 41.5nm)

Annealed Cu (surface roughness rms: 53.3nm)

Page 12: Effect of Surface Preparation of Copper on Self-Assembly

Results and discussion

Substrates Solution

Cold rolled Cu

Fullerene dispersed in Toluene

(2mg/ml)

Annealed Cu

Electropolished Cu

Graphene coated Cu

Page 13: Effect of Surface Preparation of Copper on Self-Assembly

Uniform distribution of Rod-like C60 Self-Assemblies on

Cold Rolled Cu Substrate

Good control over size

and morphology of

fullerene rods at lower

rpm (next slide). Average length of fullerene self-assemblies (FSA) at 200 rpm: ~5 µm.

Page 14: Effect of Surface Preparation of Copper on Self-Assembly

Size Analysis : Projected Area and Length Distributions

of C60 rods on Cold Rolled Cu Substrate

0

0.02

0.04

0.06

0.08

0.1

0.12

0 100 200 300 400 500

Pro

bab

ilit

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ensi

ty

Area of nanorods (µm2)

Projected Area

0

0.005

0.01

0.015

0.02

0.025

0.03

0 100 200 300 400 500

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Area of nanorods (µm2)

0

0.05

0.1

0.15

0.2

0.25

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ty

Length of nanorods (µm)

Length

0

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0.06

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0.08

0 10 20 30 40

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Length of nanorods (µm)

200 rpm 200 rpm

500 rpm 500 rpm

Best distribution of rods at 200 rpm.

Average length of fullerene self-assemblies at 200 rpm is ~5 µm.

Page 15: Effect of Surface Preparation of Copper on Self-Assembly

Results and discussions

Substrates Solution

Cold rolled Cu

Fullerene dispersed in Toluene

(2mg/ml)Annealed Cu

Electropolished Cu

Graphene coated Cu

Page 16: Effect of Surface Preparation of Copper on Self-Assembly

C60 Self-Assemblies on Annealed Cu Substrate:

larger variations in size and morphology

Less control over size and

morphology of fullerene rods at lower rpm.

Average length of FSA is ~5 µm.

Page 17: Effect of Surface Preparation of Copper on Self-Assembly

0

0.005

0.01

0.015

0.02

0 50 100 150 200 250

Pro

bab

ilit

y D

ensi

ty

Area of nanorods (µm2)

Projected Area

0

0.02

0.04

0.06

0.08

0.1

0.12

0 50 100 150 200 250

Pro

bab

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ty

Area of nanorods (µm2)

200 rpm

0

0.01

0.02

0.03

0.04

0.05

0.06

0.07

0 10 20 30 40P

rob

abil

ity D

ensi

tyLength of nanorods (µm)

Length

0

0.05

0.1

0.15

0.2

0.25

0 10 20 30 40

Pro

bab

ilit

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ensi

ty

Length of nanorods (µm)

200 rpm

Size Analysis: Projected Area and Length Distribution of

C60 self-assemblies on Annealed Cu Substrate

500 rpm 500 rpm

Poor distribution at low and high spinning speeds.

Average length of 5 µm and projected area of 18 µm2 at 200 rpm.

Page 18: Effect of Surface Preparation of Copper on Self-Assembly

Results and discussions

Substrates Solution

Cold rolled Cu

Fullerene dispersed in Toluene

(2mg/ml)

Annealed Cu

Graphene coated Cu

Electropolished Cu

Page 19: Effect of Surface Preparation of Copper on Self-Assembly

C60 rods on Graphene Coated Cu Substrate:

Two distinct morphologies

Good control over distribution

and morphology of fullerene

nanorods at 200 rpm. average length ~ 5 µm.

Page 20: Effect of Surface Preparation of Copper on Self-Assembly

0

0.02

0.04

0.06

0.08

0.1

0.12

0.14

0 10 20

Pro

bab

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ensi

ty

Length (µm)

0

0.01

0.02

0.03

0.04

0.05

0.06

0 20 40

Pro

bab

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ensi

ty

Area of nanorods (µm2)

Size distribution of larger rods: Projected Area and Length

Distribution on Graphene Coated Cu Substrate

Projected area of 10 µm2 with length of 5 µm.

200 rpm200 rpm

Projected Area Length

Page 21: Effect of Surface Preparation of Copper on Self-Assembly

Results and discussions

Substrates Solution

Cold rolled Cu

Fullerene dispersed in Toluene

(2mg/ml)Annealed Cu

Graphene coated Cu

Electropolished Cu

Page 22: Effect of Surface Preparation of Copper on Self-Assembly

Highly controllable synthesis of C60 rods on

Electropolished Cu Substrate

Excellent control over size

and morphology of fullerene nanorods at lower rpm.

Length of rod : ~10 µm

Page 23: Effect of Surface Preparation of Copper on Self-Assembly

C60 rods on Electropolished Cu (200 rpm)

by AFM Analysis

Length of nanorods is ~14 µm with diameter of ~1.5 µm.

Page 24: Effect of Surface Preparation of Copper on Self-Assembly

Size analysis: Projected Area and Length Distribution of rods on

Electropolished Cu Substrate

0

0.001

0.002

0.003

0.004

0.005

0.006

0.007

0 100 200 300 400 500

Pro

bab

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ensi

ty

Area of nanorods (µm2)

Projected Area

0

0.01

0.02

0.03

0.04

0.05

0.06

0 100 200 300 400 500

Pro

bab

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ensi

ty

Area of nanorods (µm2)

500 rpm

0

0.01

0.02

0.03

0.04

0.05

0.06

0 100 200 300

Pro

bab

ilit

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ensi

ty

Length of nanorods (µm)

Length

200 rpm

0

0.05

0.1

0.15

0.2

0 100 200 300Pro

bab

ilit

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ensi

ty

Length of nanorods (µm)

500 rpm

200 rpm

Best distribution and morphology of rods at 200 rpm.

Length of fullerene self-assemblies is ~10 µm.

Page 25: Effect of Surface Preparation of Copper on Self-Assembly

Distinct Nanowire bundles in areas without C60 rods on electropolished Cu

C60 self-assemblies on electropolished Cu (200 rpm).

C60 rods

Page 26: Effect of Surface Preparation of Copper on Self-Assembly

In contrast,

No well-defined nanowires in Graphene Coated Cu (200 rpm)

Areas without nanorods are not well defined as one on EP Cu substrate.

Page 27: Effect of Surface Preparation of Copper on Self-Assembly

Discussion• It has been shown from DFT calculations that surface defects on Cu as well as

graphene corrugations serve as strong adsorption sites for C60 molecules

• Well defined adsorption sites on electropolished Cu and graphene on Cu lead to more control on size, shape, morphology of C60 rods

• Bigger rods are formed via nucleation and growth during the waiting time of 1 minute prior to ramp-up spreading

• The nanowires are formed after the ramp-up as a result of ‘coalescence’ between the remaining C60 molecules

• The coalescence is initiated due to C60-C60 interaction arising as a result of spinning

• The presence of intrinsic surface defects on annealed and cold-rolled Cu leads to less control of C60 morphology

Page 28: Effect of Surface Preparation of Copper on Self-Assembly

Conclusions and Future Outlook

• A simple, wet-chemistry based spin-coating method developed for obtaining c60 rods and nanowires in a controllable fashion

• The size, shape and morphology of the C60 structures are intimately linked to the substrate on which they are formed.

• The developed method provides a new avenue to achieve high aspect ratio C60 molecular wires based interconnects as well as devices with tunable electrical properties (see next slide)

Page 29: Effect of Surface Preparation of Copper on Self-Assembly

C60 milli-rods: electrical conductivity

Polycarbonate Glass

Electrical conductivity of millimeter long C60 rods (aspect ratio = 10:1) formed from CS2 solution within a glass/polycarbonate vial

16

60

1

)(10

)(1.0

cm

cm

filmC

rod

ITO

C60 rod

Silica substrate