erd and memory architectures paul franzon department of electrical and computer engineering...

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ERD and Memory ERD and Memory Architectures Architectures Paul Franzon Department of Electrical and Computer Engineering [email protected] 919.515.7351

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Page 1: ERD and Memory Architectures Paul Franzon Department of Electrical and Computer Engineering paulf@ncsu.edu 919.515.7351

ERD and Memory ArchitecturesERD and Memory Architectures

Paul Franzon

Department of Electrical and Computer Engineering

[email protected]

919.515.7351

Page 2: ERD and Memory Architectures Paul Franzon Department of Electrical and Computer Engineering paulf@ncsu.edu 919.515.7351

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High Level OverviewHigh Level OverviewChallenges for Memories

Power consumption Bandwidth Resiliency Scaling (density, speed, power)

Opportunities Increased use of memory in logic and routing Using ERD devices to help ERD memories scale Intersection with 3DIC

Impact on Memory Architectures Scope for new and more specialized memory

architectures Mobile; (Cloud) Computing; SSD; Structured ASIC;

Page 3: ERD and Memory Architectures Paul Franzon Department of Electrical and Computer Engineering paulf@ncsu.edu 919.515.7351

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Challenge: BandwidthChallenge: Bandwidth

Soon to exceed 1 TBps Key challenge: Power: DDR3 would consume

600 W at this bandwidth

Page 4: ERD and Memory Architectures Paul Franzon Department of Electrical and Computer Engineering paulf@ncsu.edu 919.515.7351

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Challenge: Power ConsumptionChallenge: Power Consumption Memory hierarchy is becoming the largest single

consumer of the power in a computer Consumes 30%+ of power in today’s servers E.g. DARPA Exascale computing study

Note: This assumed DRAM power was reduced from 600 pJ/bit to 3 pJ/bit

Page 5: ERD and Memory Architectures Paul Franzon Department of Electrical and Computer Engineering paulf@ncsu.edu 919.515.7351

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Challenge: ResiliencyChallenge: Resiliency

Issues: SEU of SRAM Checkpointing and resiliency of entire processor Future scaled systems could spend 80% of their time

checkpointing

Note: DRAM Failures almost all due to packaging

Page 6: ERD and Memory Architectures Paul Franzon Department of Electrical and Computer Engineering paulf@ncsu.edu 919.515.7351

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Opportunity: PowerOpportunity: Power

Reduced capacitance associated with scalable 4F2 ERD memory technologies

Change RAM architecture Smaller sub-arrays Less

energy/access Low-swing interconnect Reduced overhead

Revisit memory hierarchy to optimize energy, not latency

Exploit 3DIC for energy reduction

Page 7: ERD and Memory Architectures Paul Franzon Department of Electrical and Computer Engineering paulf@ncsu.edu 919.515.7351

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Challenge: ScalingChallenge: Scaling

Scaling Peripheral Circuits

Smaller memory sub-arrays increases overhead of sense amps and row/column decoders

4F2 cells increases overhead of sense amps and row/column decoders

Need: Technologies and techniques to reduce overhead of

peripheral circuits Circuit Solutions Use of ERDs Use of 3DIC to implement peripheral circuits in a circuit-

optimized technology

Page 8: ERD and Memory Architectures Paul Franzon Department of Electrical and Computer Engineering paulf@ncsu.edu 919.515.7351

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Challenge: ScalingChallenge: Scaling

1R1D cells needed for resistive memories to ensure scalability (1R cells limits array size)

Impact of rectification ratio on scalability with 1R1D cell

On

:Off

Rat

io

Rectifcation

Memory Size

Page 9: ERD and Memory Architectures Paul Franzon Department of Electrical and Computer Engineering paulf@ncsu.edu 919.515.7351

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Opportunity: Memory as Logic Opportunity: Memory as Logic

4F2 programmable ERD memory cells permit high density Look Up Tables and programmable logic Nanocrossbar CMOL

Potential for high-speed (low C) and high density Need to compare to logic ITRS to establish benchmark

Page 10: ERD and Memory Architectures Paul Franzon Department of Electrical and Computer Engineering paulf@ncsu.edu 919.515.7351

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Opportunity: Memory as InterconnectOpportunity: Memory as Interconnect

Use programmable persistent memory elements as routable switchbox interconnect

Use high-density, low-overhead memory in NOC store/forward routing architectures

Example: Using a low-voltage nanocrystal flash device as an interconnect switch

Page 11: ERD and Memory Architectures Paul Franzon Department of Electrical and Computer Engineering paulf@ncsu.edu 919.515.7351

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Other CommentsOther Comments

ERD as a Solid State Disk? Definitely an opportunity but it looks like magnetic disk

will always outscale solid state disk in density and cost/bit.

Instead use inside memory hierarchy, e.g. Disk cache, checkpoint store

ERD as Associative Memory, Bayesian inference calculator, etc.? Some ERD have analog behaviors that have yet to be

exploited or explored E.g. Memristor, Memcapacitor, Meminductor

Page 12: ERD and Memory Architectures Paul Franzon Department of Electrical and Computer Engineering paulf@ncsu.edu 919.515.7351

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Other CommentsOther Comments

Memory in Logic 3DIC and 4F2 memory cells permits memory-heavy

architectures to be revisited But energy/bit-accessed has to better than

energy/FLOP for computation Real need are algorithms that increase spatial locality

Page 13: ERD and Memory Architectures Paul Franzon Department of Electrical and Computer Engineering paulf@ncsu.edu 919.515.7351

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Outline of ERD ChapterOutline of ERD Chapter

Memory Challenges Table with metrics

Solution paths to these challenges Table with metrics

New Opportunities for ERD Architectural and circuit opportunities Review of current memory enhanced architectures???

Nanocrossbar, CMOL, Synaptic

Tables, largely qualitative, somewhat quantitative

Page 14: ERD and Memory Architectures Paul Franzon Department of Electrical and Computer Engineering paulf@ncsu.edu 919.515.7351

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Feedback from GroupFeedback from Group

1. Quantify overhead of peripheral circuits as a function of core size

2. Latency matters too, both memory and interconnect. Typically traded for bandwidth. Quantify.