fe8113 ”high speed data converters”

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FE8113 ”High Speed Data Converters”

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FE8113 ”High Speed Data Converters”. Part 2: Digital background calibration. Papers 5 and 6. J.Keane et.al: “ Background Interstage Gain Calibration Technique for Pipelined ADCs ” , IEEE Transactions on Circuits and Systems-I: Regular Papers, Vol. 52,No. 1, January 2005, pp 32-43 - PowerPoint PPT Presentation

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Page 1: FE8113 ”High Speed  Data Converters”

FE8113 ”High Speed Data Converters”

Page 2: FE8113 ”High Speed  Data Converters”

Part 2: Digital background calibration

Page 3: FE8113 ”High Speed  Data Converters”
Page 4: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”, IEEE Transactions on Circuits and Systems-I: Regular Papers, Vol. 52,No. 1, January 2005, pp 32-43

J.Li, U-K.Moon: “Background Calibration Techniques for Multistage Pipelined ADCs With Digital Redundancy”, IEEE Transactions on Circuits and Systems-II: Analog and Digital Signal Processing, Vol. 50, No. 9, September 2003, pp 531-538

Papers 5 and 6

Page 5: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

Outline: A background self-calibration technique is proposed that can correct both linear and nonlinear errors in the inter-stage amplifiers of pipeline and algorithmic ADCs. Simulations show that the proposed algorithm yields a 72dB SNDR and a 112dB SFDR for a 12-bit pipeline. The calibration tracking time constant is approximately 8*105

samples

Page 6: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

Ideal N-bit ADC with input range (-Vref, Vref)

Assuming an ideal stage DASC, and an interstage gain of G1, the ADC output is calculated by:

The interstage gain G1 and the M ADSC levels must satisfy the condition M≥G1 to prevent the backend from overloading. Typically, M>G1, introducing redundancy with digital correction. The primary remaining error sources are errors in the interstage amplifier and nonmlinearity in the DASC. In a switch-cap stage, DASC nonlinearity results primarily from capacitor mismatch and can be measured and corrected for separately, as presented by Galton. The remaining error source is the interstage amplifier, and the paper describes how gain error and nonlinearity in these can be measured an corrected for.

Page 7: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

Correction of gain errors, two approaches:

I:

II:

Page 8: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

With DASC output VDASC=K1D1Vref,where K1 1 is the DASC gain, theInput of a pipeline stage is

a)

b)

c)

Page 9: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

Equivalent model of pipeline stage

Output word:

where

Page 10: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

Interstage gain estimation

Allow at least two D1 levels for a given input

The output is then

Page 11: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

Define:

Then:

Multiply z by R:

If R is a pseudorandom sequence with zero mean, then RI(y0) will have zero mean. ThenE[Rz]=e, which is proportional to

Rz can be considered a noisy estimate of the error coefficient and used to adjust this:

Page 12: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

Equivalent model of pipeline stage including amplifier nonlinearity

(Weakly nonlinear)

Modified correction algorithm

Assuming ideal backend

Rewriting and simplifying

Assume

Adding test sequence

where

Page 13: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

Z written in general form

where

Multiplying by R

Comparing samples where Is small to those where

is large gives an estimate of b1 independent of m1

However, this is depentent on backend behaviour. This means that tracking speed issignal dependent

Page 14: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

Another technique that does nor rely on specific backend codes is presented.By calculating covariance betrween Rz and

where

Page 15: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

Update equation

Integrating over a large number of samples

Page 16: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

Page 17: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

Correction of backend errors

Page 18: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

Example implementation

Page 19: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

Page 20: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

Page 21: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

Page 22: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

Page 23: FE8113 ”High Speed  Data Converters”

J.Keane et.al: “Background Interstage Gain Calibration Technique for Pipelined ADCs”

Page 24: FE8113 ”High Speed  Data Converters”

J.Li, U-K.Moon: “Background Calibration Techniques for Multistage Pipelined ADCs With Digital Redundancy

Outline: The proposed digital background calibration scheme, applicable to multistage ADCs, corrects the linearity errors resulting from capacitor mismatches and finite opamp gain. The calibration is achieved by recalculating the digital output based on each stage’s equivalent radix. The equivalent radices are extracted in the background by using a digital correlation method. The calibration technique takes advantage of the digital redundancy architecture inherent to most pipelined ADCs. The SNR is not degraded from the pseudorandom noise sequence injected into the system

Page 25: FE8113 ”High Speed  Data Converters”

J.Li, U-K.Moon: “Background Calibration Techniques for Multistage Pipelined ADCs With Digital Redundancy

Introduction- Correlation-based background digital calibration scheme in the context of a 1.5b-per-stage pipelined or cyclic ADC- The input signal need not be reduced to allow the injection of

pseudorandom calibration signal- Minimal addition of analog hardware for calibration

Page 26: FE8113 ”High Speed  Data Converters”

J.Li, U-K.Moon: “Background Calibration Techniques for Multistage Pipelined ADCs With Digital Redundancy

”Capacitor flip-over MDAC

Page 27: FE8113 ”High Speed  Data Converters”

J.Li, U-K.Moon: “Background Calibration Techniques for Multistage Pipelined ADCs With Digital Redundancy

For cyclic:

Error sources

Page 28: FE8113 ”High Speed  Data Converters”

J.Li, U-K.Moon: “Background Calibration Techniques for Multistage Pipelined ADCs With Digital Redundancy

””Non-capacitor-flip-over” MDAC

Page 29: FE8113 ”High Speed  Data Converters”

J.Li, U-K.Moon: “Background Calibration Techniques for Multistage Pipelined ADCs With Digital Redundancy

Rearranging error terms forcapacitor flip-over MDAC

Page 30: FE8113 ”High Speed  Data Converters”

J.Li, U-K.Moon: “Background Calibration Techniques for Multistage Pipelined ADCs With Digital Redundancy

”Test signal injection

Page 31: FE8113 ”High Speed  Data Converters”

J.Li, U-K.Moon: “Background Calibration Techniques for Multistage Pipelined ADCs With Digital Redundancy”

Suggested implementaion of test signal injection

Page 32: FE8113 ”High Speed  Data Converters”

J.Li, U-K.Moon: “Background Calibration Techniques for Multistage Pipelined ADCs With Digital Redundancy”

Interference Cancelling

Page 33: FE8113 ”High Speed  Data Converters”

J.Li, U-K.Moon: “Background Calibration Techniques for Multistage Pipelined ADCs With Digital Redundancy”

Interference Cancelling

Page 34: FE8113 ”High Speed  Data Converters”

J.Li, U-K.Moon: “Background Calibration Techniques for Multistage Pipelined ADCs With Digital Redundancy”

Interference Cancelling

Page 35: FE8113 ”High Speed  Data Converters”

J.Li, U-K.Moon: “Background Calibration Techniques for Multistage Pipelined ADCs With Digital Redundancy”

Interference Cancelling

Page 36: FE8113 ”High Speed  Data Converters”

J.Li, U-K.Moon: “Background Calibration Techniques for Multistage Pipelined ADCs With Digital Redundancy”

Simulation results