mcp3301 - 13-bit differential input, low power a/d...

MCP330113-Bit Differential Input, Low Power A/D Converter

with SPI Serial Interface

Features• Full Differential Inputs• ±1 LSB max DNL• ±1 LSB max INL (MCP3301-B)• ±2 LSB max INL (MCP3301-C)• Single supply operation: 4.5V to 5.5V• 100 ksps sampling rate with 5V supply voltage• 50 nA typical standby current, 1 µA max• 450 µA max active current at 5V• Industrial temp range: -40°C to +85°C• 8-pin MSOP, PDIP, and SOIC packages• Mixed Signal PICtail™ Demo Board (P/N:

MXSIGDM) compatible

Applications• Remote Sensors• Battery-operated Systems• Transducer Interface

Functional Block Diagram

General DescriptionThe MCP3301 13-bit analog-to-digital (A/D) converterfeatures full differential inputs and low power consump-tion in a small package that is ideal for battery-poweredsystems and remote data acquisition applications.

Incorporating a successive approximation architecturewith on-board sample and hold circuitry, the 13-bit A/Dconverter is specified to have ±1 LSB Differential Non-linearity (DNL) and ±1 LSB Integral Nonlinearity (INL)for B-grade devices and ±2 LSB for C-grade devices.The industry-standard SPI serial interface enables 13-bit A/D converter capability to be added to any PIC®

microcontroller.

The MCP3301 features a low current design that per-mits operation with typical standby and active currentsof only 50 nA and 300 µA, respectively. The device iscapable of conversion rates of up to 100 ksps withtested specifications over a 4.5V to 5.5V supply range.The reference voltage can be varied from 400 mV to5V, yielding input-referred resolution between 98 µVand 1.22 mV.

The MCP3301 is available in 8-pin PDIP, 150 mil SOIC,and MSOP packages. The full differential inputs of thisdevice enable a wide variety of signals to be used inapplications such as remote data acquisition, portableinstrumentation, and battery-operated applications.

Package Types

Comparator

13-Bit SAR

CDAC

Control Logic

CS/SHDN

VREF VSSVDD

CLK DOUT

ShiftRegister

IN+IN- +

-& HoldCircuits

Sample

MSOP, PDIP, SOIC

VDD

CS/SHDN

CLK

VREF

IN(+)IN(-)VSS

DOUT

MC

P3301

1

234

8

765

2001-2011 Microchip Technology Inc. DS21700E-page 1

MCP3301

1.0 ELECTRICAL CHARACTERISTICS

Maximum Ratings*VDD...................................................................................7.0VAll inputs and outputs w.r.t. VSS ............... -0.3V to VDD +0.3VStorage temperature .....................................-65°C to +150°CAmbient temperature with power applied......-65°C to +125°CMaximum Junction Temperature .................................. 150°CESD protection on all pins (HBM) .................................> 4 kV

*Notice: Stresses above those listed under “Maximumratings” may cause permanent damage to the device. This isa stress rating only and functional operation of the device atthose or any other conditions above those indicated in theoperational listings of this specification is not implied.Exposure to maximum rating conditions for extended periodsmay affect device reliability.

ELECTRICAL CHARACTERISTICSElectrical Characteristics: Unless otherwise noted, all parameters apply at VDD = 5V, VSS = 0V, and VREF = 5V. Full differential input configuration (Figure 1-5) with fixed common mode voltage of 2.5V. All parameters apply over temperature with TAMB = -40°C to +85°C (Note 7). Conversion speed (FSAMPLE) is 100 ksps with FCLK = 17*FSAMPLE

Parameter Symbol Min Typ Max Units Conditions

Conversion RateMaximum Sampling Frequency FSAMPLE — — 100 ksps See FCLK specifications (Note 8)

Conversion Time tCONV 13 CLK periods

Acquisition Time tACQ 1.5 CLK periods

DC AccuracyResolution 12 data bits + sign bitsIntegral Nonlinearity INL —

—±0.5±1

±1±2

LSB MCP3301-BMCP3301-C

Differential Nonlinearity DNL — ±0.5 ±1 LSB Monotonic with no missing codes over temperature

Positive Gain Error -3 -0.75 +2 LSBNegative Gain Error -3 -0.5 +2 LSBOffset Error -3 +3 +6 LSBDynamic PerformanceTotal Harmonic Distortion THD — -91 — dB Note 3Signal to Noise and Distortion SINAD — 78 — dB Note 3Spurious Free Dynamic Range SFDR — 92 — dB Note 3Common-Mode Rejection CMRR — 79 — dB Note 6Power Supply Rejection PSR — 74 — dB Note 4Note 1: This specification is established by characterization and not 100% tested.

2: See characterization graphs that relate converter performance to VREF level.3: VIN = 0.1V to 4.9V @ 1 kHz.4: VDD = 5V DC ±500 mVP-P @ 1 kHz, see test circuit Figure 1-4.5: Maximum clock frequency specification must be met.6: VREF = 400 mV, VIN = 0.1V to 4.9V @ 1 kHz7: MSOP devices are only specified at 25°C and +85°C.8: For slow sample rates, see Section 5.2.1 “Maintaining Minimum Clock Speed” for limitations on clock frequency.9: 4.5V - 5.5V is the supply voltage range for specified performance

DS21700E-page 2 2001-2011 Microchip Technology Inc.

MCP3301

Reference InputVoltage Range 0.4 — VDD V Note 2

Current Drain ——

1000.001

1503

µAµA CS = VDD = 5V

Analog Inputs

Full-Scale Input Span IN(+)-IN(-) -VREF — VREF V

Absolute Input Voltage IN(+) -0.3 — VDD + 0.3 V

IN(-) -0.3 — VDD + 0.3 V

Leakage Current — 0.001 ±1 µA

Switch Resistance RS — 1 — k See Figure 5-3

Sample Capacitor CSAMPLE — 25 — pF See Figure 5-3

Digital Input/Output

Data Coding Format Binary Two’s Complement

High Level Input Voltage VIH 0.7 VDD — — V

Low Level Input Voltage VIL — — 0.3 VDD V

High Level Output Voltage VOH 4.1 — — V IOH = -1 mA, VDD = 4.5V

Low Level Output Voltage VOL — — 0.4 V IOL = 1 mA, VDD = 4.5V

Input Leakage Current ILI -10 — 10 µA VIN = VSS or VDD

Output Leakage Current ILO -10 — 10 µA VOUT = VSS or VDD

Pin Capacitance CIN, COUT — — 10 pF TAMB = 25°C, f = 1 MHz, Note 1

Timing Specifications

Clock Frequency (Note 8) FCLK 0.085 — 1.7 MHz VDD = 5V, FSAMPLE = 100 ksps

Clock High Time tHI 275 — — ns Note 5

Clock Low Time tLO 275 — — ns Note 5

CS Fall To First Rising CLK Edge tSUCS 100 — — ns

CLK Fall To Output Data Valid tDO — — 125200

nsns

VDD = 5V, see Figure 1-2VDD = 2.7V, see Figure 1-2

CLK Fall To Output Enable tEN — — 125200

nsns

VDD = 5V, see Figure 1-2VDD = 2.7V, see Figure 1-2

CS Rise To Output Disable tDIS — — 100 ns See test circuits, Figure 1-2; Note 1

CS Disable Time tCSH 580 — — ns

DOUT Rise Time tR — — 100 ns See test circuits, Figure 1-2; Note 1

DOUT Fall Time tF — — 100 ns See test circuits, Figure 1-2; Note 1

ELECTRICAL CHARACTERISTICS (CONTINUED)Electrical Characteristics: Unless otherwise noted, all parameters apply at VDD = 5V, VSS = 0V, and VREF = 5V. Full differential input configuration (Figure 1-5) with fixed common mode voltage of 2.5V. All parameters apply over temperature with TAMB = -40°C to +85°C (Note 7). Conversion speed (FSAMPLE) is 100 ksps with FCLK = 17*FSAMPLE


Note 1: This specification is established by characterization and not 100% tested.2: See characterization graphs that relate converter performance to VREF level.3: VIN = 0.1V to 4.9V @ 1 kHz.4: VDD = 5V DC ±500 mVP-P @ 1 kHz, see test circuit Figure 1-4.5: Maximum clock frequency specification must be met.6: VREF = 400 mV, VIN = 0.1V to 4.9V @ 1 kHz7: MSOP devices are only specified at 25°C and +85°C.8: For slow sample rates, see Section 5.2.1 “Maintaining Minimum Clock Speed” for limitations on clock frequency.9: 4.5V - 5.5V is the supply voltage range for specified performance


MCP3301

.

FIGURE 1-1: Timing Parameters.

Power Requirements

Operating Voltage VDD 4.5 — 5.5 V Note 9

Operating Current IDD ——

300200

450—

µA VDD , VREF = 5V, DOUT unloadedVDD, VREF = 2.7V, DOUT unloaded

Standby Current IDDS — 0.05 1 µA CS = VDD = 5.0V

Temperature Ranges

Specified Temperature Range TA -40 — +85 °C

Operating Temperature Range TA -40 — +85 °C

Storage Temperature Range TA -65 — +150 °C

Thermal Package Resistance

Thermal Resistance, 8L-MSOP JA — 206 — °C/W

Thermal Resistance, 8L-PDIP JA — 85 — °C/W

Thermal Resistance, 8L-SOIC JA — 163 — °C/W

ELECTRICAL CHARACTERISTICS (CONTINUED)Electrical Characteristics: Unless otherwise noted, all parameters apply at VDD = 5V, VSS = 0V, and VREF = 5V. Full differential input configuration (Figure 1-5) with fixed common mode voltage of 2.5V. All parameters apply over temperature with TAMB = -40°C to +85°C (Note 7). Conversion speed (FSAMPLE) is 100 ksps with FCLK = 17*FSAMPLE


Note 1: This specification is established by characterization and not 100% tested.2: See characterization graphs that relate converter performance to VREF level.3: VIN = 0.1V to 4.9V @ 1 kHz.4: VDD = 5V DC ±500 mVP-P @ 1 kHz, see test circuit Figure 1-4.5: Maximum clock frequency specification must be met.6: VREF = 400 mV, VIN = 0.1V to 4.9V @ 1 kHz7: MSOP devices are only specified at 25°C and +85°C.8: For slow sample rates, see Section 5.2.1 “Maintaining Minimum Clock Speed” for limitations on clock frequency.9: 4.5V - 5.5V is the supply voltage range for specified performance

CS

CLK

tSUCS

tCSH

tHI tLO

DOUT

tEN tDOtR tF

LSBSign Bit

tDIS

Null BitHI-Z HI-Z


MCP3301
1.1 Test Circuits
FIGURE 1-2: Load Circuit for tR, tF, tDO.

FIGURE 1-3: Load Circuit for TDIS and TEN.

FIGURE 1-4: Power Supply Sensitivity Test Circuit (PSRR).

FIGURE 1-5: Full Differential Test Configuration Example.

FIGURE 1-6: Pseudo Differential Test Configuration Example.

Test Point

1.4V

DOUT3 k

CL = 100 pFMC

P330

1

*Waveform 1 is for an output with internalconditions such that the output is high, unlessdisabled by the output control.

†Waveform 2 is for an output with internalconditions such that the output is low, unlessdisabled by the output control.

VIH

TDIS

CS

DOUTWaveform 1*

DOUTWaveform 2†

90%

10%

Voltage Waveforms for tDIS

Test Point

DOUT 3 k

100 pF

tDIS Waveform 2

tDIS Waveform 1

tEN Waveform

VDD

VDD/2

VSS

MC

P330

1

2.63V

-

+

1 k

5V ±500 mVp-p

5VP-P

1 k

20 k To VDD on DUT

1 k

1/2 MCP602

VDD = 5V

0.1 µF

IN(+)

IN(-)MCP3301

5VP-P

VREF = 5V

5VP-P

VCM = 2.5V

1 µF

0.1 µF

VREFVDD

VSS

0.1 µF

IN(+)

IN(-)MCP3301

VDD=5V

VCM=2.5V

5VP-P

VREF=2.5V

1 µF

0.1 µF

VREFVDD

VSS


MCP3301

2.0 TYPICAL PERFORMANCE CURVES

Note: Unless otherwise indicated, VDD = VREF = 5V, Full differential input configuration, VSS = 0V, FSAMPLE = 100 ksps,FCLK = 17*FSAMPLE, TA = 25°C.

FIGURE 2-1: Integral Nonlinearity (INL) vs. Sample Rate.

FIGURE 2-2: Integral Nonlinearity (INL) vs. VREF.

FIGURE 2-3: Integral Nonlinearity (INL) vs. Code (Representative Part).

FIGURE 2-4: Integral Nonlinearity (INL) vs. Temperature.

FIGURE 2-5: Differential Nonlinearity (DNL) vs. Sample Rate.

FIGURE 2-6: Differential Nonlinearity (DNL) vs. VREF.

Note: The graphs and tables provided following this note are a statistical summary based on a limited number ofsamples and are provided for informational purposes only. The performance characteristics listed hereinare not tested or guaranteed. In some graphs or tables, the data presented may be outside the specifiedoperating range (e.g., outside specified power supply range) and therefore outside the warranted range.

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

0 50 100 150 200Sample Rate (ksps)

INL(

LSB

)

Positive INL

Negative INL

-2.0

-1.5

-1.0

-0.5

0.0

0.5

1.0

1.5

2.0

0 1 2 3 4 5VREF (V)

INL

(LSB

) Positive INL

Negative INL

-1

-0.8

-0.6

-0.4

-0.2

0

0.2

0.4

0.6

0.8

1

-4096 -3072 -2048 -1024 0 1024 2048 3072 4096

Code

INL(

LSB

)

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

-50 -25 0 25 50 75 100 125 150Temperature(°C)

INL(

LSB

)

Positive INL

Negative INL

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

0 50 100 150 200Sample Rate(ksps)

DN

L (L

SB)

Positive INL

Negative INL

-2.0

-1.5

-1.0

-0.5

0.0

0.5

1.0

1.5

2.0

0 1 2 3 4 5 6VREF (V)

DN

L (L

SB) Positive INL

Negative INL


MCP3301
FIGURE 2-7: Differential Nonlinearity (DNL) vs. Code (Representative Part).

FIGURE 2-8: Differential Nonlinearity (DNL) vs. Temperature.

FIGURE 2-9: Positive Gain Error vs. VREF.

FIGURE 2-10: Offset Error vs. VREF.

FIGURE 2-11: Positive Gain Error vs. Temperature.

FIGURE 2-12: Signal to Noise Ratio (SNR) vs. Input Frequency.

-1

-0.8

-0.6

-0.4

-0.2

0

0.2

0.4

0.6

0.8

1

-4096 -3072 -2048 -1024 0 1024 2048 3072 4096Code

DN

L(LS

B)

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

-50 0 50 100 150Temperature (°C)

DN

L Er

ror (

LSB

) Positive DNL

Negative DNL

0

1

2

3

4

5

itive

Gai

n Er

ror (

LSB

)

-2

-1

0

0 1 2 3 4 5 6

Posi

VREF (V)

6

8

10

12

14

16

18

20

Offs

et E

rror

(LSB

)

0

2

4

6

0 1 2 3 4 5 6

O

VREF (V)

-1.2

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

sitiv

e G

ain

Erro

r (LS

B)

-1.8

-1.6

-1.4

-50 0 50 100 150

Pos

Temperature (°C)

30

40

50

60

70

80

90

100

SNR

(dB

)

0

10

20

30

1 10 100Input Frequency (kHz)


MCP3301
FIGURE 2-13: Total Harmonic Distortion (THD) vs. Input Frequency.

FIGURE 2-14: Offset Error vs. Temperature.

FIGURE 2-15: Signal to Noise and Distortion (SINAD) vs. Input Frequency.

FIGURE 2-16: Signal to Noise and Distortion (SINAD) vs. Input Signal Level.

FIGURE 2-17: Effective Number of Bits (ENOB) vs. VREF.

FIGURE 2-18: Spurious Free Dynamic Range (SFDR) vs. Input Frequency.

-70

-60

-50

-40

-30

-20

-10

0

THD

(dB

)

-100

-90

-80

-70


1

1.5

2

2.5

3

3.5

Offs

et E

rror

(LSB

)

0

0.5

1

-50 0 50 100 150

O

Temperature (°C)

30

40

50

60

70

80

90

SIN

AD

(dB

)

0

10

20


30

40

50

60

70

80

SIN

AD

(dB

)

0

10

20

-40 -35 -30 -25 -20 -15 -10 -5 0

Input Signal Level (dB)

9

10

11

12

13

ENO

B (r

ms)

7

8

0 1 2 3 4 5 6VREF (V)

30

40

50

60

70

80

90

100

SFD

R (d

B)

0

10

20

30



MCP3301
FIGURE 2-19: Frequency Spectrum of 10 kHz Input (Representative Part).

FIGURE 2-20: Effective Number of Bits (ENOB) vs. Input Frequency.

FIGURE 2-21: Power Supply Rejection (PSR) vs. Ripple Frequency. A 0.1 µF bypass capacitor is connected to the VDD pin.

FIGURE 2-22: IDD vs. VDD.

FIGURE 2-23: IDD vs. Sample Rate.

FIGURE 2-24: IDD vs. Temperature.

-150-140-130-120-110-100

-90-80-70-60-50-40-30-20-10

0

0 5000 10000 15000 20000 25000Frequency (Hz)

Am

plitu

de (d

B)

11.8

12

12.2

12.4

12.6

12.8

13

ENO

B (r

ms)

11.2

11.4

11.6


-65

-60

-55

-50

-45

-40

-35

-30

PSR

(dB

)

-80

-75

-70

-65

1 10 100 1000 10000Ripple Frequency (kHz)

0

50

100

150

200

250

300

350

400

450

2 2.5 3 3.5 4 4.5 5 5.5 6VDD (V)

I DD (µ

A)

150

200

250

300

350

400

450

500

I DD

(µA

)

0

50

100

150


310

315

320

325

330

335

340

345

I DD

(µA

)

295

300

305

310

-50 0 50 100 150Temperature (°C)


MCP3301
FIGURE 2-25: IREF vs. VDD.

FIGURE 2-26: IREF vs. Sample Rate.

FIGURE 2-27: IREF vs. Temperature.

FIGURE 2-28: IDDS vs. VDD.

FIGURE 2-29: IDDS vs. Temperature.

FIGURE 2-30: Negative Gain Error vs. Reference Voltage.

0

20

40

60

80

100

120

2 2.5 3 3.5 4 4.5 5 5.5 6VDD (V)

I REF

(µA

)

30

40

50

60

70

80

90

100

I REF

(µA

)

0

10

20

30


72 4

72.6

72.8

73

73.2

73.4

73.6

73.8

I REF

(µA

)

71.8

72

72.2

72.4

-50 0 50 100 150Temperature (°C)

0

10

20

30

40

50

60

70

80

2 2.5 3 3.5 4 4.5 5 5.5 6VDD (V)

I DD

S (p

A)

0.001

0.01

0.1

1

10

100

-50 -25 0 25 50 75 100

Temperature (°C)

I DD

S (n

A)

2

3

4

5

6

7

8

ativ

e G

ain

Erro

r (LS

B)

-1

0

1

0 1 2 3 4 5 6

Neg

a

VREF (V)


MCP3301
FIGURE 2-31: Negative Gain Error vs. Temperature.

FIGURE 2-32: Common Mode Rejection vs. Frequency.

0 4

-0.2

0

0.2

0.4

0.6

0.8

1

ativ

e G

ain

Erro

r (LS

B)

-1

-0.8

-0.6

-0.4

-50 0 50 100 150

Neg

a

Temperature (°C)

70

71

72

73

74

75

76

77

78

79

80

1 10 100 1000Input Frequency (kHz)

Com

mon

Mod

e R

ejec

tion

Rat

ion(

dB)


MCP3301

3.0 PIN DESCRIPTIONSThe descriptions of the pins are listed in Table 3-1.

TABLE 3-1: PIN FUNCTION TABLE

3.1 Voltage Reference (VREF)This input pin provides the reference voltage for thedevice, which determines the maximum range of theanalog input signal and the LSB size.

The LSB size is determined by the equation shownbelow. As the reference input is reduced, the LSB sizeis reduced accordingly.

EQUATION

When using an external voltage reference device, thesystem designer should always refer to the manufac-turer’s recommendations for circuit layout. Any instabil-ity in the operation of the reference device will have adirect effect on the accuracy of the ADC conversionresults.

3.2 Positive Analog Input (IN+)This pin has an absolute voltage range of VSS-0.3V toVDD+0.3V. The full scale input range is defined as theabsolute value of (IN+) - (IN-).

3.3 Negative Analog Input (IN-)This pin has an absolute voltage range of VSS-0.3V toVDD+0.3V. The full scale input range is defined as theabsolute value of (IN+) - (IN-).

3.4 Ground Connection (VSS)If an analog ground plane is available, it is recom-mended that this device be tied to the analog groundplane in the circuit. See Section 5.6 “Layout Consid-erations”, for more information regarding circuitlayout.

3.5 Chip Select/Shutdown (CS/SHDN)The CS/SHDN pin is used to initiate communicationwith the device when pulled low. This pin will end a con-version and put the device in low power standby whenpulled high. The CS/SHDN pin must be pulled highbetween conversions and cannot be tied low formultiple conversions. See Figure 6-2 for serialcommunication protocol.

3.6 Serial Data Output (DOUT)The SPI serial data output pin is used to shift out theresults of the A/D conversion. Data will always changeon the falling edge of each clock as the conversiontakes place. See Figure 6-2 for serial communicationprotocol.

3.7 Serial Clock (CLK)The SPI clock pin is used to initiate a conversion, aswell as to clock out each bit of the conversion as it takesplace. See Section 5.2 “Driving the Analog Input”for constraints on clock speed, and Figure 6-2 for serialcommunication protocol.

3.8 Power Supply (VDD)The device can operate from 2.7V to 5.5V, but the per-formance is applicable from a 4.5V to 5.5V supplyrange. To ensure accuracy, a 0.1 µF ceramic bypasscapacitor should be placed as close as possible to thepin. See Section 5.6 “Layout Considerations” formore information regarding circuit layout.

MSOP, PDIP, SOIC Name Function

1 VREF Reference Voltage Input

2 IN(+) Positive Analog Input

3 IN(-) Negative Analog Input

4 VSS Ground

5 CS/SHDN Chip Select / Shutdown Input

6 DOUT Serial Data Out

7 CLK Serial Clock

8 VDD +4.5V to 5.5V Power Supply

LSB Size =2 x VREF

8192


MCP3301

4.0 DEFINITION OF TERMSBipolar Operation - This applies to either a differentialor single-ended input configuration, where bothpositive and negative codes are output from the A/Dconverter. Full bipolar range includes all 8192 codes.For bipolar operation on a single-ended input signal,the A/D converter must be configured to operate inpseudo differential mode.Unipolar Operation - This applies to either a single-ended or differential input signal where only one side ofthe device transfer is being used. This could be eitherthe positive or negative side, depending on which input(IN+ or IN-) is being used for the DC bias. Full unipolaroperation is equivalent to a 12-bit converter.Full Differential Operation - Applying a full differentialsignal to both the IN(+) and IN(-) inputs is referred to asfull differential operation. This configuration isdescribed in Figure 1-5.Pseudo-Differential Operation - Applying a single-ended signal to only one of the input channels with abipolar output is referred to as pseudo differentialoperation. To obtain a bipolar output from a single-ended input signal the inverting input of the A/Dconverter must be biased above VSS. This operation isdescribed in Figure 1-6.Integral Nonlinearity - The maximum deviation from astraight line passing through the endpoints of thebipolar transfer function is defined as the maximumintegral nonlinearity error. The endpoints of the transferfunction are a point 1/2 LSB above the first codetransition (0x1000) and 1/2 LSB below the last codetransition (0x0FFF).Differential Nonlinearity - The difference between twomeasured adjacent code transitions and the 1 LSBideal is defined as differential nonlinearity. Positive Gain Error - This is the deviation between thelast positive code transition (0x0FFF) and the idealvoltage level of VREF-1/2 LSB, after the bipolar offseterror has been adjusted out.Negative Gain Error - This is the deviation betweenthe last negative code transition (0X1000) and the idealvoltage level of -VREF-1/2 LSB, after the bipolar offseterror has been adjusted out.Offset Error - This is the deviation between the firstpositive code transition (0x0001) and the ideal 1/2 LSBvoltage level. Acquisition Time - The acquisition time is defined asthe time during which the internal sample capacitor ischarging. This occurs for 1.5 clock cycles of theexternal CLK as defined in Figure 6-2.Conversion Time - The conversion time occursimmediately after the acquisition time. During this time,successive approximation of the input signal occurs asthe 13-bit result is being calculated by the internalcircuitry. This occurs for 13 clock cycles of the externalCLK as defined in Figure 6-2.

Signal to Noise Ratio - Signal to Noise Ratio (SNR) isdefined as the ratio of the signal to noise measured atthe output of the converter. The signal is defined as therms amplitude of the fundamental frequency of theinput signal. The noise value is dependant on thedevice noise as well as the quantization error of theconverter and is directly affected by the number of bitsin the converter. The theoretical signal to noise ratiolimit based on quantization error only for an N-bitconverter is defined as:

EQUATION

For a 13-bit converter, the theoretical SNR limit is80.02 dB.Total Harmonic Distortion - Total Harmonic Distortion(THD) is the ratio of the rms sum of the harmonics tothe fundamental, measured at the output of theconverter. For the MCP3301, it is defined using the first9 harmonics, as shown in the following equation:

EQUATION

Here V1 is the rms amplitude of the fundamental and V2through V9 are the rms amplitudes of the secondthrough ninth harmonics.Signal-to-Noise plus Distortion (SINAD) - Numeri-cally defined, SINAD is the calculated combination ofSNR and THD. This number represents the dynamicperformance of the converter, including any harmonicdistortion.

EQUATION

EffectIve Number of Bits - Effective Number of Bits(ENOB) states the relative performance of the ADC interms of its resolution. This term is directly related toSINAD by the following equation:

EQUATION

For SINAD performance of 78 dB, the effective numberof bits is 12.66.Spurious Free Dynamic Range - Spurious FreeDynamic Range (SFDR) is the ratio of the rms value ofthe fundamental to the next largest component in theoutput spectrum of the ADC. This is, typically, the firstharmonic, but could also be a noise peak.

SNR 6.02N 1.76+ dB=

THD(-dB) 20 log–V2

2 V32 V4

2 ..... V82 V9

2+ + + + +

V12--------------------------------------------------------------------------------=

SINAD(dB) 20 log 10 SNR 10 10 THD 10 –+=

ENOB N SINAD 1.76–6.02------------------------------------=


MCP3301

5.0 APPLICATIONS INFORMATION

5.1 Conversion DescriptionThe MCP3301MCP3301 A/D converter employs a con-ventional SAR architecture. With this architecture, thepotential between the IN+ and IN- inputs aresimultaneously sampled and stored with the internalsample circuits for 1.5 clock cycles (tACQ). Followingthis sample time, the input hold switches of theconverter open and the device uses the collectedcharge to produce a serial 13-bit binary two’scomplement output code. This conversion process isdriven by the external clock and must include 13 clockcycles, one for each bit. During this process, the mostsignificant bit (MSB) is output first. This bit is the signbit and indicates whether the IN+ input or the IN- inputis at a higher potential.

FIGURE 5-1: Simplified Block Diagram.

5.2 Driving the Analog InputThe analog input of the MCP3301 is easily driven eitherdifferentially or single ended. Any signal that iscommon to the two input channels will be rejected bythe common mode rejection of the device. During thecharging time of the sample capacitor, a small chargingcurrent will be required. For low source impedances,this input can be driven directly. For larger sourceimpedances, a larger acquisition time will be required,due to the RC time constant that includes the sourceimpedance. For the A/D Converter to meet specifica-tion, the charge holding capacitor (CSAMPLE) must begiven enough time to acquire a 13-bit accurate voltagelevel during the 1.5 clock cycle acquisition period.

An analog input model is shown in Figure 5-3. Thismodel is accurate for an analog input, regardless ofwhether it is configured as a single-ended input or theIN+ and IN- input in differential mode. In this diagram,it is shown that the source impedance (RS) adds to theinternal sampling switch (RSS) impedance, directlyaffecting the time that is required to charge the capaci-tor (CSAMPLE). Consequently, a larger source imped-ance with no additional acquisition time increases theoffset, gain, and integral linearity errors of the conver-sion. To overcome this, a slower clock speed can beused to allow for the longer charging time. Figure 5-2shows the maximum clock speed associated withsource impedances.

FIGURE 5-2: Maximum Clock Frequency vs. Source Resistance (RS) to maintain ±1 LSB INL.

ShiftRegister

Comp 13-Bit SAR

CDACIN+

IN-

CSAMP

Hold

+

-

Hold

CSAMP

DOUT

0

0.2

0.4

0.6

0.8

1

1.2

1.4

1.6

1.8

100 1000 10000 100000

Input Resistance (ohms)

Max

Clo

ck F

requ

ency

(MH

z)


MCP3301

FIGURE 5-3: Analog Input Model.

5.2.1 MAINTAINING MINIMUM CLOCK SPEED

When the MCP3301 initiates, charge is stored on thesample capacitor. When the sample period is complete,the device converts one bit for each clock that isreceived. It is important for the user to note that a slowclock rate will allow charge to bleed off the samplecapacitor while the conversion is taking place. ForMCP3301 devices, the recommended minimum clockspeed during the conversion cycle (tCONV) is 85 kHz.Failure to meet this criteria may introduce linearityerrors into the conversion outside the rated specifica-tions. It should be noted that, during the entire conver-sion cycle, the A/D converter does not haverequirements for clock speed or duty cycle, as long asall timing specifications are met.

5.3 Biasing SolutionsFor pseudo-differential bipolar operation, the biasingcircuit shown in Figure 5-4 shows a single-ended inputAC coupled to the converter. This configuration will givea digital output range of -4096 to +4095. With the 2.5Vreference, the LSB size is equal to 610 µV.

Although the ADC is not production tested with a 2.5Vreference as shown, linearity will not change more than0.1 LSB. See Figure 2-2 and Figure 2-6 for INL andDNL errors versus VREF at VDD = 5V. A trade-off existsbetween the high-pass corner and the acquisition time.The value of C will need to be quite large in order tobring down the high-pass corner. The value of R needsto be 1 k or less, since higher input impedancesrequire additional acquisition time.

Using the values in Figure 5-4, we have a 100 Hz cor-ner frequency. See Figure 5-2 for the relationshipbetween input impedance and acquisition time.

FIGURE 5-4: Pseudo-differential biasing circuit for bipolar operation.

CPINVA

RS CHx

7 pF

VT = 0.6V

VT = 0.6VILEAKAGE

SamplingSwitch

SS RSS = 1 k

CSAMPLE= DAC capacitance

VSS

VDD

= 25 pF±1 nA

LegendVA = signal sourceRS = source impedance

CHx = input channel padCPIN = input pin capacitance

VT = threshold voltageILEAKAGE = leakage current at the pin due to various junctions

SS = sampling switchRSS = sampling switch resistor

CSAMPLE = sample/hold capacitance

VDD = 5V

0.1 µF

IN+

IN- VREF

MCP3301

1 µF MCP1525

VINVOUT

0.1 µF

1 k

10 µFVIN

R

C


MCP3301
Using an external operational amplifier on the inputallows for gain and buffers the input signal from theinput to the ADC, allowing for a higher sourceimpedance. This circuit is shown in Figure 5-5.
FIGURE 5-5: Adding an amplifier allows for gain and also buffers the input from any high impedance sources.This circuit shows that some headroom will be lost dueto the amplifier output not being able to swing all theway to the rail. An example would be for an outputswing of 0V to 5V. This limitation can be overcome bysupplying a VREF that is slightly less than the commonmode voltage. Using a 2.048V reference for the A/Dconverter, while biasing the input signal at 2.5V solvesthe problem. This circuit is shown in Figure 5-6.

FIGURE 5-6: Circuit solution to overcome amplifier output swing limitation.

5.4 Common Mode Input RangeThe common mode input range has no restriction andis equal to the absolute input voltage range: VSS -0.3Vto VDD + 0.3V. However, for a given VREF, the commonmode voltage has a limited swing if the entire range ofthe A/D converter is to be used. Figure 5-7 andFigure 5-8 show the relationship between VREF and thecommon mode voltage. A smaller VREF allows for widerflexibility in a common mode voltage. VREF levels,down to 400 mV, exhibit less than 0.1 LSB change inINL and DNL.

For characterization graphs that show this performancerelationship, see Figure 2-2 and Figure 2-6.

FIGURE 5-7: Common Mode Range of Full Differential input signal versus VREF.

FIGURE 5-8: Common Mode Range versus VREF for Pseudo Differential Input.

VDD = 5V

-+

0.1 µF

MCP6022

IN+

IN- VREFMCP3301

1 µF MCP1525VINVOUT

0.1 µF

1 k

10 k

1 M1 µF

VIN

1 M

2.048V

VDD = 5V

-+

0.1 µF

MCP606IN+

IN- VREFMCP3301

1 µF MCP1525VINVOUT

0.1 µF

1 k

10 k

1 µFVIN

10 k

VREF (V)0.25

VDD = 5V

5.01.0 2.5 4.0-1

0

1

2

3

4

54.05V

2.8V

2.3V

0.95VC

omm

on M

ode

Ran

ge (V

)

VREF (V)0.25

VDD = 5V

2.50.5 1.25 2.0-1

0

1

2

3

4

54.05V

2.8V

2.3V

0.95V

Com

mon

Mod

e R

ange

(V)


MCP3301
5.5 Buffering/Filtering the Analog
InputsInaccurate conversion results may occur if the signalsource for the A/D converter is not a low impedancesource. Buffering the input will solve the impedanceissue. It is also recommended that an analog filter beused to eliminate any signals that may be aliased backinto the conversion results. Using an op amp to drivethe analog input of the MCP3301 is illustrated inFigure 5-9. This amplifier provides a low impedancesource for the converter input and low pass filter, whicheliminates unwanted high frequency noise. Valuesshown are for a 10 Hz Butterworth Low pass filter.

Low pass (anti-aliasing) filters can be designed usingMicrochip’s interactive FilterLab® software. FilterLabwill calculate capacitor and resistor values as well asdetermine the number of poles that are required for theapplication. For more information on filtering signals,see AN-699 “Anti-Aliasing Analog Filters for DataAcquisition Systems”.

FIGURE 5-9: The MCP601 Operational Amplifier is used to implement a 2nd order anti-aliasing filter for the signal being converted by the MCP3301.

5.6 Layout ConsiderationsWhen laying out a printed circuit board for use withanalog components, care should be taken to reducenoise wherever possible. A bypass capacitor from VDDto ground should always be used with this device andshould be placed as close as possible to the device pin.A bypass capacitor value of 0.1 µF is recommended.

Digital and analog traces should be separated as muchas possible on the board with no traces runningunderneath the device or bypass capacitor. Extraprecautions should be taken to keep traces with highfrequency signals (such as clock lines) as far aspossible from analog traces.

Use of an analog ground plane is recommended inorder to keep the ground potential the same for alldevices on the board. Providing VDD connections todevices in a “star” configuration can also reduce noiseby eliminating current return paths and associatederrors (Figure 5-10). For more information on layouttips when using the MCP3301 or other ADC devices,refer to AN-688 “Layout Tips for 12-Bit A/D ConverterApplications”.

FIGURE 5-10: VDD traces arranged in a ‘Star’ configuration in order to reduce errors caused by current return paths.MCP3301

MCP3301

VDD10 µF

IN-

IN+

-

+VIN

2.2 µF

1 µF

VREF

4.096VReference

0.1 µF

1 µF0.1 µF

MCP6017.86 k

14.6 k

MCP1541CL

VDDConnection

Device 1

Device 2

Device 3

Device 4


MCP3301

6.0 SERIAL COMMUNICATIONS

6.1 Output Code FormatThe output code format is a binary two’s complementscheme with a leading sign bit that indicates the sign ofthe output. If the IN+ input is higher than the IN- input,the sign bit will be a zero. If the IN- input is higher, thesign bit will be a ‘1’.

The diagram shown in Figure 6-1 shows the outputcode transfer function. In this diagram, the horizontalaxis is the analog input voltage and the vertical axis isthe output code of the ADC. It shows that when IN+ isequal to IN-, both the sign bit and the data word arezero. As IN+ gets larger, with respect to IN-, the sign bitis a zero and the data word gets larger. The full scaleoutput code is reached at +4095 when the input [(IN+)- (IN-)] reaches VREF - 1 LSB. When IN- is larger thanIN+, the two’s complement output codes will be seenwith the sign bit being a one. Some examples of analoginput levels and corresponding output codes are shownin Table 6-1.

TABLE 6-1: BINARY TWO’S COMPLEMENT OUTPUT CODE EXAMPLES.

Analog Input Levels SignBit Binary Data Decimal

DATA

Full Scale Positive (IN+)-(IN-) = VREF-1 LSB 0 1111 1111 1111 +4095

(IN+)-(IN-) = VREF-2 LSB 0 1111 1111 1110 +4094

IN+ = (IN-) +2 LSB 0 0000 0000 0010 +2

IN+ = (IN-) +1 LSB 0 0000 0000 0001 +1

IN+ = IN- 0 0000 0000 0000 0

IN+ = (IN-) - 1 LSB 1 1111 1111 1111 -1

IN+ = (IN-) - 2 LSB 1 1111 1111 1110 -2

IN+ - IN- = VREF+1 LSB 1 0000 0000 0001 -4095

Full Scale Negative IN+ - IN- = -VREF 1 0000 0000 0000 -4096


MCP3301

FIGURE 6-1: Output Code Transfer Function.

IN+ > IN-

IN+ < IN-

0 + 0000 0000 0001 (+1)0 + 0000 0000 0010 (+2)0 + 0000 0000 0011 (+3)

1 + 1111 1111 1101 (-3)1 + 1111 1111 1110 (-2)1 + 1111 1111 1111 (-1)

0 + 1111 1111 1110 (+4094)0 + 1111 1111 1111 (+4095)

1 + 0000 0000 0000 (-4096)1 + 0000 0000 0001 (-4095)

Output Code

0 + 0000 0000 0000 (0)

VREF-VREF

Positive FullScale Output = VREF -1 LSB

Negative FullScale Output = -VREF

Analog Input

IN+ - IN-Voltage


MCP3301
6.2 Communicating with the MCP3301Communication with the device is completed using astandard SPI compatible serial interface. Initiating com-munication with the MCP3301 begins with the CSgoing low. If the device was powered up with the CS pinlow, it must be brought high and back low to initiatecommunication. The device will begin to sample theanalog input on the first rising edge of CLK after CSgoes low. The sample period will end in the falling edgeof the second clock, at which time the device will outputa low null bit. The next 13 clocks will output the resultof the conversion with the sign bit first, followed by the
12 remaining data bits, as shown in Figure 6-2. Data isalways output from the device on the falling edge of theclock. If all 13 data bits have been transmitted and thedevice continues to receive clocks while the CS is heldlow, the device will output the conversion result LSBfirst, as shown in Figure 6-3. If more clocks areprovided to the device while CS is still low (after theLSB first data has been transmitted), the device willclock out zeros indefinitely.

FIGURE 6-2: Communication with MCP3301 (MSB first Format).

FIGURE 6-3: Communication with MCP3301 (LSB first Format).

CS

CLK

DOUT

tSAMPLE

PowerDowntSUCS

tACQ tCONVtDATA**

* After completing the data transfer, if further clocks are applied with CS low, the ADC will output LSB first data,followed by zeros indefinitely. See Figure 6-2 below.** tDATA: during this time, the bias current and the comparator power down and the reference input becomes ahigh impedance node, leaving the CLK running to clock out the LSB-first data or zeros.

tCSH

NULLBIT B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0*HI-Z HI-Z NULL

BIT SB B11 B10 B9SB

CS

CLK

DOUT

tSAMPLE

Power DowntSUCS

tACQ tCONV tDATA**

* After completing the data transfer, if further clocks are applied with CS low, the ADC will output zeros indefi-nitely.** tDATA: during this time, the bias current and the comparator power down and the reference input becomes ahigh impedance node, leaving the CLK running to clock out the LSB-first data or zeros.

tCSH

NULLBIT B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0

HI-ZB1 B2 B3 B4 B5 B6 B7 B8 B9 B10 SB* HI-Z

SB B11


MCP3301
6.3 Using the MCP3301 with
Microcontroller (MCU) SPI PortsWith most microcontroller SPI ports, it is required toclock out eight bits at a time. Using a hardware SPI portwith the MCP3301 is very easy because each conver-sion requires 16 clocks. For example, Figure 6-4 andFigure 6-5 show how the MCP3301 can be interfacedto a microcontroller with a standard SPI port. Since theMCP3301 always clocks data out on the falling edge ofclock, the MCU SPI port must be configured to matchthis operation. SPI Mode 0,0 (clock idles low) and SPIMode 1,1 (clock idles high) are both compatible withthe MCP3301. Figure 6-4 depicts the operation shownin SPI Mode 0,0, which requires that the CLK from themicrocontroller idles in the ‘low’ state. As shown in thediagram, the sign bit is clocked out of the ADC on the

falling edge of the third clock pulse, followed by theremaining 12 data bits (MSB first). Once the first eightclocks have been sent to the device, the microcon-troller’s receive buffer will contain two unknown bits (forthe first two clocks, the output is high impedance),followed by the null bit, the sign bit and the highestorder four bits of the conversion. After the second eightclocks have been sent to the device, the MCU receiveregister will contain the lowest order 8 data bits. Noticethat, on the falling edge of clock 16, the ADC has begunto shift out LSB first data.

Figure 6-5 shows the same scenario in SPI Mode 1,1,which requires that the clock idles in the high state. Aswith mode 0,0, the ADC outputs data on the fallingedge of the clock and the MCU latches data from theADC in on the rising edge of the clock.

FIGURE 6-4: SPI Communication with the MCP3301 using 8-bit segments (Mode 0,0: SCLK idles low).

FIGURE 6-5: SPI Communication with the MCP3301 using 8-bit segments (Mode 1,1: SCLK idles high).

LSB first data beginsto come out

CS

CLK 9 10 11 12 13 14 15 16

DOUTNULL

BIT SB B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1HI-Z

B8 B7 B6 B5 B4 B3 B2 B1SB B11 B10 B9? ? 0

MCU latches data from ADC

Data is clocked out ofADC on falling edges

on rising edges of SCLK

1 2 3 4 5 6 7 8

HI-ZB0

B0

B1

Data stored into MCU receive registerafter transmission of first 8 bits

Data stored into MCU receive registerafter transmission of second 8 bits

X = Don’t Care Bits? = Unknown Bits

CS

CLK 9 10 11 12 13 14 16

DOUTNULL

BIT SB B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1HI-Z

B8 B7 B6 B5 B4 B3 B2 B1SB B11 B10 B9? ? 0

MCU latches data from ADC

Data is clocked out ofADC on falling edges

on rising edges of SCLK

1 2 3 4 5 6 7 8

B0

B0

LSB first data beginsto come out

HI-Z

Data stored into MCU receive registerafter transmission of first 8 bits

Data stored into MCU receive registerafter transmission of second 8 bits

15

X = Don’t Care Bits? = Unknown Bits


MCP3301

7.0 PACKAGING INFORMATION

7.1 Package Marking Information

XXXXXXXXXXXXXNNN

YYWW

NNN

Legend: XX...X Customer-specific informationY Year code (last digit of calendar year)YY Year code (last 2 digits of calendar year)WW Week code (week of January 1 is week ‘01’)NNN Alphanumeric traceability code Pb-free JEDEC designator for Matte Tin (Sn)* This package is Pb-free. The Pb-free JEDEC designator ( )

can be found on the outer packaging for this package.

Note: In the event the full Microchip part number cannot be marked on one line, it willbe carried over to the next line, thus limiting the number of available charactersfor customer-specific information.

3e

3e

8-Lead SOIC (3.90 mm) Example

3301-BI SN 11303

8-Lead PDIP (300 mil) Example

8-Lead MSOP (3x3 mm) Example

3301-BI I/P 256 1130

3

3301CI 130256


MCP3301

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1 2 3

A

A1

A2

L

b1b

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eB

c

�� *�� 1��;0


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MCP3301

APPENDIX A: REVISION HISTORY

Revision E (November 2011)Updated Product Identification System.

Corrected MSOP marking drawings.

Updated Package Specification Drawings with newadditions.

Revision D (April 2011)The following is the list of modifications:

1. Updated the content to illustrate that the devicesnow have tested specifications in the 4.5V to5.5V supply range.

2. Removed figures 2-4 to 2-6, 2-10 to 2-12, 2-16and 2-17.

Revision C (January 2007)This revision includes updates to the packagingdiagrams.

Revision B (February 2002)Undocumented changes.

Revision A (December 2001)Original Release of this Document.


MCP3301

PRODUCT IDENTIFICATION SYSTEMTo order or obtain information, e.g., on pricing or delivery, contact the local Microchip sales office.

PART NO. X /XX

PackageTemperatureRange

Device

Device: MCP3301: 13-Bit Serial A/D Converter

MCP3301T: 13-Bit Serial A/D Converter (Tape and Reel)

Grade: B = ±1 LSB INLC = ±2 LSB INL

Temperature Range: I = -40°C to +85°C

Package: MS = Plastic MSOP, 8-leadP = Plastic DIP (300 mil Body), 8-leadSN = Plastic SOIC (150 mil Body), 8-lead

Examples:a) MCP3301-BI/P: ±1 LSB INL, Industrial

Temperature, PDIP packageb) MCP3301-BI/SN: ±1 LSB INL, Industrial

Temperature, SOIC packagec) MCP3301-CI/MS: ±2 LSB INL, Industrial

Temperature, MSOP package

X

Grade


Note the following details of the code protection feature on Microchip devices:• Microchip products meet the specification contained in their particular Microchip Data Sheet.

• Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the intended manner and under normal conditions.

• There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data Sheets. Most likely, the person doing so is engaged in theft of intellectual property.

• Microchip is willing to work with the customer who is concerned about the integrity of their code.

• Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not mean that we are guaranteeing the product as “unbreakable.”

Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of ourproducts. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such actsallow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act.

Information contained in this publication regarding deviceapplications and the like is provided only for your convenienceand may be superseded by updates. It is your responsibility toensure that your application meets with your specifications.MICROCHIP MAKES NO REPRESENTATIONS ORWARRANTIES OF ANY KIND WHETHER EXPRESS ORIMPLIED, WRITTEN OR ORAL, STATUTORY OROTHERWISE, RELATED TO THE INFORMATION,INCLUDING BUT NOT LIMITED TO ITS CONDITION,QUALITY, PERFORMANCE, MERCHANTABILITY ORFITNESS FOR PURPOSE. Microchip disclaims all liabilityarising from this information and its use. Use of Microchipdevices in life support and/or safety applications is entirely atthe buyer’s risk, and the buyer agrees to defend, indemnify andhold harmless Microchip from any and all damages, claims,suits, or expenses resulting from such use. No licenses areconveyed, implicitly or otherwise, under any Microchipintellectual property rights.

2001-2011 Microchip Technology Inc.

Trademarks

The Microchip name and logo, the Microchip logo, dsPIC, KEELOQ, KEELOQ logo, MPLAB, PIC, PICmicro, PICSTART, PIC32 logo, rfPIC and UNI/O are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries.

FilterLab, Hampshire, HI-TECH C, Linear Active Thermistor, MXDEV, MXLAB, SEEVAL and The Embedded Control Solutions Company are registered trademarks of Microchip Technology Incorporated in the U.S.A.

Analog-for-the-Digital Age, Application Maestro, chipKIT, chipKIT logo, CodeGuard, dsPICDEM, dsPICDEM.net, dsPICworks, dsSPEAK, ECAN, ECONOMONITOR, FanSense, HI-TIDE, In-Circuit Serial Programming, ICSP, Mindi, MiWi, MPASM, MPLAB Certified logo, MPLIB, MPLINK, mTouch, Omniscient Code Generation, PICC, PICC-18, PICDEM, PICDEM.net, PICkit, PICtail, REAL ICE, rfLAB, Select Mode, Total Endurance, TSHARC, UniWinDriver, WiperLock and ZENA are trademarks of Microchip Technology Incorporated in the U.S.A. and other countries.

SQTP is a service mark of Microchip Technology Incorporated in the U.S.A.

All other trademarks mentioned herein are property of their respective companies.

© 2001-2011, Microchip Technology Incorporated, Printed in the U.S.A., All Rights Reserved.

Printed on recycled paper.

ISBN: 978-1-61341-756-0

DS21700E-page 31

Microchip received ISO/TS-16949:2009 certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona; Gresham, Oregon and design centers in California and India. The Company’s quality system processes and procedures are for its PIC® MCUs and dsPIC® DSCs, KEELOQ® code hopping devices, Serial EEPROMs, microperipherals, nonvolatile memory and analog products. In addition, Microchip’s quality system for the design and manufacture of development systems is ISO 9001:2000 certified.


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