mncf: monthly management meeting dr. vijay mishra 26 th july 2011
DESCRIPTION
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MNCF: Monthly Management Meeting
Dr. Vijay Mishra26th July 2011
SAM
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Tool Reservation and Usage Pattern
AFM Agilent IV/CV Characterization FTIR_Nicolet 6700 RF Network Analyzer Raman & MicroPL Optical Profilometer Solar Simulator
80
240
10
160 160
2
64
41
184
717
122
2 3
Equipment Usage Statistics for June 2011 (MNCF)Series1 Series2
AFM Agilent IV/CV Characterization FTIR_Nicolet 6700 RF Network Analyzer Raman & MicroPL Optical Profilometer Solar Simulator
80
240
20
160 160
80 80
52
189
102
127
32
1
Equipment Usage Statistics for July 2011 (MNCF)Series1 Series2
Tools Update (any Issues)• DC Probe Station 1 (PM5 with Thermal Chuck, Agilent Device Analyzer B1500A)• DC Probe Station 2 (PM5, Agilent Device Analyzer B1500A with pulsed source 5
MHz) • DC Probe Station 3 (PM8, Agilent Sem. Parametric Analyzer 4155C with pulsed
source 1 MHz, 4284A for LFCV)• DC Probe Station 4 (PM5, Agilent Impedence Analyzer 4294A for HFCV, 110 Mhz )• RF Probe Station and Network Analyzer• AFM Agilent • MSA-500 • optical Profilometer • FTIR_Nicolet 6700 – NXRFT • Raman & PL (PSU coming back as replacements)• Solar Simulator, QE measurement