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Monolithic Instruments (New opportunities for wafer fabs) November 12, 2003 Jeremy Theil Agilent Technologies ([email protected], tel: 408 553-4495)

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Page 1: Monolithic Instruments - IEEE · Monolithic Instruments- Jeremy Theil sA Page 3 Product Trends zInstrumentation zReduced system size. zIncreased computational power. zIncreased operational

Monolithic Instruments(New opportunities for wafer fabs)

November 12, 2003

Jeremy TheilAgilent Technologies([email protected], tel: 408 553-4495)

Page 2: Monolithic Instruments - IEEE · Monolithic Instruments- Jeremy Theil sA Page 3 Product Trends zInstrumentation zReduced system size. zIncreased computational power. zIncreased operational

Monolithic Instruments- Jeremy TheilPage 2sA

Outline

Trend in Manufacturing and InstrumentationDefinition of Monolithic InstrumentsExamples

Elevated Photodiode ArraysOLED MicrodisplaysDigital Micromirrors

Manufacturing/Integration ChallengesFuture Opportunities

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Product Trends

InstrumentationReduced system size.Increased computational power.Increased operational speed.Improved levels of process control.Improved reliability of manufacturing systems.Reduced system cost.

Largely Enabled by Integrated Circuits!

Integrated CircuitsReduced system size.Increased computational power.Increased operational speed.Reduced transducer size.Novel solid-state transducers/actuators.Reduced system cost.

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Semiconductor Manufacturing

Current Manufacturing TolerancesWafer flatness: < 100nm across a 300 mm wafer.Metal impurity concentration: < 1 x 1010 cm-3.Stacking fault density: < 1/cm2.Layer-to-layer alignment tolerance: < 25 nm.Linewidth control: 3 nm 3σ.Minimum feature half-pitch: 100 nm.Film thickness control: < 4% 3σ over 300 mm.

Current typical high-volume CMOS device specs.Transistor Density: ~9 x 107 transistors/cm2.Operating Frequency: ~1.7 GHz.Manufacturing Cost: ~ $32/cm2.

$3.6x10-7/FET

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Value of a Semiconductor Mfg. Platform

~$2 x 10-1

/switch

~ 10 µm

100 µm

Machining Mfg

200,000:1

40,000:1

400:1

Mach./Semi.

$1 x 10-6/FETManufacturing Cost

< 25 nmAlignment Tolerance

0.25 µmMinimum Feature Size

Semiconductor Mfg

For the number of devices made, a semiconductor fab is the most precise and least expensive manufacturing environment.

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Definition of Monolithic Instruments

Monolithic instruments are miniaturized systems, combining conventional integrated circuits with novel solid-state components, that interact with their physical environment.

� Concept- Incorporate several instrumentation system functions onto a single die.

�Transducer/actuator�Driver (analog function)�Analog/Digital interface�Signal processing�Data analysis�I/O

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Classes of Monolithic Instruments

Pre-integrated circuit.During integrated circuit fabrication.Post-integrated circuit fabrication.

Adapted from: H. Balthes, and O. Brand, Proceedings of 14th Eurosensors XIV, p1 (2000).

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Monolithic Instrument Examples

Some types of monolithic instruments that have been fabricated include:

a-Si:H photodiode arrays.Organic LED micro-arrays.Digital Micromirror Devices.Liquid-crystal microdisplays.Bio-assay array systems.Inter-cellular communications.

Components proposed for future monolithic instruments include:

Thin-film bulk acoustic resonators.Photonic crystals.Planar light-guide systemsGroup IV-based LEDs.SQUID magnetometers

Page 9: Monolithic Instruments - IEEE · Monolithic Instruments- Jeremy Theil sA Page 3 Product Trends zInstrumentation zReduced system size. zIncreased computational power. zIncreased operational

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Fabricated Monolithic InstrumentsInkjet heads (Hewlett-Packard, Loveland and Corvallis).Digital micromirror displays (Texas Instruments).DNA microarray detectors (Infineon).Direct neuron communicators (Infineon).a-Si:H photodiode arrays (Agilent).Organic LED microdisplays (Agilent, e-magin).

Texas Instrument’s DLP© TI 2003 Neuron Communications

© Infineon 2003

a-Si:H PhotodiodeContact

Interconnect

Si Substrate

a-Si:H Photodiode array(Agilent Technologies)

SXGA OLED microdisplay. Agilent Technologies

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Advantages of Monolithic Instruments

Better performance.Improved signal integrity.Access to novel transducer technology.

Smaller.Cheaper.

What we have come to expect from improvements in integrated circuit technology can be applied to instrumentation systems.

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Monolithic Instrument Technologies

Elevated Photodiode Arrays.OLED Microdisplays.Digital Micromirror Arrays.

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a-Si:H Elevated Photodiodes

Hydrogenated amorphous silicon is a deposited semiconductor.Bandgap ~1.8 eV.

AdvantagesHigher QE.Tunable spectral response.Lower thermal effects.Higher fill factor.Cheaper imager.

DisadvantageSubject to metastabilities that can affect performance (Staebler_Wronski Effect).

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Dielectric Isolation Interconnect

InsulatorTransparent Conductor

Top contact conductor

p-type

n-type

i-type

Bottom Contact

Two extra masking levels.Requires a dry etch with high selectivity between two conductivematerials.

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TFT-Based Monolithic Interconnections

R. A. Street (ed.), Technology and Applications of Amorphous Silicon. Springer, p 162 (2000).

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Local-via Monolithic Interconnect Structure

Transparent Conductor

p a-Si:H

i a-Si:H

n a-Si:H

Bottom Contact

IC Passivation

Top Conductor Contact

US Patent 6018187

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Elevated a-Si:H Photodiodes- Pixel Size Reduction

a)

c-Si 3T Pixel a-Si:H 3T Pixel

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Integrated a-Si:H Photodiode/CMOS Stack

0.35 µµµµm 4LM CMOS process. 5.9 µµµµm square pixel, on a 7 µµµµm pitch.Interpixel isolation created by etching of the n-layer a-Si:H.Planarized passivation layer.

Photodiode Array

Si substrate

Interconnect

Pixel contact viaPassivation

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a-Si:H Material Properties

0 100

1 1016

2 1016

3 1016

4 1016

5 1016

0.70 0.80 0.90 1.00

g(E)

(cm

-3 eV

-1)

Ec - E (eV)

J. Theil, D. Lefforge, G. Kooi, M. Cao, G. Ray, 18th ICAMS Proc., J. Non-crystalline Solids, in press, 2000.

Integrated DOS ~2.5 - 4 x 1015

cm-3.Mid-gap peak ~ 0.88 eV from the conduction band edge.

A second peak at ~ 0.83 eV.1.85 eV band-gap.Ea ~ 0.9 eV.EU ~ 56 meV.

Deposition Rate > 30Å/s.

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Effect of p-layer thickness on quantum efficiency

0

0.2

0.4

0.6

0.8

1

400 450 500 550 600 650 700

200A p-Layer

100A p-Layer

Wavelength (nm)

Qua

ntum

Effi

cien

cy (e

l/ph)

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Effect of layer doping on quantum efficiency

0

0.2

0.4

0.6

0.8

1

400 450 500 550 600 650 700

AA008 Spectral Response(Effect of B Doping)

LD p Layer (08)Control (09)LDp LDn (12)No n-layer (20)

Wavelength (nm)

Qua

ntum

Effi

cien

cy (e

l/ph)

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Dark Current Components

Two components of dark current:

Junction leakage.Array edge leakage.

Guard ring prevents edge current from reaching the array.

Sweep guard ring and area diode together.

Assume: Ix = 0.IE = IA Aring/Aarea diode.

IE IxIAIB

ιctrιito ιring

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Dark Current Density vs Electric Field

1.E-12

1.E-11

1.E-10

1.E-09

1.E-08

0.0E+00 5.0E+04 1.0E+05 1.5E+05 2.0E+05 2.5E+05Electric Field (V/cm)

Cur

rent

Den

sity

(A/c

m2)

9000A7500A5500A4000A3000A

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Structures and Junction Parameters

n-layer thickness: 500Å. ([P] 2 x 1020 cm-3)i-layer thickness: 3000 to 9000Å. (5500Å default value)p-layer thickness: 200Å. ([B] 7 x 1019 cm-3)

Guard ringArea Diode

Edge Intensive Diode

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Effect of Pixel Edge Length on Reverse Bias Current (3000Å I-layer)

1.E-12

1.E-11

1.E-10

1.E-09

1.E-08

1.E-07

1.E-06

1.E-05

0 2 4 6 8 10Voltage (V)

Cur

rent

Den

sity

(A/c

m2)

1.23E+06 microns5.77E+05 microns1.94E+05 microns5.95E+04 microns2.11E+04 microns3.84E+03 microns

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Stacked Elevated Photodiode Concept

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Optical Response of Stacked Diode Elements

0

0.2

0.4

0.6

0.8

1

400 450 500 550 600 650 700

800A i2000A i9000A i 2000A i Filter9000A i

Qua

ntum

Effi

cien

cy (e

-/ph)

Wavelength (nm)

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a-Si:H Color Sensor Image (640x480 4.9 x 4.9 µµµµm pixel, 1900 lux)

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OLED MicrodisplaysOrganic Light-Emitting Devices (OLEDs)

Charge transport mechanism: localized state-based hopping.Use for large area emissive displays, fabricated using evaporation or printing.Just gaining acceptance.Has lifetime issues.

ApplicationsEyepiece imagers (digital cameras).Eyeglass displays.

ComputersInstrumentation

Advantages over LCD microdisplaysSmallerBrighter (more power efficient).Less expensive (fewer components required).

Thanks to Howard Abraham for driving the Ft.Collins Development

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Microdisplay Systems

LEP

CMOS SiliconAPIX

Value Proposition:S impler, Cheaper, Brighter

M icrod isplay Based onLight Em itting Polym ers

LCD/LED-based Microdisplays

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Organic LED Materials

Organic LED’s: Materials and Devices

Alq3 (ETL, EML)NPD (HTL) R-PPV (EML)

Polymers (spin cast)

HTL: conducing polymers (PDOT, PANI)ETL, EML: polyphenylenevinylenes, fluorenes

CDT, Philips, Uniax, Dow Chemical, DuPont

Small Molecules (vacuum evaporated)HTL: metal-phthalocyanines, arylamines (CuPc, NPD)ETL, EML: metal chelates, distyrylbenzenes

Eastman Kodak, Pioneer, Idemitsu Kosan, Sanyo, FED Corp., TDK

NO

NO

Al O

N

N N

R1R1

n

Polyfluorene (EML)

R1

R1n

OLEDs rely on organic materials(polymers and small molecules)that give off light when tweakedwith an electrical current

Low work function cathode (Ca, Mg, Li/Al)

High workfunction anode(ITO, Au, Pt)

V

Glass

HoleTransport

Layer

ElectronTransportEmission

Layer

Light

Operating voltage ~10V Operating voltage ~5V

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Organic Electroluminescence

CDT: http://www.cdtltd.co.uk

Organic electroluminescence by charge injection

� Hole injection from high work function transparentanode (ITO) and transport through HTL

� Electron injection from low work function cathode(Ca, Mg, LiF/Al, CsF/Al) and transport through ETL

� Since IP < EA electrons are blocked by HTL andholes tunnel to ETL

� Formation of excitons and light emission from ETL

� Diode-like I-V (no light on reverse bias)

� Low turn-on voltage ( ~ 2 V)� Operating voltage >> turn-on voltage

Charge Injection limitationsCharge Transport limitations

� Efficiency1-5% ph/el1-22 lm/W

LUMO

HOM O

Cathode (Ca, Mg)(~ 2.9 - 3.7 eV)

HTL ETL, EML

++ +++

+

Anode (ITO)(~ 4.8- 5.1 eV)

+

HOMO

DIP

LUMO

DEA

Polymer OLED

400 500 600 7000.0

0.2

0.4

0.6

0.8

1.0 EL PL

125 nm

Lum

ines

cenc

e in

tens

ity (

arb.

uni

ts)

Wavelength (nm)

NPD/Alq3

-

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OLED Diode Construction

Process Overview for APIX/LEP Microdisplay

Emitted Light

APIX Active MatrixCircuit on Silicon

Light Emitting Polymer(Diode)

Cathode (Semitransparent)

S eal Layer (Transparent)

Device Layout:

ANODE ANODE ANODE

Light Emitting Polymer (Diode) Electrica l Schematic

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OLED Challenges

Environmental sensitivity.Device lifetime.

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OLED Diode Structure

Process Overview for APIX/LEP Microdisplay

Specific Fabrica tion Steps (sequence is bottom up):

• Functional te s t, Mount chips to daughter board, Wirebond pads to board, Final te s t

• Encapsula te ca thode with seal process s teps . N2atmosphere .

• Thermally evaporate semitransparent ca thode us ing die-s ized shadow mask. N2 a tmosphere .

• S pin Electron Transport Layer (a lso the Emiss ion Layer)light emitting polymer. N2 a tmosphere .

• Bake P EDOT (180ºC, 1 hr).• S pin Hole Transport Layer (PEDOT).• S urface clean (IP A/O2 Plasma).• Final meta lliza tion optimized for anode and bonding

pads . Anodes form re flective pixels . Functional te s t.

P rocess APIX on 6” or 8” s ilicon wafers .APIX Active MatrixCircuit on Silicon

P EDOT Layer (HTL)

P olymer Layer (ETL, EML)

Semitransparent Cathode Layer 2

Semitransparent Cathode Layer 1

Transparent Passivation Layer 1

Transparent Passivation Layer 2

Device Layout:

ANODE ANODE ANODE

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OLED Microdisplay Driver Circuits

Pulse-width modulation pixel driver circuit.

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OLED Microdisplay Operation

© MGM

© MGM

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Digital Micromirrors

Invented at Texas Instruments in 1987 (by Larry Hornbeck).Build hinged mirrors from BEOL metallization over SRAM pixels. Operates by electrostatic attraction between mirror and pixel electrodes.

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Digital Micromirror- Construction

© Texas Instruments

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Digital Micromirror- Schematic

© Texas Instruments

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Digital Micromirror- Mechanics

© Texas Instruments

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Digital Micromirror- Applications

Projections DisplaysDigital Movie ProjectorsDigital Printing and Photofinishing3D Non-holographic displaysMaskless photolithography

DNA sequencingBroadband switchingHolographic storage… Anywhere LCD can be used, with higher contrast.

http://www.dlp.com/dlp_technology/images/dynamic/white_papers/152_NewApps_paper_copyright.pdf

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Integration ChallengesKnown Issues

Material compatibility with the “nominal” process flow.Adverse effects of the standard structures.Adverse effects of the new structures.

Manufacturability of new unit modules.Materials optimization.

Material performance considerations.Integration compatibility considerations.

Unknown IssuesThere will be plenty of them.We encountered 8 major issues in one project.

Example: The 9 causes of adhesion failure.

Expect the unknown!

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The Future

Integrated circuit manufacturing platforms can be extended to make monolithic instruments.Many classes of monolithic instruments can be created.The attributes of monolithic instruments enable hundreds of new applications.

Low costSmall size

There are plenty of opportunities out there.Who is going to take advantage of them?