non-standard test setups for optoelectronic cots
TRANSCRIPT
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Non-standard Test Setups forOptoelectronic COTS
Juan BARBERO ([email protected])
Optoelectronic Department
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Non-standard Test Setups for Optoelectronic COTS
• What do I mean by Non-Standard?.
• Test Setups• Image Sensor Radiation Test• Thermal Vacuum• Temperature characterization with fiber bundles• Combined Temperature Radiation Tests• Monitoring Optical data• Optical Switches• Q-Carrier Laser Screening
• Summary
Index
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What do I mean by
Non-Standard
Optical Testing
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Sometimes optical aspects depend
on the point of view
“We cannot do it”
is NOT our answer,
but
“Please, give us some time
to think about it”.
http://www.taringa.net/posts/imagenes/14127661/Las-mejores-
ilusiones-opticas--Increibles.html.
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What do I mean by
Non-Standard
Non-Standard Solutions
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Rutan’s SpaceShipOnehttp://www.sott.net/image/s5/114181/full/Rutan_Image_2.jpg
Goventosa’s One Wheel Bike http://blog.hemmings.com/index.php/2010/11/22/m-goventosas-one-wheel-
to-obscurity/
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• Design and development of custom cameras• Support for CMOS and CCD image sensors
• Characterization of pixel performance• According to EMVA1288 standard and ESA standards
• On-line monitoring of electrical parameters and acquisition of
images in different working conditions• Radiation
• Temperature
• Vacuum
1- Low Cost Image Sensor Rad Test
FPGA
Board
RS232
Socket
Board
Driving
Board
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1- Low Cost Image Sensor Rad Test
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On-line monitoring
Pixel performance
Radiation tests
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Thermal Vacuum
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2- Thermal Vacuum Test Setup
Thermal Vac System (Our own design)
Temperature range: -184ºC to +200ºC
Vacuum range: ambient to 10E-7 mbar
Temperature rate: <2ºC/min
Multiple optical feed-through
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Thermal Vacuum
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2- Thermal Vacuum Test Setup
THERMAL VACUUM TEST TO OPTICAL ISOLATORS
MONITORING OPTICAL LOSSES
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Fiber Bundles
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3 – Fiber Bundles for parallel Testing
- Photodiode characterization in Temp
- One branch for Optical power monitored in
parallel with PD measuremnts
- Variations of the light source have no impact on
responsivity measurements
- LED parallel characterization
- Used for UV Photodiodes in REMS (Curiosity Rover)
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Combined Testing
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4 – Combined Temperature - Radiation
Radiation at Low Temperature
• High Voltage Optocoupler- Small temp chamber with window.
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Combined Testing
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Higher degradation with Protons at Low Temp (-40ºC) than at RT.
The low Temp degradation is maintained when going back to RT.
Higher degradation when radiated at actual operational conditions
4 – Combined Temperature - Radiation
Main Results
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Life Test Setups
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5 – Monitoring data during long test
- Multiple Peltier controllers
- Parallel monitoring with PD out of high Temp area
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23 Julio 2010
Test SETUP
Triple Photodiode Characterization Setup
Integrating Sphere for uniform illumination
Direct Exposition for Linearity with higher Optical Power Input
Cascade Peltiers for better cooling
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5 – Monitoring data during long test
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Life Test Initial Increase of reverse current with temperature the first time
Stabilized after 24 hours aprox and only the first time
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5 – Monitoring data during long test
Tri-PD Main Results: Life Test
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23 Julio 2010
Radiation TestGamma and Proton Rad
Dark current monitoring
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5 – Monitoring data during long test
Tri-PD Main Results: Rad Test
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23 Julio 2010
Radiation Test
Proton Rad
Reverse Current Monitored
Tri-PD Main Results: Proton Radiation
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• PM Tunable Laser, PM Switches, PM Splitters
• Optical Amplifier: Monitored Gain and NF
6- Optical Switches for Monitoring
EDFAs Radiation Test
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• Actual Setup at Rad Facility
• Variable Dose Rate
6- Optical Switches for Monitoring
EDFAs Radiation Test
PUMP
LASERS
EDFA
ModulesSwitches
Splitters
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• Tunable wavelength
• Selectable Laser Input power and Pump
• Variable Dose Rate
6- Optical Switches for Monitoring
EDFAs Radiation Test
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7- Pump Laser Evaluation for Raman
Britespace FP7 Raman Project Pump lasers at 808nm for RAMAN on Mars
Screening of Q-Carrier Lasers with need to transport for test.
Minimize the number of contacts
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- Many times Non-Standard Test Solutions are needed
- Combined testing can give light to hidden problems
- Monitoring data during long test provides a lot of
information
- No variations of the setups during monitoring
- Real evolution during tests.
- INNOVATION… also for TESTING
SUMMARY
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Thank you
for your attention
Contacts:
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