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Copyright 2005-2011, IPVision Inc., All Rights Reserved Report Date: January 13, 2011

Preliminary Technology Landscape Sub-100 nanometer IR spectroscopy and imaging

For NSF SBIR Program Grantee: Anasys Instruments Corp.

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IPVision Patent Landscape Map

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Sub-100 nanometer IR spectroscopy and imaging For : Anasys Instruments Corp.

Table of Contents

1. HOW TO USE THIS REPORT .............................................................................. 2 1.1 FREEDOM TO OPERATE/WHITE SPACE IDENTIFICATION................................................. 2 1.2 IDENTIFICATION OF COMPETITORS, POTENTIAL PARTNERS AND CUSTOMERS................. 3 1.3 IDENTIFYING INNOVATION OPPORTUNITIES ................................................................... 3

2. EXECUTIVE SUMMARY ...................................................................................... 3

3. EXISTING PATENTS OF ANASYS INSTRUMENTS.................................................... 5 3.1 PORTFOLIO INTERCONNECTION MAP ............................................................................ 5 3.2 IMMEDIATE PATENT CITATION LANDSCAPE ................................................................... 6

3.2.1 Forward Citation Patents .............................................................................................7 3.3 COUSIN LANDSCAPE.................................................................................................... 7

3.3.1 Backward Cousin Analysis ..........................................................................................7 4. SEARCH TERMS AND RESULTS........................................................................ 10 4.1 SEARCH TERMS......................................................................................................... 10 4.2 SEARCH RESULTS – THERMAL ANALYSIS................................................................... 10 4.3 SEARCH RESULTS – IR SPECTROSCOPY ................................................................... 11

5. COMPANY ANALYSES ..................................................................................... 12 5.1 ATOMIC FORCE MICROSCOPY SECTOR ...................................................................... 13

5.1.1 Veeco.........................................................................................................................13 5.1.2 Molecular Imaging Corporation .................................................................................14

5.2 THERMAL ANALYSIS SECTOR ..................................................................................... 15 5.2.1 TA Instruments ..........................................................................................................15 5.2.2 Mettler Toledo............................................................................................................16

APPENDICES AND EXHIBITS...................................................................................... 19 APPENDIX A – HOW TO READ AN IPVISION MAP.................................................................. 19

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Confidentiality and Disclaimers

CONFIDENTIALITY NOTE: This document contains information which is privileged and confidential. This information is intended to be for the use of the individual or entity named on the document. If you are not the intended recipient of this document, be aware that any disclosure, copying, distribution, or use of the contents of the information contained herein is strictly prohibited. If you have received this document in error, please notify IPVision immediately by email at service@ipvisioninc.com or by calling (617)-475-6000. Thank You.

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DATA LIMITATIONS; ERRORS: IPVision has prepared this report from information which to the best of our knowledge is complete and accurate. NOTE: Electronic data from the United States Patent and Trademark Office is not available for patents issued prior to 1976. IPVision makes NO REPRESENTATIONS OR WARRANTIES as this Report’s completeness, accuracy or fitness for any purpose. If you find any errors in this Report please notify IPVision and we will rerun this report with corrected data if possible.

THIS REPORT IS NOT LEGAL ADVICE. IPVision provides statistics and analyses of data using various methodologies and algorithms. Any suggestions and recommendations presented in this report are based on these algorithms, which are not designed to make and do not purport to be legal conclusions or recommendations. Please consult with your legal advisor before acting on any information in this Report.

This Preliminary Technology Landscape Report is only one of the reports and services offered by IPVision. For more information about these additional services please contact your IPVision representative or you may request information by email (info@ipvisioninc.com), by telephone 617-475-6000 or by fax 617-475-6001. IPVision, Inc., Kendall Square @ MIT, One Broadway, Cambridge, MA 02142. www.ipvisioninc.com

1. HOW TO USE THIS REPORT The goal of this Preliminary Technology Landscape Report is to provide insights into three areas of importance to a technology commercialization strategy:

1. Freedom to Operate/White Space Identification.

2. Identification of Competitors, Potential Partners and Customers.

3. Identifying Innovation Opportunities.

1.1 FREEDOM TO OPERATE/WHITE SPACE IDENTIFICATION “Freedom to Operate” means that if the NSF SBIR Grantee pursues a given technology commercialization strategy it will not infringe the patent rights of others. This is a fundamental issue which needs to be addressed in any technology commercialization analysis. “White Space” refers to an area in which there are few if any patent restrictions and in which the Grantee will have a range of technology choices with few if any patent infringement issues.

Identify Specific Patents. The first step in a Freedom to Operate analysis is to identify existing patents and patent applications that may have claims that cover the Grantee’s proposed products or services. The existing patent landscape presented in this report should be reviewed to identify specific patents that may pose a problem. This can often be done by reading the title and abstract to narrow down the patents to be investigated further with the Grantee’s technologists and legal counsel.

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Look For Trends. Even if there are no existing patents that pose a problem, there may be patent applications that have not become public but that could create problems for the Grantee if and when the Grantee’s products or services are ready to launch. The patent landscape presented in this report should be investigated to see if any “trends” are indicated. For example if a company in the landscape has recently increased its patent application activity these applications may suggest a research and/or product direction for further investigation.

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1.2 IDENTIFICATION OF COMPETITORS, POTENTIAL PARTNERS AND CUSTOMERS In some cases patent applications are filed at the beginning of a research and development project. In these cases the applications can give an early view into the investments that are being made by a company. In other cases the patent applications are a result of ongoing research and development and show the direction being pursued by the investment in R&D. Often both situations are represented in the patent landscape.

The NSF SBIR Grantee should look at the landscape from the perspective of identifying competitive threats, i.e., companies that are directly pursuing similar technology goals as the Grantee. In some cases these potential competitors may represent potential partners or customers. This may be suggested by the fact that the patents are in the same area but the technologies revealed through the patents may not be viable whereas the Grantee may actually have a better approach – i.e. the Grantee has solved the problem that the other companies’ patent filings show are being addressed.

1.3 IDENTIFYING INNOVATION OPPORTUNITIES The U.S. patent system is a “contract” between an inventor and society in which the inventor is granted a limited time monopoly (to control the use of his/her invention) in exchange for disclosing the details of the invention. The idea is that the disclosure of the invention increases the knowledge base of society and ultimately leads to further innovations.

The problem with this “contract” is that the knowledge disclosed in patent applications is difficult to extract. Patents are dense legal documents that non-lawyers find difficult to process. This is where the patent landscape presented in this report can help the knowledge transfer process. Consider the first time that a genomics patent cites a microprocessor patent- this is an early indicator of an innovation at the intersections of technologies- e.g. a “lab on a chip”.

The NSF SBIR Grantee reviewing this Preliminary Technology Landscape should be alert for possible novel applications of technology represented by the patterns of patent citations presented, especially in the IPVision patent maps shown.

2. EXECUTIVE SUMMARY

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Area of Investigation: Sub-100 nanometer IR spectroscopy and imaging

Client: Anasys Instruments Corp.

Anasys Patents: Anasys Instruments provided a list of the U.S. patent properties that are owned by Anasys or have been in-licensed. IPVision investigated the patent landscape around these patents. The top three patent owners in this immediate landscape are IBM (13 patents – 6 citing Anasys), TA Instruments (13 patents – 6 citing Anasys) and Veeco Instruments (7 patents – 4 citing Anasys), Other parties in the “Cousin” landscape include General Nanotechnology (24 patents), Memscap (15 patents) and Nanochip, Inc. (12 patents).

Keyword Searches: Anasys Instruments provided IPVision with the keywords for searching in the areas of

Thermal Analysis and IR Spectroscopy. These keywords did not reveal many patents of interest, In the Thermal Analysis area 19 patents or applications were found, including patents owned by TA Instruments and Sony. In the IR Spectroscopy area only 4 patent properties were found, including one from Battelle (U.S. U.S. 6,108,081 “Nonlinear vibrational microscopy” that has been cited by 34 other patents.

Companies: Anasys Instruments is positioning its technology at the intersection of three

instrumentation sectors: (1) Atomic Force Microsopy, (2) Thermal Analysis and (3) IR Spectroscopy. This Preliminary Technology Landscape Report presents the patent

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portfolios of key players identified by Anasys Instruments in these spaces: Veeco, Molecular Imaging Corporation, TA Instruments and Mettler Toledo.

Access to the IPVision ADVANTAGE™ Analytics Solution:

Clients with subscriptions can log into the IPVision ADVANTAGE™ Analytics Solution over the internet and access the results of this report and run further analytics in real time. An account has been established for this project on IPVision ADVANTAGE™. To access this account directly go to: http://ipvisioninc.com/login and where it asks for an Organization ID enter “NSF”. At the next screen enter ‘ipvsample” as the UserID and then the password “password”. Where there are Live Links in this report simply click on the Link and it will take you to the specific document stored on IPVision ADVANTAGE™.

Important Note About Data. The analyses presented in this Report were based on data as of January 13, 2011 – i.e., the patents listed for a given company represent patents owned of record as shown at the U.S. Patent and Trademark Office databases as of that date. Patents issued to, acquired by or disposed of by such a company after January 13, 2011 will not appear in the list of patents shown in this Report or on IPVision ADVANTAGE™. However, patents that issue after January 13, 2011 that cite a patent shown in an analysis in this Report will appear in any citation analysis run after January 13, 2011 on the information stored on IPVision ADVANTAGE™. In such as case there will be an inconsistency between the results presented in this Report (which is a snapshot in time) and the results shown on IPVision ADVANTAGE™.

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Report Date: January 13, 2011

3. EXISTING PATENTS OF ANASYS INSTRUMENTS Where the NSF SBIR Grantee owns or licenses issued U.S. patents or pending published U.S. patent applications the first step in understanding the Technology Landscape is to investigate the Grantee’s patent portfolio.

Anasys Instruments provided IPVision with a listing of 7 owned and in-licensed U.S. patents. Of these 6 are owned by TA Instruments and have been in-licensed by Anasys Instruments:

View “List of 7 Patents” on IPVision Advantage™ ► Link to List

3.1 PORTFOLIO INTERCONNECTION MAP Citation References: In order to obtain a patent an inventor must show that the invention claimed is “novel”, i.e., that there is no “prior art” (including previously issued patents) that describes the invention. All relevant prior art known by the inventor or found by the USPTO examiner must be cited in the patent when it issues. These are called the Citation References. Citation Interconnection Map™: For a given group of patents an IPVision Citation Interconnection Map™ shows if and how that group of patents is related through patent Citation References. See Appendix A for information about How to Read an IPVision Map. The following IPVision Patent Citation Interconnection Map shows the Anasys Instruments U.S. patent portfolio:

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Citation Interconnection Map™ of Anasys Instruments Portfolio

Observations

The 6 “red topped” patents that form a Citation Cluster are the patents that have been in-licensed from TA Instruments. The patent on the left side is U.S. 5,248,199 “Method and apparatus for spatially resolved modulated differential analysis” and has expired due to the passage of time – this is shown by the vertical red dashed line. The blue topped patent in the lower right of the map is U.S. 7,497,613 “Probe with embedded heater for nanoscale analysis” and is owned by Anasys Instruments.

Note: For Information about Reading IPVision Maps, see Appendix A

View Live Interconnection Map™ ► Map Link

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3.2 IMMEDIATE PATENT CITATION LANDSCAPE

The Patent Citation Interconnection Map shows the citation relationships within the portfolio. A Patent Landscape Map looks at the immediate patent landscape to see what patents were cited as prior patent art by patents in the portfolio and to understand what new patents are citing the portfolio as prior art. The following is an IPVision Landscape Map™ showing the Anasys Instruments U.S. Patent Portfolio (shaded in yellow on the live map), the U.S. patents or applications cited by the Anasys Instruments U.S. Patent Portfolio (“Backward Citation Patents” or “BCs”) and the other U.S. patents that cite the Anasys Instruments U.S. Patent Portfolio (“Forward Citation Patents” or “FCs”).

Patent Citation Landscape Map™ for Anasys Instruments U.S. Patent Portfolio

The patents shown with stars below are “seminal” in that they have been cited more than 20 times by other patents

The patents shown with pentagons below are EXPIRED due to NON-PAYMENT of Maintenance Fees:

Note: For information about Reading IPVision Maps, see Appendix A View Live IPVision Map™ ► Link to Map

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Investigate Seminal Patents. The Seminal Patents highlighted in the Patent Landscape Map should be investigated to determine (1) whether they might constitute “blocking patents” and (2) what technology

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and/or product strategy they may reveal and whether they create business opportunity or risk. Expired Patents Due to Non-Payment. The Expired Patents highlighted in the Patent Landscape Map should be reviewed. Because Expired Patents can not be infringed they may represent a “white space” where Anasys could be free to operate – a legal review is necessary to determine this. Another reason to look at Expired Patents is to consider whether their owners might be potential business partners or customers if the reason that the patents were allowed to expire involved technical difficulties that the technologies being pursued by Anasys could solve.

3.2.1 FORWARD CITATION PATENTS The Anasys Instruments U.S. Patent Portfolio patents are cited as prior art by 54 other U.S. patents (“Forward Citation Patents”).

View Forward Citation Patents on IPVision Advantage™ ► Link to List

According to the U.S. Patent and Trademark Office records, the Current Assignee/Owners of the Forward Citation Patents are:

View Current Assignees of Forward Citation Patents ► Link to Analysis

3.3 COUSIN LANDSCAPE Only one of the 7 patents in the Anasys Instruments U.S. Patent Portfolio is owned by Anasys Instruments: U.S. 7,497,613 “Probe with embedded heater for nanoscale analysis” (the other 6 patents have been in-licensed from TA Instruments). We investigated this Anasys owned patent (the ‘613 Patent) further by conducting a a “Cousin Analysis” to find patents that are cited by the same patents that cite the ‘613 Patent (“Forward Cousins”) and to find patents that cite the same patents that the ‘613 Patent cites (“Backward Cousins”). These “Cousins” comprise an extended “parallel citation landscape” of the ‘613 Patent.

The ‘613 Patent cites 14 other U.S. patents as prior patent art. However, because it was only recently issued no other patents cite it. As a result we could only conduct a Backward Cousin Analysis

3.3.1 BACKWARD COUSIN ANALYSIS

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IPVision investigated the “Backward Cousin” patents of the ‘613. Patent (for this purpose called the “Starting Set Patent”). Backward Cousin patents are patents that cite the same patents that are cited by

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the Starting Set Patent – they are called “Backward Cousins” because to identify them we begin with the Starting Set Patent and we go “backward in time” to find the patents that are cited by the Starting Set Patent (BCs or Backward Citations) and then we go “forward in time” from the BCs to find other patents that also cite the BCs:

What Are Backward Cousin Patents?

BC1 and BC2 are “Backward Citation” Patents – they are cited by the Starting Set Patent(s)

Starting Set Patent(s)BC1

BC2

B-Cousin

B-Cousin

B-Cousin

TIME

Starting Set Patent(s)BC1

BC2

B-Cousin

B-Cousin

B-Cousin

TIME

These B-Cousins are the Backward Cousins of the Starting Set Patent(s) – they cite the same patents as the Starting Set Patent(s)

Excluding the Starting Set Patent, there are 161 Backward Cousin Patents that cite the Backward Citation Patents.

View Live List of Backward Cousin Patents ► Link to List

3.3.1.1 OWNERS OF BACKWARD COUSIN PATENTS According to the U.S. Patent and Trademark Office records, the Current Assignee/Owners of the Backward Cousin Patents are:

View Current Assignees of Backward Cousin Patents ► Link to Analysis

3.3.1.2 BACKWARD COUSIN INTERCONNECTION MAP

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A Backward Cousin Interconnection Map™ is a visual view of the citation relationships among the Starting Set Patent, the Backward Citation Patents that the Starting Set Patent cites and the other patents

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(Backward Cousin Patents) that also cite the Backward Citation Patents. On the live IPVision Map shown below, the ‘613 Patent is shaded in yellow and appears toward the right

f

bottom area. The Backward Citation Patents it cites as prior art are shaded in green. There is a cluster ored-topped patents of General Nanotechnology LLC in the upper middle of the map:

Backward Cousin Interconnection Map™ for U.S. 7497613

The patents shown with stars below are “seminal” in that they have been cited more than 20 times by other patents

The patents shown with pentagons below are EXPIRED due to NON-PAYMENT of Maintenance Fees:

Note: For information about Reading IPVision Maps, see Appendix A View Live IPVision Map™ ► Link to Map

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4. SEARCH TERMS AND RESULTS

4.1 SEARCH TERMS IPVision was provided with the

following search terms: Thermal Analysis: -localized thermal analysis -nanoscale thermal analysis -spatially resolved thermal analysis of heterogeneous samples IR Spectroscopy: -localized IR spectroscopy -nanoscale IR spectroscopy -spatially resolved IR Spectroscopy of heterogeneous samples

Fields Searched: Title and Abstract.

Data Source: U.S. Patent and Trademark Search Sites for Issued U.S. Patents and

Published U.S. Applications.

Date Searched: January 13, 2011

4.2 SEARCH RESULTS – THERMAL ANALYSIS A total of 8 separate searches for “Thermal Analysis” were conducted in the US Patent and Trademark patent database using the keywords provided by Anasys Instruments. The searches, terms and resulting patent counts are summarized below with live links to the IPVision Advantage™ Analytics System:

Thermal Analysis Search

# Search Terms Field Searched # Patents Found

1 localized thermal analysis Title 32 localized thermal analysis Abstract 83 nanoscale thermal analysis Title 0 4 nanoscale thermal analysis Abstract 0 5 Spatially resolved thermal analysis of heterogeneous samples Title 826 Spatially resolved thermal analysis of heterogeneous samples Title 0 7 Spatially resolved thermal analysis of heterogeneous samples Abstract 3598 Spatially resolved thermal analysis of heterogeneous samples Abstract 9

These searches yielded few results of potential interest. We combined the results of Searches 1, 2 and 8 into a single list consisting of 19 patents. We then prepared a Patent Citation Interconnection Map for these 19 patents:

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Patent Citation Interconnection Map™ for 19 “Thermal Analysis” Patents

The patents shown with stars below are “seminal” in that they have been cited more than 20 times by other patents

The patents shown with pentagons below are EXPIRED due to NON-PAYMENT of Maintenance Fees:

Note: For information about Reading IPVision Maps, see Appendix A

View Live IPVision Map™ ► Link to Map

4.3 SEARCH RESULTS – IR SPECTROSCOPY A total of 6 separate searches for “IR Spectroscopy” were conducted in the US Patent and Trademark patent database using the keywords provided by Anasys Instruments. The searches, terms and resulting patent counts are summarized below with live links to the IPVision Advantage™ Analytics System:

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IR Spectroscopy

Search# Search Terms Field Searched # Patents

Found 9 localized IR spectroscopy Title 0 10 localized IR spectroscopy Abstract 311 nanoscale IR spectroscopy Title 0 12 nanoscale IR spectroscopy Abstract 0 13 Spatially resolved IR spectroscopy of heterogeneous samples Title 0 14 Spatially resolved IR spectroscopy of heterogeneous samples Abstract 1

These searches yielded few results of potential interest. We combined the results of Searches 10 and 14 into a single list consisting of 1 patent and 3 patent applications. We then prepared a Patent Citation Interconnection Map for these 4 patent properties:

Patent Citation Interconnection Map™ for 4 “IR Spectroscopy” Patent Properties

The one patent (blue-topped) patent is U.S. 6,108,081 “Nonlinear vibrational microscopy” is owned by Battelle and has been cited by 34 other patents.

Note: For information about Reading IPVision Maps, see Appendix A View Live IPVision Map™ ► Link to Map

5. COMPANY ANALYSES

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Anasys Instruments’ positioning is at the intersection of three instrumentation sectors: Atomic Force Microscopy: ($250Mill/yr) A probe based nanoscale imaging platform that is moving

towards property measurements. Thermal Analysis: ($400 Mill/yr) Bulk Thermal Analysis Property Measurements. IR Spectroscopy: ($1Bill/yr) Bulk IR Property Measurements.

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Anasys Instruments has provided the names of companies that operate within each of these instrumentation sectors. This section of the report presents views on the patent portfolios of some of these companies.

5.1 ATOMIC FORCE MICROSCOPY SECTOR The companies identified in this sector are: Bruker-Nano (Formerly Veeco); Agilent (Formerly Molecular Imaging)

5.1.1 VEECO A search of the U.S. Patent and Trademark Office (USPTO) patent databases for Veeco found 268 issued U.S. patents and 86 published U.S. patent applications, of which 43 had issued as U.S. patents.

View “List of 268 Patents” on IPVision Advantage™ ► Link to List

View “List of 86 Patent Applications” on IPVision Advantage™ ► Link to ListView “List of 43 Pending Patent Applications” on IPVision Advantage™ ► Link to List

5.1.1.1 MAIN USPTO CLASSES FOR VEECO The U.S. Patent and Trademark Office (“USPTO”) has established a U.S. Patent Classification (“USPC”) System that describes areas of technology and invention. There are approximately 450 Classes of invention and 150,000 subclasses of invention in the USPC. When a patent application is received by the USPTO the claims are reviewed and the application is assigned to one or more classes within the USPC System. According to the USPTO: “A patent classification . . . represents a searchable collection of patents grouped together according to similarly claimed subject matter.” The top 10 USPTO Main Classes for the Veeco Patent Portfolio are:

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View Main Class Analysis of Veeco Patents ► Link to Analysis

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5.1.1.2 VEECO PATENT CITATION INTERCONNECTION MAP

Patent Citation Interconnection Map™ for Veeco Patent Properties

The patents shown with stars below are “seminal” in that they have been cited more than 20 times by other patents

The patents shown with pentagons below are EXPIRED due to NON-PAYMENT of Maintenance Fees:

Note: For information about Reading IPVision Maps, see Appendix A View Live IPVision Map™ ► Link to Map

5.1.2 MOLECULAR IMAGING CORPORATION A search of the U.S. Patent and Trademark Office (USPTO) patent databases for Molecular Imaging Corporation found 31 issued U.S. patents and no pending published applications.

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View “List of 31 Patents” on IPVision Advantage™ ► Link to List

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5.1.2.1 MOLECULAR IMAGING PATENT CITATION INTERCONNECTION MAP

Patent Citation Interconnection Map™ for Molecular Imaging Corp.

The patents shown with stars below are “seminal” in that they have been cited more than 20 times by other patents

The patents shown with pentagons below are EXPIRED due to NON-PAYMENT of Maintenance Fees:

Note: For information about Reading IPVision Maps, see Appendix A View Live IPVision Map™ ► Link to Map

5.2 THERMAL ANALYSIS SECTOR The companies identified in this sector are: TA Instruments; Mettler Toledo; Perkin Elmer

5.2.1 TA INSTRUMENTS A search of the U.S. Patent and Trademark Office (USPTO) patent databases for TA Instruments found 59 issued U.S. patents and 86 published U.S. patent applications, of which 43 had issued as U.S. patents.

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View “List of 59 Patents” on IPVision Advantage™ ► Link to List

5.2.1.1 TA INSTRUMENTS PATENT CITATION INTERCONNECTION MAP Patent Citation Interconnection Map™ for TA Instruments

The patents shown with stars below are “seminal” in that they have been cited more than 20 times by other patents

The patents shown with pentagons below are EXPIRED due to NON-PAYMENT of Maintenance Fees:

Note: For information about Reading IPVision Maps, see Appendix A

View Live IPVision Map™ ► Link to Map

5.2.2 METTLER TOLEDO A search of the U.S. Patent and Trademark Office (USPTO) patent databases for Mettler Toledo found 521 issued U.S. patents and 186 published U.S. patent applications, of which 107 had issued as U.S. patents.

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View “List of 521 Patents” on IPVision Advantage™ ► Link to ListView “List of 186 Patent Applications” on IPVision Advantage™ ► Link to List

View “List of 79 Pending Patent Applications” on IPVision Advantage™ ► Link to List

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5.2.2.1 MAIN USPTO CLASSES FOR METTLER TOLEDO

The top 10 USPTO Main Classes for the Mettler Toledo Patent Portfolio are:

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View Main Class Analysis of Mettler Toledo Patents ► Link to Analysis

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5.2.2.2 METTLER TOLEDO PATENT CITATION INTERCONNECTION MAP

Patent Citation Interconnection Map™ for Mettler Toledo

The patents shown with stars below are “seminal” in that they have been cited more than 20 times by other patents

The patents shown with pentagons below are EXPIRED due to NON-PAYMENT of Maintenance Fees:

Note: For information about Reading IPVision Maps, see Appendix A View Live IPVision Map™ ► Link to Map

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APPENDICES AND EXHIBITS APPENDIX A – HOW TO READ AN IPVISION MAP

An IPVision Map is a visual representation of the relationships between objects. The following is an example of a Landscape Map for a single U.S. Patent:

This Landscape Map is of U.S. Patent 6,000,000 entitled “Extendible method and apparatus for synchronizing multiple files on two different computer systems”. It is the basic patent for the Palm Pilot software. The horizontal X axis is “time” Patent 6000000 is in the middle of the “fan”. The lines going backward (to the left) are the patents cited by Patent 6000000 and the lines going forward (to the right) show the patents which cite Patent 6000000. The details of an IPVision Map are explained in more detail below

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