purdue university - ion optics notes...aberrations in ion optics spherical‐ions farther from axis...

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7/2/2011 1 Ion Optics MS Short Course at Tsinghua Lecture 8 – 9 Mass Analyzer and MS Instrumentation 1. Potential along ion optical axis Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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Page 1: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

7/2/2011

1

Ion Optics

MS Short Course at TsinghuaLecture 8 – 9

Mass Analyzer and MS Instrumentation

1. Potential along ion optical axis

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 2: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

7/2/2011

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2. Comparison with light opticsSame objective

Shine laser onto small slit:

no focusing lenses

only small fraction oflight makes it thruslit

LASER BEAM

Use lens to focus beam into slit

n1, v1 n1, v1

n2, v2

velocity of beam changes inside lens

lens surface curved off‐axis rays are deflected and focused

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 3: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

7/2/2011

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MS experimentIon source

MS entrance slit

divergent ions are lost(+)

+

(-)

Insert lens between source and slit

collimate divergent ions thru slit

improve transmission and sensitivity

set of metal lenses: circular apertures or cylindersapply DC voltages to focus

Optical IonObjective Lens Lens

CHANGE pass beam into pass beam thru regionVELOCITY medium of different of different E field

density

DEFLECT curve/tilt curve/tilt potentialBEAM boundary of contours

different media

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 4: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

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Conservation Theorem: Liousville’s Theorem Product x. . υ = constant , x dimension, angle and υ velocity At constant velocity phase space x, is constant, can only reduce size of image by increasing angle. Aceleration is easiest way to focus (but many expts don’t allow!)

If one focuses without change in energy it is necessarily done at expense of angular divergence [which means any error in position of image is magnified in image size] One can get good focusing (x2 < x1) without angular divergence only by acceleration beam:

Post acceleration is part of high quality ion optics but it simply hides errors--the quality of the pre-accelerated beam the essential matter.

Helmholtz‐Lagrange equation and Liouville’s theorem

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 5: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

7/2/2011

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3. Electrostatic weak lenses

Field penetration produces curvature in equipotential lines, this second order effect isused for focusing: [fringe fields]

Immersion lens (two sections w. difference in potentials and hence velocities) not goodfor focusing. –necessarily chance KE

Electrostatic lenses are always convergent, never divergent as light, optic lenses oftenare. To get divergence in an optical lens one uses a “cross—over” which means onefocuses the beam to a point, after which the trajectories diverge. The small spot on atube is an image of a cross‐over made near the cathode of the electrode gun.

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 6: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

7/2/2011

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Thin Lens: Einzel lensesEinzel = single Good lens for focusing requires three lens elements this gives two lens element intersections which can be acel -- decel -- acel OR decel -- acel –decelSo even w/o changing overall energy of the beam there are strong potential changes which form the basis for the forces at right angles to beam direction which are basis for focusing. As usual, there is no force on beam along ion optical axis.

Thick Lens

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 7: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

7/2/2011

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Convergence Electrostatic lens intersections are always convergent (unlike light optics) forces are always towards the ion optical axis

4. Aberrations in Ion Optics

Spherical‐ ions farther from axis cross at different pts than thosenear axis center (field strength)

Solution:‐skim off outer part of beam (lose ions)‐keep lens diameter >> ion beam size

Chromatic‐ ions with different KE have different focal pts

Solution:‐brute force (keep KE/KE large)

H. Wollnik, J. Mass Spectrom., 34, 991‐1006 (1999).

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 8: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

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Thick and thin lensesAs stated.Thin need higher potentials, might need surrounding potential defining screen, but use distancemore effectively, allow pumping, etc

5. Strong focusingWeak focusing uses forces due to second order (fringe or lens element intersection) effectswith no force in radial direction except due to fringe effects; strong focusing uses lens elementswith radial forces directly proportional to distance from axis or higher.

These forces will be focusing in one direction but will disperse in the other so a second lenseswith opposite polarity is used to focus in the other direction.Most common case is a quadrupole doublet.DC: 1quad of doubletRF: 1 quad only

Combination of DC quadrupole provide flexibility in shaping/focusing the beam

This example illustrates a quad pair that leads to astigmatic focusing (focal points for x and yare not coincident on z)

3-element quad lens system with stigmatic focus

Figure 9 A quadrupole triplet that achieves stigmatic focusing (x/a) = (y/b) = 0 and a 1:1 magnification in both the x and y‐directions, i.e. (x/x)(y/y)= ‐1. Note that the ion trajectories, that diverge from one point initially, are all parallel in the middle of the quadrupole triplet at which position the x, y beam envelopes differ considerably.

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 9: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

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An ion pipe

All multipoles consist of 2n symmetrically arranged elementn=2 quadrupole3 hexapole4 octapole5 decapole6 dodecapole

Figure 20. The absolute values of the back-driving forces F in the x-direction that ionsexperience in an electric quadrupole (2n=4), hexapole (2n = 6) or octupole (2n= 8) areplotted as a function of the distance r from the optical axis.All multipole devices exhibit a high pass filtering action

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 10: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

7/2/2011

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Static Bending lens1. initialize ion beams with certain m/z, KE and dispersion angle, etc. 2. Use Einzel lens set 1 to focus the ion beam 3. Use reflection quadruple electrodes to bend the ion beam by 9O°4. Use Einsel Lens set to focus the bent ion beam to get maximum output.

Ion/SurfaceCollision Region

Ion/SurfaceCollision Region

a. b.

‐58V ‐58V

‐58V‐58V

‐235V

‐235V

‐18V

‐18V

-26V

Static Quadrupole Bending Lens

Static Quadrupole Bending Lens

L3L3

L5L5

L4 L4

E

DC

BA

E

D

C

BA

6. Electrical Dynamic Lens:

Schematic diagram of the ion funnel interface in the context of the overall instrumentation

Ion funnelDeceleration, especially by large factor without defocusing is difficult; decal with strong focusing is very hard. Solution is the ion funnel.

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 11: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

7/2/2011

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PNNL

Agilent iFunnel

7. Space Charge‐ limits minimum beam diameter

V1 V2

+ ions repel each otherif beam currenttoo high

reEvr

eIForce

0

0

2Space charge increases with:

↑I0↓v↓r

assume beam iscylindrical

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 12: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

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Mass Analyzers

Thomson’ apparatus

C. CapillaryB. CathodeA. Al anode 20 kVE. Detection (willenite) fluorescence o photoplateVacuum using rotary pumpParallel B, E fields

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 13: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

7/2/2011

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+

)( BvEqF Thomson

+

Wien v

E

B

E

B

v

FE

x

y

FB

FE

x

y

FB

B field(mv/z)

E field(mv2/z)

Constant KE/z“mass” spectrum if all ions have same KE

constant v

constant m/z

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 14: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

7/2/2011

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Photo of Thomson’s data

http://www.phy.cam.ac.uk/camphy/index.htm

Mass Analysis and Mass Analyzers

• The mass of a molecule cannot be directly weighed.• The m/z value of an ion cannot be directly measured.

• Mass analysis is a gas phase separation of the charged particles.

• Separation in space –trajectory based MS analyzers• Sectors• Time of Flight

• Separation in motion frequency –Trap type MS analyzers• Quadrupole filter/ion trap• Ion cyclotron resonance (ICR)• Orbi‐trap

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 15: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

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MethodQuantity measured

Mass/Charge range (Da/charge)

Resolution at 1000 (Da/charge)

MassAccuracy at 1000 Da/charge

Dynamic rangeb

Operating Pressure (Torr)

Sector Magnet

Momentum/ charge

104 105 <5 ppm 107 10-6

Time of flight

flight time 106 103 0.01% 104 10-6

Quadrupole ion trap

frequency 104-105 103-104 0.1% 104 10-3

Quadrupole filters for m/z

103-104 103 0.1% 105 10-5

Cyclotron resonance

frequency 105 106 <10 ppm 104 10-9

Orbi Trap Frequency 105 106 <10 ppm 104 10-9

Characteristics of Mass Analyzers

aMass/peak width bNumber of orders of magnitude of concentration over which response varies linearly.

Quadrupole MS Filter and Quadrupole Ion Trap

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 16: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

7/2/2011

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1.Geometry of MS analyzer and Instrument Configurations

FilamentFilament

ElectrongateElectrongateEndcap ElectrodeEndcap Electrode

Ring ElectrodeRing Electrode

Endcap ElectrodeEndcap ElectrodeElectron MultiplierElectron Multiplier

r0

z0Ring Electrode

Ring Electrode

EndcapElectrode

EndcapElectrode

Geometry of ion trap/ internal EI

Instrument with atmospheric pressure ionization

Operating pressures and optics

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 17: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

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Quadrupole Mass Spectrometer

http://www.chm.bris.ac.uk/~paulmay/misc/msc/msc3.htm

Valley of the Drums Superfund Site

QuadrupleMass Spectrometer

QuadrupleMass Spectrometer

FinniganFinnigan

Q1

Q2

Q3

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 18: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

7/2/2011

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3D vs. Linear

Linear Trap

Cylindrical Ion Trap

Paul Trap

Rectilinear Ion Trap

Quadrupole Filter

3D vs Linear

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 19: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

7/2/2011

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2. TheorySIMION Simulation of Ion Trap RF Field

2)2(,

uun n

2,0

u

u

32

0-2

-3

320-2-3

5

3

0

-3

-5

Y-AXIS [mm]

Z-A

XIS

[m

m]

X-A

XIS

[mm

]

Ion Trajectory

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 20: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

7/2/2011

20

Ion Trap RF Field

Quadrupolar Field

Potential

Position

Force E

Position

Circular frequency is INDEPENDENT on the KE and Position of the ion.

kxF m

k0

Harmonic oscillator

)(0 zyxEE Laplace’s equation0 E

0

0; 22;

z

y

x

x0

y0

222

0

)(cos),,( yx

r

tVUtyx

222

0

22

)(cos),,( zr

r

tVUtyx

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 21: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

7/2/2011

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41

220

4

mr

eUaaa yxu

220

2

mr

eVqqq yxu

222

0

)(cos),,( yx

r

tVUtyx

0)2cos(22

2

uqad

uduu

2

t

0)cos(20

2

2

xtVUmr

e

dt

xd

0)cos(2

02

2

ytVUmr

e

dt

yd

Mathieuequation

Quadrupole filter

du

deeEFma

dt

udm u

2

2

222

0

22

)(cos),,( zr

r

tVUtyx

3D Trap

0)cos(2

20

2

2

ztVUmr

e

dt

zd

0)cos(2

02

2

rtVUmr

e

dt

rd

220

220

482

mz

eU

mr

eUaa rz

220

220

242

mz

eV

mr

eVqq rz

2

t

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 22: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

7/2/2011

22

220

4

mr

eUaaa yxu 22

0

2

mr

eVqqq yxu

220

220

482

mz

eU

mr

eUaa rz

220

220

242

mz

eV

mr

eVqq rz

qeject = 0.908

qzaz

Mathieu Stability Diagram

0.4

0.2

‐ 0.2

‐ 0.4

‐ 0.6

1.50.20.3

0.4 0.50.6

0.70.8

1.0

0.1

0.4

0.5

0.6

0.7

0.8

0.9

1.0

z

r

0.2

ω?

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 23: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

7/2/2011

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uu

uuu

uuu

uuu

a

qa

qa

qa

2

22

22

2

64

2

uu

uuu

uuu

u

a

qa

qa

q

2

22

22

64

2

2/2uuu qa

(for qu<0.4)

2)2(,

uun n

2,0

u

u

32

0-2

-3

320-2-3

5

3

0

-3

-5

Y-AXIS [mm]

Z-A

XIS

[m

m]

X-A

XIS

[mm

]3. RF and DC operation: Mass filter

a

q

scan lineU/V = const=0.17

m>M(y‐unstable)

M

*scan electronically, change stable m/z (1000 Th/s)

220

4

mr

zeUau

220

2

mr

zeVqu

“mass‐selective stability”

m<M(x‐unstable)

(0.706,0.237)

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 24: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

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47

Filtering action

M + heavier ions

(high pass filter)

M + lighter ions(travel greater distanceduring RF cycles)

(low pass filter)

Positive Rods

Negative Rods

+

+

RF: light ions follow and are made unstable (when RF>DC) = high passDC: heavy ions made unstable (inertia) = low pass

48

Mass Filter ‐Mass range

706.04

220

maxmax

mr

zeVq

220

max

max )706.0(

4

r

eV

z

m

•Increase V‐ practical limits•Decrease r0‐ practical limits•Decrease ‐ easy, but affects resolution

increase length, but then have mechanical limits

2)(#cyclesm

m

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 25: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

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49

Quad calcs:1) time of flight: m/z 100; 10 eV (= 1.602x10‐18 J); L=20 cm

E=0.5mv2= 0.5m (d/t)2

2) mass range (example is an Extrel quad)f= 880 kHz = (2f)= 5.529x106Vmax= 3600 V0p

r0= 4.14 mm

4510602.1*2

1066.1)2.0(

2 18

25

E

mdt s

262

19

220

max

max )10529.5()00414.0)(706.0(

)3600)(10602.1(4

)706.0(

4

r

eV

z

m

=6.236x10‐24 kg/molecule = 3755 Da

50

Quad calcs:2) mass range (example is an Extrel quad)

f= 880 kHz = (2f)= 5.529x106Vmax= 3600 V0p

r0= 4.14 mm m/z max= 3755 Da

How much DC is needed?

U = 604 V

)10602.1(8

)10529.5()00414.0()

10023.6

1

1000

3755)(237.0(

8 19

262

23

220

e

r

z

maU u

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 26: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

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51

Quad (mass filter) Resolution

Resolution depends on (# cycles)2

Trade‐off between transmission and resolution (acceptance angle)

Mechanical limits: non‐ideal fields (round rods)rod alignmentfringing fields

Mass Filter ‐Mass resolution, intensity and peakshape

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 27: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

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53

Quadrupoles•3 types: DC only, RF only,

RF/DC (mass‐selective stability)

•beam‐type instrument

•Resolution controlled electronically (U/V scan)

•Resolution (# cycles)2

•m/z linear with U and V

•Focusing properties

54

Performance of Quadrupoles•R= 102‐104

•100 ppm accuracy•m/z range <10,000•LDR: 107

•Efficiency: <1‐95%•Speed: 1‐20 Hz

•Ionizer: continuous•Cost: low•Size: benchtop

Very common mass analyzer

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 28: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

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55

4. Higher order multipole ion guides (rf only)

hexapole

V cos t

‐ V cos t

octupole

‐collisional cooling (good for injection in TOF, sector, quad):reduce velocity spread (thermal ions)

‐more efficient collection of ions (compared to quad)

D. Gerlich, Adv. Chem. Phys. 82, 176 (1992).

r0 +

+

+

‐‐

+

‐+

+‐

+

56

0

1

-1 -0.5 0 0.5 1

collision energy more uniform in higher multipoles

Potential

radial position

OCTUPOLEQUADRUPOLE

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 29: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

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5. Quadrupolar Ion Trap

History

1953 Wolfgang Paul

1963 Hans Dehmelt

1968 Dawson & Whetten

1972 John Todd

1972 Ray March

1984 George Stafford

Mass‐selective Detection

Mass‐selective Storage

Mass‐selective Ejection

Ion Trap

Stability diagram

Operating line for mass selective instability

Operating line for mass selective instability

qeject = 0.908qeject = 0.908

qzqz

z stabilityz stability

r stabilityr stability

0.40.4

0.20.2

- 0.2- 0.2

- 0.4- 0.4

- 0.6- 0.6

azaz1.51.50.20.2

0.30.30.40.4 0.50.5 0.60.6

0.70.70.80.8 1.01.0

0.10.1

0.40.4

0.50.5

0.60.6

0.70.7

0.80.8

0.90.9

1.01.0

zz

rr

0.20.2

az=az=-8eUDC-8eUDC

mr022mr022

4eVRF4eVRFqz=qz= mr022mr022

sec ular 2

sec ular 2zz

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 30: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

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Ion Trap MS Analysis

Destructive Ion Detection

0.2

- 0.2

- 0.4

- 0.6

1.00

qz

az

qeject = 0.908

Operating line for mass selective instability

axial modulation

resonance excitation

Operating line for mass selective stability

dc scandc scan

rf/dc apex isolation

az=-8eUDC

mr022

4eVRFqz= mr022

sec ular 2

sec ular 2zz

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 31: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

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Ion Trap Ejection Mode

Mass range extension using resonance ejection

Quadrupole Ion Trap – Collisions with Background Gas

Trapping injected ions

Without HeliumWith Helium

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

Page 32: Purdue University - Ion Optics Notes...Aberrations in Ion Optics Spherical‐ions farther from axis cross at different pts than those near axis center (field strength) Solution: ‐skim

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Quadrupole Ion Trap

KE Damping

Collisions!!

Without He

With He

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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Quadrupole Ion Trap

Trapping capacity vs. space charge

82

VqDD z

rz

Quadrupole Ion Trap

Trapping capacity vs. space charge – 3D Trap

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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34

Why Linear Ion Trap?

Trapping Efficiency for external ion injection5% ~100 %

1 ‐1 ‐ 1144mm

mmRR (t)(t) LL (t))(t))bb

ii

ee

mmrr rriiii

4411

00 22

Acceleration of Ion expressed as a Second Order Differential Equation:

Collision Term

Quadrupole Field

Dipole Field

Coulombic Term

==

++

++

++

m( r02+ 2z0

2)m( r02+ 2z0

2)

(t)(t)2mz02mz0

VV (t)(t)auxaux auxauxcoscos

eett

U ‐V(t) U ‐V(t) tt4e4e

[[ ] z ] z cos cos dd zz

dtdt

22

22

Theory of Quadrupole Ion Trap

Equations of motions

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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Theory of Quadrupole Ion Trap

Isolation waveforms

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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36

Isolation waveform

Theory of Quadrupole Ion Trap

Resonance excitation

q axis0.908

0.908

q axis

Fragments

Theory of Quadrupole Ion Trap

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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37

MS/MS

q axis0.908

0.908

q axis

Theory of Quadrupole Ion Trap

6060 8080 100100 120120 140140 160160 180180 200200 220220 240240 260260 280280 300300

m/z (Thomson)m/z (Thomson)

00

2020

4040

6060

8080

100100

Rel

ativ

e A

bu

nd

ance

Rel

ativ

e A

bu

nd

ance

240.0240.0

150.3150.3

119.2119.2 235.2235.2136.3136.3

91.791.773.373.3 216.9216.9129.2129.2111.3111.3 199.1199.164.364.3177.1177.1157.2157.2 257.08257.08

100100 200200 30030000

2020

4040

6060

8080

100100222.0222.0

166.1166.1148.3148.3

100100 200200 30030000

2020

4040

6060

8080

10010086.486.4

87.487.4

88.488.4

100100 200200 30030000

2020

4040

6060

8080

100100119.1119.1

100100 200200 30030000

2020

4040

6060

8080

100100119.1119.1

100100 200200 30030000

2020

4040

6060

8080

10010091.591.5

100100 200200 30030000

2020

4040

6060

8080

100100

AlbuterolAlbuterolLidocaineLidocaineMethamphetamine Methamphetamine AmphetamineAmphetamine

MS2MS2

MS3MS3

91.591.5

Fragmentation Efficiency

70%

Fragmentation Efficiency

70%

ALMA mixture (100pg/ul)ALMA mixture (100pg/ul)ESI‐RIT Instrument – MSn analysis to mixtures

Q. Song & S. Kothari

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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75

Performance of Quadrupole Ion Trap•R= 103‐104

•50‐100 ppm accuracy•m/z range <100,000 (typ. 4000)•LDR: 102‐105

•Efficiency: <1‐95%•Speed: 1‐30 Hz

•Ionizer: pulsed and continuous•Cost: low to moderate•Size: benchtop

Very common mass analyzer

Sectors

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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39

Separation in spaceElectric Sector Mass Analyzer

Source

Detector

Ek

Detector

Lorentz Force

Ek

VB

Separation in spaceMagnetic Sector Mass Analyzer

V

rB

e

m

2

22

eVmvEk 221

Bevr

mvF

2

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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40

Magnetic Sector Mass Analyzer

+ ion moving through magnetic field with strength B

Fm

v v

vFm

Fm

B

Fm = magnetic force alwaysacts perpendicular todirection of motion

*Use right hand,Cross v into B with fingersThumb points in dir. of Fm

Uniform circular motion w/ radius rm when:

Rearrange to get:

So B sector is a momentum/charge analyzer,not a mass analyzer

Include KE from source:

eBrz

mvm

mm r

mvBzevF

2

V

rB

z

m m

2

22

zeVmvKE 2

2

1

m

zeVv

2

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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41

Scan either:

B (vary mag. field: slow)V (vary acc. voltage: faster) AND / ORrm (array detector)

How do we get a m/z spectrum?

V

rB

z

m m

2

22

Performance of Sector magnets The sector magnet is lighter and hence more convenient, than the 1800 magnet. It shares the property of

bringing a divergent beam of ions to focus (to first order) — i.e. it is a direction focusing device. Ions entering normal to a magnetic field experience a force which depends upon the field strength, the magnitude of the charge and the velocity. Since the three vectors (B, r, v) are mutually orthogonal, no change in velocity occurs and a circular path results.

Barber’s rule states that for normal entry and egress, object, image and apex are collinear. The law is true for all sector angles and for both symmetrical and unsymmetrical arrangements of object and image.

Fig. 4. Focusing action of a wedge-shaped (sector) magnetic field on a mono-energetic beam of ions, all of the same mass-to-charge ratio.

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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42

In fact, one desires both velocity and direction focusing. This is termed doublefocusing and is achieved with a suitable combination of a sector magnet andan electric sector. Each of these devices independently focuses for directionand together they give equal and opposite dispersions for velocity, i.e. theyyield velocity focusing. Such double focusing instruments give high resolution.The fields may be arranged so that all masses are simultaneously subject todouble focusing or, this may be true for just one mass/charge ratio at a time.They will be discussed later. However, it is important to recognize that thereexist degrees of success in achieving both velocity and direction focusing. Iffocusing is to first order then the beam position is independent of the firstpower of velocity (5) or direction (a), but dependent on the square terms.Focusing to second order means that a dependence exists on the third powerof the parameters, etc.

There are two important geometries of double-focusing instruments from which all other designs have beendeveloped, the Nier-Johnson geometry uses an electric sector (E) followed by a magnetic sector (B), theimage of the electric sector being the object point of the magnetic sector, i.e. there is a point ofintermediate focus. Along a plane normal to the ion beam and running through this focal point the beam isdispersed approximately linearly in terms of translational energy; the j3—slit located at this point must bequite wide for high sensitivity. It is along this plane that the velocity dispersions due to the two sectors areequal and opposite for ions of the same m/z ratio. The final slit is located at the point at which a and 5disappear to first order ie double—focussing is achieved.

Fig. 8. Arrangement of the electric and magnetic fields for a double-focusing mass spectrometer of Nier—Johnson type geometry.

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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The Mattauch-Herzog geometry differs from the Nier-Johnson in many ways: (i) there is nopoint of intermediate focus, in fact the beam is approximately parallel between the sectors (ii)there is a plane of final focus, rather than a point and this allows imaging detectors to be used(note however, that the resolution is not the same at all points along the plane and is highest atthe end which corresponds to maximizing the area of the sector covered by the ion beam).

Fig. 9. Arrangement of the electric and magnetic fields for a double-focusing mass spectrometer of Mattauch—Herzog geometry.

1. FT‐ICR

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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44

87

dB

TVr excitepp

2

Mass Spectrom. Rev., 17, 1-35 (1998).

Ion excitation for m/z analysisAdd power to excite ion packet to larger radii

*ions do not hit detector plates(use dipolar excitation pulse)

Coherent ion packet oscillates at cyclotron freq

[s]

[T][m]

• Employs orbital trapping in an electrostatic field with potential distribution:

General features:

• High mass resolution (up to ~150,000)• Increased space charge capacity at

higher masses• High mass accuracy (0.2-5ppm),

dynamic range (103- 104) andupper mass limit (m/z 6000)

• Small size and relatively low cost

2. The Orbitrap Mass Analyzer

1. Qizhi Hu, Robert J. Noll, Hongyan Li, Alexander Makarov, Mark Hardman and R. Graham Cooks, J. Mass Spectrom., 2005, 40, 430; 2. Alexander Makarov, Anal. Chem., 2000, 72, 1156. 3. Oksman, P., Int. J. Mass Spectrom. Ion Processes, 1995, 141, 67

CmRr

mRkrzkzrU

ln2

2222

2),(

mqkz

is independent of the energy and spatial spread of the ions

No cross terms in r and z. Thus the potential in the z-direction is exclusively quadratic and independent of r, motion.

Injection off-center

c

qB

m

FT-ICR

r-y plane 3-D View

z-Position

U(z)

Axial Harmonic Oscillator

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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45

Ion Capture, Squeezing and Detection

1. Qizhi Hu, Robert J. Noll, Hongyan Li, Alexander Makarov, Mark Hardman and R. Graham Cooks, J. Mass Spectrom., 2005, 40, 430; 2. Alexander Makarov, Anal. Chem., 2000, 72, 1156.

FFT

6) Mass Spectrum

m/z

5) Time-Domain Transient

Image current detection

mqkz

(a) First API-Orbitrap Prototype Instrument

(b) Second API-Orbitrap Prototype Instrument

Short RodsLong Rods

Guide Quadrupole Transfer LensesESI Sprayer Orbitrap

Storage Quadrupole

Disadvantages of FT-ICR:• Small space charge capacity• High complexity and cost.

Disadvantages of the Paul Trap:• Unit resolution• Insufficient mass accuracy (10

ppm at best)• Small space charge capacity.

Instrumentation

• The Orbitrap is a complementary alternative to these methods

• It employs dynamic ion trappingin an electrostatic field.

Commercial LTQ-Orbitrap

Orbitrap Prototypes

1. Qizhi Hu, Robert J. Noll, Hongyan Li, Alexander Makarov, Mark Hardman and R. Graham Cooks, J. Mass Spectrom., 2005, 40, 430; 2. Alexander Makarov, Anal. Chem., 2000, 72, 1156.

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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46

TOF

92

Heavy ion, low velocity

Light ion, high velocity t = 0

Ionsource off

2

2

1mvqVKE

m

qVv

2

zeV

mD

v

Dt

2 2

22

D

eVt

z

m

D

V 0V

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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93

t1 , ions drift apart as fly down tube

t2, light ions near detector, heavy ions still in tube

94

Det

ecto

r si

gnal

Flight Time (m/z)1/2

light medium heavy

Detect “all” ions that entered flight tube

Full m/z range but no scanning

m/z scalenonlinear

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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48

1986 TOF/TOF by Brucat

1946 Stephens presented concept of linear TOF MS

1953 Woff and Stephens published design and spectra from linear TOFMS

1955 First commercial linear TOF based on Wiley and McLaren ‘s design

1973 Reflectron‐TOF by Mamyrin

1988 MALDI source by Karas, Hillenkamp, then MALDI‐TOF

90’s QqTOF

Evolution of TOF from 1950 to 2000

1989 Dawson and Guilhaus described EI+orthogonal TOFESI+orthogonal TOF by Dodonove

Factors Contributing to TOF-MS Renaissance

Gilhaus et al. Rapid Conmmun. Mass Spectrom. 1997,11, 951-962

High mass The need to measure the mass of biological molecules

Discover MALDI ionization by Karas and Hillenkamp

Quadrupoles and sectors have fundamental high mass limit

Digital electronics

Advances in the speed and data handling of computers

Progress in high speed timing electronics

nanosecond digitizers, focal plane detector, affordable laser

Speed Detect ions quasi-simultaneous

Well in the time-frame of chromatography

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97

Reduced Eqn for TOF

Volts s

•m/z scale non-linear

•time scale shrinks at higher m/z2

2

92.1L

Vt

z

m

cm

To observe very high m/z, just wait longer

No (theoretical) limit to mass range-detector response poor-peaks very close in time

98

L = 1 m V = 2700 voltsm/z t (s) t (ns) ~ time resolution needed

14N+ 5.20 18015N+ 5.38

207Pb+ 20.00 50208Pb+ 20.05

500 31.09 30501 31.12

20,000 196.623 520,001 196.628

Create ion pulse<5 ns

Time constants of electronicsneed to be faster than 5 ns

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99

Effect of Instrument Parameters on Resolution

L

2dL

t

2dt

V

dV

m

dm

Small KE spreadLarge KE, high V(2 – 10 kV)

Fast time responseLong flight time, long tube

Small dLAll ions same tube lengthLong tube

dL )(-2L tV 2 dt (2t) L

V 2 dV

L

t2 dm

L tV 2 L

tV 2 m m/z

3-222

2

2-22

2

100

What causes poor resolution (time spread)?

•Direction spread

•Velocity spread

•Position spread

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2

2

1DmvqU

ectDacceldelay ttttTOF det

TOF Mass Spectrometer– Theory of Work

delayt any delays between ionization and acceleration

accelt time to reach full velocity before enter drift region

Dt drift time in the 100 µs time frame

ecttdet detector response time (1-5 ns)

q

m

E

vvt D

accel0

2/1

2

q

m

U

DtD

2/1

2

q

m

U

DtD

ED

drift region

detector

U

v0vD

Direction Spread: the Turn-Around Problem

If U0 = initial kinetic energy, thenEq

mUtturn

022

Eq

UEqSmtD

02

21

0

212

1

02

1

02

1

2

)2())2(

qESU

Dm

qE

UqESUmt

tturn can be decreased by increasing E or decrease U0

Relative contribution of tturn can be decreased by increasing D

E

tturn taccel

D

detectorv0v0

s

tD

vDvD

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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Resolving Power of TOF

t

dt

m

dmtm

22 t

t

m

m

2or

∆t: the full-width at the maximum height of the peak (FWHM)

Contributions to ∆t:

1. timing/duration of gating and detection interval

2. position spread

3. direction spread (turn around time)

4. initial velocity spread

ectDacceldelay ttttTOF det

21

0

212

1

02

1

02

1

2

)2())2(

qESU

Dm

qE

UqESUmt

Mass‐dispersed space‐time trajectories

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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53

Initial Position Spread and Spatial Focusing

aaa s

D

qEs

mU

ds

dt

21

2)0( 0

Spatial focus at D=2Sa

One stage acceleration

aa

SDds

dt20

Sa

Initial Position Spread and Spatial Focusing

aaa s

D

qEs

mU

ds

dt

21

2)(

Spatial focus at D=2Sa

One stage acceleration

double stage acceleration

Double stage acceleration with second order space focus

aa

SDds

dt20

Bosel et al. Int. J. Mass Spectrom. Ion Processes 1992, 112, 121

Sa

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Direction Spread: the Turn-Around Problem

If U0 = initial kinetic energy, thenEq

mUtturn

022

Eq

UEqSmtD

02

21

0

212

1

02

1

02

1

2

)2())2(

qESU

Dm

qE

UqESUmt

tturn can be decreased by increasing E or decrease U0

Relative contribution of tturn can be decreased by increasing D

E

tturn taccel

D

detectorv0v0

s

tD

vDvD

Initial Velocity Distribution and Time-lag Focusing

Time-lag focusing: delay between ion ionization and extraction (Wiley & McLaren)

• Focus is m/z dependent• enhanced resolving power for a limited mass range• Dose not solve turn-around problem

Convert velocity distribution to spatial distribution, then use spatial focusing

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Focus is still m/z dependent

No turn-around problem for MALDI

Difference between time-lag focusing In time-lag focusing: no correlation

between energy and space

Correlated space and energy distributions Ions with larger initial velocity acquires

less energy from the field

Colby et al. Rapid Conmmun. Mass Spectrom. 1994, 8, 865-868

Initial Velocity Distribution & Delayed Extraction for MALDI/TOF

v2v1

v3

samplesurface

grid

x2 x1 x3

Energy Correction by Reflectron (Mamyrin et al.)

Reflectron consists two fields (three electrodes)

By properly choose parameters (in box), energy distribution (5%) can be corrected

Increase fly length without increase size, resolution can reach 20,000

Can not solve turn-around problem (works well with ions generate from surface)

decelerating/accelerating field

Reflecting field

Bosel et al. Int. J. Mass Spectrom. Ion Processes 1992, 112, 121

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dLLeV

mt 4

2 21

2/1

1

L1: drift region before reflectionL2: drift region after reflectiond: penetration depth in the reflectronV: acceleration voltageOptimal focusing when L1+L2 = 4d

Reflectron Continued…

t

t

tMU

U

x

t

t

U

U

t

t

U

U

t

t fixi

A

A

1

16

3

4

1 21

1

12

3

1

2

“turn around time”

“laser pulse width”

“third-order term of ref”

“second-order term of ion source”

Resolution for a reflectron:

for energy compensation ion mirror:second-order focus ion source

t1t2

Bosel et al. Int. J. Mass Spectrom. Ion Processes 1992, 112, 121

Table 1 Limiting factors for mass resolution of reflectron TOF with a laser ionization source. The values of ∆t are determined for ions with M=106, an ion energy of 700eV and a flight time of 60 µs.

Limitations for mass resolution (R<3000)

∆t (laser pulse width) 5-8 ns commercial dye laser

∆t (detector rise time) 1.4 ns

∆t (turn around time) 5 ns T=300 K

∆t (Re-TOF third-order term) < 1 ns

∆t (Re-TOF geometry) 5 ns Reflector with grids

∆t (space charge) 12 ns 104 ions, focus r=0.05 mm, l=1mm

Optimization for high mass resolution (R> 10 000)

∆t (laser pulse width) 1.5 ns Pulse cutting

∆t (turn around time) < 1 ns Supersonic jet cooling

∆t (space charge) < 1 ns Optimized focus size

∆t (Re-TOF grid) 0 ns Gridless reflector

Result: for M=106 (p-xylene): ∆tFWHM=3.2 ns, ∆tunit=310 ns

R50%=M ∆tunit/ ∆tFWHM=10270

Bosel et al. Int. J. Mass Spectrom. Ion Processes 1992, 112, 121

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Vestal et al. Rapid Conmmun. Mass Spectrom. 1995, 9, 1044

Comparison of the Resolution and S/N for Angiotensin I

1.3m 1.3m 2m

2m 3m2m

4.2m 6.6m4.2m

Multiturn TOF for High Resolution

Toyoda et al. J. Mass Spectrom. 2000, 35, 163

Four cylindrical E-sectors Eight quadrupole lenses for space focus Linear TOF for ion detection Resolution increases as ion path increases Most ion loss in the first 5.5 cycles

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Linear oa-TOF

Orthogonal Acceleration TOF- Solutions for Continuous Ionization

~ 1989 Guihaus’ group and Dodonov’s group

Guihaus et al., Mass Spectrom. Rev., 2000, 19, 65‐107

reflectron oa-TOF

MSn Capabilities of TOF – Post Source Decay

Chaurand et al. J. Am. Soc. Mass Sepctrom. 1999, 10, 91

PSD: parent ions acquired sufficient internal energy during the desorption process, fragmented in first field free region.

Fragment ions have the same velocity as their precursor ions but have different kinetic energy as function of their mass. (can not use linear TOF)

Lighter ions reach earlier than heavier ions in ref-TOF

For linear field reflectron, best focus when L=4d.

Bad resolution with one reflectron voltage.

(Kaufmann et al.,1996)

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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Scan Method for Secondary Mass Spectra

Bosel et al. Int. J. Mass Spectrom. Ion Processes 1992, 112, 121

Scan Uref and keep Uref /Us constant as parent ion.

Fragment ions penetrate same distance in reflectron, thus have same resolution as parent ion.

Lose major advantage of TOF: detect all masses quasi-simultaneously

UrefUs

Weinkauf et al., 1989

Cotter et al. Rapid Commun. Mass Spectrom.1993, 7, 1037-1040

Curved-Field Reflectron for Secondary Mass Spectra

Cotter et al., 1993

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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Detection in TOF

Digitizers in TOF

multi-channel plate in “Chevron” arrangement10-25 µM channels inclined @ 8-12°

Single ion impact 1-5 ns pulse width detect single ion impact (problem at high m/z) Flat conversion surface Large area, detect large ion packets Better use smallest channel diameter (time spread)

Time-to-digital converter (TDC) for low ion currents (ESI) Register events of pulses Good S/N Good time resolution (<0.3 ns) Limited dynamic range due to dead time Can only register one ion at a time

Integrating Transient Recorder (ITR) For high ion currents (MALDI, ICP) Analog systems digitize ion current from

MCP. Expensive Inherent background noise Low repeat rates

TOF Ion-trap

Mass resolving power 103-104 103-104

Mass accuracy 5-50 ppm 50-100 ppm

Mass range >105 1.5 x 105

Linear dynamic range 102-106 102 -105

precision 0.1-1% 0.2 -5%

Abundance sensitivity Up to 106 103

Efficiency (transmission x duty cycle)

1-100% <1- 95%

speed 10-104 Hz 1-30 Hz

Compatibility with ionizerPulsed and continuous

Pulsed and continuous

cost Moderate-high Low to moderate

Size/weight/utility requirements

benchtop benchtop

Feature of Merit -- TOF vs. QIT

McLuckey et al. Chem. Rev. 2001, 101, 571-606

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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Suggested Reading

Weickhardt et al., Mass Spectrom. Rev., 1996, 15, 139-162, “Time-of-flight mass spectrometry: state-of-art in chemical analysis and molecular science

Bosel et al., Int. J. Mass Spectrom. Ion Processes, 1992, 112, 121-166, “Reflectron time-of-flight mass spectrometry and laser excitation for analysis of neutrals, ionized molecules and secondary fragments”

Guihaus et al., Mass Spectrom. Rev., 2000, 19, 65-107, “Orthogonal acceleration time-of-flight mass spectrometry”

Chernushevich et al., J. Mass Spectrom., 2001, 36, 849-865, “An introduction to quadrupole-time-of-flight mass spectrometry”

McLuckey et al., Chem. Rev., 2001, 101, 571-606 “Mass Analysis at the Advent of the 21st Century”

MS Instrumentation and Miniaturization

Sample TreatmentSample Treatment

Sample Collection

Sample TreatmentSample

Treatment

Data Interpretation

Lab‐Scale MS500 lb/2kwLab‐Scale MS500 lb/2kw

Sample TreatmentSample Treatment

Sample Collection

Sample TreatmentSample

Treatment

Data Interpretation

Lab‐Scale MS500 lb/2kw

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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Figure 3

Tiny TOF

Cotter, Johns Hopkins

Higher Order KE Focusing5 cm Endcap Reflection

mz 70,000, R 70

~10 cm

Figure 3

Double Focusing

Sinha, JPL

Mattauch‐HerzogLight B Sector

mz 300, R 300

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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Quadrupole Filter ArrayFerran

0.5 ID Rod

500 µm

Micro‐fabricated Mass Analyzer

Syms, Imerial

V‐Groov Filter

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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Miniaturization of Ion Trap Mass Analyzer

GeometryMiniaturization

1 µm1 mm5 mm10 mm

)2(

8)/( 2

02

02

maxmax

zrq

Vzm

eject

SimplificationOptimization

SLA

Ramsey

LTCCvan Amerom& Short

Toroidal trap

Lammert

Halo Trap

Austin

80 90 10

1.8

0.9

0

91

92

m/z (Thomson)

Pea

k I

nte

nsit

y

93

x0= 5.0mmy0 = 4.0mmNonlinear Resonance Ejection

Rectilinear Ion Trap

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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Toroidal Ion Trap

Halo Trap

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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Low Scan Voltage - VRF vs. D - Deep Trapping Potential Well

∗ ∗ Ω

r: r0, for 3D or ΩRF: RF frequencyx0, for 2D linear

Trapping Efficiency

Potential Well

r0 ½ r0 0 ½ r0 r0

QIT size

VRF

¼VRF

Full Size

Half Size

Potential Well

r0 ½ r0 0 ½ r0 r0

QIT size

Full Size

Half Size

Use of higher RF frequency

Figure 7

Tradeoff and Balance

ITMS10mm 3D trapUnit ResolutionMass range: m/z 700

Mini 115mm 2D trapUnit ResolutionMass range: m/z 800

)2(

8)/( 2

02

02

maxmax

zrq

Vzm

eject

2007

1998 Searle

Impact of Trap Size

RF Voltage and Power?

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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IonSource

IonSource

MassAnalyzer

MassAnalyzer

IonDetector

IonDetector

IonSource

IonSource

MassAnalyzer

MassAnalyzer

IonDetector

IonDetector

< 10‐5 Torr

< 10‐5 Torr1 Torr

Differential pumping

Pressure matching between the ion source and the mass analyzer

IonSource

IonSource

MassAnalyzer

MassAnalyzer

IonDetector

IonDetector

< 10‐5 Torr1 Torr760 Torr

EI/PI/MALDI

CI/MALDI

ESI/APCI

1 Torr 1 mTorr

30 m3/hr 500 L/s

Pumping

5 L/min 10 L/s

Rough Pumping

Viscous Flow

Turbo MolecularPumping

Molecular Flow

Pressureatm/760 Torr 10‐10 Torr

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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135

0

100

200

300

400

500

50 100 150 200 250 300 350 4000

200

400

600

800

1000

1200

50 100 150 200 250 300 350 400

DavidoffGood Life

CacharelPromesse

0

400

800

1200

1600

2000

50 100 150 200 250 300 350 400

Nina Ricci L‘Air du Temps

Direct Leak

m/z

Inte

nsi

ty

m/z

Inte

nsity

m/z

Inte

nsity

ID: 25µm

e-e-

Sampling and Pumping

mTorr

GDEI

RIT

EM

Membrane Introduction

TurboPump

5 l/min

DiaphragmPump

11 l/sor5 l/s

Air flow

membrane

Matrix moleculeAnalyte molecule

To MSSample flow

Nichrome Heater

PDMS Fiber

SPME Fiber Holder

SPME

Membrane Introduction

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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Gas and Ions

Scan Function

10‐2

10‐3

10‐4

0 1 2

10‐1

Time (s)

Ion Introduction

MS Analysis

Pre

ssu

re (

Torr

)

10‐2

10‐3

10‐4

0 1 2

10‐1

Time (s)

Ion Introduction

MS Analysis

Pre

ssu

re (

Torr

)

Discontinuous Atmospheric Pressure Interface (DAPI)

Pinch Valve

Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li

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Used for MS Short Course at Tsinghua by R. Graham Cooks, Hao Chen, Zheng Ouyang, Andy Tao, Yu Xia and Lingjun Li