Upload File

The top documents tagged [chip test architectures]

EE141 System-on-Chip Test Architectures Ch. 12 - FPGA Testing - P. 1 1 Chapter 12 Field Programmable Gate Array Testing
EE141 System-on-Chip Test Architectures Ch. 12 - FPGA Testing - P. 1 1 Chapter 12 Field Programmable Gate Array Testing
233 views
%%Chapter 13 MEMS Slides 110407
%%Chapter 13 MEMS Slides 110407
64 views
Feng-Xiang Huang MCORE Architecture implements Real-Time Debug Port based on Nexus Consortium Specification David Ruimy Gonzales Senior Member of Technical
Feng-Xiang Huang MCORE Architecture implements Real-Time Debug Port based on Nexus Consortium Specification David Ruimy Gonzales Senior Member of Technical
217 views
EE141 System-on-Chip Test Architectures Ch. 2 – Digital Test Architectures - P. 1 Chapter 2 Digital Test Architectures
EE141 System-on-Chip Test Architectures Ch. 2 – Digital Test Architectures - P. 1 Chapter 2 Digital Test Architectures
224 views
Built-In Self-Test and Calibration of Mixed-signal Devices Wei Jiang Ph.D. Dissertation Proposal June 11, 2009 Advisor: Vishwani D. Agrawal Committee Members:
Built-In Self-Test and Calibration of Mixed-signal Devices Wei Jiang Ph.D. Dissertation Proposal June 11, 2009 Advisor: Vishwani D. Agrawal Committee Members:
218 views
EE141 System-on-Chip Test Architectures Ch. 4 – SOC and NOC Testing - P. 1 1 Chapter 4 System/Network-on-Chip Test Architectures
EE141 System-on-Chip Test Architectures Ch. 4 – SOC and NOC Testing - P. 1 1 Chapter 4 System/Network-on-Chip Test Architectures
218 views
EE141 System-on-Chip Test Architectures Ch. 8 – Physical Failures - P. 1 1 Chapter 8 Coping with Physical Failures, Soft Errors, and Reliability Issues
EE141 System-on-Chip Test Architectures Ch. 8 – Physical Failures - P. 1 1 Chapter 8 Coping with Physical Failures, Soft Errors, and Reliability Issues
219 views
EE141 System-on-Chip Test Architectures Ch. 3 - Fault-Tolerant Design - P. 1 1 Chapter 3 Fault-Tolerant Design
EE141 System-on-Chip Test Architectures Ch. 3 - Fault-Tolerant Design - P. 1 1 Chapter 3 Fault-Tolerant Design
269 views
Built-in Adaptive Test and Calibration of DAC Wei Jiang and Vishwani D. Agrawal Electrical and Computer Engineering Auburn University, Auburn, AL 36849
Built-in Adaptive Test and Calibration of DAC Wei Jiang and Vishwani D. Agrawal Electrical and Computer Engineering Auburn University, Auburn, AL 36849
219 views
EE141 System-on-Chip Test Architectures Ch. 7 – Low-Power Testing - P. 1 1 Chapter 7 Low-Power Testing
EE141 System-on-Chip Test Architectures Ch. 7 – Low-Power Testing - P. 1 1 Chapter 7 Low-Power Testing
214 views
EE141 System-on-Chip Test Architectures Ch. 14 – High-Speed I/O Interface - P. 1 1 Chapter 14 High-Speed I/O Interface
EE141 System-on-Chip Test Architectures Ch. 14 – High-Speed I/O Interface - P. 1 1 Chapter 14 High-Speed I/O Interface
221 views
Chapter 14
Chapter 14
26 views