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The top documents tagged [nm bulk]
VR-Zone | Stuff for the Geeks (February 13th Issue)
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TRAMS PROJECT TERASCALE RELIABLE ADAPTIVE MEMORY SYSTEMS FP7 248789 Y1 EC Review Meeting April 12 th 2011 FIRST YEAR PROJECT REVIEW MEETING Leuven, April
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Energy Efficiency and Process Variation Tolerance of 45 nm Bulk and High-k CMOS Devices
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