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    ORIGINAL ARTICLE

    Taguchi-based Six Sigma approach to optimize plasma

    cutting process: an industrial case study

    Joseph C. Chen &Ye Li &Ronald A. Cox

    Received: 19 September 2007 /Accepted: 10 April 2008 / Published online: 18 June 2008# Springer-Verlag London Limited 2008

    Abstract This case study outlines the use of Taguchi

    parameter design to optimize the roundness of holes madeby an aging plasma-cutting machine. An L9array is used in

    a Taguchi experiment design consisting of four controllable

    factors, each with three levels. With two non-controllable

    factors included in the setting, we conduct 36 experiments,

    compared to the 81 parameter combinations (four factors,

    three levels or 34) required in a traditional DOE setting.

    Therefore, using the Taguchi method significantly reduces

    the time and costs of a quality improvement process.

    Conducted for two response variablesbevel magnitude

    and the smallest diameter deviation of the holethe

    Taguchi experiments gave the optimal combination

    A1B2C1D3 (small for tip size, 93 in/min for feed rate,

    100 V for voltage, and 63A for amperage), which is

    verified with a confirmation run of 30 work pieces. All 30

    cuts meet the quality requirement for subsequent assembly.

    Furthermore, statistical analysis indicates that the mean

    value and standard deviation of the confirmation run data

    are smaller than those before Taguchi parameter design is

    conducted.

    Keywords Taguchi method . Quality. Six Sigma .

    Process optimization

    1 Introduction

    Many small- and medium-sized industries have imple-

    mented the two most popular process improvement meth-

    odologieslean manufacturing and Six Sigmawhich

    originated at Toyota and Motorola, respectively. Each

    methodology has its unique structure and tools. The central

    focus of lean manufacturing is to provide value by

    eliminating waste, which is defined as anything that is not

    value-added from the customers perspective. The seven

    deadly wastes, as defined by this method, are over-

    production, inventory, waiting, movement, transportation,

    defects, and over-processing. By continuously eliminating

    these wastes, the customer receives a high value product.

    When the variation of a part or a service does not meet the

    specifications of the downstream internal and/or external

    customers, the methodology and tools of Six Sigma can be

    implemented to improve the quality of the product or

    service. The latest structure of Six Sigma is defined as the

    define-measure-analysis-implementation-control (DMAIC)

    model. Each stage of the model provides tools for

    conducting Six Sigma quality improvements for any

    process or service.

    Figure1 shows a summary of tools used in each stage of

    Six Sigma management. In order to reduce the variation of

    a process, many Six Sigma teams use design of experiments

    (DOE) methodology to find solutions that will align

    products with customer expectations. DOE is a statistical

    Int J Adv Manuf Technol (2009) 41:760769

    DOI 10.1007/s00170-008-1526-1

    J. C. Chen

    Department of Agricultural and Biosystems Engineering,

    Iowa State University,

    221 I. ED. II,

    Ames, IA 50011-3130, USA

    Y. Li (*)

    Department of Industrial and Manufacturing Systems

    Engineering, Iowa State University,

    2019 Black Engineering,

    Ames, IA 50011-2164, USA

    e-mail: [email protected]

    R. A. Cox

    Center for Industrial Research and Service (CIRAS),

    Iowa State University,

    Campus, 2272 Howe Hall, Suite 2620,

    Ames, IA 50011-2272, USA

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    tool that studies the relationship between independent

    variables, the Xs (process variables), and their interactions

    on a dependent variable, the Y, which is considered the

    critical-to-quality (CTQ) of the product.

    The most commonly used DOE tool is the 2k factorial

    design, where k is the number of factors, each with two

    levels. Thus, in a three-factor design, there are eight

    treatment combinations, i.e., 23 or 222. Unfortunately,

    for most manufacturing processes, two levels of each factor

    may provide insufficient information about quality im-

    provement. Often, three levels for each factor are needed.

    For example, when studying the feed rate of a turningoperation, three levels could be evaluated (e.g., 0.005,

    0.010, and 0.015 in. per revolution). Thus, for a three-

    factor, three-level design, there would be 27 treatment

    combinations, i.e., 33 or 333. In addition, each treatment

    combination should be run twice to achieve a more reliable

    statistical data analysis, bringing the total number of

    experiments to 54 (272). If the cost of each experimentis $100, the Six Sigma team will spend $5,400 to analyze

    a three-factor, three-level experiment design with two

    replicates.

    In many manufacturing processes, achieving a solution

    that meets customers specifications may require an

    evaluation of five or six factors. Costs will increase

    accordingly. For example, assuming a base cost of $100

    per experiment, a six-factor, three-level experiment design

    with two replicates will cost $145,800 (36 or 729

    combinations2 =1,458). This is the cost of conducting

    DOE alone and does not include time spent on DOE, which

    may reduce the productivity of other jobs and delayresolution of the quality problem. In addition, during this

    time, the process will produce more defects and wastes.

    Based on the aforementioned analysis, resolving industrial

    problems cost-effectively and in a timely manner requires a

    Phase 0: Define

    Scope and Boundary

    Define Defects

    Team Charterand Champion

    Estimated $ Impact

    Leadership approval

    Phase I: Process Measurement

    Map Process and Identify Inputs and Outputs

    Cause and Effects Matrix

    Establish Measurement System Capability

    Establish Process Capability Baseline

    Phase II: Process Analysis

    Complete FMEA

    Perform Multi-Vari Analysis

    Identify Potential Critical Inputs

    Develop Plan for Next Phase

    Phase III: Process Improvement

    Verify Critical Inputs

    Optimize Critical Inputs via

    Taguchi

    Phase IV: Process Control

    Implement Control Plan

    Verify Long Term Capability

    Continuously Improve Process

    Fig. 1 DMAIC process improvement methodology

    Fig. 2 Electric switchboard

    Fig. 3 Plasma table

    Fig. 4 Indicator light

    Int J Adv Manuf Technol (2009) 41:760769 761

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    more economical DOE approach. Taguchi parameter

    design, which is capable of providing the optimal solution

    with a reduced number of experiment runs, is one such

    approach.

    One small-sized, Midwest manufacturer has an aging

    plasma-cutting machine that produces defects and causes

    production delays. Though it is easier to replace older

    equipment with new machines, most small manufacturershave limited capital. The manager of this company

    approached the researchers for assistance in answering the

    following questions:

    1. What is the optimal setting to produce the highest

    quality products?

    2. Can the optimal setting lower the defect rate but

    maintain the required productivity?

    If the defect rate remains high after implementing

    optimal settings, the manager will have the justification he

    needs to invest in new equipment.

    To address this challenge, the researchers conducted aTaguchi parameter design study, using the results of that

    study to make recommendations. The procedure and process

    is demonstrated in the four phases outlined in Fig. 1.

    2 Overview of Taguchi parameter design

    Taguchi parameter design is one of several methods

    developed by Dr. Genichi Taguchi [1]. One of the

    conventional approaches used in off-line quality control,

    Taguchis philosophy is based on the belief that once

    quality is designed into both the product and process, only

    minimal inspection is necessary. Taguchi proposes a

    holistic view of quality related to cost, which extends the

    focus of quality beyond manufacturers at the time of

    production by integrating the customer and society as a

    whole. Taguchi defines quality as the (minimum) lossimparted by the product to society from the time the

    product is shipped. This economic loss is associated with

    losses due to rework, waste of resources during manufac-

    turing, warranty costs, customer complaints and dissatis-

    faction, time and money spent by customers on failing

    products, and the eventual loss of market share. Taguchi

    methods provide an efficient and systematic way to

    optimize designs for performance, quality, and cost. These

    methods have been used successfully in Japan and the

    United States in designing reliable, high quality products at

    low cost in such areas as automotives and consumer

    electronics.Taguchi breaks down off-line quality control into three

    stages, concept design, parameter design, and tolerance

    design, which are summarized below:

    Concept design results in either a design concept or an

    up and limping prototype. In the initial phase, more

    than one design concept, each with its own set of pros

    and cons, can be presented. The ideal design concept

    will be the one that research shows best addresses

    customer needs and is inherently robust.

    Bevel magnitudeFig. 5 Illustration of bevel

    Smallest diameter deviation: |Dsmallet-Dnormal|

    Dsmallest: Smallest diameter

    Dnormal: Nominal diameter

    Continuous curve: Actual plasma-cut hole

    Dashed curve: Nominal diameter hole, maximal roundness

    Dsmallest

    D normal

    Fig. 6 Illustration of smallestdiameter deviation

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    Parameter design is a critical production step. The

    nominal design features or selected process factor

    levels are tested and the combination of product

    parameter levels or process operating levels leastsensitive to changes in environmental conditions and

    other uncontrolled factors (noise) is determined.

    Tolerance design is used to further reduce variation, if

    required, by tightening the tolerance of those factors

    shown to have a significant impact on variation. This

    stage utilizes loss function to determine whether

    spending more money on materials and equipment will

    result in a better product, thus emphasizing the

    Japanese philosophy of invest last not invest first.

    Taguchi parameter design is an experiment-based pro-

    cess that uses the following steps to identify settings ofdesign parameters that maximize performance character-

    istics (e.g., yield or productivity, etc.):

    1. Identify initial and competing settings of design

    parameters, as well as important noise factors and their

    ranges.

    2. Construct the design and noise matrices, and plan the

    parameter design experiments.

    3. Conduct the parameter design experiments and evaluate

    the performance statistic for each test run of the design

    matrix.

    4. Use the values of the performance statistic to predictnew settings of the design matrix.

    5. Confirm that the new settings truly improve the

    performance statistic.

    Considering multiple factors simultaneously, the Taguchi

    parameter design method uses orthogonal experimental

    combinations to shorten the product development cycle,

    which, in turn, saves time and money, Taguchi parameter

    design has been utilized in traditional manufacturing

    processes such as milling, turning, and drilling to determine

    optimal combinations of parameters for better performance.

    Ghani et al. [2] applied Taguchi parameter design to

    optimizing parameters for end milling process. Low

    resultant cutting force and good surface finish were foundwith high cutting speed, low feed rate and low depth of cut.

    Zhang et al. [3] used a Taguchi parameter design

    application to optimize surface quality in a CNC face

    milling operation, where the best surface roughness

    (response) and signal-to-noise ratio were sought. Davim

    and Reis [4] studied cutting parameters of composite

    milling process using Taguchi-based experiments. Kirby

    et al. [5] discussed the application of Taguchi parameter

    design to optimize turning operations for best surface

    roughness. Palanikumar and Karthikeyan [6] used Taguchi

    methods to conduct experiments in turning composite

    material to achieve maximum material removal rate andminimum surface roughness. Taguchi parameter design has

    also been used to analyze optimal parameters for drilling

    process [7,8, 9,10].

    Although many of the aforementioned projects were

    conducted primarily in laboratories, research can also be

    done in an industrial setting. The Iowa State University

    Center for Industrial Research and Service (CIRAS), an

    extension service unit of this Midwest land grant university,

    Factor Units Level 1 Level 2 Level 3

    A Tip Size - Small Medium High

    B Feed Rate in/min 83 93 103

    C Voltage volts (V) 100 105 110

    D Amperage amperes (A) 43 53 63

    Noise Low High

    1 Air Pressure lbs/in2(PSI) 45 60

    2 Pierce Time seconds (s) 0.70 1.40

    Fig. 8 Test parameters

    Fig. 7 Fish bone diagram

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    has proposed this methodology to help industry to obtain

    optimum manufacturing processes to meet customer

    demands within a reasonable timeframe and budget. The

    following sections will present the application of Taguchi

    parameter design in helping a small business achieve the

    Six Sigma paradigm.

    3 Current problem with an older plasma-cutting

    machine

    The case study in this paper is based on a problem

    presented by an electrical manufacturing company (Com-

    pany A) located in Des Moines, Iowa. The major products

    of Company A are large electrical switchboards (Fig. 2).

    One step in the process of making the boards requires the

    use of a plasma table (Fig.3) to cut holes for hardware such

    as an indicator light (Fig. 4). The current problem of the

    plasma cutting process is that some of the holes do not

    allow the fitting for the hardware. A close examination of

    the holes reveals that two reasons may keep the hardware

    from passing through the holes. First, the plasma cutting

    process is beveling the edge of the holes it creates (Fig.5),

    which, in turn, obstructs the hardware. Meiji EMZ-5TR

    zoom stereo microscope was used to measure the magni-

    tude (unit: 0.001 inch) of the bevels for analysis. Second,

    the holes have poor circularity (roundness). Roundness is

    measured by finding the smallest diameter deviation, which

    is the difference of the smallest diameter of the actual hole

    from the nominal diameter (Fig. 6). Beveling and roundness

    problems that prevent hardware from fitting properly into

    the switchboard is a defect that requires rework. To

    minimize production costs due to this rework, a Taguchianalysis was undertaken to determine the optimal setting to

    produce holes with minimum bevel and minimum out-of-

    round diameter. Ideally, all of the holes cut by the plasma

    machine would have best round shape and enable the

    hardware to be inserted smoothly.

    To accomplish this project for Company A, a Six Sigma

    team consisting of operators, engineers, researchers and a

    manager was formed, and the Taguchi parameter design

    procedure was applied.

    4 Six Sigma improvement process

    4.1 Define

    4.1.1 Factors and levels

    Before the Six Sigma team could conduct the Taguchi

    parameter design experiment, they needed to thoroughly

    Noise 1 2 3 4

    45 45 60 60

    0.7 1.4 0.7 1.4

    Run A B C D Avg Bevel

    1 1 1 1 1 39 31 22 42 33.5 8.96 80.33 -30.73

    2 1 2 2 2 35 25 35 35 32.5 5.00 25.00 -30.31

    3 1 3 3 3 55 19 32 37 35.75 14.91 222.25 -31.60

    4 2 1 2 3 40 47 44 82 53.25 19.38 375.58 -34.94

    5 2 2 3 1 40 52 62 87 60.25 19.97 398.92 -35.94

    6 2 3 1 2 45 54 60 62 55.25 7.63 58.25 -34.91

    7 3 1 3 2 52 48 49 49 49.5 1.73 3.00 -33.90

    8 3 2 1 3 39 47 46 52 46 5.35 28.67 -33.30

    9 3 3 2 1 56 51 40 45 48 6.98 48.67 -33.69

    Noise Level Setting

    S/N

    Ratio

    1-Air Pressure2-Pierce Time

    N4

    Control Factors and Levels

    N1 N2 N32

    Fig. 10 Data of bevel (unit:

    0.001)

    Noise 1 2 3 4

    1-Air Pressure 45 45 60 60

    2-Pierce Time 0.7 1.4 0.7 1.4

    Run A B C D Avg Circularity

    1 1 1 1 1 y11 y12 y13 y14

    2 1 2 2 2 y21 y22 y23 y24

    3 1 3 3 3 y31 y32 y33 y34

    4 2 1 2 3 y41 y42 y43 y44

    5 2 2 3 1 y51 y52 y53 y54

    6 2 3 1 2 y61 y62 y63 y64

    7 3 1 3 2 y71 y72 y73 y74

    8 3 2 1 3 y81 y82 y83 y84

    9 3 3 2 1 y91 y92 y93 y94

    N1 N2 N3

    Control Factors and Levels

    Noise Level Setting

    N4 2

    Fig. 9 Taguchi experiment

    table

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    understand the plasma-cutting process. A brainstorming

    exercise that examined all of the factors of the process

    provided the necessary information. Since these factors

    involve knowledge in different domains and could be either

    controllable or non-controllable, it was necessary to have

    all team members participate in the brainstorming. A

    fishbone diagram based on this exercise revealed allpossible causes of defective plasma-cut holes from the

    perspectives of method, material, machine, operator and

    environment (Fig. 7). Through group discussion and

    ranking, four factors were identified as controllable factors

    (voltage, feed rate, amperage, and tip size) and two as

    uncontrollable noise factors (air pressure and pierce time).

    The Six Sigma team then determined ranges of the levels

    to explore for each factor. For controllable factors, this was

    done by determining normal settings for each factor and

    then setting one level lower (level 1) and one level higher

    (level 3), using the existing settings as level 2. For

    uncontrolled factors (noise factors), two levels were chosen,

    low and high. The levels and units of each factor are shown

    in Fig. 8. These levels were set to determine if changes to

    the factors impacted hole quality, and, if so, how much. In

    this way, the most significant factor was identified, and theoptimal level for each factor determined. For the uncon-

    trolled factors, the two levels helped determine if back-

    ground noises produce a significant effect. This effect will

    be further analyzed with T-tests.

    4.1.2 Experimental design

    Using these four controllable factors and two uncontrolled

    noise factors, we constructed an L9 Taguchi experiment

    table with the appropriate settings of each factor (Fig. 9).

    For each controllable parameter setting combination, four

    runs were conducted, each under a different noise factorsetting combination. Each trial run is represented as yij,

    wherei ranges from 1 to 9, denoting controllable parameter

    setting for experimental run, and j from 1 to 4, denoting

    noise factor setting. Thus, a total of 36 experimental runs

    are conducted as a setting shown in Fig. 9. The average

    value, standard deviation, variance and signal-to-noise (S/

    N) ratio of the four runs under the same controllable

    parameter setting were calculated. The same experimental

    28

    36

    44

    52

    60

    -36

    -35

    -34

    -33

    -32

    -31

    -30

    -29

    -28

    sm md lg

    Factor A: Tip Size S/N Ratio

    Ave Bevel

    44

    45

    46

    47

    48

    49

    50

    -37

    -36

    -35

    -34

    -33

    -32

    -31

    83 93 103

    Factor B: Feed Rate (ipm) S/N Ratio

    Avg Bevel

    42

    44

    46

    48

    50

    52

    54

    -37

    -36

    -35

    -34

    -33

    -32 100 105 110

    Factor C: Voltage (Volts)

    S/NR

    atio

    S/NR

    atio

    S/NR

    atio

    S/NR

    atio

    S/N Ratio

    Avg Bevel

    42

    44

    46

    48

    50

    52

    -37

    -36

    -35

    -34

    -33

    -32 43 53 63

    AvgBevel

    AvgBevel

    AvgBevel

    AvgBevel

    Factor D: Amperage (Amps)S/N Ratio

    Avg Bevel

    Fig. 12 Response graphs for bevel magnitude

    Avg Bevel

    A B C D Optima combinations(Raw Data)

    level 1 33.92 45.42 47.25 47.25 smaller the better

    level 2 56.25 46.25 44.58 45.75 A1, B1, C2, D3

    level 3 47.83 46.33 48.50 45.00

    S/N Ratio

    A B C D Optima combinations(S/N Rati o)

    level 1 -30.9 -33.2 -33 -33.5 larger the better

    level 2 -35.3 -33.2 -33 -33A1, B2, C1, D2

    level 3 -33.6 -33.4 -33.8 -33.3

    Fig. 11 Response of controllable factors to bevel and S/N ratio

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    design table was used for two response variables, the bevel

    magnitude and the deviation of the smallest diameter of

    plasma-cut holes.

    4.2 Measure and analysis

    This section provides details of the Taguchi-based experi-

    ments conducted for bevel magnitude and smallest diameterdeviation. Data were collected and analyzed using the

    experimental design described in the previous section.

    4.2.1 Taguchi experiment for bevel

    Figure10shows the experiment data for the bevel size. The

    response of each controllable factor on bevel magnitude

    and the signal-to-noise ratio are shown in Fig. 11. The

    quality characteristic is the-smaller-the-better; the formula

    to calculate S/N ratio is given below and its derivation can

    be found in [1]:

    h 10 log 1

    n

    X4j1

    y2ij

    !" #

    where,

    S/N ratio,

    yij individual response for each trial run,

    n the number of runs due to noise factors; in this case,

    n=4.The bevel response table (Fig. 11) shows the mean

    response of the variable (bevel) from each controllable

    factor at each level in the Taguchi experimental design.

    Each level of the controllable factors has three response

    values in the orthogonal array (Fig. 10) and is calculated by

    averaging these three values. The response table for the S/N

    ratio (also in Fig.11) was similarly obtained, using the S/N

    ratios in the orthogonal array. With the response values and

    the S/N ratio values, the response table can be used to

    determine the optimal combination of levels of the

    controllable factors that creates the minimum bevel.

    Figure12is the graphical depiction of the response and

    S/N ratio for bevel magnitude. Since the quality character-

    istic for beveling is the-smaller-the-better, the optimal

    setting combination for minimum bevel is A1-B1-C2-D3,

    which is interpreted as small tip size, a feed rate of 83 in/

    min, a voltage of 105 V, and amperage of 63A. For the S/Nratio, we are looking for the largest value. Therefore, the

    optimal setting combination for S/N ratio response is A1-

    B2-C1-D2, which means small tip size, a feed rate of 93 in/

    min, a voltage of 100 V, and amperage of 53A. The arrows

    in Fig. 12indicate the chosen level of each factor, and the

    directions of the arrows show the quality characteristic with

    upward denoting the-larger-the-better and downward the-

    smaller-the-better.

    4.2.2 Taguchi experiment for smallest diameter deviation

    Similarly, Fig. 13 shows the experiment data for thesmallest diameter deviation. The response of each control-

    lable factor on the smallest diameter deviation and the S/N

    ratio are shown in Fig.14. Figure15 is the graphic display

    of the response to smallest diameter deviation. The quality

    characteristic is also the-smaller-the-better for the smallest

    diameter deviation. The optimal setting combination for

    minimum smallest diameter deviation is A1-B2-C1-D3,

    which means small tip size, a feed rate of 93 in/min, a

    Fig. 14 Response of controllable factors to smallest diameter

    deviation

    Noise 1 2 3 4

    45 45 60 60

    0.7 1.4 0.7 1.4

    Run A B C D

    Avg

    Bevel

    1 1 1 1 1 0.002 0.007 0.018 0.020 0.012 0.0087 0.000075 37.116

    2 1 2 2 2 0.001 0.001 0.006 0.016 0.006 0.0071 0.000050 41.337

    3 1 3 3 3 0.006 0.001 0.003 0.019 0.007 0.0081 0.000066 39.925

    4 2 1 2 3 0.012 0.018 0.021 0.052 0.026 0.0179 0.003200 30.442

    5 2 2 3 1 0.037 0.044 0.060 0.055 0.049 0.0104 0.000109 26.0516 2 3 1 2 0.023 0.036 0.040 0.052 0.038 0.0120 0.000143 28.147

    7 3 1 3 2 0.037 0.027 0.042 0.035 0.035 0.0062 0.000039 28.956

    8 3 2 1 3 0.009 0.005 0.027 0.014 0.014 0.0096 0.000092 35.888

    9 3 3 2 1 0.041 0.032 0.021 0.041 0.034 0.0095 0.000090 29.184

    Noise Level Setting

    1-Air Pressure

    2-Pierce Time S/N

    RatioControl Factors and Levels

    N1 N2 N3 N42

    Fig. 13 Data of smallest

    diameter deviation (unit: inch)

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    voltage of 100 V, and an amperage of 63A. The S/N ratio

    responses render the same parameter setting combination.

    4.2.3 Setting selection

    According to Figs. 12 and 14, bevel and smallest diameter

    deviation as well as their S/N ratios have different optimal

    setting combinations. These are summarized in the first four

    rows of Table 1. For example, bevel S/N ratio response

    gave level 2 (53A) for factor D (amperage), while all other

    responses (bevel, smallest diameter deviation and its S/N

    ratio) chose level 3(63A). However, Company A needs

    only one overall optimal setting combination for its plasma

    table. Therefore, the appropriate optimal setting combina-

    tion is the level of each factor having the largest number of

    occurrences. For example, level 3 of factor D occurred

    three times, while level 2 occurred once. Therefore, level 3

    for factor D is chosen as the overall optimal setting

    combination. With this rule, the overall optimal setting for

    the plasma table is A1-B2-C1-D3, as indicated in the bottom

    row of Table 1. The setting A1-B2-C1-D3 means the smalltip size, a feed rate of 93 in/min, a voltage of 100 V, and

    amperage of 63A.

    4.2.4 T-test

    To examine the effect of noise factors on the response

    variables, a t-test was conducted for each noise factor. For

    -0.200

    -0.150

    -0.100

    -0.050

    0.000

    0.050

    24

    26

    28

    30

    3234

    36

    38

    40

    42

    44

    46

    48

    50

    sm md lg

    Factor A: Tip Size S/N Ratio

    Deviation

    0.0000.0050.0100.0150.0200.0250.030

    0.0350.0400.0450.0500.0550.0600.0650.0700.0750.080

    24

    26

    28

    30

    32

    34

    36

    38

    40

    83 93 103

    Factor B: Feed Rate (ipm)S/N Ratio

    Deviation

    -

    -

    2426283032343638404244464850

    100 105 110

    S/NR

    atio

    S

    /NR

    atio

    S/NR

    atio

    S/NR

    atio

    Factor C: Voltage (Volts) S/N Ratio

    Deviation

    -0.020

    -0.010

    0.000

    0.010

    0.020

    0.030

    0.040

    -0.020

    -0.010

    0.000

    0.010

    0.020

    0.030

    0.040

    242628303234363840

    42444648505254565860

    43 53 63

    D

    eviation

    D

    eviation

    Deviation

    Deviation

    Factor D: Amperage (Amps)S/N Ratio

    Deviation

    Fig. 15 Response graph for smallest diameter deviation

    Table 1 Optimal setting combination

    Selection Criteria Combination

    Bevel A1 B1 C2D3Bevel S/N ratio A1 B2 C1D2Smallest diameter deviation A1 B2 C1D3Smallest diameter deviation S/N ratio A1 B2 C1D3Overall optimal setting A1 B2 C1D3

    Table 2 T-test for air pressures effect on smallest diameter deviation

    Air pressure (PSI) 45 60

    Mean 0.019 0.030

    Variance 2.4791 e-4 3.0446 e-4

    Observations 18 18

    df 34

    Difference in mean 0.011

    Std. Error (difference between the means) 0.0055

    t Stat 2.0358

    t Critical two-tail (alpha =0.005) 2.7284

    P(T

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    air pressure, a t-test determines if the two levels (45 psi and

    60 psi) will have a significant effect on smallest diameter

    deviation. The hypothesis is stated as

    H0 : 45 60H1 : 456 60

    The t-test result is shown in Table2. From the test result

    it can be seen that the Abs (t Stat)=2.0358 < t critical two-

    tail (alpha=0.005)=2.7284, or equivalently P (T alpha= 0.005. The statistical conclusion is

    that the difference in mean from the two air pressure levels

    is not significant, so the hypothesisHo can not be rejected.

    Therefore, we can conclude that air pressure does not

    significantly affect the smallest diameter deviation.

    Similarly, three t-tests were conducted for the effects of

    pierce time to smallest diameter deviation (Table 3), air

    pressure to bevel (Table 4), and pierce time to bevel

    (Table 5). From Table 3, it can be seen that the Abs

    (t Stat)=0.6575 < t critical two-tail (alpha=0.005)=2.7284,

    or equivalently P (T alpha=0.005.

    Therefore, pierce time does not significantly affect the

    small radius. From Table 4, it can be seen that the Abs

    (t Stat)=1.2667 < t critical two-tail (alpha=0.005)=2.7284,

    or equivalently P (T alpha=0.005.

    Therefore, the air pressure does not significantly affect the

    bevel magnitude. From Table 5, Abs (t Stat)=0.8738 < t

    critical two-tail (alpha= 0.005) =2.7284, or equivalently P

    (T alpha= 0.005. Therefore, the

    pierce time does not significantly affect the small radius.

    4.3 Implementation

    After the overall optimal setting combination for the plasma

    cutter was identified, a confirmation run was conducted.

    With this optimal setting (A1-B2-C1-D3), 30 cuts were made

    to test the smallest diameter deviation and the bevel

    magnitude. The hardware passed easily through all 30 cuts,

    meaning no rework was needed. In addition, as the results

    shown in Table 6 indicate, the mean value and standard

    deviation of the confirmation run data were smaller than

    those before Taguchi design was conducted.

    4.4 Control

    The optimal setting combination was sent to Company As

    production department. The Six Sigma team is now trying

    to uncover other possible causes of unacceptable deviation

    so that other Taguchi experiments can be conducted for

    continuous improvement of the process. For example, if

    defects occur later following the optimal condition, the Six

    Sigma team will follow the DMAIC procedure (Fig. 1) to

    pursue the next cycle of process improvement. Taguchi

    Table 3 T-test for pierce times effect on smallest diameter deviation

    Pierce time (s) 0.7 1.4

    Mean 0.023 0.026

    Variance 2.94 e-4 3.18 e-4

    Observations 18 18

    Df 34

    Difference in mean 0.003

    Std. Error (difference between the means) 0.0058

    t Stat 0.6575

    t Critical one-tail (alpha =0.005) 2.7284

    P(T

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    parameter design for optimal condition could then be

    executed again.

    5 Conclusion

    Six Sigma and lean manufacturing are powerful strategies

    for transforming an enterprise and escalating its competi-

    tiveness. The fact that Six Sigma and lean manufacturing

    can successfully save time and cut costs are important

    considerations, especially for small- and medium-sized

    enterprises with limited resources. This paper presented

    the application of the Taguchi method to optimize the

    roundness of the holes cut by an aging plasma-cutting

    machine. Using the orthogonal array in the experiment

    design for four factors, the Taguchi method reduced the

    experiment set-up from 81 parameter combination settings

    (34) i n D O E t o an L9 setting. With two noise factors

    included in the Taguchi experiment design, 36 total experi-

    ments are conducted. The optimal setting combination

    received from Taguchi experiment design is A1B2C1D3

    (small for tip size, 93 in/min for feed rate, 100 V for voltage,

    and 63A for amperage), which maintains the existing feed

    rate for productivity and improves quality of products. The

    optimal setting combination gave no defects from the 30

    plasma-cut holes in the confirmation run. In addition, the

    recommended setting combination was well received by

    Company A, and the problem with defects situation has been

    much improved. With the reduced time and cost, Taguchi

    experiment design has again demonstrated its effectiveness

    in achieving Six Sigma and lean paradigm.

    Acknowledgement This project was partially funded by the Iowa

    Center for Industrial Research and Service, through a grant from the

    Department of Commerce NIST Manufacturing Extension Partnership.

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